DE60301834D1 - Vorläuferverbindung enthaltend eine an HfCl4 gebundene Stickstoffverbindung für die Ausbildung einer Hafniumoxidschicht und Verfahren zur Bildung der Hafniumoxidschicht unter Verwendung der Vorläuferverbindung - Google Patents
Vorläuferverbindung enthaltend eine an HfCl4 gebundene Stickstoffverbindung für die Ausbildung einer Hafniumoxidschicht und Verfahren zur Bildung der Hafniumoxidschicht unter Verwendung der VorläuferverbindungInfo
- Publication number
- DE60301834D1 DE60301834D1 DE60301834T DE60301834T DE60301834D1 DE 60301834 D1 DE60301834 D1 DE 60301834D1 DE 60301834 T DE60301834 T DE 60301834T DE 60301834 T DE60301834 T DE 60301834T DE 60301834 D1 DE60301834 D1 DE 60301834D1
- Authority
- DE
- Germany
- Prior art keywords
- oxide layer
- hafnium oxide
- precursor compound
- hfcl4
- methods
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G27/00—Compounds of hafnium
- C01G27/02—Oxides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
-
- H10P14/69392—
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G27/00—Compounds of hafnium
- C01G27/04—Halides
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/003—Compounds containing elements of Groups 4 or 14 of the Periodic Table without C-Metal linkages
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/80—Compositional purity
-
- H10D64/01342—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/66—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
- H10D64/68—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator
- H10D64/691—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator comprising metallic compounds, e.g. metal oxides or metal silicates
-
- H10P14/6339—
-
- H10P14/668—
-
- H10P14/69395—
-
- H10P14/69396—
-
- H10P14/69397—
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Formation Of Insulating Films (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
- Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2002-0047518A KR100513719B1 (ko) | 2002-08-12 | 2002-08-12 | 하프늄 산화막 형성용 전구체 및 상기 전구체를 이용한하프늄 산화막의 형성방법 |
| KR2002047518 | 2002-08-12 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE60301834D1 true DE60301834D1 (de) | 2006-02-23 |
| DE60301834T2 DE60301834T2 (de) | 2006-06-29 |
Family
ID=36573230
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60301834T Expired - Lifetime DE60301834T2 (de) | 2002-08-12 | 2003-08-01 | Vorläuferverbindung enthaltend eine an HfCl4 gebundene Stickstoffverbindung für die Ausbildung einer Hafniumoxidschicht und Verfahren zur Bildung der Hafniumoxidschicht unter Verwendung der Vorläuferverbindung |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US7030450B2 (de) |
| EP (1) | EP1394164B1 (de) |
| JP (1) | JP3740142B2 (de) |
| KR (1) | KR100513719B1 (de) |
| CN (1) | CN100356519C (de) |
| DE (1) | DE60301834T2 (de) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020165332A1 (en) * | 1999-06-03 | 2002-11-07 | Pope Edward J. A. | Preceramic polymers to hafnium carbide and hafnium nitride ceramic fibers and matrices |
| EP1327010B1 (de) | 2000-09-28 | 2013-12-04 | President and Fellows of Harvard College | Dampfphasenabscheidung von silikaten |
| KR100513719B1 (ko) * | 2002-08-12 | 2005-09-07 | 삼성전자주식회사 | 하프늄 산화막 형성용 전구체 및 상기 전구체를 이용한하프늄 산화막의 형성방법 |
| KR100463633B1 (ko) * | 2002-11-12 | 2004-12-29 | 주식회사 아이피에스 | 하프늄 화합물을 이용한 박막증착방법 |
| JP4907839B2 (ja) | 2003-03-26 | 2012-04-04 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| JP2005340405A (ja) * | 2004-05-26 | 2005-12-08 | Asahi Denka Kogyo Kk | 化学気相成長用原料及び薄膜の製造方法 |
| JP2006041306A (ja) * | 2004-07-29 | 2006-02-09 | Sharp Corp | 半導体装置の製造方法 |
| KR100611072B1 (ko) * | 2004-08-11 | 2006-08-10 | 삼성전자주식회사 | 원자층 적층 방법과 이를 이용한 게이트 구조물의 제조방법 및 커패시터의 제조 방법 |
| KR100657792B1 (ko) * | 2005-01-24 | 2006-12-14 | 삼성전자주식회사 | 원자층 적층 방법과 이를 이용한 커패시터의 제조 방법 및게이트 구조물의 제조 방법 |
| KR100584783B1 (ko) * | 2005-02-24 | 2006-05-30 | 삼성전자주식회사 | 복합막 형성 방법과 이를 이용한 게이트 구조물 및 커패시터 제조 방법 |
| JP2006279019A (ja) * | 2005-03-03 | 2006-10-12 | Sony Corp | 薄膜の形成方法および半導体装置の製造方法 |
| KR100578824B1 (ko) * | 2005-03-11 | 2006-05-11 | 삼성전자주식회사 | 박막 제조 방법 및 이를 이용한 게이트 구조물, 커패시터의제조 방법 |
| JP2006278550A (ja) * | 2005-03-28 | 2006-10-12 | Fujitsu Ltd | 半導体装置の製造方法 |
| JP5067772B2 (ja) * | 2005-08-19 | 2012-11-07 | 株式会社トリケミカル研究所 | ハフニウム化合物の精製方法、ハフニウム化合物の製造方法、ハフニウム系物の形成方法、及びハフニウム系膜の成膜方法 |
| JP4975414B2 (ja) | 2005-11-16 | 2012-07-11 | エーエスエム インターナショナル エヌ.ヴェー. | Cvd又はaldによる膜の堆積のための方法 |
| DE602005013101D1 (de) * | 2005-11-30 | 2009-04-16 | Sverre Stenbom | Verfahren und Vorrichtung zum Verpacken von Lebensmitteln |
| KR20090038461A (ko) * | 2006-07-21 | 2009-04-20 | 린드 인코포레이티드 | 원자 층 침착용 전구체 용액의 기화 및 이송을 위한 방법 및 장치 |
| US7749574B2 (en) * | 2006-11-14 | 2010-07-06 | Applied Materials, Inc. | Low temperature ALD SiO2 |
| JP4552973B2 (ja) | 2007-06-08 | 2010-09-29 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
| CN100543941C (zh) * | 2008-05-29 | 2009-09-23 | 南京大学 | 一种制备超薄HfO2或ZrO3栅介质薄膜的软化学法 |
| JP5518499B2 (ja) * | 2009-02-17 | 2014-06-11 | 株式会社日立国際電気 | 半導体デバイスの製造方法および基板処理装置 |
| US8946036B2 (en) * | 2012-12-07 | 2015-02-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of forming dielectric films using a plurality of oxidation gases |
| US20190057860A1 (en) * | 2017-08-18 | 2019-02-21 | Lam Research Corporation | Methods for improving performance in hafnium oxide-based ferroelectric material using plasma and/or thermal treatment |
| TW202436236A (zh) * | 2023-02-03 | 2024-09-16 | 日商三井金屬鑛業股份有限公司 | 鉿酸化合物含有物及其製造方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2524862B2 (ja) * | 1990-05-01 | 1996-08-14 | 三菱電機株式会社 | 半導体記憶装置およびその製造方法 |
| US5556997A (en) * | 1995-04-24 | 1996-09-17 | Albemarle Corporation | Enhanced synthesis of racemic metallocenes |
| US5760262A (en) * | 1996-09-17 | 1998-06-02 | Albemarle Corporation | Enhanced production of bridged hafnocenes |
| US6503561B1 (en) * | 1999-07-08 | 2003-01-07 | Air Products And Chemicals, Inc. | Liquid precursor mixtures for deposition of multicomponent metal containing materials |
| US6399208B1 (en) * | 1999-10-07 | 2002-06-04 | Advanced Technology Materials Inc. | Source reagent composition and method for chemical vapor deposition formation or ZR/HF silicate gate dielectric thin films |
| US6984591B1 (en) * | 2000-04-20 | 2006-01-10 | International Business Machines Corporation | Precursor source mixtures |
| KR100545706B1 (ko) * | 2000-06-28 | 2006-01-24 | 주식회사 하이닉스반도체 | 반도체 소자 제조방법 |
| WO2002038628A2 (en) * | 2000-11-07 | 2002-05-16 | Symyx Technologies, Inc. | Substituted pyridyl amine ligands, complexes and catalysts therefrom; processes for producing polyolefins therewith |
| KR100355239B1 (ko) * | 2000-12-26 | 2002-10-11 | 삼성전자 주식회사 | 실린더형 커패시터를 갖는 반도체 메모리 소자 및 그제조방법 |
| US6348386B1 (en) * | 2001-04-16 | 2002-02-19 | Motorola, Inc. | Method for making a hafnium-based insulating film |
| US6420279B1 (en) * | 2001-06-28 | 2002-07-16 | Sharp Laboratories Of America, Inc. | Methods of using atomic layer deposition to deposit a high dielectric constant material on a substrate |
| KR100433623B1 (ko) * | 2001-09-17 | 2004-05-31 | 한국전자통신연구원 | 급격한 금속-절연체 상전이를 이용한 전계 효과 트랜지스터 |
| US7135421B2 (en) * | 2002-06-05 | 2006-11-14 | Micron Technology, Inc. | Atomic layer-deposited hafnium aluminum oxide |
| KR100513719B1 (ko) * | 2002-08-12 | 2005-09-07 | 삼성전자주식회사 | 하프늄 산화막 형성용 전구체 및 상기 전구체를 이용한하프늄 산화막의 형성방법 |
-
2002
- 2002-08-12 KR KR10-2002-0047518A patent/KR100513719B1/ko not_active Expired - Fee Related
-
2003
- 2003-08-01 DE DE60301834T patent/DE60301834T2/de not_active Expired - Lifetime
- 2003-08-01 EP EP03254830A patent/EP1394164B1/de not_active Expired - Lifetime
- 2003-08-12 JP JP2003292164A patent/JP3740142B2/ja not_active Expired - Fee Related
- 2003-08-12 CN CNB031530850A patent/CN100356519C/zh not_active Expired - Fee Related
- 2003-08-12 US US10/638,329 patent/US7030450B2/en not_active Expired - Fee Related
-
2006
- 2006-01-27 US US11/340,692 patent/US7399716B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2004104111A (ja) | 2004-04-02 |
| EP1394164B1 (de) | 2005-10-12 |
| US7399716B2 (en) | 2008-07-15 |
| US20060118891A1 (en) | 2006-06-08 |
| JP3740142B2 (ja) | 2006-02-01 |
| US20040113195A1 (en) | 2004-06-17 |
| CN100356519C (zh) | 2007-12-19 |
| KR100513719B1 (ko) | 2005-09-07 |
| US7030450B2 (en) | 2006-04-18 |
| DE60301834T2 (de) | 2006-06-29 |
| KR20040015428A (ko) | 2004-02-19 |
| EP1394164A1 (de) | 2004-03-03 |
| CN1482653A (zh) | 2004-03-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition |