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US20170018657A1 - Vertical jfet made using a reduced mask set - Google Patents

Vertical jfet made using a reduced mask set Download PDF

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Publication number
US20170018657A1
US20170018657A1 US14/798,631 US201514798631A US2017018657A1 US 20170018657 A1 US20170018657 A1 US 20170018657A1 US 201514798631 A US201514798631 A US 201514798631A US 2017018657 A1 US2017018657 A1 US 2017018657A1
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Prior art keywords
region
trenches
doping type
mask
termination
Prior art date
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US14/798,631
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English (en)
Inventor
Zhongda Li
Anup Bhalla
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United Silicon Carbide Inc
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United Silicon Carbide Inc
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Priority to US14/798,631 priority Critical patent/US20170018657A1/en
Application filed by United Silicon Carbide Inc filed Critical United Silicon Carbide Inc
Assigned to UNITED SILICON CARBIDE, INC. reassignment UNITED SILICON CARBIDE, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: LI, ZHONGDA, BHALLA, ANUP
Priority to CN201680051802.2A priority patent/CN108028203B/zh
Priority to EP21174891.8A priority patent/EP3961678A1/en
Priority to PCT/US2016/041828 priority patent/WO2017011425A1/en
Priority to EP16744992.5A priority patent/EP3323143A1/en
Priority to US15/266,210 priority patent/US10056500B2/en
Priority to US15/405,827 priority patent/US10050154B2/en
Publication of US20170018657A1 publication Critical patent/US20170018657A1/en
Priority to US15/947,010 priority patent/US10367098B2/en
Priority to US16/036,305 priority patent/US10367099B2/en
Abandoned legal-status Critical Current

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    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/80—FETs having rectifying junction gate electrodes
    • H10D30/83—FETs having PN junction gate electrodes
    • H10D30/831—Vertical FETs having PN junction gate electrodes
    • H01L29/8083—
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    • H01L21/0455—Making n or p doped regions or layers, e.g. using diffusion
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    • H01L21/0455—Making n or p doped regions or layers, e.g. using diffusion
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    • H01L21/0455—Making n or p doped regions or layers, e.g. using diffusion
    • H01L21/046—Making n or p doped regions or layers, e.g. using diffusion using ion implantation
    • H01L21/047—Making n or p doped regions or layers, e.g. using diffusion using ion implantation characterised by the angle between the ion beam and the crystal planes or the main crystal surface
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    • H01L21/0475—Changing the shape of the semiconductor body, e.g. forming recesses
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    • H01L21/048—Making electrodes
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    • H10D12/00—Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
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    • H10D30/0512—Manufacture or treatment of FETs having PN junction gates of FETs having PN homojunction gates
    • H10D30/0515—Manufacture or treatment of FETs having PN junction gates of FETs having PN homojunction gates of vertical FETs having PN homojunction gates
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    • H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/103—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
    • H10D62/104—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices having particular shapes of the bodies at or near reverse-biased junctions, e.g. having bevels or moats
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    • H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/103—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
    • H10D62/105—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE] 
    • H10D62/106—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE]  having supplementary regions doped oppositely to or in rectifying contact with regions of the semiconductor bodies, e.g. guard rings with PN or Schottky junctions
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    • H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
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    • H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
    • H10D62/832—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge being Group IV materials comprising two or more elements, e.g. SiGe
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    • H10D62/124—Shapes, relative sizes or dispositions of the regions of semiconductor bodies or of junctions between the regions
    • H10D62/126—Top-view geometrical layouts of the regions or the junctions
    • H10D62/127—Top-view geometrical layouts of the regions or the junctions of cellular field-effect devices, e.g. multicellular DMOS transistors or IGBTs

Definitions

  • JFETs made from materials such as silicon carbide (SiC) are useful in power electronic circuits, such as power factor correction (PFC) circuits, DC-DC converters, DC-AC inverters, and motor drives.
  • PFC power factor correction
  • the performance of vertical SiC JFETs may be improved through the use of edge terminations.
  • a vertical JFET is made from semiconductor materials such as silicon carbide (SiC) by a process using a limited number of masks.
  • a first mask is used to form mesas and trenches in active cell and termination regions simultaneously.
  • a mask-less self-aligned process is used to form silicide source and gate contacts.
  • a second mask is used to open windows to the contacts.
  • a third mask is used to pattern overlay metallization.
  • An optional fourth mask is used to pattern passivation.
  • the channel may be doped via one or more angled implantations, and the width of the trenches and mesas in the active cell region may be varied from those in the termination region.
  • FIG. 1 provides, for reference, a cross-sectional view of a prior art vertical JFET with planar floating guard-ring termination.
  • FIG. 2 illustrates a cross-sectional view of a first illustrative embodiment of a vertical JFET with trench guard-ring terminations made using a set of four masks.
  • FIG. 3 is a top view of an example layout for the JFET of the first embodiment.
  • FIG. 4 is a cross-sectional view of the termination region of the JFET of the first embodiment.
  • FIGS. 5-11 are cross-sectional views of the JFET of the first embodiment as a work in process through various stages of manufacture.
  • FIG. 5 is a cross-sectional view of the starting material for fabricating the JFET.
  • FIG. 6 is a cross-sectional view of the JFET of the first embodiment in process after trench etching using a hard masking layer that is defined by a first mask.
  • FIG. 7 is a cross-sectional view of the JFET of the first embodiment in process after vertical and tilted implantations of the first doping type with the hard masking layer in place.
  • FIG. 8 is cross-sectional view of the JFET of the first embodiment in process after oxide spacer and silicide formation in the active cell region and the termination region.
  • FIG. 9 is a cross-sectional view of the JFET of the first embodiment in process after trench filling and window opening for source and gate contacts using a second mask.
  • FIG. 10 is a cross-sectional view of the JFET of the first embodiment in process after depositing and patterning the top metal using a third mask.
  • FIG. 11 is cross-sectional view of the completed JFET after forming the passivation layer using a fourth mask.
  • FIG. 12 is a cross-sectional view of a second illustrative embodiment of a JFET.
  • FIG. 13 is a cross-sectional view of a third illustrative embodiment of a JFET.
  • FIG. 14 is a cross-sectional view of a fourth illustrative embodiment of a JFET.
  • FIG. 15 is a cross-sectional view of a fifth illustrative embodiment of a JFET.
  • FIG. 16 is a cross-sectional view of a sixth illustrative embodiment of a JFET.
  • FIG. 17 is a cross-sectional view of a seventh illustrative embodiment of a JFET.
  • FIG. 18 is a cross-sectional view of an eighth illustrative embodiment of a JFET.
  • a vertical JFET may be made from semiconductor materials such as silicon carbide (SiC) by a process using a limited number of masks in a simplified process, thereby reducing costs.
  • a first mask is used to form mesas and trenches in active cell and termination regions simultaneously.
  • a mask-less self-aligned process is used to form silicide source and gate contacts.
  • a second mask is used to open windows to the contacts.
  • a third mask is used to pattern overlay metallization.
  • An optional fourth mask is used to pattern passivation.
  • the channel may be doped via angled implantation, and the width of the trenches and mesas in the active cell region may be varied from those in the termination region.
  • Additional masks may be employed to implement a number of variations. For example, channel implant and silicide formation in the termination region may be blocked by additional masks, or additional masks may be employed to remove certain features from the termination region after they are formed across the wafer.
  • FIG. 1 is a cross-sectional view of a prior art SiC vertical channel JFET with planar guard ring termination.
  • the source electrode 113 is at the top
  • the drain electrode 109 is at the bottom.
  • the gate electrode 129 is connected by a gate silicide 106 to a gate region 107 , which is doped with a first doping type.
  • the gate silicide 106 is present at the bottoms of the trenches as well as beneath the gate electrode 129 .
  • the gate silicide 106 is electrically contiguous, although the connections from the trench bottoms to the area beneath the gate electrode is not shown in FIG. 1 .
  • the source electrode 113 is connected by a source silicide 103 to the source region 104 , which is heavily doped with a second doping type.
  • the drain electrode 109 contacts the drain region 108 that is heavily doped with the second doping type.
  • the gate region 107 extends to the bottoms and side walls of the trenches, and is formed by implantation of the first doping type at zero degrees and at tilted angles.
  • the channel region 105 is doped with the second doping type and connects the source region 104 through the drift region 130 to the drain region 108 .
  • the guard rings 110 are heavily doped with the first doping type, and the gaps 111 between each of the guard rings are doped with the second doping type.
  • the potential of the guard rings 110 are floating.
  • the termination region 102 and portions of the active cell region 101 are usually covered by an interlayer dielectric 112 and/or a passivation layer 120 .
  • the interlayer dielectric 112 also fills the trenches.
  • FIG. 2 is a cross-sectional view of an illustrative first embodiment of a vertical JFET with trench guard-ring terminations made using a set of four masks.
  • the drain electrode 219 contacts the drain region 218 , which is heavily doped with the second doping type.
  • Above the drain region 218 is the drift region 230 .
  • the trenches are separated by mesas 216 .
  • the width of the mesas 216 in the termination region 201 can either be equal to, smaller than, or larger than the width of the mesas in the active cell region 202 .
  • the vertical channel JFET in the active cell 202 contains the gate region 206 that is formed by implantation of the first doping type into the bottom and the sidewall of the trenches.
  • the gate region 206 extends to the sidewalls and bottom of the trenches.
  • the gate region 206 is implanted vertically, to dope the trench bottom, and also implanted using a tilted angle, to dope the sidewalls 207 of the mesas 216 .
  • the same implantations dope the bottom and sidewalls of the trenches in both the termination region 201 and the active region 202 .
  • the mesas in the termination region 201 have a heavily doped region 212 of the second doping type at the top.
  • This region 212 is formed at the same time as the source region 204 in the active cell region 202 .
  • the source silicide contact 203 sits on top of the mesa.
  • the gate silicide contact 205 sits at the bottom of the trench.
  • the termination region 201 there is a silicide 211 on top of the mesa and a silicide 213 at the bottom of the trench. All the silicide contacts are formed simultaneously using self-aligned processes.
  • the source silicide contacts 203 in the active cell region are connected to the source electrode 208 .
  • the gate silicide contacts 205 are connected to the gate electrode 209 .
  • the silicide contacts in the termination region 211 and 213 are floating.
  • the trenches are filled with an interlayer dielectric 240 .
  • the JFET is shown with a passivation layer 210 .
  • FIG. 3 is a top view of an example layout of a JFET such as the JFET of the first embodiment.
  • the mesas 301 are parallel to each other.
  • the mesas 307 are concentric.
  • the semiconductor such as Si and SiC, is etched, leaving trenches in the active area 303 and trenches in the termination region 308 .
  • Silicide contacts are formed on the top of the mesas 301 and at the bottom of the active trenches 303 , using a self-aligned process.
  • the self-aligned process uses an oxide spacer to ensure that the silicide at the top of the mesas 301 does not short to the silicide at the bottom of the trenches 303 .
  • a source contact window 302 is opened in the inter-layer dielectric to make contact between the source silicide 301 and the source overlay metal 304 .
  • the gate contact window 305 is opened in the inter-layer dielectric to make contact between the gate silicide contacts 303 to the gate overlay metal 306 .
  • the mesas 307 and trenches 308 are formed at the same time as those in the active region, and silicide contacts may be formed on top of the mesas 307 and at the bottom of the trenches 308 , during the same self-aligned silicide formation process in the active region. However, if any such contacts are formed in the termination region, they are not connected to the gate overlay metal 306 or the source overlay metal.
  • FIG. 4 is an annotated cross-sectional view of the termination region 401 of the JFET of the first embodiment.
  • this is an npn JFET, such that the first doping type is p-type and the second doping type is n-type.
  • npn and pnp devices may be made by the processes described herein.
  • the drain voltage increases, the p-n junction 407 between the heavily doped region of the second doping type 403 and the mesa sidewall 404 , which is doped with the first type, is reverse biased, while the regions in the middle of the mesa doped with the second doping type 405 and 406 are being depleted.
  • the reverse voltage on the p-n junction 407 in the mesa stops increasing, and the further voltage will be supported in the next mesa.
  • each mesa supports the punch through voltage of the mesa.
  • the punch through voltage of the mesa needs to be less than the breakdown voltage of the p-n junction 407 in the mesa, which determines the maximum mesa width that can be used.
  • the total voltage that can be supported by the termination can be increased by adding more and more trench-mesa pairs to create a potential ladder. Note that in the termination region 401 , the silicides 425 and 426 are floating. Also shown in FIG.
  • the drain contact 419 is a drain contact 419 , at the bottom, connected to a drain region 418 .
  • the drain region 418 is in turn connected to the drift region 430 .
  • the trenches are filled with interlayer dielectric 423 and the device is topped with a passivation layer 410 .
  • the gate silicide 421 connects the gate electrode 420 to the gate region 422 .
  • the dashed boundary 408 illustrates the depletion layer edge when the first termination mesa is fully depleted, and the second is partially depleted.
  • FIGS. 5 through 11 The basic processes for the various illustrative embodiments of the JFETs of the present invention are illustrated in FIGS. 5 through 11 with cross-sectional views of a first illustrative embodiment of a JFET as a work in process.
  • Silicon or SiC JFETs are made using two dopant types, n-type and p-type.
  • the first dopant type refers to the gate implant type of the JFET
  • the “the second dopant” type refers to the dopant type used for the source and drain.
  • the descriptions of the structures and processes herein apply equally to n-channel and p-channel devices.
  • An n-channel device uses n-type regions for source and drain, and has a p-type gate region.
  • the starting material illustrated in FIG. 5 is a wafer containing a heavily doped top layer 502 of the second doping type to be used for source contacts.
  • the top heavily doped region 502 can be formed either by epitaxy or by implantation.
  • the layers 501 can could be formed by epitaxy.
  • the bottom layer of the starting wafer is a heavily doped substrate 503 of the second doping type which will be used for a drain contact.
  • FIG. 6 illustrates a cross-sectional view of the JFET in process as seen after trench etching using a first mask.
  • a hard masking layer 601 is first deposited on top of the heavily doped region of the second type 604 .
  • the hard masking layer 601 can be oxide, metal, or both.
  • the hard masking layer 601 is patterned using the first mask, and etched.
  • the trenches 605 in both the active cell region 602 and the termination region 603 are etched simultaneously using the hard masking layer 601 .
  • the trenches 605 extend into the drift region 611 .
  • the drain region 613 is also shown in FIG. 6 .
  • FIG. 7 illustrates a cross-sectional view of the JFET in process as seen after implantations of the first doping type.
  • the implantations are performed without removing the hard masking layer 703 . No masks are needed for this step.
  • a vertical implantation of the first doping type forms the heavily doped regions 704 at the bottom of the trenches 706 in both the active cell region 701 and the termination region 702 .
  • the hard masking layer 703 protects source region 707 from being counter-doped by the implantation.
  • a tilted implantation of the first doping type forms the less-heavily doped regions 705 on the side walls of the trenches 706 .
  • the hard mask 703 is removed after implantations, and the wafer is annealed to activate the implanted dopants. Also shown in FIG. 7 are the drift region 711 and the drain region 713 .
  • FIG. 8 illustrates a cross-sectional view of the JFET in process as seen after a self-aligned silicide contact formation.
  • the silicide contacts 805 and 807 are formed simultaneously in the active region 801 and termination region 802 , without using any masks.
  • the oxide spacers 803 on the side walls of the trenches 804 are formed by depositing and/or growing oxide, followed by blanket etching back. Using an etching process that operates primarily vertically, the spacers 803 remain only on mesa sides.
  • an ohmic metal such as Ni, is deposited and annealed using rapid thermal annealing to form the silicide.
  • the silicide Because Ni does not react with oxide, the silicide only forms on top of the second-doping-type regions 806 and the first-doping-type regions 808 . The unreacted Ni on the oxide spacers 803 is then removed, and thus there is no shorting path between the source silicide 805 and the gate silicide 807 . Also shown in FIG. 8 are the drift region 811 and the drain region 813 .
  • FIG. 9 illustrates a cross-sectional view of the JFET in progress as seen after contact window opening using a second mask.
  • an interlayer dielectric 903 such as oxide
  • the second mask is used to pattern the contact windows to the source silicide 904 and gate silicide 905 .
  • the windows are then cleared by etching.
  • the source contact windows 904 are opened in each of the cells.
  • a shared gate contact window 905 is opened outside the cells.
  • no contact window is opened, and thus all the silicide contacts are under the inter-layer dielectric 903 .
  • the drift region 930 the drain region 913 , the gate region 920 , and the source region 921 .
  • FIG. 10 illustrates a cross-sectional view of the JFET in progress as seen after an overlay metal is defined using a third mask.
  • a conductor such as a metal is deposited, patterned using the third mask, and etched, leaving source electrode 1003 and gate electrode 1005 separated by the interlayer dielectric 1020 .
  • the source electrode 1003 makes contact to the source silicide contacts 1004 on top of each mesa, and thereby to the source region 1022 .
  • the gate electrode 1005 makes contact to the gate silicide contact 1006 and gate thereby the gate region 1021 .
  • the silicide contacts 1030 and 1031 are not connected to any overlay metal, and thus their potential is floating.
  • drift region 1011 the drain region 1013 , and the termination region mesa top 1032 , and the termination region trench side walls and bottom 1033 , which are now distinct from the similarly formed structures in the active cell region 1001 by virtue of not being connected to the source or gate electrodes respectively.
  • FIG. 11 illustrates a cross-sectional view of the completed JFET as seen after forming a passivation layer using a fourth mask.
  • a passivation material such as benzo-cyclo-butene (BCB)
  • BCB benzo-cyclo-butene
  • a passivation layer 1103 is patterned using the fourth mask to open the windows through the passivation material to the source electrode overlay metal 1104 and to the gate electrode overlay metal 1105 . No window through the passivation layer 1103 is opened in the termination region 1102 . It is, of course, possible to entirely skip this passivation step, e.g., if the oxide layer under the BCB were sufficient to ensure device reliability.
  • drain contact 1106 is formed to complete the JFET process. Also shown in FIG. 11 are drain region 1113 , drift region 1111 , source silicide 1122 , source region 1123 , gate silicide 1141 , gate region 1140 , interlayer dielectric 1120 , termination region silicides 1135 and 1132 , and termination doped regions 1133 , and 1136 .
  • FIG. 12 illustrates a cross-sectional view of a second embodiment of a trench terminated JFET.
  • the second embodiment is similar to the first embodiment shown, e.g., in FIGS. 5-11 .
  • the sidewall of the channel region 1204 of the mesa 1203 has been doped by an implantation of the second doping type. This is done to lower the channel resistance and achieve better control of the threshold voltage.
  • such implantation may be done after the vertical and tilted implantations of the first doping type discussed above in reference to FIG. 7 .
  • the channel implantation of the second doping type may be done without using any mask, i.e., after the removal of the hard masking layer 703 .
  • the side wall 1206 of the mesa 1205 in the termination region 1202 is also doped by this implantation.
  • This doped region 1206 in the termination region 1202 does not affect the functionality of the trench guard-ring termination. It is possible to compensate for the added charges by reducing the width of the mesas 1205 in the termination region 1202 .
  • This implantation is followed by activation annealing. Also shown in FIG.
  • FIG. 13 is a cross-sectional view of a third illustrative embodiment of a trench terminated JFET.
  • the third embodiment is similar to the second embodiment shown in FIG. 12 , but here in FIG. 13 , in the termination region 1302 , the width of the trenches 1304 is narrower than the width of the trenches in the active cell region 1301 .
  • the tilted implantation of the first doping type is done simultaneously for the active cell region 1301 and the termination region 1302 using the same tilt angle. The tilt angle is chosen such that the side-wall first-doping-type region 1307 reaches the bottom of the first-doping-type region only in the active cell region 1301 .
  • the termination region 1302 there is a gap between the side-wall of the first-doping-type region 1305 and the first-doping-type region 1306 .
  • This gap increases the voltage that can be supported in each mesa in the termination region 1302 .
  • drain contact 1319 drain region 1318 , drift region 1330 , source silicide 1316 , source region 1317 , source electrode 1328 , gate silicide 1315 , gate region 1316 , gate electrode 1309 , channel implant region 1344 , interlayer dielectric 1340 , passivation 1310 , termination region silicides 1350 and 1353 , and termination region mesa top doped region 1324 .
  • FIG. 14 is a cross-sectional view of a fourth illustrative embodiment of a trench terminated JFET.
  • the fourth embodiment is similar to the second embodiment shown in FIG. 12 , but here in FIG. 14 the width of the trenches 1404 in the termination region 1402 are wider than the width of the trenches in the active cell region 1401 .
  • a fifth mask is used to separate the first-doping-type implantations for the active cell region 1401 and the termination region 1402 .
  • the additional mask is applied after the implantations of the first-doping-type described with reference to FIG. 7 . This mask blocks the active cells 1401 but is open in the termination region 1402 .
  • the first-doping-type region on the side wall 1405 is implanted deeper towards the center of the mesa in the termination region 1402 as compared to the analogous structure 1407 in the active region 1401 . This makes the mesas 1403 in the termination region 1402 easier to deplete and improves the termination. Also shown in FIG.
  • FIG. 15 is a cross-sectional view of a fifth illustrative embodiment of a trench terminated JFET.
  • the fifth embodiment is similar to the second embodiment shown in FIG. 12 , but here in FIG. 15 a sixth mask is used so that no silicide will be formed in the termination region 1502 .
  • This sixth mask brings the total mask count to five for the process: trench, Ni block, contact, metal, and passivation.
  • Silicide, including gate silicide 1503 and source silicide 1520 only forms in the active cell region 1501 .
  • the sixth mask can work either by stopping Ni from being deposited in the termination region 1502 , or by leaving oxide in the termination region 1502 so that Ni cannot react with the semiconductor. This would occur during the processes discussed in reference to FIG. 8 .
  • drain contact 1519 drain region 1518 , drift region 1530 , source region 1517 , channel implant 1544 , source electrode 1528 , gate region 1516 , gate electrode 1509 , interlayer dielectric 1540 , passivation 1510 , and termination doped regions 1505 , 1507 , and 1550 .
  • FIG. 16 is a cross-sectional view of a sixth illustrative embodiment of a trench terminated JFET.
  • the sixth embodiment is similar to the second embodiment shown in FIG. 12 , but here in FIG. 16 a seventh mask is used to prevent the channel implant of the second type from entering the termination region 1602 .
  • the channel implant of the second doping type 1603 only forms in the active cell region 1601 .
  • This seventh mask brings the total mask count to five for the process: trench, channel implant block, contact, metal, and passivation. Also shown in FIG.
  • FIG. 17 is a cross-sectional view of a seventh illustrative embodiment of a trench terminated JFET.
  • a seventh mask is used to prevent the channel implant of the second doping type from getting into the termination region 1702 .
  • the seventh mask is also used to prevent the growth of oxide spacers and formation of gate and source silicide in the termination region.
  • One simple method would be to deposit an oxide layer after the gate implants of the first doping type, then patterning it to open only the active area 1701 before performing the further channel implants and silicide formation steps.
  • the channel implant only forms the second-doping-type region 1703 in the active cells 1701 , and the gate silicide 1704 and source silicide 1720 only form in the active cells 1701 .
  • This seventh mask brings the total mask count to five for the process: trench, channel implant and silicide block, contact, metal, and passivation. Also shown in FIG. 17 are drain contact 1719 , drain region 1718 , drift region 1730 , source region 1717 , source electrode 1708 , gate region 1721 , gate electrode 1709 , channel implant 1703 , interlayer dielectric 1740 , passivation 1710 , and termination doped regions 1750 and 1751 .
  • FIG. 18 is a cross-sectional view of an eighth illustrative embodiment of a trench terminated JFET.
  • the eighth embodiment is similar to the fifth embodiment shown in FIG. 15 .
  • an eighth mask is used to keep the heavily doped wafer top layer, which is used to form the source regions 1804 in the active region 1801 , from being formed in the termination region 1802 .
  • the starting wafer is shown as having a layer 502 of a second doping typing that will become the source region. Layer 502 may be created by epitaxy or implantation, for example.
  • the eighth mask can be created by using such a starting wafer by using the eighth mask to control the etching away of the top heavily doped region of the second doping type in the termination region 1802 , leaving the top heavily doped region of the second type only in the active region 1801 .
  • This eighth mask brings the total mask count to five for the process: source pattern, trench, contact, metal, and passivation.
  • the JFET depicted in FIG. 18 can be created by using such a starting wafer that does not have the top heavily doped region of the second doping type, and then using the eighth mask to control the implantation of a top heavily doped region of the second doping in the active region termination region 1802 , leaving the top heavily doped region of the second type only in the active region.
  • an eighth mask could be used to control the selective removal of source regions in the termination region 1802 after the formation of the mesas. Also shown in FIG.
  • drain contact 1819 drain region 1818 , drift region 1830 , source electrode 1808 , source silicide 1803 , gate region 1820 , gate silicide 1805 , gate electrode 1809 , interlayer dielectric 1811 , passivation 1810 , channel doping 1821 , and termination doped regions 1825 and 1824 .

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US14/798,631 US20170018657A1 (en) 2015-07-14 2015-07-14 Vertical jfet made using a reduced mask set
CN201680051802.2A CN108028203B (zh) 2015-07-14 2016-07-12 垂直jfet及其制造方法
EP21174891.8A EP3961678A1 (en) 2015-07-14 2016-07-12 Vertical jfet and method of manufacturing the same
PCT/US2016/041828 WO2017011425A1 (en) 2015-07-14 2016-07-12 Vertical jfet and method of manufacturing the same
EP16744992.5A EP3323143A1 (en) 2015-07-14 2016-07-12 Vertical jfet and method of manufacturing the same
US15/266,210 US10056500B2 (en) 2015-07-14 2016-09-15 Vertical JFET made using a reduced mask set
US15/405,827 US10050154B2 (en) 2015-07-14 2017-01-13 Trench vertical JFET with ladder termination
US15/947,010 US10367098B2 (en) 2015-07-14 2018-04-06 Vertical JFET made using a reduced masked set
US16/036,305 US10367099B2 (en) 2015-07-14 2018-07-16 Trench vertical JFET with ladder termination

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