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USD1110279S1 - Contact pin for integrated circuit testing - Google Patents

Contact pin for integrated circuit testing

Info

Publication number
USD1110279S1
USD1110279S1 US29/941,010 US202429941010F USD1110279S US D1110279 S1 USD1110279 S1 US D1110279S1 US 202429941010 F US202429941010 F US 202429941010F US D1110279 S USD1110279 S US D1110279S
Authority
US
United States
Prior art keywords
integrated circuit
contact pin
circuit testing
testing
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/941,010
Inventor
Melissa Hasskamp
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Johnstech International Corp
Original Assignee
Johnstech International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US29/833,520 external-priority patent/USD1042345S1/en
Priority claimed from US29/843,097 external-priority patent/USD1042346S1/en
Priority claimed from US29/917,131 external-priority patent/USD1075695S1/en
Priority to US29/941,010 priority Critical patent/USD1110279S1/en
Application filed by Johnstech International Corp filed Critical Johnstech International Corp
Priority to CA230209F priority patent/CA230209S/en
Priority to JP2024009846F priority patent/JP1790958S/en
Priority to TW113302296F priority patent/TWD238957S/en
Priority to TW113302296D01F priority patent/TWD238958S/en
Publication of USD1110279S1 publication Critical patent/USD1110279S1/en
Application granted granted Critical
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Description

FIG. 1 is a top front right side perspective view of a contact pin for integrated circuit testing showing my new design.
FIG. 2 is a bottom rear left side perspective view thereof.
FIG. 3 is a front view thereof.
FIG. 4 is a rear view thereof.
FIG. 5 is a left view thereof.
FIG. 6 is a right view thereof.
FIG. 7 is a top view thereof; and,
FIG. 8 is a bottom view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a contact pin for integrated circuit testing as shown and described.
US29/941,010 2022-04-05 2024-05-07 Contact pin for integrated circuit testing Active USD1110279S1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
US29/941,010 USD1110279S1 (en) 2022-04-05 2024-05-07 Contact pin for integrated circuit testing
CA230209F CA230209S (en) 2023-11-17 2024-05-13 Contact pin for integrated circuit testing
TW113302296D01F TWD238958S (en) 2023-11-17 2024-05-16 Contact pin for integrated circuit testing
TW113302296F TWD238957S (en) 2023-11-17 2024-05-16 Contact pin for integrated circuit testing
JP2024009846F JP1790958S (en) 2023-11-17 2024-05-16 Electrical Connection Pins

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US29/833,520 USD1042345S1 (en) 2022-04-05 2022-04-05 Test pin
US29/843,097 USD1042346S1 (en) 2022-04-05 2022-06-17 Contact pin for integrated circuit testing
US29/917,131 USD1075695S1 (en) 2022-04-05 2023-11-17 Contact pin for integrated circuit testing
US29/941,010 USD1110279S1 (en) 2022-04-05 2024-05-07 Contact pin for integrated circuit testing

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US29/917,131 Continuation-In-Part USD1075695S1 (en) 2022-04-05 2023-11-17 Contact pin for integrated circuit testing

Publications (1)

Publication Number Publication Date
USD1110279S1 true USD1110279S1 (en) 2026-01-27

Family

ID=98521198

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/941,010 Active USD1110279S1 (en) 2022-04-05 2024-05-07 Contact pin for integrated circuit testing

Country Status (1)

Country Link
US (1) USD1110279S1 (en)

Citations (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US72532A (en) * 1867-12-24 Harvey d
IL72532A0 (en) * 1984-07-29 1984-11-30 Shai Tarapaz Front support particularly for typists
US5639247A (en) 1994-05-09 1997-06-17 Johnstech International Corporation Contacting system for electrical devices
US5841640A (en) 1996-08-02 1998-11-24 Yamaichi Electronics Co., Ltd. IC socket
US5947749A (en) 1996-07-02 1999-09-07 Johnstech International Corporation Electrical interconnect contact system
US6854981B2 (en) 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US7059866B2 (en) 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
USD524248S1 (en) * 2002-11-12 2006-07-04 Ilsco Corporation Interconnect for electrically connecting plural electrically conductive neutral bars in fixed spaced-apart relationship
US7445465B2 (en) 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
US7632106B2 (en) 2007-08-09 2009-12-15 Yamaichi Electronics Co., Ltd. IC socket to be mounted on a circuit board
US7639026B2 (en) 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
US7771220B2 (en) 2008-10-20 2010-08-10 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
US7819672B2 (en) 2006-10-12 2010-10-26 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus with inclined probe recess surfaces
US7914295B2 (en) 2008-11-12 2011-03-29 Yamaichi Electronics Co., Ltd. Electrical connecting device
USD711836S1 (en) * 2013-07-10 2014-08-26 Johnstech International Corporation Articulating contact pin
USD719923S1 (en) * 2014-05-15 2014-12-23 Johnstech International Corporation Articulating contact pin
USD727269S1 (en) * 2014-01-29 2015-04-21 Johnstech International Corporation Articulating contact pin
US20160161528A1 (en) 2010-04-21 2016-06-09 Johnstech International Corporation Wafer Level Integrated Circuit Contactor and Method of Construction
US20160370406A1 (en) 2013-03-15 2016-12-22 Johnstech International Corporation On-Center Electrically Conductive Pins For Integrated Testing
USD807294S1 (en) * 2016-04-25 2018-01-09 Phoenix Contact Gmbh & Co. Kg Contact for electrical connector
US9958499B1 (en) * 2015-07-07 2018-05-01 Johnstech International Corporation Constant stress pin tip for testing integrated circuit chips
US10114039B1 (en) * 2015-04-24 2018-10-30 Johnstech International Corporation Selectively geometric shaped contact pin for electronic component testing and method of fabrication
US10436819B1 (en) * 2015-07-07 2019-10-08 Johnstech International Corporation Constant pressure pin tip for testing integrated circuit chips
USD1042345S1 (en) * 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
USD1042346S1 (en) * 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing
USD1042344S1 (en) * 2021-09-29 2024-09-17 Johnstech International Corporation Contact
USD1075695S1 (en) * 2022-04-05 2025-05-20 Johnstech International Corporation Contact pin for integrated circuit testing
TWD238958S (en) * 2023-11-17 2025-06-21 美商瓊斯科技國際公司 (美國) Contact pin for integrated circuit testing

Patent Citations (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US72532A (en) * 1867-12-24 Harvey d
IL72532A0 (en) * 1984-07-29 1984-11-30 Shai Tarapaz Front support particularly for typists
US5639247A (en) 1994-05-09 1997-06-17 Johnstech International Corporation Contacting system for electrical devices
US5947749A (en) 1996-07-02 1999-09-07 Johnstech International Corporation Electrical interconnect contact system
US5841640A (en) 1996-08-02 1998-11-24 Yamaichi Electronics Co., Ltd. IC socket
US6854981B2 (en) 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
USD524248S1 (en) * 2002-11-12 2006-07-04 Ilsco Corporation Interconnect for electrically connecting plural electrically conductive neutral bars in fixed spaced-apart relationship
US7059866B2 (en) 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
US7445465B2 (en) 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
US7639026B2 (en) 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
US7819672B2 (en) 2006-10-12 2010-10-26 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus with inclined probe recess surfaces
US7632106B2 (en) 2007-08-09 2009-12-15 Yamaichi Electronics Co., Ltd. IC socket to be mounted on a circuit board
US7771220B2 (en) 2008-10-20 2010-08-10 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
US7914295B2 (en) 2008-11-12 2011-03-29 Yamaichi Electronics Co., Ltd. Electrical connecting device
US20160161528A1 (en) 2010-04-21 2016-06-09 Johnstech International Corporation Wafer Level Integrated Circuit Contactor and Method of Construction
US20160370406A1 (en) 2013-03-15 2016-12-22 Johnstech International Corporation On-Center Electrically Conductive Pins For Integrated Testing
USD711836S1 (en) * 2013-07-10 2014-08-26 Johnstech International Corporation Articulating contact pin
USD727269S1 (en) * 2014-01-29 2015-04-21 Johnstech International Corporation Articulating contact pin
USD749526S1 (en) * 2014-01-29 2016-02-16 Johnstech International Corporation Articulating contact pin
USD719923S1 (en) * 2014-05-15 2014-12-23 Johnstech International Corporation Articulating contact pin
US10114039B1 (en) * 2015-04-24 2018-10-30 Johnstech International Corporation Selectively geometric shaped contact pin for electronic component testing and method of fabrication
US10436819B1 (en) * 2015-07-07 2019-10-08 Johnstech International Corporation Constant pressure pin tip for testing integrated circuit chips
US9958499B1 (en) * 2015-07-07 2018-05-01 Johnstech International Corporation Constant stress pin tip for testing integrated circuit chips
USD807294S1 (en) * 2016-04-25 2018-01-09 Phoenix Contact Gmbh & Co. Kg Contact for electrical connector
USD1042344S1 (en) * 2021-09-29 2024-09-17 Johnstech International Corporation Contact
USD1042345S1 (en) * 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
USD1042346S1 (en) * 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing
USD1075695S1 (en) * 2022-04-05 2025-05-20 Johnstech International Corporation Contact pin for integrated circuit testing
TWD238958S (en) * 2023-11-17 2025-06-21 美商瓊斯科技國際公司 (美國) Contact pin for integrated circuit testing
TWD238957S (en) * 2023-11-17 2025-06-21 美商瓊斯科技國際公司 (美國) Contact pin for integrated circuit testing

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
Audiohobby. Link: https://www.audiohobby.eu/en/mundorf-m-construct-posts/10544-mundorf-contact-pin-straight-48mm.html. Visited Sep. 11, 2025. Mundorf Contact pin, straight, 4.8mm (Year: 2025). *
Contact Technologies Inc. Link: https://contactechnologies.com/Electrical-Contacts.htm. Visited Feb. 22, 2024. Customized Electrical Contacts Produced by Means of Powder Metallurgy. (Year: 2024). *
International Search Report and Written Opinion, International Patent Application No. PCT/US22/79030, Feb. 7, 2023 (9 pages).
Audiohobby. Link: https://www.audiohobby.eu/en/mundorf-m-construct-posts/10544-mundorf-contact-pin-straight-48mm.html. Visited Sep. 11, 2025. Mundorf Contact pin, straight, 4.8mm (Year: 2025). *
Contact Technologies Inc. Link: https://contactechnologies.com/Electrical-Contacts.htm. Visited Feb. 22, 2024. Customized Electrical Contacts Produced by Means of Powder Metallurgy. (Year: 2024). *
International Search Report and Written Opinion, International Patent Application No. PCT/US22/79030, Feb. 7, 2023 (9 pages).

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