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AU1312001A - Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique - Google Patents

Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique

Info

Publication number
AU1312001A
AU1312001A AU13120/01A AU1312001A AU1312001A AU 1312001 A AU1312001 A AU 1312001A AU 13120/01 A AU13120/01 A AU 13120/01A AU 1312001 A AU1312001 A AU 1312001A AU 1312001 A AU1312001 A AU 1312001A
Authority
AU
Australia
Prior art keywords
objects
real time
residual stresses
time non
optical holographic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU13120/01A
Inventor
Sergei Gavrilovich Andrushchenko
Irina Evgenievna Fjeldstad
John Petter Fjeldstad
Peter Dmitrievich Krotenko
Vladimir Petrovich Kushniruk
Nikolai Georgievich Kuvshinsky
Leonid Mikhailovich Lobanov
Vladimir Petrovich Loginov
Valery Aleandrovich Pavlov
Vyacheslav Antonomovich Pivtorak
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HoloTech AS
Original Assignee
HoloTech AS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from NO995312A external-priority patent/NO995312D0/en
Application filed by HoloTech AS filed Critical HoloTech AS
Publication of AU1312001A publication Critical patent/AU1312001A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0047—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AU13120/01A 1999-10-29 2000-10-19 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique Abandoned AU1312001A (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
NO995312A NO995312D0 (en) 1999-10-29 1999-10-29 Method and apparatus for non-destructive determination of residual stresses in objects by holographic interferometric technique
NO19995312 1999-10-29
NO20002601A NO20002601L (en) 1999-10-29 2000-05-19 Method and equipment for non-destructive determination of residual stresses by optical holographic interferometer technique
NO20002601 2000-05-19
PCT/NO2000/000347 WO2001031289A1 (en) 1999-10-29 2000-10-19 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique

Publications (1)

Publication Number Publication Date
AU1312001A true AU1312001A (en) 2001-05-08

Family

ID=26649010

Family Applications (1)

Application Number Title Priority Date Filing Date
AU13120/01A Abandoned AU1312001A (en) 1999-10-29 2000-10-19 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique

Country Status (7)

Country Link
EP (1) EP1226403A1 (en)
JP (1) JP4623907B2 (en)
CN (1) CN1270160C (en)
AU (1) AU1312001A (en)
NO (1) NO20002601L (en)
RU (1) RU2002113768A (en)
WO (1) WO2001031289A1 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NO20005376L (en) * 2000-10-25 2002-04-26 Holo Tech As Method and apparatus for non-destructive measurements of intrinsic stresses in plane and non-plane objects
SE0300666D0 (en) * 2003-03-10 2003-03-10 Faahraeus Holographic Technolo Stress measurement
JP4328349B2 (en) 2006-11-29 2009-09-09 株式会社日立製作所 Residual stress measurement method and apparatus
JP2009014606A (en) * 2007-07-06 2009-01-22 Hitachi Ltd Residual stress measuring device and residual stress measuring method
JP4488060B2 (en) * 2007-11-14 2010-06-23 富士ゼロックス株式会社 Non-moldable part detection device, non-moldable part detection system, non-moldable part detection program, and non-moldable part detection method
JP5356894B2 (en) * 2009-04-06 2013-12-04 ポリプラスチックス株式会社 Residual stress calculation method and residual stress distribution derivation method
GB201117343D0 (en) * 2011-10-07 2011-11-23 Airbus Uk Ltd Method and apparatus for measuring residual stresses in a component
CN102865948A (en) * 2012-09-27 2013-01-09 辽宁忠旺集团有限公司 Method for determining residual butt welding stress of aluminum alloy sheets
RU2523073C1 (en) * 2013-03-21 2014-07-20 Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) Device for definition of mechanical strains at metal structure surface by feed of required amount of heat
EP3149767A4 (en) * 2014-05-29 2018-01-24 Brown University Optical system and methods for the determination of stress in a substrate
CN104697467B (en) * 2015-02-12 2017-05-24 中北大学 Weld appearance shape based on line laser scanning and surface defect detection method
CN108181032B (en) * 2017-12-21 2020-11-03 重庆市铜梁区华亿来铝材加工厂 A kind of residual stress detection method
US10837761B1 (en) * 2019-04-30 2020-11-17 The Boeing Company Component heating sub-systems and methods for laser shearography testing systems
CN111982374B (en) * 2020-08-04 2025-04-04 溧阳卓越新材料科技有限公司 A method for online detection of residual stress in aluminum-plastic film punching

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4249423A (en) * 1979-05-11 1981-02-10 General Electric Company Semi-nondestructive residual stress measurement
JPS61501046A (en) * 1984-01-05 1986-05-22 インダストリアル　ホログラフイツクス　インコ−ポレ−テツド Equipment for double exposure interferometric non-destructive testing
SU1758419A1 (en) 1990-05-30 1992-08-30 Институт Физико-Технических Проблем Севера Со Ан Ссср Method of determining residual stresses
JPH04186106A (en) * 1990-11-21 1992-07-02 Kowa Co Optical measuring method and device
JPH04223208A (en) * 1990-12-25 1992-08-13 Nippon Telegr & Teleph Corp <Ntt> Real-time deformation/shape analysis method and device
US5432595A (en) * 1993-07-13 1995-07-11 Pechersky; Martin J. Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison
WO1995010023A1 (en) * 1993-10-05 1995-04-13 Kabushikigaisya Hutech Non-destructive inspection method for mechanical behaviour of article
US6040900A (en) * 1996-07-01 2000-03-21 Cybernet Systems Corporation Compact fiber-optic electronic laser speckle pattern shearography
US5920017A (en) * 1997-10-30 1999-07-06 Westinghouse Savannah River Company Thermal input control and enhancement for laser based residual stress measurements using liquid temperature indicating coatings

Also Published As

Publication number Publication date
CN1415066A (en) 2003-04-30
EP1226403A1 (en) 2002-07-31
JP2003514247A (en) 2003-04-15
CN1270160C (en) 2006-08-16
NO20002601D0 (en) 2000-05-19
RU2002113768A (en) 2004-01-27
JP4623907B2 (en) 2011-02-02
NO20002601L (en) 2001-04-30
WO2001031289A1 (en) 2001-05-03

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase