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JP2001056354A - 伝導性導線上の微細短絡による接触不良感知方法 - Google Patents

伝導性導線上の微細短絡による接触不良感知方法

Info

Publication number
JP2001056354A
JP2001056354A JP2000215616A JP2000215616A JP2001056354A JP 2001056354 A JP2001056354 A JP 2001056354A JP 2000215616 A JP2000215616 A JP 2000215616A JP 2000215616 A JP2000215616 A JP 2000215616A JP 2001056354 A JP2001056354 A JP 2001056354A
Authority
JP
Japan
Prior art keywords
error
voltage difference
contact failure
measured
conductive wire
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000215616A
Other languages
English (en)
Japanese (ja)
Inventor
Sokan Kin
相煥 金
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
YURIN GIKEN KK
Original Assignee
YURIN GIKEN KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by YURIN GIKEN KK filed Critical YURIN GIKEN KK
Publication of JP2001056354A publication Critical patent/JP2001056354A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58Testing of lines, cables or conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2000215616A 1999-07-21 2000-07-17 伝導性導線上の微細短絡による接触不良感知方法 Pending JP2001056354A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1999P29474 1999-07-21
KR1019990029474A KR100304045B1 (ko) 1999-07-21 1999-07-21 전도성 도선상의 미세 단락에 의한 접촉불량 감지 방법

Publications (1)

Publication Number Publication Date
JP2001056354A true JP2001056354A (ja) 2001-02-27

Family

ID=19603205

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000215616A Pending JP2001056354A (ja) 1999-07-21 2000-07-17 伝導性導線上の微細短絡による接触不良感知方法

Country Status (6)

Country Link
JP (1) JP2001056354A (de)
KR (1) KR100304045B1 (de)
CN (1) CN1281990A (de)
DE (1) DE10033687A1 (de)
FR (1) FR2796724A1 (de)
IT (1) IT1318200B1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009001351A1 (de) * 2009-03-05 2010-09-09 Robert Bosch Gmbh Verfahren und Vorrichtung zur Erkennung einer Unterbrechung in einer elektrischen Zuleitung
CN102005400B (zh) * 2009-08-28 2012-05-16 中芯国际集成电路制造(上海)有限公司 失效检测方法以及失效检测装置
CN102570378B (zh) * 2011-11-24 2014-08-06 上海显恒光电科技股份有限公司 一种短路保护电路及保护方法
DE102013207775B4 (de) * 2013-04-29 2022-01-05 Lisa Dräxlmaier GmbH Vorrichtung zum Erkennen einer Störung einer elektrischen Leitung
CN106949933B (zh) * 2017-04-07 2020-09-22 吉利汽车研究院(宁波)有限公司 一种线束插接件的检测方法
JP2020012727A (ja) * 2018-07-18 2020-01-23 日本電信電話株式会社 回線確認装置および回線確認方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB146022A (en) * 1919-10-21 1920-07-08 Arthur Shields A glass-plate support for the display of boots, shoes or the like
KR920002830Y1 (ko) * 1989-05-31 1992-05-01 삼성전자 주식회사 감지기의 연결회선의 단선 검출회로
KR100226467B1 (ko) * 1991-12-10 1999-10-15 김영환 신호선의 접촉불량 검출회로
JP2998879B2 (ja) * 1993-12-27 2000-01-17 矢崎総業株式会社 車載ワイヤハーネスのショート検出装置
JPH0843470A (ja) * 1994-07-29 1996-02-16 Showa Electric Wire & Cable Co Ltd 線条体の断線検出装置
US5638004A (en) * 1995-05-16 1997-06-10 The United States Of America As Represented By The Secretary Of The Navy Multiconductor continuity and intermittent fault analyzer with dynamic stimulation
JPH09218233A (ja) * 1996-02-08 1997-08-19 Harness Sogo Gijutsu Kenkyusho:Kk 車両における負荷の断線検出装置
KR19980045269A (ko) * 1996-12-10 1998-09-15 김영귀 자동차용 타코메터의 회로 단선 및 쇼트 감지장치

Also Published As

Publication number Publication date
KR100304045B1 (ko) 2001-11-01
ITMI20001641A1 (it) 2002-01-19
CN1281990A (zh) 2001-01-31
DE10033687A1 (de) 2001-03-08
ITMI20001641A0 (it) 2000-07-19
KR19990073534A (ko) 1999-10-05
IT1318200B1 (it) 2003-07-28
FR2796724A1 (fr) 2001-01-26

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Effective date: 20021126