TW202136801A - Holding unit for electronic components, holding device and operation equipment using the same - Google Patents
Holding unit for electronic components, holding device and operation equipment using the same Download PDFInfo
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- 238000010438 heat treatment Methods 0.000 claims description 22
- 238000009413 insulation Methods 0.000 claims description 7
- 238000001816 cooling Methods 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 3
- 239000012530 fluid Substances 0.000 claims description 2
- 238000012360 testing method Methods 0.000 description 17
- 238000010586 diagram Methods 0.000 description 6
- 238000012802 pre-warming Methods 0.000 description 5
- 208000028659 discharge Diseases 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 4
- 238000005192 partition Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 1
- 238000002788 crimping Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
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Abstract
Description
本發明係有關一種電子元件承置單元及其應用之承載裝置、作業設備。The invention relates to an electronic component bearing unit and its application bearing device and working equipment.
在現今,電子元件作業設備係以承置單元承置複數個電子元件,承置單元可為預溫盤或載台等,以對電子元件執行預設作業(例如預溫作業或預溫及載送作業);以預溫作業為例,電子元件於實際使用時,可能處於低溫環境或高溫環境,業者為確保電子元件之品質,於製作完成後,必須以測試裝置對電子元件進行熱測作業或冷測作業而淘汰不良品,然為縮減測試裝置之升溫或降溫時間,業者利用具有溫控件之預溫盤或具有溫控件之載台先行預熱或預冷電子元件,使電子元件先行升溫或降溫至預設測試溫度,再將電子元件移載至測試裝置而執行測試作業。Nowadays, electronic component operation equipment is used to hold a plurality of electronic components with a holding unit. The holding unit can be a pre-warming plate or a stage, etc., to perform preset operations (such as pre-warming operation or pre-warming and loading) on electronic components. Sending operation); Take pre-warming operation as an example, electronic components may be in a low temperature or high temperature environment during actual use. In order to ensure the quality of electronic components, the industry must perform thermal testing operations on the electronic components with a testing device after the production is completed. Or cold test operations to eliminate defective products, but to reduce the heating or cooling time of the test device, the industry uses a pre-warming plate with a temperature control or a stage with a temperature control to pre-heat or pre-cool the electronic components to make the electronic components The temperature is raised or lowered to a preset test temperature first, and then the electronic components are transferred to the test device to perform the test operation.
請參閱圖1,承置單元10包含預熱盤11及可為加熱件12之溫控件
,預熱盤11係設有複數個為凹槽之承置部111,以供承置電子元件13,加熱件12裝配於預熱盤11之下方,以供加熱該預熱盤11,使預熱盤11內之複數個電子元件13升溫至預設測試溫度;惟,預熱盤11之高溫除了向上傳導至承置部111而升溫電子元件13外,亦會向上傳導至二承置部111間之間隔壁112,導致間隔壁112與預熱盤11外部周遭空氣作熱交換而流失高溫,以致無法確保電子元件13維持於預設高溫。又,業者若欲使電子元件13保持預設溫度,即必須提高加熱件12之加熱功率,不僅更加耗費加熱能源,亦增加預熱作業時間。Please refer to FIG. 1, the
本發明之目的一,係提供一種電子元件承置單元,包含基座、治具、溫控器及隔溫件,治具設有可供移入或移出電子元件之開口,於治具裝配基座時,治具之開口於基座之表面劃分出承置區域而供承置電子元件,並使基座表面之其他部位為非承置區域,非承置區域供裝配有隔溫件,於溫控器對基座之承置區域上的電子元件進行升溫或降溫作業時,並以隔溫件防止溫度由基座之非承置區域流失,達到確保電子元件保持預溫溫度之使用效益。The first objective of the present invention is to provide an electronic component holding unit, including a base, a fixture, a thermostat and a temperature isolator. The fixture is provided with an opening for moving in or out of the electronic component, and is mounted on the fixture assembly base At this time, the opening of the fixture on the surface of the base divides a bearing area for holding electronic components, and makes other parts of the base surface a non-bearing area. When the controller heats up or cools the electronic components on the supporting area of the pedestal, it uses a temperature isolator to prevent the temperature from being lost from the non-supported area of the pedestal, so as to ensure that the electronic components maintain the pre-heated temperature.
本發明之目的二,係提供一種電子元件承置單元,其基座表面之非承置區域裝配有隔溫件,以防止溫度流失,毋需提升加熱或冷卻功率,不僅有效節省能源,更可縮減溫控作業時間。The second objective of the present invention is to provide an electronic component supporting unit, the non-receiving area of the base surface is equipped with a temperature insulating member to prevent temperature loss, without increasing the heating or cooling power, which not only effectively saves energy, but also Reduce the temperature control operation time.
本發明之目的三,係提供一種電子元件承置單元,其基座可供換裝不同治具,不同治具具有不同尺寸之開口,以供不同尺寸之開口於基座之表面劃分出不同尺寸之承置區域,而便利承置不同尺寸之電子元件,業者僅需換裝治具,毋須更換基座,達到節省成本之實用效益。The third object of the present invention is to provide an electronic component holding unit whose base can be replaced with different jigs, and different jigs have openings of different sizes, so that openings of different sizes can be divided into different sizes on the surface of the base. It is convenient to hold electronic components of different sizes. The operator only needs to replace the fixture, without replacing the base, which achieves the practical benefit of cost saving.
本發明之目的四,係提供一種承載裝置,包含承置單元及驅動單元,承置單元設置基座、治具、溫控器及隔溫件,以供承置及溫控電子元件,驅動單元係供驅動承置單元作至少一方向位移,達到提升承載使用效能。The fourth object of the present invention is to provide a bearing device, including a bearing unit and a driving unit. The bearing unit is provided with a base, a fixture, a temperature controller, and a temperature isolator for holding and temperature control electronic components, and the driving unit It is used for driving the bearing unit to move in at least one direction, so as to improve the carrying efficiency.
本發明之目的五,係提供一種作業設備,包含機台、供料裝置、收料裝置、作業裝置、承置單元、輸送裝置及中央控制裝置,供料裝置係裝配於機台,並設有至少一供料器,以供承置待作業之電子元件;收料裝置係裝配於機台,並設有至少一收料器,以供承置已作業之電子元件;作業裝置係裝配於機台,並設有至少一作業器,以供對電子元件執行預設作業;承置單元係裝配於機台,並包含基座、治具、溫控器及隔溫件,以供承置及溫控電子元件;輸送裝置係配置於機台上,並設有至少一移料器,以供移載電子元件;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升測試效能之實用效益。The fifth object of the present invention is to provide a working equipment, including a machine, a feeding device, a receiving device, a working device, a supporting unit, a conveying device, and a central control device. The feeding device is assembled on the machine and equipped with At least one feeder for holding the electronic components to be operated; the receiving device is installed on the machine, and at least one receiving device is provided for holding the electronic components that have been operated; the operating device is installed on the machine The platform is equipped with at least one operating device for performing preset operations on the electronic components; the bearing unit is assembled on the machine platform and includes a base, a fixture, a thermostat, and a temperature isolator for holding and Temperature control electronic components; the conveying device is arranged on the machine table, and is equipped with at least one moving device for transferring electronic components; the central control device is used to control and integrate the actions of various devices to perform automated operations to achieve improvement Practical benefits of test performance.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the accompanying drawings. The details are as follows:
請參閱圖2、3,本發明電子元件承置單元20包含基座21、治具22、溫控器23及隔溫件24,以供承置及溫控電子元件(圖未示出)。Please refer to FIGS. 2 and 3, the electronic
基座21係為一板件,其表面供承置電子元件,而底面則為承接面211,基座21可由傳導效能佳之材質製作;又基座21可依作業需求,而開設複數個抽氣孔(圖未示出),以供吸附隔溫件24定位。The
治具22係設有至少一開口221,以供移入或移出電子元件,於治具22裝配基座21時,治具22之開口221於基座21之表面劃分出承置區域而供承置電子元件,基座21表面之其他部位為非承置區域;更進一步,治具22之開口221的內面可為平直面、斜面或包含斜面及平直面,以供導引電子元件,或導引及限位電子元件;於本實施例中,治具22設有複數個開口221,開口221之第一端2211相通第二端2212,且第一端2211之寬度尺寸相同或略大於電子元件之寬度尺寸;又開口221之內面於靠近第一端2211之部位設有平直面2213,以限位電子元件,開口221之內面於靠近第二端2211之部位設有斜面2214,以導引電子元件移入開口221。The
又,治具22於開口221周側且位於治具22底面設有貼合面222,並以貼合面222貼接組裝於基座21之表面,治具22可作固定式或分離式裝配於該基座,可固定式或可分離式之裝配方式係為鎖固、黏固、嵌接或壓接組裝等,不受限於本實施例;於本實施例中,治具22係以鎖固方式組裝於基座21,令治具22之貼合面222貼接於基座21之表面,並以開口221之第一端2211於基座21之表面劃分出承置區域212而供承置電子元件,基座21表面之其他部位為非承置區域213。In addition, the
溫控器23係設置於基座21之下方,以溫控電子元件至預設溫度,溫控器23包含座體231及溫控件,溫控件係為加熱件、致冷晶片或具流體之流道
,並配置於座體231,以供加熱或冷卻電子元件,於本實施例中,溫控器23包含座體231及加熱件232,座體231之表面供裝配接合基座21之承接面211,加熱件232裝配於座體231,以供升溫基座21之承置區域212上的電子元件。The
隔溫件24係配置於基座21之非承置區域213,以防止溫度流失;隔溫件24可視作業需求而設計成膜狀或塊狀;又隔溫件24可作固定式或分離式裝配於該基座21之非承置區域213或該治具22之貼合面222,於基座21與治具22相互組裝時,均可使隔溫件24位於基座21之非承置區域213,不受限於本實施例
;可固定式或可分離式之組裝方式係為黏固、吸附或鎖固等方式;例如承置單元20固定承置單一尺寸之電子元件時,隔溫件24可黏固於基座21之非承置區域213;例如承置單元20承置不同尺寸之電子元件時,隔溫件24可吸附或鎖固於基座21之非承置區域213,以便因應基座21之承置區域212尺寸的改變,而調整非承置區域213的尺寸;例如隔溫件24可黏固於治具22之貼合面222,於基座21與治具22相互組裝時,使隔溫件24貼合配置於基座21之非承置區域213;於本實施例中,隔溫件24係為隔熱膜,並貼覆於基座21之非承置區域213,且貼接於治具22之貼合面222。The
請參閱圖3、4,一移料器(圖未示出)將電子元件30移入於治具22之開口221,開口221利用斜面2214導引移入電子元件30,並以平直面2213限位電子元件30,由於開口221之第一端2211於基座21之表面劃分出承置區域212,而可使開口221內之電子元件30位於基座21之承置區域212上,溫控器23啟動座體231內之加熱件232,由於基座21裝配於座體231上,加熱件232即透過座體231與基座21之相貼合,而升溫基座21,當基座21內之高溫向上傳導時,由於基座21之承置區域212並無配置隔溫件24,使得基座21之高溫可傳導至承置區域212上的電子元件30,使電子元件30升溫至預設測試溫度。Please refer to Figures 3 and 4, a shifter (not shown) moves the
然,由於基座21之承置區域212與非承置區域213位於同一平面,且各承置區域212周側的非承置區域213上貼覆有隔溫件24,當基座21之高溫向上傳導至非承置區域213時,即可利用非承置區域213上之隔溫件24阻隔高溫傳導至相對應治具22的部位,易言之,基座21之高溫並不會傳導至治具22之開口221與開口221間的間隔壁223,即可防止高溫經由治具22之間隔壁223而向外流失,以有效確保電子元件30升溫至預設溫度,毋需提高加熱件232之加熱功率或增長加熱作業時間,更佳者,由於基座21之高溫不會經由治具22而流失,而可毋需於治具22之表面貼覆隔溫件24,以節省成本及縮減隔熱作業時序。However, since the
請參閱圖5,係本發明承置單元20之第二實施例,其與第一實施例相同之設計不再贅述,僅述明第二實施例與第一實施例之差異處,當承置單元20承置較大尺寸之電子元件30A時,可於基座21上拆卸原本之治具,並依較大尺寸的電子元件30A,而變換基座21之非承置區域213及隔溫件24的尺寸範圍
,例如切割或遷移隔溫件24之尺寸或位置,即可縮減基座21之非承置區域213,而擴增基座21之承置區域212,以因應承置較大尺寸之電子元件30A,基座21可裝配新的具較大開口221A之治具22A,治具22A之開口221A供移入且限位較大尺寸之電子元件30A,使電子元件30A置放於基座21之承置區域212,於溫控器23之加熱件232升溫基座21時,即可使位於基座21之承置區域212上之電子元件30A升溫至預設溫度,並仍可利用位於基座21之非承置區域213上之隔溫件24阻隔高溫流失。Please refer to FIG. 5, which is the second embodiment of the supporting
再者,隔溫件24亦可裝配於新的治具22A之貼合面,於基座21與治具22A相互組裝時,仍可使隔溫件24貼合配置於基座21之非承置區域213。Furthermore, the
請參閱圖6,本發明承置單元20應用於承載裝置4,承載裝置4包含承置單元20及驅動單元40,承置單元20設置基座21、治具22、溫控器23及隔溫件24,以供承置及溫控電子元件,驅動單元40設有至少一驅動源,以供驅動承置單元20作至少一方向位移,驅動源可為機械手臂、線性輸送器或轉軸等,不受限於本實施例,於本實施例中,驅動源係為線性輸送器41,以載送該承置單元20作線性位移至預設作業位置,承置單元20於載送過程中對電子元件30執行預熱或預冷作業,以縮減作業時間,進而提高生產效能。Referring to FIG. 6, the
請參閱圖2、3、7,一種電子元件作業設備包含機台5、供料裝置6、收料裝置7、作業裝置8、承置單元20、輸送裝置9及中央控制裝置(圖未示出
);供料裝置6係裝配於機台5,並設有至少一供料器61,以供承置待作業之電子元件;收料裝置7係裝配於機台5,並設有至少一收料器71,以供承置已作業之電子元件;作業裝置8係裝配於機台5,並設有至少一作業器,以供對電子元件執行預設作業,於本實施例中,作業器係為測試器,包含電性連接之電路板81及測試座82,以對電子元件執行測試作業;承置單元20係裝配於機台5,並包含基座21、治具22、溫控器23及隔溫件24,以供承置及溫控電子元件;輸送裝置9係配置於機台5,並設有至少一移料器,以供移載至少一電子元件,於本實施例中,輸送裝置9之第一移料器91於供料裝置6之供料器61取出待作業電子元件
,並移載至承置單元20,承置單元20承置及預溫待作業電子元件,第一移料器91再於承置單元20取出預溫後之待作業電子元件,並移載至輸送裝置9之供料載台92,供料載台92將預溫後之待作業電子元件載送至作業裝置8之側方,輸送裝置9之第二移料器93於供料載台92取出待作業之電子元件,並移載至測試座82而執行測試作業,以及將測試座82之已作業電子元件移載至輸送裝置9之出料載台94,出料載台94載出已作業之電子元件,輸送裝置9之第三移料器95於出料載台94取出已作業之電子元件,並依據測試結果,將已作業之電子元件輸送至收料裝置7之收料器71而分類收置;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。Please refer to Figures 2, 3, and 7, an electronic component operation equipment includes a machine 5, a
[習知]
10:承置單元
11:預熱盤
111:承置部
112:間隔壁
12:加熱件
13:電子元件
[本發明]
20:承置單元
21:基座
211:承接面
212:承置區域
213:非承置區域
22、22A:治具
221、221A:開口
2211:第一端
2212:第二端
2213:平直面
2214:斜面
222:貼合面
223:間隔壁
23:溫控器
231:座體
232:加熱件
24:隔溫件
30、30A:電子元件
4:承載裝置
40:驅動單元
41:線性輸送器
5:機台
6:供料裝置
61:供料器
7:收料裝置
71:收料器
8:作業裝置
81:電路板
82:測試座
9:輸送裝置
91:第一移料器
92:供料載台
93:第二移料器
94:出料載台
95:第三移料器[Learning]
10: Bearing unit
11: Preheating plate
111: Housing Department
112: Barrier
12: Heating parts
13: Electronic components
[this invention]
20: bearing unit
21: Pedestal
211: Acceptance
212: bearing area
213:
圖1:習知承置單元之使用示意圖。 圖2:本發明承置單元第一實施例之分解示意圖。 圖3:本發明承置單元第一實施例之組裝示意圖。 圖4:本發明承置單元第一實施例之使用示意圖。 圖5:本發明承置單元第二實施例之示意圖。 圖6:本發明承載裝置之示意圖。 圖7:本發明作業設備之示意圖。Figure 1: Schematic diagram of the use of conventional housing units. Figure 2: An exploded schematic view of the first embodiment of the holding unit of the present invention. Figure 3: The assembly diagram of the first embodiment of the holding unit of the present invention. Figure 4: A schematic diagram of the use of the first embodiment of the holding unit of the present invention. Figure 5: A schematic diagram of the second embodiment of the holding unit of the present invention. Figure 6: Schematic diagram of the carrying device of the present invention. Figure 7: Schematic diagram of the working equipment of the present invention.
21:基座21: Pedestal
212:承置區域212: bearing area
213:非承置區域213: non-holding area
22:治具22: Fixture
221:開口221: open
2213:平直面2213: straight face
2214:斜面2214: inclined plane
223:間隔壁223: The Wall
23:溫控器23: Thermostat
231:座體231: Block
232:加熱件232: heating element
24:隔溫件24: Temperature insulation
30:電子元件30: Electronic components
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109110046A TWI748390B (en) | 2020-03-25 | 2020-03-25 | Holding unit for electronic components, holding device and operation equipment using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109110046A TWI748390B (en) | 2020-03-25 | 2020-03-25 | Holding unit for electronic components, holding device and operation equipment using the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202136801A true TW202136801A (en) | 2021-10-01 |
| TWI748390B TWI748390B (en) | 2021-12-01 |
Family
ID=79601271
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109110046A TWI748390B (en) | 2020-03-25 | 2020-03-25 | Holding unit for electronic components, holding device and operation equipment using the same |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI748390B (en) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWM401777U (en) * | 2010-10-13 | 2011-04-11 | Advanced Electronics Co Ltd | High-power electronic device tester capable of providing constant temperature and humidity testing environment |
| CN102064086A (en) * | 2010-10-14 | 2011-05-18 | 清华大学 | Areal heating wafer table and heating method for laser heat treatment device |
| WO2012147343A1 (en) * | 2011-04-26 | 2012-11-01 | 株式会社ニコン | Substrate bonding device, substrate holding device, substrate bonding method, substrate holding method, multilayered semiconductor device, and overlapped substrate |
| TWI657252B (en) * | 2015-02-13 | 2019-04-21 | 日商精工愛普生股份有限公司 | Electronic component conveying device and electronic component inspection device |
| TWI542980B (en) * | 2015-02-13 | 2016-07-21 | Hon Tech Inc | Electronic components preheating equipment and its application equipment |
-
2020
- 2020-03-25 TW TW109110046A patent/TWI748390B/en active
Also Published As
| Publication number | Publication date |
|---|---|
| TWI748390B (en) | 2021-12-01 |
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