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TWI824291B - Connecting mechanism, tester having the same, and testing apparatus having the same - Google Patents

Connecting mechanism, tester having the same, and testing apparatus having the same Download PDF

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Publication number
TWI824291B
TWI824291B TW110133818A TW110133818A TWI824291B TW I824291 B TWI824291 B TW I824291B TW 110133818 A TW110133818 A TW 110133818A TW 110133818 A TW110133818 A TW 110133818A TW I824291 B TWI824291 B TW I824291B
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Taiwan
Prior art keywords
control
guide
axis
joint mechanism
actuator
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TW110133818A
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Chinese (zh)
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TW202312598A (en
Inventor
李子瑋
方侑信
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鴻勁精密股份有限公司
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Priority to TW110133818A priority Critical patent/TWI824291B/en
Publication of TW202312598A publication Critical patent/TW202312598A/en
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Publication of TWI824291B publication Critical patent/TWI824291B/en

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  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The present invention provides a connecting mechanism including a plurality of clamping members and a driving structure. The clamping members are arranged along a clamping axis. The clamping member has a clamping portion at a side thereof for clamping an electronic component, and further has a first guiding member at another side thereof. The driving structure includes a moving member, a fixing member, and a control member. The moving member is movable along a pressing axis and is connected to the clamping members. The fixing member has a second guiding member. The control member is movable along a control axis and has a first control element and a second control element. The first control element corresponds to the first guiding member so that the control member controls the clamping members to move along the clamping axis to clamp the electronic component. The second control element corresponds to the second guiding member so that the control member presses the moving member to make the moving member drive the clamping members and the electronic component to move along the pressing axis. Thereby, the electronic component can be pressed onto the tester firmly for testing process.

Description

接合機構及其應用之測試裝置、測試作業機Testing devices and test operating machines for joint mechanisms and their applications

本發明提供一種提高壓接使用效能之接合機構。 The invention provides a joint mechanism that improves the efficiency of crimping.

在現今,一內建有天線之射頻電子元件廣泛應用於行動通訊區域無線網路系統及無線通訊區域網路系統等領域;射頻電子元件於本體之底面設置複數個接點,並於本體之頂面設置天線,射頻電子元件於出廠前,除了執行電性測試作業,亦需執行無線訊號測試作業,以確保品質。 Nowadays, a radio frequency electronic component with a built-in antenna is widely used in mobile communication area wireless network systems and wireless communication area network systems. The radio frequency electronic component is provided with a plurality of contacts on the bottom surface of the body and on the top of the body. Antennas are installed on the surface. Before RF electronic components leave the factory, in addition to electrical testing, they also need to perform wireless signal testing to ensure quality.

測試裝置於機台配置一具探針及電路板之電性測試器,並於電性測試器之上方配置天線測試器;當射頻電子元件置入電性測試器時,射頻電子元件以接點接觸電性測試器之探針而執行電性測試作業,並以天線朝向天線測試器發出無線訊號,天線測試器接收無線訊號而進行無線訊號測試作業。 The test device is equipped with an electrical tester with a probe and a circuit board on the machine, and an antenna tester is arranged above the electrical tester; when the radio frequency electronic components are placed in the electrical tester, the radio frequency electronic components are connected to the contacts Contact the probe of the electrical tester to perform electrical testing operations, and use the antenna to send wireless signals toward the antenna tester. The antenna tester receives the wireless signals and performs wireless signal testing operations.

惟,由於電性測試器之探針內具有彈簧,射頻電子元件之自重不足以使接點與探針作有效性地電性接觸,以致影響射頻電子元件之電性測試準確性。但若以一壓接器由上向下壓接電子元件之頂面,雖可使射頻電子元件之接點確實接觸電性測試器之探針,卻會導致壓接器屏蔽電子元件之天線,以致影響射頻電子元件之無線訊號測試準確性;因此,如何在不影響天線測試器與 射頻電子元件之無線訊號測試作業的要件下,使射頻電子元件確實壓接電性測試器執行電性測試作業,著實相當重要。 However, since the probe of the electrical tester has a spring, the self-weight of the RF electronic component is not enough to make effective electrical contact between the contact and the probe, thus affecting the accuracy of the electrical test of the RF electronic component. However, if a crimping device is used to press the top surface of an electronic component from top to bottom, although the contact point of the RF electronic component can definitely contact the probe of the electrical tester, it will cause the crimping device to shield the antenna of the electronic component. As a result, it affects the accuracy of wireless signal testing of radio frequency electronic components; therefore, how to do it without affecting the antenna tester and Under the conditions of wireless signal testing of RF electronic components, it is really important to ensure that the RF electronic components are accurately connected to the electrical tester to perform the electrical testing operation.

本發明之目的一,提供一種接合機構,包含複數個夾持具及驅動結構,複數個夾持具沿夾持軸線作相對配置,夾持具於一側設有夾持部供夾持電子元件,於另一側設有第一導移部件;驅動結構包含作動具、固定具及控制具,作動具可沿壓接軸線位移,並連接複數個夾持具,固定具設有第二導移部件,控制具可沿控制軸線位移,並設有第一控制部件及第二控制部件,其第一控制部件與夾持具之第一導移部件相配合,使控制具控制複數個夾持具沿夾持軸線位移夾持電子元件,第二控制部件與固定具之第二導移部件相配合,令控制具下壓作動具,以控制作動具帶動複數個夾持具及電子元件沿壓接軸線位移,使電子元件確實壓接電性測試器執行電性測試作業。 One object of the present invention is to provide a joint mechanism that includes a plurality of clamps and a driving structure. The plurality of clamps are relatively arranged along the clamping axis. The clamp is provided with a clamping portion on one side for clamping electronic components. , a first guide component is provided on the other side; the driving structure includes an actuator, a fixture and a control device. The actuator can be displaced along the crimping axis and is connected to a plurality of clamps. The fixture is provided with a second guide component. The control device is displaceable along the control axis and is provided with a first control part and a second control part. The first control part cooperates with the first guide part of the clamp to enable the control device to control multiple clamps. The electronic component is clamped by displacement along the clamping axis. The second control component cooperates with the second guide component of the fixture to cause the control tool to press down on the actuator to control the actuator to drive multiple clamps and electronic components along the crimping The axis displacement enables the electronic components to be accurately pressed and connected to the electrical tester to perform electrical testing operations.

本發明之目的二,提供一種接合機構,其複數個夾持具作側向夾持一為射頻電子元件之電子元件,可防止屏蔽射頻電子元件頂面之天線,以利天線與天線測試器進行無線訊號測試作業,進而提升測試品質。 The second object of the present invention is to provide a joint mechanism in which a plurality of clamps are used to laterally clamp an electronic component, which is a radio frequency electronic component, to prevent the antenna from shielding the top surface of the radio frequency electronic component and facilitate the operation of the antenna and the antenna tester. Wireless signal test operations, thereby improving test quality.

本發明之目的三,提供一種接合機構,其驅動結構以單一控制具控制且驅動二夾持具及作動具依作動時序分別沿夾持軸線及壓接軸線位移,而執行夾持電子元件及帶動電子元件壓接探針,不僅節省驅動用元件成本,更利於機構之空間配置。 The third object of the present invention is to provide a joint mechanism whose driving structure is controlled by a single controller and drives two clamps and an actuator to displace along the clamping axis and the crimping axis respectively according to the actuation sequence, thereby clamping electronic components and driving The electronic component crimping probe not only saves the cost of driving components, but also facilitates the spatial configuration of the mechanism.

本發明之目的四,提供一種接合機構,更包含基座,基座與作動具間沿壓接軸線設有讓位空間,基座設有承置部供承置電子元件,並供裝配固定具及電性測試器之探針,作動具沿壓接軸線向下位移貼合基座,使二夾持具 夾持射頻電子元件確實壓接電性測試器之探針執行電性測試作業,進而提升測試作業便利性。 The fourth object of the present invention is to provide a joint mechanism, which further includes a base. A clearance space is provided between the base and the actuator along the crimping axis. The base is provided with a receiving portion for holding electronic components and for assembling a fixture. And the probe of the electrical tester, the actuator moves downward along the crimping axis to fit the base, so that the two clamping tools Clamp the RF electronic component and firmly press the probe of the electrical tester to perform electrical testing operations, thereby improving the convenience of testing operations.

本發明之目的五,提供一種測試裝置,包含測試室、至少一電性測試器及本發明接合機構,測試室設有至少一測試空間,電性測試器配置於測試空間,並設有電性連接之探針及電路板,本發明接合機構配置於電性測試器上,以供夾持且驅動電子元件壓接探針,進而提高測試品質。 The fifth object of the present invention is to provide a testing device, which includes a testing chamber, at least one electrical tester and a joint mechanism of the present invention. The testing chamber is provided with at least one testing space. The electrical tester is arranged in the testing space and is equipped with an electrical testing device. To connect the probe and the circuit board, the joint mechanism of the present invention is configured on the electrical tester to clamp and drive the electronic component to press the probe, thereby improving the test quality.

本發明之目的六,提供一種測試作業機,包含機台、供料裝置、收料裝置、具本發明接合機構之測試裝置、輸送裝置及中央控制裝置;供料裝置配置於機台上,並設有至少一容納待測電子元件之供料承置器;收料裝置配置於機台上,並設有至少一容納已測電子元件之收料承置器;測試裝置配置於機台上,包含測試室、至少一電性測試器及本發明接合機構,以供測試電子元件;輸送裝置配置於機台上,並設有至少一輸送器,以輸送電子元件;中央控制裝置以供控制及整合各裝置作動,而執行自動化作業。 The sixth object of the present invention is to provide a testing operation machine, which includes a machine platform, a feeding device, a receiving device, a testing device with a joint mechanism of the present invention, a conveying device and a central control device; the feeding device is arranged on the machine platform, and There is at least one feeding holder for accommodating the electronic components to be tested; a receiving device is arranged on the machine platform, and at least one receiving holder for accommodating the electronic components under test is provided; the testing device is arranged on the machine platform, It includes a test chamber, at least one electrical tester and a joint mechanism of the present invention for testing electronic components; a conveying device is arranged on the machine platform and is provided with at least one conveyor for conveying electronic components; a central control device is used for control and Integrate the actions of various devices to perform automated operations.

10:基座 10: base

11:承置部 11: Acquisition Department

20:夾持具 20: Clamp

21:夾持部 21: Clamping part

22:第一導移部件 22: First guide component

23:承裝部 23:Container Department

30:作動具 30:Actuator

31:第一滑槽 31:First chute

32:通孔 32:Through hole

33:第二滑槽 33:Second chute

34:彈性件 34: Elastic parts

40:固定具 40: Fixture

41:支架 41: Bracket

42:橫板 42:Horizontal board

431:第一導引段 431: First guiding section

432:第二導引段 432: Second guidance section

50:控制具 50:Control tools

51:側部 51: Side

521:第一控制段 521: First control section

522:第二控制段 522: Second control section

53:第二控制部件 53: Second control part

54:壓缸 54: Press cylinder

A:夾持軸線 A: Clamping axis

B:壓接軸線 B: Crimping axis

C:控制軸線 C: Control axis

60:射頻電子元件 60:RF electronic components

711:電路板 711:Circuit board

712:探針 712:Probe

72:天線測試器 72:Antenna tester

80:機台 80:Machine

90:供料裝置 90: Feeding device

91:供料承置器 91: Feed holder

100:收料裝置 100: Receiving device

1001:收料承置器 1001: Material receiving device

110:測試裝置 110:Test device

1101:測試室 1101:Test room

120:輸送裝置 120: Conveying device

1201:第一輸送器 1201: First conveyor

1202:第二輸送器 1202: Second conveyor

1203:第三輸送器 1203:Third conveyor

圖1:本發明接合機構之俯視圖。 Figure 1: Top view of the joint mechanism of the present invention.

圖2:本發明接合機構之A-A線段剖視圖。 Figure 2: A-A cross-sectional view of the joint mechanism of the present invention.

圖3:本發明接合機構之B-B線段剖視圖。 Figure 3: Cross-sectional view of the joint mechanism of the present invention along line B-B.

圖4:本發明接合機構應用於測試裝置之示意圖。 Figure 4: Schematic diagram of the joint mechanism of the present invention applied to a test device.

圖5:本發明接合機構之使用示意圖(一)。 Figure 5: Schematic diagram of the use of the joint mechanism of the present invention (1).

圖6:係A-A線段的作動示意圖。 Figure 6: Schematic diagram of the action of line segment A-A.

圖7:係B-B線段的作動示意圖。 Figure 7: Schematic diagram of the action of line segment B-B.

圖8:本發明接合機構之使用示意圖(二)。 Figure 8: Schematic diagram of the use of the joint mechanism of the present invention (2).

圖9:係A-A線段的作動示意圖。 Figure 9: Schematic diagram of the action of line segment A-A.

圖10:係B-B線段的作動示意圖。 Figure 10: Schematic diagram of the action of line segment B-B.

圖11:本發明接合機構應用於測試作業機之示意圖。 Figure 11: Schematic diagram of the joint mechanism of the present invention applied to a test operating machine.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後: In order for your review committee to have a further understanding of the present invention, a preferred embodiment is cited together with the drawings, and the details are as follows:

請參閱圖1~3,本發明接合機構包含複數個夾持具及驅動結構;依作業需求,本發明接合機構可直接裝配於具測試座之測試器,或者本發明接合機構更包含基座,該基座配置於複數個夾持具及驅動結構之下方,更佳者,基座可供裝配測試器之複數支探針;於本實施例,接合機構包含基座10、複數個夾持具20及驅動結構。 Please refer to Figures 1 to 3. The joint mechanism of the present invention includes a plurality of clamps and driving structures. Depending on the operation requirements, the joint mechanism of the present invention can be directly assembled on a tester with a test seat, or the joint mechanism of the present invention further includes a base. The base is disposed below a plurality of clamps and a driving structure. Better yet, the base can be used to assemble a plurality of probes of the tester. In this embodiment, the joint mechanism includes a base 10 and a plurality of clamps. 20 and drive structure.

基座10可為獨立座體、機台板或測試座,並配置於複數個夾持具20及驅動結構之下方,舉例基座10為機台板,機台板可開設容置孔供裝配具探針之測試座,複數個夾持具20及驅動結構裝配於機台板,並位於測試座之上方;舉例基座10為具探針之測試座,測試座供裝配複數個夾持具20及驅動結構,均無不可,不受限於本實施例;於本實施例,基座10為獨立座體,並設有至少一承置部11,以供承置電子元件,基座10可供裝配電性測試器之複數支探針。 The base 10 can be an independent base body, a machine plate or a test seat, and is arranged below a plurality of clamps 20 and the driving structure. For example, the base 10 is a machine plate, and the machine plate can have accommodating holes for assembly. A test seat with probes, a plurality of clamps 20 and a driving structure are assembled on the machine board, and are located above the test seat; for example, the base 10 is a test seat with probes, and the test seat is for assembling a plurality of clamps 20 and the driving structure are optional and are not limited to this embodiment; in this embodiment, the base 10 is an independent base body and is provided with at least one receiving portion 11 for receiving electronic components. The base 10 Can be used to assemble multiple probes of electrical tester.

複數個夾持具20沿夾持軸線A作相對配置,複數個夾持具20於一側設有夾持部21供夾持電子元件,並於至少一夾持具20之另一側設有第一導移部件22;更進一步,一夾持具20可作為固定基準,另一夾持具20為可移動設計,或 者二夾持具20均為可移動設計作彼此靠近或遠離。依作業需求,夾持部21可為平面、弧面、叉桿或氣囊等,夾持部21可夾持於電子元件之本體側面,或者夾持於電子元件的本體與接點之間,或者夾持於電子元件之接點,不受限於本實施例;於本實施例,複數個夾持具20沿夾持軸線A(如X軸向)呈水平配置於基座10之上方,並相對配置位於承置部11之兩側,複數個夾持具20於一側設有為平面之夾持部21,以供夾持電子元件。 A plurality of clamps 20 are arranged oppositely along the clamping axis A. The plurality of clamps 20 are provided with a clamping portion 21 on one side for clamping electronic components, and are provided with a clamping portion 21 on the other side of at least one clamp 20. The first guide component 22; further, one clamp 20 can be used as a fixed reference, and the other clamp 20 is designed to be movable, or Both clamps 20 are movable and designed to move closer to or farther away from each other. Depending on the operation requirements, the clamping part 21 can be a flat surface, a curved surface, a fork rod or an air bag, etc. The clamping part 21 can be clamped on the side of the body of the electronic component, or between the body and the contact point of the electronic component, or The contacts clamped on the electronic components are not limited to this embodiment; in this embodiment, a plurality of clamps 20 are arranged horizontally above the base 10 along the clamping axis A (such as the X-axis direction), and Arranged oppositely on both sides of the holding portion 11 , the plurality of clamps 20 are provided with a flat clamping portion 21 on one side for clamping electronic components.

夾持具20之第一導移部件22可為桿件或具複數個控制段之導槽,若第一導移部件22為桿件,桿件可為獨立桿裝配於夾持具20,或者桿件與夾持具20一體成型;第一導移部件22可為直桿或偏心桿,舉例第一導移部件22為偏心桿裝設於夾持具20,可旋轉第一導移部件22,以微調夾持具20之初始位置,使夾持具20精確位移夾持電子元件。 The first guide component 22 of the clamp 20 can be a rod or a guide groove with a plurality of control sections. If the first guide component 22 is a rod, the rod can be an independent rod assembled to the clamp 20, or The rod and the clamp 20 are integrally formed; the first guide part 22 can be a straight rod or an eccentric rod. For example, the first guide part 22 is an eccentric rod installed on the clamp 20. The first guide part 22 can be rotated. , to fine-tune the initial position of the clamp 20 so that the clamp 20 can be accurately displaced to clamp the electronic component.

於本實施例,夾持具20於另一側設有承裝部23,以供螺接組裝一為偏心桿且呈Z軸向配置之第一導移部件22,於測試作業前,可旋轉第一導移部件22,以微調夾持具20之初始位置,使夾持具20精確位移夾持電子元件;然第一導移部件22與承裝部23之組裝方式可為嵌接組裝或螺接組裝等,不受限於本實施例。 In this embodiment, the clamp 20 is provided with a receiving portion 23 on the other side for threading and assembling a first guide component 22 that is an eccentric rod and is arranged in the Z-axis direction. It can be rotated before the test operation. The first guide part 22 is used to fine-tune the initial position of the clamp 20 so that the clamp 20 can be accurately displaced to clamp the electronic components; however, the assembly method of the first guide part 22 and the receiving part 23 can be embedded assembly or Screw assembly, etc. are not limited to this embodiment.

驅動結構包含作動具30、至少一固定具40及控制具50。 The driving structure includes an actuator 30 , at least one fixing device 40 and a control device 50 .

作動具30可沿壓接軸線B位移,並連接複數個夾持具20;於本實施例,作動具30設有相通基座10之承置部11的第一空間,以供移入/移出電子元件,作動具30設有二沿夾持軸線A(如X軸向)作相對配置之第一滑槽31,第一滑槽31相通第一空間,並供滑置二夾持具20,作動具30可帶動二夾持具20同步沿壓接軸線B(如Z軸向)位移,壓接軸線B之軸向(如Z軸向)異於夾持軸線A之軸向(如X軸 向);作動具30於相對應第一導移部件22之位置開設通孔32,以供穿置第一導移部件22及承裝部23,另於作動具30之側方設有至少一沿控制軸線C(如Y軸向)配置之第二滑槽33,控制軸線C之軸向(如Y軸向)異於夾持軸線A之軸向(如X軸向)。 The actuator 30 can displace along the crimping axis B and connect a plurality of clamps 20; in this embodiment, the actuator 30 is provided with a first space communicating with the receiving portion 11 of the base 10 for moving in/out electronics. Component, the actuator 30 is provided with two first chute 31 arranged oppositely along the clamping axis A (such as the X-axis direction). The first chute 31 communicates with the first space and is used for sliding the two clamps 20 to actuate The tool 30 can drive the two clamping tools 20 to synchronously move along the crimping axis B (such as the Z-axis direction). The axial direction of the crimping axis B (such as the Z-axis direction) is different from the axial direction of the clamping axis A (such as the X-axis direction). direction); the actuator 30 is provided with a through hole 32 at a position corresponding to the first guide component 22 for the insertion of the first guide component 22 and the receiving portion 23. In addition, at least one hole is provided on the side of the actuator 30. The second slide groove 33 is arranged along the control axis C (such as the Y-axis direction). The axial direction of the control axis C (such as the Y-axis direction) is different from the axial direction of the clamping axis A (such as the X-axis direction).

另於該作動具30之底面或周側設有至少一彈性件34,以供作動具30可沿壓接軸線B作彈性位移;更進一步,作動具30與基座10間設有至少一彈性件34,至少一彈性件34可使作動具30與基座10間具有適當高度之讓位空間,讓位空間以供作動具30沿壓接軸線B作彈性位移,彈性件34可使作動具30彈性復位。 In addition, at least one elastic member 34 is provided on the bottom surface or peripheral side of the actuator 30 so that the actuator 30 can elastically displace along the crimping axis B; furthermore, at least one elastic member 34 is provided between the actuator 30 and the base 10 34. At least one elastic member 34 can provide a space of appropriate height between the actuator 30 and the base 10. The space allows the actuator 30 to elastically displace along the crimping axis B. The elastic member 34 can allow the actuator 30 to move elastically along the crimping axis B. 30 elastic reset.

至少一固定具40設有第二導移部件,更進一步,固定具40可位於作動具30之上方或側方;第二導移部件可為桿件,或具有不同高度且沿控制軸線C配置之複數個導引段;於本實施例,二固定具40之底部以支架41固定裝配於基座10之頂部,並位於作動具30之上方,各固定具40之側面凸設有橫板42,橫板42之底面設有第二導移部件,第二導移部件包含沿控制軸線C配置且具有不同高度之複數個導引段,複數個導引段包含第一導引段431及第二導引段432,第二導引段432之高度低於第一導引段431之高度。 At least one fixture 40 is provided with a second guide component. Furthermore, the fixture 40 can be located above or to the side of the actuator 30; the second guide component can be a rod, or have different heights and is arranged along the control axis C. A plurality of guide sections; in this embodiment, the bottoms of the two fixtures 40 are fixedly assembled on the top of the base 10 with brackets 41 and are located above the actuator 30. A horizontal plate 42 is protruding from the side of each fixture 40. , the bottom surface of the horizontal plate 42 is provided with a second guide part. The second guide part includes a plurality of guide sections arranged along the control axis C and having different heights. The plurality of guide sections include the first guide section 431 and the third guide section. Two guide sections 432, the height of the second guide section 432 is lower than the height of the first guide section 431.

控制具50配置於作動具30上,而可沿控制軸線C位移,並設有第一控制部件及第二控制部件,第一控制部件與夾持具20之第一導移部件22相配合,使控制具50控制夾持具20沿夾持軸線A位移夾持電子元件,第二控制部件與固定具40之第二導移部件相配合,令控制具50壓接該作動具30沿壓接軸線B位移,以控制作動具30帶動複數個夾持具20及電子元件同步沿壓接軸線B位移,使電子元件確實壓接電性測試器之探針執行電性測試作業。 The control device 50 is arranged on the actuator 30 and can be displaced along the control axis C. It is provided with a first control part and a second control part. The first control part cooperates with the first guide part 22 of the clamp 20. The control tool 50 controls the displacement of the clamping tool 20 along the clamping axis A to clamp the electronic component. The second control component cooperates with the second guide component of the fixture 40 to make the control tool 50 crimp the actuator 30 along the crimping axis A. The axis B is displaced to control the actuator 30 to drive the plurality of clamps 20 and the electronic components to synchronously move along the crimping axis B, so that the electronic components are surely crimped to the probe of the electrical tester to perform electrical testing operations.

於本實施例,控制具50配置於作動具30之頂面,並開設有相通基座10之承置部11的第二空間,以供移入/移出電子元件,控制具50之兩側部51滑置於作動具30之第二滑槽33,第二滑槽33限位控制具50沿控制軸線C位移。 In this embodiment, the control tool 50 is disposed on the top surface of the actuator 30 and has a second space connected to the receiving part 11 of the base 10 for moving in/out electronic components. The two sides 51 of the control tool 50 The second slide groove 33 is slid in the actuator 30, and the second slide groove 33 limits the displacement of the control tool 50 along the control axis C.

第一控制部件可為桿件或具複數個控制段之導槽,舉例當夾持具20之第一導移部件22為桿件,控制具50之第一控制部件則為具複數個控制段之導槽,以供夾持具20之第一導移部件22沿複數個控制段位移;於本實施例,控制具50之第一控制部件為導槽,導槽包含相通之第一控制段521及第二控制段522,第一控制段521為一曲弧段,並相通第二控制段522,第二控制段522為直線段,於控制具50沿控制軸線C位移時,利用第一控制段521控制二夾持具20之第一導移部件22沿夾持軸線A位移,使二夾持具20沿夾持軸線A位移,並以夾持部21夾持電子元件;控制具50依作動時序利用第二控制段522控制夾持具20之第一導移部件22不作動,使夾持具20保持夾持電子元件。 The first control component can be a rod or a guide groove with a plurality of control sections. For example, when the first guide component 22 of the clamp 20 is a rod, the first control component of the control tool 50 can have a plurality of control sections. The guide groove is used for the first guide component 22 of the clamp 20 to move along a plurality of control sections; in this embodiment, the first control component of the control tool 50 is a guide groove, and the guide groove includes a connected first control section. 521 and the second control section 522. The first control section 521 is a curved arc section and is connected to the second control section 522. The second control section 522 is a straight line section. When the control tool 50 is displaced along the control axis C, the first control section 521 is connected to the second control section 522. The control section 521 controls the displacement of the first guide component 22 of the two clamps 20 along the clamping axis A, so that the two clamps 20 are displaced along the clamping axis A, and the electronic components are clamped with the clamping portion 21; the control device 50 According to the actuation sequence, the second control section 522 is used to control the first guide component 22 of the clamp 20 not to act, so that the clamp 20 keeps clamping the electronic components.

控制具50之第二控制部件可為桿件或具有不同高度之複數個導引段,舉例固定具40具有不同高度之複數個導引段,控制具50之第二控制部件則為桿件,第二控制部件可沿不同高度之複數個導引段位移;於本實施例,控制具50之第二控制部件53為桿件,控制具50沿控制軸線C位移,當第二控制部件53沿高度較高之第一導引段431位移時,可使控制具50、作動具30及二夾持具20不作動,當第二控制部件53沿高度較低之第二導引段432位移時,可使控制具50帶動該作動具30及二夾持具20同步沿壓接軸線B位移。 The second control component of the control device 50 can be a rod or a plurality of guide sections with different heights. For example, the fixture 40 has a plurality of guide sections with different heights, and the second control component of the control device 50 can be a rod. The second control component can be displaced along a plurality of guide sections with different heights; in this embodiment, the second control component 53 of the control tool 50 is a rod, and the control tool 50 is displaceable along the control axis C. When the second control component 53 moves along the control axis C, When the higher-height first guide section 431 is displaced, the control device 50 , the actuator 30 and the two clamping devices 20 can be inactivated. When the second control component 53 is displaced along the lower-height second guide section 432 , the control tool 50 can drive the actuator 30 and the two clamping tools 20 to displace along the crimping axis B synchronously.

請參閱圖4,本發明接合機構應用於電子元件之電性測試作業或應用於電性測試作業及無線訊號測試作業;於本實施例,接合機構應用於射頻電子元件60之電性測試作業,並利於射頻電子元件60執行無線訊號測試作業,一輸 送器(圖未示出)將待測之射頻電子元件60置放於接合機構之基座10的承置部11上,射頻電子元件60並位於二夾持具20之間;一執行電性測試作業之電性測試器包含電性連接之電路板711及複數支探針712,電路板711裝配於基座10之底部,複數支探針712穿伸出基座10之承置部11,以供承置及電性連接一射頻電子元件60之複數個接點;一執行無線訊號測試作業之天線測試器72位於接合機構之承置部11上方,以供測試射頻電子元件60之天線。 Please refer to Figure 4. The bonding mechanism of the present invention is applied to the electrical testing operation of electronic components or to the electrical testing operation and wireless signal testing operation. In this embodiment, the bonding mechanism is applied to the electrical testing operation of the radio frequency electronic component 60. And it is conducive to the radio frequency electronic component 60 to perform wireless signal testing operations. The transmitter (not shown) places the radio frequency electronic component 60 to be tested on the receiving part 11 of the base 10 of the joint mechanism, and the radio frequency electronic component 60 is located between the two holders 20; The electrical tester for the test operation includes an electrically connected circuit board 711 and a plurality of probes 712. The circuit board 711 is assembled at the bottom of the base 10, and the plurality of probes 712 extend out of the receiving portion 11 of the base 10. For holding and electrically connecting a plurality of contacts of a radio frequency electronic component 60; an antenna tester 72 for performing wireless signal testing operations is located above the holding portion 11 of the joint mechanism for testing the antenna of the radio frequency electronic component 60.

請參閱圖5~7,驅動結構可採手動方式或自動化方式驅動該控制具50,因此,依作業需求,驅動結構之控制具50更包含一驅動器,以供驅動該控制具50沿控制軸線C位移,該驅動器可為壓缸、線性馬達或包含馬達及傳動組,舉例驅動器為壓缸,壓缸之活塞桿可連接控制具50,舉例驅動器包含馬達及傳動組,並以傳動組連接控制具50。 Please refer to Figures 5 to 7. The driving structure can drive the control tool 50 manually or automatically. Therefore, depending on the operation requirements, the control tool 50 of the driving structure further includes a driver for driving the control tool 50 along the control axis C. displacement, the driver can be a pressure cylinder, a linear motor, or a motor and a transmission group. For example, the driver is a pressure cylinder, and the piston rod of the pressure cylinder can be connected to the control device 50. For example, the driver includes a motor and a transmission group, and the transmission group is connected to the control device. 50.

於本實施例,控制具50之驅動器為壓缸54,壓缸54頂推驅動該控制具50位移,控制具50之兩側部51於作動具30之第二滑槽33沿控制軸線C位移,控制具50以兩側之第一控制段521沿二夾持具20之第一導移部件22位移,由於第一控制段521呈曲弧設計,控制具50以二第一控制段521同步推移二夾持具20之第一導移部件22沿夾持軸線A位移,令二夾持具20於作動具30之第一滑槽31沿夾持軸線A作彼此靠近位移,二夾持具20以夾持部21夾持於基座10內之射頻電子元件60的兩側面,由於二夾持部21夾持射頻電子元件60的兩側面,而可防止屏蔽射頻電子元件60之天線的無線訊號傳輸,以利執行無線訊號測試作業;又二夾持具20同步沿夾持軸線A作彼此靠近位移時,可推移校正射頻電子元件60之擺放位置,使射頻電子元件60之接點精準對位測試器之探針712。 In this embodiment, the driver of the control device 50 is a pressure cylinder 54. The pressure cylinder 54 pushes and drives the control device 50 to move. The two sides 51 of the control device 50 move along the control axis C in the second slide groove 33 of the actuator 30. , the control tool 50 uses the first control sections 521 on both sides to displace along the first guide parts 22 of the two clamping tools 20. Since the first control section 521 has a curved design, the control tool 50 uses the two first control sections 521 to synchronize Push the first guide part 22 of the two clamps 20 to displace along the clamping axis A, so that the two clamps 20 move closer to each other along the clamping axis A in the first slide groove 31 of the actuator 30. The two clamps 20 Use the clamping portions 21 to clamp both sides of the radio frequency electronic component 60 in the base 10. Since the two clamping portions 21 clamp both sides of the radio frequency electronic component 60, it can prevent the wireless interference of the antenna of the radio frequency electronic component 60 from being shielded. signal transmission to facilitate the implementation of wireless signal testing operations; and when the two clamps 20 are synchronously moved closer to each other along the clamping axis A, the placement position of the RF electronic component 60 can be corrected, so that the contact points of the RF electronic component 60 are accurate Alignment tester probe 712.

然,控制具50沿控制軸線C位移時,其第二控制部件53同步沿固定具40之第一導引段431位移,由於第一導引段431之行程具有預設長度,而可使第二控制部件53保持於第一導引段431位移,即控制具50尚未帶動該作動具30沿壓接軸線B位移,作動具30不作動。 However, when the control tool 50 is displaced along the control axis C, its second control component 53 is simultaneously displaced along the first guide section 431 of the fixture 40. Since the stroke of the first guide section 431 has a preset length, the second control component 53 can be moved along the first guide section 431 of the fixture 40. The two control components 53 maintain the displacement of the first guide section 431, that is, the control device 50 has not yet driven the actuator 30 to move along the crimping axis B, and the actuator 30 does not operate.

請參閱圖8~10,當壓缸54持續頂推驅動該控制具50位移,控制具50之兩側部51繼續於作動具30之第二滑槽33沿控制軸線C位移,控制具50變換以第二控制段522沿二夾持具20之第一導移部件22位移,由於第二控制段522呈直線設計,控制具50之第二控制段522並不會頂推二夾持具20之第一導移部件22沿夾持軸線A持續位移,即二夾持具20不作動,使二夾持具20之夾持部21保持夾持射頻電子元件60之夾持狀態。 Please refer to Figures 8 to 10. When the pressure cylinder 54 continues to push and drive the control device 50 to move, the two sides 51 of the control device 50 continue to displace along the control axis C in the second slide groove 33 of the actuator 30, and the control device 50 changes. The second control section 522 is used to move along the first guide part 22 of the two clamps 20. Since the second control section 522 is designed in a straight line, the second control section 522 of the control device 50 will not push the two clamps 20. The first guide component 22 continues to displace along the clamping axis A, that is, the two clamps 20 do not move, so that the clamping parts 21 of the two clamps 20 maintain the clamping state of the radio frequency electronic component 60 .

然,控制具50持續沿控制軸線C位移時,其第二控制部件53同步由固定具40之第一導引段431位移至第二導引段432,由於第二導引段432之高度低於第一導引段431,第二控制部件53受第二導引段432之導引而向下位移,第二控制部件53即帶動控制具50沿壓接軸線B作Z軸向向下位移,控制具50下壓作動具30同步沿壓接軸線B作Z軸向向下位移,作動具30帶動二夾持具20及其夾持之射頻電子元件60同步沿壓接軸線B作Z軸向向下位移,使射頻電子元件60之接點以預設下壓力確實壓接測試器之探針712而執行電性測試作業,不僅有效提升電性測試品質,更利用二夾持具20夾持射頻電子元件60之二側面,以有效防止屏蔽射頻電子元件60之天線,使射頻電子元件60之天線與天線測試器72執行無線訊號測試作業,進而提升無線訊號測試品質。 However, when the control tool 50 continues to be displaced along the control axis C, its second control component 53 is simultaneously displaced from the first guide section 431 of the fixture 40 to the second guide section 432. Since the height of the second guide section 432 is low, In the first guide section 431, the second control component 53 is guided by the second guide section 432 to move downward, and the second control component 53 drives the control tool 50 to move downward in the Z-axis direction along the crimping axis B. , the control tool 50 presses down the actuator 30 to synchronously move downward along the crimping axis B in the Z-axis direction, and the actuator 30 drives the two clamping tools 20 and the radio frequency electronic components 60 they clamp to synchronously move along the crimping axis B along the Z-axis. The downward displacement enables the contact point of the radio frequency electronic component 60 to press the probe 712 of the tester with the preset downward force to perform the electrical testing operation. This not only effectively improves the quality of electrical testing, but also utilizes the two clamps 20 to clamp The two sides of the radio frequency electronic component 60 are held to effectively prevent the antenna of the radio frequency electronic component 60 from being shielded, so that the antenna of the radio frequency electronic component 60 and the antenna tester 72 can perform wireless signal testing operations, thereby improving the quality of wireless signal testing.

請參閱圖1~11,本發明接合機構應用於測試作業機之示意圖,於本實施例,測試作業機應用測試射頻電子元件60。測試作業機包含機台80、供料 裝置90、收料裝置100、具本發明接合機構之測試裝置110、輸送裝置120及中央控制裝置(圖未示出)。供料裝置90配置於機台80上,並設有至少一容納待測電子元件(如射頻電子元件60)之供料承置器91;收料裝置100配置於機台80上,並設有至少一容納已測電子元件之收料承置器1001;測試裝置110配置於機台80上,包含測試室1101、至少一電性測試器及本發明接合機構,以供夾持及測試電子元件;於本實施例,機台80之第一側及第二側分別配置測試裝置110,測試裝置110更包含天線測試器72,以供對射頻電子元件60執行無線訊號測試作業;輸送裝置120配置於機台80上,並設有至少一輸送器,以供輸送電子元件,於本實施例,輸送裝置120設有作X-Y-Z軸向位移之第一輸送器1201,第一輸送器1201於供料裝置90取出待測之射頻電子元件60,並移入二為載台之第二輸送器1202,一第三輸送器1203於第二輸送器1202取出待測射頻電子元件60,並移入測試裝置110之接合機構的基座10,接合機構以控制具50控制二夾持具20夾持基座10上之待測射頻電子元件60,並控制作動具30帶動二夾持具20及待測射頻電子元件60確實壓接測試器之探針712而執行電性測試作業,以及使待測射頻電子元件60與天線測試器72執行無線訊號測試作業,第三輸送器1203再將已測之射頻電子元件移出測試裝置110,並移入第二輸送器1202,第一輸送器1201再於第二輸送器1202取出已測之射頻電子元件,並依測試結果,將已測之射頻電子元件移載至收料裝置100分類收置;中央控制裝置(圖未示出)用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Please refer to FIGS. 1 to 11 , which are schematic diagrams of the joint mechanism of the present invention applied to a testing machine. In this embodiment, the testing machine is used to test the radio frequency electronic component 60 . The test operation machine includes machine 80, feeding The device 90, the receiving device 100, the testing device 110 with the joint mechanism of the present invention, the conveying device 120 and the central control device (not shown in the figure). The feeding device 90 is disposed on the machine 80 and is provided with at least one feed holder 91 for accommodating electronic components to be tested (such as radio frequency electronic components 60); the receiving device 100 is disposed on the machine 80 and is provided with At least one receiving container 1001 that accommodates tested electronic components; the testing device 110 is configured on the machine 80 and includes a testing chamber 1101, at least one electrical tester and a joint mechanism of the present invention for clamping and testing electronic components. ; In this embodiment, the first side and the second side of the machine 80 are respectively configured with test devices 110. The test device 110 further includes an antenna tester 72 for performing wireless signal testing operations on the radio frequency electronic components 60; the transport device 120 is configured The machine 80 is provided with at least one conveyor for conveying electronic components. In this embodiment, the conveying device 120 is provided with a first conveyor 1201 for X-Y-Z axial displacement. The first conveyor 1201 is used for supplying materials. The device 90 takes out the radio frequency electronic component 60 to be tested and moves it into the second conveyor 1202 with two carriers. A third conveyor 1203 takes out the radio frequency electronic component 60 to be tested on the second conveyor 1202 and moves it into the test device 110 The base 10 of the joint mechanism uses the control device 50 to control the two clamps 20 to clamp the radio frequency electronic component 60 to be tested on the base 10, and controls the actuator 30 to drive the two clamps 20 and the radio frequency electronic component to be tested. 60. The probe 712 of the tester is actually pressed to perform the electrical test operation, and the radio frequency electronic component to be tested 60 and the antenna tester 72 are allowed to perform the wireless signal test operation. The third conveyor 1203 then removes the tested radio frequency electronic component. The testing device 110 is moved into the second conveyor 1202. The first conveyor 1201 takes out the tested radio frequency electronic components from the second conveyor 1202, and transfers the tested radio frequency electronic components to the receiving device according to the test results. 100 classified storage; the central control device (not shown) is used to control and integrate the actions of each device to perform automated operations and achieve practical benefits of improving operating efficiency.

依作業需求,測試裝置110之測試室1101設有至少一輸送管(圖未示出),輸送管以供輸送乾燥空氣至測試室1101。 According to operational requirements, the test chamber 1101 of the test device 110 is provided with at least one delivery pipe (not shown) for delivering dry air to the test chamber 1101 .

依作業需求,於熱測作業時,測試室1101可配置鼓風機(圖未示出),以供吹送熱風,使測試室1101之內部升溫,亦無不可。 According to the operation requirements, during the thermal test operation, the test chamber 1101 can be equipped with a blower (not shown) to blow hot air to heat the interior of the test chamber 1101.

10:基座 10: base

11:承置部 11: Acquisition Department

20:夾持具 20: Clamp

21:夾持部 21: Clamping part

22:第一導移部件 22: First guide component

23:承裝部 23:Container Department

30:作動具 30:Actuator

31:第一滑槽 31:First chute

32:通孔 32:Through hole

33:第二滑槽 33:Second chute

40:固定具 40: Fixture

42:橫板 42:Horizontal board

50:控制具 50:Control tools

51:側部 51: Side

521:第一控制段 521: First control section

53:第二控制部件 53: Second control part

A:夾持軸線 A: Clamping axis

B:壓接軸線 B: Crimping axis

Claims (19)

一種接合機構,包含:複數個夾持具:沿夾持軸線作相對配置,該夾持具於一側設有夾持部供夾持電子元件,並於至少一該夾持具之另一側設有第一導移部件;驅動結構:包含作動具、至少一固定具及控制具,該作動具可沿壓接軸線位移,並連接複數個該夾持具,至少一該固定具設有第二導移部件,該控制具可沿控制軸線位移,並設有第一控制部件及第二控制部件,該第一控制部件與該夾持具之該第一導移部件相配合,以供該控制具控制複數個該夾持具沿該夾持軸線位移夾持電子元件,該第二控制部件與該固定具之該第二導移部件相配合,以供該控制具下壓該作動具,而控制該作動具帶動複數個該夾持具及電子元件沿該壓接軸線位移。 A joint mechanism includes: a plurality of clamps: relatively arranged along the clamping axis. The clamp is provided with a clamping part on one side for clamping electronic components, and on the other side of at least one of the clamps A first guide component is provided; the driving structure: includes an actuator, at least one fixture and a control device. The actuator can be displaced along the crimping axis and connects a plurality of the clamps. At least one of the fixtures is provided with a third Two guide parts, the control device can be displaced along the control axis, and is provided with a first control part and a second control part. The first control part cooperates with the first guide part of the clamp to provide the The control tool controls the displacement of a plurality of the clamps along the clamping axis to clamp the electronic components, and the second control component cooperates with the second guide component of the fixture to allow the control tool to press down the actuator, The actuator is controlled to drive a plurality of the clamps and electronic components to move along the crimping axis. 如請求項1所述之接合機構,其該夾持具之該第一導移部件與該控制具之該第一控制部件為相互配合之桿件與導槽,該導槽具有複數個控制段。 As for the joint mechanism of claim 1, the first guide component of the clamp and the first control component of the control device are rods and guide grooves that cooperate with each other, and the guide groove has a plurality of control sections. . 如請求項2所述之接合機構,其該夾持具之該第一導移部件為該桿件,該控制具之該第一控制部件為具該複數個控制段之該導槽,以供穿置該第一導移部件,該複數個控制段包含相通之第一控制段及第二控制段,該第一控制段為曲弧段,該第二控制段為直線段。 As for the joint mechanism described in claim 2, the first guide component of the clamp is a rod, and the first control component of the control tool is the guide groove with the plurality of control sections, for Through the first guide component, the plurality of control sections include connected first control sections and second control sections, the first control section is a curved arc section, and the second control section is a straight line section. 如請求項3所述之接合機構,其該夾持具設有承裝部,以供裝配一為偏心桿之該第一導移部件。 As for the joint mechanism described in claim 3, the clamp is provided with a receiving portion for assembling the first guide component which is an eccentric rod. 如請求項1所述之接合機構,其該作動具設有複數個沿該夾持軸線作相對配置之第一滑槽,以供滑置複數個該夾持具。 In the joint mechanism of claim 1, the actuator is provided with a plurality of first slide grooves arranged oppositely along the clamping axis for sliding a plurality of the clamps. 如請求項1所述之接合機構,其該作動具之側方設有至少一沿該控制軸線配置之第二滑槽,以供該控制具之側部滑置。 In the joint mechanism of claim 1, at least one second slide groove arranged along the control axis is provided on the side of the actuator for sliding the side of the control tool. 如請求項1所述之接合機構,其該作動具之底面或周側設有至少一彈性件,以供該作動具沿該壓接軸線作彈性位移。 As for the joint mechanism described in claim 1, at least one elastic member is provided on the bottom surface or the peripheral side of the actuator for elastic displacement of the actuator along the crimping axis. 如請求項1所述之接合機構,其該固定具之該第二導移部件與該固定具之該第二控制部件為相互配合之桿件與複數個導引段,該複數個導引段沿該控制軸線配置,並具有不同高度。 As for the joint mechanism described in claim 1, the second guide component of the fixture and the second control component of the fixture are rods and a plurality of guide sections that cooperate with each other, and the plurality of guide sections are configured along this control axis and have different heights. 如請求項8所述之接合機構,其該固定具之側面設有橫板,該橫板之底面設有該第二導移部件,該第二導移部件具有該複數個導引段,該複數個導引段包含第一導引段及第二導引段,該第二導引段之高度低於該第一導引段之高度,該控制具之該第二控制部件為桿件,以供沿該第一導引段及該第二導引段位移。 As for the joint mechanism described in claim 8, a horizontal plate is provided on the side of the fixture, and the second guide part is provided on the bottom surface of the horizontal plate. The second guide part has the plurality of guide sections, and the The plurality of guide sections includes a first guide section and a second guide section. The height of the second guide section is lower than the height of the first guide section. The second control component of the control device is a rod. for displacement along the first guide section and the second guide section. 如請求項1至9中任一項所述之接合機構,該控制具更包含至少一驅動器,以供驅動該控制具沿該控制軸線位移。 According to the joint mechanism according to any one of claims 1 to 9, the control tool further includes at least one driver for driving the control tool to displace along the control axis. 如請求項1至9中任一項所述之接合機構,更包含基座,該基座配置於複數個該夾持具及該驅動結構之下方。 The joint mechanism as claimed in any one of claims 1 to 9, further includes a base disposed below a plurality of the clamps and the driving structure. 如請求項11所述之接合機構,其該基座設有至少一承置部,以供承置電子元件,複數個該夾持具位於該承置部之兩側。 In the joint mechanism of claim 11, the base is provided with at least one receiving portion for receiving electronic components, and a plurality of the clamps are located on both sides of the receiving portion. 如請求項11所述之接合機構,其該固定具以至少一支架裝配於該基座之頂部,並位於該作動具之上方。 As for the joint mechanism of claim 11, the fixing device is assembled on the top of the base with at least one bracket and is located above the actuator. 一種測試裝置,包含:測試室:設有至少一測試空間;至少一電性測試器:配置於該測試室之該測試空間,並設有電性連接之探針及電路板,以供測試電子元件;至少一如請求項1至9中任一項所述之接合機構,該接合機構以供夾持且驅動電子元件壓接該電性測試器之該探針而執行電性測試作業。 A test device, including: a test room: equipped with at least one test space; at least one electrical tester: configured in the test space of the test room, and equipped with electrically connected probes and circuit boards for testing electronics Component; at least one joint mechanism as described in any one of claims 1 to 9, the joint mechanism is used to clamp and drive the electronic component to press the probe of the electrical tester to perform electrical testing operations. 如請求項14所述之測試裝置,其該接合機構更包含基座,該基座裝配於複數個該夾持具及該驅動結構之下方,並供裝配該電性測試器之該探針。 According to the test device of claim 14, the joint mechanism further includes a base, which is assembled under the plurality of clamps and the driving structure and is used for assembling the probe of the electrical tester. 如請求項15所述之測試裝置,其該作動具與該基座間設有至少一彈性件,以供該作動具與該基座之間具有讓位空間,而供該作動具沿該壓接軸線作彈性位移。 The test device according to claim 15, wherein at least one elastic member is provided between the actuator and the base to provide a space between the actuator and the base for the actuator to be pressed along the The axis undergoes elastic displacement. 如請求項14所述之測試裝置,更包含至少一天線測試器,該天線測試器配置於該測試室,以供對電子元件執行無線訊號測試作業。 The test device as claimed in claim 14 further includes at least one antenna tester, which is disposed in the test room for performing wireless signal testing operations on electronic components. 如請求項14所述之測試裝置,其該測試室設有至少一輸送管,以供輸送乾燥空氣。 The testing device of claim 14, wherein the testing chamber is provided with at least one delivery pipe for delivering dry air. 一種測試作業機,包含:機台;供料裝置:配置於該機台上,並設有至少一容納待測電子元件之供料承置器;收料裝置:配置於該機台上,並設有至少一容納已測電子元件之 收料承置器;至少一如請求項14至18中任一項所述之測試裝置,配置於該機台上,以供對該電子元件執行測試作業;輸送裝置:配置於該機台上,並設有至少一輸送器,用以輸送電子元件;中央控制裝置:以控制及整合各裝置作動。 A testing machine, including: a machine; a feeding device: disposed on the machine, and provided with at least one feed holder for accommodating electronic components to be tested; a receiving device: disposed on the machine, and Provided with at least one chamber for accommodating electronic components to be tested Material receiving container; at least one test device as described in any one of claims 14 to 18, is configured on the machine for performing testing operations on the electronic components; conveying device: is configured on the machine , and is provided with at least one conveyor for conveying electronic components; a central control device: to control and integrate the actions of each device.
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5017865A (en) * 1989-06-07 1991-05-21 Wiltron Company Coaxial microwave device test fixture
TWM468065U (en) * 2013-05-15 2013-12-11 Hon Hai Prec Ind Co Ltd RF switch
CN103782182A (en) * 2011-07-12 2014-05-07 英泰斯特股份有限公司 Method and apparatus for docking test head with peripheral equipment
US10627083B2 (en) * 2016-08-24 2020-04-21 Chocolate Lighting Company Ltd Track lighting system
TW202122812A (en) * 2019-12-05 2021-06-16 鴻勁精密股份有限公司 Radio-frequency electronic component testing apparatus and testing device applied by the same including a first platform, a second platform, an antenna tester and an electric performance tester

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5017865A (en) * 1989-06-07 1991-05-21 Wiltron Company Coaxial microwave device test fixture
CN103782182A (en) * 2011-07-12 2014-05-07 英泰斯特股份有限公司 Method and apparatus for docking test head with peripheral equipment
TWM468065U (en) * 2013-05-15 2013-12-11 Hon Hai Prec Ind Co Ltd RF switch
US10627083B2 (en) * 2016-08-24 2020-04-21 Chocolate Lighting Company Ltd Track lighting system
TW202122812A (en) * 2019-12-05 2021-06-16 鴻勁精密股份有限公司 Radio-frequency electronic component testing apparatus and testing device applied by the same including a first platform, a second platform, an antenna tester and an electric performance tester

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