WO2012053549A1 - Cu-In-Ga-Se太陽電池用ガラス基板およびそれを用いた太陽電池 - Google Patents
Cu-In-Ga-Se太陽電池用ガラス基板およびそれを用いた太陽電池 Download PDFInfo
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- WO2012053549A1 WO2012053549A1 PCT/JP2011/074049 JP2011074049W WO2012053549A1 WO 2012053549 A1 WO2012053549 A1 WO 2012053549A1 JP 2011074049 W JP2011074049 W JP 2011074049W WO 2012053549 A1 WO2012053549 A1 WO 2012053549A1
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/076—Glass compositions containing silica with 40% to 90% silica, by weight
- C03C3/083—Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound
- C03C3/085—Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound containing an oxide of a divalent metal
- C03C3/087—Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound containing an oxide of a divalent metal containing calcium oxide, e.g. common sheet or container glass
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/076—Glass compositions containing silica with 40% to 90% silica, by weight
- C03C3/089—Glass compositions containing silica with 40% to 90% silica, by weight containing boron
- C03C3/091—Glass compositions containing silica with 40% to 90% silica, by weight containing boron containing aluminium
- C03C3/093—Glass compositions containing silica with 40% to 90% silica, by weight containing boron containing aluminium containing zinc or zirconium
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/16—Photovoltaic cells having only PN heterojunction potential barriers
- H10F10/167—Photovoltaic cells having only PN heterojunction potential barriers comprising Group I-III-VI materials, e.g. CdS/CuInSe2 [CIS] heterojunction photovoltaic cells
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F19/00—Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules
- H10F19/30—Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules comprising thin-film photovoltaic cells
- H10F19/31—Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules comprising thin-film photovoltaic cells having multiple laterally adjacent thin-film photovoltaic cells deposited on the same substrate
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F19/00—Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules
- H10F19/80—Encapsulations or containers for integrated devices, or assemblies of multiple devices, having photovoltaic cells
- H10F19/807—Double-glass encapsulation, e.g. photovoltaic cells arranged between front and rear glass sheets
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
- H10F77/169—Thin semiconductor films on metallic or insulating substrates
- H10F77/1694—Thin semiconductor films on metallic or insulating substrates the films including Group I-III-VI materials, e.g. CIS or CIGS
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/206—Electrodes for devices having potential barriers
- H10F77/211—Electrodes for devices having potential barriers for photovoltaic cells
- H10F77/215—Geometries of grid contacts
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
Definitions
- the present invention relates to a glass substrate for a solar cell in which a photoelectric conversion layer is formed between glass substrates and a solar cell using the same. More specifically, a glass substrate and a cover glass are typically provided, and a photoelectric conversion layer mainly composed of a group 11, group 13 or group 16 element is formed between the glass substrate and the cover glass.
- the present invention relates to a glass substrate for a Cu—In—Ga—Se solar cell and a solar cell using the same.
- Group 11-13, 11-16 compound semiconductors having a chalcopyrite crystal structure and cubic or hexagonal 12-16 group compound semiconductors have a large absorption coefficient for light in the visible to near-infrared wavelength range. have. Therefore, it is expected as a material for high-efficiency thin film solar cells.
- Typical examples include Cu (In, Ga) Se 2 (hereinafter referred to as “CIGS” or “Cu—In—Ga—Se”) and CdTe.
- soda lime glass is used as a substrate because of its low cost and an average coefficient of thermal expansion similar to that of CIGS compound semiconductors, and solar cells are obtained. Moreover, in order to obtain an efficient solar cell, the glass material which can endure high heat processing temperature is also proposed (refer patent document 1 and 2).
- a CIGS photoelectric conversion layer (hereinafter also referred to as “CIGS layer”) is formed on the glass substrate.
- CIGS layer A CIGS photoelectric conversion layer (hereinafter also referred to as “CIGS layer”) is formed on the glass substrate.
- CIGS layer A CIGS photoelectric conversion layer (hereinafter also referred to as “CIGS layer”) is formed on the glass substrate.
- Patent Documents 1 and 2 heat treatment at a higher temperature is preferable to produce a solar cell with good power generation efficiency, and the glass substrate is required to withstand it.
- Patent Document 1 proposes a glass composition having a relatively high annealing point, but the invention described in Patent Document 1 does not necessarily have high power generation efficiency.
- the method of Patent Document 2 is intended to efficiently diffuse a low-concentration alkali element contained in the high strain point glass into the p-type light absorption layer by providing an alkali control layer. This increases the number of steps for forming the layer, and the cost is increased, and the alkali control layer causes
- the present inventors have found that the power generation efficiency can be increased by increasing the alkali of the glass substrate within a predetermined range, but there is a problem that the increase in the alkali causes a decrease in the glass transition temperature (Tg). .
- the glass substrate is required to have a predetermined average thermal expansion coefficient.
- the present invention provides a Cu—In—Ga—Se solar having a good balance of high power generation efficiency, high glass transition temperature, predetermined average coefficient of thermal expansion, high glass strength, low glass density, and devitrification prevention properties during sheet glass forming. It aims at providing the glass substrate for batteries.
- the present invention provides the following glass substrate for a Cu—In—Ga—Se solar cell and a solar cell.
- T 4 viscosity
- Cu In—Ga—Se having a relationship with a temperature of penetration (T L ) of T 4 ⁇ T L ⁇ ⁇ 30 ° C., a density of 2.6 g / cm 3 or less, and a brittleness index value of less than 7000 m ⁇ 1/2.
- -Glass substrate for In-Ga-Se solar cell (3) a glass substrate, a cover glass, and a Cu—In—Ga—Se photoelectric conversion layer disposed between the glass substrate and the cover glass, A solar cell, wherein at least the glass substrate of the glass substrate and the cover glass is a glass substrate for a Cu—In—Ga—Se solar cell according to (1) or (2).
- the glass substrate for a Cu—In—Ga—Se solar cell of the present invention has high power generation efficiency, high glass transition temperature, predetermined average thermal expansion coefficient, high glass strength, low glass density, and prevention of devitrification when forming sheet glass. It can have a good balance of properties.
- a solar cell with high power generation efficiency can be provided.
- FIG. 1 is sectional drawing which represents typically an example of embodiment of the solar cell using the glass substrate for CIGS solar cells of this invention.
- FIG. 2 shows a solar cell (a) produced on a glass substrate for evaluation in the example and a cross-sectional view (b) thereof.
- FIG. 3 shows an evaluation CIGS solar cell on an evaluation glass substrate in which eight solar cells shown in FIG. 2 are arranged.
- FIG. 4 is a graph showing the relationship between (Na 2 O + K 2 O) / Al 2 O 3 ⁇ (Na 2 O / K 2 O) and power generation efficiency.
- the glass substrate for a Cu—In—Ga—Se solar cell of the present invention is expressed in terms of a mole percentage based on the following oxides: 55 to 70% of SiO 2 6.5 to 12.6% Al 2 O 3 0 to 1% B 2 O 3 3-10% MgO, 0 to 4.8% of CaO, 0-2% SrO, BaO 0-2%, ZrO 2 from 0 to 2.5%, TiO 2 0-2.5%, Na 2 O 5.3-10.9%, Containing 0 to 10% of K 2 O, MgO + CaO + SrO + BaO is 7.7 to 17%, Na 2 O + K 2 O is 10.4 to 16%, MgO / Al 2 O 3 is 0.9 or less, (2Na 2 O + K 2 O + SrO + BaO) / (A
- T 4 viscosity
- Cu—In—Ga— which has a relationship with a temperature of penetration (T L ) of T 4 ⁇ T L ⁇ ⁇ 30 ° C., a density of 2.6 g / cm 3 or less, and a brittleness index value of less than 7000 m ⁇ 1/2. It is a glass substrate for Se solar cells.
- the glass transition temperature (Tg) of the glass substrate for CIGS solar cell of the present invention is 650 to 750 ° C.
- the glass transition temperature of the glass substrate for CIGS solar cell of the present invention is higher than the glass transition temperature of soda lime glass.
- the glass transition point temperature (Tg) of the glass substrate for CIGS solar cell of the present invention is preferably 650 ° C. or higher in order to ensure the formation of the photoelectric conversion layer at a high temperature, so as not to increase the viscosity at the time of melting. Therefore, the temperature is preferably 750 ° C. or lower. More preferably, it is 700 degrees C or less, More preferably, it is 680 degrees C or less.
- the average thermal expansion coefficient at 50 to 350 ° C. of the glass substrate for CIGS solar cell of the present invention is 75 ⁇ 10 ⁇ 7 to 95 ⁇ 10 ⁇ 7 / ° C. If it is less than 75 ⁇ 10 ⁇ 7 / ° C. or more than 95 ⁇ 10 ⁇ 7 / ° C., the difference in thermal expansion from the CIGS layer becomes too large, and defects such as peeling tend to occur. It is preferably 90 ⁇ 10 ⁇ 7 / ° C. or less, more preferably 85 ⁇ 10 ⁇ 7 / ° C. or less.
- the relationship between the temperature (T 4 ) at which the viscosity is 10 4 dPa ⁇ s and the devitrification temperature (T L ) is T 4 ⁇ T L ⁇ ⁇ 30 ° C.
- T 4 The -T L is lower than -30 ° C., devitrification is likely to occur at the time of sheet glass forming, there is a possibility that the molding of the glass plate becomes difficult.
- T 4 -T L is preferably -20 ° C. or higher, more preferably -10 ° C. or higher, more preferably 0 °C or more, particularly preferably 10 ° C. or higher.
- the devitrification temperature refers to the maximum temperature at which crystals are not generated on the glass surface and inside when the glass is held at a specific temperature for 17 hours.
- T 4 is preferably 1300 ° C. or lower, more preferably 1270 ° C. or lower, and further preferably 1250 ° C. or lower.
- the glass substrate for CIGS solar cell of the present invention has a density of 2.6 g / cm 3 or less.
- the density is preferably 2.58 g / cm 3 or less, more preferably 2.57 g / cm 3 or less.
- a density is 2.4 g / cm ⁇ 3 > or more.
- the glass substrate for CIGS solar cell of the present invention has a brittleness index value of less than 7000 m ⁇ 1/2 . If the brittleness index value is 7000 m ⁇ 1/2 or more, the glass substrate tends to break during the production process of the solar cell, which is not preferable. It is preferably 6900 m ⁇ 1/2 or less, more preferably 6800 m ⁇ 1/2 or less.
- the brittleness index value of the glass substrate is obtained as “B” defined by the following formula (1) (J. Segal, et al., J. Mat. Sci. Lett., 14). 167 (1995)).
- c / a 0.0056B 2/3 P 1/6 (1)
- P is the indentation load of the Vickers indenter
- a and c are the diagonal length of the Vickers indentation and the length of cracks generated from the four corners (the total length of two symmetrical cracks including the indenter), respectively.
- the brittleness index value B is calculated using the dimensions of the Vickers indentation driven on the surface of various glass substrates and Equation (1).
- SiO 2 A component that forms a glass skeleton. If it is less than 55 mol% (hereinafter simply referred to as “%”), the heat resistance and chemical durability of the glass substrate are lowered, and the average thermal expansion at 50 to 350 ° C.
- the coefficient may increase. Preferably it is 58% or more, More preferably, it is 60% or more, More preferably, it is 62% or more. However, if it exceeds 70%, the high-temperature viscosity of the glass is increased, and there is a possibility that a problem of deterioration of solubility occurs. Preferably it is 69% or less, More preferably, it is 68% or less, More preferably, it is 67% or less.
- Al 2 O 3 Increases the glass transition temperature, improves weather resistance (solarization), heat resistance and chemical durability, and increases Young's modulus. If the content is less than 6.5%, the glass transition temperature may be lowered. Further, the average thermal expansion coefficient at 50 to 350 ° C. may increase. Preferably it is 7% or more, More preferably, it is 9% or more. However, if it exceeds 12.6%, the high-temperature viscosity of the glass is increased, and the solubility may be deteriorated. Further, the devitrification temperature is increased, and the moldability may be deteriorated. In addition, power generation efficiency may be reduced. Preferably it is 12.4% or less, More preferably, it is 12.2% or less, More preferably, it is 12% or less.
- B 2 O 3 may be contained up to 1% in order to improve the solubility.
- the content exceeds 1%, the glass transition temperature decreases or the average thermal expansion coefficient at 50 to 350 ° C. decreases, which is not preferable for the process of forming a CIGS layer.
- devitrification temperature rises and it becomes easy to devitrify, and plate glass shaping
- the content is preferably 0.5% or less. More preferably, it does not contain substantially.
- “substantially does not contain” means that it is not contained other than inevitable impurities mixed from raw materials or the like, that is, it is not intentionally contained.
- MgO It is contained because it has the effect of lowering the viscosity at the time of melting the glass and promoting the melting. However, if it is less than 3%, the high temperature viscosity of the glass is increased and the solubility may be deteriorated. In addition, power generation efficiency may be reduced. More preferably, it is 4% or more, More preferably, it is 5% or more, More preferably, it is 6.5% or more. However, if it exceeds 10%, the average thermal expansion coefficient at 50 to 350 ° C. may increase. Further, the devitrification temperature may increase. Preferably it is 9% or less, More preferably, it is 8.5% or less.
- CaO It can be contained because it has the effect of lowering the viscosity at the time of melting the glass and promoting the melting. Preferably it is 0.5% or more, More preferably, it is 1% or more. However, if it exceeds 4.8%, the average thermal expansion coefficient of the glass substrate at 50 to 350 ° C. may increase. Moreover, there is a possibility that sodium is difficult to move in the glass substrate and power generation efficiency is lowered. Preferably it is 4.5% or less, More preferably, it is 4% or less.
- SrO It can be contained because it has the effect of reducing the viscosity at the time of melting the glass and promoting the melting. However, if it exceeds 2%, the power generation efficiency decreases, the average thermal expansion coefficient of the glass substrate at 50 to 350 ° C. increases, the density increases, and the brittleness index value described later may increase. It is preferably 1.5% or less, and more preferably 1% or less.
- BaO Since it has the effect of lowering the viscosity at the time of melting the glass and promoting the melting, it can be contained. However, if it exceeds 2%, the power generation efficiency decreases, the average thermal expansion coefficient of the glass substrate at 50 to 350 ° C. increases, the density increases, and the brittleness index value described later may increase. It is preferably 1.5% or less, and more preferably 1% or less.
- ZrO 2 It can be contained because it has the effect of lowering the viscosity at the time of melting the glass and promoting the melting. However, if the content exceeds 2.5%, the power generation efficiency decreases, the devitrification temperature rises, and the glass tends to be devitrified, making it difficult to form a sheet glass. It is preferably 1.5% or less, and more preferably 1% or less.
- TiO 2 It may be contained up to 2.5% in order to improve solubility. If the content exceeds 2.5%, the devitrification temperature rises and the glass tends to be devitrified, making it difficult to form a glass sheet. Preferably it is 1.5% or less, More preferably, it is 1% or less.
- MgO, CaO, SrO and BaO are contained in a total amount of 7.7% or more from the viewpoint of reducing the viscosity at the time of melting the glass and promoting the melting. However, if the total amount exceeds 17%, the devitrification temperature rises and the moldability may be deteriorated. 8% or more is preferable, 9% or more is more preferable, and 10% or more is more preferable. Moreover, 16% or less is preferable, 15% or less is more preferable, and 14% or less is further more preferable.
- Na 2 O is a component that contributes to improving the power generation efficiency of CIGS solar cells, and is an essential component. Further, since it has the effect of lowering the viscosity at the glass melting temperature and facilitating melting, it is contained in an amount of 5.3 to 10.9%. Na diffuses into the CIGS photoelectric conversion layer formed on the glass substrate to increase power generation efficiency, but if the content is less than 5.3%, Na diffusion into the CIGS photoelectric conversion layer on the glass substrate is insufficient. Therefore, the power generation efficiency may be insufficient.
- the content is preferably 6.5% or more, and more preferably 7.5% or more. When the Na 2 O content exceeds 10.9%, the average coefficient of thermal expansion at 50 to 350 ° C. tends to increase, and the glass transition temperature tends to decrease. Or chemical durability deteriorates. The content is preferably 10.5% or less.
- K 2 O Since it has the same effect as Na 2 O, 0 to 10% is contained. However, if it exceeds 10%, the power generation efficiency is lowered, the glass transition temperature is lowered, and the average thermal expansion coefficient at 50 to 350 ° C. may be increased. When it contains, it is preferable that it is 2% or more, and it is more preferable that it is 3% or more. Moreover, 8% or less is preferable and it is more preferable that it is 6% or less.
- Na 2 O and K 2 O The combined amount of Na 2 O and K 2 O is 10.4 to 16% in order to sufficiently reduce the viscosity at the glass melting temperature and to improve the power generation efficiency of the CIGS solar cell. It is. Preferably it is 10.5% or more, More preferably, it is 11% or more. However, if it exceeds 16%, the glass transition temperature may be too low. It is preferably 15% or less, and more preferably 14% or less.
- the ratio of MgO / Al 2 O 3 is set to 0.9 or less. If it exceeds 0.9, the devitrification temperature may increase. Preferably it is 0.85 or less, More preferably, it is 0.8 or less. Moreover, 0.2 or more are preferable, 0.3 or more are more preferable, More preferably, it is 0.4 or more, Most preferably, it is 0.5 or more.
- the value of the following formula (2) is 2. 2 or less. Based on the results of experiments and trial and error, the present inventors sufficiently set the glass transition temperature when each of the above components satisfies the scope of the present application and the value obtained by the above formula is 2.2 or less. It was found that the average coefficient of thermal expansion of 75 ⁇ 10 ⁇ 7 to 95 ⁇ 10 ⁇ 7 at 50 to 350 ° C. was satisfied while keeping high, and the brittleness index value was less than 7000 m ⁇ 1/2 .
- the glass transition temperature may be lowered, or the weather resistance may be deteriorated.
- the viscosity at high temperature will become high and a melt
- molding will become difficult when a numerical value becomes too low,
- Preferably it is 1 or more, More preferably, it is 1.5 or more.
- the reason why Na 2 O has a coefficient of 2 is that the effect of lowering Tg is higher than other components. (2Na 2 O + K 2 O + SrO + BaO) / (Al 2 O 3 + ZrO 2 ) (2)
- Na 2 O, K 2 O and Al 2 O 3 In order to keep the power generation efficiency high, the value of the following formula (3) is set to 0.9 or more. The present inventors have found from the results of experiments and trial and error that the power generation efficiency can be kept high when each of the above components satisfies the scope of the present application and the above formula is 0.9 or more. . ⁇ (Na 2 O + K 2 O) / Al 2 O 3 ⁇ ⁇ (Na 2 O / K 2 O) (3)
- the diffusion of sodium ions from the glass substrate into the CIGS layer is not sufficient, and the power generation efficiency may be reduced.
- it is 0.95 or more, More preferably, it is 1 or more.
- the value exceeds 2 the contribution to efficiency is not substantially changed. If the value is too high, the glass transition temperature may be lowered or the weather resistance may be deteriorated. Therefore, it is preferably 10 or less, more preferably 7 or less, and even more preferably 6 or less.
- the glass substrate for a Cu—In—Ga—Se solar cell of the present invention is expressed in terms of a mole percentage based on the following oxide, SiO 2 58-69%, 7-12% Al 2 O 3 B 2 O 3 from 0 to 0.5%, 4-9% MgO, CaO 0-4.5%, 0 to 1.5% of SrO, BaO 0-1.5%, 0 to 1.5% of ZrO 2 TiO 2 0-1.5%, 6.5 to 10.5% Na 2 O, Containing 2-8% K 2 O, MgO + CaO + SrO + BaO is 9 to 15%, Na 2 O + K 2 O 10.5-15%, MgO / Al 2 O 3 is 0.2 to 0.85, (2Na 2 O + K 2 O + SrO + BaO) / (Al 2 O 3 + ZrO 2 ) is 1-2.
- the glass substrate for CIGS solar cell of the present invention consists essentially of the above mother composition, but may contain other components in an amount of 1% or less and a total of 5% or less in a range not impairing the object of the present invention.
- ZnO, Li 2 O, WO 3 , Nb 2 O 5 , V 2 O 5 , Bi 2 O 3 , MoO 3 are used for the purpose of improving weather resistance, solubility, devitrification, ultraviolet shielding, refractive index, and the like.
- TlO 2 , P 2 O 5 and the like may be contained.
- these raw materials are matrix compositions so that each glass substrate contains SO 3 , F, Cl and SnO 2 in an amount of 1% or less and a total amount of 2% or less. You may add to a raw material.
- Y 2 O 3 and La 2 O 3 may be contained in the glass substrate in a total amount of 2% or less.
- it may contain a colorant such as Fe 2 O 3 in the glass substrate. The total content of such colorants is preferably 1% or less.
- the glass substrate for CIGS solar cell of the present invention preferably contains substantially no As 2 O 3 or Sb 2 O 3 in consideration of environmental load. In consideration of stable float forming, it is preferable that ZnO is not substantially contained.
- the glass substrate for CIGS solar cell of the present invention is not limited to being formed by the float method, and may be manufactured by forming by the fusion method.
- the manufacturing method of the glass substrate for CIGS solar cells of this invention is demonstrated.
- molding process are implemented similarly to the time of manufacturing the conventional glass substrate for solar cells.
- SO 3 can be effectively used as a fining agent, Suitable for the float method and fusion method (down draw method) as the molding method.
- a float method capable of easily and stably forming a large-area glass substrate with the enlargement of the solar cell is used. preferable.
- molten glass obtained by melting raw materials is formed into a plate shape.
- raw materials are prepared so that the obtained glass substrate has the above composition, the raw materials are continuously charged into a melting furnace, and heated to 1550 to 1700 ° C. to obtain molten glass.
- the molten glass is formed into a ribbon-like glass plate by applying, for example, a float process.
- After pulling out the ribbon-shaped glass plate from the float forming furnace it is cooled to room temperature by a cooling means, and after cutting, a CIGS solar cell glass substrate is obtained.
- the glass substrate for CIGS solar cell of the present invention is also suitable as a glass substrate for CIGS solar cell and a cover glass.
- the thickness of the glass substrate is preferably 3 mm or less, more preferably 2 mm or less, and further preferably 1.5 mm or less.
- the method for applying the CIGS photoelectric conversion layer to the glass substrate is not particularly limited.
- an evaporation method in which a photoelectric conversion layer is formed by evaporation; a precursor film containing Cu, Ga, and In is formed by a sputtering method, and then the precursor film is exposed to an atmosphere containing hydrogen selenide at a high temperature.
- a selenization method for forming a photoelectric conversion layer in the case of vapor deposition, selenization is preferred because selenium tends to re-evaporate when the substrate temperature increases.
- the heating temperature when forming the photoelectric conversion layer is 500 to 700 ° C., preferably 550 to 700 ° C., more preferably 580 to 700 ° C., further preferably 600 to It can be 700 degreeC.
- the cover glass and the like are not particularly limited. Other examples of the composition of the cover glass include soda lime glass.
- the thickness of the cover glass is preferably 3 mm or less, more preferably 2 mm or less, and even more preferably 1.5 mm or less.
- the method for assembling the cover glass on the glass substrate having the photoelectric conversion layer is not particularly limited.
- the heating temperature can be 500 to 700 ° C., preferably 600 to 700 ° C.
- the average coefficient of thermal expansion at 50 to 350 ° C. is equivalent, so that no thermal deformation or the like during solar cell assembly occurs. .
- the solar cell in the present invention has a glass substrate having a photoelectric conversion layer of Cu—In—Ga—Se and a cover glass disposed on the glass substrate, and one of the glass substrate and the cover glass or Both are glass substrates for Cu—In—Ga—Se solar cells of the present invention.
- FIG. 1 is a cross-sectional view schematically showing an example of an embodiment of a solar cell in the present invention.
- a solar cell (CIGS solar cell) 1 according to the present invention has a glass substrate 5, a cover glass 19, and a CIGS layer 9 between the glass substrate 5 and the cover glass 19. It is preferable that the glass substrate 5 consists of the glass substrate for CIGS solar cells of this invention demonstrated above.
- the solar cell 1 has the back electrode layer of Mo film which is the plus electrode 7 on the glass substrate 5, and has the photoelectric converting layer which is the CIGS layer 9 on it.
- the composition of the CIGS layer can be exemplified by Cu (In 1-X Ga x ) Se 2 .
- x represents the composition ratio of In and Ga, and 0 ⁇ x ⁇ 1.
- a CdS (cadmium sulfide) layer, a ZnS (zinc sulfide) layer, a ZnO (zinc oxide) layer, a Zn (OH) 2 (zinc hydroxide) layer as a buffer layer 11, or a mixture thereof. It has a crystal layer.
- a transparent conductive film 13 such as ZnO, ITO, or Al doped ZnO (AZO) is provided through the buffer layer 11, and an extraction electrode such as an Al electrode (aluminum electrode) that is a negative electrode 15 is provided thereon.
- An antireflection film may be provided at a necessary place between these layers.
- an antireflection film 17 is provided between the transparent conductive film 13 and the negative electrode 15.
- a cover glass 19 may be provided on the minus electrode 15, and if necessary, the minus electrode and the cover glass are sealed with resin or bonded with a transparent resin for adhesion.
- the cover glass the glass substrate for CIGS solar cell of the present invention may be used.
- the edge part of a photoelectric converting layer or the edge part of a solar cell may be sealed.
- a material for sealing the same material as the glass substrate for CIGS solar cells of this invention, other glass, and resin are mentioned, for example. Note that the thickness of each layer of the solar cell shown in the accompanying drawings is not limited to the drawings.
- the power generation efficiency of the CIGS solar cell in the present invention is preferably 11.8% or more. By being 11.8% or more, it can be set as performance useful enough as a solar cell. More preferably, it is 12% or more, More preferably, it is 12.2% or more.
- Examples 1 to 30 Examples (Examples 1 to 30) and comparative examples (Examples 31 to 36) of the glass substrate for CIGS solar cell of the present invention are shown.
- the parentheses in Tables 1 to 5 are calculated values.
- the raw materials of each component were prepared so as to have the compositions shown in Tables 1 to 5, and 100 parts by mass of the raw material for the glass substrate component was added to 0.1 parts by mass of the sulfate in terms of SO 3 , It melt
- the glass plate thus obtained has an average coefficient of thermal expansion (unit: ⁇ 10 -7 / ° C) at 50 to 350 ° C, a glass transition temperature Tg (unit: ° C), and a temperature at which the viscosity becomes 10 4 dPa ⁇ s (T 4 ) (unit: ° C.), devitrification temperature (T L ) (unit: ° C.), density (unit: g / cm 3 ), brittleness index value (unit: m ⁇ 1/2 ) were measured, and Table 1 Shown in ⁇ 5.
- the measuring method of each physical property is shown below.
- each physical property is the same value with a glass plate and a glass substrate.
- a glass substrate can be obtained by processing and polishing the obtained glass plate.
- Tg is a value measured using TMA, and was determined according to JIS R3103-3 (fiscal 2001).
- Viscosity measured by using a rotational viscometer, and the temperature T 2 (solubility reference temperature) when the viscosity ⁇ is 10 2 dPa ⁇ s, when the viscosity ⁇ is 10 4 dPa ⁇ s Temperature T 4 (reference temperature for moldability) was measured.
- Devitrification temperature (T L ) 5 g of glass lump cut out from the glass plate was placed on a platinum dish and kept in an electric furnace at a predetermined temperature for 17 hours. The maximum temperature at which crystals do not precipitate on the surface and inside of the glass lump after being held was defined as the devitrification temperature.
- Film formation was performed at room temperature to obtain a Mo film having a thickness of 500 nm.
- a CuGa alloy layer is formed with a CuGa alloy target using a sputtering apparatus, and then an In layer is formed using an In target, whereby an In—CuGa precursor film is formed.
- a film was formed.
- Film formation was performed at room temperature. The thickness of each layer was adjusted so that the composition of the precursor film measured by fluorescent X-rays was Cu / (Ga + In) ratio of 0.8 and Ga / (Ga + In) ratio of 0.25. Obtained.
- the precursor film was heat-treated in a mixed atmosphere of argon and hydrogen selenide (hydrogen selenide is 5% by volume with respect to argon) using an RTA (Rapid Thermal Annealing) apparatus.
- RTA Rapid Thermal Annealing
- CIGS layer 9a was obtained.
- the thickness of the obtained CIGS layer 9a was 2 ⁇ m.
- a CdS layer was formed as the buffer layer 11a on the CIGS layer 9a by a CBD (Chemical Bath Deposition) method. Specifically, first, cadmium sulfate having a concentration of 0.01M, thiourea having a concentration of 1.0M, ammonia having a concentration of 15M, and pure water were mixed in a beaker. Next, the CIGS layer was immersed in the mixed solution, and the beaker was placed in a constant temperature bath with a water temperature of 70 ° C. in advance to form a CdS layer having a thickness of 50 to 80 nm.
- CBD Chemical Bath Deposition
- a transparent conductive film 13a was formed on the CdS layer by a sputtering apparatus by the following method. First, a ZnO layer was formed using a ZnO target, and then an AZO layer was formed using an AZO target (ZnO target containing 1.5 wt% Al 2 O 3 ). Each layer was formed at room temperature to obtain a transparent conductive film 13a having a two-layer structure having a thickness of 480 nm. On the AZO layer of the transparent conductive film 13a, an aluminum film having a thickness of 1 ⁇ m was formed as a U-shaped negative electrode 15a by EB vapor deposition (U-shaped electrode length (vertical 8 mm, horizontal 4 mm), electrode width 0. 5 mm).
- FIG. 2A is a view of one solar battery cell as viewed from above
- FIG. 2B is a cross-sectional view taken along the line AA ′ in FIG.
- One cell has a width of 0.6 cm and a length of 1 cm, and the area excluding the negative electrode 15a is 0.5 cm 2.
- FIG. 3 a total of eight cells are placed on one glass substrate 5a. Obtained.
- a CIGS solar cell for evaluation (evaluation glass substrate 5a produced with the above eight cells) is installed in a solar simulator (YSS-T80A manufactured by Yamashita Denso Co., Ltd.), and a positive terminal is applied to a positive electrode 7a previously coated with an InGa solvent. (Not shown), and the negative terminal 16a was connected to the voltage generator at the lower end of the U-shape of the negative electrode 15a.
- the temperature in the solar simulator was controlled at a constant temperature of 25 ° C. with a temperature controller. Pseudo sunlight was irradiated, and after 60 seconds, the voltage was changed from -1 V to +1 V at an interval of 0.015 V, and the current values of each of the eight cells were measured.
- the power generation efficiency was calculated by the formula (4) from the current and voltage characteristics at the time of irradiation.
- the values of the most efficient cell among the 8 cells are shown in Tables 1 to 5 as the value of the power generation efficiency of each glass substrate.
- the illuminance of the light source used for the test was 0.1 W / cm 2 .
- Power generation efficiency [%] Voc [V] ⁇ Jsc [A / cm 2 ] ⁇ FF [Dimensionless] ⁇ 100 / Illuminance [W / cm 2 ] of the light source used in the test Equation (4)
- the power generation efficiency is obtained by multiplying the open circuit voltage (Voc), the short circuit current density (Jsc), and the fill factor (FF).
- the open circuit voltage (Voc) is an output when the terminal is opened, and the short circuit current (Isc) is a current when the terminal is short circuited.
- the short circuit current density (Jsc) is Isc divided by the cell area excluding the negative electrode.
- the point that gives the maximum output is called the maximum output point, the voltage at that point is called the maximum voltage value (Vmax), and the current is called the maximum current value (Imax).
- Vmax the voltage at that point
- Imax the current
- a value obtained by dividing the product of the maximum voltage value (Vmax) and the maximum current value (Imax) by the product of the open circuit voltage (Voc) and the short circuit current (Isc) is obtained as a fill factor (FF). Using the above values, the power generation efficiency was determined.
- the residual amount of SO 3 in the glass substrate was 100 to 500 ppm.
- the brittleness index values of Examples 1 to 30 are less than 7000 m ⁇ 1/2 .
- the glass substrates of the examples have a glass transition temperature Tg as high as 650 ° C. or higher, and an average coefficient of thermal expansion at 50 to 350 ° C. is 75 ⁇ 10 ⁇ 7.
- a ⁇ 95 ⁇ 10 -7 / °C brittleness index value B is less than 7000 m -1/2, density 2.6 g / cm 3 or less
- T 4 -T L is -30 ° C. or higher.
- the power generation efficiency is excellent.
- the brittleness index value was calculated using the regression equation obtained by performing multiple regression analysis with the composition and the actual measurement value based on the actual measurement value obtained. However, it was calculated in increments of 50 in consideration of measurement errors.
- the numerical value obtained by the above equation (3) and the power generation efficiency are proportional to each other in the region where the numerical value obtained by the above equation (3) is 2.2 or less. It became almost constant. Therefore, it divided
- FIG. 4 is a graph showing the relationship between (Na 2 O + K 2 O) / Al 2 O 3 ⁇ (Na 2 O / K 2 O) and power generation efficiency.
- the power generation efficiency is excellent when the value of (Na 2 O + K 2 O) / Al 2 O 3 ⁇ (Na 2 O / K 2 O) is 0.9 or more. From this, it is predicted that the power generation efficiency is good in the example where the value of (Na 2 O + K 2 O) / Al 2 O 3 ⁇ (Na 2 O / K 2 O) is 0.9 or more.
- the solar cell in the present invention is assembled (specifically, when the glass substrate having a CIGS photoelectric conversion layer and the cover glass are heated and bonded), the glass substrate is not easily deformed. It has strength, light weight, no devitrification, and better power generation efficiency.
- the glass substrate is T 4 -T L is easily devitrified below -30 ° C.
- Comparative Example As shown in Table 5 (Examples 31-35), it is difficult molding at a float. Further, the comparative example (Example 36) has a low Tg, and the glass substrate is likely to be deformed during film formation at 600 ° C. or higher, which may hinder battery manufacture.
- the glass substrate for a Cu—In—Ga—Se solar cell of the present invention is suitable as a glass substrate and cover glass for CIGS solar cells, but can also be used for other solar cell substrates and cover glasses.
- the glass substrate for a Cu—In—Ga—Se solar cell of the present invention has high power generation efficiency, high glass transition temperature, predetermined average thermal expansion coefficient, high glass strength, low glass density, and prevention of devitrification when forming sheet glass. It has a good balance of properties, and a solar cell with high power generation efficiency can be provided by using the glass substrate for CIGS solar cell of the present invention.
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Abstract
Description
また、効率の良い太陽電池を得るため、高温の熱処理温度に耐えうるガラス材料の提案もされている(特許文献1および2参照)。
また、特許文献2の方法は、アルカリ制御層を設けることで、高歪点ガラスに含まれる低濃度のアルカリ元素を効率よくp型光吸収層に拡散することを目的としているが、アルカリ制御層を設ける工程が増えるためコストがかかり、またアルカリ制御層によりアルカリ元素の拡散が不十分になり、効率低下のおそれがある。
一方で、ガラス基板上のCIGS層の成膜中または成膜後の剥離を防止するためには、ガラス基板は、所定の平均熱膨張係数を有することが求められる。
このようにCIGS太陽電池に使用されるガラス基板において高い発電効率、高いガラス転移点温度、所定の平均熱膨張係数、高いガラス強度、低いガラス密度、板ガラス成形時の失透防止の特性をバランスよく有することは困難であった。
(1)下記酸化物基準のモル百分率表示で、
SiO2を55~70%、
Al2O3を6.5~12.6%、
B2O3を0~1%、
MgOを3~10%、
CaOを0~4.8%、
SrOを0~2%、
BaOを0~2%、
ZrO2を0~2.5%、
TiO2を0~2.5%、
Na2Oを5.3~10.9%、
K2Oを0~10%含有し、
MgO+CaO+SrO+BaOが7.7~17%、
Na2O+K2Oが10.4~16%、
MgO/Al2O3が0.9以下、
(2Na2O+K2O+SrO+BaO)/(Al2O3+ZrO2)が2.2以下、
(Na2O+K2O)/Al2O3×(Na2O/K2O)が0.9以上であり、
ガラス転移点温度が650~750℃、50~350℃における平均熱膨張係数が75×10-7~95×10-7/℃、粘度が104dPa・sとなる温度(T4)と失透温度(TL)との関係がT4-TL≧-30℃、密度が2.6g/cm3以下、脆さ指標値が7000m-1/2未満であるCu-In-Ga-Se太陽電池用ガラス基板。
(2)下記酸化物基準のモル百分率表示で、
SiO2を58~69%、
Al2O3を7~12%、
B2O3を0~0.5%、
MgOを4~9%、
CaOを0~4.5%、
SrOを0~1.5%、
BaOを0~1.5%、
ZrO2を0~1.5%、
TiO2を0~1.5%、
Na2Oを6.5~10.5%、
K2Oを2~8%含有し、
MgO+CaO+SrO+BaOが9~15%、
Na2O+K2Oが10.5~15%、
MgO/Al2O3が0.2~0.85、
(2Na2O+K2O+SrO+BaO)/(Al2O3+ZrO2)が1~2.2、
(Na2O+K2O)/Al2O3×(Na2O/K2O)が0.9~10であり、
ガラス転移点温度が650~700℃、50~350℃における平均熱膨張係数が75×10-7~90×10-7/℃、粘度が104dPa・sとなる温度(T4)と失透温度(TL)との関係がT4-TL≧-20℃、密度が2.58g/cm3以下、脆さ指標値が6800m-1/2未満である(1)に記載のCu-In-Ga-Se太陽電池用ガラス基板。
(3)ガラス基板と、カバーガラスと、前記ガラス基板と前記カバーガラスとの間に配置されるCu-In-Ga-Seの光電変換層と、を有し、
前記ガラス基板と前記カバーガラスのうち少なくとも前記ガラス基板が、(1)または(2)に記載のCu-In-Ga-Se太陽電池用ガラス基板である太陽電池。
以下、本発明のCu-In-Ga-Se太陽電池用ガラス基板について説明する。
本発明のCu-In-Ga-Se太陽電池用ガラス基板は、下記酸化物基準のモル百分率表示で、
SiO2を55~70%、
Al2O3を6.5~12.6%、
B2O3を0~1%、
MgOを3~10%、
CaOを0~4.8%、
SrOを0~2%、
BaOを0~2%、
ZrO2を0~2.5%、
TiO2を0~2.5%、
Na2Oを5.3~10.9%、
K2Oを0~10%含有し、
MgO+CaO+SrO+BaOが7.7~17%、
Na2O+K2Oが10.4~16%、
MgO/Al2O3が0.9以下、
(2Na2O+K2O+SrO+BaO)/(Al2O3+ZrO2)が2.2以下、
(Na2O+K2O)/Al2O3×(Na2O/K2O)が0.9以上であり、
ガラス転移点温度が650~750℃、50~350℃における平均熱膨張係数が75×10-7~95×10-7/℃、粘度が104dPa・sとなる温度(T4)と失透温度(TL)との関係がT4-TL≧-30℃、密度が2.6g/cm3以下、脆さ指標値が7000m-1/2未満である、Cu-In-Ga-Se太陽電池用ガラス基板である。
ガラス板の成形性を考慮すると、T4は1300℃以下が好ましく、1270℃以下がより好ましく、1250℃以下がさらに好ましい。
本発明において、ガラス基板の脆さ指標値は、下式(1)により定義される「B」として得られるものである(J.Sehgal, et al.,J.Mat.Sci.Lett.,14,167(1995))。
c/a=0.0056B2/3P1/6 (1)
ここで、Pはビッカース圧子の押し込み荷重であり、a、cはそれぞれ、ビッカース圧痕の対角長および四隅から発生するクラックの長さ(圧子を含む対称な2つのクラックの全長)である。各種ガラス基板の表面に打ち込んだビッカース圧痕の寸法と式(1)を用いて、脆さ指標値Bを算出することとする。
SiO2:ガラスの骨格を形成する成分で、55モル%(以下、単に「%」と記載する)未満ではガラス基板の耐熱性および化学的耐久性が低下し、50~350℃における平均熱膨張係数が増大するおそれがある。好ましくは58%以上であり、より好ましくは60%以上であり、さらに好ましくは62%以上である。
しかし、70%超ではガラスの高温粘度が上昇し、溶解性が悪化する問題が生じるおそれがある。好ましくは69%以下であり、より好ましくは68%以下であり、さらに好ましくは67%以下である。
しかし、12.6%超では、ガラスの高温粘度が上昇し、溶解性が悪くなるおそれがある。また、失透温度が上昇し、成形性が悪くなるおそれがある。また発電効率が低下するおそれがある。好ましくは12.4%以下、より好ましくは12.2%以下、さらに好ましくは12%以下である。
なお、「実質的に含有しない」とは、原料等から混入する不可避的不純物以外には含有しないこと、すなわち、意図的に含有させないことを意味する。
しかし、10%超では、50~350℃における平均熱膨張係数が増大するおそれがある。また失透温度が上昇するおそれがある。好ましくは9%以下であり、より好ましくは8.5%以下である。
Na2O含有量が10.9%を超えると50~350℃における平均熱膨張係数が大きくなり、ガラス転移点温度が低下する傾向がある。または化学的耐久性が劣化する。含有量が10.5%以下であると好ましい。
2.2を超えると、ガラス転移点温度が低くなる、もしくは耐候性が悪化するおそれがある。また、数値が低くなりすぎると高温での粘性が高くなり、溶解や成形が困難となるため好ましくは1以上であり、より好ましくは1.5以上である。
なお、Na2Oに2の係数が付いているのはTgを低くする効果が他の成分より高いためである。
(2Na2O+K2O+SrO+BaO)/(Al2O3+ZrO2) (2)
{(Na2O+K2O)/Al2O3}×(Na2O/K2O) (3)
発電効率についてはKに比べてNaの方が効果があるため、第2項は値が大きいほうがよいと推察している。より好ましくは、第2項としての「Na2O/K2O」の値が1以上である。この理由としては、混合アルカリ効果のためK量に比べて相対的にNa量が多いほうがアルカリ拡散しやすくなるためである。
SiO2を58~69%、
Al2O3を7~12%、
B2O3を0~0.5%、
MgOを4~9%、
CaOを0~4.5%、
SrOを0~1.5%、
BaOを0~1.5%、
ZrO2を0~1.5%、
TiO2を0~1.5%、
Na2Oを6.5~10.5%、
K2Oを2~8%含有し、
MgO+CaO+SrO+BaOが9~15%、
Na2O+K2Oが10.5~15%、
MgO/Al2O3が0.2~0.85、
(2Na2O+K2O+SrO+BaO)/(Al2O3+ZrO2)が1~2.2、
(Na2O+K2O)/Al2O3×(Na2O/K2O)が0.9~10であり、
ガラス転移点温度が650~700℃、50~350℃における平均熱膨張係数が75×10-7~90×10-7/℃、粘度が104dPa・sとなる温度(T4)と失透温度(TL)との関係がT4-TL≧-20℃、密度が2.58g/cm3以下、脆さ指標値が6800m-1/2未満である、Cu-In-Ga-Se太陽電池用ガラス基板が好ましい。
また、ガラス基板の化学的耐久性向上のため、ガラス基板中にY2O3、La2O3を合量で2%以下含有させてもよい。
また、ガラス基板の色調を調整するため、ガラス基板中にFe2O3等の着色剤を含有してもよい。このような着色剤の含有量は、合量で1%以下が好ましい。
本発明のCIGS太陽電池用ガラス基板は、環境負荷を考慮すると、As2O3、Sb2O3を実質的に含有しないことが好ましい。また、安定してフロート成形することを考慮すると、ZnOを実質的に含有しないことが好ましい。しかし、本発明のCIGS太陽電池用ガラス基板は、フロート法による成形に限らず、フュージョン法による成形により製造してもよい。
本発明のCIGS太陽電池用ガラス基板の製造方法について説明する。
本発明のCIGS太陽電池用ガラス基板を製造する場合、従来の太陽電池用ガラス基板を製造する際と同様に、溶解・清澄工程および成形工程を実施する。なお、本発明のCIGS太陽電池用ガラス基板は、アルカリ金属酸化物(Na2O、K2O)を含有するアルカリガラス基板であるため、清澄剤としてSO3を効果的に用いることができ、成形方法としてフロート法およびフュージョン法(ダウンドロー法)に適している。
太陽電池用のガラス基板の製造工程において、ガラスを板状に成形する方法としては、太陽電池の大型化に伴い、大面積のガラス基板を容易に、安定して成形できるフロート法を用いることが好ましい。
初めに、原料を溶解して得た溶融ガラスを板状に成形する。例えば、得られるガラス基板が上記組成となるように原料を調製し、上記原料を溶解炉に連続的に投入し、1550~1700℃に加熱して溶融ガラスを得る。そしてこの溶融ガラスを例えばフロート法を適用してリボン状のガラス板に成形する。
次に、リボン状のガラス板をフロート成形炉から引出した後に、冷却手段によって室温状態まで冷却し、切断後、CIGS太陽電池用ガラス基板を得る。
本発明のCIGS太陽電池用ガラス基板は、CIGS太陽電池のガラス基板、またカバーガラスとしても好適である。
本発明のCIGS太陽電池用ガラス基板をCIGS太陽電池のガラス基板に適用する場合、ガラス基板の厚さは3mm以下とするのが好ましく、より好ましくは2mm以下、さらに好ましくは1.5mm以下である。またガラス基板にCIGSの光電変換層を付与する方法は特に制限されない。
本発明のCIGS太陽電池用ガラス基板をCIGS太陽電池のガラス基板のみに使用する場合、カバーガラス等は特に制限されない。カバーガラスの組成の他の例は、ソーダライムガラス等が挙げられる。
次に、本発明における太陽電池について説明する。
本発明における太陽電池は、Cu-In-Ga-Seの光電変換層を有するガラス基板と上記ガラス基板上に配置されたカバーガラスとを有し、上記ガラス基板および上記カバーガラスのうちの一方または両方が本発明のCu-In-Ga-Se太陽電池用ガラス基板である。
図1は本発明における太陽電池の実施形態の一例を模式的に表す断面図である。
図1において、本発明における太陽電池(CIGS太陽電池)1は、ガラス基板5、カバーガラス19、およびガラス基板5とカバーガラス19との間にCIGS層9を有する。ガラス基板5は、上記で説明した本発明のCIGS太陽電池用ガラス基板からなるのが好ましい。太陽電池1は、ガラス基板5上にプラス電極7であるMo膜の裏面電極層を有し、その上にCIGS層9である光電変換層を有する。CIGS層の組成はCu(In1-XGax)Se2が例示できる。xはInとGaの組成比を示すもので0<x<1である。
なお添付の図面に示す太陽電池の各層の厚さは図面に限定されない。
表1~5で表示した組成になるように各成分の原料を調合し、該ガラス基板用成分の原料100質量部に対し、硫酸塩をSO3換算で0.1質量部原料に添加し、白金坩堝を用いて1600℃の温度で3時間加熱し溶解した。溶解にあたっては、白金スターラーを挿入し1時間攪拌しガラスの均質化を行った。次いで溶融ガラスを流し出し、板状に成形後冷却し、ガラス板を得た。
なお、実施例では、ガラス板について測定しているが、各物性は、ガラス板とガラス基板とで同じ値である。得られたガラス板を加工、研磨を施することで、ガラス基板とすることができる。
(6)脆さ指標値:前述の各種ガラス板をガラス基板とし、そのガラス基板の表面に打ち込んだビッカース圧痕の寸法と上記式(1)を用いて、脆さ指標値Bを算出する。
評価用太陽電池の作製について、図2、3およびその符号を用いて以下説明する。なお、評価用太陽電池の層構成は、図1の太陽電池のカバーガラス19および反射防止膜17を有さない以外は、図1に示す太陽電池の層構成とほぼ同様である。
得られたガラス板を大きさ3cm×3cm、厚さ1.1mmに加工しガラス基板を得た。ガラス基板5aの上に、スパッタ装置にて、プラス電極7aとしてMo膜を成膜した。成膜は室温にて実施し、厚み500nmのMo膜を得た。
プラス電極7a(モリブデン膜)上にスパッタ装置にて、CuGa合金ターゲットでCuGa合金層を成膜し、続いてInターゲットを使用してIn層を成膜することで、In-CuGaのプリカーサ膜を製膜した。成膜は室温にて実施した。蛍光X線によって測定したプリカーサ膜の組成が、Cu/(Ga+In)比が0.8、Ga/(Ga+In)比が0.25となるように各層の厚みを調整し、厚み650nmのプリカーサ膜を得た。
透明導電膜13aのAZO層上にEB蒸着法により、U字型のマイナス電極15aとして膜厚1μmのアルミ膜を成膜した(U字の電極長(縦8mm、横4mm)、電極幅0.5mm)。
発電効率[%]=Voc[V]×Jsc[A/cm2]×FF[無次元]×100/試験に用いる光源の照度[W/cm2] 式(4)
なお、開放電圧(Voc)は端子を開放した時の出力であり、短絡電流(Isc)は短絡した時の電流である。短絡電流密度(Jsc)はIscをマイナス電極を除いたセルの面積で割ったものである。
表1~4より明らかなように、実施例(例1~30)のガラス基板は、ガラス転移点温度Tgが650℃以上と高く、50~350℃における平均熱膨張係数が75×10-7~95×10-7/℃であり、脆さ指標値Bが7000m-1/2未満、密度が2.6g/cm3以下、T4-TLが-30℃以上である。また、発電効率も優れている。
発電効率ηの計算値は、上記式(3)により得られた数値Pを用いて、Pが2.2以下の場合は、下記式(5)を用いて算出し、Pが2.2超の場合は、下記式(6)を用いて算出した。
η=3.47×P+8.77 (5)
η=-0.20×P+15.62 (6)
また、比較例(例36)はTgが低く、600℃以上での成膜時にガラス基板が変形しやすく、電池の製造に支障をきたすおそれがある。
5、5a ガラス基板
7、7a プラス電極
9、9a CIGS層
11、11a バッファ層
13、13a 透明導電膜
15、15a マイナス電極
16a マイナス端子
17 反射防止膜
19 カバーガラス
Claims (3)
- 下記酸化物基準のモル百分率表示で、
SiO2を55~70%、
Al2O3を6.5~12.6%、
B2O3を0~1%、
MgOを3~10%、
CaOを0~4.8%、
SrOを0~2%、
BaOを0~2%、
ZrO2を0~2.5%、
TiO2を0~2.5%、
Na2Oを5.3~10.9%、
K2Oを0~10%含有し、
MgO+CaO+SrO+BaOが7.7~17%、
Na2O+K2Oが10.4~16%、
MgO/Al2O3が0.9以下、
(2Na2O+K2O+SrO+BaO)/(Al2O3+ZrO2)が2.2以下、
(Na2O+K2O)/Al2O3×(Na2O/K2O)が0.9以上であり、
ガラス転移点温度が650~750℃、50~350℃における平均熱膨張係数が75×10-7~95×10-7/℃、粘度が104dPa・sとなる温度(T4)と失透温度(TL)との関係がT4-TL≧-30℃、密度が2.6g/cm3以下、脆さ指標値が7000m-1/2未満であるCu-In-Ga-Se太陽電池用ガラス基板。 - 下記酸化物基準のモル百分率表示で、
SiO2を58~69%、
Al2O3を7~12%、
B2O3を0~0.5%、
MgOを4~9%、
CaOを0~4.5%、
SrOを0~1.5%、
BaOを0~1.5%、
ZrO2を0~1.5%、
TiO2を0~1.5%、
Na2Oを6.5~10.5%、
K2Oを2~8%含有し、
MgO+CaO+SrO+BaOが9~15%、
Na2O+K2Oが10.5~15%、
MgO/Al2O3が0.2~0.85、
(2Na2O+K2O+SrO+BaO)/(Al2O3+ZrO2)が1~2.2、
(Na2O+K2O)/Al2O3×(Na2O/K2O)が0.9~10であり、
ガラス転移点温度が650~700℃、50~350℃における平均熱膨張係数が75×10-7~90×10-7/℃、粘度が104dPa・sとなる温度(T4)と失透温度(TL)との関係がT4-TL≧-20℃、密度が2.58g/cm3以下、脆さ指標値が6800m-1/2未満である請求項1に記載のCu-In-Ga-Se太陽電池用ガラス基板。 - ガラス基板と、カバーガラスと、前記ガラス基板と前記カバーガラスとの間に配置されるCu-In-Ga-Seの光電変換層と、を有し、
前記ガラス基板と前記カバーガラスのうち少なくとも前記ガラス基板が、請求項1または2に記載のCu-In-Ga-Se太陽電池用ガラス基板である太陽電池。
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| KR1020137010040A KR20130129923A (ko) | 2010-10-20 | 2011-10-19 | CuInGaSe 태양 전지용 유리 기판 및 그것을 사용한 태양 전지 |
| JP2012539747A JPWO2012053549A1 (ja) | 2010-10-20 | 2011-10-19 | Cu−In−Ga−Se太陽電池用ガラス基板およびそれを用いた太陽電池 |
| US13/867,490 US20130233386A1 (en) | 2010-10-20 | 2013-04-22 | Glass substrate for cu-in-ga-se solar cells and solar cell using same |
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| JP2014024717A (ja) * | 2012-07-27 | 2014-02-06 | Asahi Glass Co Ltd | Cu−In−Ga−Se太陽電池用ガラス板およびそれを用いた太陽電池とその製造方法 |
| JP2014067903A (ja) * | 2012-09-26 | 2014-04-17 | Asahi Glass Co Ltd | 太陽電池用ガラス基板、太陽電池、および太陽電池の製造方法 |
| WO2014181641A1 (ja) * | 2013-05-09 | 2014-11-13 | 旭硝子株式会社 | 透光性基板、有機led素子、透光性基板の製造方法 |
| JPWO2013168592A1 (ja) * | 2012-05-11 | 2016-01-07 | 旭硝子株式会社 | 積層体用の前面ガラス板および積層体 |
| JP2016147792A (ja) * | 2015-02-13 | 2016-08-18 | 旭硝子株式会社 | ガラス基板 |
| JP2017061404A (ja) * | 2015-09-23 | 2017-03-30 | ショット アクチエンゲゼルシャフトSchott AG | 化学的に安定なガラス及びその使用 |
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| JP2020518137A (ja) * | 2017-04-19 | 2020-06-18 | (シーエヌビーエム)ボンブー デザイン アンド リサーチ インスティテュート フォー グラス インダストリー カンパニー,リミティド | 薄膜太陽電池用層構造を製造するための方法 |
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| JPWO2012053549A1 (ja) | 2014-02-24 |
| TW201217294A (en) | 2012-05-01 |
| US20130233386A1 (en) | 2013-09-12 |
| KR20130129923A (ko) | 2013-11-29 |
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