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DE60036753D1 - Automatische Analysevorrichtung, sowie Verwaltungsvorrichtung und Rechnerprogramprodukt zur Verwaltung davon - Google Patents

Automatische Analysevorrichtung, sowie Verwaltungsvorrichtung und Rechnerprogramprodukt zur Verwaltung davon

Info

Publication number
DE60036753D1
DE60036753D1 DE60036753T DE60036753T DE60036753D1 DE 60036753 D1 DE60036753 D1 DE 60036753D1 DE 60036753 T DE60036753 T DE 60036753T DE 60036753 T DE60036753 T DE 60036753T DE 60036753 D1 DE60036753 D1 DE 60036753D1
Authority
DE
Germany
Prior art keywords
managing
well
computer program
program product
automatic analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60036753T
Other languages
English (en)
Other versions
DE60036753T2 (de
Inventor
Yukie Tokiwa
Kyoko Imai
Shigeki Matsubara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of DE60036753D1 publication Critical patent/DE60036753D1/de
Application granted granted Critical
Publication of DE60036753T2 publication Critical patent/DE60036753T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00712—Automatic status testing, e.g. at start-up or periodic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y10T436/113332—Automated chemical analysis with conveyance of sample along a test line in a container or rack
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y10T436/115831—Condition or time responsive

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
DE60036753T 1999-06-16 2000-06-14 Automatische Analysevorrichtung, sowie Verwaltungsvorrichtung und Rechnerprogramprodukt zur Verwaltung davon Expired - Lifetime DE60036753T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP16949999 1999-06-16
JP16949999A JP3598019B2 (ja) 1999-06-16 1999-06-16 自動分析装置

Publications (2)

Publication Number Publication Date
DE60036753D1 true DE60036753D1 (de) 2007-11-29
DE60036753T2 DE60036753T2 (de) 2008-07-24

Family

ID=15887664

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60036753T Expired - Lifetime DE60036753T2 (de) 1999-06-16 2000-06-14 Automatische Analysevorrichtung, sowie Verwaltungsvorrichtung und Rechnerprogramprodukt zur Verwaltung davon

Country Status (4)

Country Link
US (1) US6846457B1 (de)
EP (2) EP1061372B1 (de)
JP (1) JP3598019B2 (de)
DE (1) DE60036753T2 (de)

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JP3990944B2 (ja) * 2002-06-28 2007-10-17 株式会社日立ハイテクノロジーズ 自動分析装置
JP2004061456A (ja) * 2002-07-31 2004-02-26 Teruaki Ito 検体前処理搬送システム
DE10253700B4 (de) 2002-11-18 2005-11-17 Siemens Ag Verfahren zum Durchführen einer Qualitätskontrolle für einen Analyseprozess und Verwendung des Verfahrens
US20040209375A1 (en) * 2003-04-15 2004-10-21 Bayer Healthcare Control bracketing and results hold
US7185288B2 (en) * 2003-07-18 2007-02-27 Dade Behring Inc. Operator interface module segmented by function in an automatic clinical analyzer
JP4369313B2 (ja) * 2004-07-02 2009-11-18 株式会社日立ハイテクノロジーズ 臨床検査システム
JP4839010B2 (ja) * 2005-03-29 2011-12-14 シスメックス株式会社 分析システム、データ処理装置、及びアプリケーションプログラム
US7260498B2 (en) * 2005-06-17 2007-08-21 Dade Behring Inc. Context-specific electronic performance support
JP4576307B2 (ja) * 2005-09-12 2010-11-04 株式会社日立ハイテクノロジーズ 自動分析装置
JP2007187446A (ja) * 2006-01-11 2007-07-26 Hitachi High-Technologies Corp 自動分析装置
JP4825548B2 (ja) * 2006-02-28 2011-11-30 シスメックス株式会社 試料分析装置
JP4871618B2 (ja) 2006-03-14 2012-02-08 株式会社日立ハイテクノロジーズ 精度管理システム
JP2008058123A (ja) * 2006-08-31 2008-03-13 Hitachi High-Technologies Corp 自動分析装置
JP4511512B2 (ja) * 2006-12-22 2010-07-28 シスメックス株式会社 分析装置用ユーザインタフェース及び分析装置
JP2008209338A (ja) * 2007-02-28 2008-09-11 Hitachi High-Technologies Corp 自動分析装置
EP1986013A3 (de) * 2007-04-27 2013-04-03 Sysmex Corporation Probenanalysegerät
KR20100009645A (ko) * 2007-06-19 2010-01-28 베크만 컬터, 인코포레이티드 이상 특정 방법 및 분석 장치
EP2116851B1 (de) * 2008-02-13 2018-09-19 Hitachi High-Technologies Corporation Automatisches Analysegerät
JP2009222610A (ja) * 2008-03-18 2009-10-01 Hitachi High-Technologies Corp 自動分析装置
EP2105723B1 (de) * 2008-03-28 2020-04-15 Sysmex Corporation Probenanalysegerät, Probenanalyseverfahren und Computerprogrammprodukt
JP5542317B2 (ja) * 2008-09-25 2014-07-09 ベックマン コールター， インコーポレイテッド 自動分析装置および精度管理結果表示方法
JP5397981B2 (ja) * 2008-09-26 2014-01-22 ベックマン コールター， インコーポレイテッド 自動分析装置および分析精度管理表示方法
JP5166208B2 (ja) * 2008-10-28 2013-03-21 シスメックス株式会社 検体分析装置、検体分析装置の校正方法及びコンピュータプログラム
JP5378859B2 (ja) * 2009-03-30 2013-12-25 シスメックス株式会社 検体検査システム
JP5351606B2 (ja) * 2009-05-20 2013-11-27 日本電子株式会社 生化学自動分析装置
JP5147906B2 (ja) * 2010-07-22 2013-02-20 株式会社日立ハイテクノロジーズ 精度管理システム
JP5669528B2 (ja) * 2010-11-17 2015-02-12 株式会社日立ハイテクノロジーズ 自動分析装置
WO2012120755A1 (ja) * 2011-03-04 2012-09-13 株式会社 日立ハイテクノロジーズ 分析装置
JP5992668B2 (ja) * 2011-07-22 2016-09-14 東芝メディカルシステムズ株式会社 自動分析装置
EP2734827B1 (de) * 2011-07-22 2022-05-04 Roche Diagnostics Hematology, Inc. Kalibrierung und beurteilung eines blutanalysators
JP6008536B2 (ja) * 2012-03-29 2016-10-19 シスメックス株式会社 分析システム、管理装置、及びコンピュータプログラム
JP6013796B2 (ja) * 2012-06-25 2016-10-25 株式会社日立ハイテクノロジーズ 自動分析装置及び試料測定方法
JP6075087B2 (ja) * 2013-01-28 2017-02-08 ウシオ電機株式会社 蛍光光度計点検方法、点検用試薬容器及び蛍光光度計
USD978375S1 (en) 2013-03-13 2023-02-14 Abbott Laboratories Reagent container
JP6169245B2 (ja) * 2013-03-15 2017-07-26 アボット・ラボラトリーズＡｂｂｏｔｔ Ｌａｂｏｒａｔｏｒｉｅｓ 後部アクセス可能トラックシステムを有する自動診断分析装置および関連方法
WO2015098473A1 (ja) * 2013-12-25 2015-07-02 株式会社日立ハイテクノロジーズ 自動分析装置及び分析方法
JP7068463B2 (ja) * 2018-07-27 2022-05-16 株式会社日立ハイテク 自動分析システム
WO2020139989A1 (en) 2018-12-28 2020-07-02 Beckman Coulter, Inc. Clinical analyzer automated system diagnostics
CN111381055A (zh) * 2018-12-29 2020-07-07 深圳迈瑞生物医疗电子股份有限公司 一种校准数据显示方法和样本分析装置
JP7423752B2 (ja) * 2020-03-19 2024-01-29 株式会社日立ハイテク 自動分析装置
JP7326205B2 (ja) * 2020-03-31 2023-08-15 株式会社日立ハイテク 自動分析装置
CN114441390A (zh) * 2020-10-30 2022-05-06 深圳市瑞图生物技术有限公司 一种并发时序控制方法及精子质量分析仪、存储介质

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4873633A (en) * 1985-10-18 1989-10-10 Cetus Corporation User controlled off-center light absorbance reading adjuster in a liquid handling and reaction system
JP2779071B2 (ja) * 1991-01-31 1998-07-23 日本電子株式会社 生化学自動分析装置
DE4224621C2 (de) * 1992-07-25 1994-05-05 Boehringer Mannheim Gmbh Verfahren zur Analyse eines Bestandteils einer medizinischen Probe mittels eines automatischen Analysegerätes
CA2168452A1 (en) * 1993-08-16 1995-02-23 Timothy J. Fischer Method and instrument for automatically performing analysis relating to thrombosis and hemostasis
US5532941A (en) * 1994-07-08 1996-07-02 Lin; Lawrence I. Inter-laboratory performance monitoring system
US5492831A (en) * 1994-11-15 1996-02-20 Lachat Instruments Shared peripheral analytical system
JPH102902A (ja) * 1996-06-14 1998-01-06 Toshiba Corp 自動分析装置
EP0871034B1 (de) * 1997-04-10 2007-03-07 Hitachi, Ltd. Automatische Analysevorrichtung
JP3889877B2 (ja) * 1997-04-10 2007-03-07 株式会社日立製作所 自動分析装置およびその支援システム
JPH11142412A (ja) * 1997-11-05 1999-05-28 Hitachi Ltd 自動分析装置
JP3438607B2 (ja) * 1998-09-25 2003-08-18 株式会社日立製作所 自動分析装置

Also Published As

Publication number Publication date
JP3598019B2 (ja) 2004-12-08
EP1600779A3 (de) 2007-07-18
US6846457B1 (en) 2005-01-25
EP1600779A2 (de) 2005-11-30
EP1061372B1 (de) 2007-10-17
EP1061372A2 (de) 2000-12-20
DE60036753T2 (de) 2008-07-24
EP1061372A3 (de) 2003-05-21
JP2001004633A (ja) 2001-01-12

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