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TWI479261B - A photosensitive resin composition and a photosensitive member using the same, a method of forming a photoresist pattern, and a method of manufacturing the printed circuit board - Google Patents

A photosensitive resin composition and a photosensitive member using the same, a method of forming a photoresist pattern, and a method of manufacturing the printed circuit board Download PDF

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Publication number
TWI479261B
TWI479261B TW099104748A TW99104748A TWI479261B TW I479261 B TWI479261 B TW I479261B TW 099104748 A TW099104748 A TW 099104748A TW 99104748 A TW99104748 A TW 99104748A TW I479261 B TWI479261 B TW I479261B
Authority
TW
Taiwan
Prior art keywords
resin composition
photosensitive resin
meth
phenyl
group
Prior art date
Application number
TW099104748A
Other languages
English (en)
Chinese (zh)
Other versions
TW201042389A (en
Inventor
Masahiro Miyasaka
Yukiko Muramatsu
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Publication of TW201042389A publication Critical patent/TW201042389A/zh
Application granted granted Critical
Publication of TWI479261B publication Critical patent/TWI479261B/zh

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F2/00Processes of polymerisation
    • C08F2/46Polymerisation initiated by wave energy or particle radiation
    • C08F2/48Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light
    • C08F2/50Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light with sensitising agents
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/04Acids; Metal salts or ammonium salts thereof
    • C08F220/06Acrylic acid; Methacrylic acid; Metal salts or ammonium salts thereof
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F257/00Macromolecular compounds obtained by polymerising monomers on to polymers of aromatic monomers as defined in group C08F12/00
    • C08F257/02Macromolecular compounds obtained by polymerising monomers on to polymers of aromatic monomers as defined in group C08F12/00 on to polymers of styrene or alkyl-substituted styrenes
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F265/00Macromolecular compounds obtained by polymerising monomers on to polymers of unsaturated monocarboxylic acids or derivatives thereof as defined in group C08F20/00
    • C08F265/04Macromolecular compounds obtained by polymerising monomers on to polymers of unsaturated monocarboxylic acids or derivatives thereof as defined in group C08F20/00 on to polymers of esters
    • C08F265/06Polymerisation of acrylate or methacrylate esters on to polymers thereof
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D4/00Coating compositions, e.g. paints, varnishes or lacquers, based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; Coating compositions, based on monomers of macromolecular compounds of groups C09D183/00 - C09D183/16
    • C09D4/06Organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond in combination with a macromolecular compound other than an unsaturated polymer of groups C09D159/00 - C09D187/00
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • G03F7/031Organic compounds not covered by group G03F7/029
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/09Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/105Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having substances, e.g. indicators, for forming visible images
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Wood Science & Technology (AREA)
  • Architecture (AREA)
  • Structural Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Materials For Photolithography (AREA)
  • Polymerisation Methods In General (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Macromonomer-Based Addition Polymer (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)
  • Manufacturing Of Printed Wiring (AREA)
TW099104748A 2009-02-26 2010-02-12 A photosensitive resin composition and a photosensitive member using the same, a method of forming a photoresist pattern, and a method of manufacturing the printed circuit board TWI479261B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009044087 2009-02-26

Publications (2)

Publication Number Publication Date
TW201042389A TW201042389A (en) 2010-12-01
TWI479261B true TWI479261B (zh) 2015-04-01

Family

ID=42665393

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099104748A TWI479261B (zh) 2009-02-26 2010-02-12 A photosensitive resin composition and a photosensitive member using the same, a method of forming a photoresist pattern, and a method of manufacturing the printed circuit board

Country Status (5)

Country Link
JP (1) JP5327310B2 (ja)
KR (1) KR101339530B1 (ja)
CN (3) CN102317864A (ja)
TW (1) TWI479261B (ja)
WO (1) WO2010098183A1 (ja)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101444044B1 (ko) * 2010-12-16 2014-09-23 히타치가세이가부시끼가이샤 감광성 엘리먼트, 레지스트 패턴의 형성 방법 및 프린트 배선판의 제조 방법
JP5935462B2 (ja) * 2011-05-10 2016-06-15 日立化成株式会社 感光性エレメント、レジストパターンの形成方法、プリント配線板の製造方法
KR102171606B1 (ko) * 2012-11-20 2020-10-29 쇼와덴코머티리얼즈가부시끼가이샤 감광성 수지 조성물, 감광성 엘리먼트, 레지스터 패턴의 형성 방법 및 프린트 배선판의 제조 방법
JP6136414B2 (ja) * 2013-03-19 2017-05-31 日立化成株式会社 感光性樹脂組成物、感光性エレメント、レジストパターン付き基板の製造方法及びプリント配線板の製造方法
JPWO2015098870A1 (ja) 2013-12-27 2017-03-23 日立化成株式会社 感光性樹脂組成物、感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造方法
WO2016043162A1 (ja) 2014-09-18 2016-03-24 日立化成株式会社 感光性樹脂組成物、感光性エレメント、レジストパターン付き基板の製造方法及びプリント配線板の製造方法
CN107111231B (zh) * 2014-12-22 2020-06-09 日产化学工业株式会社 感光性树脂组合物和粘接剂组合物
KR102272719B1 (ko) * 2015-03-31 2021-07-05 닛산 가가쿠 가부시키가이샤 레지스트패턴 피복용 도포액 및 패턴의 형성방법
CN108780276A (zh) 2016-03-17 2018-11-09 日立化成株式会社 感光性树脂组合物、感光性元件、带抗蚀剂图案的基板的制造方法、以及印刷配线板的制造方法
CN108165095B (zh) * 2017-12-28 2020-12-18 深圳市容大感光科技股份有限公司 一种快速定位基材反面基准位置的油墨及其定位方法
CN110632825A (zh) * 2019-09-14 2019-12-31 浙江福斯特新材料研究院有限公司 感光性树脂组合物、干膜抗蚀剂
CN114585974A (zh) * 2019-10-16 2022-06-03 昭和电工材料株式会社 感光性树脂膜、抗蚀剂图案的形成方法及配线图案的形成方法
JP7479142B2 (ja) * 2019-12-17 2024-05-08 東京応化工業株式会社 レジスト組成物及びレジストパターン形成方法
CN115087929A (zh) * 2019-12-19 2022-09-20 昭和电工材料株式会社 碱溶性树脂、感光性树脂组合物、感光元件、抗蚀剂图案的形成方法及布线图案的形成方法
WO2021192058A1 (ja) * 2020-03-24 2021-09-30 昭和電工マテリアルズ株式会社 感光性樹脂組成物、感光性エレメント、及び配線基板の製造方法
CN112574184B (zh) * 2020-12-25 2022-12-20 同济大学 环氧化物取代的吡唑啉衍生物、光固化组合物以及制备方法
CN112506005B (zh) * 2020-12-30 2024-04-26 杭州福斯特电子材料有限公司 一种高附着耐电镀感光干膜抗蚀剂
CN113126434B (zh) * 2021-04-14 2023-08-29 福斯特(安吉)新材料有限公司 一种干膜抗蚀剂
WO2023073799A1 (ja) * 2021-10-26 2023-05-04 株式会社レゾナック 感光性樹脂組成物、感光性エレメント、及び、積層体の製造方法
WO2025215193A1 (en) * 2024-04-10 2025-10-16 Arkema France Acidic oligomers used in deinking process

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007122028A (ja) * 2005-09-28 2007-05-17 Asahi Kasei Electronics Co Ltd 感光性樹脂組成物およびその積層体
WO2008078483A1 (ja) * 2006-12-27 2008-07-03 Hitachi Chemical Company, Ltd. 感光性樹脂組成物、感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造方法
TW201003315A (en) * 2008-03-21 2010-01-16 Asahi Kasei Emd Corp Photosensitive resin composition, photosensitive resin laminate, method for resist pattern formation, and process for producing printed wiring board, lead frame, semiconductor package, and substrate with concaves and convexes

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CN104133343B (zh) * 2005-05-23 2016-11-16 日立化成株式会社 感光性树脂组合物,感光性元件,光致抗蚀图形的形成方法及印刷电路板的制造方法
JP4525626B2 (ja) * 2006-04-06 2010-08-18 日立化成工業株式会社 感光性樹脂組成物、感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造方法
JP4752656B2 (ja) * 2005-09-09 2011-08-17 日立化成工業株式会社 感光性樹脂組成物、感光性エレメント、これらを用いたレジストパターンの形成方法及びプリント配線板の製造方法
CN1940723B (zh) * 2005-09-28 2011-11-09 旭化成电子材料株式会社 感光性树脂组合物及其层合体
TW200745749A (en) * 2006-02-21 2007-12-16 Hitachi Chemical Co Ltd Photosensitive resin composition, method for forming resist pattern, method for manufacturing printed wiring board, and method for producing substrate for plasma display panel
JP5117233B2 (ja) * 2008-03-21 2013-01-16 旭化成イーマテリアルズ株式会社 感光性樹脂組成物および積層体

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007122028A (ja) * 2005-09-28 2007-05-17 Asahi Kasei Electronics Co Ltd 感光性樹脂組成物およびその積層体
WO2008078483A1 (ja) * 2006-12-27 2008-07-03 Hitachi Chemical Company, Ltd. 感光性樹脂組成物、感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造方法
TW201003315A (en) * 2008-03-21 2010-01-16 Asahi Kasei Emd Corp Photosensitive resin composition, photosensitive resin laminate, method for resist pattern formation, and process for producing printed wiring board, lead frame, semiconductor package, and substrate with concaves and convexes

Also Published As

Publication number Publication date
CN103543608A (zh) 2014-01-29
CN102317864A (zh) 2012-01-11
WO2010098183A1 (ja) 2010-09-02
KR101339530B1 (ko) 2013-12-10
JP5327310B2 (ja) 2013-10-30
JPWO2010098183A1 (ja) 2012-08-30
CN104808444A (zh) 2015-07-29
TW201042389A (en) 2010-12-01
KR20110106912A (ko) 2011-09-29

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