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TW200801861A - Exposure method and exposure apparatus - Google Patents

Exposure method and exposure apparatus

Info

Publication number
TW200801861A
TW200801861A TW95120320A TW95120320A TW200801861A TW 200801861 A TW200801861 A TW 200801861A TW 95120320 A TW95120320 A TW 95120320A TW 95120320 A TW95120320 A TW 95120320A TW 200801861 A TW200801861 A TW 200801861A
Authority
TW
Taiwan
Prior art keywords
exposure
substrate
mask
capturing
pixels
Prior art date
Application number
TW95120320A
Other languages
Chinese (zh)
Other versions
TWI481971B (en
Inventor
Jin Iino
Original Assignee
Integrated Solutions Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Integrated Solutions Co Ltd filed Critical Integrated Solutions Co Ltd
Publication of TW200801861A publication Critical patent/TW200801861A/en
Application granted granted Critical
Publication of TWI481971B publication Critical patent/TWI481971B/en

Links

Landscapes

  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Liquid Crystal (AREA)
  • Optical Filters (AREA)

Abstract

An exposure apparatus of the present invention irradiates exposure light from a lamp (continuous light source) 9 to substrate 4, which is transported at a constant speed in a one direction by a substrate transport portion 5, through a mask 11 provided on an optical axis (light path) of an exposure system 3 at an exposure station (exposure portion) 2. When images of opening portions 11a of the mask 11 are transferred and exposed to the substrate 4, a reference position on the substrate 4 in the transporting direction and in a direction perpendicular thereto is detected by capturing forward and side edges (pattern edges) of pixels (reference patterns) 18, which are preformed on the substrate 4, by means of a linear CCD 20 in a capturing portion 6. When the pixels 18 captured by the capturing portion 6 are transported from a capturing position F to an exposure position E, the exposure station 2 continuously exposes an exposure area along the transporting direction of the substrate 4 with adjusting the position of the mask 11 such that the position of the mask 11 is identical with the reference position on the substrate 4.
TW095120320A 2005-04-08 2006-06-08 Exposure method and exposure apparatus TWI481971B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005111928A JP4304165B2 (en) 2005-04-08 2005-04-08 Exposure method and exposure apparatus

Publications (2)

Publication Number Publication Date
TW200801861A true TW200801861A (en) 2008-01-01
TWI481971B TWI481971B (en) 2015-04-21

Family

ID=37413583

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095120320A TWI481971B (en) 2005-04-08 2006-06-08 Exposure method and exposure apparatus

Country Status (2)

Country Link
JP (1) JP4304165B2 (en)
TW (1) TWI481971B (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4738887B2 (en) * 2005-05-19 2011-08-03 株式会社ブイ・テクノロジー Exposure equipment
JP2008281919A (en) * 2007-05-14 2008-11-20 Dainippon Printing Co Ltd Method for producing color filter forming substrate and color filter forming substrate
JP5685756B2 (en) 2010-11-10 2015-03-18 株式会社ブイ・テクノロジー Film exposure method
JP5630864B2 (en) * 2010-12-06 2014-11-26 凸版印刷株式会社 Exposure equipment
JP2012159713A (en) * 2011-02-01 2012-08-23 Arisawa Mfg Co Ltd Manufacturing method of film-like product, manufacturing apparatus of film-like product, and mask
WO2013035696A1 (en) * 2011-09-05 2013-03-14 株式会社ニコン Substrate transfer apparatus and substrate processing apparatus
CN104145299B (en) * 2012-03-12 2017-09-22 住友化学株式会社 Optics shows that the calibrating installation and optics of part show the calibration method of part
CN105684126A (en) * 2013-10-22 2016-06-15 应用材料公司 Roll-to-roll maskless lithography with active alignment
WO2016114178A1 (en) * 2015-01-15 2016-07-21 株式会社村田製作所 Exposure device
JP7052573B2 (en) * 2018-06-06 2022-04-12 東京エレクトロン株式会社 Coating film forming device and adjustment method of coating film forming device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7375795B2 (en) * 2004-12-22 2008-05-20 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method, and device manufactured thereby

Also Published As

Publication number Publication date
TWI481971B (en) 2015-04-21
JP4304165B2 (en) 2009-07-29
JP2006292919A (en) 2006-10-26

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