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WO2009001451A1 - 検出装置及び試験装置 - Google Patents

検出装置及び試験装置 Download PDF

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Publication number
WO2009001451A1
WO2009001451A1 PCT/JP2007/062925 JP2007062925W WO2009001451A1 WO 2009001451 A1 WO2009001451 A1 WO 2009001451A1 JP 2007062925 W JP2007062925 W JP 2007062925W WO 2009001451 A1 WO2009001451 A1 WO 2009001451A1
Authority
WO
WIPO (PCT)
Prior art keywords
change point
section
signals
timing
strobe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/062925
Other languages
English (en)
French (fr)
Inventor
Tasuku Fujibe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to KR1020107001936A priority Critical patent/KR20100034030A/ko
Priority to JP2009520252A priority patent/JP5143836B2/ja
Priority to PCT/JP2007/062925 priority patent/WO2009001451A1/ja
Priority to DE112007003570T priority patent/DE112007003570T5/de
Priority to US11/857,448 priority patent/US7840858B2/en
Priority to TW097123373A priority patent/TWI386666B/zh
Publication of WO2009001451A1 publication Critical patent/WO2009001451A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

　互いに位相が異なる複数のストローブ信号を生成するマルチストローブ生成部と、複数のストローブ信号のそれぞれのタイミングにおける被測定信号の信号値をそれぞれ取得する複数の取得部と、隣接する２つのストローブ信号に応じて取得された２つの信号値が異なる場合に、当該２つのストローブ信号の間に被測定信号の変化点があったことを検出する複数の変化点検出部と、複数の変化点検出部のうち、有効とする変化点検出部を設定するマスク設定部と、有効とされた変化点検出部の出力に基づいて、被測定信号の変化タイミングを出力する変化タイミング出力部とを備える検出装置を提供する。
PCT/JP2007/062925 2007-06-27 2007-06-27 検出装置及び試験装置 Ceased WO2009001451A1 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
KR1020107001936A KR20100034030A (ko) 2007-06-27 2007-06-27 검출 장치 및 시험 장치
JP2009520252A JP5143836B2 (ja) 2007-06-27 2007-06-27 検出装置及び試験装置
PCT/JP2007/062925 WO2009001451A1 (ja) 2007-06-27 2007-06-27 検出装置及び試験装置
DE112007003570T DE112007003570T5 (de) 2007-06-27 2007-06-27 Erfassungsgerät und Prüfgerät
US11/857,448 US7840858B2 (en) 2007-06-27 2007-09-19 Detection apparatus and test apparatus
TW097123373A TWI386666B (zh) 2007-06-27 2008-06-23 偵測裝置以及測試裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/062925 WO2009001451A1 (ja) 2007-06-27 2007-06-27 検出装置及び試験装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US11/857,448 Continuation US7840858B2 (en) 2007-06-27 2007-09-19 Detection apparatus and test apparatus

Publications (1)

Publication Number Publication Date
WO2009001451A1 true WO2009001451A1 (ja) 2008-12-31

Family

ID=40161590

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/062925 Ceased WO2009001451A1 (ja) 2007-06-27 2007-06-27 検出装置及び試験装置

Country Status (6)

Country Link
US (1) US7840858B2 (ja)
JP (1) JP5143836B2 (ja)
KR (1) KR20100034030A (ja)
DE (1) DE112007003570T5 (ja)
TW (1) TWI386666B (ja)
WO (1) WO2009001451A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010092800A1 (ja) * 2009-02-13 2010-08-19 株式会社アドバンテスト 試験装置および試験方法
JP2012247318A (ja) * 2011-05-27 2012-12-13 Advantest Corp 試験装置および試験方法
JP2016536583A (ja) * 2013-11-06 2016-11-24 テラダイン、 インコーポレイテッド 事象検出能力を有する自動試験システム

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101221080B1 (ko) * 2008-11-19 2013-01-11 가부시키가이샤 어드밴티스트 시험 장치, 시험 방법, 및 프로그램
US20110054827A1 (en) * 2009-08-26 2011-03-03 Advantest Corporation, a Japanese Corporation Test apparatus and method for modulated signal
TWI552098B (zh) * 2012-07-17 2016-10-01 Chunghwa Telecom Co Ltd Electronic billboarding system based on inter - party relationship judgment
US9575114B2 (en) * 2013-07-10 2017-02-21 Elite Semiconductor Memory Technology Inc. Test system and device
US9003244B2 (en) * 2013-07-31 2015-04-07 International Business Machines Corporation Dynamic built-in self-test system
JP6883482B2 (ja) * 2016-08-26 2021-06-09 エイブリック株式会社 センサ回路

Citations (6)

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JPH07244078A (ja) * 1994-02-16 1995-09-19 Tektronix Inc ロジックアナライザ
JP2001153933A (ja) * 1999-11-30 2001-06-08 Sharp Corp 半導体試験装置
WO2002103379A1 (en) * 2001-06-13 2002-12-27 Advantest Corporation Semiconductor device testing instrument and semiconductor device testing method
JP2004125552A (ja) * 2002-10-01 2004-04-22 Advantest Corp ジッタ測定装置、及び試験装置
JP2004127455A (ja) * 2002-10-04 2004-04-22 Advantest Corp マルチストローブ生成装置、試験装置、及び調整方法
JP2004325332A (ja) * 2003-04-25 2004-11-18 Advantest Corp 測定装置、及びプログラム

Family Cites Families (12)

* Cited by examiner, † Cited by third party
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US6182233B1 (en) * 1998-11-20 2001-01-30 International Business Machines Corporation Interlocked pipelined CMOS
JP4118463B2 (ja) * 1999-07-23 2008-07-16 株式会社アドバンテスト タイミング保持機能を搭載したｉｃ試験装置
US6629274B1 (en) * 1999-12-21 2003-09-30 Intel Corporation Method and apparatus to structurally detect random defects that impact AC I/O timings in an input/output buffer
US6477674B1 (en) * 1999-12-29 2002-11-05 Intel Corporation Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elements
JP2002082830A (ja) * 2000-02-14 2002-03-22 Mitsubishi Electric Corp インターフェイス回路
US6377065B1 (en) * 2000-04-13 2002-04-23 Advantest Corp. Glitch detection for semiconductor test system
KR100425446B1 (ko) * 2001-04-27 2004-03-30 삼성전자주식회사 캘리브레이션 될 소정의 클럭신호를 선택하는클럭선택회로를 구비하는 반도체 메모리 장치의 입력회로및 소정의 클럭신호를 선택하는 방법
JP4859854B2 (ja) * 2001-06-13 2012-01-25 株式会社アドバンテスト 半導体デバイス試験装置、及び半導体デバイス試験方法
JP4251800B2 (ja) * 2001-11-08 2009-04-08 株式会社アドバンテスト 試験装置
JP4279489B2 (ja) * 2001-11-08 2009-06-17 株式会社アドバンテスト タイミング発生器、及び試験装置
US7406646B2 (en) * 2002-10-01 2008-07-29 Advantest Corporation Multi-strobe apparatus, testing apparatus, and adjusting method
JP4284527B2 (ja) * 2004-03-26 2009-06-24 日本電気株式会社 メモリインターフェイス制御回路

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07244078A (ja) * 1994-02-16 1995-09-19 Tektronix Inc ロジックアナライザ
JP2001153933A (ja) * 1999-11-30 2001-06-08 Sharp Corp 半導体試験装置
WO2002103379A1 (en) * 2001-06-13 2002-12-27 Advantest Corporation Semiconductor device testing instrument and semiconductor device testing method
JP2004125552A (ja) * 2002-10-01 2004-04-22 Advantest Corp ジッタ測定装置、及び試験装置
JP2004127455A (ja) * 2002-10-04 2004-04-22 Advantest Corp マルチストローブ生成装置、試験装置、及び調整方法
JP2004325332A (ja) * 2003-04-25 2004-11-18 Advantest Corp 測定装置、及びプログラム

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010092800A1 (ja) * 2009-02-13 2010-08-19 株式会社アドバンテスト 試験装置および試験方法
US7965093B2 (en) 2009-02-13 2011-06-21 Advantest Corporation Test apparatus and test method for testing a device under test using a multi-strobe
JPWO2010092800A1 (ja) * 2009-02-13 2012-08-16 株式会社アドバンテスト 試験装置および試験方法
JP2012247318A (ja) * 2011-05-27 2012-12-13 Advantest Corp 試験装置および試験方法
US8898531B2 (en) 2011-05-27 2014-11-25 Advantest Corporation Test apparatus and test method
JP2016536583A (ja) * 2013-11-06 2016-11-24 テラダイン、 インコーポレイテッド 事象検出能力を有する自動試験システム

Also Published As

Publication number Publication date
KR20100034030A (ko) 2010-03-31
US7840858B2 (en) 2010-11-23
TWI386666B (zh) 2013-02-21
TW200900713A (en) 2009-01-01
DE112007003570T5 (de) 2010-08-26
US20090006025A1 (en) 2009-01-01
JPWO2009001451A1 (ja) 2010-08-26
JP5143836B2 (ja) 2013-02-13

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