[go: up one dir, main page]

USD813180S1 - Elastic membrane for semiconductor wafer polishing apparatus - Google Patents

Elastic membrane for semiconductor wafer polishing apparatus Download PDF

Info

Publication number
USD813180S1
USD813180S1 US29/580,339 US201629580339F USD813180S US D813180 S1 USD813180 S1 US D813180S1 US 201629580339 F US201629580339 F US 201629580339F US D813180 S USD813180 S US D813180S
Authority
US
United States
Prior art keywords
semiconductor wafer
polishing apparatus
elastic membrane
wafer polishing
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/580,339
Inventor
Makoto Fukushima
Hozumi Yasuda
Keisuke Namiki
Osamu Nabeya
Shingo Togashi
Satoru Yamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JPD2013-10677F external-priority patent/JP1521451S/ja
Priority claimed from JPD2013-10674F external-priority patent/JP1495081S/ja
Priority claimed from JPD2013-10672F external-priority patent/JP1494713S/ja
Priority claimed from JPD2013-10673F external-priority patent/JP1495738S/ja
Priority claimed from JPD2013-10676F external-priority patent/JP1495739S/ja
Priority claimed from JPD2013-10678F external-priority patent/JP1521701S/ja
Priority claimed from JPD2013-10675F external-priority patent/JP1495082S/ja
Priority to US29/580,339 priority Critical patent/USD813180S1/en
Application filed by Ebara Corp filed Critical Ebara Corp
Application granted granted Critical
Publication of USD813180S1 publication Critical patent/USD813180S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Description

FIG. 1 is a top plan view of a first embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 2 is a bottom plan view thereof;
FIG. 3 is a front side view thereof;
FIG. 4 is a right side view thereof;
FIG. 5 is a left side view thereof;
FIG. 6 is a cross sectional view taken along section line 6-6 in FIG. 1;
FIG. 7 is an enlarged perspective view of a portion labeled FIG. 7 in FIG. 1;
FIG. 8 is an opposite side view of FIG. 7;
FIG. 9 is a top plan view of a second embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 10 is a bottom plan view thereof;
FIG. 11 is a front side view thereof;
FIG. 12 is a right side view thereof;
FIG. 13 is a left side view thereof;
FIG. 14 is a cross sectional view taken along section line 14-14 in FIG. 9;
FIG. 15 is an enlarged perspective view of a portion labeled FIG. 15 in FIG. 9; and,
FIG. 16 is an opposite side view of FIG. 15.
The broken lines shown in the drawings represent portions of the elastic membrane for semiconductor wafer polishing apparatus that form no part of the claimed design. The dashed-dot-dashed lines represent the boundary lines of the claimed design.
All surfaces not shown form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an elastic membrane for semiconductor wafer polishing apparatus, as shown and described.
US29/580,339 2013-05-15 2016-10-07 Elastic membrane for semiconductor wafer polishing apparatus Active USD813180S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/580,339 USD813180S1 (en) 2013-05-15 2016-10-07 Elastic membrane for semiconductor wafer polishing apparatus

Applications Claiming Priority (16)

Application Number Priority Date Filing Date Title
JP2013-10677 2013-05-15
JP2013-10678 2013-05-15
JPD2013-10674F JP1495081S (en) 2013-05-15 2013-05-15
JPD2013-10672F JP1494713S (en) 2013-05-15 2013-05-15
JPD2013-10673F JP1495738S (en) 2013-05-15 2013-05-15
JP2013-10675 2013-05-15
JP2013-10673 2013-05-15
JPD2013-10676F JP1495739S (en) 2013-05-15 2013-05-15
JP2013-10674 2013-05-15
JPD2013-10678F JP1521701S (en) 2013-05-15 2013-05-15
JPD2013-10677F JP1521451S (en) 2013-05-15 2013-05-15
JP2013-10676 2013-05-15
JP2013-10672 2013-05-15
JPD2013-10675F JP1495082S (en) 2013-05-15 2013-05-15
US29/472,346 USD769200S1 (en) 2013-05-15 2013-11-12 Elastic membrane for semiconductor wafer polishing apparatus
US29/580,339 USD813180S1 (en) 2013-05-15 2016-10-07 Elastic membrane for semiconductor wafer polishing apparatus

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US29/472,346 Division USD769200S1 (en) 2013-05-15 2013-11-12 Elastic membrane for semiconductor wafer polishing apparatus

Publications (1)

Publication Number Publication Date
USD813180S1 true USD813180S1 (en) 2018-03-20

Family

ID=57120114

Family Applications (2)

Application Number Title Priority Date Filing Date
US29/472,346 Active USD769200S1 (en) 2013-05-15 2013-11-12 Elastic membrane for semiconductor wafer polishing apparatus
US29/580,339 Active USD813180S1 (en) 2013-05-15 2016-10-07 Elastic membrane for semiconductor wafer polishing apparatus

Family Applications Before (1)

Application Number Title Priority Date Filing Date
US29/472,346 Active USD769200S1 (en) 2013-05-15 2013-11-12 Elastic membrane for semiconductor wafer polishing apparatus

Country Status (1)

Country Link
US (2) USD769200S1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD913977S1 (en) * 2016-12-12 2021-03-23 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD981969S1 (en) * 2020-12-18 2023-03-28 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD769200S1 (en) * 2013-05-15 2016-10-18 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD808349S1 (en) * 2013-05-15 2018-01-23 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD801942S1 (en) * 2015-04-16 2017-11-07 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD797067S1 (en) * 2015-04-21 2017-09-12 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD798248S1 (en) * 2015-06-18 2017-09-26 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD799646S1 (en) * 2016-08-30 2017-10-10 Asm Ip Holding B.V. Heater block
USD836572S1 (en) * 2016-09-30 2018-12-25 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
JP6833591B2 (en) 2016-10-28 2021-02-24 株式会社荏原製作所 Substrate holding device, elastic film, polishing device, and how to replace the elastic film
US11179823B2 (en) 2016-10-28 2021-11-23 Ebara Corporation Substrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane
USD859331S1 (en) * 2017-03-31 2019-09-10 Ebara Corporation Vacuum contact pad
USD859332S1 (en) 2017-06-29 2019-09-10 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD851613S1 (en) 2017-10-05 2019-06-18 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD868124S1 (en) 2017-12-11 2019-11-26 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD918161S1 (en) * 2017-12-19 2021-05-04 Ebara Corporation Elastic membrane
USD877101S1 (en) 2018-03-09 2020-03-03 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD954567S1 (en) 2019-06-25 2022-06-14 Ebara Corporation Measurement jig
JP1651619S (en) * 2019-07-11 2020-01-27
JP1651618S (en) * 2019-07-11 2020-01-27
JP1651623S (en) * 2019-07-18 2020-01-27
USD908645S1 (en) 2019-08-26 2021-01-26 Applied Materials, Inc. Sputtering target for a physical vapor deposition chamber
USD937329S1 (en) 2020-03-23 2021-11-30 Applied Materials, Inc. Sputter target for a physical vapor deposition chamber
USD947802S1 (en) * 2020-05-20 2022-04-05 Applied Materials, Inc. Replaceable substrate carrier interfacing film
USD989012S1 (en) * 2020-09-17 2023-06-13 Ebara Corporation Elastic membrane
USD940765S1 (en) 2020-12-02 2022-01-11 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD1006768S1 (en) * 2021-01-07 2023-12-05 Solaero Technologies Corp. Semiconductor wafer for mosaic solar cell fabrication
USD1072774S1 (en) 2021-02-06 2025-04-29 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD1007449S1 (en) 2021-05-07 2023-12-12 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD1038901S1 (en) 2022-01-12 2024-08-13 Applied Materials, Inc. Collimator for a physical vapor deposition chamber
USD1053230S1 (en) 2022-05-19 2024-12-03 Applied Materials, Inc. Sputter target for a physical vapor deposition chamber
JP1770111S (en) 2023-03-09 2024-05-10 Drip tray for mobile cleaning robot
USD1051530S1 (en) * 2023-03-29 2024-11-12 Irobot Corporation Drip tray for use with a mobile cleaning robot
USD1090499S1 (en) * 2024-02-27 2025-08-26 Avery Dennison Retail Information Services Llc Antenna
USD1092453S1 (en) * 2024-04-22 2025-09-09 Avery Dennison Retail Information Services Llc Antenna

Citations (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3627338A (en) * 1969-10-09 1971-12-14 Sheldon Thompson Vacuum chuck
US20010029158A1 (en) 1998-07-30 2001-10-11 Yoshitaka Sasaki Polishing apparatus and polishing method, and method of manufacturing semiconductor device and method of manufacturing thin film magnetic head
US6402594B1 (en) * 1999-01-18 2002-06-11 Shin-Etsu Handotai Co., Ltd. Polishing method for wafer and holding plate
US20020160693A1 (en) * 1999-12-28 2002-10-31 Takashi Nihonmatsu Wafer polishing method and wafer polishing device
US6659850B2 (en) 2000-03-31 2003-12-09 Speedfam-Ipec Corporation Work piece carrier with adjustable pressure zones and barriers and a method of planarizing a work piece
US20040175951A1 (en) 2003-03-07 2004-09-09 Applied Materials, Inc. Substrate carrier with a textured membrane
US20050035514A1 (en) * 2003-08-11 2005-02-17 Supercritical Systems, Inc. Vacuum chuck apparatus and method for holding a wafer during high pressure processing
US20050215182A1 (en) * 2004-03-05 2005-09-29 Strasbaugh Wafer carrier with pressurized membrane and retaining ring actuator
US20070063453A1 (en) * 2004-03-25 2007-03-22 Ibiden Co., Ltd. Vacuum chuck and suction board
US20080070479A1 (en) 2004-11-01 2008-03-20 Ebara Corporation Polishing Apparatus
US7357699B2 (en) 2003-02-10 2008-04-15 Ebara Corporation Substrate holding apparatus and polishing apparatus
US7402098B2 (en) 2006-10-27 2008-07-22 Novellus Systems, Inc. Carrier head for workpiece planarization/polishing
US20090068934A1 (en) 2007-09-04 2009-03-12 Samsung Electronics Co., Ltd. Wafer polishing carrier apparatus and chemical mechanical polishing equipment using the same
US20090068935A1 (en) 2003-10-17 2009-03-12 Hiroomi Torii Polishing apparatus
US20090111362A1 (en) 2007-10-29 2009-04-30 Ebara Corporation Polishing Apparatus
US20090247057A1 (en) 2005-09-14 2009-10-01 Ebara Corporation Polishing platen and polishing apparatus
USD616390S1 (en) 2009-03-06 2010-05-25 Tokyo Electron Limited Quartz cover for manufacturing semiconductor wafers
CN301348233S (en) 2009-08-27 2010-09-15 株式会社荏原制作所 Elastic film for semiconductor wafer polishing device
USD633452S1 (en) 2009-08-27 2011-03-01 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD634719S1 (en) 2009-08-27 2011-03-22 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
TWD139857S (en) 2009-08-27 2011-04-11 荏原製作所股份有限公司 Elastic film for semiconductor wafer polishing equipment
USD649126S1 (en) 2008-10-20 2011-11-22 Ebara Corporation Vacuum contact pad
TWD146491S (en) 2010-12-28 2012-04-21 荏原製作所股份有限公司 Elastic film for semiconductor wafer polishing
USD684551S1 (en) 2011-07-07 2013-06-18 Phuong Van Nguyen Wafer polishing pad holder
US8469776B2 (en) 2006-11-22 2013-06-25 Applied Materials, Inc. Flexible membrane for carrier head
USD686175S1 (en) 2012-03-20 2013-07-16 Veeco Instruments Inc. Wafer carrier having pockets
USD686582S1 (en) 2012-03-20 2013-07-23 Veeco Instruments Inc. Wafer carrier having pockets
USD687790S1 (en) 2012-03-20 2013-08-13 Veeco Instruments Inc. Keyed wafer carrier
USD687791S1 (en) 2012-03-20 2013-08-13 Veeco Instruments Inc. Multi-keyed wafer carrier
US20130316628A1 (en) 2012-05-23 2013-11-28 Samsung Electronics Co., Ltd. Flexible membranes for a polishing head
USD711330S1 (en) 2010-12-28 2014-08-19 Ebara Corporation Elastic membrane for semiconductor wafer polishing
US8859070B2 (en) 2011-11-30 2014-10-14 Ebara Corporation Elastic membrane
USD769200S1 (en) * 2013-05-15 2016-10-18 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD770990S1 (en) * 2013-05-15 2016-11-08 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD797067S1 (en) * 2015-04-21 2017-09-12 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD798248S1 (en) * 2015-06-18 2017-09-26 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target

Patent Citations (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3627338A (en) * 1969-10-09 1971-12-14 Sheldon Thompson Vacuum chuck
US20010029158A1 (en) 1998-07-30 2001-10-11 Yoshitaka Sasaki Polishing apparatus and polishing method, and method of manufacturing semiconductor device and method of manufacturing thin film magnetic head
US6402594B1 (en) * 1999-01-18 2002-06-11 Shin-Etsu Handotai Co., Ltd. Polishing method for wafer and holding plate
US20020160693A1 (en) * 1999-12-28 2002-10-31 Takashi Nihonmatsu Wafer polishing method and wafer polishing device
US6659850B2 (en) 2000-03-31 2003-12-09 Speedfam-Ipec Corporation Work piece carrier with adjustable pressure zones and barriers and a method of planarizing a work piece
US7357699B2 (en) 2003-02-10 2008-04-15 Ebara Corporation Substrate holding apparatus and polishing apparatus
US20040175951A1 (en) 2003-03-07 2004-09-09 Applied Materials, Inc. Substrate carrier with a textured membrane
US20050035514A1 (en) * 2003-08-11 2005-02-17 Supercritical Systems, Inc. Vacuum chuck apparatus and method for holding a wafer during high pressure processing
US20090068935A1 (en) 2003-10-17 2009-03-12 Hiroomi Torii Polishing apparatus
US20050215182A1 (en) * 2004-03-05 2005-09-29 Strasbaugh Wafer carrier with pressurized membrane and retaining ring actuator
US20070063453A1 (en) * 2004-03-25 2007-03-22 Ibiden Co., Ltd. Vacuum chuck and suction board
US20080070479A1 (en) 2004-11-01 2008-03-20 Ebara Corporation Polishing Apparatus
US20090247057A1 (en) 2005-09-14 2009-10-01 Ebara Corporation Polishing platen and polishing apparatus
US7402098B2 (en) 2006-10-27 2008-07-22 Novellus Systems, Inc. Carrier head for workpiece planarization/polishing
US8469776B2 (en) 2006-11-22 2013-06-25 Applied Materials, Inc. Flexible membrane for carrier head
US20090068934A1 (en) 2007-09-04 2009-03-12 Samsung Electronics Co., Ltd. Wafer polishing carrier apparatus and chemical mechanical polishing equipment using the same
US20090111362A1 (en) 2007-10-29 2009-04-30 Ebara Corporation Polishing Apparatus
USD649126S1 (en) 2008-10-20 2011-11-22 Ebara Corporation Vacuum contact pad
USD616390S1 (en) 2009-03-06 2010-05-25 Tokyo Electron Limited Quartz cover for manufacturing semiconductor wafers
USD633452S1 (en) 2009-08-27 2011-03-01 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
CN301348233S (en) 2009-08-27 2010-09-15 株式会社荏原制作所 Elastic film for semiconductor wafer polishing device
USD634719S1 (en) 2009-08-27 2011-03-22 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
TWD139857S (en) 2009-08-27 2011-04-11 荏原製作所股份有限公司 Elastic film for semiconductor wafer polishing equipment
USD729753S1 (en) 2010-12-28 2015-05-19 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD711330S1 (en) 2010-12-28 2014-08-19 Ebara Corporation Elastic membrane for semiconductor wafer polishing
TWD146491S (en) 2010-12-28 2012-04-21 荏原製作所股份有限公司 Elastic film for semiconductor wafer polishing
USD684551S1 (en) 2011-07-07 2013-06-18 Phuong Van Nguyen Wafer polishing pad holder
US8859070B2 (en) 2011-11-30 2014-10-14 Ebara Corporation Elastic membrane
USD687790S1 (en) 2012-03-20 2013-08-13 Veeco Instruments Inc. Keyed wafer carrier
USD687791S1 (en) 2012-03-20 2013-08-13 Veeco Instruments Inc. Multi-keyed wafer carrier
USD686582S1 (en) 2012-03-20 2013-07-23 Veeco Instruments Inc. Wafer carrier having pockets
USD686175S1 (en) 2012-03-20 2013-07-16 Veeco Instruments Inc. Wafer carrier having pockets
US20130316628A1 (en) 2012-05-23 2013-11-28 Samsung Electronics Co., Ltd. Flexible membranes for a polishing head
USD769200S1 (en) * 2013-05-15 2016-10-18 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD770990S1 (en) * 2013-05-15 2016-11-08 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus
USD797067S1 (en) * 2015-04-21 2017-09-12 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target
USD798248S1 (en) * 2015-06-18 2017-09-26 Applied Materials, Inc. Target profile for a physical vapor deposition chamber target

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD913977S1 (en) * 2016-12-12 2021-03-23 Ebara Corporation Elastic membrane for semiconductor wafer polishing
USD981969S1 (en) * 2020-12-18 2023-03-28 Ebara Corporation Elastic membrane for semiconductor wafer polishing apparatus

Also Published As

Publication number Publication date
USD769200S1 (en) 2016-10-18

Similar Documents

Publication Publication Date Title
USD813180S1 (en) Elastic membrane for semiconductor wafer polishing apparatus
USD808349S1 (en) Elastic membrane for semiconductor wafer polishing apparatus
USD913977S1 (en) Elastic membrane for semiconductor wafer polishing
USD772841S1 (en) Headphone device
USD754096S1 (en) Amplifier
USD717112S1 (en) Cutlery
USD776438S1 (en) Toothbrush
USD727280S1 (en) Headphone device
USD736175S1 (en) Headphone device
USD727281S1 (en) Headphone device
USD744881S1 (en) Breathalyzer
USD790491S1 (en) Power semiconductor device
USD727763S1 (en) Breathalyzer
USD717111S1 (en) Cutlery
USD793016S1 (en) Brush cleaning apparatus
USD786235S1 (en) Support for a mobile device
USD766820S1 (en) Battery
USD774628S1 (en) Conduit coupler
USD743798S1 (en) Bottle
USD717000S1 (en) Hair stylizing apparatus
USD714098S1 (en) Glass
USD731448S1 (en) Polishing pad for substrate polishing apparatus
USD859332S1 (en) Elastic membrane for semiconductor wafer polishing
USD757240S1 (en) Duct member for coolant and chip extraction
USD769832S1 (en) Semiconductor device