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WO2009022427A1 - 取得装置、試験装置および製造方法 - Google Patents

取得装置、試験装置および製造方法 Download PDF

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Publication number
WO2009022427A1
WO2009022427A1 PCT/JP2007/065965 JP2007065965W WO2009022427A1 WO 2009022427 A1 WO2009022427 A1 WO 2009022427A1 JP 2007065965 W JP2007065965 W JP 2007065965W WO 2009022427 A1 WO2009022427 A1 WO 2009022427A1
Authority
WO
WIPO (PCT)
Prior art keywords
signal
strobe
observed
strobe signal
flip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/065965
Other languages
English (en)
French (fr)
Inventor
Satoru Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to PCT/JP2007/065965 priority Critical patent/WO2009022427A1/ja
Priority to JP2009528015A priority patent/JP5113846B2/ja
Publication of WO2009022427A1 publication Critical patent/WO2009022427A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Abstract

　観測対象の信号を取り込むべきタイミングを示すストローブ信号を発生するストローブ発生部と、観測対象信号をストローブ信号のタイミングで取得するフリップフロップと、直前のストローブ信号に応じてフリップフロップにより取得された直前の観測対象信号の値に応じて、次の観測対象信号を取り込むための次のストローブ信号のタイミングを変更する変更部と、を備える取得装置を提供する。変更部は、ストローブ信号を、互いに異なる遅延量だけ遅延させる複数の遅延部と、複数の遅延部により互いに異なる遅延量だけ遅延された複数のストローブ信号の中から、直前の観測対象信号の値に応じて次のストローブ信号を選択する選択部と、を有し、フリップフロップは、選択部により選択された次のストローブ信号を入力してよい。
PCT/JP2007/065965 2007-08-16 2007-08-16 取得装置、試験装置および製造方法 Ceased WO2009022427A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/JP2007/065965 WO2009022427A1 (ja) 2007-08-16 2007-08-16 取得装置、試験装置および製造方法
JP2009528015A JP5113846B2 (ja) 2007-08-16 2007-08-16 取得装置、試験装置および製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/065965 WO2009022427A1 (ja) 2007-08-16 2007-08-16 取得装置、試験装置および製造方法

Publications (1)

Publication Number Publication Date
WO2009022427A1 true WO2009022427A1 (ja) 2009-02-19

Family

ID=40350491

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/065965 Ceased WO2009022427A1 (ja) 2007-08-16 2007-08-16 取得装置、試験装置および製造方法

Country Status (2)

Country Link
JP (1) JP5113846B2 (ja)
WO (1) WO2009022427A1 (ja)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05327435A (ja) * 1992-05-20 1993-12-10 Matsushita Electron Corp 半導体集積回路装置
JPH0836037A (ja) * 1994-07-20 1996-02-06 Advantest Corp 伝送経路の伝播遅延時間測定回路
JP2001201532A (ja) * 2000-01-18 2001-07-27 Advantest Corp 半導体デバイス試験方法・半導体デバイス試験装置
JP2005285160A (ja) * 2004-03-26 2005-10-13 Advantest Corp 試験装置及び試験方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05327435A (ja) * 1992-05-20 1993-12-10 Matsushita Electron Corp 半導体集積回路装置
JPH0836037A (ja) * 1994-07-20 1996-02-06 Advantest Corp 伝送経路の伝播遅延時間測定回路
JP2001201532A (ja) * 2000-01-18 2001-07-27 Advantest Corp 半導体デバイス試験方法・半導体デバイス試験装置
JP2005285160A (ja) * 2004-03-26 2005-10-13 Advantest Corp 試験装置及び試験方法

Also Published As

Publication number Publication date
JPWO2009022427A1 (ja) 2010-11-11
JP5113846B2 (ja) 2013-01-09

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