TWI394961B - Insulation inspection equipment and insulation inspection methods - Google Patents

Description

Insulation inspection device and insulation inspection method

The present invention relates to an insulation inspection apparatus and an insulation inspection method, and more particularly to an insulation inspection apparatus and an insulation inspection method for performing insulation inspection of a circuit board on which a plurality of wiring patterns are formed quickly and accurately.

In the past, the insulation inspection of the circuit board having the plurality of wiring patterns was determined by performing the determination of the insulation state between the wiring patterns (whether or not the insulation is ensured). Good products are also bad products.

In such a conventional insulation inspection apparatus, a resistance value between wiring patterns is calculated by applying a high voltage (for example, 200 V) between two wiring patterns to be inspected, and based on the resistance The value is used to determine the quality of the insulation.

However, in such a conventional insulation inspection apparatus, since the inspection is started after a certain period of time has elapsed after a specific voltage is applied, the inspection is performed, and therefore, it is provided between when a specific voltage is applied. When there is a spark in the time, the incorrect resistance value is calculated, and the problem of the insulation state is not correctly determined.

In order to solve such a problem, the present inventors have created an insulation inspection apparatus and method disclosed in Patent Document 1 previously filed.

[Patent Document 1] Patent Publication No. 3546046 (issuance date: July 21, 2004)

The insulation inspection apparatus and method disclosed in Patent Document 1 apply a specific DC voltage between a pair of wiring patterns and change in time between detection of application and application of a specific voltage value. The voltage is detected from the voltage change, and the spark is detected by detecting a drop in the voltage at which the spark is generated. In this manner, by detecting the voltage change during the rising period of the applied voltage, the spark can be detected, and the above problem can be solved.

However, in Patent Document 1, there is no description about the state of the spark or the like.

Therefore, it has been expected to create an insulation inspection device and an insulation inspection method that can be used to check the spark condition and the spark that is connected to the circuit board.

SUMMARY OF THE INVENTION The present invention is directed to an insulation inspection apparatus capable of performing a more accurate inspection of a spark associated with a circuit board.

Furthermore, the present invention has an object of providing an insulation inspection method capable of performing a more accurate inspection of a spark associated with a circuit board.

In view of the above, an insulation inspection device according to the present invention is an insulation inspection device that performs insulation inspection on a circuit board on which a plurality of wiring patterns are formed, and is characterized in that: a selection means is provided from the plural In the wiring pattern, one of the wiring patterns to be inspected is selected as the first inspection unit, and all the wiring patterns to be inspected other than the first inspection unit are selected as the second inspection unit; And a power supply means for applying a voltage to the second inspection unit while being connected to the second inspection unit to set a specific potential difference between the first inspection unit and the second inspection unit; and detecting current And means for detecting a current flowing between the first inspection unit and the second inspection unit; and determining means for comparing the current detected by the current detecting means with a specific reference value And by comparing the results, it is determined whether the circuit substrate is a good product or a defective product.

Further, in the above-described insulation inspection device, the second inspection unit may be formed by a wiring pattern other than the wiring pattern of the first inspection unit, and all of the wiring patterns are connected in parallel.

Further, in the above-described insulation inspection device, the current detecting means may be connected in series to the first inspection unit or the second inspection unit.

Further, in the above-described insulation inspection apparatus, the selection means may select all of the plurality of conductor patterns as the first inspection unit in order, and the defective product may be determined when the current value is higher than the reference When the value is larger, the circuit board is judged to be defective.

Further, in the above-described insulation inspection device, the current detecting means may include a first current detecting means and a second current detecting means having two different ranges, and the first current detecting means is for detecting The second current detecting means is provided to measure the insulation resistance value between the first inspection unit and the second inspection unit, and is provided in association with the occurrence of a spark in the first inspection unit. .

Further, in the inspection apparatus described above, a display means for displaying the current value detected by the first current detecting means in a time series may be provided.

Further, in the above-described insulation inspection device, the determination means may include a spark detecting unit and a power calculating unit, and the spark detecting unit detects the occurrence of a spark based on the measured current value of the first current detecting means, and calculates the electric power. The part detects the state of the spark based on the measured current value of the first current detecting unit and the measured voltage value of the voltage detecting unit.

Further, in the above-described insulation inspection device, the determination means may include a resistance calculation unit that calculates the resistance value based on the measured current value of the second current detecting unit and the measured voltage value of the voltage detecting unit.

Furthermore, the insulation inspection method according to the present invention is an insulation inspection method for performing insulation inspection on a circuit board on which a plurality of wiring patterns are formed, and is characterized in that the plurality of wiring patterns are to be inspected. One of the wiring patterns is selected as the first inspection unit, and all the wiring patterns to be inspected other than the first inspection unit are selected as the second inspection unit; and the first inspection is performed for the first inspection. a step of applying a voltage between the second inspection unit and the second inspection unit, and applying a voltage to the second inspection unit; and applying a voltage to the second inspection unit a step of detecting a current flowing between the first inspection unit and the second inspection unit; and comparing a current flowing in the first inspection unit with a specific reference value As a result of the comparison, it is determined that the circuit substrate is a good or defective product.

Further, the recording medium of the present invention is a computer-readable recording medium, and is recorded with a computer that performs insulation inspection on a circuit board on which a plurality of wiring patterns are formed, and performs an insulation inspection method for the circuit board. In the insulation inspection method, the wiring pattern to be inspected is selected as the first inspection unit from the plurality of wiring patterns, and the first inspection unit is selected. a step of selecting all the wiring patterns to be inspected as the second inspection unit; and applying a voltage to the second inspection unit in order to generate a specific potential difference between the first inspection unit and the second inspection unit. And a step of detecting a current flowing between the first inspection unit and the second inspection unit in a state where a voltage is applied to the second inspection unit; and flowing the first inspection unit; The current is compared with a specific reference value, and by the comparison result, the step of determining whether the circuit substrate is good or defective is determined.

According to the present invention, it is possible to provide an insulation inspection apparatus capable of performing a more accurate inspection of a spark associated with a circuit board.

Furthermore, according to the present invention, it is possible to provide an insulation inspection method capable of performing a more accurate inspection of a spark associated with a circuit board.

Hereinafter, embodiments of the insulation inspection device and the insulation inspection method according to the present invention will be described with reference to the attached drawings. In the drawings, the same reference numerals will be given to the same elements, and overlapping description will be omitted.

The term "circuit board" as used in this application is not limited to a printed wiring board, but is an electrode board used for, for example, a flexible board, a multilayer wiring board, a liquid crystal display, or a plasma display, and a semiconductor. A general term for a substrate to which various wirings are applied, such as a package substrate for packaging or a film carrier. That is, in the so-called circuit board, all the substrates which can be the object of the insulation inspection are included.

[Insulation inspection device]

Fig. 1 is a view showing an example of a schematic configuration of an insulation inspection device 1 of the present invention. Here, the insulation inspection device 1 is configured by deducting other elements of the circuit board 10 to be inspected from the elements shown in FIG. That is, the insulation inspection device 1 is provided with: a control means 9; and a display means (display) 8; and a switch group SWs; and a power source means 3; and a first current detecting means 4; and a second current detecting means 5 And voltage detection means 6. This control means 9 is provided with a selection means (SW switching control means). 2; and the determining means 7; and the memory means 10. The control means 9 is constituted by a normal computer, the selection means 2 and the determination means 7 are formed by the CPU, and the memory means 10 is a ROM or a work memory RAM in which a computer program for performing the insulation inspection method is stored. Made into. The switch group SWs is provided with a pair of switches SW1 and SW2 having a complex array.

On the other hand, on the circuit board 10 to be inspected, conduction patterns P1 to P5 (collectively referred to as "P") are formed. In order to simplify the drawing, it is easy to understand, and as the pattern P, only the linear wiring patterns P1 and P2, the T-shaped wiring pattern P3, and the cross-shaped wiring patterns P4 and P5 are exemplified. Wiring pattern. Here, in the circuit board 10 which is a good product, the patterns P1 to P5 are each electrically independent, and a specific insulation resistance is maintained between adjacent patterns.

The insulating device 1 includes a plurality of stylus CPs that connect the sets of SW1 and SW2 constituting the switch group SWs to each other, and each of the stylus contacts is electrically contacted to each of the wiring patterns P1 to P5 of the circuit board 10, respectively. It is possible to check the insulation state or the conduction state of each wiring pattern.

The basic principle of the inspection performed by the insulation inspection apparatus 1 is that the pattern P of the circuit board 10 is selected as the first inspection unit T1 and the second inspection unit T2 according to a specific rule, and the second inspection unit T2 is selected. When a specific voltage is applied and a specific potential difference is generated between the first inspection unit T1 and the second inspection unit T2, the current flowing through the first inspection unit T1 is detected, and the correlation is more accurately performed. The inspector of the spark. Here, the first inspection unit is a single (single) wiring pattern selected for inspection by a plurality of wiring patterns (P1 to P5 in the drawing) included in the circuit board 10 (also referred to as a single wiring pattern). It is made for the "inspected pattern". The second inspection unit T2 is formed of all the wiring patterns (also referred to as "all patterns other than the inspection pattern") to be inspected except for the first inspection unit. In the inspection, the plurality of wiring patterns included in the circuit board 10 are sequentially selected as the first inspection unit, and the insulation inspection with the second inspection unit is performed, and all the wiring patterns are used as the first inspection unit. After selecting and checking, the inspection is ended.

Hereinafter, each element constituting the insulation inspection device 1 will be described. The selection means 2 selects one wiring pattern to be inspected from the plurality of wiring patterns included in the circuit board 10 as the first inspection portion (inspected pattern) T1. At the same time, all of the wiring patterns to be inspected which remain outside the wiring pattern of the first inspection unit T1 are selected as the second inspection unit T2. In this state, after the insulation inspection between the first inspection unit T1 and the second inspection unit T2 is performed, one of the patterns to be inspected is selected from the pattern that has not been selected as the first inspection unit T1. The inspection unit T1 is selected, and all of the remaining wiring patterns to be inspected are selected as the second inspection unit T2. Hereinafter, this stage is repeated.

The specific selection method is caused by using the switch group SWs having the plurality of switching elements SW1 and SW2 and the selection means (SW switching control means) 2 for switching control of the respective switching elements. The switching operation of each of the switching elements SW1 and SW is performed to select one of the first inspection unit T1 or the second inspection unit T2 from the plurality of wiring patterns.

For example, in FIG. 2A, the uppermost wiring pattern P1 among the switch group SWs is selected as the first inspection portion (inspected pattern) T1, and the wiring pattern P2 other than the wiring pattern P1 is displayed. P5 It is selected for the second inspection unit (all patterns other than the inspection pattern) T2. In FIG. 2B, the wiring pattern P4 is selected as the first inspection unit, and the wiring patterns P1 to P3 and P5 other than the wiring pattern P4 are selected as the second inspection unit T2.

Each of the stylus CPs electrically connected to each of the wiring patterns P is connectable to the power source means 3 via the switch SW1, and is connectable to the first current detecting means 4, the second current detecting means 5, and the voltage via the switch SW2. The detecting means 6 is connected.

In FIG. 2A, the wiring pattern P1 selected as the first inspection unit T1 is connected to the first current detecting means 4 and the second current detecting means 5 by the ON of the switch SW2, and further with the voltage. The detecting means 6 is connected. The wiring patterns P2 to P5 selected as the second inspection unit T2 are connected to the power source means 3 by turning on the switch SW1. The switch SW _A may be provided before the first current detecting means 4, and the switch SW _V may be provided before the voltage detecting means 6, and under the control of the control means 9, the corresponding switch may be made in the individual detection. ON.

The wiring patterns P2 to P5 selected as the second inspection unit T2 are electrically connected in parallel to each other by the respective SW1. By the parallel connection, all the wiring patterns P2 to P5 of the second inspection portion T2 can be equipotential, and in the complicated wiring pattern having a large area, the sparks between the wiring patterns can be prevented. Produced.

The wiring pattern P that is selected under the control of the selection means 2 is selected so that the wiring pattern P1 that has been selected once as the first inspection unit T1 is not used as the subsequent first inspection unit T1. It is set by the method of re-selection. Therefore, in the first inspection unit T1, all the wiring patterns P are sequentially selected one by one.

The power source means 3 is connected so as to be able to apply a specific voltage to the second inspection unit T2 via each SW1 in order to set a specific potential difference between the first inspection unit T1 and the second inspection unit T2. By the power source means 3, the potential of the second inspection unit T2 is changed, and the second inspection unit T2 is provided with a potential different from that of the first inspection unit T1.

The power source means 3 may be a DC power source or an AC power source as long as it can generate a specific potential difference between the first inspection unit T1 and the second inspection unit T2, and is not particularly limited. However, in order to detect the change in the current value in the first current detecting means 4 to be described later, it is preferable to use a variable DC power supply.

The specific potential difference applied by the power source means 3 is not particularly limited, but is preferably set to a potential difference of 1 to 10 V/μs. This is because, by using the potential difference in this range, the spark can be accurately detected in a short time.

As shown in FIG. 2A, the first current detecting means 4 is connected in series to the first inspection portion (wiring pattern P1) T1 via the switch SW2 and the stylus CP, and detects the current of the first inspection portion T1. The first current detecting means 4 is an ammeter which can measure the current value. The current detected by the first current detecting means 4 causes a potential difference between the first inspection unit T1 and the second inspection unit T2 by applying a specific voltage to the second inspection unit, and is affected by the potential difference. The current flowing through the first inspection unit T1.

Therefore, when the current value measured by the first current detecting means 4 indicates a current value equal to or greater than a specific value or a change in current value of a specific value or more, the first inspection unit T1 is displayed. A spark is generated between the second inspection portions T2. In other words, the spark between the two inspection units can be detected by the current value measured by the first current detecting means 4.

Since the first current detecting means 4 is connected to the first inspection portion (inspected pattern) T1 side, the contact between the second inspection portion (all wiring patterns other than the inspection pattern) T2 and the stylus CP is poor. The resulting spark is not detected by the first current detecting means. In addition, since the voltage is not applied to the first inspection unit T1 and is grounded via the stylus CP, the switch SW2, the first current detecting means 4, and the second current detecting means, the cause is not caused by A spark caused by poor contact between the first inspection unit (inspected pattern) T1 and the stylus CP.

Furthermore, even in the case where a second inspection portion (all wiring patterns other than the inspection pattern) T2 to which a specific voltage is applied and a metal frame near the wiring patterns are generated, a spark is generated (in the present application) In the case of the "suspected spark", the current does not flow on the side of the first inspection unit T1. Therefore, the insulation device 1 does not detect such a suspected spark. In this manner, the insulation inspection device 1 prevents the occurrence of a spark generated between the first inspection portion T1 and the second inspection portion T2, or does not cause such a spark. detected.

The first current detecting means 4 is not particularly limited as long as it can measure the current value at the time of generating a spark. However, it is preferable to detect a current value of 0.1 to 10 mA. The current value detected by the first current detecting means 4 is sent to the determining means 7 which will be described later.

The second current detecting means 5 is connected in series to the first inspection unit T1, and detects a current flowing in the first inspection unit T1. The second current detecting means 5 is similar to the above-described first current detecting means 4 in that the current flowing through the first detecting portion T1 can be detected in the same manner, but compared with the first current detecting means 4, There is a difference in the ability to detect the performance of a much smaller current.

By providing the second current detecting means 5, the current value flowing between the first inspection portion T1 and the second inspection portion T2 can be reliably measured. Therefore, the voltage detecting means 6 described later can be used to calculate the current value. 1 The resistance value between the inspection unit T1 and the second inspection unit T2.

The current measuring capability of the second current detecting means 5 is such that the current value required to calculate the resistance value between the first and second inspection portions T1, T2 as described above can be measured. It is not particularly limited, but it is desirable to detect a current value of 0.1 to 20 μA. The current value measured by the second current measuring means 5 is sent to the determination means 7.

The first current detecting means 4 is mainly provided to detect the occurrence of a spark associated with the first inspection unit (inspected pattern), and the second current measuring means 5 is for measuring the first inspection unit and the second inspection unit. The insulation resistance value between them is set. However, it should be understood that the performance of the galvanometer used may be used for both the first current detecting means 4 and the second current detecting means 5 by one galvanometer.

The voltage detecting means 6 is connected to the first inspection unit T1, and detects the voltage of the first inspection unit T1. In the voltage detecting means 6, a voltmeter capable of detecting the voltage value of the first inspection unit T1 can be used. The voltage value measured by the voltage measuring means 6 is sent to the determining means 7.

The determination means 7 receives the measured current value from the first current detecting means 4 and the second current detecting means 5, and the measured voltage value from the voltage measuring means 6, and determines the measured value based on the measured values. Whether the circuit board is a defective product. FIG. 3 is a schematic configuration diagram showing the function of the determination means 7. The determination means 7 includes a spark detecting unit 71, a power calculating unit 73, a resistance calculating unit 74, an insulation calculating unit 75, and a transmitting unit 72.

The determination by the determination means 7 is performed by comparing the current value according to the first current detecting means 4 with a predetermined reference value, and based on the comparison result, the product is either The spark detecting unit 71 that determines the defective product performs the determination. As a specific comparison method performed by the spark detecting unit 71, for example, the following three methods are exemplified.

In the first method, the current value detected by the first current detecting means 4 is directly compared with the reference value, and when the detected current value is larger than a specific value, it is determined that the current value is generated. There are ways to spark.

For example, in FIG. 4, the change in the current value shown by the broken line indicates the change in the good circuit substrate, and the change in the current value shown by the solid line is the defective substrate displayed on the inspection object. The change in the part exceeding the reference value A is to show that it is where the spark is generated. The reference value A when the first method is used is not particularly limited, but is set to 0.1 to 1.0 mA.

Further, when the determination is made by the first method, the power supply means 3 is set as a variable voltage power supply, and an appropriate circuit is provided so that the rise of the current value at the moment of applying the voltage does not exceed The way in which specific values are made is ideal. The determination means 7 is, for example, an A-D conversion circuit (not shown) that sequentially converts the measured current value (analog value) obtained by the first current detecting means and the second current detecting means into digital current data. And inputting the digital current data together with the digital reference data of the reference value A, and outputting a comparison circuit of a logical height "1" when measuring the case where the digital current data is more than the digital reference data. (not shown) to constitute.

In the second method, a circuit board of a good product is used in advance, and a change in current value is obtained as a reference current change value B, and then a current value and a reference current when a defective circuit board to be inspected is used are taken out. The difference between the change values B, when the difference exceeds the allowable range set in advance, it is determined as a spark.

For example, in FIG. 5A, the change in the current value shown by the broken line is the change in the current value (reference current change value B) displayed in the circuit substrate of the good product, and the current value shown by the solid line. The change is a change in the current value displayed in the circuit board of the defective product. Fig. 5B shows the difference between the measured current value and the reference current change value B shown in Fig. 5A, and the field A showing the difference exceeding the allowable range C is the place where the spark is generated. The allowable range C when the second method is used is not particularly limited, but is set to ±0.1 to 1.0 mA.

In the determination means 7, for example, an A-D conversion circuit (not shown) for sequentially converting a measured current value (analog value) from a circuit board to be inspected into digital current data can be used. And a digital reference current change value data of a reference current change value B previously stored in an appropriate memory (not shown); and a digital current reference and a digital reference corresponding to the read from the memory The current change value data is input, and the subtraction circuit (not shown) of the differential data is output; and in the subsequent stage of the subtraction circuit, when the differential data is more than the digital allowable range C data, the logical height is output "1" The composition of the comparison circuit (not shown).

In the third method, when a voltage is applied to the first inspection unit T1 by the power source means 3, a change in current is calculated every certain period of time, and when the current value changes from a decrease to an increase (current) When the slope of the change changes from 0 to positive, it is determined as a spark.

For example, in FIG. 6, the change in the current value shown by the broken line indicates the change in the good circuit substrate, and the change in the current value shown by the solid line is the defective substrate displayed on the inspection object. The change in the middle. The change in the current value of the good product shown by the broken line continues the direction toward the lower right, but the change in the current value of the defective product shown by the solid line shows that the current value is increasing at time t1, and this Site A is the place where the spark is produced.

For example, between time t1 and time t2, in the good product, the continuous holding current value is decreased (the amount of change with respect to the current value of the previous instant is negative), but in the defective circuit substrate, At time t1, the current value is increased (the amount of change with respect to the current value of the previous instant is positive), and it is understood that sparks are generated at this time. In the judgment criterion when the third method is used, since the current value is increased, the change in the current value is 0 or more, or only the change in the sharp current value is detected. In this way, a specific positive change value may be set in advance.

The determination means 7 is, for example, an A-D conversion circuit (not shown) that sequentially converts a measured current value (analog value) from a circuit board to be inspected into a digital current data; and a differential circuit (not shown) for differentially processing the digital current data; and a determination circuit for determining whether the output data of the differential circuit is positive or negative, or for determining whether the value exceeds a specific change value, or A comparison circuit (not shown) is constructed.

Referring to Fig. 3, the determination means 7 is provided with a transmission unit 72 that transmits a spark detection signal when a spark is generally detected from the spark detecting unit 71 as described above. In the display unit 72, a result of the spark detection can be visually observed, and an alarm sound or the like can be used to recognize the result by hearing.

The determination means 7 includes the electric power calculation unit 73, and calculates the transition of the electric power at the time of generating the spark from the current value of the first current detecting means 4 and the voltage value of the voltage detecting means 6. The power calculation unit 73 may be provided with an operation unit, and the calculation method may be set in advance by the user, or may be automatically calculated when a spark is detected.

The power calculation unit 73 can be provided, for example, by using a FIFO type memory FIFO (not shown) having an appropriate memory capacity, and via an appropriate A-D converter (not shown). The digital current data of the first current detecting means 4 and the digital voltage data of the voltage detecting means 6 are sequentially stored, and the means for storing the data is stopped at a specific time after the spark is generated (not shown) ), and can ensure the current data and voltage data at a specific time after the moment when the spark is generated. By providing the electric power calculation unit 73, it is possible to use the current data and the voltage data in a specific time after the moment when the spark is generated, and the selection means 2 to select which wiring is the micro-inspection pattern. The state of the spark detection time, the pattern to be inspected, the change of the electric power with time, the size of the spark, and the insulation breakdown are known.

Further, the determination means 7 includes the resistance calculation unit 74, and the second current detecting means 5 and the voltage detecting means 6 calculate the resistance value between the first inspection portion T1 and the second inspection portion T2. The resistance calculation unit 74 converts the measured current value of the second current detecting means 5 and the measured voltage value of the voltage detecting means 6 into a digital current by an appropriate A-D converter (not shown), for example. The value of the resistor and the value of the digital voltage can be obtained by using a dividing circuit (not shown).

By providing the resistance calculation unit 74 and the insulation determination unit 75 in this manner, the insulation resistance can be calculated while performing the spark detection. For example, the determination means 7 determines whether or not the first inspection unit T1 and the second inspection unit T2 are in an insulated state. The determination means 7 can be determined, for example, by using a comparator (not shown) that inputs a resistance value data and a reference resistance value.

The calculation results of the electric power calculation unit 73, the electric resistance calculation unit 74, and the insulation determination unit 75 are sent to the transmission unit 72 and displayed on the display unit 8.

The display means 8 can be detected or calculated by the first current detecting means 4, the second current detecting means 5, the voltage detecting means 6, the electric power calculating unit 73, the electric resistance calculating unit 74, and the insulation determining unit 75. The current value, voltage value, resistance value, power value, etc., as well as the determination result of whether or not the spark is good or not, and the determination result that the circuit board is a good product or a defective product are displayed on the screen. Moreover, the display means 8 can also display the values or states as described above in a time series diagram or a table. By displaying the time series in this way, the user of the insulation inspection apparatus 1 can visually confirm the occurrence state and size of the spark.

The above is the description of the configuration of the embodiment of the insulation inspection device 1 of the present invention.

[Insulation inspection method]

Fig. 7 is a flow chart showing an example of an inspection method of the insulation inspection device of the present invention. The computer program for carrying out the inspection method is, for example, stored in the memory means 10, and the insulation inspection is performed under the control of the control means 9.

First, the circuit board to be inspected is placed in the insulating inspection apparatus 1 and the specific straightness for detecting the spark is set (S1). Here, as the spark detecting method, the third method described above is described as an example, but the present invention is not limited thereto. In addition, in order to utilize the second method, the digital reference current change value data of the reference current change value B which is the current change value of the good product, and the digital allowable range C data for determining the good product are set in the memory means 10 in.

The inspection of the circuit board to be the object is started.

First, by selecting the wiring pattern of the first inspection unit (inspected pattern) T1 from the plurality of wiring patterns to be inspected, the remaining wiring pattern is selected as the second inspection unit T2. (S2). The first inspection unit is connected to the first and second current detecting means via SW2. The pattern constituting the second inspection unit is connected to the power source unit 3 by SW1. At this time, the plurality of wiring patterns forming the second inspection portion T2 are connected in parallel to each other.

After the wiring pattern of the circuit board is selected as the two groups of the first inspection unit T1 and the second inspection unit T2, a specific voltage is applied to the second inspection unit T2 by the power source means 3 (S3).

In this state, the first current detecting means 4 connected to the first inspection unit T1, the second current detecting means 5, and the voltage detecting means 6 measure the current and voltage of the first inspection unit T1 (S4). The current value and the voltage value measured by the first current detecting means 4, the second current detecting means 5, and the voltage detecting means 6 are sent to the determining means 7.

The spark detecting unit 71 of the determining means 7 calculates the difference data based on the current value measured by the first current detecting means 3 and the specific reference value (S5).

It is determined whether or not the difference data exists in the allowable range C data (S6).

When the difference data is within the allowable range C data, it is determined that there is no spark (no spark is detected) (S7). On the other hand, when the difference data is outside the allowable range C data, it is determined that it is detected. Spark (S8).

In step S8, when it is determined that a spark has occurred, the circuit board is determined to be defective (S10). When a spark is generated, it is displayed on the display means 8 by the transmitting unit 72.

When the spark is not detected, the insulation calculation unit 75 performs the insulation inspection based on the current value data obtained by the second current detecting means 5 and the voltage value data obtained by the voltage detecting means 6 (S9). In the insulation inspection, the current value and the voltage value obtained by the second current detecting means 5 and the voltage detecting means 6 are used to calculate the first inspection unit T1 and the second inspection via the resistance calculating unit 74 of the determining means 7. The resistance between the parts T2. In addition, in this flowchart, although the inspection of the insulation inspection is performed at the end of each spark inspection, the insulation inspection may be performed before the spark inspection, or the spark inspection and the insulation inspection may be performed simultaneously. engineering.

The resistance value data calculated by the resistance calculation unit 74 is sent to the insulation determination unit 75. The insulation determining unit 75 determines the insulation state by performing the calculated resistance value data and the reference resistance value data set in advance. When the calculated resistance value data is equal to or greater than the reference resistance value data, it is determined to be an insulated state, and the circuit substrate is determined to be good (S11), and the calculated resistance value data is lower than the reference resistance value. In the case of data, it is judged that it is not in an insulated state (S12), and the circuit board is judged to be defective (S10).

When it is determined that the defective product is the same, it is displayed on the display means 8 by the transmitting unit 72 as in the case of detecting the spark.

When both the spark inspection and the insulation inspection are completed, the next inspection unit T1 and the second inspection unit T2 are selected by the selection means 2, and the inspection is repeated until all the wiring patterns are used as the first inspection. The part T1 has been inspected.

Further, when the display means 8 is notified that a spark is generated and the content of the defective product is obtained, the current value data obtained from the first current detecting means 4 and the voltage detecting means 6 are automatically obtained by the user or the user. The voltage value data is calculated by the power calculation unit 73 of the determination means 7 to calculate the power value data. At this time, the calculated power value data is displayed on the display means 8.

Therefore, the user of the insulation inspection device 1 can immediately confirm the size of the spark or the like by visual observation or the like when a spark is generated. The above is the description of the embodiment of the insulation inspection method of the present invention.

[Advantages of the insulation inspection device and the insulation inspection method of the present embodiment]

(1) In the prior insulation inspection apparatus, for example, in the case where the wiring pattern and the probe (the stylus CP) in contact with the wiring pattern are in poor contact, when a spark is generated between the wiring pattern and the probe When the voltage drop occurs, this is detected as a spark between the wiring patterns of the circuit board. Further, when a spark is generated between the wiring pattern and the metal frame in the vicinity of the wiring pattern, similarly, this may be detected as a spark between the wiring patterns of the circuit board. That is, there is a problem that all the sparks generated on the circuit board are detected as sparks generated between the wiring patterns.

According to the insulation inspection apparatus and the insulation inspection method of the present embodiment, since the voltage is applied only to the second inspection unit, the potential difference is generated only between the first inspection unit and the second inspection unit. The current detecting means connected to the first inspection unit detects only the current flowing between the first inspection unit and the second inspection unit, and detects only the first inspection unit and the second inspection unit. A spark between any of the wiring patterns.

(2) In the prior insulation inspection apparatus, for example, in the relationship of the circuit components for forming the apparatus, it is impossible to detect a drop in voltage due to a sudden change in the applied voltage, and therefore it is necessary to The check time is set to be very long until the applied voltage rises to a specific voltage value. As a result, the inspection time required for the detection of the spark is also prolonged.

According to the insulation inspection apparatus and the insulation inspection method of the present invention, since the generation of the spark is determined when the current value is larger than the specific value, and the determination is made as a defective product, it can be made in a shorter time. Make judgments efficiently.

Further, according to the insulation inspection device and the insulation inspection method of the present embodiment, the insulation inspection device includes the second current detecting means having a range different from that of the first current detecting means, so that the first current detecting means can be used. The spark is detected and the leakage current is detected by the second current detecting means. Therefore, it is possible to perform insulation inspection and spark inspection at the same time, and the inspection time can be further shortened.

(3) In the conventional insulation inspection apparatus, for example, regarding the spark detection method, it is only possible to detect the spark by observing the time lapse of the voltage change and detecting the voltage drop, and it is impossible to analyze the generated spark. Condition or size.

According to the insulation inspection apparatus and the insulation inspection method of the present embodiment, since the insulation inspection apparatus includes the current detecting means, the voltage detecting means, and the display means, the current and the change of the voltage at the time of detecting the spark can be displayed. While the device is being displayed, the size (electricity) of the spark can also be calculated and displayed. Therefore, the state of the spark can be visually displayed to the user, and the user can easily grasp the state of the spark.

(4) In particular, in recent years, circuit boards have become more complicated, and wiring patterns have been complicated. Along with the complication of this wiring pattern, the area of the wiring pattern itself (the size of the network) is increased. For this reason, if a voltage is applied to the wiring pattern, the wiring pattern itself stores a charge, and it becomes easy to generate a spark. Further, since the circuit board itself is made finer, the spark due to foreign matter existing in the circuit board itself is likely to be generated.

According to the insulation inspection device and the insulation inspection method of the present embodiment, even if the wiring pattern is complicated, or the wiring pattern itself is charged, the first current detecting means is not affected, and only the measurement is performed. Current between wiring patterns.

Further, according to the insulation inspection device and the insulation inspection method of the present embodiment, the second inspection unit is formed by connecting a plurality of wiring patterns other than the wiring pattern of the first inspection unit in parallel, thereby preventing the The generation of sparks between the second inspection units. Therefore, it is possible to prevent sparks from occurring in the wiring pattern other than the inspection object.

Further, according to the insulation inspection device and the insulation inspection method of the present embodiment, since the voltage is applied only to the second inspection portion, the potential difference is generated only between the first inspection portion and the second inspection portion. Therefore, the first current detecting means connected to the first inspection unit detects only the current flowing between the first inspection unit and the second inspection unit, and can detect only the first inspection unit. A spark between the wiring pattern of any of the second inspection portions. Therefore, even if a spark (suspected spark) other than the wiring pattern to be inspected is generated, it can be prevented from being detected as a spark, and even if the wiring pattern is complicated, or the wiring pattern itself is tied There is charge and it will not be affected.

In this manner, the insulation inspection device and the insulation inspection method of the present embodiment are devices and methods for performing insulation inspection on a circuit board on which a plurality of wiring patterns are formed, and even if it is a complicated wiring pattern, the wiring pattern can be obtained. The spark and its condition are more accurately and surely detected, and the inspection time can be shortened to a shorter time than in the prior art.

[alternative example, etc.]

Hereinafter, the embodiments of the insulation inspection device and the insulation inspection method of the present invention are described, but the present invention is not limited to the embodiment. It should be understood that various additions, deletions, changes, etc. that can be easily performed by the same are also included in the present invention.

(1) As the pattern P formed on the circuit board, five types of wiring patterns are exemplified. However, the wiring pattern P is not limited to the five types of patterns, and the type, number, position, size, shape, and the like of the wiring pattern are not limited to the illustrated wiring patterns. In the circuit board 10, the wiring pattern is also a multilayer substrate that is expanded to a plurality of layers through holes (through holes).

(2) Among the selection means 2, the determination means 7, the memory means 10, and the like of the control means 9, although the individual constituent circuits are exemplified, the present invention is not limited thereto. Other circuits that can achieve their individual purposes can also be used.

(3) The pattern P formed on the circuit board 10 is a single first inspection unit (inspected pattern) and a second inspection unit other than the first inspection unit (all wiring patterns except the inspection pattern) To illustrate. However, the insulation inspection device performs inspection between the pattern to be inspected and the pattern adjacent to the substrate to cause insulation failure. As long as it is within the range that can achieve this purpose, a flexible explanation should be adopted for "all wiring patterns other than the pattern to be inspected".

In other words, it should be understood that the second inspection unit is set to "all wiring patterns except the pattern to be inspected", but the pattern that is adjacent to the pattern to be inspected without causing insulation failure is 2 Removal in the inspection section should also be included in the object of the present invention. For example, when the wiring of the circuit substrate 10 is divided into blocks, and the patterns are separated from each other between the blocks, and the insulation defects are not generated, they are in a single block. The first inspection unit and the second inspection unit are defined.

Similarly, the pattern which is not close to the adjacent pattern is removed, and such patterns do not become the objects of the first inspection unit and the second inspection unit during the insulation inspection.

Further, in order to escape the technical scope of the present invention, a plurality of wirings are removed from the second inspection portion without any purpose or effect, and such an embodiment is also included in the present invention.

(4) Further, the object of the present invention includes a computer program for causing the computer 9 to perform the insulation inspection method, and a recording medium on which the recording is recorded.

(5) A specific voltage is applied from the power source means 3 to the second inspection unit T2 at each inspection stage. Therefore, in each inspection stage, a step of charging the electric charge to the second inspection portion T2 may be provided.

(6) The inspection performed by the insulation inspection apparatus 1 is performed by selecting the pattern P of the circuit board 10 as the first inspection unit T1 and the second inspection unit T2 according to a specific rule, and in the second inspection unit T2. When a specific voltage is applied and a specific potential difference is generated between the first inspection unit T1 and the second inspection unit T2, the insulation inspector is detected by detecting the current flowing through the first inspection unit T1. Here, the first inspection unit is formed of a single wiring pattern selected as the inspection target, and the second inspection unit T2 is formed of all the wiring patterns except the first inspection unit. In the inspection, the wiring patterns are sequentially selected as the first inspection unit, and the insulation inspection with the second inspection unit is performed, and all the wiring patterns are selected as the first inspection unit and inspected, and the inspection is terminated. .

Therefore, in order to detect the leakage current flowing from the first inspection portion T1 formed by the single wiring pattern, in FIG. 1, FIG. 2A and FIG. 2B, between the single wiring pattern T1 and the earth (earth) The first current detecting means and the second current detecting means are connected.

However, the connection place of the first current detecting means 4 and the second current detecting means 5 is not limited thereto. The leakage current flowing through the first inspection portion T1 formed by the single wiring pattern is such that a specific voltage is applied to the second inspection portion T2 from the power source means 3, and the first inspection portion T1 is provided with insulation failure. Leakage current generated in the case. When there is no insulation failure in the first inspection unit T1, even if a specific voltage is applied from the power source means 3 to the second inspection unit T2, no current flows in the first inspection unit T1.

Therefore, either or both of the first current detecting means 4 and the second current detecting means 5 are connected between the power source means 3 and the second inspection unit T2, and the second inspection unit T2 is detected. The current flowing through can detect the presence or absence of insulation failure of the first inspection unit T1. In other words, either or both of the first current detecting means 4 and the second current detecting means 5 may be connected to the power source means 3 and the local area 2 inspection unit in FIGS. 1, 2A and 2B. T2 is between the divergence points. At this time, the current data detected by the first current detecting means 4 and the second current detecting means 5 is also sent to the control means 9.

The technical scope of the present invention is defined by the description of the scope of the appended patent application.

1. . . Insulation inspection device

2. . . Selection means

3. . . Power means

4. . . First current detecting means

5. . . Second current detecting means

6. . . Voltage detection means

7. . . Judging means

8. . . Display means

9. . . Control means

10. . . Memorization means

P. . . Wiring pattern

SW. . . switch

SWs. . . Switch group

T1. . . First inspection department

T2. . . Second inspection department

CP. . . Stylus

Fig. 1 is a schematic block diagram showing an example of an insulation inspection apparatus according to the present invention.

[ Fig. 2A] Fig. 2A is a view showing an example of a combination of a first inspection unit and a second inspection unit selected by the selection means of Fig. 1, and the uppermost wiring pattern P1 in the switch group SWs, It is selected as the first inspection unit T1, and the wiring patterns P2 to P5 are selected as the second inspection unit T2.

FIG. 2B is a view showing an example of a combination of a first inspection unit and a second inspection unit selected by the selection means of FIG. 1, and the wiring pattern P4 is used as the first inspection unit T1. The wiring patterns P1 to P3 and P5 are selected as the second inspection unit T2.

Fig. 3 is a schematic block diagram showing the function of the determining means of Fig. 1.

Fig. 4 is a graph showing changes in current values in a circuit board of a good product and a defective product. Here, the two-dotted line is the display reference value A.

[ Fig. 5A] Fig. 5A is a graph showing changes in current values in a circuit board of a good product and a defective product.

[Fig. 5B] Fig. 5B is a difference showing the current values shown in Fig. 5A. Here, one of the two dotted lines is a display allowable range.

Fig. 6 is a graph showing changes in current values in a circuit board of a good product and a defective product. Here, it is a display showing the change at time t1, t2.

Fig. 7 is a flow chart showing an inspection method performed by the insulation inspection device shown in Fig. 1.

1. . . Insulation inspection device

2. . . Selection means

3. . . Power means

4. . . First current detecting means

5. . . Second current detecting means

6. . . Voltage detection means

7. . . Judging means

8. . . Display means

9. . . Control means

10. . . Memorization means

SWs. . . Switch group

SW1, SW2. . . switch

10. . . Circuit substrate

P1~P5. . . Conduction pattern

CP. . . Stylus

Claims (10)

An insulation inspection device is an insulation inspection device that performs insulation inspection on a circuit board on which a plurality of wiring patterns are formed, and is characterized in that: a selection means is provided which is to be inspected from the plurality of wiring patterns The wiring pattern of one of the objects is selected as the first inspection unit, and all the wiring patterns to be inspected other than the first inspection unit are selected as the second inspection unit; and the power supply means is used for A specific potential difference is set between the first inspection unit and the second inspection unit, and a voltage is applied to the second inspection unit while being connected to the second inspection unit. The current detecting means detects the potential difference. a current flowing between the first inspection unit and the second inspection unit; and a determination means for comparing the current value detected by the current detecting means with a specific reference value, and thereby comparing the result It is determined whether the circuit substrate is a good product or a defective product. The insulation inspection device according to the first aspect of the invention, wherein the second inspection unit is formed by a wiring pattern other than the wiring pattern of the first inspection unit, and the wiring patterns are all connected in parallel. . The insulation inspection device according to the first aspect of the invention, wherein the current detection means is connected in series to the first inspection unit or the second inspection unit. The insulation inspection device according to the first aspect of the invention, wherein the plurality of conductor patterns are sequentially selected as the first inspection unit, and the defective product is determined as described above. When the current value is larger than the aforementioned reference value, the circuit board is judged to be defective. The insulation inspection device according to the first aspect of the invention, wherein the current detecting means includes a first current detecting means and a second current detecting means having two different ranges, and the first current detecting means Is provided for detecting the occurrence of a spark associated with the first inspection unit, wherein the second current detecting means is for measuring between the first inspection unit and the second inspection unit The insulation resistance value is set. The insulation inspection device according to the fifth aspect of the invention, further comprising: a display means for displaying the current value detected by the first current detecting means in a time series. The insulation inspection device according to claim 5, wherein the determination means includes a spark detection unit and a power calculation unit, wherein the spark detection unit is based on a current value measured by the first current detecting means. The electric power calculation unit detects the state of the spark based on the measured current value of the first current detecting unit and the measured voltage value of the voltage detecting unit. The insulation inspection device according to claim 5, wherein the determination means includes a resistance calculation unit, and based on a measured current value of the second current detecting unit and a measured voltage value of the voltage detecting unit To calculate the resistance value. An insulation inspection method is an insulation inspection method for insulating inspection of a circuit board on which a plurality of wiring patterns are formed, and is characterized in that one of the plurality of wiring patterns is to be inspected. The wiring pattern is selected as the first inspection unit, and all of the wiring patterns to be inspected other than the first inspection unit are selected as the second inspection unit; and the first inspection unit and the first (2) a step of applying a voltage to the second inspection unit when a specific potential difference is generated between the inspection units; and detecting the first inspection unit and the second inspection in a state where a voltage is applied to the second inspection unit a step of flowing a current between the portions; and comparing a current value flowing in the first inspection portion with a specific reference value, and by using the comparison result, determining whether the circuit substrate is good or not The steps of good products. A recording medium, which is a computer-readable recording medium, and a program for performing an insulation inspection method on a circuit board on which a circuit board having a plurality of wiring patterns is formed is inspected, and is characterized in that In the insulation inspection method, the wiring pattern to be inspected is selected as the first inspection unit from the plurality of wiring patterns, and the inspection target is selected in addition to the first inspection unit. a step of selecting a wiring pattern as a second inspection unit; and a step of applying a voltage to the second inspection unit to generate a specific potential difference between the first inspection unit and the second inspection unit; and a step of detecting a current flowing between the first inspection unit and the second inspection unit while a voltage is applied to the second inspection unit; and a current value flowing in the first inspection unit and The specific reference value is compared, and by the comparison result, the step of determining whether the circuit substrate is good or defective is determined.