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DE60114854D1 - A/d-umsetzerkalibrierung - Google Patents

A/d-umsetzerkalibrierung

Info

Publication number
DE60114854D1
DE60114854D1 DE60114854T DE60114854T DE60114854D1 DE 60114854 D1 DE60114854 D1 DE 60114854D1 DE 60114854 T DE60114854 T DE 60114854T DE 60114854 T DE60114854 T DE 60114854T DE 60114854 D1 DE60114854 D1 DE 60114854D1
Authority
DE
Germany
Prior art keywords
calibration
change
threshold
operating conditions
measure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60114854T
Other languages
English (en)
Other versions
DE60114854T2 (de
Inventor
Erik Jonsson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telefonaktiebolaget LM Ericsson AB
Original Assignee
Telefonaktiebolaget LM Ericsson AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SE0003043A external-priority patent/SE517536C2/sv
Application filed by Telefonaktiebolaget LM Ericsson AB filed Critical Telefonaktiebolaget LM Ericsson AB
Application granted granted Critical
Publication of DE60114854D1 publication Critical patent/DE60114854D1/de
Publication of DE60114854T2 publication Critical patent/DE60114854T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
DE60114854T 2000-08-29 2001-08-24 A/d-umsetzerkalibrierung Expired - Lifetime DE60114854T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
SE0003043 2000-08-29
SE0003043A SE517536C2 (sv) 2000-03-14 2000-08-29 Anordning samt metod för bakgrundskalibrering av A/D- omvandlare
SE0102079A SE517457C2 (sv) 2000-08-29 2001-06-12 Metod och anordning för bakgrundskalibrering av A/D- omvandlare
SE0102079 2001-06-12
PCT/SE2001/001803 WO2002019531A1 (en) 2000-08-29 2001-08-24 A/d converter calibration

Publications (2)

Publication Number Publication Date
DE60114854D1 true DE60114854D1 (de) 2005-12-15
DE60114854T2 DE60114854T2 (de) 2006-06-01

Family

ID=26655221

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60114854T Expired - Lifetime DE60114854T2 (de) 2000-08-29 2001-08-24 A/d-umsetzerkalibrierung

Country Status (9)

Country Link
US (1) US6717536B2 (de)
EP (1) EP1316150B1 (de)
JP (1) JP4776143B2 (de)
CN (1) CN1254018C (de)
AT (1) ATE309642T1 (de)
AU (2) AU2001282788B2 (de)
DE (1) DE60114854T2 (de)
SE (1) SE517457C2 (de)
WO (1) WO2002019531A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100449633C (zh) * 2003-05-19 2009-01-07 皇家飞利浦电子股份有限公司 盘驱动设备以及在盘驱动设备中定时再校准的方法
US6967603B1 (en) * 2004-07-19 2005-11-22 Realtek Semiconductor Corp. ADC background calibration timing
US7102417B2 (en) * 2004-11-05 2006-09-05 International Business Machines Corporation Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuit
KR100730896B1 (ko) 2005-03-17 2007-06-21 (주)에스디시스템 공급전압 변동에도 안정적인 에이디씨 입력값의 측정이가능한 에이디씨 측정회로장치
US7460045B1 (en) * 2006-08-15 2008-12-02 Pmc-Sierra, Inc. Background calibration technique for pipelined A/D converters using simplified histogram-based testing
US8890730B2 (en) * 2013-03-15 2014-11-18 Xilinx, Inc. Calibration of a switching instant of a switch
DE102013105340A1 (de) * 2013-05-24 2014-11-27 Vorwerk & Co. Interholding Gmbh Elektrisch betriebenes Gerät, Verfahren zur Kalibrierung eines Sensors und Computerprogrammprodukt
DE102013014876B3 (de) * 2013-09-06 2014-12-11 Hottinger Baldwin Messtechnik Gmbh Messverstärker mit Hintergrundjustierung und Verfahren dafür
CN106546901A (zh) * 2016-09-23 2017-03-29 上海为准电子科技有限公司 一种针对射频电路湿度性能的功率校准的方法与装置
DE102018114092B4 (de) * 2018-06-13 2021-04-29 Infineon Technologies Ag Verfahren, Vorrichtungen und Systeme zur Überwachung von Datenwandlern welche einen Kalibrierungsdatensatz aufweisen

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3703001A (en) * 1969-05-22 1972-11-14 Eugene B Hibbs Jr Analog to digital converter
US4133036A (en) * 1976-02-26 1979-01-02 Republic Steel Corporation Method and system for monitoring a physical condition of a medium
US4399426A (en) * 1981-05-04 1983-08-16 Tan Khen Sang On board self-calibration of analog-to-digital and digital-to-analog converters
US5101206A (en) * 1989-12-05 1992-03-31 Hewlett-Packard Company Integrating analog to digital converter
JPH03205921A (ja) * 1990-01-08 1991-09-09 Hitachi Denshi Ltd デジタイザ回路
US5450336A (en) * 1991-03-05 1995-09-12 Aradigm Corporation Method for correcting the drift offset of a transducer
JPH04307818A (ja) * 1991-04-04 1992-10-30 Mitsubishi Electric Corp ドリフト補償回路
US6069576A (en) * 1998-04-02 2000-05-30 The United States Of America As Represented By The Secretary Of The Navy Synchro-to-digital converter
JP3965773B2 (ja) * 1998-05-06 2007-08-29 松下電器産業株式会社 Ａ／ｄ変換装置
US6346907B1 (en) * 1998-08-07 2002-02-12 Agere Systems Guardian Corp. Analog-to-digital converter having voltage to-time converter and time digitizer, and method for using same
US6184809B1 (en) * 1998-08-19 2001-02-06 Texas Instruments Incorporated User transparent self-calibration technique for pipelined ADC architecture
EP1024348B1 (de) * 1999-01-28 2011-07-27 Denso Corporation Verfahren zur Unterdrückung von niederfrequentem Rauschen und zugehörige CMOS-Schaltung
SE517675C2 (sv) 2000-03-14 2002-07-02 Ericsson Telefon Ab L M Ett förfarande för A/D-omvandling samt ett A/D- omvandlingssystem
SE517536C2 (sv) 2000-03-14 2002-06-18 Ericsson Telefon Ab L M Anordning samt metod för bakgrundskalibrering av A/D- omvandlare
US6414612B1 (en) * 2000-09-14 2002-07-02 Scientific-Atlanta, Inc. Enhanced bandwidth digitizer using multiple analog-to digital converters and self calibration

Also Published As

Publication number Publication date
SE517457C2 (sv) 2002-06-11
EP1316150B1 (de) 2005-11-09
AU2001282788B2 (en) 2006-11-02
JP4776143B2 (ja) 2011-09-21
US6717536B2 (en) 2004-04-06
SE0102079D0 (sv) 2001-06-12
US20030146863A1 (en) 2003-08-07
SE0102079L (sv) 2002-03-01
JP2004507965A (ja) 2004-03-11
ATE309642T1 (de) 2005-11-15
EP1316150A1 (de) 2003-06-04
AU8278801A (en) 2002-03-13
WO2002019531A1 (en) 2002-03-07
CN1254018C (zh) 2006-04-26
DE60114854T2 (de) 2006-06-01
CN1449598A (zh) 2003-10-15

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Legal Events

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