TWI728860B - Wireless communication electronic component testing device and testing equipment using the same - Google Patents

Abstract

The present invention reveals a wireless communication electronic component testing device, including a tester, an antenna, and a testing housing. The testing housing has a shade. The shade is made of low-k material, which has a small relative dielectric constant to allow wireless signal to pass therethrough. The shade can cover on a support to where the tester is disposed to define a testing room around the tester during electronic component testing process. Therefore, the low-k material shade is partitioning between the antenna and the electronic component without blocking the wireless signal. Electricity testing can be processed smoothly. The testing room can be defined for controlling testing environment.

Description

Radio frequency electronic component test device and its application test equipment

The present invention provides a test room located between the electrical tester and the antenna tester, which not only enables the electrical tester of the radio frequency electronic component inside the test room of the preset test environment to perform electrical testing operations It is a test device that can perform wireless signal test operations with an external antenna tester through the first anti-interference component of the test room, thereby improving the test quality.

Please refer to Figure 1. A radio frequency electronic component 10 with multiple built-in antennas is widely used in the fields of mobile communication area wireless network systems and wireless communication area network systems; currently the radio frequency electronic element 10 is provided with multiple contacts 11 on one side , And an antenna 12 is arranged on the other side. Before leaving the factory, the radio frequency electronic component 10 not only performs wireless signal testing operations, but also performs electrical testing operations to ensure quality.

The radio frequency electronic component testing device is equipped with an electrical tester with an electrically connected circuit board 21 and a test base 22 on the machine. The test base 22 has a plurality of probes 221 for testing the radio frequency electronic components 10 The test device is additionally equipped with an antenna tester 23 above the test base 22 to transmit or receive wireless signals to the radio frequency electronic component 10; when the radio frequency electronic component 10 is placed on the test base 22, the radio frequency electronic component 10 contacts with the contact 11 The probe 221 of the test stand 22 performs the electrical test operation, and sends a wireless signal from the antenna 12 toward the antenna tester 23 located in the preset direction to be tested, and the antenna tester 23 receives the wireless signal to perform the wireless signal test operation.

However, the radio frequency electronic component 10 may be used in a low temperature environment or a high temperature environment, so that the radio frequency electronic component 10 must be subjected to low temperature or high temperature or normal temperature electrical test operations and wireless signal test operations. If it is a low temperature test operation, the problem of condensation should also be considered. Can ensure the test quality of RF electronic components 10 , Especially when the space of the test equipment is limited, the configuration of the test environment needs more research and development; therefore, how to make the radio frequency electronic element 10 be located without affecting the wireless signal transmission of the antenna tester 23 and the radio frequency electronic element 10 Performing test operations in a test environment with a preset temperature (such as low temperature, high temperature or anti-condensation test environment) is the target of the industry's research and development.

Furthermore, the above-mentioned radio frequency electronic component 10 only uses the pressure of its own weight to make the contact 11 contact the probe 221 of the test base 22. Since the probe 221 has a spring, this weight pressure cannot make the contact 11 and the probe 221 reliably. Contact with each other, which affects the electrical test quality of the radio frequency electronic component 10. Since the antenna 12 of the radio frequency electronic component 10 is relative to the antenna tester 23, how can the antenna tester 23 and the radio frequency electronic component 10 not affect the wireless signal transmission requirements? The crimpable radio frequency electronic component 10 to perform electrical testing operations is also the target of research and development by the industry.

The first objective of the present invention is to provide a radio frequency electronic component test device, including an electrical tester, an antenna tester and a test room. The test room is provided with a cover with a first anti-interference component, and the first anti-interference component is used to prevent shielding. It is made of material and has a low dielectric coefficient for wireless signals to pass through. The first support is closed on the cover to form a test space. The test space is used to house the electrical tester with radio frequency electronic components; the test room is located in the electrical test Between the tester and the antenna tester, not only does the radio frequency electronic component in the electrical tester in the test room of the preset test environment perform electrical test operations, but also can be tested with the external antenna through the first anti-interference component of the test room The device performs wireless signal test operations, thereby improving the test quality.

The second objective of the present invention is to provide a radio frequency electronic component testing device, the test room is equipped with an environmental controller to regulate the temperature of the test space and prevent condensation, so that the radio frequency electronic components can perform electrical testing operations in the test space at a preset temperature And wireless signal testing operations to improve the quality of testing.

The third object of the present invention is to provide a radio frequency electronic component testing device, the antenna tester is assembled in the signal channel of the second supporting device, the second supporting device drives the antenna tester to move synchronously, and presses the cover of the test chamber with the crimping component The first anti-interference component of the body enables the first anti-interference component to press against the radio frequency electronic component to actually contact the electrical tester, thereby improving the test quality.

The fourth object of the present invention is to provide a radio frequency electronic component testing device, in which the antenna tester is mounted on the second support, the test room is equipped with a joint unit with a second anti-interference component in the test space, and the joint unit is pressed by the second anti-interference component The radio frequency electronic components do indeed contact the electrical tester, thereby improving the quality of the test.

The fifth object of the present invention is to provide a radio frequency electronic component testing device, the cover of the test room can be connected to a first driver, the first driver drives the cover to open or close to the first support for electrical testing of the conveyor The device picks and places the radio frequency electronic components, thereby improving the use efficiency.

The sixth object of the present invention is to provide a radio frequency electronic component testing device, the cover of the test chamber can be assembled to the second supporting device, and the second supporting device drives the cover to move to open or close to the first supporting device, not only for conveying The radio frequency electronic component is taken and placed in the electrical tester, and the first anti-interference component of the cover is pressed against the radio frequency electronic component to actually contact the electrical tester, thereby improving the use efficiency.

The seventh object of the present invention is to provide a radio frequency electronic component testing device, the cover of the test room can be assembled on the second supporting device, the cover is provided with at least one pick-up component, the pick-up component is used for picking and placing the radio frequency electronic component, thereby improving the use efficacy.

The eighth object of the present invention is to provide a radio frequency electronic component testing device, which is equipped with an adjuster on the first support or the second support for adjusting the placement position or angle of the electrical tester and the test chamber or the antenna tester , To enable radio frequency electronic components to perform wireless signal test operations with different directions to be tested, so as to reduce the number of antenna testers, and achieve the practical benefits of saving antenna tester costs and improving use efficiency.

The ninth object of the present invention is to provide a test equipment, including a machine, a feeding device, The receiving device, the testing device of the present invention, the conveying device and the central control device; the feeding device is arranged on the machine platform, and is provided with at least one feeding holder for accommodating the radio frequency electronic component to be tested; the receiving device is arranged on the machine platform It is equipped with at least one receiving holder for accommodating the tested radio frequency electronic components; the testing device of the present invention is arranged on the machine platform and includes an electrical tester, an antenna tester and a test room, so that the test room is located in the electrical Between the tester and the antenna tester, not only the radio frequency electronic components are placed in the electrical tester inside the test room of the preset test environment to perform electrical testing operations, but also the first anti-interference component of the test room can be connected to the outside The antenna tester performs wireless signal testing operations; the conveying device is arranged on the machine and is equipped with at least one conveyer to convey radio frequency electronic components; the central control device is used to control and integrate the actions of various devices to perform automated operations to achieve improvement Practical benefits of operational efficiency.

In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the accompanying drawings. The details are as follows:

Please refer to FIG. 2, the first embodiment of the test device 30 of the present invention includes an electrical tester 31, an antenna tester 32 and a test chamber 33.

The electrical tester 31 is provided with an electrically connected circuit board 311 and at least one test base 312. The test base 312 is electrically connected to the radio frequency electronic components at the test station to perform electrical testing operations on the radio frequency electronic components; The test base 312 has a plurality of probes 313, one end of the probe 313 is electrically connected to the circuit board 311, and the other end is electrically connected to the radio frequency electronic component. Furthermore, the test station is a preset position where the radio frequency electronic component performs the test operation. For example, the test station can be located in the electrical tester 31 or the carrier, etc., depending on the requirements of different test operations, and is not limited to this embodiment; In this embodiment, the test station is located at the test seat 312 of the electrical tester 31.

The electrical tester 31 is assembled on the first supporting device 34. Furthermore, the first supporting device 34 can be a platen, an end, a frame body or a base body, or a part connected to related components of the electrical tester 31 As the first bearing 34, the type of the first bearing 34 can be as long as it can be equipped with the electrical tester 31. In other words, the first bearing 34 can be the table of the machine, the table of the adjuster, The panel of the test room or the supporting parts of the carrier, etc. The carrier can be a rotating device or a linear moving device (such as an actuator, a bearing, etc.). The first support 34 can be fixed or movable. For example, the first support 34 is the table of the machine, which can fix the electrical tester 31 at a preset position ; For example, the first bearing 34 is the platform of the adjuster, which can drive the electrical tester 31 to make angular rotation to adjust the placement angle or make at least one direction displacement to change the placement position; in this embodiment, the first bearing 34 is a fixed configuration and is the platform of the machine for assembling the electrical tester 31.

The antenna tester 32 is provided with at least one signal work piece 321 for radio frequency electronic components to perform wireless signal testing operations; for example, the antenna tester 32 performs radio signal reception or transmission operations for the radio frequency electronic components, for example, the antenna tester 32 performs radio signal testing operations on the radio frequency electronic components. Components for receiving and transmitting wireless signals . The antenna tester 32 can be connected to an independent processor (not shown in the figure) to transmit the wireless signal received from the radio frequency electronic component to the processor, or to transmit the wireless signal for testing the processor to the radio frequency electronic component, the processor It can also be the processor of a central control device (not shown in the figure). Furthermore, the angle of the operating axis L of the signal operating member 321 of the antenna tester 32 can be the same or close to the direction to be measured of the radio frequency electronic component (such as 0° or 45° or 30° direction).

The test device 30 can change the number and position of the antenna tester 32 according to the requirements of the test operation. For example, when testing wireless signals with a single direction, a single antenna tester 32 can be configured. For example, when testing wireless signals with different directions, the number of antenna testers 32 can be changed. A plurality of antenna testers 32 are arranged in each position; in this embodiment, the antenna tester 32 is assembled on the second support 35, and the signal operating member 321 of the antenna tester 32 has an operating axis L at 0° for receiving radio frequency electronics. The wireless signal emitted by the component is transmitted to the processor of the central control device for an analysis to determine whether the strength of the wireless signal emitted by the beam from the radio frequency electronic component to be measured is in compliance with the standard.

The second support 35 can be made of rigid material or anti-shielding material, or include composite materials (such as metal material and anti-shielding material). The second support 35 can be a table, a frame or a base, or connected to an antenna for testing A part of the related components of the device 32 is used as the second support 35. The type of the second support 35 can be used as long as the antenna tester 32 can be assembled. In other words, the second support 35 can be a rack or an adjuster. Mounting parts , The supporting part of the crimping device or the supporting part of the carrier, etc., for example, the second supporting tool 35 is a crimping device and can be displaced relative to the test chamber 33. The second supporting tool 35 can be a fixed type or a movable type. For example, the second supporting tool 35 is a rack to fix the antenna tester 32 at a preset position; for example, the second supporting tool 35 is a movable crimper, which can drive The antenna tester 32 moves synchronously and presses against the test chamber 33.

In this embodiment, the second support 35 is a movable crimper and is made of rigid material. A signal channel 351 is opened inside. One end of the signal channel 351 is used for mounting the antenna tester 32, and the other end is connected to the second The bottom of the support 35, the bottom of the second support 35 is used as the crimping part 352, and the actuator 353 drives the displacement in the Z direction to make the antenna tester 32 move synchronously. Of course, the bottom of the second supporting tool 35 can also be additionally equipped with a crimping tool made of shielding material as the crimping component 352. The angle of the operating axis L of the signal operating member 321 of the antenna tester 32 is the same as the 0° to-be-tested direction of the radio frequency electronic component, so as to receive the wireless signal of the beam emitted from the to-be-tested direction of the radio frequency electronic component.

The test chamber 33 is provided with a cover 331 with at least one first anti-interference component 3311. The first anti-interference component 3311 is made of a shielding material and has a low dielectric coefficient for passing wireless signals. The first anti-interference component 3311 is closed on the cover 331. The support 34 forms a test space 332 for accommodating the electrical tester 31 with radio frequency electronic components, so that the test chamber 33 is located between the electrical tester 31 and the antenna tester 32, so that not only the radio frequency electronic components are located The test room 33 of the preset test environment can be used for wireless signal testing with the external antenna tester 32 through the first anti-interference component 3311 of the test room 33.

In addition, one of the cover body 331 and the second support 35 is crimped and displaced toward the other, so that the first anti-interference component 3311 of the cover body 331 is pressed against the radio frequency electronic element, so that the radio frequency electronic element does contact the electrical tester. 31. The wireless signal transmitted between the antenna tester 32 and the radio frequency electronic component passes through the first anti-interference component 3311 to perform the wireless signal test operation. Furthermore, the relative displacement of the cover 331 and the second bearing 35 is also unavoidable. The second bearing 35 can still be used to crimp the first interference prevention component 3311 of the cover 331.

In this embodiment, the cover 331 of the test chamber 33 includes a first anti-interference component 3311 and a frame 3312. The frame 3312 is made of metal material and avoids the range of the test axis, that is, the range of the non-test axis to avoid interference For transmitting wireless signals, the frame 3312 is used to mount the first anti-interference component 3311. Of course, if the strength of the first anti-interference component 3311 meets the operating requirements, the frame 3312 may not be required.

The first anti-interference component 3311 is made of anti-shielding material and has a low dielectric coefficient; further, the anti-shielding material can be closed-cell polyethylene foam or aerogel, when the inside of the anti-shielding material is vacuum , Its dielectric coefficient is 1. When the inside of the shielding material is air, its dielectric coefficient is close to 1. The first interference-preventing member 3311 has appropriate strength and elasticity, and can return to its original state after being compressed; in this embodiment , The first anti-interference component 3311 is a closed-cell polyethylene foam with appropriate strength and elasticity. The first anti-interference component 3311 is assembled on the frame 3312, with the first side 3313 facing the antenna tester 32, and the second side 3314 faces the radio frequency electronic components; the dielectric coefficient of the first interference prevention component 3311 can be 1.06~1.03, and better, the dielectric coefficient is 1.03~1, the dielectric coefficient of the first interference prevention component 3311 is low, especially for millimeter waves Low wireless signal interference , And can reduce the loss of wireless signal in transmission.

The test chamber 33 is provided with at least one first driver 333 for driving the cover body 331 to open and close; when the first driver 333 drives the cover body 331 to be closed on the first bearing 34, a test space 332 is formed, when the first driver 333 Drive the cover 331 away from the first support 34 to open the test space 332; the first driver 333 can drive the cover 331 for rotational displacement or linear displacement; in this embodiment, the first driver 333 is disposed on the first support 34, And connect the frame 3312 of the cover 331, the first driver 333 drives the cover 331 to rotate and open and close, and the first driver 333 drives the cover 331 to close the first support 34 to form a test space 332. The test space 332 is provided for The electrical tester 31 is accommodated, and the antenna tester 32 is located outside the test chamber 33.

The test chamber 33 is provided with at least one environmental controller to control the temperature of the test space or prevent condensation; the environmental controller can be a refrigerating chip, a heating element, or a fluid pipeline that transports pre-heated fluid, such as a fluid pipeline that delivers low-temperature gas to The test space 332 can maintain the preset low temperature test environment in the test space 332. For example, the fluid pipeline transports normal temperature dry gas to the test space 332, which can prevent condensation in the test space 332; in this embodiment, the test chamber 33 is connected to the first support 34 The fluid pipeline 334 is configured to deliver low-temperature dry gas to the test space 332 of the cover 331, so that the test space 332 forms a low-temperature and dry test environment.

Please refer to FIG. 3, a conveyor 36 adsorbs a radio frequency electronic component 40 to be tested. One side of the radio frequency electronic component 40 has a plurality of contacts 41, and the other side has an antenna 42. During testing, the first driver 333 of the test chamber 33 The cover 331 is driven to rotate and swing to open the test space 332, and the transporter 36 moves the radio frequency electronic component 40 to be tested into the test seat 312 (that is, the test station) of the electrical tester 31, and the radio frequency electronic component 40 The contact 41 is initially the probe 313 of the test base 312 in electrical contact.

Please refer to FIG. 4, after the radio frequency electronic component 40 is placed on the test base 312, the first driver 333 of the test chamber 33 drives the cover 331 to rotate and swing to close the first support 34 to close the test space 332. The test chamber The fluid pipeline 334 of 33 delivers low-temperature dry air to the test space 332 to prevent condensation of the radio frequency electronic component 40. However, in order to make the contact 41 of the radio frequency electronic component 40 actually contact the probe 313 of the test base 312, the first surface 3313 of the first interference prevention component 3311 of the cover 331 is opposite to the antenna tester 32 and the second surface 3314 Compared with the antenna 42 of the radio frequency electronic component 40, the second bearing 35 is moved in the Z direction by the actuator 353, and the second bearing 35 drives the antenna tester 32 to move synchronously. The second bearing 35 is a crimping part 352 Press down the first surface 3313 of the first interference prevention member 3311 of the cover body 331, so that the first interference prevention member 3311 of the cover body 331 arcs down abruptly, so that the second surface 3314 of the first interference prevention member 3311 is preset The crimping force crimps the radio frequency electronic component 40, the contact 41 of the radio frequency electronic component 40 does contact the probe 313 of the test base 312, and the probe 313 performs an electrical test operation on the radio frequency electronic component 40 via the circuit board 311.

Furthermore, the direction to be measured of the antenna 42 of the radio frequency electronic component 40 is 0°, and the angle of the working axis L of the signal work piece 321 of the antenna tester 32 is the same as the direction to be measured of the radio frequency electronic component 40 and is 0°. Although the cover 331 is located between the antenna 42 of the radio frequency electronic component 40 and the antenna tester 32, since the first anti-interference component 3311 is made of anti-shielding material, its dielectric coefficient is 1.03~1, and the first anti-interference component 3311 can pass Wireless signal; Therefore, when the antenna 42 of the radio frequency electronic component 40 at the test station emits a beam toward the 0° under-test direction to transmit wireless signals, the first anti-interference component 3311 has the requirements of low dielectric coefficient and low loss, The wireless signal is transmitted to the antenna tester 32 through the first anti-interference component 3311 and the signal channel 351 , The signal work piece 321 of the antenna tester 32 receives the wireless signal of the radio frequency electronic component 40, and then performs the wireless signal test operation, the antenna tester 32 transmits the received wireless signal to the processor of the central control device (not shown) , For the processor to perform an analysis to determine whether the strength of the wireless signal emitted by the direction to be measured of the radio frequency electronic component 40 meets the standard; if so, the radio frequency electronic component 40 is judged to be a good product, otherwise, it is judged to be a defective product; therefore, The test device 30 can not only ensure the quality of the electrical test operation of the radio frequency electronic component 40, but also perform the wireless signal test operation smoothly, thereby improving the production efficiency.

Please refer to FIG. 5, the second embodiment of the test device 30 of the present invention is different from the first embodiment in that the antenna tester 32 is mounted on a fixed second support 35A, the second support 35A is a rack, and the test The chamber 33 is equipped with a joining unit 335 with a second anti-interference component 3351 in the test space 332. The joining unit 335 presses the second anti-interference component 3351 against the radio frequency electronic component, so that the radio frequency electronic component does contact the electrical tester 31; in this embodiment For example, the joining unit 335 uses the second driver 3352 to drive the second anti-interference component 3351 to move in the Z direction. The second anti-interference component 3351 is made of anti-shielding material and has a low dielectric coefficient for passing wireless signals.

6 and 7, during the test, the first driver 333 of the test chamber 33 drives the cover 331 to rotate and oscillate to open the test space 332, and the conveyor 36 moves the radio frequency electronic component 40 to be tested into electrical properties. The test base 312 (ie, the test station) of the tester 31 and the contact 41 of the radio frequency electronic component 40 are electrically contacted with the probe 313 of the test base 312. After the radio frequency electronic component 40 is placed on the test socket 312, the first driver 333 of the test chamber 33 drives the cover 331 to rotate and oscillate to close the first support 34 to close the test space 332 and the fluid pipeline of the test chamber 33 334 delivers low-temperature dry air to the test space 332 to prevent condensation of the radio frequency electronic components 40. In the test chamber 33, the second driver 3352 of the bonding unit 335 drives the second anti-interference component 3351 to move downward in the Z direction to crimp the radio frequency electronic component 40 with a preset crimping force, so that the contact 41 of the radio frequency electronic component 40 is actually in contact with the test The probe 313 of the base 312 and the probe 313 perform electrical testing operations on the radio frequency electronic component 40 via the circuit board 311. Since the first anti-interference component 3311 of the cover 331 and the second anti-interference component 3351 of the joint unit 335 are made of anti-shielding materials, their dielectric coefficient is 1.03~1, which can pass wireless signals; therefore, they are located in the test station When the antenna 42 of the radio frequency electronic component 40 emits a beam toward 0° to be measured to transmit wireless signals, the first anti-interference component 3311 and the second anti-interference component 3351 have low dielectric coefficient and low loss requirements, so that the wireless The signal is transmitted to the antenna tester 32 through the first anti-interference component 3311 and the second anti-interference component 3351. The signal work piece 321 of the antenna tester 32 receives the wireless signal of the radio frequency electronic component 40, and then performs the wireless signal test operation.

Please refer to Figures 8 and 9, the test device 30 of the present invention is configured on the first bearing or the second bearing Adjuster for adjusting the placement angle or position; the difference between the third embodiment and the second embodiment is that the first bearing 34A is a table, and the adjuster 37 is installed to adjust the placement angle or position; In an embodiment, the bottom of the first bearing 34A is equipped with an adjuster 37, the adjuster 37 is assembled on the machine 50, and the first bearing 34A carries the electrical tester 31 and the test chamber 33 for adjusting the swing of the electrical tester 31 Set the position or angle so that the antenna 42 of the radio frequency electronic component 40 can perform wireless signal testing operations with different preset directions, so as to reduce the number of antenna testers 32 and save costs; furthermore, the adjuster 37 can be a robotic arm or a rotating shaft. Or include a plurality of adjustment rods to adjust the electrical tester 31 and the radio frequency electronic components 40 on it to the angle required for the test operation (such as 0°, 30° or 45° pointing), for example, a plurality of adjustment rods The pieces can be moved with different heights to drive and adjust the first bearing 34A.

When the electrical tester 31 holds the radio frequency electronic component 40, the test chamber 33 uses the second anti-interference component 3351 of the joint unit 335 to crimp the radio frequency electronic component 40, so that the contact 41 of the radio frequency electronic component 40 does indeed contact the electrical tester The probe 313 of 31 performs electrical test operation; the adjuster 37 drives the first support 34A , The electrical tester 31, the test chamber 33 and the radio frequency electronic component 40 adjust the placement angle synchronously, and the anti-interference range of the first anti-interference component 3311 and the second anti-interference component 3351 is greater than the to-be-tested range of the radio frequency electronic component 40 Under essential conditions, the antenna 42 of the radio frequency electronic component 40 transmits a wireless signal to the direction to be measured at 30°. The wireless signal is transmitted to the antenna tester 32 through the first anti-interference component 3311 and the second anti-interference component 3351, so that the antenna tester 32 can receive it. The radio signal of the radio frequency electronic component 40 performs the wireless signal test operation.

Please refer to Figures 10 and 11, the fourth embodiment of the test device 30 of the present invention is different from the first embodiment in that the test chamber 33A is mounted on the second support 35 so that the cover 331A of the test chamber 33A closes the first The support 34 forms a test space; further, the cover 331A is provided with at least one pick-up component for picking up and placing radio frequency electronic components; in this embodiment, the test room 33A is located in the first anti-interference component 3311A of the cover 331A The first surface 3313A of the Z-direction extends upwards with a connecting part 3315A to be assembled with the crimping part 352 of the second support 35. The connecting part 3315A is provided with a pick-up part 3316A, and one end of the pick-up part 3316A is connected to a suction device (Figure Not shown), the other end is connected to the second surface 3314A of the first interference prevention component 3311A ; Of course, since the test chamber 33A is assembled on the second bearing 35, the actuator 353 of the second bearing 35 can be used as the first driver. Therefore, the actuator 353 drives the second bearing 35 to move, so that the second bearing 35 drives the test chamber 33A and the antenna tester 32 to move downwards in the Z direction synchronously, and the test chamber 33A uses the pickup part 3316A to adsorb a radio frequency electronic component 40 synchronously. Displace and close the first bearing 34 with the cover 331A to form a test space 332A , And make the pick-up part 3316A move the radio frequency electronic component 40 to the test seat 312 of the electrical tester 31, and the second support 35 uses the crimping part 352 to press the connecting part 3315A of the test chamber 33A to make the cover 331A the first An anti-interference component 3311A is compressed and deformed to press against the radio frequency electronic component 40, so that the contact point 41 of the radio frequency electronic component 40 does contact the probe 313 of the test base 312 to perform an electrical test operation. Furthermore, the antenna 42 of the radio frequency electronic component 40 at the test station emits a beam toward the 0° direction to be tested to transmit wireless signals. The first interference prevention component 3311A and the connecting component 3315A have low dielectric constant and low loss requirements. , And the wireless signal is transmitted to the antenna tester 32, and the antenna tester 32 receives the wireless signal of the radio frequency electronic component 40, and then performs the wireless signal test operation.

Please refer to Figures 2 to 4 and 12, a schematic diagram of the testing device 30 of the present invention applied to testing equipment, including the machine 50, the feeding device 60, the receiving device 70, the testing device 30 of the present invention, the conveying device 80 and the central control device (Not shown in the figure); the feeding device 60 is arranged on the machine 50, and is provided with at least one feeding holder 61 that contains the radio frequency electronic component to be tested; the receiving device 70 is arranged on the machine 50, and is provided There is at least one receiving carrier 71 for accommodating the tested radio frequency electronic components; the test device 30 of the present invention is arranged on the machine 50 and includes an electrical tester 31, an antenna tester 32 and a test chamber 33 for radio frequency Electronic components perform electrical testing operations and wireless signal testing operations. In this embodiment, testing devices 30 are respectively arranged on the first side and the second side of the machine 50; the conveying device 80 is arranged on the machine 50 and is provided with at least A conveyor for conveying radio frequency electronic components. In this embodiment, the conveying device 80 is provided with a first conveyor 81 that is displaced in the XYZ direction. The first conveyor 81 takes out the radio frequency electronic components to be tested from the feeding device 60. And transfer to the second conveyor 82 of the second stage, the third conveyor 83 of the conveyor device 80 in the second conveyor 82 and the electrical tester 31 of the test device 30 to pick and place to exchange the radio frequency electronic components to be tested and the The radio frequency electronic component to be tested, the electrical tester 31 and the antenna tester 32 of the test device 30 perform electrical test operations and wireless signal test operations on the radio frequency electronic component to be tested; the first conveyor 81 is then taken out from the second conveyor 82 The tested radio frequency electronic components, and according to the test results, transfer the tested radio frequency electronic components to the receiving device 70 and sort them ; The central control device is used to control and integrate the actions of various devices to perform automated operations to achieve practical benefits of enhancing operational efficiency.

[Learning] 10: RF electronic components 11: Contact 12: Antenna 21: circuit board 22: Test Block 221: Probe 23: Antenna Tester [this invention] 30: Test device 31: Electrical tester 311: Circuit Board 312: Test Block 313: Probe 32: Antenna Tester 321: Signal work piece L: work axis 33, 33A: test room 331, 331A: cover 3311, 3311A: the first anti-interference component 3312: frame 3313, 3313A: First side 3314, 3314A: second side 3315A: Connecting parts 3316A: Pick up parts 332: test space 333: first drive 334: Fluid Line 335: Joint unit 3351: The second anti-interference component 3352: second drive 34, 34A: first bearing 35, 35A: second bearing 351: signal channel 352: crimping parts 353: Actuator 36: Conveyor 37: adjuster 40: RF electronic components 41: Contact 42: Antenna 50: machine 60: Feeding device 61: Feeder 70: Receiving device 71: Receiving Holder 80: Conveying device 81: The first conveyor 82: second conveyor 83: The third conveyor

Figure 1: Schematic diagram of the use of the conventional testing device. Figure 2: A schematic diagram of the first embodiment of the testing device of the present invention. Figure 3: Schematic diagram (1) of the use of the first embodiment of the testing device of the present invention. Figure 4: A schematic diagram of the use of the first embodiment of the testing device of the present invention (2). Figure 5: A schematic diagram of the second embodiment of the testing device of the present invention. Figure 6: A schematic diagram of the use of the second embodiment of the testing device of the present invention (1). Fig. 7: A schematic diagram of the use of the second embodiment of the test device of the present invention (2). Fig. 8: A schematic diagram of the third embodiment of the testing device of the present invention. Figure 9: A schematic diagram of the use of the third embodiment of the testing device of the present invention. Figure 10: Schematic diagram of the fourth embodiment of the testing device of the present invention. Figure 11: A schematic diagram of the use of the fourth embodiment of the testing device of the present invention. Figure 12: A schematic diagram of the testing device of the present invention applied to testing equipment.

311: Circuit Board

312: Test Block

313: Probe

32: Antenna Tester

321: Signal work piece

33: test room

331: cover

3311: The first anti-interference component

332: test space

333: first drive

334: Fluid Line

335: Joint unit

3351: The second anti-interference component

3352: second drive

34: The first bearing

40: RF electronic components

41: Contact

42: Antenna

Claims (10)

A radio frequency electronic component testing device, comprising: a first supporting tool; a second supporting tool; an electrical tester: arranged on the first supporting tool for performing electrical testing operations on the radio frequency electronic component at a testing station; Antenna tester: arranged on the second supporting device for performing wireless signal testing operations on the radio frequency electronic component; test room: equipped with a cover with at least one first anti-interference component, and close the first with the cover The test space is formed by the supporting tool. The test space accommodates the electrical tester. The cover is located between the electrical tester and the antenna tester. The first anti-interference component is used for the antenna tester and the antenna tester. The wireless signal transmitted between the radio frequency electronic components passes; wherein the second supporting device is provided with a signal channel, one end of the signal channel is for mounting the antenna tester, and the other end is provided with a crimping component for crimping the first protective device Nuisance components. In the radio frequency electronic component testing device according to claim 1, the cover of the testing room is assembled on the second supporting device. According to the radio frequency electronic component testing device of claim 2, the cover of the test room is provided with at least one pick-up component for picking and placing the radio frequency electronic component. A radio frequency electronic component testing device, comprising: a first supporting tool; a second supporting tool; an electrical tester: arranged on the first supporting tool for the purpose of comparing the radio frequency at a testing station Electronic components perform electrical testing operations; antenna tester: arranged on the second supporting tool for performing wireless signal testing operations on the radio frequency electronic components; test room: equipped with a cover with at least one first anti-interference component, The first supporting device is closed in the cover to form a test space, the test space accommodates the electrical tester, the cover is located between the electrical tester and the antenna tester, and uses the first anti-interference The component is for the wireless signal transmitted between the antenna tester and the radio frequency electronic component to pass; wherein, the test room is provided with a joint unit on the first support, and the joint unit includes a second driver and a second anti-interference component. Two drivers are used for driving the displacement of the second anti-interference component, and the second anti-interference component is used for crimping the radio frequency electronic component. According to claim 1 or claim 4 of the radio frequency electronic component test device, the cover of the test room includes the first anti-interference component and a frame, and the frame is equipped with the first anti-interference component. For the radio frequency electronic component testing device described in claim 1 or claim 4, the test chamber is provided with a first driver for driving the cover to open and close. The radio frequency electronic component test device described in claim 1 or claim 4 further includes an adjuster that is mounted on the first support or the second support for adjusting the placement angle or position. According to the radio frequency electronic component test device according to any one of claims 1 to 4, the test room is provided with at least one environmental controller. According to the radio frequency electronic component test device according to any one of claims 1 to 4, the first anti-interference component of the test room is made of a shielding material and has a low dielectric coefficient. A test equipment, comprising: a machine; a feeding device: arranged on the machine, and provided with at least one feeding holder for accommodating radio frequency electronic components to be tested; and a receiving device: arranged on the machine, and Equipped with at least one receiving carrier for accommodating the tested radio frequency electronic components; at least one radio frequency electronic component testing device as described in claim 1 or claim 4: arranged on the machine; conveying device: arranged on the machine On the stage, there is at least one conveyor for conveying radio frequency electronic components; the central control device: to control and integrate the actions of various devices to perform automated operations.

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