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MX2010001526A - Dispositivo de circuito y metodo para medir inestabilidad de reloj. - Google Patents

Dispositivo de circuito y metodo para medir inestabilidad de reloj.

Info

Publication number
MX2010001526A
MX2010001526A MX2010001526A MX2010001526A MX2010001526A MX 2010001526 A MX2010001526 A MX 2010001526A MX 2010001526 A MX2010001526 A MX 2010001526A MX 2010001526 A MX2010001526 A MX 2010001526A MX 2010001526 A MX2010001526 A MX 2010001526A
Authority
MX
Mexico
Prior art keywords
circuit device
clock jitter
measuring clock
clock signal
value
Prior art date
Application number
MX2010001526A
Other languages
English (en)
Inventor
Paul Basset
Martin Saint-Laurent
Boris Andreev
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of MX2010001526A publication Critical patent/MX2010001526A/es

Links

Classifications

    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pulse Circuits (AREA)
  • Manipulation Of Pulses (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dc Digital Transmission (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Measuring Phase Differences (AREA)

Abstract

En una modalidad, se describe un método que incluye recibir una señal de reloj en una cadena de retardo de un dispositivo de circuito y determinar un valor de la señal de reloj en un punto seleccionado dentro de la cadena de retardo. El método también incluye ajustar el punto seleccionado cuando el valor no indica detección de un borde de la señal de reloj.
MX2010001526A 2007-08-09 2008-08-08 Dispositivo de circuito y metodo para medir inestabilidad de reloj. MX2010001526A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/836,220 US7816960B2 (en) 2007-08-09 2007-08-09 Circuit device and method of measuring clock jitter
PCT/US2008/072629 WO2009021186A1 (en) 2007-08-09 2008-08-08 Circuit device and method of measuring clock jitter

Publications (1)

Publication Number Publication Date
MX2010001526A true MX2010001526A (es) 2010-03-15

Family

ID=39590275

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2010001526A MX2010001526A (es) 2007-08-09 2008-08-08 Dispositivo de circuito y metodo para medir inestabilidad de reloj.

Country Status (14)

Country Link
US (1) US7816960B2 (es)
EP (1) EP2026469B1 (es)
JP (1) JP5318870B2 (es)
KR (1) KR101200233B1 (es)
CN (1) CN101779376B (es)
AT (1) ATE506754T1 (es)
BR (1) BRPI0815032A2 (es)
CA (1) CA2695373C (es)
DE (1) DE602008006312D1 (es)
ES (1) ES2365438T3 (es)
MX (1) MX2010001526A (es)
RU (1) RU2451391C2 (es)
TW (1) TWI366343B (es)
WO (1) WO2009021186A1 (es)

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CN108023576B (zh) * 2017-12-25 2021-02-02 北京无线电计量测试研究所 一种用于快沿脉冲发生器上升时间校准的方法
CN109062538B (zh) * 2018-07-10 2020-11-20 豪威科技(上海)有限公司 环形先进先出缓冲器及数据传输接口、系统、方法
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CN115204083B (zh) * 2022-09-13 2023-02-28 摩尔线程智能科技(北京)有限责任公司 芯片静态时序分析方法、装置、电子设备及存储介质
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Also Published As

Publication number Publication date
RU2010108218A (ru) 2011-10-27
JP5318870B2 (ja) 2013-10-16
ES2365438T3 (es) 2011-10-05
RU2451391C2 (ru) 2012-05-20
CA2695373A1 (en) 2009-02-12
EP2026469A1 (en) 2009-02-18
TW200919968A (en) 2009-05-01
KR101200233B1 (ko) 2012-11-09
JP2010536267A (ja) 2010-11-25
US20090039867A1 (en) 2009-02-12
BRPI0815032A2 (pt) 2015-03-10
US7816960B2 (en) 2010-10-19
ATE506754T1 (de) 2011-05-15
TWI366343B (en) 2012-06-11
CA2695373C (en) 2013-07-23
DE602008006312D1 (de) 2011-06-01
WO2009021186A1 (en) 2009-02-12
EP2026469B1 (en) 2011-04-20
CN101779376B (zh) 2013-11-06
KR20100053632A (ko) 2010-05-20
CN101779376A (zh) 2010-07-14

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