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WO2009028596A1 - 受動素子内蔵基板、製造方法、及び半導体装置 - Google Patents

受動素子内蔵基板、製造方法、及び半導体装置 Download PDF

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Publication number
WO2009028596A1
WO2009028596A1 PCT/JP2008/065380 JP2008065380W WO2009028596A1 WO 2009028596 A1 WO2009028596 A1 WO 2009028596A1 JP 2008065380 W JP2008065380 W JP 2008065380W WO 2009028596 A1 WO2009028596 A1 WO 2009028596A1
Authority
WO
WIPO (PCT)
Prior art keywords
substrate
passive element
connection pad
manufacturing
terminal electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/065380
Other languages
English (en)
French (fr)
Inventor
Akinobu Shibuya
Akira Ouchi
Yasuhiro Ishii
Tooru Mori
Koichi Takemura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP2009530174A priority Critical patent/JPWO2009028596A1/ja
Publication of WO2009028596A1 publication Critical patent/WO2009028596A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H10W70/614
    • H10W70/685
    • H10W90/401
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G2/00Details of capacitors not covered by a single one of groups H01G4/00-H01G11/00
    • H01G2/02Mountings
    • H01G2/06Mountings specially adapted for mounting on a printed-circuit support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/002Details
    • H01G4/228Terminals
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • H05K1/111Pads for surface mounting, e.g. lay-out
    • H05K1/112Pads for surface mounting, e.g. lay-out directly combined with via connections
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/182Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
    • H05K1/185Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit
    • H10W70/682
    • H10W72/07251
    • H10W72/20

Landscapes

  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)

Abstract

 破壊が起こりにくく、低コストで容易に製造可能な受動素子内蔵基板およびその製造方法を提供する。接続パッド2が形成された実装基板1と、基板7に薄膜受動素子4が形成されるとともに、接続パッド2に対向する薄膜受動素子4側の面に接続パッド2に対応した端子電極3が形成され、かつ、端子電極3が接続パッド2に接合され、基板7の厚さが15μm以下である受動素子チップと、受動素子チップと実装基板1の間に充填されるとともに、受動素子チップの外周部に配された部分の上面が基板7の上面と一致するように形成された樹脂6と、基板7の上面に半導体素子又は半導体パッケージの端子に対応して形成されたLSI接続パッド9と、受動素子チップ内にて対応するLSI接続パッド9と端子電極3とを電気的に接続するように形成された貫通ビア8と、を備える。
PCT/JP2008/065380 2007-08-30 2008-08-28 受動素子内蔵基板、製造方法、及び半導体装置 Ceased WO2009028596A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009530174A JPWO2009028596A1 (ja) 2007-08-30 2008-08-28 受動素子内蔵基板、製造方法、及び半導体装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-224261 2007-08-30
JP2007224261 2007-08-30

Publications (1)

Publication Number Publication Date
WO2009028596A1 true WO2009028596A1 (ja) 2009-03-05

Family

ID=40387310

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/065380 Ceased WO2009028596A1 (ja) 2007-08-30 2008-08-28 受動素子内蔵基板、製造方法、及び半導体装置

Country Status (2)

Country Link
JP (1) JPWO2009028596A1 (ja)
WO (1) WO2009028596A1 (ja)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014120519A (ja) * 2012-12-13 2014-06-30 Mitsubishi Electric Corp 半導体装置
WO2016117245A1 (ja) * 2015-01-21 2016-07-28 ソニー株式会社 インターポーザ、モジュールおよびインターポーザの製造方法
JP2019114723A (ja) * 2017-12-25 2019-07-11 凸版印刷株式会社 キャパシタ内蔵ガラス回路基板及びキャパシタ内蔵ガラス回路基板の製造方法
CN110024066A (zh) * 2017-02-21 2019-07-16 Tdk株式会社 薄膜电容器
WO2019225698A1 (ja) * 2018-05-24 2019-11-28 凸版印刷株式会社 回路基板
KR20200022792A (ko) * 2018-08-23 2020-03-04 주식회사 엘지화학 배터리 팩 기판 및 배터리 팩 기판 접속 시스템
JP2020087992A (ja) * 2018-11-16 2020-06-04 Tdk株式会社 薄膜キャパシタ及びその製造方法、並びに、薄膜キャパシタを内蔵する回路基板
WO2025173472A1 (ja) * 2024-02-16 2025-08-21 Tdk株式会社 薄膜キャパシタ

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006186238A (ja) * 2004-12-28 2006-07-13 Shinko Electric Ind Co Ltd 配線基板の製造方法
JP2007184324A (ja) * 2006-01-04 2007-07-19 Nec Corp キャパシタ、チップキャリア型キャパシタ、半導体装置および実装基板ならびにキャパシタの製造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4240899B2 (ja) * 2001-03-26 2009-03-18 Necエレクトロニクス株式会社 半導体装置及び半導体装置の製造方法
JP4100936B2 (ja) * 2002-03-01 2008-06-11 Necエレクトロニクス株式会社 半導体装置の製造方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006186238A (ja) * 2004-12-28 2006-07-13 Shinko Electric Ind Co Ltd 配線基板の製造方法
JP2007184324A (ja) * 2006-01-04 2007-07-19 Nec Corp キャパシタ、チップキャリア型キャパシタ、半導体装置および実装基板ならびにキャパシタの製造方法

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014120519A (ja) * 2012-12-13 2014-06-30 Mitsubishi Electric Corp 半導体装置
WO2016117245A1 (ja) * 2015-01-21 2016-07-28 ソニー株式会社 インターポーザ、モジュールおよびインターポーザの製造方法
US20180019198A1 (en) * 2015-01-21 2018-01-18 Sony Corporation Interposer, module, and method of producing interposer
US10020250B2 (en) 2015-01-21 2018-07-10 Sony Corporation Interposer, module, and method of producing interposer
CN110024066A (zh) * 2017-02-21 2019-07-16 Tdk株式会社 薄膜电容器
JP2019114723A (ja) * 2017-12-25 2019-07-11 凸版印刷株式会社 キャパシタ内蔵ガラス回路基板及びキャパシタ内蔵ガラス回路基板の製造方法
WO2019225698A1 (ja) * 2018-05-24 2019-11-28 凸版印刷株式会社 回路基板
JP7509035B2 (ja) 2018-05-24 2024-07-02 Toppanホールディングス株式会社 回路基板
CN112088489A (zh) * 2018-05-24 2020-12-15 凸版印刷株式会社 电路基板
JPWO2019225698A1 (ja) * 2018-05-24 2021-07-01 凸版印刷株式会社 回路基板
US11303261B2 (en) 2018-05-24 2022-04-12 Toppan Printing Co., Ltd. Circuit board
CN112088489B (zh) * 2018-05-24 2025-06-24 凸版印刷株式会社 电路基板
KR20200022792A (ko) * 2018-08-23 2020-03-04 주식회사 엘지화학 배터리 팩 기판 및 배터리 팩 기판 접속 시스템
KR102650086B1 (ko) * 2018-08-23 2024-03-20 주식회사 엘지에너지솔루션 배터리 팩 기판 및 배터리 팩 기판 접속 시스템
JP2020087992A (ja) * 2018-11-16 2020-06-04 Tdk株式会社 薄膜キャパシタ及びその製造方法、並びに、薄膜キャパシタを内蔵する回路基板
JP7225721B2 (ja) 2018-11-16 2023-02-21 Tdk株式会社 薄膜キャパシタ及びその製造方法、並びに、薄膜キャパシタを内蔵する回路基板
WO2025173472A1 (ja) * 2024-02-16 2025-08-21 Tdk株式会社 薄膜キャパシタ

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