1299406 九、發明說明： 【發明所屬之技術領域】 試埠時將多顆1c移送至測 =rr_ 多顆 子電=能技=與1299406 IX. Description of invention: [Technical field to which the invention belongs] Transfer multiple 1c to test at trial time =rr_multiple sub-electricity=energy==
Clrcuit，簡稱IC)所取代，由於IC在生產過程中乃經過 了確保產品品質’業者於ic製作完成後，: 進仃電路檢測作業’以檢測Ic於製作過中 而檢測出不良品。 ^也又相壞，進 "月 > 閱第1圖，其係為本申請人先前之台灣專利 9121，號『1C檢測機之運送裝置』專利案，該檢測機係於;幾： 2 0前側排列設置數個可自動升降之供料架2 i及收料架2 2， 機台2 0之後側則設有數組裝設有測試板之檢測台2 3，於供、 收料架21、22與檢測台23間設有包括左懸臂取放機構 2 4 )右懸臂取放機構2 5及轉運機構2 6 ;當1C執行測試作業 時，係以左懸臂取放機構2 4將單一待測1C移送至轉運機構 2 6，轉運機構2 6以隧道穿越的方式移動到後側後，接著由右 懸臂取放機構2 5將1C移送至檢測台2 3進行檢測作業，於完成 檢測後，右懸臂取放機構2 5再將單一之完測1C移送至轉運機構 2 6，由轉運機構2 6將1C移送回至前側，復由左懸臂取放機構 2 4將完測之1C取出並依據檢測結果，將ic移送並分類至各收 料架2 2，而完成1C的檢測作業。 請參閱第2圖，該各組檢測台2 3之上方係分別對應設置有 壓接機構2 7 ’該壓接機構2 7具有一可由驅動源驅動升降之下 壓桿2 7 1及下壓治具2 7 2，於1C個別置入於各檢測台2 3之 測試座2 31後，該下壓桿2 71將會下降使下壓治具2 7 2壓 1299406 之接點，以 構2 4先各=iC由左懸臂取放機 運機構2 6上之t ti再由右懸臂取放機構2 5將在轉 程中ί檢測台2 3進行檢測作業，使得運送過 问αΑ、的父換取放移置程序，而耗費過多的交捸銘醤η主 ;’於完測後之1c運送亦需經過兩道的交換長放移置葱 ^ 能提供單一的IC進行測試，即便設置六 :-i :f3，亦僅能同時對六個1c進行測試測試，因此所能進 相當有限，倘每個1c所需測試時間更長時，整‘ 之=更是有限’而伽應付目前高產i的^ 祕 b，本發日狀遂畔鲜從事相_觸研發與製作 二’ 目前所面臨之問題深入研究’經過長期努力之研究與 ΐ而種可有效縮減IC交換取放移置及測試的^ 此即為本發明之設計宗旨。 并 【發明内容】 本發明之主要目的係提供一種可同時多顆平行置入測 檢測機㈠，其細輸人端IG輸賴構將簡g上之待測K 二或多次的方式移置至載送治具，而使載送治具上同時滿载承 置夕顆之待測1C，該載送治具再以執道傳送機構將其直接移 測試埠内，並由測試埠内之下壓機構將載送治具上之多顆待測 同時下壓，以使各1C確保接觸到測試板之各測試座接點，而 進行多顆1C的測試作業’並於完成測試作業後，利用軌道傳^ 構將載送治具移出測試埠，再以輸出端IC輸送機構依據測試妗 果’將載送治具内各完測之1C進行分類取放於各收料匣内；^此" 利用將滿载承置多顆待測1C之载送治具直接移送至測試埠内9，不 僅可大幅縮減1C交換取放移置的時間，且將載送治具上之多顆Ic .!299406 能村极麟㈣__，糾碰測機有效 本發明之另一目的係提供一 、 的彈性顯而使IC下降，並5 C時，可利用彈性件 各測試座接點’以進行戦射，f腳接_測試板之 脫離壓抵ic後，彈性件的使下壓機構上升 則载送治具可再以軌道傳送機構^上升並脫離各測試座， ，；r 二第二於第-載送4= 以空ϋ的方式停留於出料區，1 —f f二载送治具則 送出測試埠至出料區時，第一載送f合具上則試作業並移 輸送機構進行分類取放於各收料肋，而輸出端1C 置之待測1C則移送至測試埠進行 ^ 承 【實施方式】 為使貴審查委員對本發明有進一步之深入瞭解，兹例舉一 1299406 較佳實施例，並配合圖式說明如后： 請參閱第3、4圖，本發明係於機台之前侧及周侧設有可升 降之供料匣30、可升降之空匣31、可升降之良品的收料g 3 2、3 3，以及不良品的收料匣34、35、36、37,於 供料匣3 0之側邊設有輸入端1C輸送機構4 0，於收料匣3 4、 3 5、3 6、3 7之侧邊則設有輸出端1C輸送機構4 1 ,輸入端 1C輸送機構4 0係設有具數支吸嘴之取放頭4 〇 1，並使取放頭 4 〇 1可作第一、二、三方向（X、Y、Z軸向）的位移，以吸取移 置供料匣3 0上之待測1C，輸出端1C輸送機構4 1則係相同設有 具數支吸嘴之取放頭41 1，並使取放頭41 1可作第一、二、 三方向（X、Y、Z軸向）的位移，以將完測IC吸取移置至各分級 之收料E3 2、3 3、3 4、3 5、3 6、3 7，另於測試埠 5 0之周侧架設有回字型之執道傳送機構6 〇，並於執道傳送機 構6 0上分別於入料區61、測試區6 2、出料區6 3承置相同 之第一载送治具71、第二載送治具7 2、第三載送治且7 3， 而可利，執道傳送機構6 0將第一載送治具7 i、第二g送治具 7 2、第三載送治具73分別移送經由入料區6 i、測試區 及出料區6 3等各作業站，以進行人料、測試及出料作業。 i、6圖’舉第—載送治具71而言，其上係排列 iff承置座7 1 1 (如3 2個），關時可分別承置多顆 各承置座711内開設有貫通孔712，並於貫通孔712 1 3 (如彈簧）架設支舰架 二从^1 4上方承置IC，並於IC受壓時可利用彈性件7 1 3 各測智:而使1C下降，並於下降後使1C接腳接觸到測試板之 利用^行峨㈣，於完成峨使IG脫離受壓時， 座接，，俾利進行張，可令IC上升脫離測試板之各測試 測試淳5 0之下方係褒設有連結 甲央控制為之測試板5 ]L，該測試板5 i上係設有多 Ϊ299406 承置座 巧試座5 1 1之數量係可對應載送治具之 下壓接觸5二=)，以供载送治具上多顆之制ic同時 第二’ i發r初始狀態時’第一載送治具71、 入料區6 1 :測試區6¾^7 3係分別以空刚態置於 之取放頭4 〇 ]，將合f 6 3 ;輸入端IC輸送機構4 0Clrcuit, referred to as IC), was replaced by IC. In the production process, the quality of the product was ensured. After the manufacturer completed the production of ic, the circuit was tested to detect the defective product by detecting Ic in production. ^ Also bad, enter "month> Read the first picture, which is the applicant's previous Taiwan patent 9121, the "1C detector transport device" patent case, the test machine is attached; several: 2 0 is arranged on the front side of the supply rack 2 i and the receiving rack 2 2 which can be automatically lifted and lowered, and the rear side of the machine 20 is provided with a plurality of test stands 2 3 with test boards, and the supply and receiving racks 21 22 and the detection station 23 are provided with a left cantilever pick-and-place mechanism 2 4 ) a right cantilever pick-and-place mechanism 25 and a transport mechanism 2 6; when 1C performs a test operation, the left cantilever pick-and-place mechanism 24 will be single to be tested 1C is transferred to the transfer mechanism 2 6, the transfer mechanism 26 is moved to the rear side by tunneling, and then the right cantilever pick-and-place mechanism 25 transfers the 1C to the test stand 2 3 for detection operation, after completion of the test, right The cantilever pick-and-place mechanism 2 5 then transfers the single measurement 1C to the transfer mechanism 2 6, and the transport mechanism 26 transfers the 1C back to the front side, and the left cantilever pick-and-place mechanism 24 takes the completed 1C and according to the detection. As a result, the ic is transferred and sorted to each of the receiving racks 2 2, and the 1C detecting operation is completed. Referring to FIG. 2, each of the sets of test stations 2 3 is respectively provided with a crimping mechanism 2 7 '. The crimping mechanism 27 has a driving source capable of driving the lower pressing rod 2 7 1 and the lower pressing After the test stand 2 31 of each test stand 23 is placed in 1C, the lower press bar 2 71 will be lowered to make the contact of the lower press fixture 2 7 2 pressure 1299406, to construct 2 4 First, each = iC is taken by the left cantilever, and the right cantilever pick-and-place mechanism 2 5 will perform the detection work in the transfer ί detecting station 2 3, so that the parent who transfers the question αΑ, Displacement of the program, and the cost of too much exchange 捸 醤 ; main; '1c delivery after the completion of the test also requires two exchanges of long-range transfer of onion ^ can provide a single IC for testing, even if set six:-i :f3, can only test six 6c at the same time, so the progress can be quite limited. If the test time required for each 1c is longer, the whole '= is more limited' and the gamma cope with the current high yield i Secret b, this issue of the Japanese-style 遂 鲜 鲜 鲜 鲜 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Species can effectively reduce the switching IC designed to take place and the displacement test ^ Namely the present invention. [Invention] The main object of the present invention is to provide a plurality of parallel detection detectors (1) at the same time, and the fine input end IG input structure is to displace the K to be tested on the simple g two or more times. To carry the jig, and the carrying jig is simultaneously loaded with the 1C to be tested, and the carrying jig is then directly moved into the test cymbal by the obligatory transport mechanism, and is tested by The pressing mechanism will press down a plurality of test fixtures to be pressed at the same time, so that each 1C ensures contact with each test socket contact of the test board, and performs multiple 1C test operations', and after completing the test operation, Using the orbital transmission mechanism, the carrier fixture is removed from the test magazine, and then the output IC transport mechanism sorts and selects the 1C in each of the loaded fixtures in each receiving magazine according to the test result; " Using the load-carrying fixtures that carry a large number of 1C to be tested directly to the test chamber 9, not only can the time of 1C exchange pick-and-place shift be greatly reduced, but also the multiple Ic on the fixture will be carried .299406 能村极麟(四)__, the impact tester is effective. Another object of the present invention is to provide an elastic display to make the IC When descending, and 5 C, the test piece joints of the elastic members can be used to perform the squirting, and the f-spin _ test plate is released from the ic, and the elastic member can raise the pressing mechanism to carry the jig. Raise and disengage from each test stand by the orbital transport mechanism ^; r 2nd in the first-carrier 4 = stay in the discharge area in an open manner, 1 - ff 2 to send the jig and send the test to the exit In the material area, the first carrier f is tested and transferred to the conveying mechanism for sorting and feeding to each receiving rib, and the output 1C is set to be tested and transferred to the test 埠 for carrying out [Embodiment] In order to make the reviewer further understand the present invention, a preferred embodiment of 1299406 is illustrated, and the following description is in conjunction with the drawings: Please refer to Figures 3 and 4, the present invention is attached to the front side and the peripheral side of the machine. It has a feeding device 30 that can be lifted and lowered, a space that can be lifted and lowered 31, a receiving material that can be raised and lowered, g 3 2, 3 3, and a receiving material for defective products 匣34, 35, 36, 37, in the feeding 匣The side of the 30 is provided with the input end 1C conveying mechanism 40, and the side of the receiving 匣3 4, 3 5, 3 6 and 3 7 is provided with the output end 1C conveyor. 4 1 , the input end 1C conveying mechanism 40 is provided with a pick-and-place head 4 〇 1 with several nozzles, and the pick-and-place head 4 〇 1 can be used for the first, second and third directions (X, Y, Z axes) The displacement is to absorb the 1C to be tested on the displacement supply 匣3, and the delivery mechanism 41 at the output end 1C is similarly provided with the pick-and-place head 411 having a plurality of nozzles, and the pick-and-place head 41 1 can be used as the displacement in the first, second and third directions (X, Y, Z axis) to shift the measurement IC suction to the graded receipts E3 2, 3 3, 3 4, 3 5, 3 6 3, and the test side of the test 埠50 is provided with a return type transfer mechanism 6 〇, and on the transfer transfer mechanism 60 in the feed area 61, the test area 6.2, and the discharge area 6 3, the same first carrier jig 71, the second carrier jig 7 2, the third carrier delivery and 7 3 are placed, and the escrow transport mechanism 60 will first carry the jig 7 i, the second g feeding fixture 7 2, the third carrier feeding jig 73 are respectively transferred through the feeding area 6 i, the test area and the discharge area 63 and other work stations for human materials, testing and discharging operations . i, 6 diagram 'lifting the first-to-carrying fixture 71, the upper iffing socket 7 1 1 (such as 32) is arranged, and each of the plurality of sockets 711 can be separately installed when closed. The through hole 712 and the through hole 712 1 3 (such as a spring) are mounted on the support frame 2 to receive the IC from above the ^1 4 , and when the IC is pressed, the elastic member 7 1 3 can be used to measure the wisdom: After the descent, the 1C pin is brought into contact with the test board (4), and when the IG is released from the pressure, the socket is connected, and the sheet is lifted, so that the IC can be lifted off the test board. The lower part of the 淳50 is equipped with a test board 5]L connected to the central control, and the test board 5i is provided with a plurality of 299406. The number of the test stand 5 1 1 can correspond to the carrying fixture. Under pressure contact 5 2 =), for carrying a plurality of ic on the jig while the second 'i hair r initial state' first carrying jig 71, feeding area 6 1 : test area 63⁄4 ^ 7 3 series are placed in the empty state, and the head is placed 4 〇], which will be combined with f 6 3 ; the input terminal IC transport mechanism 4 0
8 〇;以ΐί供〇内-次吸取多㈣寺測IC 載送治具7丄之承置庙之承置座7 1 1内，直到第一 業。M之承置庄7 1 1内滿载待測IC8 0而完成供料作 同時使第二載 〇第 於入料區6 1，因此在第-載送、f且—f运治具7 2已位 業的同時，輸人端IG輸 $ g如測試作 0内將多顆之待測IC9 明參閱第1〇圖，當第-載送治具7工 ^竹二某 式作業後，接著軌道傳送機構6 〇將會再 二成 完測IC8 0之第-載送治具7 i移送至出 吏，载有 ;;7 1 :之各完測IC8 〇進行分類取放於各收料【、载廷 行完測IC8 0的出料作業同時，滿載有待 第一載送、具7 2將會移送進入測試埠5 〇内進彳 〇 ，時使第三载送治具7 3移送至人龍6 業， 7 3已位於人料區6丨，因此在第二载送治具？ 2 治具 仃測試作業的同時，輸入端1C輸送機構4 〇之取放頭4 = 0進 u丄’將 .1299406 0内將多顆之待測1C1 ◦ 0移置到第三载送治 完成供料g 直到第三载送治具7 3滿餅測ic 1 〇 〇而 測試作^後，具7 2内之多顆1C9 0完成 f "C9 〇之第二 二使= *Ϊ7?；Τ^νίΡΤ4 ° 1 ' 送ί且? t隹2、3 6、3 7内’以進行出料作業；在第二載 作業，進入測試埠5 0内進行測試 而完成供料作業 到第一载送治具71滿載待測1Cl 1 ο 具、ίί=ϋϊ=發明之第—載送治具71 (第二載送治 -載逆^同）移送至測試埠内進行測試作業前，該第 各&= m傳送機構6 〇的支撐而位於測試板51之 試板i各職座接腳係尚未接觸到測 0時’可利用彈性件713的彈性壓縮而 降後使其接腳接觸到測試板51之各 5 二以進行測試作業，於完成測試並使下壓機構 完元測iC8 〇後，彈性件7 1 3的彈性伸張將使 -i送仏且7 ΓΐΪ離ί測試座5 1 1 (如第1 2圖所示），則第 試^了 道傳送機構6 ◦移出測試蟫，以完成測 此外’雜閱第1 4、1 5圖，本剌之第—載送治具7丄 •1299406 件7 1 f送〜具、第二載送治具亦同）亦可於治具之框圍設彈性 的可於π而無需於貫通孔之周側以彈性件架設支推框架，相同 性侔4 1 巧5 2下壓壓抵待測亿8 0時，使治具整個利用彈 使的彈性壓縮而使第一載送治具7 1下降，並於下降後 成測卿顺板之各麟座無，崎行賴作業，於完 -截、Hi脫離找時’糊彈性件7 1 3的彈性伸張，可令第 進ίίΐΐί M iC上升脫雜觸測試板之各測試座接點，俾利 送至發=㈣滿置乡顆制IG之觀紗直接移 、、，二jf細’不僅可大幅縮減1C交換取放移置的時間，且將載 多顆1c同時進行測試，亦可有效縮減1c測試的時間， 的循環賴’可充分糊時序配，以減少測 ^，、實/ 夺的待機時間’進而使檢測機有效提升測試的 為一冰具實用性及進步性之設計，然未見有相同之產品 二Γ符發明專利㈣要件，爰依法提出申請。 第1圖·係為習式ic檢測機之配置示意圖。 ΚΠΐΐ式1❻測機之檢測台與壓接機構之配置示意圖。 第3圖·本發明之俯視架構圖。 第4圖··本發明之配置示意圖。 第5圖·本發明載送治具之外觀示意圖。 第6圖：本發明載送治具之剖面示意圖。 第7圖··本發明測試板之外觀示意圖。 第8圖··本發明之動作示意圖（一）。 第9圖··本發明之動作示意圖（二）。 第10圖：本發明之動作示意圖（三）。 第11圖·本發明之動作示意圖（四）。 ίί 2:ί發明载送治具於測試埠内之動作示意圖（-)。 第1 3圖.本㈣載送治具於測試埠内之動作示意圖（二）。 12994068 〇; ΐ 〇 〇 〇 - - - - ( ( ( 四 四 四 四 四 四 四 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺M is placed in the 7 1 1 full load IC8 0 to be tested and the supply is completed while the second load is placed in the feed zone 6 1, so in the first carrier, f and -f transport fixture 7 2 At the same time, the input end of the IG loses $g. If the test is done in 0, the number of ICs to be tested will be as shown in the first figure. When the first-loading fixture is completed, the work will be followed by the work of the second work. The track transport mechanism 6 〇 will be transferred to the exit 吏 7i of the complete test IC 8 0, and will be loaded; 7 1 : each completed IC8 分类 is sorted and placed in each receipt [ At the same time, the loading operation of the IC8 0 is completed, and the full load is waiting for the first delivery, and the 7 2 will be transferred to the test 埠5 彳〇, and the third carrier will be transferred to the person. Long 6 industry, 7 3 has been located in the human area 6 丨, so in the second carrying fixture? 2 At the same time as the test tool 仃 test operation, the input end 1C transport mechanism 4 取 pick and place head 4 = 0 enter u 丄 ' will be 1 .1299406 0 will be more than 1C1 ◦ 0 to be moved to the third load delivery Feed g until the third carrier jig 7 3 full cake test ic 1 〇〇 and test ^, with a number of 1C9 0 in 7 2 complete f " C9 〇 second second make = * Ϊ 7?; Τ^νίΡΤ4 ° 1 'Send ί and ? t 隹 2, 3 6 , 3 7 'to perform the discharge operation; in the second load operation, enter the test 埠 50 to test and complete the feeding operation to the first load The jig 71 is fully loaded to be tested 1Cl 1 ο 具, ίί = ϋϊ = the first of the invention - the carrying jig 71 (the second load is sent to the same - the same) is transferred to the test 进行 for the test operation, the first &= m The support of the transport mechanism 6 而 is located on the test board 51 of the test board 51. The various foot pins of the test board 51 have not been touched to the test 0. The elastic compression of the elastic member 713 can be utilized to reduce the contact of the foot to the test. Each of the plates 51 is used for testing. After the test is completed and the pressing mechanism is finished measuring iC8, the elastic stretch of the elastic member 7 1 3 will cause -i to be sent and 7 ΓΐΪ from the ί test stand 5 1 1 ( In the first picture, the first test transfer mechanism 6 ◦ removes the test 蟫 to complete the test. In addition, the first reading of the first and fourth pictures, the first part of the — 载 载 载 载 载 载 1 1 1 1 1 1 1 1 1 1 1 The piece 7 1 f is sent to the tool and the second carrier is also provided. The elastic frame can be placed around the frame of the jig without arranging the frame with the elastic member on the circumferential side of the through hole. 4 1 巧5 2 Pressed down against the test of 80 volts, so that the fixture is fully elasticized by the elastic force, so that the first carrier fixture 7 1 drops, and after the decline, it becomes the lining of the board. There is no seat, and there is no work in the area. When the end-cutting and Hi-disengagement are found, the elastic stretch of the adhesive elastic part 7 1 3 can make the first ίίΐΐί M iC rise off the test stand of the test board. Send to the hair = (four) full set of home IG's gaze directly moved,, two jf fine 'not only can significantly reduce the time of 1C exchange pick and place, and will carry multiple 1c test at the same time, can also effectively reduce 1c test time, the cycle of 'can be fully paste timing, to reduce the test, the real / take the standby time' and then make the test machine effectively improve the test Progressive and practicality of design, then there is no product of the same two elements of Γ symbols Patent iv invention, Yuan apply law. Figure 1 is a schematic diagram of the configuration of the conventional ic detector. Schematic diagram of the configuration of the test station and the crimping mechanism of the ❻1 type measuring machine. Fig. 3 is a top plan view of the present invention. Fig. 4 is a schematic view showing the configuration of the present invention. Fig. 5 is a schematic view showing the appearance of the jig of the present invention. Figure 6 is a schematic cross-sectional view of the present invention carrying a jig. Fig. 7 is a schematic view showing the appearance of the test board of the present invention. Fig. 8 is a schematic view showing the operation of the present invention (1). Fig. 9 is a schematic view showing the operation of the present invention (2). Figure 10: Schematic diagram of the action of the present invention (3). Figure 11 is a schematic view of the operation of the present invention (4). Ίί 2: ί Invented the diagram (-) of the action of the fixture in the test 。. Figure 1 3. This (4) Schematic diagram of the action of carrying the jig in the test ( (2). 1299406
第14圖：本發明載送治具之另一實施例動作示意圖（一） 第15圖：本發明載送治具之另一實施例動作示意圖（二） 【主要元件符號說明】 習式部份： 2 0 :機台 21 :供料架 2 2 :收料架 2 3 :檢測台 2 31 :測試座 2 4 :左懸臂取放機構 ~ 2 5 :右懸臂取放機構 2 6 :轉運機構 2 7 :壓接機構 2 71 :下壓桿 本發明部份： 3 0 :供料匣 3 3 :收料匣 3 6 :收料匣 4 0 :輸入端1C輸送機構 4 1 :輸出端1C輸送機構 5 0 :測試埠 5 1 :測試板 5 11 5 2 :下壓機構 6 0 :軌道傳送機構 61 :入料區 6 2 :測試區 71:第一載送治具 711:承置座 712:貫通孔 714:支撐框架 7 2 :第二載送治具 7 3 :第三載送治具 8 0 : 1C 9 0 : 1C 1 1 0 : 1C 2 7 2 :下壓治具 3 1 :空匣 3 4 :收料匣 3 7 :收料匣 3 2 :收料匣 3 5 :收料匣 40 1 4 11 取放頭 取放頭 測試座 6 3 :出料區 713:彈性件Figure 14 is a schematic view showing the operation of another embodiment of the present invention. (Fig. 15 is a schematic view showing the operation of another embodiment of the present invention. (II) [Explanation of main component symbols] : 2 0 : Machine table 21 : Feeding rack 2 2 : Receiving rack 2 3 : Test stand 2 31 : Test stand 2 4 : Left cantilever pick-and-place mechanism ~ 2 5 : Right cantilever pick-and-place mechanism 2 6 : Transfer mechanism 2 7: crimping mechanism 2 71 : lower pressing rod part of the invention: 3 0 : supply 匣 3 3 : receiving 匣 3 6 : receiving 匣 4 0 : input end 1C conveying mechanism 4 1 : output end 1C conveying mechanism 5 0 : Test 埠 5 1 : Test plate 5 11 5 2 : Lower pressing mechanism 6 0 : Track conveying mechanism 61 : Feeding zone 6 2 : Test zone 71: First carrying jig 711: Bearing 712: Through Hole 714: support frame 7 2 : second carrier jig 7 3 : third carrier jig 8 0 : 1C 9 0 : 1C 1 1 0 : 1C 2 7 2 : lower press fixture 3 1 : empty 3 4 : Receiving machine 3 7 : Receiving machine 3 2 : Receiving 匣 3 5 : Receiving 匣 40 1 4 11 Pick-up head and head test stand 6 3 : Discharge area 713: elastic parts
10 0： 1C 1210 0: 1C 12