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AU1311901A - Method and device for non-destructive inspection of objects by means of optical holographic interferometry - Google Patents

Method and device for non-destructive inspection of objects by means of optical holographic interferometry

Info

Publication number
AU1311901A
AU1311901A AU13119/01A AU1311901A AU1311901A AU 1311901 A AU1311901 A AU 1311901A AU 13119/01 A AU13119/01 A AU 13119/01A AU 1311901 A AU1311901 A AU 1311901A AU 1311901 A AU1311901 A AU 1311901A
Authority
AU
Australia
Prior art keywords
objects
destructive inspection
optical holographic
holographic interferometry
interferometry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU13119/01A
Inventor
Nikolay Aleksandrovich Davidenko
Irina Evgenievna Fjeldstad
John Petter Fjeldstad
Peter Dmitrievich Krotenko
Vladimir Petrovich Kushniruk
Nikolay Georgievich Kuvshinsky
Leonid Mikhailovich Lobanov
Valeriy Aleksandrovich Pavlov
Vjacheslav Avtonomovich Pivtorak
Galina Ivanovna Tkachuk
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HoloTech AS
Original Assignee
HoloTech AS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from NO995311A external-priority patent/NO995311D0/en
Application filed by HoloTech AS filed Critical HoloTech AS
Publication of AU1311901A publication Critical patent/AU1311901A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/164—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AU13119/01A 1999-10-29 2000-10-18 Method and device for non-destructive inspection of objects by means of optical holographic interferometry Abandoned AU1311901A (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
NO19995311 1999-10-29
NO995311A NO995311D0 (en) 1999-10-29 1999-10-29 Method and Device for Non-Destructive Inspection of Objects Using Optical Holographic Interferometer
NO20002724 2000-05-26
NO20002724A NO20002724L (en) 1999-10-29 2000-05-26 Method and equipment for non-destructive inspection of objects based on halographic interferometry
PCT/NO2000/000346 WO2001031286A2 (en) 1999-10-29 2000-10-18 Method and device for non-destructive inspection of objects by means of optical holographic interferometry

Publications (1)

Publication Number Publication Date
AU1311901A true AU1311901A (en) 2001-05-08

Family

ID=26649009

Family Applications (1)

Application Number Title Priority Date Filing Date
AU13119/01A Abandoned AU1311901A (en) 1999-10-29 2000-10-18 Method and device for non-destructive inspection of objects by means of optical holographic interferometry

Country Status (7)

Country Link
EP (1) EP1226402A2 (en)
JP (1) JP4757421B2 (en)
CN (1) CN1192207C (en)
AU (1) AU1311901A (en)
NO (1) NO20002724L (en)
RU (1) RU2002113769A (en)
WO (1) WO2001031286A2 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NO20005376L (en) * 2000-10-25 2002-04-26 Holo Tech As Method and apparatus for non-destructive measurements of intrinsic stresses in plane and non-plane objects
US8599383B2 (en) 2009-05-06 2013-12-03 The Regents Of The University Of California Optical cytometry
EP2615412B1 (en) * 2010-09-07 2016-06-01 Dai Nippon Printing Co., Ltd. Scanner device and device for measuring three-dimensional shape of object
EP2739937B1 (en) * 2011-08-02 2023-03-01 The Regents of The University of California Rapid, massively parallel single-cell drug response measurements via live cell interferometry
RU2475725C1 (en) * 2011-09-14 2013-02-20 Общество С Ограниченной Ответственностью Инженерно-Технологический Центр "Сварка" Method for nondestructive rapid inspection of weld joints and apparatus for realising said method
CN102519976A (en) * 2011-12-26 2012-06-27 上海大学 Digital holographic detection device for subsurface defect of optical element
EP3004373B1 (en) 2013-05-24 2018-03-14 The Regents of The University of California Identifying desirable t lymphocytes by change in mass responses
CN105607452B (en) * 2016-01-04 2019-01-15 中国海洋大学 Measure the Double-number holographic imaging apparatus of suspended particulate settling velocity
CN109374646A (en) * 2018-09-26 2019-02-22 上海海事大学 A crack beam detection method based on laser holography technology
US11499815B2 (en) * 2020-12-08 2022-11-15 International Business Machines Corporation Visual quality assessment augmentation employing holographic interferometry

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58106406A (en) * 1981-12-21 1983-06-24 Sumitomo Electric Ind Ltd Optical sensor
FR2543299B1 (en) * 1983-03-21 1985-11-15 Daeden Jean Pierre HOLOGRAPHIC NON-DESTRUCTIVE CONTROL SYSTEM
DE3516538A1 (en) * 1985-05-08 1986-11-13 Fa. Carl Zeiss, 7920 Heidenheim METHOD AND DEVICE FOR OPTICAL VOLTAGE MEASUREMENT
FR2593288B1 (en) * 1986-01-20 1989-09-01 Aerospatiale DEVICE FOR NON-DESTRUCTIVE CHECKING OF A PART BY OPTICAL HOLOGRAPHY
JPH05157514A (en) * 1991-12-06 1993-06-22 Mitsubishi Electric Corp Micro deformation measuring device
JP2554996B2 (en) * 1993-01-19 1996-11-20 株式会社ヒューテック Non-destructive inspection of mechanical behavior of a loaded object, its determination method and its apparatus
US5680212A (en) * 1996-04-15 1997-10-21 National Research Council Of Canada Sensitive and fast response optical detection of transient motion from a scattering surface by two-wave mixing

Also Published As

Publication number Publication date
CN1192207C (en) 2005-03-09
JP2003513232A (en) 2003-04-08
NO20002724L (en) 2001-04-30
EP1226402A2 (en) 2002-07-31
JP4757421B2 (en) 2011-08-24
NO20002724D0 (en) 2000-05-26
WO2001031286A2 (en) 2001-05-03
RU2002113769A (en) 2004-01-27
CN1415067A (en) 2003-04-30
WO2001031286A3 (en) 2001-11-01

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase