TWI274029B - Testing machine for integrated circuits - Google Patents

Abstract

The present invention relates to a testing machine for integrated circuits, which comprises a first feeding means provided with at least one holding tray, wherein said at least holding tray is used to hold untested integrated circuits thereon; a passing means used to pick untested integrated circuits and then place them onto a first carrying means and a second carrying means, respectively; a testing means having a plurality of testing apparatus and pick-and-place mechanisms which are respectively arranged at back side of the first and the second carrying mechanism, wherein the respective pick-and-place mechanisms can place tested integrated circuits onto the first and the second carrying mechanism, respectively, and then pick other untested integrated circuits of the first and the second carrying mechanism onto the testing apparatus so as to have a testing process. In addition, the first and the second carrying means can transport tested integrated circuits to the passing means by which said tested integrated circuits can be picked out, then other untested integrated circuits will be placed onto the first and the second carrying means so as to be tested, also, the passing means will further transmit the tested integrated circuits to a second collection means for storage, thereby enabling to enhance the production efficiency.

Description

1274029 IX. Description of the invention: [Technical field to which the invention belongs] This article is a technical and technical work. [Previous technology] The heart is now, after the completion of the integrated circuit (Ic) 3, Will use the -i C detector to perform circuit test operations to detect

If there is any damage in the process, the defective product will be eliminated. Please refer to Taiwan's No. 9i2iG786 before the application of the first image. ig ig ϋ 有 有 供 供 供 供 供 供 供 供 供 供 供 供 供 供 供 供 供 供 供 供 供 供=Disk'-The left cantilever pick-and-place mechanism 2 drives the pick and place device 3 to move to the feeding frame 1 in the first direction (for example, the direction: direction), so that the pick-and-placer 3 to t are moved in the tray The 1c to be tested is taken out and transferred to the carrier 5 of the 6-transport mechanism 4. The transport mechanism 4 is used to cause the stage 5 to be carried by the second side to the array detecting station 6, and a right cantilever pick-and-place mechanism 8==2 = 2nd direction displacement to the top of the stage 5 'The picker is removed and the 1c to be tested on the stage 5 is taken out and transferred to the detection industry. After the detection is completed, the right cantilever is reset by 13 to r. The left-hanging automatic inspection operation, ·only the detector is still in use, the ideal 1 2 峨 录 臂 取 取 取 于 于 于 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及When c is in operation, if the carrier 5 of the transport mechanism 4 carries the 剌IC to the test station 6, the stage 5 must be completed. After the action, the IC to be tested can be used by the stage. 5 is taken out, so that both the test stand 6 and the stage 5 need to wait for the right suspension 1274029. After the arm pick-and-place mechanism 7 reaches the position, the action can be taken, placed, and tested for 1 ,, thereby increasing the waiting time of the work, resulting in the entire test. The process has low production efficiency. Niu 2 · The inspection system is based on (4) pick-and-place mechanism 2 and money f pick-and-place mechanism 7 minutes feeding and the action of taking and discharging the inspection station 6, resulting in an increase in component cost. The left cantilever pick-and-place mechanism 2 and the right cantilever pick-and-place mechanism 7 are assembled between the feeding rack 1 and the detecting table 6, so that the assembly is complicated and the time is low and the productivity is lacking. The human dry 4 · in the feeding rack 1 The detection table 6 is equipped with a left cantilever pick-and-place mechanism ^ and a right (four) pick-and-place mechanism 7' to increase the volume of the machine and the side space is 0 [invention content] The purpose of the thread is to provide a type 1 detection machine (1),俾 so that the transfer does not have to wait ^ίϊ can be taken at the loading device, fine/complete 1 c, minus yuan =; province = two r machine (-) '俾 to effectively reduce the load; The first aspect of the present invention provides a 1 c detecting machine (1) comprising: a first lining to accommodate at least one tray for holding 1 c to be tested ^ is used to accommodate at least one tray that has been tested for 1 °; , ^ has an array tester and pick and place mechanism 'tester side to test IC' and pick and place mechanism can be used for second direction displacement 6 1274029 test / complete test Ic; at least one carrier device: set in front of the test device, 'to feed, put for test; 测 measure redundancy at each tester transfer device: used for the first 1. The ancestor completes the test IC. The device is placed between the device and the carrier device to be tested. The above I c detector (-), the first-loading device = the mechanism to read the structure, the side of the ratchet Structure, :, shifting the surface as the second direction bit "==shift = - two sets the machine structure: = contains - there is bearing, : then the transfer tray is used for the second direction displacement to the preset direction: Shift = Take, put, and test I c.冉 枓 If If If If If, machine (1) 'The moving device also contains the drive maneuver, the device for the first -, second direction displacement, and the pick and place for the third direction The IC to be tested/completed is taken between the device and the carrier device. Ij The I C detector (1) further includes a heating device, _ to heat the above-mentioned I C detector (-)', and further includes an empty disk arranging device for the tray. [Embodiment] In order to make the reviewer further understand the present invention, an embodiment will be described in conjunction with the drawings, and the details are as follows: 权佳, see Figure 2, is the implementation of the present invention. J c detection of the implementation of 7 1274029, including: the first - placement device 1 Q · its mounting mechanism i to accommodate at least - the tray, the tray mechanism 12 is used to: melon for the second direction of displacement And the tray is placed on a second loading device 2, the soil is transported, and the conveying mechanism 13 is transported 4: the first direction is displaced to a preset position for taking the material. The current f-maintaining mechanism 2 1 series is used to accommodate the displacement of the 2 2S dish in the full-loading mechanism 2, and the first transfer device 40 3 2 of the tray 'test device 3 〇 mechanism can be transferred to n3 3 for the first • Move 1/, 1C, · bit_ left side of device 3 Q, _ tester 3 1 丄, and drive stage 4 2 by drive mechanism 41 to move between groups of testers 31, The second transfer device 5 n . is used to transfer the IC to be tested/tested; the right woven device of the device 3 Q and the drive H is driven by the drive mechanism 51 for moving in each group test 3 a, the mobile carrier feed means 6 0 .f test / measurement End 1C; -, two shift ϊΐ curse / [eta] 1 billion feed means, second square 2 - to? 5〇 is used to transfer the device to be tested, and the driving mechanism 6 1 drives the pick-and-place heating device 7 〇6 2βΜ-22nd direction displacement, and is moved by the pick and place device for taking and placing; The chopper is placed on the side of the , to heat the 1274029 empty disk arranging device s. · Qiao? 1c ; 〇 · is set in the first - loading device moving mechanism 81 q of the other money, is to move 8 2: to = - to support the empty tray of the board, please refer to Figure 3 3 into the test 1c for detection, and 2 of the 0th testers 31 are accommodated at least - the mounting mechanism 11 containing the Ic to be tested 1 = displaced in the third direction and transferred to ^ = i, the tray mechanism 1 2 Carrying, the feeding tray is in the second direction, and the conveying mechanism 6 is driven to be used for the loading device 6 to capture: = ϊ Γ Γ Γ Γ Γ Γ Disk: Take 1=: the first displacement and take out ^2 from the tray as the first pendulum placed on the movable pick-and-placer 6 2 for 'one, one; set 2 and then drive the mechanism 6 1 with the test!' Send = 4 = = 2 will be = device. As shown in Fig. 5, the load-bearing worker is driven by the drive mechanism 41 to drive the stage 42 as the first direction as the device 30-test ns1, the tester 3] 3 2 can first drive the pick and place device 3 3 to the tester 3^, # The completed test IC is taken out, and the finished IC is placed on the stage 20 之0 for the stage 4 2, ^, at this time, the "device 60 because the test IC is not required to move into the test device 3 〇 test cry 3 1 , the drive mechanism 61 can drive the pick-and-place device 6 2 direct bit 'shift one At the tray of the material device 10, the next IC to be tested is taken out again; as shown in Fig. 6, the first carrier device 40 causes the driving mechanism 4 i to drive the stage 4 2 to be displaced in the first direction. , the I/O of the stage 4 2 is located under the pick-up unit 3 3 of the test set 30, and the pick-up unit 3 3 is to take out the IC to be tested in the stage 4 2 for transfer to the tester. 3 1*, at this time, the loading device 1274029 6^ drives the pick-and-place device 6 2 position 2 to the loading station 5 2 of the loading device 5 to drive the L3 to be placed in the 1C. 0 on the right side of the test - and: 2 transfer Measuring and discharging operation time; can be called the mobile device 6〇^ Please refer to Figure 7, the test is carried out; take, 3 3 displacement to the device 3; 2 square 0^= mechanism 3 2 The drive 1 is detected by the tester 31, and the test C is pressed into the preset position. At this time, the second load Z/Jf test IC is carried out to the pick-up mechanism 3 2 to pick up the device 3 3 The tester, ;, f is to be tested IC; I forge 1 G of the health, and take out the next pick and place 3 = map = transfer device 6 〇 drive mechanism 6 1 to drive i ^ rtt, - directional displacement, and the lower - to-be-tested 1 C is transferred to the stage 4 2 of the -^ device 40, and the measurement on the stage 4 2 is taken out, and the 3 (10) stage 5 2 will be 1 C is transferred to the pick-and-place. Referring to Figure 9, the first-carrier device 4 is driven to drive the platform. The next-to-be-tested IC is sequentially carried to the test device. At 31, the picking device 6 驱动 drives the pick-and-place device 6 2 to the second loading device 2 以 by the pick-and-place mechanism 61, so that the pick-and-place device 6 2 places the test I ς according to different detection levels. The tray is placed in a suitable tray. At this time, the second carrier device 50 is driven by the drive mechanism 51. The station 5 2 will carry out the test IC to achieve the automatic detection IC operation. Furthermore, when the tray on the first loading device 1 is used, the installed IC can be placed after the IC is taken. On the carrier plate 8 2 of the empty disk tray device 8', the carrier plate 8 2 can also be used for placing empty trays of different colors, and as a 1274029 supplemental second loading device 2 for holding the test IC The trays are used to facilitate and replenish the practical benefits of empty trays. 5 set [Simplified description of the diagram] Figure 1: Schematic diagram of the formula No. 91210786. Fig. 2 is a schematic view showing the structure of each device of the present invention. Fig. 3 is a schematic view showing the use of the Ic to be tested by the transfer device. Figure 4 ········································································· schematic diagram. Figure 6 of the test completion IC:: Figure carrier device for the pick-and-place mechanism of the test device μ to be tested" Figure 7: The pick-and-place mechanism of the test device will be measured τ map. I enter the tester Schematic diagram of the IC of the material transfer device on the planting station of the first carrier device. Release test/test to be carried out in Fig. 9: The system of the transfer device places the measurement IC on the second rough layout. Use of equipment receipts 8th [Main component symbol description] [Live] Feeding rack: 1 Pick and place: 3 Stage: 5 Right cantilever pick-and-place mechanism: Receiving rack: 9 [Invention] First stock Device: 1 disk mechanism: 12 first loading device: 2 tray mechanism: 2 2 7 0 0 left cantilever pick-and-place mechanism: 2 transfer mechanism: 4 test station: 6 pick-and-place: 8 holding mechanism: conveying mechanism: Holding mechanism: Conveying mechanism: 11 1274029 Test device: 3 0 Pick-and-place mechanism: 3 2 First transfer device: 4 0 Stage: 4 2 Second transfer device: 5 0 Stage: 5 2 Transfer device: 6 0 Pick and place: 6 2 Heating device: 7 0 Empty disk setting device: 8 0 Carrier plate: 8 2 Tester: 31 Pick and place: 3 3 Drive mechanism: 41 drive Moving mechanism: 51 Drive mechanism: 61 Moving mechanism: 81

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Claims (1)

1274029 1 Patent application scope: I C detector (1), including the first loading device, the second feeding device, the testing device The utility model is characterized in that it is used for accommodating at least one tray for holding the IC to be tested; it is for accommodating at least one tray for holding the IC to be tested; and is provided with an array tester and a pick-and-place mechanism, and each test I' is for testing the IC, and taking The release mechanism is used to take, test, and test the IC; the dual-at least one carrier device is used for each tester/test IC of the test device; the first and second load devices of the transfer device and Send the load to be tested/completed I c. According to the 1st detection machine (1), (2) and the conveyor mentioned in the first paragraph of the patent application scope (1): the inspection machine (1), the installation mechanism, the tray mechanism and the conveying mechanism Set to the tray of the 1 c measuring tray 'Tray mechanism system cage (4) - direction displacement, the feeding mechanism rib transfer tray to the first direction to the preset position. Seconds 1 卞 4 · According to the patent application scope The J(10) measuring machine (1) described above, the 哕 structure drives the pick and place device for the second direction displacement, and the 待 忒 及 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、斤说""Detector 卜卜ϊ::5ίίί The left and right array testers in front of the test device are provided with a group tester movement to carry the test/test ί C. Not to the left and right 6 · According to item 5 of the patent application scope (: detection machine (-), wherein the 2 3 13 1274029 7 first carrier device drives the stage as the first test device and the material transfer device by the drive mechanism Take and test the i C separately. Apply the 1C detector (-) described in item 5 of the patent scope, where the The moving mechanism drives the stage as the first shift = the test device and the transfer splitting respectively take and put the test/finish I c. Move and 仏8. According to the scope of the patent application scope i (1: detection machine ( a), in ι, the moving device drives the pick and place device as the first, second & = direction displacement '俾 to take and put the test/end between the first and second devices and the carrier device Test I c. 9. The c detector (1) thermal device according to item i of the patent application scope is used to heat the test to be tested; [C. 10. The c-detector (1) according to item 1 of the patent application scope, the empty disc arranging device is for accommodating at least one empty tray. 3 1 1 · According to the C test machine (1) mentioned in the first paragraph of the patent application scope, 1 忒 盘 置 置 系 系 系 系 系 系 忒 忒 忒 忒 忒 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 C C Displace in the second direction. two 14