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WO2006115175A3 - 試験装置、プログラム、及び記録媒体 - Google Patents

試験装置、プログラム、及び記録媒体 Download PDF

Info

Publication number
WO2006115175A3
WO2006115175A3 PCT/JP2006/308327 JP2006308327W WO2006115175A3 WO 2006115175 A3 WO2006115175 A3 WO 2006115175A3 JP 2006308327 W JP2006308327 W JP 2006308327W WO 2006115175 A3 WO2006115175 A3 WO 2006115175A3
Authority
WO
WIPO (PCT)
Prior art keywords
test
timing
timing signal
supplying
reference clock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2006/308327
Other languages
English (en)
French (fr)
Other versions
WO2006115175A2 (ja
Inventor
Naohiro Ikeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to EP06745508A priority Critical patent/EP1882957A4/en
Priority to CN2006800135854A priority patent/CN101384916B/zh
Publication of WO2006115175A2 publication Critical patent/WO2006115175A2/ja
Anticipated expiration legal-status Critical
Publication of WO2006115175A3 publication Critical patent/WO2006115175A3/ja
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

　被試験デバイスの試験に用いる試験パターンを、与えられるタイミング信号に応じて被試験デバイスに供給する複数のテストモジュールと、基準クロックを生成する基準クロック生成部と、複数のテストモジュールに対応して設けられ、基準クロックに応じて前記タイミング信号を生成し、それぞれ対応するテストモジュールにタイミング信号を供給する複数のタイミング供給部と、それぞれのテストモジュールがタイミング信号を受け取ってから試験パターンを出力するまでのそれぞれのテストモジュール遅延量に基づいて、複数のテストモジュールが出力するそれぞれの試験パターンのタイミングが略同一となるように、それぞれのタイミング供給部がタイミング信号を出力するタイミングを制御する制御部とを備える試験装置を提供する。
PCT/JP2006/308327 2005-04-25 2006-04-20 試験装置、プログラム、及び記録媒体 Ceased WO2006115175A2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP06745508A EP1882957A4 (en) 2005-04-25 2006-04-20 TEST INSTRUMENT, PROGRAM AND RECORDING MEDIUM
CN2006800135854A CN101384916B (zh) 2005-04-25 2006-04-20 测试装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005126893A JP4721762B2 (ja) 2005-04-25 2005-04-25 試験装置
JP2005-126893 2005-04-25

Publications (2)

Publication Number Publication Date
WO2006115175A2 WO2006115175A2 (ja) 2006-11-02
WO2006115175A3 true WO2006115175A3 (ja) 2008-11-06

Family

ID=37188119

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2006/308327 Ceased WO2006115175A2 (ja) 2005-04-25 2006-04-20 試験装置、プログラム、及び記録媒体

Country Status (7)

Country Link
US (1) US7343259B2 (ja)
EP (1) EP1882957A4 (ja)
JP (1) JP4721762B2 (ja)
KR (1) KR100961851B1 (ja)
CN (1) CN101384916B (ja)
TW (1) TWI395967B (ja)
WO (1) WO2006115175A2 (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7362089B2 (en) * 2004-05-21 2008-04-22 Advantest Corporation Carrier module for adapting non-standard instrument cards to test systems
JP4819552B2 (ja) * 2006-03-31 2011-11-24 キヤノン株式会社 サンプリング装置、それを用いた表示装置
US7876118B2 (en) 2009-02-05 2011-01-25 Advantest Corporation Test equipment
US8094566B2 (en) * 2009-12-24 2012-01-10 Advantest Corporation Test apparatus and test method
KR101981269B1 (ko) * 2017-08-29 2019-05-22 김지용 디스플레이에서 번-인 감소 방법
CN115561566B (zh) * 2021-07-02 2025-10-28 长鑫存储技术有限公司 测试信号的时间补偿方法及装置
CN114358599B (zh) * 2022-01-05 2024-12-03 国网江苏省电力有限公司营销服务中心 一种基于混合密度深度学习的居配现场检测系统的任务时序分配方法
KR102834343B1 (ko) * 2022-12-16 2025-07-15 주식회사 엑시콘 신호 동기화를 위한 테스트 장치 및 방법
TWI885407B (zh) * 2023-07-10 2025-06-01 南亞科技股份有限公司 可攜式記憶體測試系統

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1019980A (ja) * 1996-07-03 1998-01-23 Mitsubishi Electric Corp テスト装置
JPH11190760A (ja) * 1997-12-26 1999-07-13 Advantest Corp 半導体試験装置
JP2000131388A (ja) * 1998-10-26 2000-05-12 Ando Electric Co Ltd Ｉｃ試験装置のシステム構成設定装置
JP2000147069A (ja) * 1998-11-13 2000-05-26 Fuji Xerox Co Ltd 半導体集積回路及びその試験方法
JP2002139556A (ja) * 2000-11-02 2002-05-17 Advantest Corp 半導体試験装置
JP2003156527A (ja) * 2001-11-20 2003-05-30 Advantest Corp 半導体試験装置
JP2004212291A (ja) * 2003-01-07 2004-07-29 Advantest Corp 調整装置及び試験装置
JP2005091038A (ja) * 2003-09-12 2005-04-07 Advantest Corp 試験装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6622103B1 (en) * 2000-06-20 2003-09-16 Formfactor, Inc. System for calibrating timing of an integrated circuit wafer tester
JP2003098222A (ja) * 2001-09-25 2003-04-03 Mitsubishi Electric Corp 検査用基板、検査装置及び半導体装置の検査方法
JP4251800B2 (ja) * 2001-11-08 2009-04-08 株式会社アドバンテスト 試験装置
US6735543B2 (en) * 2001-11-29 2004-05-11 International Business Machines Corporation Method and apparatus for testing, characterizing and tuning a chip interface
DE602004017327D1 (de) * 2003-08-06 2008-12-04 Advantest Corp Testvorrichtung, korrekturwert-verwaltungsverfahren und entsprechendes computerprogramm
JP4351677B2 (ja) * 2003-09-03 2009-10-28 株式会社アドバンテスト 試験装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1019980A (ja) * 1996-07-03 1998-01-23 Mitsubishi Electric Corp テスト装置
JPH11190760A (ja) * 1997-12-26 1999-07-13 Advantest Corp 半導体試験装置
JP2000131388A (ja) * 1998-10-26 2000-05-12 Ando Electric Co Ltd Ｉｃ試験装置のシステム構成設定装置
JP2000147069A (ja) * 1998-11-13 2000-05-26 Fuji Xerox Co Ltd 半導体集積回路及びその試験方法
JP2002139556A (ja) * 2000-11-02 2002-05-17 Advantest Corp 半導体試験装置
JP2003156527A (ja) * 2001-11-20 2003-05-30 Advantest Corp 半導体試験装置
JP2004212291A (ja) * 2003-01-07 2004-07-29 Advantest Corp 調整装置及び試験装置
JP2005091038A (ja) * 2003-09-12 2005-04-07 Advantest Corp 試験装置

Also Published As

Publication number Publication date
US20060241885A1 (en) 2006-10-26
CN101384916B (zh) 2011-12-28
EP1882957A4 (en) 2010-10-27
CN101384916A (zh) 2009-03-11
KR20080011298A (ko) 2008-02-01
JP2006300894A (ja) 2006-11-02
WO2006115175A2 (ja) 2006-11-02
TW200638056A (en) 2006-11-01
TWI395967B (zh) 2013-05-11
US7343259B2 (en) 2008-03-11
KR100961851B1 (ko) 2010-06-09
EP1882957A2 (en) 2008-01-30
JP4721762B2 (ja) 2011-07-13

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