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USD1042345S1 - Test pin - Google Patents

Test pin Download PDF

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Publication number
USD1042345S1
USD1042345S1 US29/833,520 US202229833520F USD1042345S US D1042345 S1 USD1042345 S1 US D1042345S1 US 202229833520 F US202229833520 F US 202229833520F US D1042345 S USD1042345 S US D1042345S
Authority
US
United States
Prior art keywords
test pin
view
test
elevation view
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/833,520
Inventor
Mike Andres
Melissa Hasskamp
David Skodie
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Johnstech International Corp
Original Assignee
Johnstech International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnstech International Corp filed Critical Johnstech International Corp
Priority to US29/833,520 priority Critical patent/USD1042345S1/en
Priority to US29/843,097 priority patent/USD1042346S1/en
Priority to TW111304926D05F priority patent/TWD227948S/en
Priority to TW111304926D01F priority patent/TWD227945S/en
Priority to TW111304926F priority patent/TWD227944S/en
Priority to TW111304926D02F priority patent/TWD227946S/en
Priority to TW111304926D04F priority patent/TWD227947S/en
Priority to JP2023000897F priority patent/JP1745525S/en
Priority to JP2022021528F priority patent/JP1745477S/en
Assigned to JOHNSTECH INTERNATIONAL CORPORATION reassignment JOHNSTECH INTERNATIONAL CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ANDRES, MIKE, HASSKAMP, Melissa, SKODJE, DAVID
Priority to US29/917,131 priority patent/USD1075695S1/en
Priority to US29/941,010 priority patent/USD1110279S1/en
Application granted granted Critical
Publication of USD1042345S1 publication Critical patent/USD1042345S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a top perspective view of a first embodiment of a test pin showing our new design;
FIG. 2 is a bottom perspective view thereof;
FIG. 3 is a front elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a right side elevation view thereof;
FIG. 7 is a top plan view thereof;
FIG. 8 is a bottom plan view thereof;
FIG. 9 is a top perspective view of a second embodiment of the test pin;
FIG. 10 is a bottom perspective view thereof;
FIG. 11 is a front elevation view thereof;
FIG. 12 is a rear elevation view thereof;
FIG. 13 is a left side elevation view thereof;
FIG. 14 is a right side elevation view thereof;
FIG. 15 is a top plan view thereof; and,
FIG. 16 is a bottom plan view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a test pin, as shown and described.
US29/833,520 2022-04-05 2022-04-05 Test pin Active USD1042345S1 (en)

Priority Applications (11)

Application Number Priority Date Filing Date Title
US29/833,520 USD1042345S1 (en) 2022-04-05 2022-04-05 Test pin
US29/843,097 USD1042346S1 (en) 2022-04-05 2022-06-17 Contact pin for integrated circuit testing
TW111304926D01F TWD227945S (en) 2022-04-05 2022-09-30 Contact pin for integrated circuit testing
TW111304926F TWD227944S (en) 2022-04-05 2022-09-30 Contact pin for integrated circuit testing
TW111304926D02F TWD227946S (en) 2022-04-05 2022-09-30 Contact pin for integrated circuit testing
TW111304926D04F TWD227947S (en) 2022-04-05 2022-09-30 Contact pin for integrated circuit testing
TW111304926D05F TWD227948S (en) 2022-04-05 2022-09-30 Contact pin for integrated circuit testing
JP2022021528F JP1745477S (en) 2022-04-05 2022-10-05 electrical connection pins
JP2023000897F JP1745525S (en) 2022-04-05 2022-10-05 electrical connection pins
US29/917,131 USD1075695S1 (en) 2022-04-05 2023-11-17 Contact pin for integrated circuit testing
US29/941,010 USD1110279S1 (en) 2022-04-05 2024-05-07 Contact pin for integrated circuit testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/833,520 USD1042345S1 (en) 2022-04-05 2022-04-05 Test pin

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US29/843,097 Continuation-In-Part USD1042346S1 (en) 2022-04-05 2022-06-17 Contact pin for integrated circuit testing
US29/917,131 Continuation-In-Part USD1075695S1 (en) 2022-04-05 2023-11-17 Contact pin for integrated circuit testing

Publications (1)

Publication Number Publication Date
USD1042345S1 true USD1042345S1 (en) 2024-09-17

Family

ID=88875240

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/833,520 Active USD1042345S1 (en) 2022-04-05 2022-04-05 Test pin

Country Status (2)

Country Link
US (1) USD1042345S1 (en)
TW (5) TWD227945S (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1075695S1 (en) * 2022-04-05 2025-05-20 Johnstech International Corporation Contact pin for integrated circuit testing
USD1090459S1 (en) * 2022-10-12 2025-08-26 Kabushiki Kaisha Nihon Micronics Electric contact
USD1110279S1 (en) * 2022-04-05 2026-01-27 Johnstech International Corporation Contact pin for integrated circuit testing
USD1110964S1 (en) * 2023-10-16 2026-02-03 Johnstech International Corporation Pin for IC testing device

Citations (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5841640A (en) 1996-08-02 1998-11-24 Yamaichi Electronics Co., Ltd. IC socket
US5947749A (en) 1996-07-02 1999-09-07 Johnstech International Corporation Electrical interconnect contact system
US6854981B2 (en) 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US7059866B2 (en) 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
US7445465B2 (en) 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
USD589902S1 (en) * 2008-06-26 2009-04-07 Cheng Uei Precision Industry Co., Ltd. Contact
USD590350S1 (en) * 2008-04-21 2009-04-14 Hon Hai Precision Ind. Co., Ltd. Electrical contact
USD604701S1 (en) * 2008-09-29 2009-11-24 Omron Corporation Connector pin
US7632106B2 (en) 2007-08-09 2009-12-15 Yamaichi Electronics Co., Ltd. IC socket to be mounted on a circuit board
US7639026B2 (en) 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
USD614581S1 (en) * 2008-09-29 2010-04-27 Omron Corporation Connector pin
US7771220B2 (en) 2008-10-20 2010-08-10 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
US7819672B2 (en) 2006-10-12 2010-10-26 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus with inclined probe recess surfaces
US7914295B2 (en) 2008-11-12 2011-03-29 Yamaichi Electronics Co., Ltd. Electrical connecting device
USD711836S1 (en) * 2013-07-10 2014-08-26 Johnstech International Corporation Articulating contact pin
USD719923S1 (en) * 2014-05-15 2014-12-23 Johnstech International Corporation Articulating contact pin
USD727269S1 (en) * 2014-01-29 2015-04-21 Johnstech International Corporation Articulating contact pin
USD772818S1 (en) * 2014-05-23 2016-11-29 John O. Tate Contact member for an electronic device socket
US10114039B1 (en) * 2015-04-24 2018-10-30 Johnstech International Corporation Selectively geometric shaped contact pin for electronic component testing and method of fabrication
USD852756S1 (en) * 2018-04-04 2019-07-02 Cheng Uei Precision Industry Co., Ltd. Connector contact

Patent Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5947749A (en) 1996-07-02 1999-09-07 Johnstech International Corporation Electrical interconnect contact system
US5841640A (en) 1996-08-02 1998-11-24 Yamaichi Electronics Co., Ltd. IC socket
US6854981B2 (en) 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US7059866B2 (en) 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
US7445465B2 (en) 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
US7639026B2 (en) 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
US7819672B2 (en) 2006-10-12 2010-10-26 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus with inclined probe recess surfaces
US7632106B2 (en) 2007-08-09 2009-12-15 Yamaichi Electronics Co., Ltd. IC socket to be mounted on a circuit board
USD590350S1 (en) * 2008-04-21 2009-04-14 Hon Hai Precision Ind. Co., Ltd. Electrical contact
USD589902S1 (en) * 2008-06-26 2009-04-07 Cheng Uei Precision Industry Co., Ltd. Contact
USD614581S1 (en) * 2008-09-29 2010-04-27 Omron Corporation Connector pin
USD604701S1 (en) * 2008-09-29 2009-11-24 Omron Corporation Connector pin
US7771220B2 (en) 2008-10-20 2010-08-10 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
US7914295B2 (en) 2008-11-12 2011-03-29 Yamaichi Electronics Co., Ltd. Electrical connecting device
USD711836S1 (en) * 2013-07-10 2014-08-26 Johnstech International Corporation Articulating contact pin
USD727269S1 (en) * 2014-01-29 2015-04-21 Johnstech International Corporation Articulating contact pin
USD749526S1 (en) * 2014-01-29 2016-02-16 Johnstech International Corporation Articulating contact pin
USD749525S1 (en) * 2014-01-29 2016-02-16 Johnstech International Corporation Articulating contact pin
USD719923S1 (en) * 2014-05-15 2014-12-23 Johnstech International Corporation Articulating contact pin
USD772818S1 (en) * 2014-05-23 2016-11-29 John O. Tate Contact member for an electronic device socket
US10114039B1 (en) * 2015-04-24 2018-10-30 Johnstech International Corporation Selectively geometric shaped contact pin for electronic component testing and method of fabrication
USD852756S1 (en) * 2018-04-04 2019-07-02 Cheng Uei Precision Industry Co., Ltd. Connector contact

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Contact Technology. Link: https://contactechnologies.com/Electrical-Contacts.htm. Visited Feb. 22, 2024. Customized Electrical Contacts Produced by Means of Powder Metallurgy (Year: 2024). *
Grainger. Link: https://www.grainger.com/product/44F380?gucid=N:N:FPL:Free:GGL:CSM-1946:tew63h3:20501231. Visited Feb. 23, 2024. Siemens Replacement Contact Kit, Item 44F380Mfr. Model 75BF14. (Year: 2024). *
Grainger. Link: https://www.grainger.com/product/GE-Replacement-Contact-Kit-4-6AMX1?searchQuery=55-152313G009&searchBar=true&tier=Tier+6. Visited Feb. 23, 2024. GE Replacement Contact Kit (Year: 2024). *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1075695S1 (en) * 2022-04-05 2025-05-20 Johnstech International Corporation Contact pin for integrated circuit testing
USD1110279S1 (en) * 2022-04-05 2026-01-27 Johnstech International Corporation Contact pin for integrated circuit testing
USD1090459S1 (en) * 2022-10-12 2025-08-26 Kabushiki Kaisha Nihon Micronics Electric contact
USD1110964S1 (en) * 2023-10-16 2026-02-03 Johnstech International Corporation Pin for IC testing device

Also Published As

Publication number Publication date
TWD227948S (en) 2023-10-11
TWD227945S (en) 2023-10-11
TWD227947S (en) 2023-10-11
TWD227946S (en) 2023-10-11
TWD227944S (en) 2023-10-11

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