TWI221925B - Apparatus and method for examining insulation of circuit board - Google Patents
Apparatus and method for examining insulation of circuit board Download PDFInfo
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- TWI221925B TWI221925B TW92106490A TW92106490A TWI221925B TW I221925 B TWI221925 B TW I221925B TW 92106490 A TW92106490 A TW 92106490A TW 92106490 A TW92106490 A TW 92106490A TW I221925 B TWI221925 B TW I221925B
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發明所屬之技術領域 顯示 法0 本發明係有關一種印刷電路基板 口口, ^ 狀晶以汉寻離子體 盗的電極板等電路基板之絕緣檢查駿置和絕緣檢查方 先前技術 路基板,通常是利 的絕緣情況是否良 斷,來檢查電路基 近年來,對於設有複數條配線的電 用絕緣檢查裝置,對各配線與其他配線 好(是否保證具有充分的絕緣性)進行判 板是否為優良品。 圖4是習知的絕緣檢查裝置的基本結構六音圖。 絕緣裝置100包括:用於在檢查對象的配^pi、p2的 接點之間施加高壓電壓V(比如:20 0 V)的可變電壓源 101、 用於測量施加在配線Pi、P2之間的電壓的電壓表 102、 連接在上述配線!^上的開關1〇3、用於測量在配\線 P1、P2之間流動的電流I的電流計丨〇 4、以及基於電壓表 1 0 2和電流計1 〇 4輸出的V和I計算出電阻值R (v /丨)、並根據 其電阻值R來判斷絕緣狀況是否良好的控制裝置1 〇 5。 在此絕緣檢查裝置100中,一旦由控制裝置1〇5接通了 開關103,可變電壓源1〇1的輸出電壓則被施加在配線ρι、 P2之間’由電,壓表1〇2測出的配線PI、P2之間的電壓值和 由電a十1 0 4測出的在配線P 1、P 2之間流動的電流值則被 輸入到控制裝置105。控制裝置1 05,在配線P1、ρ2之間施 加了可變電壓源1 〇 1的輸出電壓之後,在既定的時間根據The present invention relates to a display method of the technical field. The present invention relates to a printed circuit board, a circuit board, and an insulation inspection circuit board such as an electrode plate stolen by a Chinese ion-seeking plasma. The prior art circuit substrates are usually To check whether the insulation is good or not, to check the circuit base. In recent years, for electrical insulation inspection devices with multiple wirings, the wiring of each wiring and other wiring is good (whether sufficient insulation is guaranteed). Product. Fig. 4 is a six-tone diagram of the basic structure of a conventional insulation inspection device. The insulation device 100 includes: a variable voltage source 101 for applying a high voltage V (for example, 20 0 V) between the contacts of the test object pi and p2, and for measuring between the wirings Pi and P2. Voltmeter 102, switch 10 connected to the above wiring, ^ ammeter for measuring the current I flowing between the distribution lines P1, P2, 〇04, and based on the voltmeter 102 A control device 105 that calculates a resistance value R (v / 丨) from the V and I output from the ammeter 104 and determines whether the insulation status is good based on the resistance value R. In this insulation inspection device 100, once the switch 103 is turned on by the control device 105, the output voltage of the variable voltage source 101 is applied between the wirings p2 and P2. The measured voltage value between the wirings PI and P2 and the current value flowing between the wirings P 1 and P 2 measured by the electric circuit 104 are input to the control device 105. Control device 105 applies an output voltage of variable voltage source 101 between wirings P1 and ρ2, and then
1221925 五、發明說明(2) —-------- 檢測出來的電壓值v和電流值ί計算出配線P丨、p 2 阻值(絕緣電阻值)R= V/I,並判斷此絕緣電阻1,電 在預先設定的既定臨界值Re f以上,以此來判定電路疋否 是否良好。也就是,當絕緣電阻值R在臨界值Ref以基板 時’控制裝置丨〇 5就判斷配線p丨、p2之間的絕緣狀況f 好’而當絕緣電阻值R未達到臨界值R e f時,控制; 就判斷配線p 1、P 2之間的絕緣狀況為不良。 ^在配線P 1、P2之間施加了可變電壓源丨〇 i的輸出電壓 之後’不立即對絕緣狀況是否良好進行判斷,這是因為, 如圖\所示,在配線P1、P2之間剛剛施加了電壓v,配線間 的電壓還處在不穩定的狀態(圖5 (a )中的電壓上升的區 =),並且,在配線P丨、P2之間一瞬間有較大的過渡電流 流動,所以,要在配線P1、p2之間的電壓穩定在所施加的 電壓v上、且電流也處於穩定的既定時刻t2後才對絕緣狀 況是否良好進行判斷。 發明内容 發明所要解決的課題 但是’因為在檢查對象的配線p丨、p2之間施加了高壓 的直流電壓,這樣從施加電壓之後到經過一個既定時刻t21. 為止’會在配,線之間出現產生火花的現象,因此,會存在 配線P1、P 2之間的絕緣電阻值發生變化的不良情況。 一比如,在圖5中,如果在時刻t丨發生了火花,如虛線a 所示,配線之間的電壓就會在一剎那間急劇地下降,之後1221925 V. Explanation of the invention (2) —-------- The detected voltage value v and current value ί Calculate the wiring resistance values (insulation resistance value) R = V / I, and judge This insulation resistance 1 is judged whether the circuit is good or not by being electrically above a predetermined threshold value Re f which is set in advance. That is, when the insulation resistance value R is at the critical value Ref and the substrate is 'the control device 丨 05 judges that the insulation condition f between the wirings p 丨 and p2 is good' and when the insulation resistance value R does not reach the critical value R ef, Control; it is judged that the insulation between the wirings p 1 and P 2 is defective. ^ After the output voltage of the variable voltage source 丨 〇i is applied between wirings P1 and P2 ', it is not immediately judged whether the insulation is good or not, because, as shown in Figure \, between wirings P1 and P2 Immediately after the voltage v is applied, the voltage between the wirings is still in an unstable state (the area where the voltage rises in Fig. 5 (a) =), and there is a large transient current between wirings P 丨 and P2 for an instant. It flows, therefore, it is necessary to determine whether the insulation status is good after the voltage between the wirings P1 and p2 is stabilized at the applied voltage v and the current is also stable at a predetermined time t2. SUMMARY OF THE INVENTION The problem to be solved by the invention, however, is that “Because a high-voltage DC voltage is applied between the wiring p 丨 and p2 of the inspection target, such that after the voltage is applied until a predetermined time t21. Elapses,” it will appear between the wiring and the wiring. A spark phenomenon occurs, and therefore, there is a problem that an insulation resistance value between the wirings P1 and P2 changes. For example, in Figure 5, if a spark occurs at time t 丨, as shown by the dotted line a, the voltage between the wiring will drop sharply in an instant, and then
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再上升,與此同時,如虛線B所示,在一瞬間有較大的電 流流動,而絕緣電阻值!^在火花發生的一瞬間幾乎成為〇 之後,再逐漸增大。 'It rises again, and at the same time, as shown by the dotted line B, a large current flows at an instant, and the insulation resistance value! ^ Increases gradually after the spark occurs almost at 0. '
火花發生後,由於配線之間的電壓在朝施加電壓¥上 升的同時,在配線Ρ1、ρ 2之間流動的電流在下降,所以, 配線PI、Ρ2之間的絕緣電阻值r會增大。但是,由於因火’ 花而引起絕緣電阻值R發生變化,如虛線C、D所示,其增 大的波形也就處於不穩定狀態。這樣,如虛線^所示了 ^ 檢查時刻t2,絕緣電阻值R為臨界值Ref以上的,就可以类 斷電路基板為優良品,如虛線D所示,絕緣電阻值r比臨$ 值Rei小的,就判斷電路基板為不良品。 1 由於因火花而引起絕緣電阻值r比臨界值Re f小的,艮 :是按習知的絕緣檢查方法,也可以在檢測時刻」 =判Γ不良品,所以,對此種情況不存在什麼特= '、、、'而,對於如虛線C所示的、上述絕緣電阻值R在蹈 各值Ref以上的情況來說,由於按習知的絕緣檢查方法, 4 ϊ ί ί ί ΓB!刻t2將電路基板判斷為優良品,所以,名 而^ 6優良品的電路基板中,因絕緣檢查中火花的發4After the spark occurs, the voltage between the wirings rises toward the applied voltage ¥ and the current flowing between the wirings P1 and ρ2 decreases. Therefore, the insulation resistance value r between the wirings PI and P2 increases. However, since the insulation resistance value R is changed due to fire, as shown by the dotted lines C and D, the increased waveform is also in an unstable state. In this way, as shown by the dashed line ^ At the inspection time t2, if the insulation resistance value R is above the critical value Ref, the circuit board can be broken as a good product. As shown by the dashed line D, the insulation resistance value r is higher than the value of Re If it is small, the circuit board is judged to be defective. 1 Because the spark resistance causes the insulation resistance value r to be smaller than the critical value Re f, Gen: It is a conventional insulation inspection method, and it can also be judged at the detection time "= Γ defective products, so there is nothing in this situation In particular, for the case where the above-mentioned insulation resistance value R is above each value Ref, as shown by the dotted line C, due to the conventional insulation inspection method, 4 ϊ ί ί ΓB! t2 judges the circuit board as a good product. Therefore, in the circuit board with a good product name, 6 due to the occurrence of sparks during the insulation inspection 4
緣電阻似發生變化的電路基板、以及不是這種 ΓίΓ上路基板就都混在一起了。由於火花產生而引起释 ^一發生變化的電路基板會因火花的發生而多少受 製。t:: f,因、此,與沒有產生火花的電路基板相比較, 安ϊ電:ϋ ΐ有:降低’之後就會出現在該電路基板』 "^ °卩件、或者是在檢查安裝了零部件的電路基相The circuit substrates whose edge resistances seem to change, and the circuit boards which are not such ΓίΓ are all mixed together. Release caused by spark generation ^ The circuit board that is changed will be somewhat restrained by the occurrence of spark. t :: f. Therefore, compared with the circuit board that does not generate sparks, the electric power is: ϋ ΐ Yes: it will appear on the circuit board after it is lowered "" ^ ° 卩Base phase
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以及機械的疲勞而 引起電路基板不良 時,由於熱、電氣、 等問題。 經絕緣^裝置被判斷為優良品 又變成了*良品的發生,會使絕緣檢查裝 ^ 地被降低。因&,有必要設法不讓那 “員以 的發生而引起絕緣電阻值R發生變化的缘檢-中火曰化 這種情況的電路基板都混在一起, "·板^ 不疋 電路基板的情況發生。 了此破判斷為優良品的 置以= ΐ於,提供一種電路基板之絕緣檢杳裝 = 別可以確保將發生過火花的電路基ί 用以解決課題 本發明的 既定的直流電 定時刻,根據 線之間流動的 根據此電阻值 括·火化檢測 述配線之間發 測裝置檢測出· 根據本發 查方法,在配 間的電壓處於 絕緣檢 配線之 和由施 算出上 基板是 檢測因 及判斷 ,則判 態,本 既定的 定時刻 查裴置 間的電 加電壓 述配線 否為良 施加上 裝置, 斷該電 發明的 直流電 ,根據 間施加 時的既 上述配 值,再 在於包 起在上 火花檢 良品。 絕緣檢 配線之 和由施 的手段 電路基板之 壓,在上述 上述電壓值 電流值,計 來判斷電路 裝置,用來 生的火花; 有火花發生 明的另一形 線之間施加 穩定時的既 ,在配線之 壓處於穩定 所引起的在 之間的電阻 好,其特徵 述電壓而引 一旦由上述 路基板為不 電路基板之 壓,在上述 上述電壓值When the circuit board is defective due to mechanical fatigue, it is caused by thermal, electrical, or other problems. The occurrence of an inferior product that has been judged to be an inferior product by the insulative device has caused the inferiority of the insulation inspection device to be reduced. Because of &, it is necessary to try not to let the "results occur" to cause the insulation resistance value R to change-the circuit boards in this case are mixed together, " · board ^ not the circuit board In order to solve this problem, it is determined that the product is of good quality = to provide a kind of insulation inspection of the circuit board = do not ensure that the circuit base that has sparked will be used to solve the problem. At this time, the resistance value is included according to the resistance value flowing between the wires. The cremation detection is detected by the test device between the wirings. According to this inspection method, the voltage between the distributions is the sum of the insulation test wirings. Because of the judgment, the state is judged. At the given fixed time, check whether the electrical voltage applied to the wiring is good. Apply the device, and cut off the direct current of the invention. The quality of the spark check is good. The sum of the insulation check wiring is determined by the pressure of the circuit board, and the above-mentioned voltage value and current value are used to determine the circuit device. Incoming sparks; when a spark is applied between two other shaped wires, the resistance between them is good when the voltage of the wiring is stable, and its characteristics are described by the voltage. Not the voltage of the circuit board, above the above voltage value
2014-5547-PF(Nl).ptd 第8頁 1221925 五、發明說明(5) ^壓所引起的在上述配線之間流動的電流值,計 否=線之間的電阻值,再根據此電阻值來判斷電路 2良好,其特徵在於包括··檢測因上述施加電壓 的上述電壓處於穩定為止而發生在上述配線之間 j V驟,及一旦檢測出有火花發生,則不管基於電 =的電路基板是否為良好,均判斷該電路基板 的步驟。 根據以上的發明,在配線之間施加了既定的直 ,,在該配線之間的電壓處於穩定的既定時刻, ^線之間的電壓值V和該配線之間流動的電流值1, =^调檢測值计异出此配線之間的絕緣電阻值R = ^將此絕緣電阻㈣與預先設定的臨界值Ref進行比 ^對電路基板是否良好來進行判斷。也就是說, 2 ί Γ在臨界值Ref以上,則判斷電路基板為優 t果絕緣電阻值R比臨界值Ref小,❹丨斷電路基板 OU ° :且士根據上述絕緣電阻值來對電路基板進行 :查過程中,自配線之間施加既定的直 =之間的電壓處=穩定的既定時刻為止的期間内, :=間發生了火化’其火花的發生就能被檢測出, 根據電阻值的·判斷電路基板是否 基板直接被判斷為不良品。由此,就可; 絕緣檢查而被判斷為優良品的電路基板中有火花發 電路基板混入的可能性。 算出上 基板是 而引起 的火花 阻值而 不良品 流電壓 檢測出 再根據 I,通 較,則 如果絕 良品, 為不良 的絕緣 到該配 一旦配 而不管 的電路 止通過 生過的2014-5547-PF (Nl) .ptd Page 8 1221925 V. Description of the invention (5) The value of the current flowing between the above wirings caused by the voltage, whether calculated = the resistance value between the lines, and then based on this resistance The circuit 2 is judged to be good by a value, and is characterized by detecting a j V step that occurs between the wirings because the voltage of the applied voltage is stable, and once a spark is detected, the circuit based on electricity is not affected. Whether the substrate is good or not, the steps of the circuit substrate are judged. According to the above invention, a predetermined voltage is applied between the wirings, and when the voltage between the wirings is stable at a predetermined time, the voltage value V between the lines and the current value 1 flowing between the wirings, = ^ Adjust the detection value meter to distinguish the insulation resistance value R between the wirings. ^ Compare this insulation resistance ㈣ with a preset threshold Ref to determine whether the circuit board is good. In other words, if 2 Γ is above the critical value Ref, the circuit substrate is judged to be excellent. If the insulation resistance value R is smaller than the critical value Ref, the circuit substrate OU ° is broken: and the circuit is judged according to the above insulation resistance value. Substrate: During the inspection, a predetermined voltage is applied between the wirings = the voltage between the wiring = the predetermined time of stability, the fire occurs between: =, and its spark can be detected, according to the resistance Values • Determine whether the circuit board is directly judged as a defective product. As a result, there is a possibility that the circuit board, which is judged to be a good product by the insulation inspection, may have a spark in the circuit board. Calculate the spark resistance caused by the upper substrate and the defective product. The current voltage is detected and then compared with I. If the product is defective, it is defective insulation. Once the circuit is installed, the circuit will not pass.
2014-5547-PF(Nl).ptd 第9頁2014-5547-PF (Nl) .ptd Page 9
、發明說明(6) 而且’本發明的電路基板之絕緣檢查裝置,在上述配 為t間施加既定的直流電壓時,還可以將面積小的配線作 加向2位來施加上述直流電壓。這樣,由於在配線之間施 2既定的直流電壓時,是將面積小的配線作為高電位來施 小i述直流電壓的,所以,火花發生時流動的火花電流就 二將面積大的配線作為高電位的情況,由此可以減小由 化發生而引起的配線等的損傷。 於m ΐ且又因為施加直流電壓後,到配線之間的電壓處 要i疋=而要的時間比將面積大的配線作為高電位的情況 良好的判二 比面2 生:引起的電壓變化,面積小… 花的情況下,蔣A a 厅以,在基於電壓的變化來檢測火 測出火花。 、小的配線作為高電位還可以準確地檢 而且’本發明的雷 括操作裝置,用來改m板之、、、邑緣檢查裝置,還可以包 述既定時刻。並且,=、、、電路基板是否良好進行判斷的上 時刻,可以預先 f 2判斷電路基板是否良好的既定 根據此特徵, 良好進行判斷,的上述 ^作裝置來延遲對電路基板是否 的時間來監視是否有火:的情況下’因為可以有較長 的信賴度得以提高。而一 =生,所以,製品(電路基板) 情況下,因為縮短了檢查時間’所前上述既定時刻的 所以就可以提高檢查的效 2014-5547-PF(Nl).ptd 第10頁 五、發明說明(7) _________ 率。因此’通過設置操作裝置來改變 進行判斷的既定時刻’則可以兼顧產σ^路基板是否良好 果的平衡’來自由地設定上述既定時:的信賴度和檢查效 而且,本發明的電路基板之絕緣檢 檢測裝置’還可以包括用於檢測u的上述火花 裝置、…加電壓突然下降時則判芯,的電壓檢測 判斷裝置。具體地來說,上述火花檢測:f化二生的火花 次的信號和這次的信號;置和’將上 路基板之絕緣檢查方法,可以基於施 ^,上述電 發生。根據這些特徵,以 進订準確而有效地檢測。 j對火化的發生 而且,本發明的電路基板之絕 括工序控制裝置,一旦由火花檢測裝置檢^右运可以包 測出有火花,板之絕緣檢查方法’也是-旦檢 根據此特徵、:因為檢查工序。 火花發生,則可以省ς A:檢测出被檢查中的電路基板有 」从,去其後的檢杳工库,辦 對許多電路基板進行檢查時具有較好的檢查效率特別是在· 實施方式 構示Γ:有關本發明的絕緣檢查裝置的-個實施例的結 1221925 五、發明說明(8) 署η查裝置1,對於在未圖示的電路基板上分佈設 τ ’用在習知技術中已說明過的技術,來 mλ 絕緣狀態是否良好,當確認了所有的配 線Ρ1〜Ρ5與其他配線之間的絕緣狀況都為良好時,則可以 =:電?基板為優良品,而當只要存在一個絕緣狀況不 良的部分時,則將電路基板判斷為不良品。 而且,為瞭解決由上述火花發生而°出°現的問題,還配 置有一種在絕緣檢查中能夠檢測出配線之間發生過火花, 2在檢測出有火花發生時’則判斷電路基良品的 結構。 !緣檢查裝置1,具有可變電壓源2、電壓表3、與設 圖不的電路基板上的配線Ρ1Ρ5連接的開關電路4 、電流計5、控制裝置6、火花檢出電路7、D/A轉換器8、 1轉換益9和1〇。而且,D/A轉換器8將由控制裝置6向可 支電壓源2輸出的控制信號(控制輸出電壓的數值信號)轉 變成模擬信號。A/D轉換器9將從電壓表3輸入到控制裝置6 $,壓檢測信號(模擬信號)轉換成數值信號,a/d轉換器 10是將從電流計5冑入到㉟制裝置6的電流檢測信號(模擬 信號)轉換成數值信號。 、、、邑緣檢查裝置1,基本上是在圖4所示的習知的絕緣檢 —裝置100上追加了火花檢出電路7而構成的。也就是,絕 緣檢查裝置i的可變電壓源2、t壓表3、開關電路4、電流 。十5以及控制裝置6分別相當於絕緣檢查裝置丨〇 〇的可變電 壓源101、電壓表102、開關電路1〇3、電流計1〇4以及控6. Description of the invention (6) Furthermore, when the predetermined DC voltage is applied between the above-mentioned configurations of the circuit board insulation inspection device of the present invention, the small-area wiring can be applied to two places to apply the DC voltage. In this way, when a predetermined DC voltage is applied between the wirings, the wiring with a small area is applied as a high potential to apply the DC voltage. Therefore, the spark current flowing when a spark occurs is used as the wiring with a large area. In the case of a high potential, it is possible to reduce damage to wiring and the like caused by generation. At m ΐ and because DC voltage is applied, it takes i 配线 = to the voltage between the wirings. The time required is better than the case where a large area wiring is used as a high potential. The second aspect is the resulting voltage change. The area is small ... In the case of flowers, Jiang Aa Hall uses the change in voltage to detect fire and detect sparks. The small wiring can also be accurately detected as a high potential. Furthermore, the lightning device of the present invention includes an operation device for changing the m-plate inspection device, and can also describe a predetermined time. In addition, at the time when the circuit board is good or not, it can be determined in advance f 2 whether the circuit board is good. Based on this feature, it is good to judge. The above-mentioned operation device delays the time to monitor whether the circuit board is good. Is there a fire: the case 'because there can be a longer period of reliability to be improved. And so, in the case of products (circuit boards), because the inspection time is shortened, the inspection time can be improved. Therefore, the inspection efficiency can be improved. 2014-5547-PF (Nl) .ptd Page 10 V. Invention (7) _________ rate. Therefore, 'the set time for judging by setting an operating device' can take into account whether the production of the σ ^ circuit board is balanced or not 'freely setting the above-mentioned predetermined timing: the reliability and the inspection effect. Moreover, the circuit board of the present invention The insulation inspection and detection device may further include the above-mentioned spark device for detecting u, ... a voltage detection and judgment device for judging the core when the applied voltage suddenly drops. Specifically, the above-mentioned spark detection: the signal of the second spark and the current signal; and the method of checking the insulation of the on-board substrate may be based on the application of the above-mentioned electricity. Based on these characteristics, ordering can be accurately and efficiently detected. J to the occurrence of cremation Moreover, once the circuit board of the present invention has an absolute process control device, once it is detected by the spark detection device, it can be detected that there is a spark, and the insulation inspection method of the board is also-once inspected according to this feature: Because of the inspection process. If a spark occurs, you can save it. A: It is detected that the circuit board being inspected is “from”, go to the subsequent inspection warehouse, and have a better inspection efficiency when inspecting many circuit boards, especially in the implementation. Schematic representation Γ: The knot of an embodiment of the insulation inspection device of the present invention 1221925 V. Description of the invention (8) The inspection device 1 is used to distribute τ 'on a circuit board (not shown). The technology that has been described in the technology, is the insulation state of mλ good? When it is confirmed that all the wirings P1 to P5 and other wirings are in good insulation condition, then it can be =: electrical? The substrate is a good product, and if there is only one part with poor insulation, the circuit board is judged as a defective product. In addition, in order to solve the problem caused by the occurrence of the above-mentioned sparks, a type of sparks between wirings can be detected during the insulation inspection. 2 When a spark is detected, it is determined that the circuit is a good product. structure. The edge inspection device 1 has a variable voltage source 2, a voltmeter 3, a switch circuit 4 connected to wiring P1P5 on a circuit board that is not shown in the drawing, an ammeter 5, a control device 6, a spark detection circuit 7, D / A converters 8, 1 convert 9 and 10. Further, the D / A converter 8 converts a control signal (numerical signal for controlling the output voltage) output from the control device 6 to the supportable voltage source 2 into an analog signal. The A / D converter 9 is input from the voltmeter 3 to the control device 6 and the voltage detection signal (analog signal) is converted into a numerical signal. The a / d converter 10 is input from the ammeter 5 to the control device 6 The current detection signal (analog signal) is converted into a numerical signal. Basically, the inspection device 1 is basically formed by adding a spark detection circuit 7 to the conventional insulation inspection device 100 shown in FIG. 4. That is, the variable voltage source 2, the t-voltage gauge 3, the switching circuit 4, and the current of the insulation inspection device i. 10 and the control device 6 correspond to the variable voltage source 101, the voltmeter 102, the switch circuit 103, the ammeter 104, and the control unit of the insulation inspection device.
五 、發明說明(9) 制裝置1 0 5,各部件的功能也基本上是相同 儘管圖4所示的習知的絕緣檢查裝、。、 蕾為例來對檢測原理進行了說明,而實際,是以2拫配 杳:基板上形成有許多配線,根據同上:檢查的 查各配線之間的絕緣狀%,是該技 5相冋的原理來檢 板進:樣針對設置有許多配線的電:其 =仃檢查’但疋’為了說明其檢查原理 =路基 ,根,如以下所述,從配線中:」:數目 仃、、且合,來進行絕緣檢查。當然, 、田的配線進 也同樣可以詳述此檢查原理。、 。,對多數的配線 =P1、P2為兩端有接點的直線配 各的配線,配線心5為^ 4有接點的呈十字形的配線。I線P1,的各面積:大端5. Description of the invention (9) The manufacturing device 105 is basically the same in function of each component, although the conventional insulation inspection device shown in FIG. 4 is used. Lei took Lei as an example to explain the detection principle, but in reality, it is based on 2 拫: a lot of wiring is formed on the substrate, according to the same as above: check the insulation state between each wiring, which is the 5 phase of the technology The principle is to check the board: the sample is for electricity with a lot of wiring: its = 仃 check 'but 疋' in order to explain its inspection principle = roadbed, root, as described below, from the wiring: '': number 仃, and Close to conduct insulation inspection. Of course, the wiring of Yoshida can also detail this inspection principle. ,. For most wirings, P1 and P2 are straight wirings with contacts at both ends, and wiring core 5 is a cross-shaped wiring with 4 contacts. Areas of I line P1, big endian
Pl=P2<P3< P4- P5 有關此面積的内容將在後面詳細敘述。 而且’基於配線數目的不Π y , 關電路1❹3是由"固開關而構置100中的開 同的熹. 再风的而在本貫施例中,所了 =哥電路4的結構為轉換組開關SWi (i = i、2、 2、…5)而構成的Pl = P2 < P3 < P4- P5 The content of this area will be described in detail later. And 'based on the number of wirings, 关 y, the closed circuit 1❹3 is the same as the open circuit in 100, which is constructed by a "solid switch." In the present embodiment, the structure of the = 4 circuit is Switching group switch SWi (i = i, 2, 2, ... 5)
可變電轉換開關是由每根配_i(i = 1、2、...5)的遊 二電壓减2連接的開關Tl(1 = 1、2、…5)和與電流』J ^ "Λι tT、J 〇 定電:(變上墨源f :係用於向檢查對象的配線之間施加既 疋電[(M下稱為試驗電壓),$過由㈣轉換器8進行心The variable electrical transfer switch is a switch T1 (1 = 1, 2, ... 5) connected to each of the two voltages minus 2 of _i (i = 1, 2, ... 5) and the current "J ^ " Λι tT, J 〇 Fixed electricity: (change the ink source f: is used to apply the existing electricity to the wiring of the inspection object [(M is referred to as the test voltage), and the heart is converted by the electricity converter 8]
1221925 五、發明說明(10) 轉換的^制裝置的控制信號,其輸出電壓可以得到控制。 電壓表3 ’係用於測量高電位的配線和低電位的配線 的電壓,由此電壓表3測量到的電壓信息,經過A/D轉 換器9進行A/D轉換之後被輸入到控制裝置6中。 開關電路4,根據預先設定的組合,可以將如上所述 ◊,線P1 (工—1、2、…5 )作為檢查對象的配線,將各配線 」=絕緣檢查裝置1進行連接/切斷。轉換組開關SWi,包 配狳ΪΡ1連接在可變電壓源2上的正極開關n、以及將 SW2〜在電流計5上的負極開關M1。同樣,轉換開關 π Μτ? ι括將配線?2〜Ρ5連接在可變電壓源2上的正極 =〜Μ以及將配線Ρ2〜Ρ5連接在電流計5上的負極 = Μ2〜Μ5。開關電路4的各開㈣〜丁5⑻〜μ,是 控制名置6來對其開關轉換進行控制的。 電流計5 ’係用於測量在施加了電 換器1〇進行A/D轉換之後,被輸入到控制裝置6中;轉 火花檢查電路7,係用來檢測因施 花。如圖5(a )所示,由於一旦因”加電壓而發生的火 火花,可變電壓源2的輸出電壓就“二^ 電壓V而發生 過檢測此電壓&變化,料以檢 火、、-’所以’通 =電路7,比如可以由抽樣保持電路火、化比疋二發生。火花 八〜構為,可以按既定的週期對電壓的專構成。 進行抽樣,並將前次的電壓信號和^ /I出的^壓信號 較,一旦檢測出有電壓波形的下 、電壓仏號進行比 卜降(這次的電壓較前次電 $ 14頁 2014-5547.PF(Nl).ptd 1221925 五、發明說明(11) 壓小的情況),則輸出火花發生的信號。此火花檢出信 號’被輸入到控制裝置6。 控制裝置6包括:對開關電路4的各開關τ 1〜T5、Μ 1〜 Μ5進行on/〇FF (開關)轉換的轉換控制裝置61、利用電壓 表3檢測出的電壓值和電流計5檢測出的電壓值計算絕緣電 阻值R的電阻值計算裝置6 2、根據電阻值計算裝置6 2計算 出的電阻值R以及火花檢出電路7輸出的信號來判斷絕緣狀 況是否良好的判斷裝置6 3。1221925 V. Description of the invention (10) The output voltage of the control signal of the converted control device can be controlled. The voltmeter 3 'is used to measure the voltage of the high-potential wiring and the low-potential wiring. The voltage information measured by the voltmeter 3 is input to the control device 6 after being A / D converted by the A / D converter 9. in. The switch circuit 4 can be connected to / disconnected from each of the wirings '' = insulation inspection device 1 according to the preset combination as described above, with the wires P1 (1, 2, ... 5) as the inspection target wiring. The switch group switch SWi includes a positive switch n connected to the variable voltage source 2 and a negative switch M1 connecting SW2 to a current meter 5. Similarly, the transfer switch π Μτ? Ι will be wired? 2 ~ P5 are positive poles connected to the variable voltage source 2 = ~ M and negative poles connecting wirings P2 ~ P5 to the ammeter 5 = M2 ~ M5. Each of the switching circuits 4 to 5 to 5 is controlled by the control unit 6 to control its switching. The ammeter 5 'is used to measure the A / D conversion after the converter 10 is applied, and is input to the control device 6; the spark check circuit 7 is used to detect the cause of blooming. As shown in FIG. 5 (a), once a spark occurs due to “voltage application”, the output voltage of the variable voltage source 2 is “two voltages V” and this voltage & change is detected. , -'So'pass = circuit 7, for example, the sample hold circuit fire and chemical conversion ratio can occur. The sparks are composed of voltages that can be formed at predetermined cycles. Sampling and comparing the previous voltage signal with the voltage signal from ^ / I. Once the lower and upper voltage signals of the voltage waveform are detected, the voltage is reduced (this time the voltage is $ 14 compared with the previous electricity. 2014- 5547.PF (Nl) .ptd 1221925 V. Description of the invention (11) If the pressure is low), it will output the signal of spark occurrence. This spark detection signal 'is input to the control device 6. The control device 6 includes a switching control device 61 that performs on / 0FF (on / off) switching of each of the switches τ 1 to T 5 and M 1 to M 5 of the switching circuit 4, the voltage value detected by the voltmeter 3 and the detection by the ammeter 5. Resistance value calculating device 6 for calculating the insulation resistance value R based on the calculated voltage value 2. Judging device 6 for judging whether the insulation status is good or not according to the resistance value R calculated by the resistance value calculating device 6 2 and the signal output by the spark detection circuit 7 .
在本實施例中,轉換控制裝置6丨,如表1所示,對各 開關Τ1〜T 5、Μ1〜Μ 5進行0 N / 0 F F的轉換控制。 表1In this embodiment, as shown in Table 1, the switching control device 6 丨 performs switching control of 0 N / 0 F F on each of the switches T1 to T5 and M1 to M5. Table 1
SW1 SW2 SW3 SW4 SW5 T1 Ml T2 M2 13 M3 T4 M4 T5 M5 第1次 ON — — ON — ON _ ON ON 第2次 — — ON — ON ON ON 第3次 — — — —— ON __ ON ON 次 — — — — — —— ON — — ONSW1 SW2 SW3 SW4 SW5 T1 Ml T2 M2 13 M3 T4 M4 T5 M5 1st ON — — ON — ON _ ON ON 2nd — — ON — ON ON ON 3rd — — — — — ON __ ON ON times — — — — — —— ON — — ON
、也就是,為了檢查配線Ρ1和其他的配線Ρ2〜Ρ5的絕緣 狀況’在將開關M2〜Μ5全部接通(〇Ν)、使配線ρ2〜Ρ5處於 低電位之後,接通開關Τ 1使配線Ρ 1處於高電位(第1次檢 查)。這樣,在本實施例中,配線p i和p 2、 ρ 1和p 3、 ρ 1 和P 4、以及ρ 1和ρ 5之間的絕緣檢查就可以同時進行。這是That is, in order to check the insulation status of the wiring P1 and other wirings P2 to P5 'After all the switches M2 to M5 are turned on (ON) and the wirings ρ2 to P5 are at a low potential, the switch T1 is turned on to make the wiring P 1 is at a high potential (first inspection). Thus, in this embodiment, the insulation inspection between the wirings p i and p 2, p 1 and p 3, p 1 and P 4, and p 1 and p 5 can be performed simultaneously. this is
!221925 五、發明說明(12) 因為,本實施例的絕緣檢查裝置丨,即使不能檢測出是 哪條配線之間發生了火花,❻只要檢測出有火花發生就在 以將其電路基板作為不良品來進行區別,所以,只 何配線之間檢測出有火花發生就足夠了。如此,由於配 P1和其他的配線P2〜P5之間的絕緣檢查可以同時進行,所 以,對於配線P1和其他的配線P2〜P5的絕緣檢查,用i次 檢查就可以完成在分別進行各配線之間的絕緣檢查時所人需 =的5次的檢查,從而可以大大地縮短絕緣檢查所需要的而 日可間以下’對於第2次以後的檢查也同樣適用。 、 其次,為了檢查配線P2和其他的配線P3〜p5的絕緣狀 況,在將開關M3〜M5全部接通(ON),使配線P3〜p5處於低 電位之後,接通開關T 2使配線p 2處於高電位(第2次檢 查)。在這裏,沒有接通開關…是因為在第j次的檢查中已 經對配線PI、P2進行了絕緣檢查。 一 接下來’為了檢查配線P3和其他的配線P4、P5的絕緣 狀況’在將開關乂4、M5接通,使配線P4、P5處於低電位的 同時’、接通開關T3使配線P3處於高電位(第3次檢查)。 然後’為了檢查配線Ρ4和配線Ρ5的絕緣狀況,在將開 ΐ通丄使配線Ρ5處於低電位的同時,接通開關Τ4使配 線Ρ4處於高電位(第4次檢查)。 對上述各,開關的〇N/〇FF (開與關)的控制,還考慮了 以下的幾點。 #由=配,Pl〜p5各自都有靜電電容,在即將開始放火 化、”火花開始時的電壓Vsps (參照圖5 )相對應的正電221925 V. Description of the invention (12) Because the insulation inspection device of this embodiment does not detect which wiring has a spark, if the spark is detected, the circuit board is regarded as Good quality is used to distinguish, so it is enough to detect sparks between any wiring. In this way, since the insulation inspection between P1 and other wirings P2 to P5 can be performed at the same time, the insulation inspection of wiring P1 and other wirings P2 to P5 can be completed by i times. Insulation inspections are required for five inspections, which can greatly reduce the time required for insulation inspections, but less than a day. 'The same applies to the second and subsequent inspections. Secondly, in order to check the insulation of the wiring P2 and other wirings P3 to p5, after all the switches M3 to M5 are turned ON, and the wirings P3 to p5 are at a low potential, the switch T 2 is turned on to make the wiring p 2 High potential (2nd check). Here, the switch is not turned on ... because the wiring PI and P2 have been inspected for insulation during the jth inspection. Next, 'to check the insulation of wiring P3 and other wirings P4 and P5', while turning on switches 乂 4 and M5, and make wirings P4 and P5 at a low potential, 'turning on switch T3 brings wiring P3 at a high level Potential (3rd check). Then, in order to check the insulation status of the wiring P4 and the wiring P5, while the wiring P5 is turned on to make the wiring P5 at a low potential, the switch T4 is turned on to make the wiring P4 at a high potential (the fourth inspection). Regarding the control of ON / OFF (ON and OFF) of each of the above, the following points are also considered. # 由 = 配, Pl ~ p5 each have electrostatic capacitance, and the positive voltage corresponding to the voltage Vsps (refer to Figure 5) at the beginning of the ignition and the spark is about to start.
1221925 五、發明說明(13) 荷被充電到尚電位的配線(盘電壓 魄)h,伯闵氩t 而〜"、电查/原2的正接點連接的配 線)上仁因為靜電電容與配線的面穑 以,在將面積較大的配線作為高電、 、’、 較小的配線作為高電位的情況T m以及將面積 電壓VSPS,卻有G的電:使有相同的火花開始 Μ邮W。m 〇_ 電到前者中(即面積較大 ^ 、, ,^將面積較大的配線作為高電位時,火 花電流會比當將面積較小的配線作為高電位時的火花電流 大’這樣’ 一旦有較大的火花電流流動,配線等就要承受 較大的負荷,從而會產生配線等受到損傷的情況。 而且,當將面積較大的配線作為高電位的情況、以及 將面積較小的配線作為高電位的情況互相比較時,比起前 者’後者電壓上升到電壓V所要的時間較短。這樣,將面 積較小的配線作為高電位,比起將面積大的配線作為高電 位的情況來說,可以提前判斷時刻,從而縮短檢查時間。 並且,因火花發生而弓丨起的電壓變化(即Vsps與“… 之差),面積大的配線較面積小的配線小。因此,由於是 基於電壓的變化來檢測火花,所以,要是將面積大的配 作為高電位,就難以進行火花的檢測。 於是,在本實施例中,考慮到以上所述的情況, 行如上所述的絕緣檢查時,將面積小的配線作為高 而將面積大的’配線作為低電位。 ^ ’ 比如,在表1的第1次檢查中,是採用將具有比配 的面積大的其他配線P2〜P5接通負極開關成為低電位、 面積小的配線P1接通正極開關成為高電位。 f 1221925 五、發明說明(14) 汽叶5電所阻值:十算裝置62 ’根據電壓表3所測量的電壓v和電 抓。十5所測I的電流!來計算出電阻值r( = v/i)。 電 驗電壓^ f 63具有計時器63a ’用此計時器63a計算從試 通Γ到配線之間時的時刻t〇開始所經過的時間, 通過對在配線的雷懕#私雜—& # 士 ^ T iBi 圖5)計算出的PΦ Γ 態時的既定時刻t2 (參照 小進行出私,Γ峰電阻值R和予先設定的臨界值Rre f的大 φ 又,來判斷絕緣狀態是否良好。也就是,♦計曾 出來的電阻值R在臨 ’疋 田。十# 絕緣狀態為不良 界值Rrefj"下時,則判斷配線間的 否良ί:ίΓ斷3中在ΐ於上述絕緣電阻值Rfi絕緣狀態是彳 出_妒^ ,一旦有來自火花檢出電路7的火花檢 G 3二=用再“絕緣電阻值^判斷絕緣狀態 為,由於考慮到在絕緣檢查中發生 ,而使電路基板的絕緣特性的信賴 JL:: 將這種信賴度不可靠的電 去。 味檢查而被判斷為優良品的電路基板中 及的::檢二Γ法所進^二程,為例,來對本實施例所涉i 加的電所二牛在檢查對象的配線接點之間設定所要施 S 1 S 5 Λ i ^ t ^ ^ ^ ύ W丄ύ W D的5又疋條件,將開關 竹開關電路3的負極開關M i(i = l 、 2014-5547-PF(Nl).ptd 第18頁 1221925 五、發明說明(15) ' 2、〜5)、正極開關τ i(卜1、2、…5)順序接通(步驟#2、 #3),在檢查對象的配線之間施加試驗電壓的同時,開始 由計時器6 3 a的計時(步驟# 4 )。 其次,一旦數到既定的計數值(與時刻t2對應的計數 值)(步驟#5),則測量電壓值v和電流丨(步驟#6),再根據 此電壓值V和電流I計算出絕緣電阻值R(步驟#7)。然後, 判斷火花是否發生(步驟#8),如果有火花發生(步;驟#8的 YES),則判斷該電路基板為不良品(步驟#9)。 μ另一方面,如果沒有發生火花(步驟#8的⑽),就判 計算出來的絕緣電阻值r是否在臨界值Rref以上(步驟 #10)。如果絕緣電阻值R在臨界值卜以以上(步驟#1〇的 YES),就判斷配線間的絕緣狀況為良好(步驟#1丨),如果 在臨界值Rref以下(步驟#1〇的NO),則判斷該電路基板 不良品(步驟# 9)。 4 並且’對表1的第4次(配線P4和P5之間)檢查,如果w 步驟#1到步驟#11其處理還沒有結束(步驟#12的肋),則^ 回步驟# 1,對剩下的檢查次數反復地執行上述的處理,' = 果對表1所示的全部次數檢查完畢,則結束上述處理(步 驟# 1 2的Y E S) ’並判斷電路基板為優良品(步驟#丨3 ),产 結束整個絕緣檢查。 心而 如此,即,可以在配線的電壓處於穩定狀態時的既定 刻計算出電阻值R,通過比較此電阻值r和臨界值Rref的Z 小,來判斷配線的絕緣狀態是否良好,又可以在進行上、 判斷之前檢測出發生在配線之間的火花。由於在檢2出^1221925 V. Description of the invention (13) The wiring (panel voltage) h which is charged to the potential is h, Bomin arg and the " wiring of the positive contact of the electric inspection / original 2) because of the electrostatic capacitance and The wiring surface assumes that when a larger wiring area is used as a high voltage, and a smaller wiring is used as a high potential, T m and the area voltage is VSPS, but the electricity is G: so that the same spark starts. Post W. m 〇_ Electricity to the former (that is, larger area ^ ,,, ^ When the wiring with a larger area is used as a high potential, the spark current will be larger than that when the wiring with a smaller area is used as a high potential. Once a large spark current flows, the wiring and the like are subjected to a large load, which may cause damage to the wiring and the like. In addition, when a large-area wiring is used as a high potential, and a small-area wiring is used, When the wiring is compared with a high potential, the time required for the latter to rise to the voltage V is shorter than that of the former. In this way, a wiring with a small area is regarded as a high potential, and a wiring with a large area is regarded as a high potential. For example, it is possible to judge the time in advance, thereby shortening the inspection time. In addition, the voltage change caused by sparks (that is, the difference between Vsps and "...), the wiring with a large area is smaller than the wiring with a small area. The spark is detected based on the change in voltage, so if a large area is set as a high potential, it is difficult to detect the spark. Therefore, in this embodiment, the test In consideration of the above situation, when conducting the insulation inspection as described above, the wiring with a small area is made high and the wiring with a large area is made low. ^ 'For example, in the first inspection of Table 1, it is Use other wiring with larger area than P2 ~ P5 to switch on the negative switch to low potential, and wiring P1 with small area to switch on the positive switch to high potential. F 1221925 V. Description of the invention (14) Steam leaf 5 resistance Value: Ten calculation device 62 'Calculate the resistance value r (= v / i) based on the measured voltage v and the electric grip of the voltmeter 3 and the measured current I of the tenth 5! The test voltage ^ f 63 has a timer 63a 'Use this timer 63a to calculate the time elapsed from the time of the trial connection Γ to the time t0 between the wiring, and calculate it from the thunder in the wiring # 私 杂 — &# 士 ^ T iBi Figure 5) At a predetermined time t2 in the PΦ Γ state (referring to the small φ for private sale, the large φ of the peak value of the Γ peak resistance value R and a predetermined threshold value Rre f), to determine whether the insulation state is good. That is, When the resistance value R is in the 'Putian. Ten # insulation state is the bad threshold Rrefj ", Judging whether the wiring room is good or not: In the case of the break 3, the insulation state Rfi is above the insulation resistance value Rfi. When the spark detection from the spark detection circuit 7 is detected, the second is the insulation resistance value. ^ The insulation state is judged to be due to the insulation characteristics of the circuit board due to the occurrence of the insulation inspection. JL :: This reliability is not reliable. The circuit board judged to be a good product by the taste inspection. And :: The second pass of the inspection method Γ is used as an example to set the S 1 S 5 Λ i ^ t to be applied between the wiring contacts of the inspection object for the electric power station II added in this embodiment. ^ ^ ^ ύ W 丄 ύ WD's 5 conditions, will switch the negative switch M i (i = l, 2014-5547-PF (Nl) .ptd of the bamboo switch circuit 3) Page 18 1221925 V. Description of the invention (15 ) '2, ~ 5), the positive switch τ i (bu 1, 2, ... 5) is turned on in sequence (step # 2, # 3), and the test voltage is applied between the wirings to be inspected, and the timer starts 6 3 a timing (step # 4). Secondly, once it reaches the predetermined count value (count value corresponding to time t2) (step # 5), measure the voltage value v and current 丨 (step # 6), and then calculate the insulation based on this voltage value V and current I Resistance value R (step # 7). Then, it is determined whether a spark occurs (step # 8), and if a spark occurs (YES in step # 8), it is determined that the circuit board is defective (step # 9). On the other hand, if no spark occurs (发生 in step # 8), it is judged whether the calculated insulation resistance value r is above the critical value Rref (step # 10). If the insulation resistance value R is above the critical value (YES in step # 1〇), it is judged that the insulation condition between wirings is good (step # 1 丨). If it is below the critical value Rref (NO in step # 1〇) , It is judged that the circuit board is defective (step # 9). 4 And 'check the 4th time (between wiring P4 and P5) in Table 1, if w ##################################################### The above process is repeatedly performed for the remaining number of inspections. '= If all the inspections shown in Table 1 are completed, the above process is terminated (YES in step # 1 2)' and the circuit board is judged to be a good product (step # 丨3), the entire insulation inspection is completed. This is because the resistance value R can be calculated at a predetermined moment when the voltage of the wiring is in a stable state. By comparing the resistance value r and the Z of the critical value Rref is small, it can be judged whether the insulation status of the wiring is good. A spark that occurred between the wiring was detected before performing the above and judgment. Since check out 2 ^
2014-5547-PF(Nl).ptd 1221925 五、發明說明(16) :花時’就直接判斷電路基板為不良&,因此,可 由於在被判斷為優良品的電路美} Φ ^ ^ ^ ^ ^ 刃电路基板中混入了因絕緣檢查中 火化,發生而引起絕緣電阻值生變化的電路基板中 及不是這種情況的電路基板所彳丨如从 降。 略I板所引起的電路基板的信賴度下 而且’在上述實施例中’採用的是在計數值達 值日守、即,配線的電壓處於穩定狀態時的既定時刻,二 斷火花5否發生。然而’也可以不局限於此實施例也J 以在火化發生的時侯就判斷電路基板為不良品。 也就是說,如圖3所示,纟完成與上述實施例的步驟 #1〜步驟#4的處理大體相同的步驟#21〜步驟#24的處理之 後,就判斷火花是否發生(步驟#25),如果有火花發生 驟#25的NO),則判斷該電路基板為不良品(步驟#33)。 、另外,如果沒有火花發生(步驟#25的YES),就在計數 達到了既疋的什數值時(步驟# 2 6 ),測量電壓值v和電流值 1(步驟#27),再根據此電壓值v和電流1來計算電阻值R(步 驟#28) ’然後’判斷計算出來的電阻值r是否在臨界值 Rref以上(步驟#29),如果上述電阻值!^在臨界值以以以上 (步驟# 2 9的Y ES ),則判斷配線間的絕緣狀況為良好(步驟 #30),如果對所有次數的檢查其上述處理都結束了(步驟 # 3 1的Y ES) ’則判斷電路基板為優良品(步驟# 3 2 ),結束絕 緣檢查。另外,如果上述電阻值r比臨界值計以小(步驟 #29的NO),則判斷該電路基板為不良品(步驟#3 3)。 然而,火化並不是只在剛施加電壓後的過渡期(電壓2014-5547-PF (Nl) .ptd 1221925 V. Description of the invention (16): When it takes time, the circuit board is directly judged to be defective & therefore, it can be due to the beauty of the circuit judged to be a good product} Φ ^ ^ ^ ^ ^ Blade circuit boards are mixed with circuit boards that cause changes in insulation resistance due to cremation during insulation inspection and circuit boards that are not in this case. Under the reliability of the circuit board caused by the I board, and in the above-mentioned embodiment, the predetermined time when the count value reaches the value, that is, when the voltage of the wiring is in a stable state, is the second spark 5 occurred? . However, it is not limited to this embodiment, and it is also possible to judge that the circuit board is a defective product when a fire occurs. That is, as shown in FIG. 3, after completing the processing of steps # 21 to # 24 that are substantially the same as the processing of steps # 1 to # 4 in the above embodiment, it is determined whether a spark occurs (step # 25) If no spark occurs in step # 25, the circuit board is judged to be defective (step # 33). In addition, if no spark occurs (YES in step # 25), when the count reaches the previous value (step # 2 6), measure the voltage value v and the current value 1 (step # 27), and then according to this The voltage value v and the current 1 are used to calculate the resistance value R (step # 28). Then, it is judged whether the calculated resistance value r is above the critical value Rref (step # 29). If the above resistance value! ^ Is above the critical value (Y ES of step # 2 9), it is judged that the insulation condition of the wiring room is good (step # 30), and the above processing is completed if all the inspections are performed (Y ES of step # 3 1) 'then judge the circuit The substrate is a good product (step # 3 2), and the insulation inspection is finished. If the resistance value r is smaller than the threshold value (NO in step # 29), it is determined that the circuit board is defective (step # 3 3). However, cremation is not limited to the transition period (voltage
2014-5547-PF(Nl).ptd 第20頁 1221925 五、發明說明(17) 上升的時期)才發生,也又可能在電壓的穩定期發生。在 這種情況下,對於在達到時刻t2為止的穩定期内有火花發 生的電路基板來說,如上所述,會將其判斷為不良品,然 而在時刻12之後還繼續施加電壓的情況下,對於 刻t2之後還有火花發生的電路基板來說,就會造成如果在 時刻t2巧定為絕緣合格的話,也被判斷為優良品的情況 發生。XI樣,在被判斷為優良品的電路基板中又混入、 比如,該電路基板的發貨目的地的檢查者在遲於 路基板,❿一旦不良品的數量相對優良品的數 二 大的話’就會有損於製品(電路基板)的信賴度。因此例車: 要延遲该絕緣檢查裝置的判斷 '、 内來監視是否有火花的發生,。較長的時間 度,但在這種情況下,目L Λ 製品的信賴 描木m / 因為1次絕緣檢查所需要的時問合 私加,因此也就導致了檢查效率的降低。 寺1曰 借繁此正好相反的i - 番 桐 ,^ , 々要求,在上述實施例的結構上爯执 置-個,士。圖1的虛線所示,檢查者用來 #再- 1裝置11以及配置在控制裝 :二的 的時刻設定裝置64。檢查者 八、:更躬斷時刻 查精度(製品的信賴度)和檢查效率::;所=求的檢 裝置1!來變更,判斷時刻1 :;以:用操作 鈕構成,用來執行,比如,L、、 例女了以由1組按 者延遲判斷時刻的指令,可以基準;提前或 就能以一個既定的單位時二女人女、,判斷時刻 平1 f間栓刖或延遲於時刻t 2的一種鈇2014-5547-PF (Nl) .ptd Page 20 1221925 V. Description of the invention (17) Rising period), or it may happen during the voltage stabilization period. In this case, as described above, a circuit board having a spark in the stable period up to time t2 will be judged as a defective product. However, if a voltage is continuously applied after time 12, For circuit boards that still have sparks after t2, if the insulation is determined to be qualified at time t2, it will also be judged as a good product. XI, it is mixed in the circuit board that is judged to be a good product. For example, the inspector of the shipping destination of the circuit board is later than the road substrate, and once the number of defective products is relatively large compared to the number of good products' It will damage the reliability of the product (circuit board). For this example, the judgment of the insulation inspection device must be postponed to monitor the occurrence of sparks. It takes a long time, but in this case, the reliability of the product L Λ tracing wood m / because the time required for a single insulation inspection is privately added, which also leads to a reduction in inspection efficiency. Temple 1 said that the i-Pantong, ^, 繁, which is the opposite of this, requires that the structure of the above embodiment be implemented one by one. As indicated by the dashed line in FIG. 1, the inspector uses # 再 -1 device 11 and a time setting device 64 arranged in the control device: two. Inspector VIII: More time to check the accuracy (reliability of the product) and inspection efficiency ::; == the required inspection device 1! To change, to judge the time 1: to: use the operation button to perform, For example, L ,, and so on can be benchmarked by a group of people to delay the judgment of the time, which can be benchmarked; two women and women can be judged in advance or in a predetermined unit, and the time of judgment is tied between 1 f or delayed. t 2
1221925 五、發明說明(18) 構。 根據此結,,如圖5所示,當設定較時刻七 個既定時間的時刻13為生丨邮口生十丨士 m ^ $ — a 士力女认為^斷時刻時,因為可以檢測出在上 述貫施例中沒有檢測出的,尤性μ + 〇 u w λ ^ 』的,在時刻t 2到時刻13之間發砵的 火花(如虛線E所示),從而脾φ μ蚊1 〈间發生的 攸而將電路基板判斷為不良 樣就可以減少如上所述的力雪玫盆α ^ ^ ^ 7处的在電路基板發貨目的地, 對該基片再重新做絕緣檢杳時而 一 柘,你而矸以祛制0似一今而破判斷為不良品的電路基 板,伙而可以使製品的信賴度得到提高。 發明效果 根據 之間施加 的在配線 出來的電 絕緣電阻 而引起配 良品’所 斷為優良 並且 電壓時, 壓的,所 的配線作 起的配線 線之間的 的電路基 直流電壓 動的電流 鼻出此配 斷電路基 有火花發 以確實地 路基板中 本發明, 積小的配 花發生時 位的情況 傷。並且 定所需要 本發明 既定的 之間流 流來計 值來判 線之間 以,可 品的電 ,根據 是將面 以,,火 為向電 等的損 電壓穩 板之絕 ’在檢 的同時 線之間 板是否 生時, 防止通 ,混入 由於在 線作為 流動的 ’這樣 ,又因 的時間 緣檢查 测出由 ’又根 的絕緣 為良好 則直接 過基於 有火花 配線之 高電位 火花電 可以減 為施加 比將面 裝置, 此施加 據施加 電阻值 ,而當 判斷電 電阻值 發生的 間施加 來施加 流則小 少因火 直流電 積大的 由於在配線 電壓所引起 電壓和檢測 ’再根據此 因施加電壓 路基板為不 判斷而被判 電路基板。 既定的直流 上述直流電 於將面積大 花發生而引 壓後,到配 配線作為南1221925 V. Description of Invention (18) Structure. According to this result, as shown in FIG. 5, when the time 13 is set to be seven of the given time from the current time 丨 the postal student is ten shi m ^ $ — a when Shili Nu thinks that ^ break time, because it can be detected The sparks that are not detected in the above-mentioned examples, particularly μ + 〇uw λ ^ ′, occur between time t 2 and time 13 (as shown by the dotted line E), so that the spleen φ μ mosquito 1 < If the circuit board is judged to be bad, it can reduce the above-mentioned force snow rose basin α ^ ^ ^ 7 at the circuit board shipping destination, and then perform insulation inspection on the substrate again. Immediately, you can eliminate the circuit board that is judged to be a defective product like 0, so that you can improve the reliability of the product. ADVANTAGE OF THE INVENTION According to the electrical insulation resistance applied to the wiring, the good quality product is broken, and when the voltage is high, the circuit-based DC voltage between the wiring wires is caused by the current nose. As a result of this distribution circuit, sparks are generated in order to secure the circuit board in the present invention, and a small amount of flower arrangement occurs at the time. In addition, it is necessary to determine the current value of the current according to the present invention to determine whether the electricity between the lines can be obtained, based on the fact that the surface of the voltage loss is stable, such as fire, and electricity. At the same time, when the board between the wires is live, prevent the connection, and mix in. Because the wire is flowing, this time, and because of the time margin check, the insulation of the root is good, and it can be directly passed by the high potential spark electricity based on the spark wiring. Reduce the application ratio to the surface device, this application is based on the applied resistance value, and when it is judged that the electrical resistance value occurs, the applied current is less due to the fire and direct current product due to the voltage and detection caused by the wiring voltage. The circuit board was judged because the circuit board to which the voltage was applied was not judged. The above-mentioned direct current is induced by the large area of the flower, and then the distribution line is used as the south
立、贤π說明 電位的情況要短,這揭 基板是否良好的判斷眭Ζ以提前根據上述電阻值判斷電 而曰卢I 時刻,從而縮短檢查時間。 而且,在基於雷厭k m r ^ ^ ^ pi i的變化來檢測火花的情況下,由 囚人化發生所引起的φ蔽、 ^ 献綞西i ^ 吳的電屢變化,面積小的配線比面積大 酉己線要大,所以,通過將面積小的配線作為高電位可以 確地檢測出火花。 、 並且,本發明,因為還具備用來改變判斷電路基板 否良好的上述既定時刻的操作裝置,這樣可以兼顧產品 #賴度和檢查效果的平衡,自由地設定上述既定時刻。 路 於 的 準 的 1221925 圖式簡單說明 圖1係有關本發明的絕緣檢查裝置的一個實施例的結 構示意圖。 圖2係有關絕緣檢查方法的流程圖。 圖3係有關絕緣檢查方法的其他實施例的流程圖。 圖4係習知的絕緣檢查裝置的結構示意圖。 圖5係有關配線之間的電壓、在配線之間流動的電 流、以及電阻值變化的示意圖。 符號說明 2 電壓源 4開關電路 6控制裝置 8 D/A轉換器 1 0 A/D轉換器 6 1轉換控制裝置 6 3判斷裝置 6 4 時刻設定裝置 1 0 1 電壓源 I 絕緣檢查裝置 3 電壓表 5 電流計 7 火花檢出電路 9 A/D轉換器 II 操作裝置 62電阻值計算裝置 6 3 a計時器 1 0 0 絕緣裝置 102 電壓表 1 0 4 電流計 1 0 3 開關 1 0 5控制裝置Note that the situation of the potential is shorter, which reveals whether the substrate is good or not, so that it can judge the electrical moment according to the above resistance value in advance, thereby shortening the inspection time. Moreover, in the case of detecting sparks based on the change of thunder-strain kmr ^ ^ ^ pi i, the electric power of φ,, 缍,, 吴, 吴, and 化 due to the occurrence of prisoner changes frequently, and the wiring with a small area is larger than the area. Since the self-wiring line is large, it is possible to reliably detect a spark by using a small-area wiring as a high potential. In addition, the present invention is also provided with an operating device for changing the above-mentioned predetermined time for judging whether the circuit board is good or not, so that the balance of the product #reliance and the inspection effect can be taken into consideration, and the above-mentioned predetermined time can be freely set. The standard 1221925 is based on a simple diagram. Figure 1 is a schematic structural diagram of an embodiment of an insulation inspection device according to the present invention. Figure 2 is a flowchart of the insulation inspection method. FIG. 3 is a flowchart of another embodiment of the insulation inspection method. FIG. 4 is a schematic structural diagram of a conventional insulation inspection device. Fig. 5 is a schematic diagram showing changes in voltage between wirings, current flowing between wirings, and resistance values. DESCRIPTION OF SYMBOLS 2 Voltage source 4 Switching circuit 6 Control device 8 D / A converter 1 0 A / D converter 6 1 Conversion control device 6 3 Judging device 6 4 Time setting device 1 0 1 Voltage source I Insulation inspection device 3 Voltmeter 5 Ammeter 7 Spark detection circuit 9 A / D converter II Operating device 62 Resistance value calculation device 6 3 a Timer 1 0 0 Insulation device 102 Voltmeter 1 0 4 Ammeter 1 0 3 Switch 1 0 5 Control device
2014-5547-PF(Nl).ptd 第24頁2014-5547-PF (Nl) .ptd Page 24
Claims (1)
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002142608A JP3546046B2 (en) | 2001-09-26 | 2002-05-17 | Circuit board insulation inspection apparatus and insulation inspection method |
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| Publication Number | Publication Date |
|---|---|
| TW200307139A TW200307139A (en) | 2003-12-01 |
| TWI221925B true TWI221925B (en) | 2004-10-11 |
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| TW92106490A TWI221925B (en) | 2002-05-17 | 2003-03-24 | Apparatus and method for examining insulation of circuit board |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI394961B (en) * | 2005-10-18 | 2013-05-01 | Nidec Read Corp | Insulation inspection equipment and insulation inspection methods |
| TWI498571B (en) * | 2013-03-29 | 2015-09-01 | Nidec Read Corp | Method and apparatus of inspecting insulation |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103983906A (en) * | 2014-06-11 | 2014-08-13 | 贵州贵航汽车零部件股份有限公司华阳电器公司 | Detection method of insulation property of plastic part with metal insert |
| CN114740266B (en) * | 2022-04-08 | 2023-06-13 | 东方电气集团东方电机有限公司 | Insulation monitoring method, device, electronic equipment and storage medium |
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2003
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI394961B (en) * | 2005-10-18 | 2013-05-01 | Nidec Read Corp | Insulation inspection equipment and insulation inspection methods |
| TWI498571B (en) * | 2013-03-29 | 2015-09-01 | Nidec Read Corp | Method and apparatus of inspecting insulation |
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