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TW374847B - Testing device for IC devices - Google Patents

Testing device for IC devices

Info

Publication number
TW374847B
TW374847B TW086117011A TW86117011A TW374847B TW 374847 B TW374847 B TW 374847B TW 086117011 A TW086117011 A TW 086117011A TW 86117011 A TW86117011 A TW 86117011A TW 374847 B TW374847 B TW 374847B
Authority
TW
Taiwan
Prior art keywords
data
tester
disposed
pattern
logic
Prior art date
Application number
TW086117011A
Other languages
English (en)
Inventor
Toshiyuki Okayasu
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of TW374847B publication Critical patent/TW374847B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW086117011A 1996-11-15 1997-11-14 Testing device for IC devices TW374847B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8304933A JPH10142298A (ja) 1996-11-15 1996-11-15 集積回路デバイス試験装置

Publications (1)

Publication Number Publication Date
TW374847B true TW374847B (en) 1999-11-21

Family

ID=17939070

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086117011A TW374847B (en) 1996-11-15 1997-11-14 Testing device for IC devices

Country Status (7)

Country Link
US (1) US6157200A (zh)
JP (1) JPH10142298A (zh)
KR (1) KR100295548B1 (zh)
DE (1) DE19781528T1 (zh)
GB (1) GB2322203A (zh)
TW (1) TW374847B (zh)
WO (1) WO1998022829A1 (zh)

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Also Published As

Publication number Publication date
DE19781528T1 (de) 1999-03-11
GB2322203A (en) 1998-08-19
US6157200A (en) 2000-12-05
JPH10142298A (ja) 1998-05-29
KR19990076906A (ko) 1999-10-25
KR100295548B1 (ko) 2001-08-07
WO1998022829A1 (en) 1998-05-28
GB9810225D0 (en) 1998-07-08

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees