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TWI877871B - Processing device and pre-heating device of electronic component - Google Patents

Processing device and pre-heating device of electronic component Download PDF

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Publication number
TWI877871B
TWI877871B TW112141500A TW112141500A TWI877871B TW I877871 B TWI877871 B TW I877871B TW 112141500 A TW112141500 A TW 112141500A TW 112141500 A TW112141500 A TW 112141500A TW I877871 B TWI877871 B TW I877871B
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heat sink
working space
test
burning
frame
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TW112141500A
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Chinese (zh)
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TW202518041A (en
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鄭振輝
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鴻勁精密股份有限公司
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Abstract

The processing device having a supporter, a heat-dissipation member, and a driving unit. The supporter has at least one layer of supporting rack in a working space in order to receive a circuit board having a testing seat. The heat-dissipation member is disposed in the working space and has a heat-dissipation element to dissipate the heat from the electronic component on the testing seat. The driving unit has a moving arm which is movable along at least one direction to drive one of the supporting rack and the heat-dissipation member to move toward the other one so as to dissipate the heat from the electronic component which is pre-heated. Thus, the cost of the testing seat and the loading of the circuit board can be reduced. Therefore, the performance of pre-heating device can be enhanced.

Description

作業裝置及電子元件預燒設備Working equipment and electronic component pre-burning equipment

本發明提供一種大幅縮減測試座之成本及電路板之負荷,以提高使用效能之作業裝置。The present invention provides an operating device which greatly reduces the cost of a test socket and the load of a circuit board to improve the performance.

在現今,請參閱圖1、2,複數個電子元件11製作完成後,若需歷經較長之測試時間及高溫測試,業者以預燒模組12承置複數個電子元件11,並搬運至預燒設備執行預燒測試作業。預燒模組12包含電性連接之電路板121及複數個測試座122,電路板121以供電性連接預燒設備之電控連接板(圖未示出),測試座122以供承置及測試電子元件11,並配置外蓋123,於外蓋123蓋合測試座122時,能夠限位電子元件11。然電子元件11於測試中,其自身會產生高溫,為避免過當之高溫影響測試品質,預燒模組12於外蓋123之頂面設置複數片之散熱鰭片124,以供透過外蓋123之熱交換而對電子元件11執行散熱作業,使電子元件11於預設之預燒測試溫度進行測試作業。又為了更加精準控制電子元件11之預燒測試溫度,於外蓋123之底面配置加熱件125,利用加熱件125貼接電子元件11,而輔助調節電子元件11之預燒測試溫度。再觀,預燒設備之預燒爐體13於爐架131的作業空間132設有複數層之承架133,以供分別承置具有複數個電子元件11之預燒模組12,預燒爐體13之爐架131一側設有入風流道134,以供輸送高溫氣體流入作業空間132,使電子元件11於模擬日後應用之高溫環境進行預燒測試作業,爐架131之另一側則設有出風流道135,以供排出高溫氣體。惟,每一個預燒模組12若設置數十個或上百個之測試座122,相對地,必須配置數十個或上百個之外蓋123、散熱鰭片124及加熱件125,不僅相當耗費元件成本且組裝複雜,數量繁多之外蓋123、散熱鰭片124及加熱件125更增加電路板121之重量,而不利於搬運。再者,測試座122內之已預燒測試完畢的電子元件11會因仍貼合於高溫之加熱件125,以致必需耗時等待電子元件11降溫,不利於搬運至下一裝置,進而降低生產效能。Nowadays, please refer to Figures 1 and 2. After the production of multiple electronic components 11 is completed, if a longer test time and high temperature test are required, the industry uses a pre-burning module 12 to hold multiple electronic components 11 and transports them to the pre-burning equipment to perform the pre-burning test operation. The pre-burning module 12 includes an electrically connected circuit board 121 and a plurality of test sockets 122. The circuit board 121 is used to electrically connect to the electrical control connection board of the pre-burning equipment (not shown in the figure), and the test socket 122 is used to hold and test the electronic components 11, and is equipped with an outer cover 123. When the outer cover 123 covers the test socket 122, it can limit the electronic component 11. However, the electronic component 11 will generate high temperature during the test. To prevent the excessive high temperature from affecting the test quality, the pre-burning module 12 is provided with a plurality of heat sink fins 124 on the top surface of the outer cover 123 to perform heat dissipation on the electronic component 11 through heat exchange of the outer cover 123, so that the electronic component 11 can be tested at the preset pre-burning test temperature. In order to more accurately control the pre-burning test temperature of the electronic component 11, a heating element 125 is arranged on the bottom surface of the outer cover 123, and the heating element 125 is used to attach the electronic component 11 to assist in adjusting the pre-burning test temperature of the electronic component 11. Furthermore, the pre-firing furnace body 13 of the pre-firing equipment is provided with a plurality of layers of supports 133 in the working space 132 of the furnace rack 131 for respectively placing the pre-firing modules 12 having a plurality of electronic components 11. An air inlet channel 134 is provided on one side of the furnace rack 131 of the pre-firing furnace body 13 for conveying high-temperature gas into the working space 132 so that the electronic components 11 can be pre-firing tested in a high-temperature environment simulating future applications. An air outlet channel 135 is provided on the other side of the furnace rack 131 for exhausting the high-temperature gas. However, if each pre-burn module 12 is provided with dozens or hundreds of test sockets 122, dozens or hundreds of outer covers 123, heat sink fins 124 and heating elements 125 must be configured accordingly, which not only consumes considerable component costs but also complicates assembly. The large number of outer covers 123, heat sink fins 124 and heating elements 125 also increase the weight of the circuit board 121, which is not conducive to transportation. Furthermore, the electronic components 11 that have been pre-burned and tested in the test sockets 122 will still be attached to the high-temperature heating element 125, so it takes time to wait for the electronic components 11 to cool down, which is not conducive to transportation to the next device, thereby reducing production efficiency.

本發明之目的一,提供一種作業裝置,包含架置器、至少一散熱器及驅動單元,架置器設有至少一作業空間,作業空間配置至少一層之承架,以供承置具有測試座之電路板,至少一散熱器設置於架置器之作業空間,並設有散熱部件以供對測試座之電子元件執行散熱作業,驅動單元設有至少一移載臂,移載臂可作至少一方向位移,以供驅動承架及散熱器之其中一者朝向另一者位移,使散熱器可對預燒作業中之電子元件進行散熱作業,而確保電子元件於預設之預燒測試溫度進行測試作業;藉以,毋需於每一個電路板上之各測試座配置散熱器及加熱件,甚至毋需配置用以承裝散熱器及加熱件之外蓋,以大幅縮減元件配置,進而有效節省成本。The first object of the present invention is to provide a working device, comprising a mounting device, at least one heat sink and a driving unit, wherein the mounting device is provided with at least one working space, the working space is provided with at least one layer of a support frame for supporting a circuit board with a test seat, at least one heat sink is arranged in the working space of the mounting device, and is provided with a heat dissipation component for performing a heat dissipation operation on the electronic components of the test seat, and the driving unit is provided with at least one transfer arm, and the transfer arm can be used for at least one side The heat sink can be displaced in the direction of the heat sink to drive one of the support frame and the heat sink to move toward the other, so that the heat sink can dissipate heat for the electronic components in the pre-burn-in operation, thereby ensuring that the electronic components are tested at the preset pre-burn-in test temperature; thereby, it is not necessary to configure a heat sink and a heating element on each test socket on each circuit board, and it is even unnecessary to configure an outer cover for accommodating the heat sink and the heating element, thereby greatly reducing the component configuration and effectively saving costs.

本發明之目的二,提供一種作業裝置,其驅動單元可帶動承架及散熱器之其中一者朝向另一者位移,使散熱器對預燒作業中之電子元件執行散熱作業;藉以,毋需於各測試座配置散熱器及加熱件,以簡化測試座,進而大幅縮減電路板之負荷,達到利於搬運之使用效能。The second object of the present invention is to provide an operating device, wherein a driving unit can drive one of a support frame and a heat sink to move toward the other, so that the heat sink performs a heat dissipation operation on the electronic components in the pre-burn-in operation; thereby, it is not necessary to configure a heat sink and a heating element on each test seat, thereby simplifying the test seat, thereby greatly reducing the load of the circuit board, and achieving a use efficiency that is conducive to transportation.

本發明之目的三,提供一種作業裝置,其驅動單元能夠帶動散熱器與承架上之測試座相互分離,使測試座內之電子元件迅速回溫,以利將具測試座之電路板搬運至下一裝置處,進而提高使用效能。The third object of the present invention is to provide an operating device, wherein a driving unit can drive a heat sink and a test socket on a support frame to separate from each other, so that the electronic components in the test socket can be quickly heated up, so as to facilitate the transportation of the circuit board with the test socket to the next device, thereby improving the use efficiency.

本發明之目的四,提供一種電子元件預燒設備,包含預燒爐體及本發明作業裝置;預燒爐體設有氣體供應裝置,以供對爐內輸送具有預燒測試溫度之氣體;本發明作業裝置配置於預燒爐體之內部,並包含架置器、至少一散熱器及驅動單元,以供承置至少一具有測試座之電路板,使測試座之電子元件於預燒爐體內執行預燒測試作業,並對測試座內之電子元件進行散熱作業。The fourth object of the present invention is to provide an electronic component pre-burning equipment, comprising a pre-burning furnace body and the operating device of the present invention; the pre-burning furnace body is provided with a gas supply device for conveying gas having a pre-burning test temperature into the furnace; the operating device of the present invention is arranged inside the pre-burning furnace body, and comprises a mount, at least one heat sink and a drive unit for holding at least one circuit board having a test socket, so that the electronic components of the test socket perform a pre-burning test operation in the pre-burning furnace body, and perform a heat dissipation operation on the electronic components in the test socket.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable you to have a further understanding of the present invention, a preferred embodiment is given below with accompanying drawings:

請參閱圖3,本發明作業裝置之第一實施例,包含架置器21、至少一散熱器及驅動單元。Please refer to FIG. 3 , which shows a first embodiment of the operating device of the present invention, including a mounting device 21, at least one heat sink and a driving unit.

架置器21設有至少一作業空間,作業空間配置至少一層之承架,以供承置至少一具有測試座之電路板。更進一步,架置器21可為固定架或活動架,例如架置器21為活動式之搬運車架,以供移入或移出預燒爐體(圖未示出)之爐內。例如架置器21為預燒爐體之固定式爐架。The mounting device 21 is provided with at least one working space, and the working space is provided with at least one layer of support frames for supporting at least one circuit board with a test socket. Furthermore, the mounting device 21 can be a fixed frame or a movable frame, for example, the mounting device 21 is a movable transport frame for moving into or out of the pre-sintering furnace body (not shown). For example, the mounting device 21 is a fixed furnace frame of the pre-sintering furnace body.

於本實施例,預燒設備包含預燒爐體31及本發明之作業裝置,預燒爐體31設置氣體供應裝置(圖未示出),以供對爐內輸送具有預燒測試溫度之氣體,能夠對電子元件執行預燒測試作業。作業裝置之架置器21配置於預燒爐體31之內部,而作為爐架,架置器21之第一側板211及第二側板212間界定一作業空間213,並於作業空間213固設複數層水平配置之承架214,各承架214之第一面(例如頂面)為承載面2141,以供承置一具有複數個測試座之電路板(圖未示出),而第二面(例如底面)為承裝面2142,依作業需求,可供裝配驅動單元。更進一步,架置器21之至少一側設有相通作業空間213之至少一第一通口215,於本實施例,架置器21於第一側板211開設複數個相通作業空間213之第一通口215,以供流入具有預燒測試溫度之氣體,於第二側板212開設複數個相通作業空間213之第二通口216,以供流出氣體。In this embodiment, the pre-burning equipment includes a pre-burning furnace body 31 and the operating device of the present invention. The pre-burning furnace body 31 is provided with a gas supply device (not shown) for transporting gas with a pre-burning test temperature into the furnace, so as to perform a pre-burning test operation on electronic components. The mounting device 21 of the operating device is arranged inside the pre-calcining furnace body 31, and as a furnace frame, a working space 213 is defined between the first side plate 211 and the second side plate 212 of the mounting device 21, and a plurality of horizontally arranged supporting frames 214 are fixedly installed in the working space 213, and the first surface (for example, the top surface) of each supporting frame 214 is a supporting surface 2141 for supporting a circuit board with a plurality of test sockets (not shown in the figure), and the second surface (for example, the bottom surface) is a supporting surface 2142, which can be used to assemble the drive unit according to the working requirements. Furthermore, at least one side of the holder 21 is provided with at least one first opening 215 communicating with the working space 213. In the present embodiment, the holder 21 has a plurality of first openings 215 communicating with the working space 213 on the first side plate 211 for the inflow of gas having the pre-burning test temperature, and a plurality of second openings 216 communicating with the working space 213 on the second side plate 212 for the outflow of gas.

又,預燒爐體31與架置器21之間設有至少一流道,流道相通架置器21之作業空間213,以供輸送氣體。於本實施例,架置器21之第一側板211與預燒爐體31間形成有入風流道311,以供預燒爐體31之氣體供應裝置的氣體經由入風流道311及第一通口215而流入架置器21之作業空間213,架置器21之第二側板212與預燒爐體31間則形成有出風流道312,以供作業空間213之氣體經由第二通口216而流出至出風流道312。Furthermore, at least one flow channel is provided between the precalcining furnace body 31 and the rack 21, and the flow channel communicates with the working space 213 of the rack 21 for transporting gas. In this embodiment, an air inlet flow channel 311 is formed between the first side plate 211 of the rack 21 and the precalcining furnace body 31, so that the gas of the gas supply device of the precalcining furnace body 31 flows into the working space 213 of the rack 21 through the air inlet flow channel 311 and the first opening 215, and an air outlet flow channel 312 is formed between the second side plate 212 of the rack 21 and the precalcining furnace body 31, so that the gas in the working space 213 flows out to the air outlet flow channel 312 through the second opening 216.

至少一散熱器設置於架置器21之作業空間213,並設有至少一散熱部件,以供對測試座之電子元件執行散熱作業。更進一步,散熱器之散熱部件可為散熱鰭片,或包含散熱流道及於散熱流道內流動的流體等。At least one heat sink is disposed in the working space 213 of the mounting device 21 and is provided with at least one heat dissipation component for performing heat dissipation operations on the electronic components of the test socket. Furthermore, the heat dissipation component of the heat sink can be a heat dissipation fin, or include a heat dissipation channel and a fluid flowing in the heat dissipation channel.

依作業需求,散熱器配置至少一溫控件,以供溫控電子元件之測試溫度。更進一步,溫控件可為加熱件、致冷晶片或具流體之溫控座。According to the operation requirements, the heat sink is equipped with at least one temperature control unit to control the test temperature of the electronic components. Furthermore, the temperature control unit can be a heating element, a cooling chip or a temperature control seat with fluid.

於本實施例,散熱器包含本體221、可為散熱鰭片222之散熱部件 、接合件223及可為加熱件224之溫控件,本體221之上方設有複數片直立狀之散熱鰭片222,本體221之下方設有接合件223,接合件223依作業需求,可直接接觸測試座內之電子元件或者測試座之外蓋,加熱件224配置於接合件223之內部,以供溫控電子元件之測試溫度。 In this embodiment, the heat sink includes a body 221, a heat dissipation component which may be a heat dissipation fin 222, a joint 223 and a temperature control unit which may be a heating unit 224. A plurality of upright heat dissipation fins 222 are provided above the body 221, and a joint 223 is provided below the body 221. The joint 223 can directly contact the electronic components in the test seat or the outer cover of the test seat according to the operation requirements. The heating unit 224 is arranged inside the joint 223 to control the test temperature of the electronic components.

依作業需求,散熱器於本體221之底面裝配溫控件,並以溫控件作為接合件223,而直接接觸電子元件或者測試座之外蓋,亦無不可,不受限於本實施例。According to the operation requirements, the heat sink can be equipped with a temperature control unit on the bottom surface of the body 221, and the temperature control unit can be used as a joint 223 to directly contact the electronic component or the outer cover of the test socket, which is not limited to this embodiment.

驅動單元設有至少一移載臂23,以供驅動承架214及散熱器之其中一者朝向另一者位移。更進一步,驅動單元包含移載臂23及可驅動移載臂23位移之驅動源(圖未示出),驅動源可為線性馬達、壓缸或包含馬達及傳動組,傳動組可為皮帶輪組或螺桿螺座組。The driving unit is provided with at least one transfer arm 23 for driving one of the support frame 214 and the heat sink to move toward the other. Furthermore, the driving unit includes the transfer arm 23 and a drive source (not shown) that can drive the transfer arm 23 to move. The drive source can be a linear motor, a cylinder, or a motor and a transmission set. The transmission set can be a belt pulley set or a screw screw seat set.

依作業需求,驅動單元於架置器21之承架214底部設置可作至少一方向(例如Z方向)位移之移載臂23,移載臂23以供帶動散熱器朝向承架214位移;或者架置器21於承架214之上方設置橫架(圖未示出),驅動單元可於橫架之底部設置可作至少一方向(例如Z方向)位移之移載臂23,移載臂23以供帶動散熱器朝向承架214位移。According to the working requirements, the driving unit is provided with a transfer arm 23 capable of displacement in at least one direction (for example, the Z direction) at the bottom of the support frame 214 of the mount 21, and the transfer arm 23 is used to drive the radiator to move toward the support frame 214; or the mount 21 is provided with a cross frame (not shown) above the support frame 214, and the driving unit can be provided with a transfer arm 23 capable of displacement in at least one direction (for example, the Z direction) at the bottom of the cross frame, and the transfer arm 23 is used to drive the radiator to move toward the support frame 214.

於本實施例,驅動單元於架置器21之複數個承架214的承裝面2142設置複數個能夠由驅動源(圖未示出)驅動作Z方向位移之移載臂23,移載臂23裝配連結散熱器之本體221,而可帶動散熱器朝向承架214位移,以於承架214承置具有複數個測試座之電路板(圖未示出)時,可使散熱器接觸測試座之外蓋而執行散熱作業。In this embodiment, the driving unit sets a plurality of transfer arms 23 that can be driven by a driving source (not shown) to move in the Z direction on the supporting surface 2142 of the plurality of supports 214 of the mount 21. The transfer arms 23 are assembled and connected to the main body 221 of the heat sink, and can drive the heat sink to move toward the support frame 214, so that when the support frame 214 supports a circuit board (not shown) with a plurality of test sockets, the heat sink can contact the outer cover of the test socket to perform a heat dissipation operation.

請參閱圖4至圖6,電路板41承裝且電性連接複數個具有外蓋43之測試座42,測試座42以供承置及測試電子元件44,由於架置器21之承架214下方裝配複數個移載臂23,利用移載臂23帶動散熱器及溫控件對測試座42之電子元件44執行散熱及溫控作業,使得每一個電路板41上之各測試座42毋需配置散熱器及溫控件,甚至毋需於測試座42配置外蓋43,由此可知,數量繁多之電路板41,相對地可大幅縮減數量繁多之散熱器及溫控件,更佳者,可縮減數量繁多之外蓋43;因此,不僅簡化測試座42之結構而大幅節省測試用元件成本,亦可大幅減輕電路板41之負荷而利於搬運。Please refer to Figures 4 to 6. A circuit board 41 is mounted and electrically connected to a plurality of test sockets 42 having outer covers 43. The test sockets 42 are used to hold and test electronic components 44. Since a plurality of transfer arms 23 are mounted below the support frame 214 of the mount 21, the transfer arms 23 drive the heat sink and the temperature control unit to perform heat dissipation and temperature control operations on the electronic components 44 of the test sockets 42, so that each test socket on each circuit board 41 can be electrically connected to the test sockets 42. The test socket 42 does not need to be equipped with a heat sink and a temperature control unit, and even does not need to be equipped with an outer cover 43. Therefore, a large number of circuit boards 41 can be relatively greatly reduced in number. Even better, a large number of outer covers 43 can be reduced. Therefore, not only is the structure of the test socket 42 simplified and the cost of test components is greatly saved, but the load of the circuit board 41 can also be greatly reduced to facilitate transportation.

開啟預燒爐體31之門板(圖未示出),將複數個具有測試座42之電路板41分別置放於架置器21之複數個承架214的承載面2141,且位於作業空間213,電路板41以金手指或排線而電性連接預燒設備之電控連接板(圖未示出),並令電路板41之複數個測試座42對位複數個散熱器之接合件223;關閉門板,預燒爐體31之氣體供應裝置將具有預燒測試溫度之氣體輸送至入風流道311,入風流道311之氣體經由架置器21之第一側板211的第一通口215流入作業空間213,使架置器21之作業空間213形成一具有預燒測試溫度之測試環境,以供測試座42之電子元件44於預燒爐體31內執行預燒測試作業。驅動單元以驅動源(圖未示出 )驅動移載臂23作Z方向向下位移,移載臂23帶動散熱器之本體221、散熱鰭片222、接合件223及加熱件224朝向承架214及測試座42位移,並以接合件223接觸測試座42之外蓋43,利用複數個散熱鰭片222對本體221及電子元件44執行散熱作業,並以加熱件224精確溫控測試座42內之電子元件44保持預燒測試溫度而執行測試作業;架置器21之作業空間213內的氣體再由第二側板212的第二通口216流出至預燒爐體31之出風流道312而排出。 Open the door panel of the pre-sintering furnace body 31 (not shown in the figure), place the plurality of circuit boards 41 with test sockets 42 on the bearing surfaces 2141 of the plurality of brackets 214 of the mounting device 21, and place them in the working space 213. The circuit boards 41 are electrically connected to the electric control connection board (not shown in the figure) of the pre-sintering equipment by means of gold fingers or flat cables, and the plurality of test sockets 42 of the circuit boards 41 are aligned with the joints 223 of the plurality of heat sinks; close the door. The gas supply device of the pre-burning furnace body 31 delivers the gas with the pre-burning test temperature to the air inlet channel 311, and the gas in the air inlet channel 311 flows into the working space 213 through the first opening 215 of the first side plate 211 of the holder 21, so that the working space 213 of the holder 21 forms a test environment with the pre-burning test temperature, so that the electronic components 44 of the test socket 42 can perform the pre-burning test operation in the pre-burning furnace body 31. The driving unit drives the transfer arm 23 to move downward in the Z direction with a driving source (not shown in the figure). The transfer arm 23 drives the body 221, the heat sink fins 222, the joint 223 and the heating element 224 of the heat sink to move toward the support frame 214 and the test seat 42, and the joint 223 contacts the outer cover 43 of the test seat 42, and uses a plurality of heat sink fins 222 to perform heat dissipation operations on the body 221 and the electronic components 44, and uses the heating element 224 to accurately control the temperature of the electronic components 44 in the test seat 42 to maintain the pre-burning test temperature to perform the test operation; the gas in the working space 213 of the mount 21 then flows out from the second port 216 of the second side plate 212 to the air outlet channel 312 of the pre-burning furnace body 31 and is discharged.

請參閱圖7、8,本發明作業裝置之第二實施例大致相同第一實施例,其差異在於架置器21包含固定架217與活動架218,固定架217裝配於預燒爐體31之內部,並於作業空間213設置至少一橫架219,橫架219之底部以供裝配連結複數個散熱器之本體221,固定架217之兩側開設有相通作業空間213之第一通口215及第二通口216,以供流入及流出氣體,活動架218位於固定架217之內部 ,並設置至少一承架214,以供承置電路板41,活動架218之一側開設有相通作業空間213及第一通口215之第三通口2181,以供穿置橫架219及流入氣體,活動架218之另一側開設有相通作業空間213及第二通口216之第四通口2182,以供穿置橫架219及流出氣體,驅動單元以移載臂(圖未示出)連結活動架218,而可驅動活動架218作Z方向位移,活動架218帶動複數個承架214及複數個電路板41同步作Z方向向上位移,令測試座42朝向散熱器之接合件223位移,測試座42之外蓋43接觸散熱器之接合件223,使散熱器對電子元件44執行散熱作業,以確保電子元件44於預設之預燒測試溫度而執行測試作業。 Please refer to Figures 7 and 8. The second embodiment of the working device of the present invention is roughly the same as the first embodiment. The difference is that the mounting device 21 includes a fixed frame 217 and a movable frame 218. The fixed frame 217 is installed inside the precalciner body 31, and at least one cross frame 219 is set in the working space 213. The bottom of the cross frame 219 is used to assemble and connect the main body 221 of multiple radiators. The first opening 215 and the second opening 216 that communicate with the working space 213 are opened on both sides of the fixed frame 217 for the inflow and outflow of gas. The movable frame 218 is located inside the fixed frame 217. , and at least one support frame 214 is provided to support the circuit board 41. A third opening 2181 is provided on one side of the movable frame 218 to communicate with the working space 213 and the first opening 215, so as to allow the cross frame 219 to pass through and the gas to flow in. A fourth opening 2182 is provided on the other side of the movable frame 218 to communicate with the working space 213 and the second opening 216, so as to allow the cross frame 219 to pass through and the gas to flow out. The driving unit is connected with a transfer arm (not shown) The movable frame 218 can be driven to move in the Z direction. The movable frame 218 drives the plurality of supports 214 and the plurality of circuit boards 41 to move upward in the Z direction synchronously, so that the test seat 42 moves toward the joint 223 of the heat sink. The outer cover 43 of the test seat 42 contacts the joint 223 of the heat sink, so that the heat sink performs a heat dissipation operation on the electronic component 44, so as to ensure that the electronic component 44 performs a test operation at a preset pre-burn test temperature.

[習知] 電子元件11 預燒模組12 電路板121 測試座122 外蓋123 散熱鰭片124 加熱件125 預燒爐體13 爐架131 作業空間132 承架133 入風流道134 出風流道135 [本發明] 架置器21 第一側板211 第二側板212 作業空間213 承架214 承載面2141 承裝面2142 第一通口215 第二通口216 固定架217 活動架218 第三通口2181 第四通口2182 橫架219 本體221 散熱鰭片222 接合件223 加熱件224 移載臂23 預燒爐體31 入風流道311 出風流道312 電路板41 測試座42 外蓋43 電子元件44 [Knowledge] Electronic component 11 Pre-burning module 12 Circuit board 121 Test seat 122 Cover 123 Heat sink 124 Heating element 125 Pre-burning furnace body 13 Furnace frame 131 Working space 132 Support frame 133 Air inlet channel 134 Air outlet channel 135 [Present invention] Mounting device 21 First side plate 211 Second side plate 212 Working space 213 Support frame 214 Support surface 2141 Support surface 2142 First opening 215 Second opening 216 Fixed frame 217 Movable frame 218 Third opening 2181 Fourth opening 2182 Horizontal frame 219 Main body 221 Heat sink fin 222 Joint 223 Heating element 224 Transfer arm 23 Pre-burning furnace body 31 Air inlet channel 311 Air outlet channel 312 Circuit board 41 Test seat 42 Cover 43 Electronic component 44

圖1:習知預燒設備之局部使用示意圖。 圖2:習知圖1之局部放大示意圖。 圖3:本發明作業裝置第一實施例之局部示意圖。 圖4至圖6:本發明作業裝置第一實施例之使用局部示意圖。 圖7至圖8:本發明作業裝置第二實施例之使用局部示意圖。 Figure 1: A partial schematic diagram of the known pre-burning equipment. Figure 2: A partial enlarged schematic diagram of the known Figure 1. Figure 3: A partial schematic diagram of the first embodiment of the working device of the present invention. Figures 4 to 6: Partial schematic diagrams of the first embodiment of the working device of the present invention in use. Figures 7 to 8: Partial schematic diagrams of the second embodiment of the working device of the present invention in use.

21:架置器 21: Mounting device

211:第一側板 211: First side panel

212:第二側板 212: Second side panel

213:作業空間 213:Workspace

214:承架 214: Frame

2141:承載面 2141: Loading surface

2142:承裝面 2142: Mounting surface

215:第一通口 215: First port

216:第二通口 216: Second port

221:本體 221:Entity

222:散熱鰭片 222: Heat sink fins

223:接合件 223:Joints

224:加熱件 224: Heating element

23:移載臂 23: Transfer arm

31:預燒爐體 31: Pre-burning furnace body

311:入風流道 311: Entering the wind channel

312:出風流道 312: Windy Flow

Claims (5)

一種作業裝置,包含: 架置器:設有至少一作業空間,該作業空間配置至少一層之承架,以供承 置至少一具有測試座之電路板; 至少一散熱器:設置於該架置器之該作業空間,並設有至少一散熱部件, 以供對該測試座之電子元件執行散熱作業; 驅動單元:設有至少一移載臂,該移載臂能夠作至少一方向位移; 其中,該架置器設有活動架與固定架,該活動架設有該承架,該固定架於 該承架之上方設置橫架,該橫架供裝配該散熱器,該固定架之兩側設有相通該 作業空間之至少一第一通口及至少一第二通口,該活動架之一側設有相通該作 業空間及該第一通口之第三通口,於另一側設有相通該作業空間及該第二通口 之第四通口,該驅動單元之該移載臂能夠驅動該活動架及該承架朝向該散熱器 位移。 A working device, comprising: A mounting device: provided with at least one working space, the working space is equipped with at least one layer of support frames for supporting at least one circuit board with a test socket; At least one heat sink: arranged in the working space of the mounting device, and provided with at least one heat dissipation component, for performing heat dissipation operations on the electronic components of the test socket; A driving unit: provided with at least one transfer arm, the transfer arm can be displaced in at least one direction; Wherein, the mounting device is provided with a movable frame and a fixed frame, the movable frame is provided with the support frame, the fixed frame is provided with a cross frame above the support frame, the cross frame is provided with the heat sink, the two sides of the fixed frame are provided with at least one first opening and at least one second opening communicating with the working space, one side of the movable frame is provided with a The third opening is connected to the working space and the first opening, and a fourth opening is provided on the other side to communicate with the working space and the second opening. The transfer arm of the driving unit can drive the movable frame and the support frame to move toward the radiator. 如請求項1所述之作業裝置,其該散熱器包含本體、散熱部件及接合件,該本體以供裝配該散熱部件,該散熱部件以供散熱,該接合件設於該本體及該散熱部件之下方,以供接觸該電子元件或該測試座之外蓋。The operating device as described in claim 1, wherein the heat sink includes a main body, a heat sink component and a connector, wherein the main body is used to assemble the heat sink component, the heat sink component is used for heat dissipation, and the connector is arranged below the main body and the heat sink component to contact the outer cover of the electronic component or the test socket. 如請求項1或2所述之作業裝置,其該散熱器配置至少一溫控件。In the operating device as described in claim 1 or 2, the radiator is equipped with at least one temperature control unit. 一種電子元件預燒設備,包含: 預燒爐體:設有氣體供應裝置,以供對爐內輸送具預燒測試溫度之氣體; 至少一如請求項1所述之作業裝置:位於該預燒爐體之內部,以架置器之 至少一承架承置至少一具有測試座及電子元件之電路板。 An electronic component pre-burning device comprises: A pre-burning furnace body: provided with a gas supply device for conveying gas having a pre-burning test temperature into the furnace; At least one operating device as described in claim 1: located inside the pre-burning furnace body, with at least one support of a mounting device to support at least one circuit board having a test socket and electronic components. 如請求項4所述之電子元件預燒設備,其該預燒爐體與該架置器之 間設有至少一流道,該流道相通該架置器之作業空間,以供輸送該氣體。 As described in claim 4, the electronic component pre-burning equipment has at least one flow channel between the pre-burning furnace body and the mounter, and the flow channel is connected to the working space of the mounter for conveying the gas.
TW112141500A 2023-10-30 2023-10-30 Processing device and pre-heating device of electronic component TWI877871B (en)

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101512354A (en) * 2005-04-19 2009-08-19 佛姆法克特股份有限公司 Apparatus and method for managing thermally induced motion of a probe card assembly
CN218445818U (en) * 2022-07-28 2023-02-03 苏州华兴源创科技股份有限公司 Semiconductor chip test equipment

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101512354A (en) * 2005-04-19 2009-08-19 佛姆法克特股份有限公司 Apparatus and method for managing thermally induced motion of a probe card assembly
CN218445818U (en) * 2022-07-28 2023-02-03 苏州华兴源创科技股份有限公司 Semiconductor chip test equipment

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