WO2006038459A1 - 有機薄膜トランジスタ材料、有機薄膜トランジスタ、電界効果トランジスタ及びスイッチング素子 - Google Patents
有機薄膜トランジスタ材料、有機薄膜トランジスタ、電界効果トランジスタ及びスイッチング素子 Download PDFInfo
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- WO2006038459A1 WO2006038459A1 PCT/JP2005/017340 JP2005017340W WO2006038459A1 WO 2006038459 A1 WO2006038459 A1 WO 2006038459A1 JP 2005017340 W JP2005017340 W JP 2005017340W WO 2006038459 A1 WO2006038459 A1 WO 2006038459A1
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D333/00—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom
- C07D333/02—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings
- C07D333/04—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings not substituted on the ring sulphur atom
- C07D333/06—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings not substituted on the ring sulphur atom with only hydrogen atoms, hydrocarbon or substituted hydrocarbon radicals, directly attached to the ring carbon atoms
- C07D333/14—Radicals substituted by singly bound hetero atoms other than halogen
- C07D333/18—Radicals substituted by singly bound hetero atoms other than halogen by sulfur atoms
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
- H10K85/113—Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/649—Aromatic compounds comprising a hetero atom
- H10K85/653—Aromatic compounds comprising a hetero atom comprising only oxygen as heteroatom
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/649—Aromatic compounds comprising a hetero atom
- H10K85/655—Aromatic compounds comprising a hetero atom comprising only sulfur as heteroatom
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/649—Aromatic compounds comprising a hetero atom
- H10K85/656—Aromatic compounds comprising a hetero atom comprising two or more different heteroatoms per ring
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/464—Lateral top-gate IGFETs comprising only a single gate
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/466—Lateral bottom-gate IGFETs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K19/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00
- H10K19/10—Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00 comprising field-effect transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/615—Polycyclic condensed aromatic hydrocarbons, e.g. anthracene
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/631—Amine compounds having at least two aryl rest on at least one amine-nitrogen atom, e.g. triphenylamine
- H10K85/636—Amine compounds having at least two aryl rest on at least one amine-nitrogen atom, e.g. triphenylamine comprising heteroaromatic hydrocarbons as substituents on the nitrogen atom
Definitions
- Organic thin film transistor material organic thin film transistor, field effect transistor, and switching element
- the present invention relates to an organic thin film transistor material, an organic thin film transistor, a field effect transistor, and a switching element.
- a display medium is formed using an element using liquid crystal, organic EL, electrophoresis, or the like.
- TFT elements active drive elements
- image drive elements the technology that uses active drive elements (TFT elements) as image drive elements has become the mainstream in order to ensure uniformity of screen brightness and screen rewrite speed.
- TFT elements active drive elements
- these TFT elements are formed on a glass substrate, and liquid crystal, organic EL elements, etc. are sealed.
- TFT elements are manufactured by forming multiple layers and forming source, drain, and gate electrodes sequentially on the substrate. The manufacture of such TFT elements usually requires sputtering and other vacuum manufacturing processes.
- the substrate material since the formation of a TFT element using such a conventional Si material involves a high temperature process, the substrate material must be a material that can withstand the process temperature.
- Non-Patent Document 1 organic laser oscillation devices
- organic thin film transistors reported in many papers!
- the solution can be obtained by relatively low !, vacuum at temperature! /, Simplification of the manufacturing process by low-pressure deposition, and appropriate improvement of the molecular structure. It is thought that there is a possibility of obtaining a semiconductor that can be used, and manufacturing by a printing method including an ink jet method by inking an organic semiconductor solution is also conceivable. Manufacturing using these low-temperature processes has been considered impossible for conventional Si-based semiconductor materials, but there are possibilities for devices using organic semiconductors, so the aforementioned restrictions on substrate heat resistance are relaxed.
- a TFT element may be formed on a transparent resin substrate.
- a TFT element is formed on a transparent resin substrate and the display material can be driven by the TFT element, the display will be lighter and more flexible than conventional ones, and will not crack even if dropped. Will be difficult to crack))
- the acenes such as pentacene and tetracene have been studied so far (see, for example, Patent Document 1).
- Low molecular weight compounds such as phthalocyanines including lead phthalocyanine, perylene and its tetracarboxylic acid derivatives (see, for example, Patent Document 2), and aromatic oligomers typified by thiophene hexamers called oc chenille or sexithiophene.
- Patent Document 3 a compound in which a 5-membered heteroaromatic ring is symmetrically condensed to naphthalene or anthracene (for example, see Patent Document 4), a modified oligo and a polydithienopyridine (for example, see Patent Document 5).
- Non-Patent Documents 1 to 3 such as conjugated polymers such as polythiophene, polychelene vinylene, and poly-p-phenolene vinylene.
- conjugated polymers such as polythiophene, polychelene vinylene, and poly-p-phenolene vinylene.
- Patent Document 1 Japanese Patent Laid-Open No. 5-55568
- Patent Document 2 JP-A-5-190877
- Patent Document 3 JP-A-8-264805
- Patent Document 4 JP-A-11-195790
- Patent Document 5 Japanese Patent Laid-Open No. 2003-155289
- Patent Document 6 Japanese Patent Laid-Open No. 2003-261655
- Patent Document 7 Japanese Unexamined Patent Publication No. 2003-264327
- Patent Document 8 Japanese Unexamined Patent Application Publication No. 2003-268083
- Patent Document 9 Pamphlet of International Publication No. 03Z016599
- Patent Document 10 US Patent Application Publication No. 2003Z0105365
- Non-Patent Document 1 Science 289 ⁇ , 599 pages (2000)
- Non-Patent Document 2 “Nature” 403ature, 521 pages (2000)
- Non-Patent Document 3 "Advanced Material", 2002, No. 2, page 99
- An object of the present invention is to provide an organic thin film transistor material that has good characteristics as a transistor and further suppresses deterioration with time, and an organic thin film transistor, a field effect transistor, and a switching element using the organic thin film transistor material.
- One aspect for achieving the above object of the present invention is an organic thin film transistor material characterized by containing a compound represented by the following general formula (1).
- Al and A2 represent a conjugated structure containing an aromatic hydrocarbon ring or an aromatic heterocycle
- L represents a divalent linking group or a single bond, provided that Al and A2 sandwich L.
- Line Symmetrical relationship, each with no repeated partial structure.
- FIG. 1 is a diagram showing a configuration example of an organic TFT according to the present invention.
- FIG. 2 is an example of a schematic equivalent circuit diagram of the organic TFT of the present invention.
- An organic thin film transistor material comprising a compound represented by the following general formula (1).
- Al and A2 represent a conjugated structure containing an aromatic hydrocarbon ring or an aromatic heterocycle
- L represents a divalent linking group or a single bond, provided that Al and A2 sandwich L.
- Line Symmetrical relationship, each with no repeated partial structure.
- the divalent linking group represented by L is a substituted or unsubstituted carbon chain, O, 1 S—, N (R) — (where R is hydrogen or an alkyl group), an aromatic hydrocarbon ring or an aromatic heterocycle.
- An organic thin film transistor wherein the organic thin film transistor material according to any one of (1) to (4) is used for a channel layer.
- It is composed of an organic charge transporting material and a gate electrode that is in direct or indirect contact with the organic charge transporting material, and by applying a charge between the gate electrode and the organic charge transporting material,
- a field effect transistor characterized by.
- an organic TFT material useful for thin film transistor applications can be obtained by using the structure defined in any one of the forces (1) to (4).
- the organic TFT of the present invention manufactured using the organic TFT material and the field effect transistor of the present invention have a ratio of the maximum current value to the minimum current value when the gate voltage with high carrier mobility is changed, In other words, it showed excellent transistor characteristics such as good ONZOFF characteristics and high durability.
- a switching element manufactured using the organic TFT or the field effect transistor exhibits good switching characteristics.
- the compound represented by the general formula (1) according to the present invention is (line) symmetric with respect to L, and by using this, an ideally arranged semiconductor layer can be obtained and the transistor characteristics can be improved. Can be expected.
- the solvent solubility tends to deteriorate depending on the structure, which becomes a negative factor when the semiconductor layer is formed by coating.
- the organic thin film transistor material of the present invention will be described.
- examples of the aromatic heterocycle in Al and A2 include, for example, pyridine, pyrimidine, furan, pyrrole, imidazole, benzimidazole, pyrazole, pyrazine, triazole (for example, 1, 2, 4 triazole, 1, 2, 3 triazole, etc.), oxazole, benzoxazole, thiazole, isoxazole, isothiazole, thiof , Quinoline, benzofuran, dibenzofuran, benzothiene phen, dibenzothiphen phen, indole, carbazole, carbolyl, diaza force rubazole (in which one of the carbon atoms constituting the carboline ring is replaced by a nitrogen atom), quinoxaline, Pyridazine, triazinin, quinazoline, phthalazine and the like can be mentioned.
- the aromatic heterocyclic ring may be unsubstituted or may have a substituent.
- substituents include an alkyl group (for example, a methyl group, an ethyl group, a propyl group, an isopropyl group, a tert-butyl group).
- aryl group for example, phenyl group, naphthyl group, etc.
- aromatic heterocyclic group for example, furyl group, chenyl group, pyridyl group, pyridazyl group, pyrimidinyl group, Pyrazol group, triazinyl group, imidazolyl group, pyrazolyl group, thiazolyl group, quinazolyl group, phthalazinyl group, etc.
- heterocyclic group for example, pyrrolidyl group, imidazolidyl group, morpholyl group, oxazolidyl group, etc.
- alkoxyl group for example, a methoxy group, an ethoxy group, a propyloxy group, a pentyloxy group, a hexyloxy group, an octyloxy group, a dodecyloxy group
- examples of the aromatic hydrocarbon ring represented by Al and A2 include benzene, naphthalene, anthracene, phenanthrene, pentaphen, pentacene, and the like. It may be substituted with a substituent.
- Al and A2 have the above-mentioned aromatic hydrocarbon ring and aromatic heterocyclic ring in a common structure, and the aromatic hydrocarbon ring and aromatic heterocyclic ring are 5-membered rings. Or a 6-membered ring may form a conjugated structure, and a 5-membered ring and a 6-membered ring may form a conjugated structure.
- Al and A2 are in a (line) symmetrical relationship with L interposed therebetween, and each has a repeated partial structure.
- “having a repeated partial structure,” means that, for example, both of Al and A2,-(B)-(B represents a repeating unit structure, and n represents an integer of 2 or more. It means that there is no part that can be expressed like).
- the switching element is sometimes referred to as an organic TFT element depending on its usage, and is sometimes referred to as a field effect transistor element.
- the organic TFT material of the present invention can be used for a channel layer of an organic TFT or a field effect transistor, thereby providing a switching element (also referred to as a transistor device) that is driven satisfactorily.
- An organic TFT organic thin film transistor
- a bottom gate type having a gate electrode on a body and having a source electrode and a drain electrode connected by an organic semiconductor channel through a gate insulating layer.
- An organic thin film comprising the compound represented by the general formula (1) according to the present invention.
- the film transistor material in the channel (also called channel layer) of the switching element using organic TFT or field effect transistor it can be installed on the substrate by vacuum evaporation. It is preferable to install the solution prepared by adding additives as necessary on the substrate by cast coating, spin coating, printing, ink jet method, abrasion method or the like.
- the solvent for dissolving the organic TFT material of the present invention is not particularly limited as long as it can prepare a solution having an appropriate concentration by dissolving the organic TFT material.
- Chain ether solvents such as diethyl ether and diisopropyl ether, cyclic ether solvents such as tetrahydrofuran and dioxane, keton solvents such as acetone methylethyl ketone, halogens such as chloroform and 1,2-dichloroethane.
- aromatic solvents such as alkyl halide solvents, toluene, o-dichlorobenzene, nitrobenzene, m-taresol, N-methylpyrrolidone, and carbon dioxide disulfide.
- the material for forming the source electrode, the drain electrode, and the gate electrode is not particularly limited as long as it is a conductive material.
- conductive polymer whose conductivity has been improved by doping or the like, for example, conductive polyarine, conductive polypyrrole, conductive polythiophene, a complex of polyethylene dioxythiophene and polystyrene sulfonic acid, etc. is also suitably used. It is done. Among them, those having low electric resistance at the contact surface with the semiconductor layer are preferable.
- a method for forming an electrode a method of forming a conductive thin film formed by using a method such as vapor deposition or sputtering using the above as a raw material by using a known photolithography method or a lift-off method, aluminum, copper, etc.
- a method of etching on a metal foil using a resist by thermal transfer, ink jet or the like Alternatively, the conductive polymer solution or dispersion, or the conductive fine particle dispersion may be directly patterned by ink jetting, or may be formed from the coating film by lithography or laser ablation.
- a method of patterning an ink containing a conductive polymer or conductive fine particles, a conductive paste, or the like by a printing method such as relief printing, intaglio printing, lithographic printing, or screen printing can also be used.
- an inorganic oxide film having a high relative dielectric constant is preferable.
- inorganic oxides include silicon oxide, aluminum oxide, tantalum oxide, titanium oxide, tin oxide, vanadium oxide, barium strontium titanate, barium zirconate titanate, lead zirconate titanate, titanate
- examples include lead lanthanum, strontium titanate, barium titanate, magnesium barium fluoride, bismuth titanate, strontium bismuth titanate, strontium bismuth tantanoate, bismuth tantalate niobate, and yttrium trioxide.
- acid silicate, acid aluminum, acid tantalum, and acid titanium are preferred.
- Inorganic nitrides such as silicon nitride and aluminum nitride can also be suitably used.
- Examples of the method for forming the coating include vacuum deposition, molecular beam epitaxy, ion cluster beam, low energy ion beam, ion plating, CVD, sputtering, and atmospheric pressure plasma. Dry process, spray coating method, spin coating method, blade coating method, dip coating method, casting method, roll coating method, bar coating method, die coating method and other coating methods, printing and ink jet patterning methods, etc. Can be used depending on the material.
- the wet process includes a method of applying and drying a liquid in which fine particles of inorganic oxide are dispersed in an arbitrary organic solvent or water using a dispersion aid such as a surfactant as necessary.
- a so-called sol-gel method in which a solution of a chemical precursor, for example, an alkoxide body is applied and dried is used.
- the atmospheric pressure plasma method and the sol-gel method are preferable.
- a method for forming an insulating film by plasma film formation under atmospheric pressure is atmospheric pressure or atmospheric pressure.
- the method is described in JP-A-11-61406, JP-A-11-133205, JP2000- No. 121804, No. 2000-147209, No. 2000-185362, etc. (hereinafter also referred to as atmospheric pressure plasma method).
- atmospheric pressure plasma method As a result, a highly functional thin film can be formed with high productivity.
- organic compound film polyimides, polyamides, polyesters, polyacrylates, photo-radical polymerization-type, photo-power thione polymerization-type photocurable resins, or copolymers containing acrylonitrile components, polybules Phenolic alcohol, polybutyl alcohol, novolac resin, cyano ethyl pullulan, and the like can also be used.
- the wet process is preferred as the method for forming the organic compound film.
- An inorganic oxide film and an organic oxide film can be laminated and used together. The thickness of these insulating films is generally 50 ⁇ ! ⁇ 3 m, preferably 100 nm to l ⁇ m.
- the support is composed of glass or a flexible resin sheet, and for example, a plastic film can be used as the sheet.
- the plastic film include polyethylene terephthalate (PET), polyethylene naphthalate (PEN), polyethersulfone (PES), polyetherimide, polyetheretherketone, polyethylene-sulfuride, polyarylate, polyimide, polycarbonate ( PC), cellulose triacetate (TAC), and cellulose acetate propionate (CAP).
- a field effect transistor using an organic thin film formed using the organic TFT material of the present invention will be described below.
- FIG. 1 is a diagram showing a configuration example of an organic TFT according to the present invention.
- a source electrode 2 and a drain electrode 3 are formed on a support 6 with a metal foil or the like, and an organic semiconductor layer 1 made of the organic TFT material of the present invention is formed between both electrodes.
- a field effect transistor is formed by forming an insulating layer 5 on the substrate and further forming a gate electrode 4 thereon.
- B) shows the organic semiconductor layer 1 formed between the electrodes in (a). It represents what was formed so that the whole support body surface might be covered.
- C shows that the organic semiconductor layer 1 is first formed on the support 6 by using a coating method or the like, and then the source electrode 2, the drain electrode 3, the insulating layer 5, and the gate electrode 4 are formed.
- FIG. 4D after forming the gate electrode 4 with a metal foil or the like on the support 6, the insulating layer 5 is formed, and the source electrode 2 and the drain electrode 3 are formed with the metal foil or the like thereon. Then, an organic semiconductor layer 1 made of the organic TFT material of the present invention is formed between the electrodes. In addition, it is possible to adopt a configuration as shown in FIGS.
- FIG. 2 is a diagram showing an example of a schematic equivalent circuit diagram of an organic TFT sheet.
- the organic TFT sheet 10 has a large number of organic TFTs 11 arranged in a matrix.
- 7 is a gate bus line of each TF T11
- 8 is a source bus line of each TFT11.
- An output element 12 is connected to the source electrode of each TFT 11, and this output 12 is, for example, a liquid crystal, an electrophoretic element or the like, and constitutes a pixel in the display device.
- the pixel electrode may be used as an input electrode of the photosensor.
- liquid crystal is shown as an output element in an equivalent circuit having resistance and capacitor power.
- 13 is a storage capacitor
- 14 is a vertical drive circuit
- 15 is a horizontal drive circuit.
- organic thin film transistor element 2 was prepared in the same manner as the organic thin film transistor element 1, except that the comparative compound ⁇ 1> was replaced with the comparative compound ⁇ 2> (pentacene, a commercially available reagent manufactured by Aldrich). did. Further, organic thin film transistor elements 3 to 8 were produced in the same manner as the organic thin film transistor element 1 except that the comparative compound ⁇ 1> was replaced with the exemplified compound according to the present invention shown in Table 1.
- the organic thin film transistor elements 1 to 8 fabricated as described above showed good operating characteristics of p-channel encapsulated FETs. Further, for the organic thin film transistor elements 1 to 8, the saturation region force carrier mobility of the I-V characteristic is obtained, and further the ONZOFF ratio (the drain current value ratio when the drain bias is 50 V and the gate bias is 50 V and OV) is obtained. It was. The obtained device was left in the atmosphere for one month, and the carrier mobility and ONZO FF ratio were obtained again. The results are shown in Table 1.
- an organic thin film transistor material having good characteristics as a transistor and further suppressed deterioration over time, an organic thin film transistor using the same, a field effect transistor, and a switching element.
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- Thin Film Transistor (AREA)
Abstract
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006539217A JPWO2006038459A1 (ja) | 2004-10-01 | 2005-09-21 | 有機薄膜トランジスタ材料、有機薄膜トランジスタ、電界効果トランジスタ及びスイッチング素子 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004289866 | 2004-10-01 | ||
| JP2004-289866 | 2004-10-01 |
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| Publication Number | Publication Date |
|---|---|
| WO2006038459A1 true WO2006038459A1 (ja) | 2006-04-13 |
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| PCT/JP2005/017340 Ceased WO2006038459A1 (ja) | 2004-10-01 | 2005-09-21 | 有機薄膜トランジスタ材料、有機薄膜トランジスタ、電界効果トランジスタ及びスイッチング素子 |
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| WO (1) | WO2006038459A1 (ja) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008127375A (ja) * | 2006-11-24 | 2008-06-05 | Osaka Univ | 分岐型化合物、これを用いた有機薄膜及び有機薄膜素子 |
| WO2008090969A1 (ja) * | 2007-01-26 | 2008-07-31 | Toray Industries, Inc. | 有機半導体コンポジット、有機トランジスタ材料ならびに有機電界効果型トランジスタ |
| US8026369B2 (en) | 2007-01-24 | 2011-09-27 | Samsung Electronics Co., Ltd. | Composition containing thiazole rings, organic semiconductor polymer containing the composition, organic active layer containing the organic semiconductor polymer, organic thin film transistor containing the organic active layer, electronic device containing the organic thin film transistor and method of preparing the same |
| CN104119327A (zh) * | 2013-04-25 | 2014-10-29 | 海洋王照明科技股份有限公司 | 一种有机半导体材料、制备方法和电致发光器件 |
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| JPH10190001A (ja) * | 1996-12-20 | 1998-07-21 | Lucent Technol Inc | 有機薄膜トランジスタの製造方法 |
| JP2004006747A (ja) * | 2002-04-18 | 2004-01-08 | Konica Minolta Holdings Inc | 有機半導体材料、これを用いた有機トランジスタ、電界効果トランジスタ及びスイッチング素子 |
| JP2004165257A (ja) * | 2002-11-11 | 2004-06-10 | Konica Minolta Holdings Inc | 有機薄膜トランジスタ素子 |
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| JP2004273678A (ja) * | 2003-03-07 | 2004-09-30 | Konica Minolta Holdings Inc | 有機薄膜トランジスタ |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004214482A (ja) * | 2003-01-07 | 2004-07-29 | Konica Minolta Holdings Inc | 有機半導体材料および有機薄膜トランジスタ |
-
2005
- 2005-09-21 WO PCT/JP2005/017340 patent/WO2006038459A1/ja not_active Ceased
- 2005-09-21 JP JP2006539217A patent/JPWO2006038459A1/ja active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08191162A (ja) * | 1995-01-09 | 1996-07-23 | Matsushita Electric Ind Co Ltd | 電界効果トランジスタ |
| JPH10190001A (ja) * | 1996-12-20 | 1998-07-21 | Lucent Technol Inc | 有機薄膜トランジスタの製造方法 |
| JP2004006747A (ja) * | 2002-04-18 | 2004-01-08 | Konica Minolta Holdings Inc | 有機半導体材料、これを用いた有機トランジスタ、電界効果トランジスタ及びスイッチング素子 |
| JP2004165257A (ja) * | 2002-11-11 | 2004-06-10 | Konica Minolta Holdings Inc | 有機薄膜トランジスタ素子 |
| JP2004186695A (ja) * | 2002-12-04 | 2004-07-02 | Merck Patent Gmbh | モノ、オリゴおよびポリビス(チエニル)アリーレン並びに電荷移動材料としてのこれらの使用 |
| JP2004273678A (ja) * | 2003-03-07 | 2004-09-30 | Konica Minolta Holdings Inc | 有機薄膜トランジスタ |
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| JP2008127375A (ja) * | 2006-11-24 | 2008-06-05 | Osaka Univ | 分岐型化合物、これを用いた有機薄膜及び有機薄膜素子 |
| US8026369B2 (en) | 2007-01-24 | 2011-09-27 | Samsung Electronics Co., Ltd. | Composition containing thiazole rings, organic semiconductor polymer containing the composition, organic active layer containing the organic semiconductor polymer, organic thin film transistor containing the organic active layer, electronic device containing the organic thin film transistor and method of preparing the same |
| US8154016B2 (en) | 2007-01-24 | 2012-04-10 | Samsung Electronics Co., Ltd. | Composition containing thiazole rings, organic semiconductor polymer containing the composition, organic active layer containing the organic semiconductor polymer, organic thin film transistor containing the organic active layer, electronic device containing the organic thin film transistor and method of preparing the same |
| KR101430260B1 (ko) | 2007-01-24 | 2014-08-14 | 삼성전자주식회사 | 티아졸 함유 유기반도체 고분자, 이의 제조방법 및 이를이용한 유기박막트랜지스터 |
| WO2008090969A1 (ja) * | 2007-01-26 | 2008-07-31 | Toray Industries, Inc. | 有機半導体コンポジット、有機トランジスタ材料ならびに有機電界効果型トランジスタ |
| US8441002B2 (en) | 2007-01-26 | 2013-05-14 | Toray Industries, Inc. | Organic semiconductor composite, organic transistor material and organic field effect transistor |
| CN104119327A (zh) * | 2013-04-25 | 2014-10-29 | 海洋王照明科技股份有限公司 | 一种有机半导体材料、制备方法和电致发光器件 |
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