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TWM650996U - Controller for power supply device - Google Patents

Controller for power supply device Download PDF

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Publication number
TWM650996U
TWM650996U TW112206966U TW112206966U TWM650996U TW M650996 U TWM650996 U TW M650996U TW 112206966 U TW112206966 U TW 112206966U TW 112206966 U TW112206966 U TW 112206966U TW M650996 U TWM650996 U TW M650996U
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Taiwan
Prior art keywords
mode
circuit
memory circuit
control
control parameter
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TW112206966U
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Chinese (zh)
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方冠鈞
林昱超
徐振華
徐鼎青
管建葳
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力林科技股份有限公司
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Publication of TWM650996U publication Critical patent/TWM650996U/en

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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/04Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0423Input/output
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/20Pc systems
    • G05B2219/25Pc structure of the system
    • G05B2219/25257Microcontroller

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Control Of Voltage And Current In General (AREA)
  • Dc-Dc Converters (AREA)

Abstract

A controller for a power supply device is provided. The controller includes a transmission terminal, a first memory circuit, a second memory circuit, a determining circuit and a control circuit. When the input voltage value is lower than a reference voltage value, the determining circuit generates a first mode signal. When the input voltage value is greater than or equal to the reference voltage value, the determining circuit generates a second mode signal. The control circuit enters a first mode in response to the first mode signal, and enters a second mode in response to the second mode signal. In the first mode, the control circuit writes a control parameter from the transmission terminal into the first memory circuit. In the second mode, the control circuit uses the control parameters stored in the first memory circuit to test the power supply device. When the control parameter meets an expected function of the power supply device, the control circuit writes the control parameter into the second memory circuit.

Description

用於電源供應裝置的控制器Controller for power supply unit

本新型創作是有關於一種控制器,且特別是有關於一種用於電源供應裝置的控制器。 The present invention relates to a controller, and in particular to a controller for a power supply device.

現行的電源供應裝置會基於控制參數來進行操作。一般來說,控制參數會被寫入到一次性可編程(one-time programmable,OTP)記憶體電路中。 Current power supplies operate based on control parameters. Generally speaking, control parameters are written into a one-time programmable (OTP) memory circuit.

應注意的是,基於不同的應用或使用場合,電源供應裝置可能會有不同的預期功能。不同的預期功能會對應於不同的控制參數。這意味著,控制參數必須被調整以符合不同的應用或使用場合的預期功能。然而,當被寫入到OTP記憶體電路後的控制參數被測試出並不符合預期功能時,工程人員則需要對OTP記憶體電路進行修改。上述的修改例如是進行工程變更命令(engineering change order,ECO)。 It should be noted that the power supply device may have different intended functions based on different applications or usage scenarios. Different expected functions will correspond to different control parameters. This means that the control parameters must be adjusted to match the intended functionality of the different applications or use cases. However, when the control parameters written into the OTP memory circuit are tested and found to not meet the expected functions, engineers need to modify the OTP memory circuit. The above modification is, for example, an engineering change order (ECO).

本新型創作提供一種用於電源供應裝置的控制器,能夠 實現多次接收控制參數,並對所接收到的不同控制參數進行測試。 This new creation provides a controller for a power supply device that can Receive control parameters multiple times and test the different control parameters received.

本新型創作的電源供應裝置的控制器包括電源輸入端、傳輸端、第一記憶體電路、第二記憶體電路、判斷電路以及控制電路。判斷電路耦接於電源輸入端。判斷電路判斷位於電源輸入端的輸入電壓值。當輸入電壓值小於參考電壓值時,判斷電路產生第一模式訊號。當輸入電壓值大於或等於參考電壓值時,判斷電路產生第二模式訊號。控制電路耦接於判斷電路、第一記憶體電路、第二記憶體電路以及傳輸端。控制電路反應於第一模式訊號進入第一模式,並且反應於第二模式訊號進入第二模式。在第一模式中,控制電路將來自於傳輸端的第一控制參數寫入至第一記憶體電路。在第二模式中,控制電路利用儲存在第一記憶體電路中的第一控制參數對電源供應裝置進行測試,並且當第一控制參數符合電源供應裝置的預期功能時,將第一控制參數寫入至第二記憶體電路。 The controller of the power supply device of the present invention includes a power input terminal, a transmission terminal, a first memory circuit, a second memory circuit, a judgment circuit and a control circuit. The judgment circuit is coupled to the power input terminal. The judgment circuit judges the input voltage value located at the power input terminal. When the input voltage value is less than the reference voltage value, the judgment circuit generates the first mode signal. When the input voltage value is greater than or equal to the reference voltage value, the judgment circuit generates a second mode signal. The control circuit is coupled to the judgment circuit, the first memory circuit, the second memory circuit and the transmission end. The control circuit enters the first mode in response to the first mode signal and enters the second mode in response to the second mode signal. In the first mode, the control circuit writes the first control parameter from the transmission end to the first memory circuit. In the second mode, the control circuit tests the power supply device using the first control parameter stored in the first memory circuit, and when the first control parameter meets the expected function of the power supply device, writes the first control parameter into the second memory circuit.

基於上述,在第一模式中,控制電路先將來自於傳輸端的第一控制參數寫入至第一記憶體電路。在第二模式中,控制電路利用儲存在第一記憶體電路中的第一控制參數對電源供應裝置進行測試。當第一控制參數符合電源供應裝置的預期功能時,控制電路才將第一控制參數寫入至第二記憶體電路。控制電路被允許對第一記憶體電路進行多次的編程操作。如此一來,控制器能夠實現多次接收控制參數,並對所接收到的不同控制參數進行測試。 Based on the above, in the first mode, the control circuit first writes the first control parameter from the transmission end to the first memory circuit. In the second mode, the control circuit tests the power supply device using the first control parameter stored in the first memory circuit. When the first control parameter meets the expected function of the power supply device, the control circuit writes the first control parameter to the second memory circuit. The control circuit is allowed to perform multiple programming operations on the first memory circuit. In this way, the controller can receive control parameters multiple times and test the different control parameters received.

10:電源供應裝置 10:Power supply device

100:控制器 100:Controller

110:第一記憶體電路 110: First memory circuit

120:第二記憶體電路 120: Second memory circuit

130:判斷電路 130:Judgement circuit

140:控制電路 140:Control circuit

ED:外部裝置 ED: external device

FBL:傳輸端 FBL: transmission end

FC:預期功能 FC: expected function

MD1:第一模式 MD1: first mode

MD2:第二模式 MD2: Second mode

PAC:電源輸入端 PAC: power input terminal

PC1、PC2:控制參數 PC1, PC2: control parameters

POUT:輸出電源 POUT: output power

SC:控制訊號 SC: control signal

SF:測試結果 SF: test results

SM1:第一模式訊號 SM1: first mode signal

SM2:第二模式訊號 SM2: second mode signal

VAC:輸入電壓值 VAC: input voltage value

VDET:參考電壓值 VDET: reference voltage value

VP:峰值 VP: Peak

圖1是依據本新型創作一實施例所繪示的電源供應裝置的示意圖。 FIG. 1 is a schematic diagram of a power supply device according to an embodiment of the present invention.

圖2是依據本新型創作一實施例所繪示的輸入電壓值的示意圖。 FIG. 2 is a schematic diagram of input voltage values according to an embodiment of the present invention.

本新型創作的部份實施例接下來將會配合附圖來詳細描述,以下的描述所引用的元件符號,當不同附圖出現相同的元件符號將視為相同或相似的元件。這些實施例只是本新型創作的一部份,並未揭示所有本新型創作的可實施方式。更確切的說,這些實施例只是本新型創作的專利申請範圍中的範例。 Some embodiments of the present invention will be described in detail with reference to the drawings. The component symbols cited in the following description will be regarded as the same or similar components when the same component symbols appear in different drawings. These embodiments are only part of the invention and do not disclose all possible implementation modes of the invention. Rather, these embodiments are merely examples within the scope of the patent application for this novel creation.

請參考圖1,圖1是依據本新型創作一實施例所繪示的電源供應裝置的示意圖。在本實施例中,電源供應裝置10包括控制器100。電源供應裝置10反應於控制器100中的控制參數來運行。以本實施例為例,電源供應裝置10接收輸入電壓值VAC,並依據輸入電壓值VAC以及控制參數來提供輸出電源POUT。電源供應裝置10可以是電源晶片或電源轉換器(本新型創作並不以此為限)。 Please refer to FIG. 1 , which is a schematic diagram of a power supply device according to an embodiment of the present invention. In this embodiment, the power supply device 10 includes a controller 100 . The power supply device 10 operates in response to control parameters in the controller 100 . Taking this embodiment as an example, the power supply device 10 receives the input voltage value VAC, and provides the output power POUT according to the input voltage value VAC and the control parameters. The power supply device 10 may be a power chip or a power converter (the invention is not limited thereto).

在本實施例中,控制器100包括電源輸入端PAC、傳輸端FBL、第一記憶體電路110、第二記憶體電路120、判斷電路130以及控制電路140。判斷電路130耦接於電源輸入端PAC。判斷電路130判斷位於電源輸入端PAC的輸入電壓值VAC。判斷電路 130依據輸入電壓值VAC來提供第一模式訊號SM1以及第二模式訊號SM2的其中之一。具體來說,判斷電路130比較輸入電壓值VAC以及參考電壓值VDET。當輸入電壓值VAC小於參考電壓值VDET時,判斷電路130產生第一模式訊號SM1。當輸入電壓值VAC大於或等於參考電壓值VDET時,判斷電路130則產生第二模式訊號SM2。 In this embodiment, the controller 100 includes a power input terminal PAC, a transmission terminal FBL, a first memory circuit 110 , a second memory circuit 120 , a judgment circuit 130 and a control circuit 140 . The judgment circuit 130 is coupled to the power input terminal PAC. The judgment circuit 130 judges the input voltage value VAC located at the power input terminal PAC. Judgment circuit 130 provides one of the first mode signal SM1 and the second mode signal SM2 according to the input voltage value VAC. Specifically, the judgment circuit 130 compares the input voltage value VAC and the reference voltage value VDET. When the input voltage value VAC is less than the reference voltage value VDET, the judgment circuit 130 generates the first mode signal SM1. When the input voltage value VAC is greater than or equal to the reference voltage value VDET, the judgment circuit 130 generates the second mode signal SM2.

在本實施例中,控制電路140耦接於判斷電路130、第一記憶體電路110、第二記憶體電路120以及傳輸端FBL。控制電路140反應於第一模式訊號SM1進入第一模式,並且反應於第二模式訊號SM2進入第二模式。第一模式例如是編程模式。第二模式例如是正常模式。在第一模式中,控制電路140將來自於傳輸端FBL的控制參數PC1寫入至第一記憶體電路110。在第二模式中,控制電路140利用儲存在第一記憶體電路110中的控制參數PC1來對電源供應裝置10進行測試。換言之,在第二模式中,電源供應裝置10基於在儲存第一記憶體電路110中的控制參數PC1來進行運行測試。在第二模式中,當控制參數PC1符合電源供應裝置10的預期功能FC時,控制電路140將控制參數PC1寫入至第二記憶體電路120。預期功能FC例如是電源供應裝置10所期望的輸出電壓值、輸出電流值、輸出功率以及效率的至少其中之一。 In this embodiment, the control circuit 140 is coupled to the judgment circuit 130, the first memory circuit 110, the second memory circuit 120 and the transmission end FBL. The control circuit 140 enters the first mode in response to the first mode signal SM1 and enters the second mode in response to the second mode signal SM2. The first mode is, for example, programming mode. The second mode is, for example, the normal mode. In the first mode, the control circuit 140 writes the control parameter PC1 from the transmission end FBL to the first memory circuit 110 . In the second mode, the control circuit 140 uses the control parameter PC1 stored in the first memory circuit 110 to test the power supply device 10 . In other words, in the second mode, the power supply device 10 performs an operation test based on the control parameter PC1 stored in the first memory circuit 110 . In the second mode, when the control parameter PC1 meets the expected function FC of the power supply device 10 , the control circuit 140 writes the control parameter PC1 to the second memory circuit 120 . The expected function FC is, for example, at least one of the output voltage value, the output current value, the output power, and the efficiency expected by the power supply device 10 .

在此值得一提的是,控制電路140在第一模式中先將控制參數PC1寫入至第一記憶體電路110。控制電路140在第二模式中利用儲存在第一記憶體電路110中的控制參數PC1對電源供 應裝置10進行測試。當控制參數PC1符合電源供應裝置10的預期功能FC時,控制電路140才將控制參數PC1寫入至第二記憶體電路120。控制電路140被允許對第一記憶體電路110進行多次的編程操作。如此一來,控制器100能夠實現多次接收控制參數,並對所接收到的不同控制參數進行測試。 It is worth mentioning here that the control circuit 140 first writes the control parameter PC1 to the first memory circuit 110 in the first mode. In the second mode, the control circuit 140 uses the control parameter PC1 stored in the first memory circuit 110 to control the power supply. Should device 10 be tested. When the control parameter PC1 meets the expected function FC of the power supply device 10 , the control circuit 140 writes the control parameter PC1 to the second memory circuit 120 . The control circuit 140 is allowed to perform multiple programming operations on the first memory circuit 110 . In this way, the controller 100 can receive control parameters multiple times and test different received control parameters.

在本實施例中,第一記憶體電路110是任意形式的多次性可編程(multiple-times programmable,MTP)記憶體電路。第二記憶體電路120是一次性可編程(one-time programmable,OTP)記憶體電路。第二記憶體電路120例如是唯讀記憶體(ROM)電路或熔絲(fuse)電路。 In this embodiment, the first memory circuit 110 is any form of multiple-times programmable (MTP) memory circuit. The second memory circuit 120 is a one-time programmable (OTP) memory circuit. The second memory circuit 120 is, for example, a read-only memory (ROM) circuit or a fuse circuit.

應注意的是,相較於現行的電源供應裝置,本實施例的電源供應裝置10的控制電路140能夠對第一記憶體電路110進行無限次的控制參數的寫入操作。換言之,控制器100能夠實現無限次的不同控制參數的測試。即便是控制參數PC1不符合電源供應裝置10的預期功能FC,控制電路140能夠將其他控制參數寫入至第一記憶體電路110以進行另一次的測試。本實施例並不需要對第二記憶體電路120進行例如是工程變更命令(engineering change order,ECO)的修改。控制器100適用於多個不同控制參數的測試。如此一來,控制器100的測試便利性能夠大幅被提升。 It should be noted that compared with the current power supply device, the control circuit 140 of the power supply device 10 of this embodiment can perform unlimited writing operations of control parameters to the first memory circuit 110 . In other words, the controller 100 can implement unlimited tests of different control parameters. Even if the control parameter PC1 does not meet the expected function FC of the power supply device 10, the control circuit 140 can write other control parameters into the first memory circuit 110 to perform another test. This embodiment does not require modifications to the second memory circuit 120, such as an engineering change order (ECO). The controller 100 is suitable for testing multiple different control parameters. In this way, the testing convenience of the controller 100 can be greatly improved.

在本實施例中,傳輸端FBL在不同模式中具有不同的用途。在第一模式中,傳輸端FBL在被切換為參數接收端以接收控制參數PC1。以本實施例為例,傳輸端FBL在第一模式中接收來 自於外部裝置ED的控制參數PC1。控制電路140接收控制參數PC1並將控制參數PC1儲存到第一記憶體電路110。在一些實施例中,第一記憶體電路110耦接於傳輸端FBL。控制電路140在第一模式中控制第一記憶體電路110接收控制參數PC1,並儲存控制參數PC1。 In this embodiment, the transmission end FBL has different uses in different modes. In the first mode, the transmitting end FBL is switched to a parameter receiving end to receive the control parameter PC1. Taking this embodiment as an example, the transmission end FBL receives in the first mode Control parameter PC1 from external device ED. The control circuit 140 receives the control parameter PC1 and stores the control parameter PC1 in the first memory circuit 110 . In some embodiments, the first memory circuit 110 is coupled to the transmission terminal FBL. In the first mode, the control circuit 140 controls the first memory circuit 110 to receive the control parameter PC1 and store the control parameter PC1.

在本實施例中,控制電路140在第二模式中讀取儲存在第一記憶體電路110中的控制參數PC1,並依據控制參數PC1來產生對應於控制參數PC1的控制訊號SC。控制電路140利用控制訊號SC來進行測試。控制訊號SC包括用以控制電源供應裝置10中的功率開關的開關訊號、同步整流開關的同步整流訊號以及參考訊號的至少其中之一。參考訊號可以是用於過電壓保護、過電流保護以及過溫保護所需的閾值。 In this embodiment, the control circuit 140 reads the control parameter PC1 stored in the first memory circuit 110 in the second mode, and generates the control signal SC corresponding to the control parameter PC1 according to the control parameter PC1. The control circuit 140 uses the control signal SC to perform testing. The control signal SC includes at least one of a switching signal used to control the power switch in the power supply device 10 , a synchronous rectification signal of the synchronous rectification switch, and a reference signal. The reference signal may be the threshold required for over-voltage protection, over-current protection, and over-temperature protection.

經測試後,如果控制參數PC1符合電源供應裝置10的預期功能FC時,這表示控制參數PC1適用於電源供應裝置10。因此,控制電路140將控制參數PC1寫入至第二記憶體電路120。在後續的操作中,控制電路140讀取儲存在第二記憶體電路120中的控制參數PC1來產生控制訊號SC,從而對電源供應裝置10進行控制。 After testing, if the control parameter PC1 complies with the expected function FC of the power supply device 10 , it means that the control parameter PC1 is suitable for the power supply device 10 . Therefore, the control circuit 140 writes the control parameter PC1 to the second memory circuit 120 . In subsequent operations, the control circuit 140 reads the control parameter PC1 stored in the second memory circuit 120 to generate the control signal SC, thereby controlling the power supply device 10 .

在本實施例中,外部裝置ED可利用任意形式的資料傳輸介面與傳輸端FBL進行連接。資料傳輸介面例如是通用非同步收發傳輸器(Universal Asynchronous Receiver/Transmitter,UART)或通用序列匯流排(Universal Serial Bus,USB)。在第二模式中, 傳輸端FBL在被切換為電源供應裝置10的應用端。舉例來說,應用端可以是資料回饋端。以資料回饋端為例,電源供應裝置10可透過傳輸端FBL將測試資料回饋給外部裝置ED。 In this embodiment, the external device ED can use any form of data transmission interface to connect with the transmission end FBL. The data transmission interface is, for example, a Universal Asynchronous Receiver/Transmitter (UART) or a Universal Serial Bus (USB). In the second mode, The transmission terminal FBL is switched to the application terminal of the power supply device 10 . For example, the application end can be the data feedback end. Taking the data feedback end as an example, the power supply device 10 can feed back the test data to the external device ED through the transmission end FBL.

在本實施例中,外部裝置ED可以是測試主機、平板電腦、筆記型電腦與桌上型電腦等能夠提供控制參數的電子裝置。 In this embodiment, the external device ED may be an electronic device capable of providing control parameters, such as a test host, a tablet computer, a notebook computer, and a desktop computer.

在本實施例中,判斷電路130包括第一輸入端、第二輸入端以及輸出端。第一輸入端耦接於電源輸入端PAC。第一輸入端接收位於電源輸入端PAC的輸入電壓值VAC。第二輸入端接收參考電壓值VDET。輸出端耦接於控制電路140。輸出端用以輸出第一模式訊號SM1以及第二模式訊號SM2的其中之一。在本實施例中,判斷電路130可以是由比較器或運算放大器來實施。 In this embodiment, the judgment circuit 130 includes a first input terminal, a second input terminal and an output terminal. The first input terminal is coupled to the power input terminal PAC. The first input terminal receives the input voltage value VAC located at the power input terminal PAC. The second input terminal receives the reference voltage value VDET. The output terminal is coupled to the control circuit 140 . The output terminal is used to output one of the first mode signal SM1 and the second mode signal SM2. In this embodiment, the judgment circuit 130 may be implemented by a comparator or an operational amplifier.

在本實施例中,控制電路140例如是中央處理單元(Central Processing Unit,CPU),或是其他可程式化之一般用途或特殊用途的微處理器(Microprocessor)、數位訊號處理器(Digital Signal Processor,DSP)、可程式化控制器、特殊應用積體電路(Application Specific Integrated Circuits,ASIC)、可程式化邏輯裝置(Programmable Logic Device,PLD)或其他類似裝置或這些裝置的組合,其可載入並執行電腦程式。 In this embodiment, the control circuit 140 is, for example, a central processing unit (CPU), or other programmable general-purpose or special-purpose microprocessor (Microprocessor) or digital signal processor (Digital Signal Processor). , DSP), programmable controller, Application Specific Integrated Circuits (ASIC), Programmable Logic Device (PLD) or other similar devices or combinations of these devices, which can be loaded and execute computer programs.

請參考圖1以及圖2,圖2是依據本新型創作一實施例所繪示的輸入電壓值的示意圖。在本實施例中,判斷電路130判斷位於電源輸入端PAC的輸入電壓值VAC。判斷電路130比較輸入電壓值VAC的峰值VP以及參考電壓值VDET。當輸入電壓值VAC 的峰值VP小於參考電壓值VDET時,判斷電路130產生第一模式訊號SM1。因此,控制電路140進入第一模式MD1。在另一方面,當輸入電壓值VAC的峰值VP大於或等於參考電壓值VDET時,判斷電路130則產生第二模式訊號SM2。因此,控制電路140進入第二模式MD2。 Please refer to FIG. 1 and FIG. 2 . FIG. 2 is a schematic diagram of an input voltage value according to an embodiment of the present invention. In this embodiment, the determination circuit 130 determines the input voltage value VAC located at the power input terminal PAC. The determination circuit 130 compares the peak value VP of the input voltage value VAC with the reference voltage value VDET. When the input voltage value VAC When the peak value VP of is less than the reference voltage value VDET, the judgment circuit 130 generates the first mode signal SM1. Therefore, the control circuit 140 enters the first mode MD1. On the other hand, when the peak value VP of the input voltage value VAC is greater than or equal to the reference voltage value VDET, the judgment circuit 130 generates the second mode signal SM2. Therefore, the control circuit 140 enters the second mode MD2.

以本實施例為例,若要使控制電路140進入第一模式MD1,工程人員可對電源輸入端PAC施加第一電壓訊號。第一電壓訊號的輸入電壓值VAC的峰值VP低於參考電壓值VDET。因此,判斷電路130產生第一模式訊號SM1。控制電路140反應於第一模式訊號SM1而進入第一模式MD1。在第一模式MD1中,如果控制電路140透過傳輸端FBL接收到控制參數PC1,控制電路140會將控制參數PC1寫入至第一記憶體電路110。在第一模式MD1中,如果控制電路140沒有接收到控制參數PC1,控制電路140會等待直到接收到控制參數PC1為止。第一電壓訊號可以是直流電壓訊號或交流電壓訊號。 Taking this embodiment as an example, to make the control circuit 140 enter the first mode MD1, the engineer can apply a first voltage signal to the power input terminal PAC. The peak value VP of the input voltage value VAC of the first voltage signal is lower than the reference voltage value VDET. Therefore, the judgment circuit 130 generates the first mode signal SM1. The control circuit 140 responds to the first mode signal SM1 and enters the first mode MD1. In the first mode MD1, if the control circuit 140 receives the control parameter PC1 through the transmission terminal FBL, the control circuit 140 will write the control parameter PC1 into the first memory circuit 110. In the first mode MD1, if the control circuit 140 does not receive the control parameter PC1, the control circuit 140 waits until the control parameter PC1 is received. The first voltage signal may be a DC voltage signal or an AC voltage signal.

當第一記憶體電路110儲存控制參數PC1時,工程人員可對電源輸入端PAC施加第二電壓訊號。第二電壓訊號可以是直流電壓訊號或交流電壓訊號。第二電壓訊號可例如是市電。第二電壓訊號的輸入電壓值VAC的峰值VP高於參考電壓值VDET。因此,判斷電路130產生第二模式訊號SM2。控制電路140反應於第二模式訊號SM2而進入第二模式MD2。在第二模式MD2中,控制電路140利用儲存在第一記憶體電路110中的控制參數PC1 來對電源供應裝置10進行測試。在測試後,當控制參數PC1符合電源供應裝置10的預期功能FC時,控制參數PC1可能是電源供應裝置10的最佳參數。控制電路140透過傳輸端FBL將測試結果SF回饋到外部裝置ED。此外,在第二模式MD2中,在完成測試後,控制電路140將控制參數PC1寫入至第二記憶體電路120。也因此,在出廠後,電源供應裝置10基於儲存在第二記憶體電路120中的控制參數PC1來運行。換言之,在出廠後,控制電路140以第二模式MD2來運行。 When the first memory circuit 110 stores the control parameter PC1, the engineer can apply the second voltage signal to the power input terminal PAC. The second voltage signal may be a DC voltage signal or an AC voltage signal. The second voltage signal may be, for example, mains power. The peak value VP of the input voltage value VAC of the second voltage signal is higher than the reference voltage value VDET. Therefore, the judgment circuit 130 generates the second mode signal SM2. The control circuit 140 responds to the second mode signal SM2 and enters the second mode MD2. In the second mode MD2, the control circuit 140 uses the control parameter PC1 stored in the first memory circuit 110 Let's test the power supply device 10 . After testing, when the control parameter PC1 meets the expected function FC of the power supply device 10, the control parameter PC1 may be the best parameter of the power supply device 10. The control circuit 140 feeds back the test result SF to the external device ED through the transmission terminal FBL. In addition, in the second mode MD2, after completing the test, the control circuit 140 writes the control parameter PC1 to the second memory circuit 120. Therefore, after leaving the factory, the power supply device 10 operates based on the control parameter PC1 stored in the second memory circuit 120 . In other words, after leaving the factory, the control circuit 140 operates in the second mode MD2.

在另一方面,在第二模式MD2中,當控制參數PC1並不符合電源供應裝置10的預期功能FC時,控制參數PC1並不是電源供應裝置10的最佳參數。控制電路140透過傳輸端FBL將上述的測試結果SF回饋到外部裝置ED。因此,工程人員能夠獲知控制參數必須被調整。工程人員對電源輸入端PAC施加第一電壓訊號。因此,控制器100被控制以進入第一模式MD1。在第一模式MD1中,外部裝置ED提供控制參數PC2。控制電路140接收來自於傳輸端FBL的控制參數PC2,並將控制參數PC2寫入至第一記憶體電路110。接下來,工程人員對電源輸入端PAC施加第二電壓訊號以使控制器100進入第二模式MD2。 On the other hand, in the second mode MD2, when the control parameter PC1 does not comply with the expected function FC of the power supply device 10, the control parameter PC1 is not an optimal parameter of the power supply device 10. The control circuit 140 feeds back the above-mentioned test result SF to the external device ED through the transmission terminal FBL. Therefore, the engineering personnel can learn that the control parameters must be adjusted. The engineer applies the first voltage signal to the power input terminal PAC. Therefore, the controller 100 is controlled to enter the first mode MD1. In the first mode MD1, the external device ED provides control parameters PC2. The control circuit 140 receives the control parameter PC2 from the transmission end FBL, and writes the control parameter PC2 into the first memory circuit 110 . Next, the engineer applies a second voltage signal to the power input terminal PAC to cause the controller 100 to enter the second mode MD2.

在第二模式MD2中,控制電路140讀取儲存在第一記憶體電路110中的控制參數PC2,並依據控制參數PC2來產生對應於控制參數PC2的控制訊號SC。控制電路140利用對應於控制參數PC2的控制訊號SC來進行測試。當儲存於第一記憶體電路110 的控制參數PC2符合電源供應裝置10的預期功能FC時,將控制參數PC2寫入至第二記憶體電路120。因此,在出廠後,電源供應裝置10基於儲存在第二記憶體電路120中的控制參數PC2來運行。 In the second mode MD2, the control circuit 140 reads the control parameter PC2 stored in the first memory circuit 110, and generates the control signal SC corresponding to the control parameter PC2 according to the control parameter PC2. The control circuit 140 uses the control signal SC corresponding to the control parameter PC2 to perform testing. When stored in the first memory circuit 110 When the control parameter PC2 meets the expected function FC of the power supply device 10, the control parameter PC2 is written to the second memory circuit 120. Therefore, after leaving the factory, the power supply device 10 operates based on the control parameter PC2 stored in the second memory circuit 120 .

綜上所述,控制電路在第一模式中先將來自於傳輸端的第一控制參數寫入至第一記憶體電路。在第二模式中,控制電路利用儲存在第一記憶體電路中的第一控制參數對電源供應裝置進行測試。當第一控制參數符合電源供應裝置的預期功能時,控制電路才將第一控制參數寫入至第二記憶體電路。控制電路被允許對第一記憶體電路進行多次的編程操作。如此一來,控制器能夠實現多次接收控制參數,並對所接收到的不同控制參數進行測試。控制器適用於多次不同控制參數的測試。控制器的測試便利性能夠大幅被提升。 To sum up, in the first mode, the control circuit first writes the first control parameter from the transmission end to the first memory circuit. In the second mode, the control circuit tests the power supply device using the first control parameter stored in the first memory circuit. When the first control parameter meets the expected function of the power supply device, the control circuit writes the first control parameter to the second memory circuit. The control circuit is allowed to perform multiple programming operations on the first memory circuit. In this way, the controller can receive control parameters multiple times and test the different control parameters received. The controller is suitable for multiple tests with different control parameters. The testing convenience of the controller can be greatly improved.

雖然本新型創作已以實施例揭露如上,然其並非用以限定本新型創作,任何所屬技術領域中具有通常知識者,在不脫離本新型創作的精神和範圍內,當可作些許的更動與潤飾,故本新型創作的保護範圍當視後附的申請專利範圍所界定者為準。 Although the embodiments of the present invention have been disclosed above, they are not intended to limit the invention. Anyone with ordinary knowledge in the technical field can make some modifications and changes without departing from the spirit and scope of the invention. Therefore, the scope of protection of this new creation shall be determined by the appended patent application scope.

10:電源供應裝置 10:Power supply device

100:控制器 100:Controller

110:第一記憶體電路 110: First memory circuit

120:第二記憶體電路 120: Second memory circuit

130:判斷電路 130:Judgement circuit

140:控制電路 140:Control circuit

ED:外部裝置 ED: external device

FBL:傳輸端 FBL: transmission end

FC:預期功能 FC: expected function

PAC:電源輸入端 PAC: power input terminal

PC1、PC2:控制參數 PC1, PC2: control parameters

POUT:輸出電源 POUT: output power

SC:控制訊號 SC: control signal

SF:測試結果 SF: test results

SM1:第一模式訊號 SM1: first mode signal

SM2:第二模式訊號 SM2: second mode signal

VAC:輸入電壓值 VAC: input voltage value

VDET:參考電壓值 VDET: reference voltage value

Claims (10)

一種用於電源供應裝置的控制器,包括:電源輸入端;傳輸端;第一記憶體電路;第二記憶體電路;判斷電路,耦接於所述電源輸入端,經配置以判斷位於所述電源輸入端的輸入電壓值,當所述輸入電壓值小於參考電壓值時,產生第一模式訊號,並且當所述輸入電壓值大於或等於參考電壓值時,產生第二模式訊號;以及控制電路,耦接於所述判斷電路、所述第一記憶體電路、所述第二記憶體電路以及所述傳輸端,經配置以反應於所述第一模式訊號進入第一模式,並且反應於所述第二模式訊號進入第二模式,其中在所述第一模式中,所述控制電路將來自於所述傳輸端的第一控制參數寫入至所述第一記憶體電路,並且其中在所述第二模式中,所述控制電路利用儲存在所述第一記憶體電路中的所述第一控制參數對所述電源供應裝置進行測試,並且當所述第一控制參數符合所述電源供應裝置的預期功能時,將所述第一控制參數寫入至所述第二記憶體電路。 A controller for a power supply device, including: a power input terminal; a transmission terminal; a first memory circuit; a second memory circuit; a judgment circuit coupled to the power input terminal and configured to judge whether the The input voltage value at the power input end, when the input voltage value is less than the reference voltage value, a first mode signal is generated, and when the input voltage value is greater than or equal to the reference voltage value, a second mode signal is generated; and the control circuit, coupled to the judgment circuit, the first memory circuit, the second memory circuit and the transmission end, configured to enter the first mode in response to the first mode signal, and in response to the The second mode signal enters the second mode, wherein in the first mode, the control circuit writes the first control parameter from the transmission end to the first memory circuit, and wherein in the third In the second mode, the control circuit uses the first control parameter stored in the first memory circuit to test the power supply device, and when the first control parameter meets the requirements of the power supply device When a function is expected, the first control parameter is written to the second memory circuit. 如請求項1所述的控制器,其中所述第一記憶體電路是多次性可編程記憶體電路。 The controller of claim 1, wherein the first memory circuit is a one-time programmable memory circuit. 如請求項1所述的控制器,其中所述第二記憶體電路是一次性可編程記憶體電路。 The controller of claim 1, wherein the second memory circuit is a one-time programmable memory circuit. 如請求項1所述的控制器,其中:當所述輸入電壓值的峰值小於所述參考電壓值時,所述判斷電路產生所述第一模式訊號,並且當所述輸入電壓值的峰值大於或等於所述參考電壓值時,所述判斷電路產生第二模式訊號。 The controller of claim 1, wherein: when the peak value of the input voltage value is less than the reference voltage value, the judgment circuit generates the first mode signal, and when the peak value of the input voltage value is greater than or equal to the reference voltage value, the judgment circuit generates a second mode signal. 如請求項1所述的控制器,其中所述傳輸端在所述第一模式中被切換為參數接收端。 The controller according to claim 1, wherein the transmitting end is switched to a parameter receiving end in the first mode. 如請求項1所述的控制器,其中所述傳輸端在所述第一模式中接收來自於外部裝置的所述第一控制參數。 The controller of claim 1, wherein the transmission end receives the first control parameter from an external device in the first mode. 如請求項1所述的控制器,其中所述傳輸端在所述第二模式中被切換為所述電源供應裝置的應用端。 The controller of claim 1, wherein the transmission end is switched to the application end of the power supply device in the second mode. 如請求項1所述的控制器,其中在所述第二模式中,當所述第一控制參數不符合所述電源供應裝置的所述預期功能時,所述控制器被控制以進入所述第一模式。 The controller of claim 1, wherein in the second mode, when the first control parameter does not meet the expected function of the power supply device, the controller is controlled to enter the First mode. 如請求項8所述的控制器,其中在所述第一模式中,所述控制電路接收來自於所述傳輸端的第二控制參數,並將所述第二控制參數寫入至所述第一記憶體電路。 The controller of claim 8, wherein in the first mode, the control circuit receives a second control parameter from the transmission end and writes the second control parameter to the first memory circuit. 如請求項9所述的控制器,其中在所述第二模式中,當儲存於所述第一記憶體電路的所述第二控制參數符合所述 電源供應裝置的所述預期功能時,將所述第二控制參數寫入至所述第二記憶體電路。 The controller of claim 9, wherein in the second mode, when the second control parameter stored in the first memory circuit meets the When the power supply device performs the expected function, the second control parameter is written to the second memory circuit.
TW112206966U 2023-04-24 2023-07-05 Controller for power supply device TWM650996U (en)

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TWI868777B (en) * 2023-04-24 2025-01-01 力林科技股份有限公司 Controller for power supply device
US12431784B2 (en) 2023-04-24 2025-09-30 Power Forest Technology Corporation Controller for power supply device

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