TWI816561B - Test device, test method and test system - Google Patents

Abstract

A test device for testing a target chip and providing a test result is provided. The test device includes a transmission interface, a memory, and a processor. The transmission interface is coupled to the target chip. The memory stores a test program code. The processor performs the test program code to obtain the state information of the target chip and generate the test result.

Description

Detection device, detection method and detection system

The present invention relates to a detection device, and in particular to a detection device for detecting status information of a target wafer.

Generally speaking, users need to pay attention to the power consumption of the chip at all times during the process of developing chip applications. When the actual power consumption of the chip is different from the specification reference value, users usually think that the chip is faulty or abnormal. However, most of the causes are simply incorrect system settings of the chip, or defects in the external physical circuitry to which the chip is connected. Therefore, users need to spend a long time testing to find out the real problem.

An embodiment of the present invention provides a detection device for detecting a target wafer and providing a detection result. The detection device includes a transmission interface, a memory and a processor. The transmission interface is coupled to the target chip. The memory stores a detection program code. The processor executes the detection program code to read the status information of the target chip and generate detection results.

Another embodiment of the present invention provides a detection system, including a target wafer, a converter and a detection device. The target chip has a plurality of pins and a temporary storage circuit. The converter is coupled to the target chip. The detection device detects the target chip through the converter to generate a detection result, and includes a transmission interface, a memory and a processor. The transmission interface is coupled to the converter. The memory stores a detection program code. The processor executes the detection program code to read the status information of the target chip and generate results.

Another embodiment of the present invention provides a detection method, which includes resetting a target chip; determining whether the target chip enters a standby mode; when the target chip enters the standby mode, detecting the target chip to generate a detection result; and outputting the detection result.

The detection method of the present invention can be implemented through the detection system of the present invention, which is hardware or firmware that can perform specific functions. It can also be recorded in a recording medium through program code and implemented in conjunction with specific hardware. . When the program code is loaded and executed by an electronic device, processor, computer or machine, the electronic device, processor, computer or machine becomes a detection device or detection system for implementing the present invention.

In order to make the purpose, features and advantages of the present invention more clearly understandable, embodiments are given below and explained in detail with reference to the accompanying drawings. The description of the present invention provides different examples to illustrate the technical features of different implementations of the present invention. The configuration of each component in the embodiment is for illustration only and is not intended to limit the present invention. In addition, the partial repetition of reference numbers in the figures in the embodiments is for simplifying the description and does not imply the correlation between different embodiments.

Figure 1 is a schematic diagram of the detection system of the present invention. As shown in the figure, the detection system 100 includes a detection device 110, a converter 120 and a circuit to be tested 180. The detection device 110 is connected to the circuit under test 180 through the converter 120, and is used to periodically read the status information of a target chip 130 in the circuit under test 180, and generate a detection result ST. Therefore, by observing the test result ST, the user can quickly know whether the setting of the circuit under test 180 is wrong.

In a possible embodiment, the detection device 110 further has a current detection function. In this example, the detection device 110 marks all factors that may affect the power consumption of the target wafer 130 in the detection result ST. For example, when a certain pin of the target chip 130 is at a floating level, or the potential state of a certain pin is different from the potential state of the external physical circuit to which the pin is connected, or when a certain item of the target chip 130 When the function is enabled, the power consumption of the target chip 130 will be affected. Therefore, the detection device 110 highlights factors that may affect the power consumption of the target wafer 130 in the detection result ST. According to the detection result ST, the user adjusts the internal settings of the target chip 130 (turn off functions that cause power consumption) or adjusts the structure of the external physical circuit connected to the target chip 130 . In this embodiment, the circuit to be tested 180 includes a target chip 130 and an external physical circuit connected to the target chip 130 . After completing the adjustment, all possible causes that may affect the power consumption of the target chip 130 can be eliminated. Then, the user restarts the target chip 130 . At this time, the power consumption of the target chip 130 should be less than or equal to a preset value. When the power consumption of the target chip 130 is not less than or equal to a preset value, it indicates that the target chip 130 is operating abnormally. Therefore, the user can quickly find the abnormal target chip.

In some embodiments, the detection device 110 may first put the target chip 130 into a standby mode (power-down mode), then find out the possible cause of power consumption of the target chip 130, and mark the power consumption cause in the detection result ST. . In this example, the user performs an adjustment operation based on the detection result ST, such as adjusting the internal settings of the target chip 130 or the structure of the external physical circuit connected to the target chip 130 . After completing the adjustment, the user may put the target chip 130 into a power-down mode and measure the power consumption of the target chip 130 . Since the user has eliminated all factors affecting the power consumption of the target chip 130 in advance, the user can obtain a more accurate measurement result when measuring the power consumption of the target chip 130 .

In a possible embodiment, the detection device 110 includes a memory 111 and a processor 112 . The memory 111 stores a detection program code 113 . The present invention is not limited to the type of memory 111. In a possible embodiment, the memory 111 is a non-volatile memory. The processor 112 reads the memory 111 to execute the detection program code 113 and generates a detection result ST. In a possible embodiment, the processor 112 generates a command message SCM according to the detection program code 113 to read the status information of the target chip 130 .

In other embodiments, the processor 112 commands the target chip 130 to enter a standby mode through the command message SCM. When the target chip 130 does not enter the standby mode, the processor 112 periodically detects whether the target chip 130 enters the standby mode. After the target chip 130 enters the standby mode, the processor 112 reads the internal temporary storage circuit of the target chip 130 to learn the definitions of all pins of the target chip 130, and detects some specific pins according to the pin definitions of the target chip 130. The level of the pin is used to generate the detection result ST. In another possible embodiment, the processor 112 finds the pin numbers that may affect the power consumption of the target chip 130 based on the information stored in the internal temporary storage circuit of the target chip 130, and learns some of the factors that affect the power consumption of the target chip 130. function is turned off. The processor 112 reminds the user to pay attention to some pins of the target chip 130 and the internal settings of the target chip 130 through the detection result ST. In some embodiments, the detection result ST presents the pin information of each pin of the target chip 130 and the number of the target chip 130 .

In some embodiments, the detection device 110 further includes a display device 114 for presenting the detection result ST. The present invention does not limit how the display device 114 presents the detection result ST. In a possible embodiment, the display device 114 presents the detection result ST in a text format. In another possible embodiment, the display device 114 presents the detection result ST in a visual manner. For example, display device 114 may present the appearance of target wafer 130 .

In this embodiment, the display device 114 is integrated into the detection device 110, but this is not intended to limit the invention. In other embodiments, the display device 114 may be independent of the detection device 110 . In some embodiments, the processor 112 is further coupled to a printing device (not shown), such as a printer. In this example, the processor 112 may use the detection result ST as a report, and print the detection result ST through the printing device.

In other embodiments, the detection device 110 further includes a transmission interface 115 . The transmission interface 115 is coupled to the converter 120 and is used for outputting the command message SCM generated by the processor 112 or receiving the conversion message ST2 generated by the converter 120 . The present invention does not limit the type of transmission interface 115. In a possible embodiment, the transmission interface 115 is a serial interface, such as a USB interface.

The present invention is not limited to the type of detection device 110. In a possible embodiment, the detection device 110 is a personal computer (PC) or a notebook computer (NB). In this example, the detection code 113 is a detection application running on a personal computer or laptop. When the detection application is opened, the detection device 110 detects the target chip 130 through the converter 120 .

The converter 120 is coupled between the detection device 110 and the circuit under test 180, and is used to convert the command message SCM sent by the detection device 110 into a message that can be recognized by the target chip 130, such as the conversion message ST1, and then convert the command message SCM sent by the target chip 130. The reply message SRO is converted into a message that can be recognized by the detection device 110, such as the converted message ST2. The present invention does not limit the type of converter 120. In a possible embodiment, the converter 120 is an in circuit emulator (ICE).

In some embodiments, the converter 120 has transmission interfaces 121 and 122. The transmission interface 121 is used to receive the command message SCM from the detection device 110 or to output the conversion message ST2 to the detection device 110 . In this example, the type of the transmission interface 121 is the same as the type of the transmission interface 151 , for example, both are USB interfaces. In addition, the transmission interface 122 is used to receive the reply message SRO from the target chip 130 or to output the conversion message ST1 to the target chip 130 . In a possible embodiment, the transmission interface 122 is a debugging interface, such as a Serial Wire Debug (SWD) interface or a Joint Test Action Group (Joint Test Action Group; JTAG) standard interface.

The target chip 130 has pins 131 to 162 and a temporary storage circuit 170 . The present invention does not limit the number of pins of the target chip 130 . In other embodiments, target wafer 130 has more or fewer pins. The temporary storage circuit 170 is used to store the pin information of the pins 131~162. In a possible embodiment, the target chip 130 further includes a central processing unit (not shown). The central processing unit defines the functions of the pins 131 to 162 based on the information stored in the temporary storage circuit 170 .

For example, the first part of pins 131~162 is configured as the input mode of General Purpose Input Output (GPIO), and the second part of pins 131~162 is configured as In open-drain output mode, the third part of pins 131~162 is configured as a pin in push-pull output mode, and the fourth part of pins 131~162 The pins are configured as quasi-bidirectional mode pins. Therefore, the detection device 110 can learn the functions of the pins 131 to 162 based on the information stored in the temporary storage circuit 170 .

In another possible embodiment, information on whether a specific function of the target chip 130 (such as a power-on reset (POR) function or a brown-out detector (BOD) function) is enabled Also stored in the temporary storage circuit 170. In other embodiments, the target chip 130 has analog-related functions, such as an analog-to-digital converter (ADC), an analog comparator (ACMP), and an analog amplifier (OPA). In this example, the information stored in the temporary storage circuit 170 may also indicate whether the corresponding analog function is enabled.

In a possible embodiment, the temporary storage circuit 170 includes information 171~173. Information 171 is used to indicate whether the target chip 130 has entered the standby mode. For example, when the target chip 130 does not enter the standby mode, the information 171 may have a first value. When the target chip 130 enters the standby mode, the information 171 has a second value. Therefore, the detection device 110 can know whether the target chip 130 has entered the standby mode according to the information 171 .

Information 172 records the pin information of pins 131~162. After the detection device 110 reads the information 172, it can know the operation modes of the pins 131~162. The processor 112 detects the level of the pin operating in a specific mode. In some embodiments, the specific mode refers to the GPIO input mode, open-drain output mode, push-pull output mode or approximate bidirectional mode.

Taking pin 131 as an example, assume that pin 131 operates in the GPIO input mode or the open-drain output mode. In this example, the processor 112 determines whether the level of the pin 131 is a floating level. In a possible embodiment, when the external physical circuit connected to the pin 131 does not provide voltage to the pin 131, the level of the pin 131 is a floating level. When the level of the pin 131 is a floating level, it means that the potential of the pin 131 is abnormal. Since the abnormal level of the pin 131 may easily cause abnormal current in the target chip 130 , the processor 112 highlights the pin number of the pin 131 in the detection result ST. In another possible embodiment, when the pin 131 operates in the push-pull output mode or the approximate bidirectional mode of the GPIO, the processor 112 determines whether the level of the pin 131 meets a preset level. When the level of pin 131 does not meet a preset level, it means that the input (or output) level of pin 131 (such as high level) is different from the output (or input) level of the corresponding external physical circuit (such as low level). Therefore, the processor 112 highlights the pin number of the pin 131 in the detection result ST.

The information 173 is used to indicate whether specific functions of the target chip 130 (such as the POR function and the BOD function) are enabled. Based on the information 173, the processor 112 can know whether a specific function of the target chip 130 is enabled. In other embodiments, the information 173 further indicates whether an analog function of the target chip 130 is enabled, such as an analog-to-digital converter, an analog comparator, and an analog amplifier.

Figure 2 is a schematic diagram of the detection results of the present invention. In a possible embodiment, the detection result 200 may be presented on the display device 114 in FIG. 1 . In this example, the detection result 200 includes the appearance of the target chip 130 and the status information of each pin. As shown in the figure, pins 1 to 4 operate in the GPIO input mode, so the arrows pointing toward the target chip 130 indicate the operation modes of pins 1 to 4. Pins 5, 6, 11, 12, and 29-32 operate in the approximate bidirectional mode of GPIO, so the operating modes of pins 5, 6, 11, 12, and 29-32 are represented by bidirectional arrows. Pins 13-16 operate in the open-sink output mode of GPIO, so a horizontal line segment plus a dot indicates the operating mode of pins 13-16. Pins 17-22 operate in the push-pull output mode of GPIO, so the arrows on pins 17-22 point outward. Since the operation mode of each pin of the target chip 130 is represented by a pattern (such as an arrow), the user immediately knows the operation mode of each pin of the target chip 130 . In some embodiments, the detection result 200 further presents the serial number MCU 1234 of the target wafer 130 .

In a possible embodiment, when the processor 112 executes the detection program code 113, the processor 112 generates the command message SCM. The converter 120 converts the command message SCM to generate the conversion message ST1, and provides the conversion message ST1 to the target chip 130. The target chip 130 reads the temporary storage circuit 170 according to the conversion message ST1 to generate the reply message SRO. The converter 120 converts the reply message SRO to generate the conversion message ST2, and provides the conversion message ST2 to the processor 112. The processor 112 generates a detection result 200 according to the conversion message ST2, and presents the detection result 200 on the display device 114.

In this embodiment, through the graphical detection results 200, the user can immediately determine the status information of each pin of the target chip 130. In other embodiments, the pins without arrows may serve as power pins for receiving external voltage or outputting voltage to external devices.

In addition, the detection result 200 not only indicates the status information of each pin, but in some embodiments, the detection result 200 further highlights the pin number of the pin that may cause the target chip 130 to consume power. For example, the operation modes of pins 1 to 4 are all GPIO input modes, but the fonts of pins 1 and 2 are different from the fonts of pins 3 and 4, which means that the levels of pins 1 and 2 are A floating level. If the pins operating in the GPIO input mode (such as pins 1 and 2) are at a floating level, it will easily cause the target chip 130 to consume power. Therefore, the user pays special attention to the design of the external physical circuit corresponding to pins 1 and 2 based on the pins 1 and 2 highlighted in the test result 200 . For example, the user may determine whether pin 1 is connected to a pull-up resistor or a pull-down resistor.

In another possible embodiment, the operation modes of pins 13 to 16 are all GPIO open-drain output modes, but the fonts of pins 15 and 16 are different from the fonts of pins 13 and 14, which means that pin 15 The level of 16 is a floating level. Therefore, the user pays special attention to the design of the corresponding external physical circuit based on the pins 15 and 16 highlighted in the test result 200 . For example, the user may determine whether the external physical circuit has an upper resistor coupled to pin 15 .

In other embodiments, the operation mode of pins 17 to 22 is the push-pull output mode of GPIO, but the font of pins 17 and 18 is different from the font of pins 19-22, which means that pins 17 and 18 The level is different from the level of the external physical circuit. For example, pins 17 and 18 may output a high level, but the corresponding external physical circuit pulls down the levels of pins 17 and 18, so that the levels of pins 17 and 18 are not equal to the high level. Since the output levels of pins 17 and 18 are different from the input levels of the external physical circuit, it is easy to cause leakage problems. Therefore, the user pays special attention to the design of the corresponding external physical circuit based on the pin numbers highlighted in the test result 200 (such as pins 17 and 18).

In another embodiment, the operation modes of pins 29 to 32 are all approximate bidirectional modes of GPIO, but the fonts of pins 29 and 30 are different from the fonts of pins 31 and 32, which means that pins 29 and 30 The level is different from the level of the external physical circuit. For example, pins 29 and 30 may output a high level, but measure a low level on the corresponding external physical circuit. Since the level status of pins 29 and 30 is different from the level status of the external physical circuit, it is easy to cause leakage problems. Therefore, the user pays special attention to the design of the corresponding external physical circuit based on the pin numbers highlighted in the test result 200 (such as pins 29 and 30).

In some embodiments, the detection result 200 may use pin numbers of different colors to highlight the pin numbers where current abnormality may occur. For example, because pins 1, 2, 15, 16, 17, 18, 29 and 30 may cause abnormal current, the numbers of pins 1, 2, 15, 16, 17, 18, 29 and 30 are numbered with the first Color (such as orange) appears. In this example, since the pins 3-14, 19-28, 31 and 32 will not cause abnormal current in the target chip 130, they are presented in a second color (such as black).

In some embodiments, when the user moves the cursor so that the cursor points to a specific pin, the display device may display a reminder window to inform the user of the characteristics of the specific pin. Figure 3 is a schematic diagram of the reminder window of the present invention. When the user points the cursor to pin 2, the display device displays a reminder window 300. The reminder window 300 may display the name of pin 2, the related register setting value, the corresponding clock frequency and source, and so on.

In this embodiment, the reminder window 300 provides information 310, 320 and 330. Information 310 may represent the setting of the corresponding function module register of pin 2. Information 320 may represent the settings of the GPIO configuration register. Information 330 may indicate the status of pin 2. In other embodiments, the color of the information 330 may be different from the information 310 and 320 so that the user can more easily notice the connection relationship between the pin 2 and the external circuit.

Figure 4 is another schematic diagram of the reminder window of the present invention. In this embodiment, the reminder window 400 and the detection result 200 are presented simultaneously. The reminder window 400 lists the operating status of the target chip 130, the current output voltage is 3.3V, the number of the currently detected target chip 130 (such as MCU 1234), and the operating status of the target chip 130, such as whether to enter standby mode. In other embodiments, the reminder window 400 may list the numbers of specific pins (ie, pins that may affect the power consumption of the target chip 130), such as pins 1, 2, 15, and 16 with floating levels, and may occur Pins 17, 18, 29, and 30 for leakage problems.

Figure 5 is another schematic diagram of the reminder window of the present invention. When the user points the cursor to the number MCU 1234 of the target chip 130, the display device displays a reminder window 500. In this example, the user learns the functions enabled by the target chip 130 based on the information provided by the reminder window 500 . In other embodiments, the reminder window 500 only displays functions that may cause extra power consumption of the target chip 130, such as the POR function.

In some embodiments, when a detection device (such as 110 in FIG. 1 ) finds that a specific function of the target chip 130 (a function that causes extra power consumption of the target chip 130 ) is turned on, the detection device highlights the target in the detection result 200 The chip 130 is numbered MCU1234. For example, the font (or color) of the number MCU1234 is different from the font (or color) of the pin numbers 5 to 8. Therefore, the user can know whether the function that affects the power consumption of the target chip 130 is not turned off according to the font (or color) of the target chip 130 . In this example, if the user points the cursor to the number MCU 1234 of the target chip 130, the display device displays the reminder window 500 to inform the user which function of the target chip 130 is not closed.

The present invention does not limit the message presented in the reminder window 500. In a possible embodiment, the reminder window 500 at least presents the functions enabled by the target chip 130 . According to the message in the reminder window 500, the user closes specific functions that may cause power consumption of the target chip 130, such as the POR function or the BOD function. In another possible embodiment, the reminder window 500 further displays partial pin numbers of the target chip 130 . In this example, the pin numbers displayed in the reminder window 500 correspond to pins (eg, 1, 2, 15-18, 29, 30) that may cause extra power consumption of the target chip 130 . Therefore, the user detects whether the corresponding external physical circuit is equipped with a pull-up or pull-down resistor according to the pin number presented in the reminder window 500, so as to prevent the level of the corresponding pin from being a floating level, or to detect Whether the external physical circuit affects the potential output by the target chip 130 .

Since the reminder window 500 displays all functions and pin numbers that may increase the extra power consumption of the target chip 130, the user can turn off all functions that affect the power consumption of the target chip 130 according to the reminder window 500, and check the coupling of the target chip 130. The connected external physical circuit ensures that the power consumption of the target chip 130 will not be affected by external influences.

In some embodiments, the detection device may first command the target chip 130 to enter a standby mode. After the target chip 130 enters the standby mode, the detection device detects the temporary storage circuit inside the target chip 130 to determine the definition of each pin of the target chip 130, and then marks the specific pin number (such as 1, 2, 15 -18, 29, 30) in the test result 200. The detection device also informs the target chip 130 that some functions of the target chip 130 have been enabled through the detection result 200 . The user may turn off some functions of the target chip 130, then reconnect the target chip 130 with the external physical circuit, and measure the power consumption of the target chip 130. In this example, since the specific function of the target chip 130 has been turned off, and the external physical circuit has been checked (whether it has a pull-up or pull-down resistor, whether it has a leakage current problem), when the target chip 130 operates in the standby mode, the target chip 130 operates in the standby mode. The power consumption of the chip 130 should be lower than a preset value. When the power consumption of the target chip 130 does not meet the preset value, it means that the target chip 130 is indeed abnormal. However, when the power consumption of the target chip 130 meets the preset value, it means that the target chip 130 is normal. Therefore, the reminder window 500 can speed up the time for the user to detect the target chip 130, improve the accuracy of detection, and reduce the probability of misjudgment.

Figure 6 is a schematic flow chart of the detection method of the present invention. The detection method of the present invention is used to detect a target chip and learn the definition of each pin of the target chip and the functions enabled by the target chip. In a possible embodiment, the detection results generated by the detection method mark the specific pins of the target chip and the specific functions enabled by the target chip. The specific pins marked refer to the pins that may easily cause power consumption when the position is abnormal. For example, pins that are prone to power consumption refer to pins that operate in the GPIO input mode and the GPIO open-drain output mode, and the level is equal to a floating level. In addition, pins operating in the push-pull output mode of the GPIO and operating in the approximate bidirectional mode of the GPIO, and whose levels are different from those of the corresponding external physical circuits, will also cause current anomalies in the target chip. In other embodiments, the specific functions marked in the test results refer to functions that easily cause extra power consumption when the target chip is in standby mode, such as POR function, BOD function, analog function, etc.

The detection method of the present invention can exist through program code. When the program code is loaded and executed by the machine, the machine becomes a detection device for implementing the invention. First, the detection device is connected to a converter, and the detection program code of the detection device is turned on (step S611). In one possible embodiment, the converter may be an in-circuit emulator (ICE).

Then, connect a circuit to be tested through a converter (step S612). In a possible embodiment, the converter is responsible for communication between the detection device and the circuit under test. In another possible embodiment, after connecting to the circuit under test, the detection device executes the detection program code to read the status information of a target chip on the circuit under test. In other embodiments, before reading the status information of the target chip, the detection device first commands the target chip to perform a reset operation.

Determine whether the target chip enters a standby mode (step S613). In a possible embodiment, the detection device determines whether a CPU in the target chip enters a sleep mode. After the central processor enters the sleep mode, the detection device confirms whether the target chip has enabled a standby function. In a possible embodiment, the detection device may read the first information stored in a temporary storage circuit inside the target chip to learn whether the target chip has enabled the standby function. When the target chip does not turn on the standby function, it means that the target chip has not yet entered a standby mode, so it returns to step S613 to periodically read the status of the target chip.

When the target chip turns on the standby function, it means that the target chip enters the standby mode, so the setting detection is started (step S614). In a possible embodiment, step S614 is to detect the definition of each pin of the target chip to generate a detection result. In this example, step S614 may read the second information stored in a temporary storage circuit inside the target chip to obtain the definition of each pin of the target chip. In another possible embodiment, step S614 further detects whether a specific function of the target chip is enabled. In this example, step S614 learns which functions of the target chip are enabled based on the second information stored in a temporary storage circuit inside the target chip.

The detection result is output (step S615). In a possible embodiment, the detection result is output to a display device. In this example, the detection results may be presented on the display device in a graphical or textual manner. In another possible embodiment, the detection results are printed out through a printing tool (such as a printer). Likewise, test results may be presented graphically or textually in a report.

In some embodiments, the detection result highlights the pin number of at least one specific pin. In this example, the highlighted pin number means that the operating state of the specific pin belongs to an input mode or an open-drain output mode of the GPIO, and the level of the specific pin is a floating level. In another possible embodiment, the highlighted pin number means that the operating state of the specific pin belongs to a push-pull output mode or an approximate bidirectional mode of GPIO, and the level of the specific pin is different from the corresponding level of the external physical circuit. In this example, when the display device displays the detection result, if the user points a cursor to the pin number of a specific pin, the display device further displays a first reminder window to remind the user that the specific pin may cause power consumption. The user detects the corresponding external physical circuit (the external physical circuit will be connected to the target chip) according to the pin number of the specific pin marked in the first reminder window, such as detecting whether the external physical circuit has a pull-up or pull-down resistor or whether Detect whether the external physical circuit has leakage problems. When the external physical circuit has a pull-up or pull-down resistor, it can avoid causing the level of a specific pin of the target chip to be a floating level when the external physical circuit is connected to the target chip.

In another possible embodiment, when at least one of the POR function and the BOD function of the target chip is turned on, the number of the target chip is highlighted in the detection result. In this example, when the display device displays the detection result, if the user points the cursor to the number of the target chip, the display device further displays a second reminder window to remind the user to turn off some functions of the target chip to avoid additional consumption. Electricity. After the user turns off some functions of the target chip, the user may connect the target chip to an external physical circuit and operate the target chip in a standby mode. Since the power consumption function of the target chip has been turned off, the power consumption of the target chip should comply with a preset value. When the power consumption of the target chip does not meet a preset value, it indicates that the target chip is abnormal. Therefore, the user can accurately know whether the target chip is abnormal by measuring the power consumption of the target chip.

The detection method of the present invention, or a specific type or part thereof, may exist in the form of program code. Program code can be stored in physical media, such as floppy disks, optical discs, hard disks, or any other machine-readable (such as computer-readable) storage media, or computer program products that are not limited to external forms, among which, When the program code is loaded and executed by a machine, such as a computer, the machine becomes a detection device for participating in the present invention. The program code can also be transmitted through some transmission media, such as wires or cables, optical fiber, or any transmission type. When the program code is received, loaded and executed by a machine, such as a computer, the machine becomes a party to participate in the process. Invented detection device. When implemented in a general purpose processing unit, the program code combined with the processing unit provides a unique device that operates similarly to application specific logic circuits.

Unless otherwise defined, all terms (including technical and scientific terms) used herein belong to the common understanding of a person with ordinary knowledge in the technical field to which this invention belongs. In addition, unless explicitly stated, the definition of a word in a general dictionary should be interpreted as consistent with its meaning in articles in the relevant technical field, and should not be interpreted as an ideal state or an overly formal tone. Although terms such as "first," "second," and the like may be used to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another element.

Although the present invention has been disclosed above in terms of preferred embodiments, they are not intended to limit the present invention. Anyone with ordinary skill in the art may make slight changes and modifications without departing from the spirit and scope of the present invention. . For example, the systems, devices or methods described in the embodiments of the present invention may be implemented as physical embodiments of hardware, software, or a combination of hardware and software. Therefore, the protection scope of the present invention shall be determined by the appended patent application scope.

100:Detection system 110:Detection device 120:Converter 130:Target chip 111:Memory 112: Processor 113: Detection code 114:Display device 115, 121, 122: Transmission interface 131~162: Pin 170: Temporary circuit 171~173, 310, 320, 330: Information 180: Circuit to be tested ST, 200: test results SCM: command message ST1, ST2: Conversion message SRO: Reply message 300, 400, 500: reminder window S611~S615: steps

Figure 1 is a schematic diagram of the detection system of the present invention. Figure 2 is a schematic diagram of the detection results of the present invention. Figure 3 is a schematic diagram of the reminder window of the present invention. Figure 4 is another schematic diagram of the reminder window of the present invention. Figure 5 is another schematic diagram of the reminder window of the present invention. Figure 6 is a schematic flow chart of the detection method of the present invention.

100:Detection system

110:Detection device

120:Converter

130:Target chip

111:Memory

112: Processor

113: Detection code

114:Display device

115, 121, 122: Transmission interface

131~162: Pin

170: Temporary circuit

171~173:Information

180: Circuit to be tested

ST: test results

SCM: command message

ST1, ST2: Conversion message

SRO: Reply message

Claims (10)

A detection device is used to detect a target chip and provide a detection result. The detection device includes: a transmission interface coupled to the target chip; a memory to store a detection program code; and a processor to execute the detection Program code for reading status information of the target chip and generating the detection result; wherein the processor commands the target chip to enter a standby mode, and after the target chip enters the standby mode, the processor reads the target Chip status information. The detection device of claim 1, wherein the processor reads a first information stored in a temporary storage circuit of the target chip to determine whether the target chip enters the standby mode. When the target chip enters the standby mode, At this time, the processor reads a second information stored in the temporary storage circuit to read the pin information of each pin of the target chip. Such as the detection device of claim 2, wherein when the target chip does not enter the standby mode, the processor periodically reads the first information stored in the temporary storage circuit until the target chip enters the standby mode. The detection device of claim 2 further includes: a display device to present the detection result, wherein the detection result presents the pin information of each pin of the target chip and the number of the target chip. The detection device of claim 4, wherein the processor determines whether each pin of the target chip operates in a specific mode based on the second information stored in the temporary storage circuit. When a specific pin of the target chip When operating in a specific mode, the The processor determines whether to highlight the specific pin in the detection result based on the level of the specific pin. The detection device of claim 5, wherein: when the specific pin operates in an input mode of a general-purpose input and output or an open-drain output mode, and the specific pin is a floating level, the processor detects In the results, the specific pin is highlighted; and when the specific pin operates in a push-pull output mode or an approximate bidirectional mode of the general-purpose input and output, and the level of the specific pin does not meet a preset value, The processor highlights the specific pin in the detection result. A detection method includes: resetting a target chip; commanding the target chip to enter a standby mode; determining whether the target chip enters a standby mode; when the target chip enters the standby mode, detecting the target chip to generate a Test results; and output the test results. For example, the detection method of claim 7, wherein when a cursor of a display device points to the pin number of the specific pin, the display device further displays a reminder window. As claimed in claim 7, the step of detecting the target chip further includes: determining whether at least one of a power-on reset function and a low-voltage detection function of the target chip is turned on; and when the power-on reset function and the low-voltage detection function are turned on; When at least one of the low-voltage detection functions is turned on, the number of the target chip is highlighted in the detection result. A detection system includes: a target chip having a plurality of pins and a temporary storage circuit; a converter coupled to the target chip; and a detection device that detects the target chip through the converter to generate a detection The result includes: a transmission interface coupled to the converter; a memory storing a detection program code; and a processor executing the detection program code to read the status information of the target chip and generate the Detection result; wherein the processor commands the target chip to enter a standby mode, and after the target chip enters the standby mode, the processor reads status information of the target chip.

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