Classifications

• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
  • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
  • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
  • G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
  • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
  • G11C17/18—Auxiliary circuits, e.g. for writing into memory
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
  • G11C29/027—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in fuses
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C8/00—Arrangements for selecting an address in a digital store
  • G11C8/20—Address safety or protection circuits, i.e. arrangements for preventing unauthorized or accidental access
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
  • G11C2216/12—Reading and writing aspects of erasable programmable read-only memories
  • G11C2216/26—Floating gate memory which is adapted to be one-time programmable [OTP], e.g. containing multiple OTP blocks permitting limited update ability

Landscapes

• Engineering & Computer Science (AREA)
• Computer Hardware Design (AREA)
• Computer Security & Cryptography (AREA)
• Microelectronics & Electronic Packaging (AREA)
• Design And Manufacture Of Integrated Circuits (AREA)
• Read Only Memory (AREA)
• Semiconductor Integrated Circuits (AREA)
• Logic Circuits (AREA)

Applications Claiming Priority (1)

Publications (1)

Family

ID=32469634

Family Applications (1)

Country Status (4)

Families Citing this family (51)

Family Cites Families (13)

• 2003
  • 2003-12-19 US US10/739,520 patent/US6876594B2/en not_active Expired - Lifetime
  • 2003-12-24 EP EP03104975A patent/EP1434238B1/de not_active Expired - Lifetime
  • 2003-12-24 DE DE60336204T patent/DE60336204D1/de not_active Expired - Lifetime
  • 2003-12-25 JP JP2003428708A patent/JP2004215261A/ja active Pending

Also Published As

Similar Documents