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USD1075695S1 - Contact pin for integrated circuit testing - Google Patents

Contact pin for integrated circuit testing Download PDF

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Publication number
USD1075695S1
USD1075695S1 US29/917,131 US202329917131F USD1075695S US D1075695 S1 USD1075695 S1 US D1075695S1 US 202329917131 F US202329917131 F US 202329917131F US D1075695 S USD1075695 S US D1075695S
Authority
US
United States
Prior art keywords
integrated circuit
contact pin
circuit testing
testing
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/917,131
Inventor
Melissa Hasskamp
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Johnstech International Corp
Original Assignee
Johnstech International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US29/833,520 external-priority patent/USD1042345S1/en
Priority claimed from US29/843,097 external-priority patent/USD1042346S1/en
Priority to US29/917,131 priority Critical patent/USD1075695S1/en
Application filed by Johnstech International Corp filed Critical Johnstech International Corp
Priority to US29/941,010 priority patent/USD1110279S1/en
Priority to CA230209F priority patent/CA230209S/en
Priority to JP2024009846F priority patent/JP1790958S/en
Priority to TW113302296D01F priority patent/TWD238958S/en
Priority to TW113302296F priority patent/TWD238957S/en
Assigned to JOHNSTECH INTERNATIONAL CORPORATION reassignment JOHNSTECH INTERNATIONAL CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HASSKAMP, Melissa
Publication of USD1075695S1 publication Critical patent/USD1075695S1/en
Application granted granted Critical
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a Top Front Right Side Perspective view of a contact pin for integrated circuit testing showing my new design.
FIG. 2 is a Bottom Rear Left Side Perspective view thereof.
FIG. 3 is a Front view thereof.
FIG. 4 is a Rear view thereof.
FIG. 5 is a Left view thereof.
FIG. 6 is a Right view thereof.
FIG. 7 is a Top view thereof; and,
FIG. 8 is a Bottom view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a contact pin for integrated circuit testing as shown and described.
US29/917,131 2022-04-05 2023-11-17 Contact pin for integrated circuit testing Active USD1075695S1 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
US29/917,131 USD1075695S1 (en) 2022-04-05 2023-11-17 Contact pin for integrated circuit testing
US29/941,010 USD1110279S1 (en) 2022-04-05 2024-05-07 Contact pin for integrated circuit testing
CA230209F CA230209S (en) 2023-11-17 2024-05-13 Contact pin for integrated circuit testing
JP2024009846F JP1790958S (en) 2023-11-17 2024-05-16 Electrical Connection Pins
TW113302296D01F TWD238958S (en) 2023-11-17 2024-05-16 Contact pin for integrated circuit testing
TW113302296F TWD238957S (en) 2023-11-17 2024-05-16 Contact pin for integrated circuit testing

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US29/833,520 USD1042345S1 (en) 2022-04-05 2022-04-05 Test pin
US29/843,097 USD1042346S1 (en) 2022-04-05 2022-06-17 Contact pin for integrated circuit testing
US29/917,131 USD1075695S1 (en) 2022-04-05 2023-11-17 Contact pin for integrated circuit testing

Related Parent Applications (2)

Application Number Title Priority Date Filing Date
US29/833,520 Continuation-In-Part USD1042345S1 (en) 2022-04-05 2022-04-05 Test pin
US29/843,097 Continuation-In-Part USD1042346S1 (en) 2022-04-05 2022-06-17 Contact pin for integrated circuit testing

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US29/941,010 Continuation-In-Part USD1110279S1 (en) 2022-04-05 2024-05-07 Contact pin for integrated circuit testing

Publications (1)

Publication Number Publication Date
USD1075695S1 true USD1075695S1 (en) 2025-05-20

Family

ID=95706027

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/917,131 Active USD1075695S1 (en) 2022-04-05 2023-11-17 Contact pin for integrated circuit testing

Country Status (1)

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US (1) USD1075695S1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1110279S1 (en) * 2022-04-05 2026-01-27 Johnstech International Corporation Contact pin for integrated circuit testing

Citations (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0070939A2 (en) * 1981-07-31 1983-02-09 Brunswick Corporation Snap-in anti-reverse selector
EP0072532A1 (en) * 1981-08-14 1983-02-23 Hoechst Aktiengesellschaft 5(6)-Phenyl-sulfonyloxy-benzimidazole derivatives, process for their production, pharmaceutical compositions containing them and their use against liver disorders
IL70939A0 (en) * 1983-03-15 1984-05-31 Skf Steel Eng Ab Means for electrically heating gases
IL72532A0 (en) * 1984-07-29 1984-11-30 Shai Tarapaz Front support particularly for typists
US5639247A (en) 1994-05-09 1997-06-17 Johnstech International Corporation Contacting system for electrical devices
US5823801A (en) * 1996-08-05 1998-10-20 The Whitaker Corporation Electrical connector having thin contacts with surface mount edges
US5841640A (en) 1996-08-02 1998-11-24 Yamaichi Electronics Co., Ltd. IC socket
US5899755A (en) * 1996-03-14 1999-05-04 Johnstech International Corporation Integrated circuit test socket with enhanced noise imminity
US5947749A (en) 1996-07-02 1999-09-07 Johnstech International Corporation Electrical interconnect contact system
EP1199735A2 (en) * 2000-09-04 2002-04-24 ABB Schweiz AG Manufacturing method for an ennobled coated contact finger
US6854981B2 (en) 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US7059866B2 (en) 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
USD524757S1 (en) * 2002-11-12 2006-07-11 Ilsco Corporation Interconnect for electrically connecting plural electrically conductive neutral bars in fixed spaced-apart relationship
US7445465B2 (en) 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
US7632106B2 (en) 2007-08-09 2009-12-15 Yamaichi Electronics Co., Ltd. IC socket to be mounted on a circuit board
US7639026B2 (en) 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
US7771220B2 (en) 2008-10-20 2010-08-10 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
US7819672B2 (en) 2006-10-12 2010-10-26 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus with inclined probe recess surfaces
US7914295B2 (en) 2008-11-12 2011-03-29 Yamaichi Electronics Co., Ltd. Electrical connecting device
US20140134899A1 (en) * 2011-06-13 2014-05-15 Gyeong-Hwa Na Pin for a semiconductor chip test, and socket for a semiconductor chip test including same
USD719923S1 (en) * 2014-05-15 2014-12-23 Johnstech International Corporation Articulating contact pin
USD727269S1 (en) * 2014-01-29 2015-04-21 Johnstech International Corporation Articulating contact pin
US20160161528A1 (en) 2010-04-21 2016-06-09 Johnstech International Corporation Wafer Level Integrated Circuit Contactor and Method of Construction
US20160370406A1 (en) 2013-03-15 2016-12-22 Johnstech International Corporation On-Center Electrically Conductive Pins For Integrated Testing
US10114039B1 (en) * 2015-04-24 2018-10-30 Johnstech International Corporation Selectively geometric shaped contact pin for electronic component testing and method of fabrication
TWD228536S (en) 2022-10-12 2023-11-11 日商日本麥克隆尼股份有限公司 Part of electric contact
USD1042345S1 (en) * 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
USD1042346S1 (en) * 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing
USD1042344S1 (en) * 2021-09-29 2024-09-17 Johnstech International Corporation Contact
USD1042357S1 (en) * 2021-09-29 2024-09-17 Johnstech International Corporation Anti pinching contact

Patent Citations (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0070939A2 (en) * 1981-07-31 1983-02-09 Brunswick Corporation Snap-in anti-reverse selector
EP0072532A1 (en) * 1981-08-14 1983-02-23 Hoechst Aktiengesellschaft 5(6)-Phenyl-sulfonyloxy-benzimidazole derivatives, process for their production, pharmaceutical compositions containing them and their use against liver disorders
IL70939A0 (en) * 1983-03-15 1984-05-31 Skf Steel Eng Ab Means for electrically heating gases
IL72532A0 (en) * 1984-07-29 1984-11-30 Shai Tarapaz Front support particularly for typists
US5639247A (en) 1994-05-09 1997-06-17 Johnstech International Corporation Contacting system for electrical devices
US5899755A (en) * 1996-03-14 1999-05-04 Johnstech International Corporation Integrated circuit test socket with enhanced noise imminity
US5947749A (en) 1996-07-02 1999-09-07 Johnstech International Corporation Electrical interconnect contact system
US5841640A (en) 1996-08-02 1998-11-24 Yamaichi Electronics Co., Ltd. IC socket
US5823801A (en) * 1996-08-05 1998-10-20 The Whitaker Corporation Electrical connector having thin contacts with surface mount edges
EP1199735A2 (en) * 2000-09-04 2002-04-24 ABB Schweiz AG Manufacturing method for an ennobled coated contact finger
US6854981B2 (en) 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
USD524757S1 (en) * 2002-11-12 2006-07-11 Ilsco Corporation Interconnect for electrically connecting plural electrically conductive neutral bars in fixed spaced-apart relationship
US7059866B2 (en) 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
US7445465B2 (en) 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
US7639026B2 (en) 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
US7819672B2 (en) 2006-10-12 2010-10-26 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus with inclined probe recess surfaces
US7632106B2 (en) 2007-08-09 2009-12-15 Yamaichi Electronics Co., Ltd. IC socket to be mounted on a circuit board
US7771220B2 (en) 2008-10-20 2010-08-10 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
US7914295B2 (en) 2008-11-12 2011-03-29 Yamaichi Electronics Co., Ltd. Electrical connecting device
US20160161528A1 (en) 2010-04-21 2016-06-09 Johnstech International Corporation Wafer Level Integrated Circuit Contactor and Method of Construction
US20140134899A1 (en) * 2011-06-13 2014-05-15 Gyeong-Hwa Na Pin for a semiconductor chip test, and socket for a semiconductor chip test including same
US20160370406A1 (en) 2013-03-15 2016-12-22 Johnstech International Corporation On-Center Electrically Conductive Pins For Integrated Testing
USD727269S1 (en) * 2014-01-29 2015-04-21 Johnstech International Corporation Articulating contact pin
USD749525S1 (en) * 2014-01-29 2016-02-16 Johnstech International Corporation Articulating contact pin
USD749526S1 (en) * 2014-01-29 2016-02-16 Johnstech International Corporation Articulating contact pin
USD719923S1 (en) * 2014-05-15 2014-12-23 Johnstech International Corporation Articulating contact pin
US10114039B1 (en) * 2015-04-24 2018-10-30 Johnstech International Corporation Selectively geometric shaped contact pin for electronic component testing and method of fabrication
USD1042344S1 (en) * 2021-09-29 2024-09-17 Johnstech International Corporation Contact
USD1042357S1 (en) * 2021-09-29 2024-09-17 Johnstech International Corporation Anti pinching contact
USD1042345S1 (en) * 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
USD1042346S1 (en) * 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing
TWD228536S (en) 2022-10-12 2023-11-11 日商日本麥克隆尼股份有限公司 Part of electric contact

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
EBay. Link: https://www.ebay.com/itm/256331446070. Visited Jan. 24, 2024. Johnstech International Contact Kit, rol200 PN: 133746-0100 (Year: 2025). *
EBay. Link: https://www.ebay.com/itm/256513586456. Visited Jan. 24, 2024. Johnstech International Contact Kit PN: 106356-0100 (Year: 2025). *
International Search Report and Written Opinion, International Patent Application No. PCT/US22/79030, Feb. 7, 2023 (9 pages).
Johnstech. Link: https://www.johnstech.com/products/ . Visited Jan. 24, 2024. Landing page showing contact pin for VROL 200 & VROL 100. (Year: 2025). *
Notice of Allowance issued in Taiwan Patent Application No. 113302296, Mar. 4, 2025, with English translation (6 pages).

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1110279S1 (en) * 2022-04-05 2026-01-27 Johnstech International Corporation Contact pin for integrated circuit testing

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