TWI779649B - Testing system, judging device, testing method for testing insulation of a circuit board, and computer-readable recording medium thereof - Google Patents
Testing system, judging device, testing method for testing insulation of a circuit board, and computer-readable recording medium thereof Download PDFInfo
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Abstract
一種檢測系統的實施方式,用於檢測一電路板的絕緣性,該檢測系統包括:一電流量測裝置、一類比數位轉換裝置、一記錄裝置、一判斷裝置。電源供應裝置係用以提供電源於該檢測系統。電流量測裝置係用以量測該電路板上一待測電路的一電流訊號,並輸出一量測結果。類比數位轉換裝置用以將該量測結果轉換為一數位訊號。記錄裝置,記錄該數位訊號。判斷裝置,依該數位訊號的變化波形判斷該電路板的絕緣性以輸出一判斷結果,其中該判斷結果係基於先前量測之至少一先前量測波形而輸出。 An embodiment of a detection system is used to detect the insulation of a circuit board. The detection system includes: a current measuring device, an analog-to-digital conversion device, a recording device, and a judging device. The power supply device is used to provide power to the detection system. The current measuring device is used to measure a current signal of a circuit to be tested on the circuit board, and output a measurement result. The analog-to-digital conversion device is used to convert the measurement result into a digital signal. The recording device records the digital signal. The judging device judges the insulation of the circuit board according to the changing waveform of the digital signal to output a judging result, wherein the judging result is output based on at least one previous measurement waveform of the previous measurement.
Description
本發明係關於一種電路板檢測技術,更特別的是關於用於檢測一電路板的絕緣性的檢測系統、判斷裝置、檢測方法以及其電腦可讀取紀錄媒體。 The present invention relates to a circuit board testing technology, more particularly to a testing system, a judging device, a testing method and a computer-readable recording medium for testing the insulation of a circuit board.
在習知電路板檢測技術中,檢測印刷基板之電路圖案間之絕緣狀態係透過檢查探針施加檢查電壓於印刷基板之電路圖案之間,且根據該檢查電壓與流動於檢查探針之電流值求得絕緣電阻值,並基於該絕緣電阻值檢查絕緣狀態是否良好。此外,亦有習知電路板檢測技術係藉由施加檢查電壓後再檢查探針之電壓上升的斜率來判斷是否代表有火花產生的風險。 In the conventional circuit board inspection technology, the insulation state between the circuit patterns of the printed substrate is detected by applying an inspection voltage between the circuit patterns of the printed substrate through the inspection probe, and according to the inspection voltage and the current value flowing in the inspection probe Find the insulation resistance value, and check whether the insulation condition is good or not based on the insulation resistance value. In addition, there is also a conventional circuit board inspection technology that checks the rising slope of the voltage of the probe after applying the inspection voltage to determine whether there is a risk of sparks.
一般來說,習知檢測技術係將印刷基板之多個電路圖案的多個測試點的訊號匯流到測試設備以進行絕緣狀態檢測。在測試點匯流到測試設備的架構下,習知檢測技術只能檢測出該印刷基板整體來說絕緣狀態是否良好,未能指出哪個測試點有火花產生的風險。再者,絕緣狀態是否良好的判斷方式與判斷準則的參數是依靠人力的經驗值來確定,這是很耗費時間與取決於個人的能力,也有誤判的可能性。 Generally speaking, the conventional detection technology is to combine the signals of multiple test points of multiple circuit patterns on the printed substrate to the test equipment for insulation state detection. Under the framework of converging the test points to the test equipment, the conventional detection technology can only detect whether the overall insulation state of the printed substrate is good, but fails to point out which test point has the risk of sparks. Furthermore, the method of judging whether the insulation state is good or not and the parameters of the judging criteria are determined by human experience, which is very time-consuming and depends on the ability of the individual, and there is also the possibility of misjudgment.
是以,印刷基板的絕緣狀態的檢測技術仍有待改善。 Therefore, the detection technology of the insulation state of the printed substrate still needs to be improved.
本發明之一目的在於提出一種用於檢測電路板的絕緣性的檢測技術。就個別測試點而言,此技術利用一種判斷裝置,其基於先前量測之至少一先前量測波形,並依據與被測電路板回饋的量測結果對應的數位訊號的變化波形,來判斷該電路板的絕緣性以輸出判斷結果。 One object of the present invention is to provide a detection technique for detecting the insulation of a circuit board. As far as individual test points are concerned, this technology uses a judging device based on at least one previous measurement waveform of the previous measurement, and according to the change waveform of the digital signal corresponding to the measurement result returned by the circuit board under test, to judge the The insulation of the circuit board is used to output the judgment result.
為達至少上述目的,依據本發明的一第一方面,提出一種檢測系統的實施方式,用於檢測一電路板的絕緣性,該檢測系統包括:一電流量測裝置、一類比數位轉換裝置、一記錄裝置、一判斷裝置。電源供應裝置係用以提供電源於該檢測系統。電流量測裝置係用以量測該電路板上一待測電路的一電流訊號,並輸出一量測結果。類比數位轉換裝置用以將該量測結果轉換為一數位訊號。記錄裝置,記錄該數位訊號。判斷裝置,依該數位訊號的變化波形判斷該電路板的絕緣性以輸出一判斷結果,其中該判斷結果係基於先前量測之至少一先前量測波形而輸出。 In order to achieve at least the above-mentioned purpose, according to a first aspect of the present invention, an embodiment of a detection system is proposed for detecting the insulation of a circuit board. The detection system includes: a current measuring device, an analog-to-digital conversion device, A recording device and a judging device. The power supply device is used to provide power to the detection system. The current measuring device is used to measure a current signal of a circuit to be tested on the circuit board, and output a measurement result. The analog-to-digital conversion device is used to convert the measurement result into a digital signal. The recording device records the digital signal. The judging device judges the insulation of the circuit board according to the changing waveform of the digital signal to output a judging result, wherein the judging result is output based on at least one previous measurement waveform of the previous measurement.
於該檢測系統的一實施例中,上述之電源供應裝置所提供之掃描頻率範圍為約20百萬赫茲到約80百萬赫茲。 In an embodiment of the detection system, the scan frequency range provided by the power supply device is about 20 megahertz to about 80 megahertz.
於該檢測系統的一實施例中,該檢測系統更包括:一波形資料庫,儲存該先前量測波形。 In an embodiment of the detection system, the detection system further includes: a waveform database storing the previously measured waveforms.
於該檢測系統的一實施例中,該判斷裝置包括一人工智慧引擎,其由該先前量測波形所訓練,且該判斷結果係由該人工智慧引擎所輸出。 In an embodiment of the detection system, the judgment device includes an artificial intelligence engine trained by the previous measurement waveform, and the judgment result is output by the artificial intelligence engine.
於該檢測系統的一實施例中,該人工智慧引擎採用自動編碼(autoencoder)模型。 In an embodiment of the detection system, the artificial intelligence engine uses an autoencoder model.
於該檢測系統的一實施例中,該判斷裝置包括一比較器,其比較該變化波形與該先前量測波形,以輸出該判斷結果。 In an embodiment of the detection system, the judging device includes a comparator, which compares the changing waveform with the previous measurement waveform to output the judging result.
為達至少上述目的,依據本發明的一第二方面,提出一種判斷裝置的實施方式,用於一檢測系統中以檢測一電路板的絕緣性,該檢測系統包括用以量測該電路板上一待測電路的一電流訊號以輸出一量測結果的一電流量測裝置,以及記錄該量測結果之數位訊號之一變化波形的一記錄裝置,該判斷裝置包括:一波形資料庫及一人工智慧引擎。波形資料庫儲存至少一先前量測波形。人工智慧引擎,其由該先前量測波形所訓練,用於依該變化波形判斷該電路板的絕緣性。 In order to achieve at least the above purpose, according to a second aspect of the present invention, an embodiment of a judging device is proposed, which is used in a detection system to detect the insulation of a circuit board. A current measuring device for outputting a measurement result of a current signal of a circuit to be tested, and a recording device for recording a changing waveform of the digital signal of the measurement result, the judging device includes: a waveform database and a AI engine. The waveform database stores at least one previously measured waveform. An artificial intelligence engine trained by the previous measurement waveform is used for judging the insulation of the circuit board according to the changing waveform.
於該判斷裝置的一實施例中,該檢測系統更包括一電源供應裝置,用以提供電源於該檢測系統,且所提供之掃描頻率為約20百萬赫茲到約80百萬赫茲。 In an embodiment of the judging device, the detection system further includes a power supply device for providing power to the detection system, and the provided scanning frequency is about 20 megahertz to about 80 megahertz.
於該判斷裝置的一實施例中,該檢測系統更包括一類比數位轉換裝置,用以將該量測結果轉換為該數位訊號。 In an embodiment of the judgment device, the detection system further includes an analog-to-digital conversion device for converting the measurement result into the digital signal.
於該判斷裝置的一實施例中,該檢測系統更包括一記錄裝置,記錄該數位訊號。 In an embodiment of the judging device, the detection system further includes a recording device for recording the digital signal.
於該判斷裝置的一實施例中,該人工智慧引擎採用自動編碼(autoencoder)模型。 In an embodiment of the judging device, the artificial intelligence engine adopts an autoencoder model.
為達至少上述目的,依據本發明的一第三方面,提出一種檢測方法的實施方式,用於檢測一電路板的絕緣性,包括:量測該電路板上一待測電路的一電流訊號,並輸出一量測結果;將該量測結果轉換為一數位訊號;記錄該數位訊號;以及依該數位訊號的變化波形判斷該電路板的絕緣性以輸出一判斷結果,其中該判斷結果係基於先前量測之至少一先前量測波形而輸出。 In order to achieve at least the above-mentioned purpose, according to a third aspect of the present invention, an embodiment of a detection method is proposed, which is used to detect the insulation of a circuit board, including: measuring a current signal of a circuit to be tested on the circuit board, And output a measurement result; convert the measurement result into a digital signal; record the digital signal; and judge the insulation of the circuit board according to the change waveform of the digital signal to output a judgment result, wherein the judgment result is based on At least one previously measured waveform of the previous measurement is output.
於該判斷方法的一實施例中,該判斷步驟包括:由一人工智慧引擎輸出該判斷結果,其中該人工智慧引擎係由該先前量測波形所訓練。 In an embodiment of the judging method, the judging step includes: outputting the judging result by an artificial intelligence engine, wherein the artificial intelligence engine is trained by the previously measured waveform.
於該判斷方法的一實施例中,該檢測方法更包括:輸入該先前量測波形至該人工智慧引擎;以及以該先前量測波形之一預設結果訓練該人工智慧引擎。 In an embodiment of the judging method, the detecting method further includes: inputting the previously measured waveform to the artificial intelligence engine; and training the artificial intelligence engine with a preset result of the previously measured waveform.
於該判斷方法的一實施例中,該判斷步驟包括:由一比較器比較該變化波形與該先前量測波形以輸出該判斷結果。 In an embodiment of the judging method, the judging step includes: using a comparator to compare the changing waveform with the previous measurement waveform to output the judging result.
為達至少上述目的,依據本發明的一第四方面,提出一種檢測方法的實施方式,用於檢測一電路板的絕緣性,包括:紀錄一數位訊號,該數位訊號係自一量測結果轉換,該量測結果係量測該電路板上一待測電路的一電流訊號而輸出;以及依該數位訊號的變化波形判斷該電路板的絕緣性以輸出一判斷結果,其中該判斷結果係基於先前量測之至少一先前量測波形而輸出。 In order to achieve at least the above-mentioned purpose, according to a fourth aspect of the present invention, an embodiment of a testing method is proposed for testing the insulation of a circuit board, including: recording a digital signal, the digital signal is converted from a measurement result , the measurement result is output by measuring a current signal of a circuit to be tested on the circuit board; and judging the insulation of the circuit board according to the change waveform of the digital signal to output a judgment result, wherein the judgment result is based on At least one previously measured waveform of the previous measurement is output.
於該判斷方法的一實施例中,依該數位訊號的變化波形判斷該電路板的絕緣性之步驟包括:由一人工智慧引擎輸出該判斷結果,其中該人工智慧引擎係由該先前量測波形所訓練。 In an embodiment of the judging method, the step of judging the insulation of the circuit board according to the changing waveform of the digital signal includes: outputting the judging result by an artificial intelligence engine, wherein the artificial intelligence engine is based on the previously measured waveform trained.
於該判斷方法的一實施例中,該檢測方法更包括:輸入該先前量測波形至該人工智慧引擎;以及以該先前量測波形之一預設結果訓練該人工智慧引擎。 In an embodiment of the judging method, the detecting method further includes: inputting the previously measured waveform to the artificial intelligence engine; and training the artificial intelligence engine with a preset result of the previously measured waveform.
於該判斷方法的一實施例中,依該數位訊號的變化波形判斷該電路板的絕緣性之步驟包括:由一比較器比較該變化波形與該先前量測波形以輸出該判斷結果。 In an embodiment of the judging method, the step of judging the insulation of the circuit board according to the changing waveform of the digital signal includes: comparing the changing waveform with the previous measured waveform by a comparator to output the judging result.
為達至少上述目的,依據本發明的一第五方面,提出一種非暫態電腦可讀取紀錄媒體的實施方式,其儲存多數個指令,一電子裝置於讀取該指令後,可執行如前述第四方面的判斷方法或其實施例中之一種或其組合。 In order to achieve at least the above-mentioned purpose, according to a fifth aspect of the present invention, a non-transitory computer-readable recording medium is proposed, which stores a plurality of instructions, and after an electronic device reads the instructions, it can execute the above-mentioned The judging method of the fourth aspect or one of its embodiments or a combination thereof.
如上提出一種用於檢測電路板的絕緣性的檢測技術的多種實施方式的多個實施例。就個別測試點而言,此技術利用一種判斷裝置,其基於先前量測之至少一先前量測波形,並依據與被測電路板回饋的量測結果對應的數位訊號的變化波形,來判斷該電路板的絕緣性以輸出判斷結果。此判斷裝置可進一步以人工智慧技術來實現,如藉由機器學習來實現,從而降低誤判率。 A number of embodiments of various implementations of a detection technology for detecting the insulation of a circuit board are presented above. As far as individual test points are concerned, this technology uses a judging device based on at least one previous measurement waveform of the previous measurement, and according to the change waveform of the digital signal corresponding to the measurement result returned by the circuit board under test, to judge the The insulation of the circuit board is used to output the judgment result. The judging device can be further implemented with artificial intelligence technology, such as machine learning, so as to reduce the misjudgment rate.
1A、1B、1C:檢測系統 1A, 1B, 1C: detection system
3:訓練系統 3: Training system
10:電源供應裝置 10: Power supply device
12:電流量測裝置 12: Current measuring device
14:類比數位轉換裝置 14: Analog-to-digital conversion device
16:記錄裝置 16: Recording device
18:判斷裝置 18: Judgment device
20:波形資料庫 20:Waveform database
21:人工智慧引擎 21: Artificial intelligence engine
22:比較器 22: Comparator
30:電測設備 30: Electric measuring equipment
32:運算裝置 32: computing device
34:資料庫 34: Database
36:人工智慧引擎 36: Artificial intelligence engine
40:自動編碼器模型 40: Autoencoder Models
41:編碼器 41: Encoder
42:潛伏碼 42: latent code
43:解碼器 43: Decoder
410:輸入層 410: Input layer
420:隱藏層 420: hidden layer
440:隱藏層 440: hidden layer
450:輸出層 450: output layer
CB、CBX:電路板 CB, CBX: circuit board
PB1、PB2:測試探針 PB1, PB2: test probe
S110~S160:步驟 S110~S160: steps
WR:變化波形資料 WR: changing waveform data
IN:輸入資料 IN: input data
OUT:輸出資料 OUT: output data
圖1A為用於檢測電路板的絕緣性的檢測系統的一種實施方式的示意方塊圖。 FIG. 1A is a schematic block diagram of an embodiment of a testing system for testing the insulation of a circuit board.
圖1B為用於檢測電路板的絕緣性的檢測系統的另一種實施方式的示意方塊圖。 FIG. 1B is a schematic block diagram of another embodiment of a testing system for testing the insulation of a circuit board.
圖1C為用於檢測電路板的絕緣性的檢測系統的又一種實施方式的示意方塊圖。 FIG. 1C is a schematic block diagram of yet another embodiment of a testing system for testing the insulation of a circuit board.
圖2為檢測系統的判斷裝置的一實施方式的示意方塊圖。 Fig. 2 is a schematic block diagram of an embodiment of the judging device of the detection system.
圖3為檢測系統的判斷裝置的一實施方式的示意方塊圖。 Fig. 3 is a schematic block diagram of an embodiment of the judging device of the detection system.
圖4為用於檢測電路板的絕緣性的檢測方法的一種實施方式的流程圖。 FIG. 4 is a flowchart of an embodiment of a testing method for testing the insulation of a circuit board.
圖5為用以訓練人工智慧引擎的方法一種實施方式的流程圖。 FIG. 5 is a flowchart of an embodiment of a method for training an artificial intelligence engine.
圖6為用以訓練人工智慧引擎的訓練系統的一種實施方式的示意圖。 FIG. 6 is a schematic diagram of an embodiment of a training system for training an artificial intelligence engine.
圖7為利用自動編碼器來建立人工智慧引擎的一實施例的示意圖。 FIG. 7 is a schematic diagram of an embodiment of using an autoencoder to build an artificial intelligence engine.
圖8為自動編碼器的一實施例的示意圖。 Fig. 8 is a schematic diagram of an embodiment of an autoencoder.
圖9為圖8的自動編碼器的驗證資料的重建誤差的示意圖。 FIG. 9 is a schematic diagram of the reconstruction error of the verification data of the autoencoder in FIG. 8 .
圖10為用以判定圖8的自動編碼器的效能的混淆矩陣的示意圖。 FIG. 10 is a schematic diagram of a confusion matrix used to determine the performance of the autoencoder in FIG. 8 .
為充分瞭解本發明之目的、特徵及功效,茲藉由下述具體之實施例,並配合所附之圖式,對本發明做詳細說明,說明如後:請參考圖1A,其為用於檢測電路板的絕緣性的檢測系統的一種實施方式的示意方塊圖。 In order to fully understand the purpose, characteristics and effects of the present invention, the present invention will be described in detail by the following specific embodiments and the accompanying drawings, as follows: Please refer to Figure 1A, which is used for testing A schematic block diagram of an embodiment of a circuit board insulation detection system.
如圖1A所示,檢測系統1A用於檢測一電路板的絕緣性。檢測系統1A包括電源供應裝置10、電流量測裝置12、類比數位轉換裝置14、記錄裝置16、判斷裝置18。
As shown in FIG. 1A , a
電源供應裝置10係用以提供電源於該檢測系統1A。例如,在圖1A中,檢測系統1A係透過測試探針PB1及PB2在一定時間內於電路板CB之兩個電路圖案間施加電源供應裝置10所提供之較高的電壓,以檢測該等電路圖案間的絕緣狀態是否良好,是否有產生電火花而引起的不良的情況。在圖1A中,電源供應裝置10電性連接至測試探針PB1,測試探針PB1用於電性連接至電路板CB之一電路圖案,而測試探針PB2接地並用以電性連接至另一電路圖案。
The
電流量測裝置12係用以量測該電路板CB上待測電路(如前述兩個電路圖案)的電流訊號,並輸出一量測結果。如圖1A所示,電流量測裝置12電性連接至測試探針PB1,在測試探針PB1及PB2電性接觸兩個電路圖案時,用以量測一電流訊號。如該兩個電路圖案的絕緣性不良,則會反映在該電流訊號的變化波形上,有較大幅度的起伏的波形產生。電流量測裝置12例如以電壓訊號來代表該量測結果。
The
類比數位轉換裝置14用以將該量測結果轉換為一數位訊號。
The analog-to-
記錄裝置16,記錄該數位訊號。判斷裝置18,依該數位訊號的變化波形判斷該電路板的絕緣性以輸出一判斷結果,其中該判斷結果係基於先前量測之至少一先前量測波形而輸出。例如,利用運算裝置,如電腦中的記憶單元及處理單元分別實現記錄裝置16及判斷裝置18。在另一示例中,記錄裝置16為記憶體,如揮發性或非揮發性記憶體,或儲存裝置如硬體、固態硬體等;判斷裝置18也可以微處理器、微控制器或數位訊號處理器,或可以基於使用現場可程式邏輯閘陣列(field programmable gate array,FPGA)、或特定積體電路(application specific integrated circuit,ASIC)或複雜可編程邏輯器件(CPLD)之類的電路中之一個或多個電路來實現,亦可使用專屬的電路或模組來實現。
The
請參考圖1B,其為用於檢測電路板的絕緣性的檢測系統的另一種實施方式的示意方塊圖。圖1B的檢測系統1B與圖1A的檢測系統1A的差異在於圖1B的檢測系統1B的電流量測裝置12電性連接至測試探針PB2。在測試探針PB1及PB2電性接觸兩個電路圖案時,如該兩個電路圖案的絕緣性不良,則會反映在檢測系統1B的電流量測裝置12所量測的電流訊號的變化波形上,有較大幅度的起伏的波形產生。
Please refer to FIG. 1B , which is a schematic block diagram of another embodiment of a testing system for testing the insulation of a circuit board. The difference between the
請參考圖1C,其為用於檢測電路板的絕緣性的檢測系統的又一種實施方式的示意方塊圖。圖1C的檢測系統1C與圖1A的檢測系統1A及圖1B的檢測系統1B的差異在於,圖1C的檢測系統1C包含電流量測模組12C及類比數位轉換模組14C,電流量測模組12C電性連接測試探針PB1及PB2。在測試探針PB1及PB2電性接觸兩個電路圖案時,電流量測模組12C透過兩個電流量測裝置12用以量測該電路板CB上待測電路(如前述兩個電路圖案)的電流訊號,並輸出量測
結果;類比數位轉換模組14C透過兩個類比數位轉換裝置14用以將該量測結果轉換為兩個數位訊號。該兩個數位訊號可透過處理,如相減,以達到抗干擾的作用。圖1C的檢測系統1C的記錄裝置16,記錄該兩個數位訊號。判斷裝置18,依該等數位訊號的變化波形判斷該電路板的絕緣性以輸出一判斷結果,其中該判斷結果係基於先前量測之至少一先前量測波形而輸出。
Please refer to FIG. 1C , which is a schematic block diagram of another embodiment of a testing system for testing the insulation of a circuit board. The difference between the
於該檢測系統1A、1B或1C的一些實施例中,上述之電源供應裝置10所提供之掃描頻率範圍為約20百萬赫茲到約80百萬赫茲。
In some embodiments of the
請參考圖2,其為檢測系統1A、1B或1C的判斷裝置18的一種實施方式的示意方塊圖。如圖2所示,判斷裝置18可包括人工智慧引擎21,其由該先前量測波形所訓練,且該判斷結果係由該人工智慧引擎21所輸出。先前量測波形例如儲存於波形資料庫20。在圖2中所示意的人工智慧引擎21為已訓練好的模型。於一實施例中,該人工智慧引擎21採用自動編碼(autoencoder)模型。關於自動編碼模型將稍後列舉實施例說明。判斷裝置18更可包括波形資料庫20,例如儲存被判斷為代表有電火花產生的量測波形。
Please refer to FIG. 2 , which is a schematic block diagram of an embodiment of the judging
請參考圖3,其為檢測系統1A的判斷裝置18的一實施方式的示意方塊圖。如圖3所示,該判斷裝置18可包括比較器22,其比較該變化波形與該先前量測波形,以輸出該判斷結果。例如,該先前量測波形為代表有電火花發生的突波波形,比較器22透過影像處理技術,如掃描視窗(sliding window)之類或相關的技術,在該變化波形中搜尋是否存在與該突波波形。若在該變化波形中有該突波波形,則輸出該判斷結果為有電火花的風險;若在該變化波形中沒有該突波波形,則輸出該判斷結果為正常。
Please refer to FIG. 3 , which is a schematic block diagram of an embodiment of the judging
請參考圖4,為用於檢測電路板的絕緣性的檢測方法的一種實施方式的流程圖。該檢測方法可利用上述檢測系統1A、1B或1C來實現。如圖4所示,一種檢測方法,用於檢測一電路板的絕緣性,包括以下步驟S110~S160。
Please refer to FIG. 4 , which is a flowchart of an embodiment of a detection method for detecting the insulation of a circuit board. The detection method can be realized by using the above-mentioned
如步驟S110所示,量測該電路板上一待測電路的一電流訊號,並輸出一量測結果。如利用檢測系統1A、1B或1C的電流量測裝置12來實現。
As shown in step S110, measure a current signal of a circuit to be tested on the circuit board, and output a measurement result. Such as using the
如步驟S120所示,將該量測結果轉換為數位訊號。如利用檢測系統1A、1B或1C的類比數位轉換裝置14來實現。
As shown in step S120, the measurement result is converted into a digital signal. Such as using the analog-to-
如步驟S150所示,記錄該數位訊號。如利用檢測系統1A、1B或1C的記錄裝置16來實現。
As shown in step S150, the digital signal is recorded. This is done with the
如步驟S160所示,依該數位訊號的變化波形判斷該電路板的絕緣性以輸出一判斷結果,其中該判斷結果係基於先前量測之至少一先前量測波形而輸出。如利用檢測系統1A、1B或1C的判斷裝置18來實現。
As shown in step S160, the insulation of the circuit board is judged according to the changing waveform of the digital signal to output a judgment result, wherein the judgment result is output based on at least one previous measurement waveform of the previous measurement. Such as using the
於該判斷方法的一實施例中,該步驟S160(判斷步驟)包括:由一人工智慧引擎21輸出該判斷結果,其中該人工智慧引擎21係由該先前量測波形所訓練。如圖2所示的已訓練的利用人工智慧引擎21來實現。
In an embodiment of the judging method, the step S160 (judging step) includes: outputting the judging result by an
於該判斷方法的一實施例中,該步驟S160(判斷步驟)包括:由一比較器22比較該變化波形與該先前量測波形以輸出該判斷結果。如圖3所示的利用比較器22來實現。
In an embodiment of the judging method, the step S160 (judging step) includes: a
請參考圖5,其為用以訓練人工智慧引擎的方法一種實施方式的流程圖。如圖5所示,訓練人工智慧引擎的方法包括步驟S130及S140:如步驟S130所示,輸入該先前量測波形至該人工智慧引擎。 Please refer to FIG. 5 , which is a flowchart of an embodiment of a method for training an artificial intelligence engine. As shown in FIG. 5 , the method for training an artificial intelligence engine includes steps S130 and S140: as shown in step S130, input the previously measured waveform to the artificial intelligence engine.
如步驟S140所示,以及以該先前量測波形之一預設結果訓練該人工智慧引擎。 As shown in step S140, the artificial intelligence engine is trained with a preset result of the previous measurement waveform.
在一實施例中,圖4的檢測方法可進一步包含圖5的步驟S130及S140,例如於步驟S150及S160之前,利用步驟S130及S140對未訓練的人工智慧引擎21進行訓練,以得出已訓練的人工智慧引擎21。在執行步驟S150及S160時,利用已訓練的人工智慧引擎21來進行判斷。
In one embodiment, the detection method in FIG. 4 may further include steps S130 and S140 in FIG. 5, for example, before steps S150 and S160, use steps S130 and S140 to train the untrained
此外,在一些實施例中,圖5的步驟S130及S140可以實現在一第一運算裝置(如本地的電腦或雲端)上,圖4的步驟S150及S160可以實現在一第二運算裝置(如本地的電腦或雲端)上,其中第一運算裝置及第二運算裝置可以是相同的或不同的運算裝置。 In addition, in some embodiments, steps S130 and S140 in FIG. 5 can be implemented on a first computing device (such as a local computer or a cloud), and steps S150 and S160 in FIG. 4 can be realized on a second computing device (such as local computer or cloud), wherein the first computing device and the second computing device can be the same or different computing devices.
此外,依據本發明的一個方面,亦可將圖4的步驟S150及S160作為一種檢測方法,用於檢測一電路板的絕緣性,該檢測方法執行於一運算裝置(如本地的電腦或雲端)上。此外,在該檢測方法的一些實施例中,更包括圖5的步驟S130及S140。 In addition, according to an aspect of the present invention, steps S150 and S160 in FIG. 4 can also be used as a detection method for detecting the insulation of a circuit board, and the detection method is executed on a computing device (such as a local computer or a cloud). superior. In addition, in some embodiments of the detection method, steps S130 and S140 in FIG. 5 are further included.
以下舉例說明前述圖2中的人工智慧引擎的實現方式。 The following example illustrates the implementation of the artificial intelligence engine in FIG. 2 .
請參考圖6,其為用以訓練人工智慧引擎的訓練系統的一種實施方式的示意圖。如圖6所示,訓練系統3包括電測設備30、運算裝置32、資料庫34、人工智慧引擎36。
Please refer to FIG. 6 , which is a schematic diagram of an implementation manner of a training system for training an artificial intelligence engine. As shown in FIG. 6 , the
電測設備30例如包含檢測系統1A、1B或1C中的電源供應裝置10、電流量測裝置12、類比數位轉換裝置14,並且電源供應裝置10、電流量測裝置12、類比數位轉換裝置14利用如圖1A、1B或1C中所示的方式電性連接及配置。電測設備30用以透過電源供應裝置10、電流量測裝置12、類比數位轉換裝置14之操
作,檢測一片或多片電路板CBX中一對或多個電路圖案的電路的絕緣性,並從而取得各種代表變化波形的數位訊號。
The
運算裝置32例如是電腦,用以將電測設備30輸出的數位訊號作記錄為各種檢測波形資料。變化波形資料WR可以收集並儲存於資料庫34而用作訓練人工智慧引擎36的資料集。技術人員可以在運算裝置32上對資料庫34將錄各種變化波形WR。人工智慧引擎36為待訓練的人工智慧引擎的模型。
The
依據圖6中訓練系統3的架構,在一實施例中,資料庫34、人工智慧引擎36可以實現在一第一運算裝置(如本地的電腦或雲端)上,並利用圖5的用以訓練人工智慧引擎的方法來加以訓練人工智慧引擎36。在另一實施例中,第一運算裝置也可以由運算裝置32來實現。
According to the architecture of the
如圖6所示,訓練系統3可用於準備訓練資料,如變化波形資料WR。舉例而言,變化波形資料WR可以包含波形W1~W4,其中波形W1代表正常波形,波形W2代表可能引起火花的波形,波形W3、W4代表無火花的波形。波形W2具有波形W1中所沒有的局部突波的特徵,例如該局部突波的波峰及波谷有至少例如20V或以上的壓差,且該局部突波的波峰及波谷的變化在一較短時間間隔內發生,故有別於波形W3、W4中的局部的波峰及波谷的變化在一較長時間間隔內發生。上述屬於判斷可能引起火花的波形的判斷的專家領域知識,可利用作為選取有用的波形作為資料集。此外,更可用利用資料擴增(data augmentation)的技巧,基於如波形W1~W4為訓練用資料集增加更多的樣本。另外,上述對應至火花的局部突波的圖形及對應至非火花的局部的波峰及波谷的圖形,在建立人工智慧引擎36,如
以深度學習的模型來實現人工智慧引擎36時,可以進一步用作特徵(features)來使用。
As shown in FIG. 6, the
舉例而言,於一實施例中,人工智慧引擎36可以包含一監督式學習的模型,該監督式學習的模型為用以偵測某一可能引起火花的波形的已訓練的模型。於另一實施例中,人工智慧引擎36可以包含一非監督式學習的模型,該非監督式學習的模型對該輸入資料集例如進行分群或分類的運算,並據以用來發現或偵測可能引起火花的波形。
For example, in one embodiment, the
請參考圖7,其為利用自動編碼器(autoencoder)來建立人工智慧引擎36的一實施例的示意圖。自動編碼器是屬於非監督式學習的神經網路。如圖7所示,自動編碼器模型40包括編碼器(encoder)41、潛伏碼(latent code)42、解碼器(decoder)43。編碼器41包括輸入層410、至少一隱藏層420。解碼器43包括至少一隱藏層440、輸出層450。如圖7下方所示意,編碼器41的輸入層410用以將輸入資料IN,如對應至量測的波形的數位訊號轉為波形圖案並作為輸入資料IN,經編碼器41處理得出潛伏碼42。潛伏碼42輸入至解碼器43並轉換為波形圖案並作為輸出資料OUT。
Please refer to FIG. 7 , which is a schematic diagram of an embodiment of using an autoencoder to build an
自動編碼器模型40中的各層可以是使用全連接層(fully-connected layers),也可以使用局部連接層(partially connected layers)如卷積層(convolution layer)或池化層(pooling layer)。
Each layer in the
在一實施例中,編碼器41包含至少一個卷積層。例如,卷積層利用前述的對應至火花的局部突波的圖形及對應至非火花的局部的波峰及波谷的圖形作為特徵來建立特徵圖(feature maps),從輸入資料IN的波形圖案中擷
取出特徵。編碼器41更包含至少一個池化層,對卷積層的輸出進行降維運算,最後編碼器41產生潛伏碼42。
In one embodiment, the
在一實施例中,可透過設計編碼器41中卷積層及池化層,令潛伏碼42可代表波形是否為正常波形(如波形W1),可能引起火花的波形(如波形W2),或無火花的波形(如波形W3、W4)而分類的碼,如以獨熱編碼(one-hot encoding)來達成及表示。
In one embodiment, by designing the convolutional layer and the pooling layer in the
在一實施例中,解碼器43可實現為與編碼器41對稱。
In an embodiment, the
在一實施例中,解碼器43可因應需要而實現為與編碼器41有變異(variational)從而產生有變異的輸出資料OUT。例如,在可能引起火花的波形的突波處有顏色變化(如紅色)以產生輸出資料OUT,如以熱圖(heat map)的技巧來實現。又例如,在可能引起火花的波形的突波處有特殊圖形或方框作為指示,以產生輸出資料OUT。
In one embodiment, the
如圖8所示,其為自動編碼器模型40的一實施例的示意圖。在此實施例中,輸入層410、隱藏層420、潛伏碼(或可視為隱藏層)42、隱藏層440、輸出層450分別具有128、64、32、64、128個神經元。舉例而言,來加快自動編碼器模型40的收斂速度的優化器(optimizer)為Adam優化器,各神經元使用修正線性單元(Rectified Linear Unit,ReLU)作為激勵函數,取均方誤差(Mean square error,MSE)作為損失函數。
As shown in FIG. 8 , it is a schematic diagram of an embodiment of an
請參考圖9,其為圖8的自動編碼器的驗證資料的重建誤差(reconstruction error of the validation data)的示意圖。如圖9所示,驗證資料的重建誤差。圖9的驗證資料是50筆正常訊號加上10筆異常訊號(代表有火花的可能),可以看到最後10筆資料的重建誤差為離群值,根據「異常分數門檻值」來做偵測。 Please refer to FIG. 9 , which is a schematic diagram of reconstruction error of the validation data of the autoencoder in FIG. 8 . As shown in Figure 9, the reconstruction error of the verification data. The verification data in Figure 9 is 50 normal signals plus 10 abnormal signals (representing the possibility of sparks). It can be seen that the reconstruction error of the last 10 data is an outlier, which is detected according to the "abnormal score threshold". .
請參考圖10,其為用以判定圖8的自動編碼器的效能的混淆矩陣(confusion matrix)的示意圖。驗證資料1054筆,其中1000筆為正常資料,54筆發生火花的異常資料。通過自動編碼器模型40進行資料鑑別檢測,檢測結果,資料鑑別準確率95.6%。其中有46筆誤判,來源為正常卻被鑑別為異常(有火花)。
Please refer to FIG. 10 , which is a schematic diagram of a confusion matrix used to determine the performance of the autoencoder in FIG. 8 . There are 1054 verification data, of which 1000 are normal data and 54 are abnormal data with sparks. The data identification detection is carried out through the
在經過訓練使誤判率降至合適或合乎需求的值以後,得出最終的自動編碼器模型40,其可用來實現檢測系統1A、1B或1C的判斷裝置18。
After training to reduce the misjudgment rate to a suitable or desirable value, a
在一些應用情景中,前述的判斷裝置18亦可視為電測設備的一部分,或實現於電測設備中。檢測設備如具有多個檢測探針及自動化機器以接收電路板以便進行測試之電測設備。如此一來,此檢測技術係有助於對於電路板的多個測試點亦可個別指出判定結果,以便於技術人員有效率地找出需要進一步檢測的電路板位置。
In some application scenarios, the above-mentioned judging
依據本發明的另一方面,提出一種非暫態電腦可讀取紀錄媒體的實施方式,其儲存多數個指令,一電子裝置(或運算裝置)於讀取該等指令後,可執行基於圖5中的步驟S150及160的判斷方法或其實施例中之一種或其組合。電腦可讀取紀錄媒體之實施例比如但不受限於:光學式資訊儲存媒體,磁式資訊儲存媒體,硬碟,固態硬碟,或記憶體,如記憶卡、靭體或ROM或RAM。舉例而言,運算裝置包括通訊單元、至少一處理單元及至少一儲存裝置,其中該處理單元電性耦接至該通訊單元及該記憶單元。儲存裝置例如包含主儲存裝置及(或)輔助儲存裝置,如前述儲存媒體之任一示例。該至少一處理單元用以透過該通訊單元以無線或有線方式與通訊網路進行通訊,從而與其他運算裝置如終端裝置通訊。該處理單元可包含一個或多個處理器,該運算裝置亦可包括其他裝置如圖形處理器,以進行運算。在一些實施例中,該運算裝置可以執行作業系統,並可進 一步利用網路服務、腳本引擎、網路應用程式或網路應用程式介面(API)之伺服器等各種技術中之一種或多種方式而實現,以提供應用服務以供使用者端之瀏覽器、應用程式等使用。 According to another aspect of the present invention, an embodiment of a non-transitory computer-readable recording medium is proposed, which stores a plurality of instructions, and after an electronic device (or computing device) reads these instructions, it can execute the The judging method in steps S150 and 160 or one of its embodiments or a combination thereof. Examples of computer-readable recording media include but are not limited to: optical information storage media, magnetic information storage media, hard disks, solid state disks, or memories such as memory cards, firmware, or ROM or RAM. For example, the computing device includes a communication unit, at least one processing unit and at least one storage device, wherein the processing unit is electrically coupled to the communication unit and the memory unit. The storage device includes, for example, a primary storage device and/or an auxiliary storage device, such as any example of the aforementioned storage media. The at least one processing unit is used to communicate with a communication network through the communication unit in a wireless or wired manner, so as to communicate with other computing devices such as terminal devices. The processing unit may include one or more processors, and the computing device may also include other devices such as a graphics processor for computing. In some embodiments, the computing device can execute an operating system, and can further One-step implementation using one or more of various technologies such as web services, script engines, web applications, or web application programming interface (API) servers to provide application services for browsers on the user end, applications, etc.
如上所述,提出一種用於檢測電路板的絕緣性的檢測技術的多種實施方式的多個實施例。就個別測試點而言,此技術利用一種判斷裝置,其基於先前量測之至少一先前量測波形,並依據與被測電路板回饋的量測結果對應的數位訊號的變化波形,來判斷該電路板的絕緣性以輸出判斷結果。此判斷裝置可進一步以人工智慧技術來實現,如藉由機器學習來實現,從而降低誤判率。 As described above, several examples of various implementations of a detection technique for detecting the insulation of a circuit board are proposed. As far as individual test points are concerned, this technology uses a judging device based on at least one previous measurement waveform of the previous measurement, and according to the change waveform of the digital signal corresponding to the measurement result returned by the circuit board under test, to judge the The insulation of the circuit board is used to output the judgment result. The judging device can be further implemented with artificial intelligence technology, such as machine learning, so as to reduce the misjudgment rate.
本發明在上文中已以較佳實施例揭露,然熟習本項技術者應理解的是,該實施例僅用於描繪本發明,而不應解讀為限制本發明之範圍。應注意的是,舉凡與該等實施例等效之變化與置換,均應設為涵蓋於本發明之範疇內。因此,本發明之保護範圍當以申請專利範圍所界定者為準。 The present invention has been disclosed above with preferred embodiments, but those skilled in the art should understand that the embodiments are only used to describe the present invention, and should not be construed as limiting the scope of the present invention. It should be noted that all changes and substitutions equivalent to these embodiments should be included within the scope of the present invention. Therefore, the scope of protection of the present invention should be defined by the scope of the patent application.
1A:檢測系統 1A: Detection system
10:電源供應裝置 10: Power supply device
12:電流量測裝置 12: Current measuring device
14:類比數位轉換裝置 14: Analog-to-digital conversion device
16:記錄裝置 16: Recording device
18:判斷裝置 18: Judgment device
CB:電路板 CB: circuit board
PB1、PB2:測試探針 PB1, PB2: test probe
Claims (17)
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| TW514258U (en) * | 2001-08-02 | 2002-12-11 | Forever Advanced Technology Co | Fixture framework for testing machine of printed circuit board |
| TW200732678A (en) * | 2005-10-18 | 2007-09-01 | Nidec Read Corp | Insulation inspecting device and insulation inspecting method |
| US20160054373A1 (en) * | 2013-03-29 | 2016-02-25 | Nidec-Read Corporation | Insulation inspection apparatus and insulation inspection method |
| US20170292989A1 (en) * | 2016-04-04 | 2017-10-12 | Fanuc Corporation | Deterioration detection device for printed circuit board |
| CN110398680A (en) * | 2019-08-14 | 2019-11-01 | 华芯电子(天津)有限责任公司 | A kind of PCB method for testing reliability |
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| TW514258U (en) * | 2001-08-02 | 2002-12-11 | Forever Advanced Technology Co | Fixture framework for testing machine of printed circuit board |
| TW200732678A (en) * | 2005-10-18 | 2007-09-01 | Nidec Read Corp | Insulation inspecting device and insulation inspecting method |
| US20160054373A1 (en) * | 2013-03-29 | 2016-02-25 | Nidec-Read Corporation | Insulation inspection apparatus and insulation inspection method |
| US20170292989A1 (en) * | 2016-04-04 | 2017-10-12 | Fanuc Corporation | Deterioration detection device for printed circuit board |
| CN110398680A (en) * | 2019-08-14 | 2019-11-01 | 华芯电子(天津)有限责任公司 | A kind of PCB method for testing reliability |
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