TWI877871B - Processing device and pre-heating device of electronic component - Google Patents
Processing device and pre-heating device of electronic component Download PDFInfo
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- TWI877871B TWI877871B TW112141500A TW112141500A TWI877871B TW I877871 B TWI877871 B TW I877871B TW 112141500 A TW112141500 A TW 112141500A TW 112141500 A TW112141500 A TW 112141500A TW I877871 B TWI877871 B TW I877871B
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Abstract
Description
本發明提供一種大幅縮減測試座之成本及電路板之負荷,以提高使用效能之作業裝置。The present invention provides an operating device which greatly reduces the cost of a test socket and the load of a circuit board to improve the performance.
在現今,請參閱圖1、2,複數個電子元件11製作完成後,若需歷經較長之測試時間及高溫測試,業者以預燒模組12承置複數個電子元件11,並搬運至預燒設備執行預燒測試作業。預燒模組12包含電性連接之電路板121及複數個測試座122,電路板121以供電性連接預燒設備之電控連接板(圖未示出),測試座122以供承置及測試電子元件11,並配置外蓋123,於外蓋123蓋合測試座122時,能夠限位電子元件11。然電子元件11於測試中,其自身會產生高溫,為避免過當之高溫影響測試品質,預燒模組12於外蓋123之頂面設置複數片之散熱鰭片124,以供透過外蓋123之熱交換而對電子元件11執行散熱作業,使電子元件11於預設之預燒測試溫度進行測試作業。又為了更加精準控制電子元件11之預燒測試溫度,於外蓋123之底面配置加熱件125,利用加熱件125貼接電子元件11,而輔助調節電子元件11之預燒測試溫度。再觀,預燒設備之預燒爐體13於爐架131的作業空間132設有複數層之承架133,以供分別承置具有複數個電子元件11之預燒模組12,預燒爐體13之爐架131一側設有入風流道134,以供輸送高溫氣體流入作業空間132,使電子元件11於模擬日後應用之高溫環境進行預燒測試作業,爐架131之另一側則設有出風流道135,以供排出高溫氣體。惟,每一個預燒模組12若設置數十個或上百個之測試座122,相對地,必須配置數十個或上百個之外蓋123、散熱鰭片124及加熱件125,不僅相當耗費元件成本且組裝複雜,數量繁多之外蓋123、散熱鰭片124及加熱件125更增加電路板121之重量,而不利於搬運。再者,測試座122內之已預燒測試完畢的電子元件11會因仍貼合於高溫之加熱件125,以致必需耗時等待電子元件11降溫,不利於搬運至下一裝置,進而降低生產效能。Nowadays, please refer to Figures 1 and 2. After the production of multiple
本發明之目的一,提供一種作業裝置,包含架置器、至少一散熱器及驅動單元,架置器設有至少一作業空間,作業空間配置至少一層之承架,以供承置具有測試座之電路板,至少一散熱器設置於架置器之作業空間,並設有散熱部件以供對測試座之電子元件執行散熱作業,驅動單元設有至少一移載臂,移載臂可作至少一方向位移,以供驅動承架及散熱器之其中一者朝向另一者位移,使散熱器可對預燒作業中之電子元件進行散熱作業,而確保電子元件於預設之預燒測試溫度進行測試作業;藉以,毋需於每一個電路板上之各測試座配置散熱器及加熱件,甚至毋需配置用以承裝散熱器及加熱件之外蓋,以大幅縮減元件配置,進而有效節省成本。The first object of the present invention is to provide a working device, comprising a mounting device, at least one heat sink and a driving unit, wherein the mounting device is provided with at least one working space, the working space is provided with at least one layer of a support frame for supporting a circuit board with a test seat, at least one heat sink is arranged in the working space of the mounting device, and is provided with a heat dissipation component for performing a heat dissipation operation on the electronic components of the test seat, and the driving unit is provided with at least one transfer arm, and the transfer arm can be used for at least one side The heat sink can be displaced in the direction of the heat sink to drive one of the support frame and the heat sink to move toward the other, so that the heat sink can dissipate heat for the electronic components in the pre-burn-in operation, thereby ensuring that the electronic components are tested at the preset pre-burn-in test temperature; thereby, it is not necessary to configure a heat sink and a heating element on each test socket on each circuit board, and it is even unnecessary to configure an outer cover for accommodating the heat sink and the heating element, thereby greatly reducing the component configuration and effectively saving costs.
本發明之目的二,提供一種作業裝置,其驅動單元可帶動承架及散熱器之其中一者朝向另一者位移,使散熱器對預燒作業中之電子元件執行散熱作業;藉以,毋需於各測試座配置散熱器及加熱件,以簡化測試座,進而大幅縮減電路板之負荷,達到利於搬運之使用效能。The second object of the present invention is to provide an operating device, wherein a driving unit can drive one of a support frame and a heat sink to move toward the other, so that the heat sink performs a heat dissipation operation on the electronic components in the pre-burn-in operation; thereby, it is not necessary to configure a heat sink and a heating element on each test seat, thereby simplifying the test seat, thereby greatly reducing the load of the circuit board, and achieving a use efficiency that is conducive to transportation.
本發明之目的三,提供一種作業裝置,其驅動單元能夠帶動散熱器與承架上之測試座相互分離,使測試座內之電子元件迅速回溫,以利將具測試座之電路板搬運至下一裝置處,進而提高使用效能。The third object of the present invention is to provide an operating device, wherein a driving unit can drive a heat sink and a test socket on a support frame to separate from each other, so that the electronic components in the test socket can be quickly heated up, so as to facilitate the transportation of the circuit board with the test socket to the next device, thereby improving the use efficiency.
本發明之目的四,提供一種電子元件預燒設備,包含預燒爐體及本發明作業裝置;預燒爐體設有氣體供應裝置,以供對爐內輸送具有預燒測試溫度之氣體;本發明作業裝置配置於預燒爐體之內部,並包含架置器、至少一散熱器及驅動單元,以供承置至少一具有測試座之電路板,使測試座之電子元件於預燒爐體內執行預燒測試作業,並對測試座內之電子元件進行散熱作業。The fourth object of the present invention is to provide an electronic component pre-burning equipment, comprising a pre-burning furnace body and the operating device of the present invention; the pre-burning furnace body is provided with a gas supply device for conveying gas having a pre-burning test temperature into the furnace; the operating device of the present invention is arranged inside the pre-burning furnace body, and comprises a mount, at least one heat sink and a drive unit for holding at least one circuit board having a test socket, so that the electronic components of the test socket perform a pre-burning test operation in the pre-burning furnace body, and perform a heat dissipation operation on the electronic components in the test socket.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable you to have a further understanding of the present invention, a preferred embodiment is given below with accompanying drawings:
請參閱圖3,本發明作業裝置之第一實施例,包含架置器21、至少一散熱器及驅動單元。Please refer to FIG. 3 , which shows a first embodiment of the operating device of the present invention, including a
架置器21設有至少一作業空間,作業空間配置至少一層之承架,以供承置至少一具有測試座之電路板。更進一步,架置器21可為固定架或活動架,例如架置器21為活動式之搬運車架,以供移入或移出預燒爐體(圖未示出)之爐內。例如架置器21為預燒爐體之固定式爐架。The
於本實施例,預燒設備包含預燒爐體31及本發明之作業裝置,預燒爐體31設置氣體供應裝置(圖未示出),以供對爐內輸送具有預燒測試溫度之氣體,能夠對電子元件執行預燒測試作業。作業裝置之架置器21配置於預燒爐體31之內部,而作為爐架,架置器21之第一側板211及第二側板212間界定一作業空間213,並於作業空間213固設複數層水平配置之承架214,各承架214之第一面(例如頂面)為承載面2141,以供承置一具有複數個測試座之電路板(圖未示出),而第二面(例如底面)為承裝面2142,依作業需求,可供裝配驅動單元。更進一步,架置器21之至少一側設有相通作業空間213之至少一第一通口215,於本實施例,架置器21於第一側板211開設複數個相通作業空間213之第一通口215,以供流入具有預燒測試溫度之氣體,於第二側板212開設複數個相通作業空間213之第二通口216,以供流出氣體。In this embodiment, the pre-burning equipment includes a
又,預燒爐體31與架置器21之間設有至少一流道,流道相通架置器21之作業空間213,以供輸送氣體。於本實施例,架置器21之第一側板211與預燒爐體31間形成有入風流道311,以供預燒爐體31之氣體供應裝置的氣體經由入風流道311及第一通口215而流入架置器21之作業空間213,架置器21之第二側板212與預燒爐體31間則形成有出風流道312,以供作業空間213之氣體經由第二通口216而流出至出風流道312。Furthermore, at least one flow channel is provided between the
至少一散熱器設置於架置器21之作業空間213,並設有至少一散熱部件,以供對測試座之電子元件執行散熱作業。更進一步,散熱器之散熱部件可為散熱鰭片,或包含散熱流道及於散熱流道內流動的流體等。At least one heat sink is disposed in the
依作業需求,散熱器配置至少一溫控件,以供溫控電子元件之測試溫度。更進一步,溫控件可為加熱件、致冷晶片或具流體之溫控座。According to the operation requirements, the heat sink is equipped with at least one temperature control unit to control the test temperature of the electronic components. Furthermore, the temperature control unit can be a heating element, a cooling chip or a temperature control seat with fluid.
於本實施例,散熱器包含本體221、可為散熱鰭片222之散熱部件
、接合件223及可為加熱件224之溫控件,本體221之上方設有複數片直立狀之散熱鰭片222,本體221之下方設有接合件223,接合件223依作業需求,可直接接觸測試座內之電子元件或者測試座之外蓋,加熱件224配置於接合件223之內部,以供溫控電子元件之測試溫度。
In this embodiment, the heat sink includes a
依作業需求,散熱器於本體221之底面裝配溫控件,並以溫控件作為接合件223,而直接接觸電子元件或者測試座之外蓋,亦無不可,不受限於本實施例。According to the operation requirements, the heat sink can be equipped with a temperature control unit on the bottom surface of the
驅動單元設有至少一移載臂23,以供驅動承架214及散熱器之其中一者朝向另一者位移。更進一步,驅動單元包含移載臂23及可驅動移載臂23位移之驅動源(圖未示出),驅動源可為線性馬達、壓缸或包含馬達及傳動組,傳動組可為皮帶輪組或螺桿螺座組。The driving unit is provided with at least one
依作業需求,驅動單元於架置器21之承架214底部設置可作至少一方向(例如Z方向)位移之移載臂23,移載臂23以供帶動散熱器朝向承架214位移;或者架置器21於承架214之上方設置橫架(圖未示出),驅動單元可於橫架之底部設置可作至少一方向(例如Z方向)位移之移載臂23,移載臂23以供帶動散熱器朝向承架214位移。According to the working requirements, the driving unit is provided with a
於本實施例,驅動單元於架置器21之複數個承架214的承裝面2142設置複數個能夠由驅動源(圖未示出)驅動作Z方向位移之移載臂23,移載臂23裝配連結散熱器之本體221,而可帶動散熱器朝向承架214位移,以於承架214承置具有複數個測試座之電路板(圖未示出)時,可使散熱器接觸測試座之外蓋而執行散熱作業。In this embodiment, the driving unit sets a plurality of
請參閱圖4至圖6,電路板41承裝且電性連接複數個具有外蓋43之測試座42,測試座42以供承置及測試電子元件44,由於架置器21之承架214下方裝配複數個移載臂23,利用移載臂23帶動散熱器及溫控件對測試座42之電子元件44執行散熱及溫控作業,使得每一個電路板41上之各測試座42毋需配置散熱器及溫控件,甚至毋需於測試座42配置外蓋43,由此可知,數量繁多之電路板41,相對地可大幅縮減數量繁多之散熱器及溫控件,更佳者,可縮減數量繁多之外蓋43;因此,不僅簡化測試座42之結構而大幅節省測試用元件成本,亦可大幅減輕電路板41之負荷而利於搬運。Please refer to Figures 4 to 6. A
開啟預燒爐體31之門板(圖未示出),將複數個具有測試座42之電路板41分別置放於架置器21之複數個承架214的承載面2141,且位於作業空間213,電路板41以金手指或排線而電性連接預燒設備之電控連接板(圖未示出),並令電路板41之複數個測試座42對位複數個散熱器之接合件223;關閉門板,預燒爐體31之氣體供應裝置將具有預燒測試溫度之氣體輸送至入風流道311,入風流道311之氣體經由架置器21之第一側板211的第一通口215流入作業空間213,使架置器21之作業空間213形成一具有預燒測試溫度之測試環境,以供測試座42之電子元件44於預燒爐體31內執行預燒測試作業。驅動單元以驅動源(圖未示出
)驅動移載臂23作Z方向向下位移,移載臂23帶動散熱器之本體221、散熱鰭片222、接合件223及加熱件224朝向承架214及測試座42位移,並以接合件223接觸測試座42之外蓋43,利用複數個散熱鰭片222對本體221及電子元件44執行散熱作業,並以加熱件224精確溫控測試座42內之電子元件44保持預燒測試溫度而執行測試作業;架置器21之作業空間213內的氣體再由第二側板212的第二通口216流出至預燒爐體31之出風流道312而排出。
Open the door panel of the pre-sintering furnace body 31 (not shown in the figure), place the plurality of
請參閱圖7、8,本發明作業裝置之第二實施例大致相同第一實施例,其差異在於架置器21包含固定架217與活動架218,固定架217裝配於預燒爐體31之內部,並於作業空間213設置至少一橫架219,橫架219之底部以供裝配連結複數個散熱器之本體221,固定架217之兩側開設有相通作業空間213之第一通口215及第二通口216,以供流入及流出氣體,活動架218位於固定架217之內部
,並設置至少一承架214,以供承置電路板41,活動架218之一側開設有相通作業空間213及第一通口215之第三通口2181,以供穿置橫架219及流入氣體,活動架218之另一側開設有相通作業空間213及第二通口216之第四通口2182,以供穿置橫架219及流出氣體,驅動單元以移載臂(圖未示出)連結活動架218,而可驅動活動架218作Z方向位移,活動架218帶動複數個承架214及複數個電路板41同步作Z方向向上位移,令測試座42朝向散熱器之接合件223位移,測試座42之外蓋43接觸散熱器之接合件223,使散熱器對電子元件44執行散熱作業,以確保電子元件44於預設之預燒測試溫度而執行測試作業。
Please refer to Figures 7 and 8. The second embodiment of the working device of the present invention is roughly the same as the first embodiment. The difference is that the
[習知]
電子元件11
預燒模組12
電路板121
測試座122
外蓋123
散熱鰭片124
加熱件125
預燒爐體13
爐架131
作業空間132
承架133
入風流道134
出風流道135
[本發明]
架置器21
第一側板211
第二側板212
作業空間213
承架214
承載面2141
承裝面2142
第一通口215
第二通口216
固定架217
活動架218
第三通口2181
第四通口2182
橫架219
本體221
散熱鰭片222
接合件223
加熱件224
移載臂23
預燒爐體31
入風流道311
出風流道312
電路板41
測試座42
外蓋43
電子元件44
[Knowledge]
圖1:習知預燒設備之局部使用示意圖。 圖2:習知圖1之局部放大示意圖。 圖3:本發明作業裝置第一實施例之局部示意圖。 圖4至圖6:本發明作業裝置第一實施例之使用局部示意圖。 圖7至圖8:本發明作業裝置第二實施例之使用局部示意圖。 Figure 1: A partial schematic diagram of the known pre-burning equipment. Figure 2: A partial enlarged schematic diagram of the known Figure 1. Figure 3: A partial schematic diagram of the first embodiment of the working device of the present invention. Figures 4 to 6: Partial schematic diagrams of the first embodiment of the working device of the present invention in use. Figures 7 to 8: Partial schematic diagrams of the second embodiment of the working device of the present invention in use.
21:架置器 21: Mounting device
211:第一側板 211: First side panel
212:第二側板 212: Second side panel
213:作業空間 213:Workspace
214:承架 214: Frame
2141:承載面 2141: Loading surface
2142:承裝面 2142: Mounting surface
215:第一通口 215: First port
216:第二通口 216: Second port
221:本體 221:Entity
222:散熱鰭片 222: Heat sink fins
223:接合件 223:Joints
224:加熱件 224: Heating element
23:移載臂 23: Transfer arm
31:預燒爐體 31: Pre-burning furnace body
311:入風流道 311: Entering the wind channel
312:出風流道 312: Windy Flow
Claims (5)
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| TW112141500A TWI877871B (en) | 2023-10-30 | 2023-10-30 | Processing device and pre-heating device of electronic component |
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| TW202518041A TW202518041A (en) | 2025-05-01 |
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| TW (1) | TWI877871B (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101512354A (en) * | 2005-04-19 | 2009-08-19 | 佛姆法克特股份有限公司 | Apparatus and method for managing thermally induced motion of a probe card assembly |
| CN218445818U (en) * | 2022-07-28 | 2023-02-03 | 苏州华兴源创科技股份有限公司 | Semiconductor chip test equipment |
-
2023
- 2023-10-30 TW TW112141500A patent/TWI877871B/en active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101512354A (en) * | 2005-04-19 | 2009-08-19 | 佛姆法克特股份有限公司 | Apparatus and method for managing thermally induced motion of a probe card assembly |
| CN218445818U (en) * | 2022-07-28 | 2023-02-03 | 苏州华兴源创科技股份有限公司 | Semiconductor chip test equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202518041A (en) | 2025-05-01 |
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