WO2019004457A1 - 封止用樹脂組成物、半導体パッケージ及び半導体パッケージの製造方法 - Google Patents
封止用樹脂組成物、半導体パッケージ及び半導体パッケージの製造方法 Download PDFInfo
- Publication number
- WO2019004457A1 WO2019004457A1 PCT/JP2018/024934 JP2018024934W WO2019004457A1 WO 2019004457 A1 WO2019004457 A1 WO 2019004457A1 JP 2018024934 W JP2018024934 W JP 2018024934W WO 2019004457 A1 WO2019004457 A1 WO 2019004457A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- epoxy resin
- resin composition
- sealing
- mass
- type epoxy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/22—Di-epoxy compounds
- C08G59/24—Di-epoxy compounds carbocyclic
- C08G59/245—Di-epoxy compounds carbocyclic aromatic
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/22—Di-epoxy compounds
- C08G59/226—Mixtures of di-epoxy compounds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/22—Di-epoxy compounds
- C08G59/24—Di-epoxy compounds carbocyclic
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/22—Di-epoxy compounds
- C08G59/28—Di-epoxy compounds containing acyclic nitrogen atoms
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/22—Di-epoxy compounds
- C08G59/30—Di-epoxy compounds containing atoms other than carbon, hydrogen, oxygen and nitrogen
- C08G59/308—Di-epoxy compounds containing atoms other than carbon, hydrogen, oxygen and nitrogen containing halogen atoms
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
-
- H10W74/01—
-
- H10W74/10—
-
- H10W74/40—
-
- H10W74/473—
Definitions
- the present invention relates to a resin composition for sealing, a semiconductor package, and a method of manufacturing the semiconductor package.
- Patent Document 1 describes a liquid sealing material which achieves good injection performance and suppression of fillet cracks after sealing by blending a specific amount of aminophenol epoxy resin with bisphenol type epoxy resin.
- the sealing area tends to increase as the size of the semiconductor package increases. Along with this, there is an increasing possibility that an increase in stress generated between the sealing portion and the substrate inside the package may affect the reliability of the package. For this reason, it is considered that the design of the sealing material from the viewpoint of suppressing the stress generated inside the package will be more important in the future.
- Means for solving the above problems include the following embodiments.
- the sealing resin composition as described in ⁇ 1> or ⁇ 2> whose ratio which occupies for the said epoxy resin whole of the ⁇ 3> above-mentioned bisphenol-type epoxy resin is 20 mass% or more and less than 90 mass%.
- ⁇ 4> The sealing resin composition according to any one of ⁇ 1> to ⁇ 3>, wherein the epoxy resin further comprises a glycidyl amine type epoxy resin.
- ⁇ 7> A support, a semiconductor element disposed on the support, and the sealing resin composition according to any one of ⁇ 1> to ⁇ 6>, which seals the semiconductor element And a cured product.
- the resin composition for sealing which is excellent in injectability and excellent in the inhibitory effect of the stress which arises in a package inside, the semiconductor package obtained using this, and its manufacturing method are provided.
- the term “step” includes, in addition to steps independent of other steps, such steps as long as the purpose of the step is achieved even if it can not be clearly distinguished from other steps.
- numerical values described before and after “to” are included in the numerical range indicated using “to” as the minimum value and the maximum value, respectively.
- the upper limit value or the lower limit value described in one numerical value range may be replaced with the upper limit value or the lower limit value of the other stepwise description numerical value range in the numerical value range described stepwise in the present disclosure.
- the upper limit value or the lower limit value of the numerical range may be replaced with the value shown in the example.
- each component may contain a plurality of corresponding substances.
- the content or content of each component is the total content or content of the plurality of substances present in the composition unless otherwise specified.
- particles corresponding to each component may contain a plurality of types.
- the particle diameter of each component means the value for the mixture of the plurality of particles present in the composition unless otherwise specified.
- the sealing resin composition of the present embodiment contains an epoxy resin, a curing agent, and a filler, and the epoxy resin is a bisphenol type epoxy resin, 1,6-bis (glycidyloxy) naphthalene (the following formula ( The ratio of the specific naphthalene type epoxy resin to the whole epoxy resin is 10% by mass to 30% by mass including the epoxy resin represented by 1); hereinafter, also referred to as a specific naphthalene type epoxy resin).
- the resin composition is excellent in injectability, has a low coefficient of thermal expansion in a cured state, and has a low modulus of elasticity.
- the coefficient of thermal expansion in the cured state of the sealing resin composition is low, it is considered that the difference in coefficient of thermal expansion between the cured product and the support becomes small, and the effect of reducing the generated stress can be obtained. .
- the elastic modulus in a cured state of the sealing resin composition is low, it is considered that the effect of relieving the generated stress can be obtained.
- the coefficient of thermal expansion and the modulus of elasticity after curing are reduced while the viscosity increase before curing is suppressed, as compared with the methods such as increasing the amount of filler and adding a plasticizer. It is considered that good injection and stress reduction or alleviating effects can be simultaneously achieved.
- the coefficient of thermal expansion can be obtained by including a specific naphthalene type epoxy resin as an epoxy resin. It is presumed that the elastic modulus is kept low by reducing the amount of the specific naphthalene type epoxy resin and suppressing the amount of the specific naphthalene type epoxy resin to a certain rate or less and using the bisphenol type epoxy resin in combination.
- the sealing resin composition is preferably in a liquid state at the time of use. More specifically, the viscosity at 25 ° C. (viscosity at 10 revolutions / minute) is preferably 25 Pa ⁇ s or less. Moreover, it is preferable that the viscosity in 110 degreeC is 0.12 Pa.s or less.
- the viscosity of the sealing resin composition is a value measured by the method described in the examples described later.
- Epoxy resin The specific naphthalene type epoxy resin is an epoxy resin which is liquid at normal temperature (25 ° C.), and is also available as a commercial product. Examples of commercially available products include "Epiclon HP-4032D", trade name of DIC Corporation.
- the proportion of the specific naphthalene type epoxy resin in the entire epoxy resin is 10% by mass or more, and preferably 15% by mass or more. From the viewpoint of maintaining good injectability, the ratio of the specific naphthalene type epoxy resin to the entire epoxy resin is 30% by mass or less, and preferably 25% by mass or less.
- the type of bisphenol epoxy resin is not particularly limited, and examples thereof include bisphenol A epoxy resin, bisphenol F epoxy resin, and bisphenol AD epoxy resin.
- the bisphenol type epoxy resin contained in the resin composition for sealing may be one kind alone or two or more kinds. From the viewpoint of using the sealing resin composition in liquid form, it is preferable that the bisphenol type epoxy resin is liquid at normal temperature (25 ° C.). From the viewpoint of viscosity reduction, the bisphenol epoxy resin is preferably a bisphenol F epoxy resin.
- the proportion of the bisphenol type epoxy resin in the entire epoxy resin is not particularly limited, and can be selected according to the desired properties of the encapsulating resin composition. For example, it can be selected from the range of 20% by mass to less than 90% by mass, and may be selected from the range of 30% by mass to 80% by mass.
- the sealing resin composition may contain an epoxy resin other than the specific naphthalene type epoxy resin and the bisphenol type epoxy resin.
- the types of epoxy resins other than the specific naphthalene type epoxy resin and the bisphenol type epoxy resin are not particularly limited, and can be selected according to the desired characteristics and the like of the sealing resin composition.
- the resin composition for sealing contains a bisphenol-type epoxy resin and an epoxy resin other than that as an epoxy resin other than a specific naphthalene-type epoxy resin
- the mass ratio of the bisphenol-type epoxy resin to the other epoxy resin bisphenol-type epoxy resin
- the other epoxy resins are not particularly limited. For example, it can be selected from the range of 1/5 to 5/1.
- the resin composition for sealing contains a bisphenol type epoxy resin and an epoxy resin other than epoxy resin as an epoxy resin other than the specific naphthalene type epoxy resin
- normal temperature 25
- an epoxy resin which is liquid at ° C. and more preferable to contain a glycidyl amine type epoxy resin.
- the molecular weight of the glycidyl amine epoxy resin is preferably 300 or less.
- the glycidyl amine type epoxy resin may be bifunctional or trifunctional or more. From the viewpoint of improving the heat resistance after curing, a glycidyl amine type epoxy resin having three or more functions (having three or more epoxy groups in one molecule) is preferable. Examples of glycidyl amine type epoxy resins having two or more functional groups include N, N-diglycidyl aniline, N, N-diglycidyl-o-toluidine and the like. Examples of trifunctional or higher glycidyl amine type epoxy resins include triglycidyl-p-aminophenol and 4,4'-methylenebis [N, N-bis (oxiranylmethyl) aniline]. Among these, triglycidyl-p-aminophenol is preferable from the viewpoint of normal temperature (25 ° C.) viscosity.
- the sealing resin composition contains a glycidyl amine type epoxy resin as an epoxy resin
- the ratio is not particularly limited.
- the proportion of the total epoxy resin is preferably 10% by mass to 60% by mass.
- the type of curing agent is not particularly limited, and can be selected according to the desired properties of the sealing resin composition.
- amine curing agents, phenol curing agents, acid anhydride curing agents, polymercaptan curing agents, polyaminoamide curing agents, isocyanate curing agents, blocked isocyanate curing agents and the like can be mentioned.
- the curing agent may be used alone or in combination of two or more.
- the curing agent is preferably an amine curing agent from the viewpoint of using the sealing resin composition in a liquid state.
- aliphatic amine compounds such as diethylenetriamine, triethylenetetramine, n-propylamine, 2-hydroxyethylaminopropylamine, cyclohexylamine, 4,4'-diamino-dicyclohexylmethane, 4,4'-diamino Aromatic amine compounds such as diphenylmethane and 2-methylaniline; imidazole compounds such as imidazole, 2-methylimidazole, 2-ethylimidazole and 2-isopropylimidazole; and imidazoline compounds such as imidazoline, 2-methylimidazoline and 2-ethylimidazoline Can be mentioned.
- Equivalent ratio of epoxy resin to curing agent that is, the ratio of the number of functional groups (active hydrogen in the case of amine curing agent) to the number of functional groups in epoxy resin (the number of functional groups in curing agent / functionality in epoxy resin)
- the radix is not particularly limited. It is preferable to set in the range of 0.5 to 2.0, and more preferable to be set in the range of 0.6 to 1.3, from the viewpoint of reducing the amount of each unreacted component. It is more preferable to set in the range of 0.8 to 1.2 from the viewpoint of moldability and reflow resistance.
- filler is not particularly limited. Specifically, silica, glass, alumina, calcium carbonate, zirconium silicate, calcium silicate, silicon nitride, aluminum nitride, boron nitride, beryllia, zirconia, zircon, forsterite, steatite, spinel, mullite, titania, talc And inorganic materials such as clay and mica.
- a filler having a flame retardant effect may be used. Examples of the filler having a flame retardant effect include composite metal hydroxides such as aluminum hydroxide, magnesium hydroxide, a composite hydroxide of magnesium and zinc, zinc borate and the like.
- silica is preferable from the viewpoint of reducing the thermal expansion coefficient
- alumina is preferable from the viewpoint of improving the thermal conductivity.
- the fillers may be used alone or in combination of two or more.
- the content of the filler contained in the sealing resin composition is not particularly limited. From the viewpoint of achieving both good flowability and curing containing a filler, the content of the filler is preferably 30% by mass to 90% by mass of the entire resin composition for sealing, and 50% by mass or more More preferably, it is 75% by mass.
- the volume average particle diameter is preferably 0.2 ⁇ m to 20 ⁇ m, and more preferably 0.5 ⁇ m to 15 ⁇ m.
- the volume average particle diameter is 0.2 ⁇ m or more, the increase in the viscosity of the sealing resin composition tends to be further suppressed.
- the volume average particle size is 20 ⁇ m or less, the filling property in the narrow gap tends to be further improved.
- the volume average particle size of the filler should be measured as the particle size (D50) at which the volume accumulation from the small diameter side becomes 50% in the volume-based particle size distribution obtained by the laser scattering diffraction particle size distribution measuring apparatus. it can.
- the sealing resin composition may contain, in addition to the components described above, various additives such as a curing accelerator, a stress relaxation agent, a coupling agent, a mold release agent, and a colorant.
- various additives such as a curing accelerator, a stress relaxation agent, a coupling agent, a mold release agent, and a colorant.
- the sealing resin composition may contain various additives well known in the art, as needed, in addition to the additives exemplified below.
- the sealing resin composition may contain a curing accelerator.
- the type of the curing accelerator is not particularly limited, and can be selected according to the types of the epoxy resin and the curing agent, the desired characteristics of the sealing resin composition, and the like.
- the amount is preferably 0.1 parts by mass to 30 parts by mass with respect to 100 parts by mass of the curable resin component (total of epoxy resin and curing agent) And 1 part by mass to 15 parts by mass.
- the sealing resin composition may contain a stress relaxation agent.
- the stress relaxation agent include particles of thermoplastic elastomer, NR (natural rubber), NBR (acrylonitrile-butadiene rubber), acrylic rubber, urethane rubber, silicone rubber and the like.
- the stress relaxation agents may be used alone or in combination of two or more.
- the sealing resin composition contains a stress relaxation agent
- the amount thereof is preferably 0.1 part by mass to 30 parts by mass with respect to 100 parts by mass of the curable resin component (total of epoxy resin and curing agent). And 1 part by mass to 15 parts by mass.
- the sealing resin composition may contain a coupling agent.
- the coupling agent include epoxysilane, mercaptosilane, aminosilane, alkylsilane, ureidosilane, silane compounds such as vinylsilane, titanium compounds, aluminum chelate compounds, aluminum / zirconium compounds, and the like. Among them, silane compounds are preferable from the viewpoint of fluidity.
- the coupling agents may be used alone or in combination of two or more.
- the amount of the coupling agent is preferably 0.05 parts by mass to 5 parts by mass with respect to 100 parts by mass of the filler. More preferably, it is 2.5 parts by mass.
- the sealing resin composition may contain a colorant.
- the colorant include carbon black, organic dyes, organic pigments, titanium oxide, red lead, and bengara.
- the colorants may be used alone or in combination of two or more.
- the amount is preferably 0.01 parts by mass to 10 parts by mass with respect to 100 parts by mass of the curable resin component (total of epoxy resin and curing agent), The amount is more preferably 0.1 parts by mass to 5 parts by mass.
- the sealing resin composition can be used in various mounting techniques.
- it can be suitably used as an underfill material used for flip chip mounting technology.
- it can be used suitably for the application which fills up the crevice between the semiconductor device joined by bump etc., and a support body.
- the type of semiconductor device and support is not particularly limited, and can be selected from those commonly used in the field of semiconductor packages.
- the method for filling the gap between the semiconductor element and the support using the sealing resin composition is not particularly limited. For example, it can carry out by a well-known method using a dispenser etc.
- the semiconductor package of the present embodiment has a support, a semiconductor element disposed on the support, and a cured product of the above-described sealing resin composition sealing the semiconductor element.
- the types of the semiconductor element and the support are not particularly limited, and can be selected from those generally used in the field of the semiconductor package.
- the semiconductor package has a low coefficient of thermal expansion of the cured product of the sealing resin composition and a low modulus of elasticity. For this reason, when stress arises between the hardened
- the method for manufacturing a semiconductor package according to the present embodiment includes the steps of: filling a space between a support and a semiconductor element disposed on the support with the sealing resin composition described above; and the sealing resin Curing the composition.
- the types of the semiconductor element and the support are not particularly limited, and can be selected from those generally used in the field of semiconductor packages.
- the method for filling the gap between the semiconductor element and the support using the sealing resin composition and the method for curing the sealing resin composition after filling are not particularly limited, and can be performed by a known method. .
- Epoxy resin 1 Liquid bisphenol F type epoxy resin, trade name "YDF-8170C", Nippon Steel Sumikin Chemical Co., Ltd. Epoxy resin 2. Triglycidyl-p-aminophenol, trade name "jER 630", Mitsubishi Chemical Corporation epoxy resin 3 ... 1,6-Bis (glycidyloxy) naphthalene, trade name "Epiclon HP-4032D", DIC Corporation
- Hardener 1 2-Methylaniline, trade name “jER Cure W”, Mitsubishi Chemical Co., Ltd.
- Hardener 2 ... 4,4'-diaminodiphenylmethane, trade name "Kayahard AA”, Nippon Kayaku Co., Ltd.
- the viscosity (Pa ⁇ s) at 25 ° C. of the resin composition for sealing is an E-type viscometer (VISCONIC EHD type (trade name) manufactured by Tokyo Keiki Co., Ltd.) (cone angle 3 °, rotation number: 10 revolutions / minute) ) was used. The results are shown in Table 1.
- the viscosity (Pa ⁇ s) at 110 ° C. of the resin composition for sealing was measured using AR 2000 (TA Instruments) under the conditions of 40 mm parallel plate, shear rate 32.5 (1 / s). The results are shown in Table 1.
- the cured resin composition for sealing was cut into a size of 8 mm in diameter and 20 mm in length using a thermomechanical analyzer (TMA 2940, TA Instruments Co., Ltd.) and compressed from 0 ° C. to 300 ° C. 5 The temperature rise was measured at ° C./min, and the slope of the tangent at 10 ° C. to 30 ° C. was taken as the thermal expansion coefficient (ppm / ° C.). The results are shown in Table 1.
- the embodiment contains a bisphenol-type epoxy resin as an epoxy resin and a specific naphthalene-type epoxy resin, and the proportion of the specific naphthalene-type epoxy resin in the entire epoxy resin is 10 mass% to 30 mass%.
- the resin composition for sealing of the example was excellent in the injectability, and both of the thermal expansion coefficient and the elastic modulus were lower than the resin composition for sealing of the comparative example not satisfying the conditions. From this, it was suggested that even if stress is generated between the cured product of the sealing resin composition and the support, the effect of reducing or alleviating the stress is excellent.
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Epoxy Resins (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
Description
<1>エポキシ樹脂と、硬化剤と、充填材とを含み、前記エポキシ樹脂がビスフェノール型エポキシ樹脂と、1,6-ビス(グリシジルオキシ)ナフタレンとを含み、前記1,6-ビス(グリシジルオキシ)ナフタレンの前記エポキシ樹脂全体に占める割合が10質量%~30質量%である、封止用樹脂組成物。
本開示において「~」を用いて示された数値範囲には、「~」の前後に記載される数値がそれぞれ最小値及び最大値として含まれる。
本開示中に段階的に記載されている数値範囲において、一つの数値範囲で記載された上限値又は下限値は、他の段階的な記載の数値範囲の上限値又は下限値に置き換えてもよい。また、本開示中に記載されている数値範囲において、その数値範囲の上限値又は下限値は、実施例に示されている値に置き換えてもよい。
本開示において各成分は該当する物質を複数種含んでいてもよい。組成物中に各成分に該当する物質が複数種存在する場合、各成分の含有率又は含有量は、特に断らない限り、組成物中に存在する当該複数種の物質の合計の含有率又は含有量を意味する。
本開示において各成分に該当する粒子は複数種含んでいてもよい。組成物中に各成分に該当する粒子が複数種存在する場合、各成分の粒子径は、特に断らない限り、組成物中に存在する当該複数種の粒子の混合物についての値を意味する。
本実施形態の封止用樹脂組成物は、エポキシ樹脂と、硬化剤と、充填材とを含み、前記エポキシ樹脂がビスフェノール型エポキシ樹脂と、1,6-ビス(グリシジルオキシ)ナフタレン(下記式(1)で表されるエポキシ樹脂;以下、特定ナフタレン型エポキシ樹脂ともいう)とを含み、特定ナフタレン型エポキシ樹脂のエポキシ樹脂全体に占める割合が10質量%~30質量%である。
特定ナフタレン型エポキシ樹脂は、常温(25℃)で液状のエポキシ樹脂であり、市販品としても入手可能である。市販品としては、例えば、DIC株式会社の商品名「エピクロン HP-4032D」が挙げられる。
特定ナフタレン型エポキシ樹脂及びビスフェノール型エポキシ樹脂以外のエポキシ樹脂の種類は特に制限されず、封止用樹脂組成物の所望の特性等に応じて選択できる。具体的には、フェノール、クレゾール、キシレノール、レゾルシン、カテコール等のフェノール化合物及びα-ナフトール、β-ナフトール、ジヒドロキシナフタレン等のナフトール化合物からなる群より選ばれる少なくとも1種のフェノール性化合物と、ホルムアルデヒド、アセトアルデヒド、プロピオンアルデヒド等の脂肪族アルデヒド化合物とを酸性触媒下で縮合又は共縮合させて得られるノボラック樹脂をエポキシ化したものであるノボラック型エポキシ樹脂(フェノールノボラック型エポキシ樹脂、オルソクレゾールノボラック型エポキシ樹脂等);上記フェノール性化合物と、ベンズアルデヒド、サリチルアルデヒド等の芳香族アルデヒド化合物とを酸性触媒下で縮合又は共縮合させて得られるトリフェニルメタン型フェノール樹脂をエポキシ化したものであるトリフェニルメタン型エポキシ樹脂;上記フェノール化合物及びナフトール化合物と、アルデヒド化合物とを酸性触媒下で共縮合させて得られるノボラック樹脂をエポキシ化したものである共重合型エポキシ樹脂;アルキル置換又は非置換のビフェノールのジグリシジルエーテルであるビフェニル型エポキシ樹脂;スチルベン系フェノール化合物のジグリシジルエーテルであるスチルベン型エポキシ樹脂;ビスフェノールS等のジグリシジルエーテルである硫黄原子含有エポキシ樹脂;ブタンジオール、ポリエチレングリコール、ポリプロピレングリコール等のアルコール類のグリシジルエーテルであるエポキシ樹脂;フタル酸、イソフタル酸、テトラヒドロフタル酸等の多価カルボン酸化合物のグリシジルエステルであるグリシジルエステル型エポキシ樹脂;アニリン、ジアミノジフェニルメタン、イソシアヌル酸等の窒素原子に結合した活性水素をグリシジル基で置換したものであるグリシジルアミン型エポキシ樹脂;ジシクロペンタジエンとフェノール化合物の共縮合樹脂をエポキシ化したものであるジシクロペンタジエン型エポキシ樹脂;分子内のオレフィン結合をエポキシ化したものであるビニルシクロヘキセンジエポキシド、3,4-エポキシシクロヘキシルメチル-3,4-エポキシシクロヘキサンカルボキシレート、2-(3,4-エポキシ)シクロヘキシル-5,5-スピロ(3,4-エポキシ)シクロヘキサン-m-ジオキサン等の脂環型エポキシ樹脂;パラキシリレン変性フェノール樹脂のグリシジルエーテルであるパラキシリレン変性エポキシ樹脂;メタキシリレン変性フェノール樹脂のグリシジルエーテルであるメタキシリレン変性エポキシ樹脂;テルペン変性フェノール樹脂のグリシジルエーテルであるテルペン変性エポキシ樹脂;ジシクロペンタジエン変性フェノール樹脂のグリシジルエーテルであるジシクロペンタジエン変性エポキシ樹脂;シクロペンタジエン変性フェノール樹脂のグリシジルエーテルであるシクロペンタジエン変性エポキシ樹脂;多環芳香環変性フェノール樹脂のグリシジルエーテルである多環芳香環変性エポキシ樹脂;ナフタレン環含有フェノール樹脂のグリシジルエーテルであるナフタレン型エポキシ樹脂;ハロゲン化フェノールノボラック型エポキシ樹脂;ハイドロキノン型エポキシ樹脂;トリメチロールプロパン型エポキシ樹脂;オレフィン結合を過酢酸等の過酸で酸化して得られる線状脂肪族エポキシ樹脂;フェノールアラルキル樹脂、ナフトールアラルキル樹脂等のアラルキル型フェノール樹脂をエポキシ化したものであるアラルキル型エポキシ樹脂;などが挙げられる。これらのエポキシ樹脂は、1種を単独で用いても2種以上を組み合わせて用いてもよい。
硬化剤の種類は特に制限されず、封止用樹脂組成物の所望の特性等に応じて選択できる。例えば、アミン硬化剤、フェノール硬化剤、酸無水物硬化剤、ポリメルカプタン硬化剤、ポリアミノアミド硬化剤、イソシアネート硬化剤、ブロックイソシアネート硬化剤等が挙げられる。硬化剤は、1種を単独で用いても2種以上を組み合わせて用いてもよい。
充填材の種類は、特に制限されない。具体的には、シリカ、ガラス、アルミナ、炭酸カルシウム、ケイ酸ジルコニウム、ケイ酸カルシウム、窒化珪素、窒化アルミ、窒化ホウ素、ベリリア、ジルコニア、ジルコン、フォステライト、ステアタイト、スピネル、ムライト、チタニア、タルク、クレー、マイカ等の無機材料が挙げられる。難燃効果を有する充填材を用いてもよい。難燃効果を有する充填材としては、水酸化アルミニウム、水酸化マグネシウム、マグネシウムと亜鉛の複合水酸化物等の複合金属水酸化物、硼酸亜鉛などが挙げられる。
封止用樹脂組成物は、上述の成分に加えて、硬化促進剤、応力緩和剤、カップリング剤、離型剤、着色剤等の各種添加剤を含んでもよい。封止用樹脂組成物は、以下に例示する添加剤以外にも必要に応じて当技術分野で周知の各種添加剤を含んでもよい。
封止用樹脂組成物は、硬化促進剤を含んでもよい。硬化促進剤の種類は特に制限されず、エポキシ樹脂及び硬化剤の種類、封止用樹脂組成物の所望の特性等に応じて選択できる。
封止用樹脂組成物は、応力緩和剤を含んでもよい。応力緩和剤としては、熱可塑性エラストマー、NR(天然ゴム)、NBR(アクリロニトリル-ブタジエンゴム)、アクリルゴム、ウレタンゴム、シリコーンゴム等の粒子などが挙げられる。応力緩和材剤は、1種を単独で用いても2種以上を組み合わせて用いてもよい。
封止用樹脂組成物は、カップリング剤を含んでもよい。カップリング剤としては、エポキシシラン、メルカプトシラン、アミノシラン、アルキルシラン、ウレイドシラン、ビニルシラン等のシラン化合物、チタン化合物、アルミニウムキレート化合物、アルミニウム/ジルコニウム化合物などが挙げられる。中でも流動性の観点からは、シラン化合物が好ましい。カップリング剤は、1種を単独で用いても2種以上を組み合わせて用いてもよい。
封止用樹脂組成物は、着色剤を含んでもよい。着色剤としては、カーボンブラック、有機染料、有機顔料、酸化チタン、鉛丹、ベンガラ等が挙げられる。着色剤は、1種を単独で用いても2種以上を組み合わせて用いてもよい。
封止用樹脂組成物は、種々の実装技術に用いることができる。特に、フリップチップ型実装技術に用いるアンダーフィル材として好適に用いることができる。例えば、バンプ等で接合された半導体素子と支持体の間の隙間を充填する用途に好適に用いることができる。
本実施形態の半導体パッケージは、支持体と、前記支持体上に配置された半導体素子と、前記半導体素子を封止している上述した封止用樹脂組成物の硬化物と、を有する。
本実施形態の半導体パッケージの製造方法は、支持体と、前記支持体上に配置された半導体素子との間の空隙を上述した封止用樹脂組成物で充填する工程と、前記封止用樹脂組成物を硬化する工程と、を有する。
表1に示す成分を表1に示す量にて混合し、封止用樹脂組成物を調製した。各成分の詳細は下記のとおりである。表1中の「eq」は硬化剤の当量基準の割合(硬化剤1と硬化剤2の合計は1である)を示す。充填材の「質量%」は封止用樹脂組成物全体に対する割合を示す。
エポキシ樹脂2…トリグリシジル-p-アミノフェノール、商品名「jER 630」、三菱ケミカル株式会社
エポキシ樹脂3…1,6-ビス(グリシジルオキシ)ナフタレン、商品名「エピクロン HP-4032D」、DIC株式会社
硬化剤2…4,4’-ジアミノジフェニルメタン、商品名「カヤハードAA」、日本化薬株式会社
カップリング剤…3-グリシドキシプロピルトリメトキシシラン、商品名「KBM-403」、信越化学工業株式会社
封止用樹脂組成物の25℃における粘度(Pa・s)は、E型粘度計(東京計器株式会社製、VISCONIC EHD型(商品名))(コーン角度3°、回転数:10回転/分)を用いて測定した。結果を表1に示す。
封止用樹脂組成物の110℃における粘度(Pa・s)は、AR2000(TAインスツルメント社)を用い、40mmパラレルプレート、せん断速度32.5(1/s)の条件で測定した。結果を表1に示す。
ガラス基板上に、25μmの間隙を設けて、半導体素子の代わりにガラス板(20mm×20mm)を固定した試験片を作製した。次に、この試験片を110℃に設定したホットプレート上に置き、ガラス板の一端側に封止用樹脂組成物を塗布し、間隙が封止用樹脂組成物で満たされるまでの時間(秒/sec)を測定した。結果を表1に示す。
封止用樹脂組成物を硬化して得られた硬化物の熱膨張率(ppm/℃)、弾性率(GPa)、ガラス転移温度(℃)をそれぞれ下記の方法で測定した。結果を表1に示す。
熱機械分析装置(TMA2940、TAインスツルメント社)を用いて、硬化させた封止用樹脂組成物を、直径8mm、長さ20mmのサイズに切り出し、圧縮法にて0℃から300℃まで5℃/minで昇温測定し、10℃~30℃における接線の傾きを熱膨張率(ppm/℃)とした。結果を表1に示す。
粘弾性測定装置(RSA III、TAインスツルメント社)を用いて、硬化させた封止用樹脂組成物を50mm×10mm×3mmのサイズに切り出し、スパン間距離40mm、周波数1Hzの条件下、3点曲げ法にて20℃から300℃まで5℃/minで昇温し、25℃における貯蔵弾性率(GPa)の値を測定した。結果を表1に示す。
上記熱膨張率と同じ装置、条件で測定を行い、50℃と150℃における接線の交点に対応する温度をガラス転移温度(℃)とした。結果を表1に示す。
本明細書に記載された全ての文献、特許出願、及び技術規格は、個々の文献、特許出願、及び技術規格が参照により取り込まれることが具体的かつ個々に記された場合と同程度に、本明細書中に援用されて取り込まれる。
Claims (8)
- エポキシ樹脂と、硬化剤と、充填材とを含み、前記エポキシ樹脂がビスフェノール型エポキシ樹脂と、1,6-ビス(グリシジルオキシ)ナフタレンとを含み、前記1,6-ビス(グリシジルオキシ)ナフタレンの前記エポキシ樹脂全体に占める割合が10質量%~30質量%である、封止用樹脂組成物。
- 前記ビスフェノール型エポキシ樹脂がビスフェノールF型エポキシ樹脂を含む、請求項1に記載の封止用樹脂組成物。
- 前記ビスフェノール型エポキシ樹脂の前記エポキシ樹脂全体に占める割合が20質量%以上90質量%未満である、請求項1又は請求項2に記載の封止用樹脂組成物。
- 前記エポキシ樹脂がグリシジルアミン型エポキシ樹脂をさらに含む、請求項1~請求項3のいずれか1項に記載の封止用樹脂組成物。
- 前記グリシジルアミン型エポキシ樹脂が3官能以上のグリシジルアミン型エポキシ樹脂を含む、請求項4に記載の封止用樹脂組成物。
- 前記グリシジルアミン型エポキシ樹脂の前記エポキシ樹脂全体に占める割合が10質量%~60質量%である、請求項4又は請求項5のいずれか1項に記載の封止用樹脂組成物。
- 支持体と、前記支持体上に配置されている半導体素子と、前記半導体素子を封止している請求項1~請求項6のいずれか1項に記載の封止用樹脂組成物の硬化物と、を有する半導体パッケージ。
- 支持体と、前記支持体上に配置されている半導体素子との間の空隙を請求項1~請求項6のいずれか1項に記載の封止用樹脂組成物で充填する工程と、前記封止用樹脂組成物を硬化する工程と、を有する半導体パッケージの製造方法。
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019527079A JP7231833B2 (ja) | 2017-06-29 | 2018-06-29 | 封止用樹脂組成物、半導体パッケージ及び半導体パッケージの製造方法 |
| CN201880037837.XA CN110709443A (zh) | 2017-06-29 | 2018-06-29 | 密封用树脂组合物、半导体封装体及半导体封装体的制造方法 |
| KR1020197038727A KR102795674B1 (ko) | 2017-06-29 | 2018-06-29 | 밀봉용 수지 조성물, 반도체 패키지 및 반도체 패키지의 제조 방법 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017-127851 | 2017-06-29 | ||
| JP2017127851 | 2017-06-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2019004457A1 true WO2019004457A1 (ja) | 2019-01-03 |
Family
ID=64741610
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2018/024934 Ceased WO2019004457A1 (ja) | 2017-06-29 | 2018-06-29 | 封止用樹脂組成物、半導体パッケージ及び半導体パッケージの製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP7231833B2 (ja) |
| KR (1) | KR102795674B1 (ja) |
| CN (1) | CN110709443A (ja) |
| TW (2) | TWI787295B (ja) |
| WO (1) | WO2019004457A1 (ja) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117736550A (zh) * | 2022-09-15 | 2024-03-22 | 华为技术有限公司 | 树脂组合物及其制备方法和应用 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08240809A (ja) * | 1995-03-02 | 1996-09-17 | Sumitomo Bakelite Co Ltd | 液晶表示素子用シール材組成物及びそれを用いた液晶表示素子 |
| JPH1129624A (ja) * | 1997-07-09 | 1999-02-02 | Toshiba Corp | 半導体封止用液状エポキシ樹脂組成物 |
| WO2011039879A1 (ja) * | 2009-10-01 | 2011-04-07 | 株式会社Ihiエアロスペース | 繊維強化プラスチック用のマトリックス樹脂組成物及び繊維強化プラスチック構造体 |
| JP2011225773A (ja) * | 2010-04-22 | 2011-11-10 | Sekisui Chem Co Ltd | 光硬化性樹脂組成物、有機el素子用封止剤及び有機el素子 |
| JP2013082782A (ja) * | 2011-10-06 | 2013-05-09 | Hitachi Chemical Co Ltd | 液状エポキシ樹脂組成物の選択方法及び製造方法、並びに電子部品装置及びその製造方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002194053A (ja) * | 2000-12-22 | 2002-07-10 | Shin Etsu Chem Co Ltd | 半導体スクリーン印刷封止用液状エポキシ樹脂組成物 |
| JP2006299247A (ja) * | 2005-03-25 | 2006-11-02 | Shin Etsu Chem Co Ltd | 液状エポキシ樹脂組成物及び半導体装置 |
| JP5210011B2 (ja) * | 2008-03-18 | 2013-06-12 | 積水化学工業株式会社 | 電子部品用接着剤 |
| JP2011057617A (ja) * | 2009-09-10 | 2011-03-24 | Nissan Chem Ind Ltd | ジカルボン酸化合物及びそれを含有した熱硬化性樹脂組成物 |
| JP2013028659A (ja) * | 2011-07-26 | 2013-02-07 | Hitachi Chemical Co Ltd | アンダーフィル用エポキシ樹脂液状封止材及びこれを用いた電子部品装置 |
| JP2013163747A (ja) * | 2012-02-10 | 2013-08-22 | Sumitomo Bakelite Co Ltd | 半導体封止用液状樹脂組成物及び半導体装置 |
| JP6969729B2 (ja) | 2014-12-12 | 2021-11-24 | ナミックス株式会社 | 液状エポキシ樹脂組成物、半導体封止剤、半導体装置、および液状エポキシ樹脂組成物の製造方法 |
| WO2017022721A1 (ja) * | 2015-08-03 | 2017-02-09 | 日立化成株式会社 | エポキシ樹脂組成物、フィルム状エポキシ樹脂組成物及び電子装置 |
-
2018
- 2018-06-29 TW TW107122574A patent/TWI787295B/zh active
- 2018-06-29 CN CN201880037837.XA patent/CN110709443A/zh active Pending
- 2018-06-29 KR KR1020197038727A patent/KR102795674B1/ko active Active
- 2018-06-29 JP JP2019527079A patent/JP7231833B2/ja active Active
- 2018-06-29 TW TW111145423A patent/TWI839971B/zh active
- 2018-06-29 WO PCT/JP2018/024934 patent/WO2019004457A1/ja not_active Ceased
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08240809A (ja) * | 1995-03-02 | 1996-09-17 | Sumitomo Bakelite Co Ltd | 液晶表示素子用シール材組成物及びそれを用いた液晶表示素子 |
| JPH1129624A (ja) * | 1997-07-09 | 1999-02-02 | Toshiba Corp | 半導体封止用液状エポキシ樹脂組成物 |
| WO2011039879A1 (ja) * | 2009-10-01 | 2011-04-07 | 株式会社Ihiエアロスペース | 繊維強化プラスチック用のマトリックス樹脂組成物及び繊維強化プラスチック構造体 |
| JP2011225773A (ja) * | 2010-04-22 | 2011-11-10 | Sekisui Chem Co Ltd | 光硬化性樹脂組成物、有機el素子用封止剤及び有機el素子 |
| JP2013082782A (ja) * | 2011-10-06 | 2013-05-09 | Hitachi Chemical Co Ltd | 液状エポキシ樹脂組成物の選択方法及び製造方法、並びに電子部品装置及びその製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102795674B1 (ko) | 2025-04-11 |
| TW202313756A (zh) | 2023-04-01 |
| TWI787295B (zh) | 2022-12-21 |
| JP7231833B2 (ja) | 2023-03-02 |
| KR20200023312A (ko) | 2020-03-04 |
| TWI839971B (zh) | 2024-04-21 |
| CN110709443A (zh) | 2020-01-17 |
| TW201905025A (zh) | 2019-02-01 |
| JPWO2019004457A1 (ja) | 2020-05-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5574237B2 (ja) | 電子部品封止用エポキシ樹脂組成物 | |
| KR102628332B1 (ko) | 경화성 수지 조성물, 전자 부품 장치 및 전자 부품 장치의 제조 방법 | |
| JPWO2019004458A1 (ja) | 封止用樹脂組成物、再配置ウエハ、半導体パッケージ及び半導体パッケージの製造方法 | |
| JP7760256B2 (ja) | アンダーフィル材、半導体パッケージ及び半導体パッケージの製造方法 | |
| WO2018181600A1 (ja) | 封止用エポキシ樹脂組成物及び電子部品装置 | |
| JP2019083225A (ja) | アンダーフィル用液状樹脂組成物、電子部品装置、及び電子部品装置の製造方法 | |
| CN116583548A (zh) | 成形用树脂组合物及电子零件装置 | |
| JP2018172545A (ja) | 圧縮成形用固形封止材、半導体装置の製造方法及び半導体装置 | |
| JPWO2011114935A1 (ja) | エポキシ樹脂組成物及び硬化物 | |
| JP7231833B2 (ja) | 封止用樹脂組成物、半導体パッケージ及び半導体パッケージの製造方法 | |
| KR20190092589A (ko) | 수지 조성물 및 전자 부품 장치 | |
| JP2022103215A (ja) | アンダーフィル材、半導体パッケージ及び半導体パッケージの製造方法 | |
| JP2017028050A (ja) | アンダーフィル材及びそれを用いた電子部品装置 | |
| JP2007092002A (ja) | エポキシ樹脂組成物及びそれを用いた半導体装置用中空パッケージ、並び半導体部品装置 | |
| JP2019065224A (ja) | 硬化性樹脂組成物、電子部品装置及び電子部品装置の製造方法 | |
| WO2019142646A1 (ja) | 硬化性樹脂組成物、半導体装置、及び半導体装置の製造方法 | |
| CN113891913A (zh) | 密封用树脂组合物和电子部件装置 | |
| JP2001316566A (ja) | 一液性エポキシ樹脂組成物およびそれを用いた半導体封止用エポキシ樹脂組成物 | |
| JPWO2018181603A1 (ja) | 液状エポキシ樹脂組成物、半導体装置及び半導体装置の製造方法 | |
| WO2019035430A1 (ja) | 封止用樹脂組成物、半導体装置及び半導体装置の製造方法 | |
| JP6519600B2 (ja) | 封止用エポキシ樹脂成形材料及び電子部品装置 | |
| JP2019065225A (ja) | 硬化性樹脂組成物、電子部品装置及び電子部品装置の製造方法 | |
| JP2019065226A (ja) | 硬化性樹脂組成物、電子部品装置及び電子部品装置の製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 18824447 Country of ref document: EP Kind code of ref document: A1 |
|
| ENP | Entry into the national phase |
Ref document number: 2019527079 Country of ref document: JP Kind code of ref document: A |
|
| ENP | Entry into the national phase |
Ref document number: 20197038727 Country of ref document: KR Kind code of ref document: A |
|
| NENP | Non-entry into the national phase |
Ref country code: DE |
|
| 122 | Ep: pct application non-entry in european phase |
Ref document number: 18824447 Country of ref document: EP Kind code of ref document: A1 |