TWI408375B - Current measuring device and computer system utilizing the same - Google Patents
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Abstract
Description
本發明係有關於一種電腦系統,特別是有關於一種可測量一負載裝置的電流量的電腦系統。The present invention relates to a computer system, and more particularly to a computer system that can measure the amount of current in a load device.
在現有的電流測量技術中,通常係利用電流計或電流勾表測量流經一負載單元的電流量。在使用電流計時,需將電流計串聯負載單元。電流計根據流經本身的電流量,告知流經負載單元的電流量。若使用電流勾表測量電流時,需將電流勾表圍繞負載單元。電流勾表根據所感應到的電流磁場,推出流經待測物的電流量。In existing current measurement techniques, an galvanometer or current meter is typically used to measure the amount of current flowing through a load cell. When using current counting, the galvanometer needs to be connected in series with the load cell. The galvanometer informs the amount of current flowing through the load cell based on the amount of current flowing through itself. If the current is used to measure the current, the current checklist should be placed around the load cell. The current checklist pushes out the amount of current flowing through the object to be tested based on the sensed current magnetic field.
然而,不論是利是電流計或電流勾表測量電流,均需改變負載單元原本的連接關係。在習知的做法中,係先拔除負載單元,再將負載單元與電流測量裝置(電流計或電流勾表)相連接。在測量過後,需先移除負載單元與電流測量裝置的連接,再回復負載單元與其它元件之間的連接關係。因此,將造成電流測量時間大幅地增加。However, whether it is the current meter or the current meter to measure the current, it is necessary to change the original connection relationship of the load unit. In the conventional practice, the load unit is first removed, and the load unit is connected to a current measuring device (current meter or current meter). After the measurement, the connection between the load unit and the current measuring device is removed, and the connection relationship between the load unit and other components is restored. Therefore, the current measurement time will be greatly increased.
另外,在負載單元的拔除或是回復的過程中,很有可能會使得負載單元與其它元件形成異常的連接關係,如不正常的短路(short)或開路(open)。因此,測試人員需再花費時間,對負載單元進行除錯(debug)的程序。In addition, during the process of removing or recovering the load unit, it is very likely that the load unit forms an abnormal connection relationship with other components, such as an abnormal short or open. Therefore, the tester needs to spend more time debugging the load unit.
本發明提供一種電流測量裝置,用以測量流經一第一負載單元的電流量。電流測量裝置包括,一第一阻抗單元、一第一偵測單元以及一處理單元。第一阻抗單元具有一第一輸入端以及一第一輸出端。第一輸入端接收一輸入電壓。第一輸出端與第一負載單元耦接於一第一節點。第一偵測單元根據輸入電壓與第一節點的電壓,產生一第一偵測信號。處理單元處理第一偵測信號,用以得知流經第一負載單元之電流量。The invention provides a current measuring device for measuring the amount of current flowing through a first load unit. The current measuring device includes a first impedance unit, a first detecting unit and a processing unit. The first impedance unit has a first input end and a first output end. The first input receives an input voltage. The first output end is coupled to the first load unit to a first node. The first detecting unit generates a first detection signal according to the input voltage and the voltage of the first node. The processing unit processes the first detection signal to know the amount of current flowing through the first load unit.
本發明另提供一種電腦系統,包括一第一負載裝置以及一電流測量裝置。第一負載裝置具有一第一負載單元。電流測量裝置測量流經該第一負載單元的電流量,並包括一第一阻抗單元、一第一偵測單元以及一處理單元。第一阻抗單元具有一第一輸入端以及一第一輸出端。第一輸入端接收一輸入電壓。第一輸出端與第一負載單元耦接於一第一節點。第一偵測單元根據輸入電壓與第一節點的電壓,產生一第一偵測信號。處理單元處理第一偵測信號,用以得知流經第一負載裝置之電流量。The invention further provides a computer system comprising a first load device and a current measuring device. The first load device has a first load unit. The current measuring device measures the amount of current flowing through the first load unit, and includes a first impedance unit, a first detecting unit, and a processing unit. The first impedance unit has a first input end and a first output end. The first input receives an input voltage. The first output end is coupled to the first load unit to a first node. The first detecting unit generates a first detection signal according to the input voltage and the voltage of the first node. The processing unit processes the first detection signal to know the amount of current flowing through the first load device.
為讓本發明之特徵和優點能更明顯易懂,下文特舉出較佳實施例,並配合所附圖式,作詳細說明如下:In order to make the features and advantages of the present invention more comprehensible, the preferred embodiments are described below, and are described in detail with reference to the accompanying drawings.
第1圖係為本發明之電腦系統之示意圖。如圖所示,電腦系統100包括,負載裝置110、電流測量裝置130以及處理裝置150。負載裝置110具有負載單元111。電流測量裝置130用以測量流經負載單元111的電流量,並將測量後的結果傳送至處理裝置150。處理裝置150根據電流測量裝置130的測量結果,執行一特定動作。稍後將詳細說明特定動作。Figure 1 is a schematic illustration of a computer system of the present invention. As shown, computer system 100 includes load device 110, current measurement device 130, and processing device 150. The load device 110 has a load unit 111. The current measuring device 130 is configured to measure the amount of current flowing through the load unit 111 and transmit the measured result to the processing device 150. The processing device 150 performs a specific action based on the measurement result of the current measuring device 130. Specific actions will be described in detail later.
在本實施例中,電流測量裝置130透過傳輸介面171,與負載裝置110進行測量信號的傳送,然後再透過傳輸介面191,與處理裝置150進行測量結果的傳送。本發明並不限制傳輸介面171與191的種類。傳輸介面171與191可為通用序列匯流排(Universal Serial Bus;USB)介面、電路內部整合電路滙流排(Inter-Integrated Circuit Bus;I2C Bus)介面、或是其它匯流排介面。在一可能實施例中,傳輸介面171與191可為不同種類的傳輸介面。In the present embodiment, the current measuring device 130 transmits the measurement signal to the load device 110 through the transmission interface 171, and then transmits the measurement result to the processing device 150 through the transmission interface 191. The invention does not limit the types of transmission interfaces 171 and 191. The transmission interfaces 171 and 191 can be a Universal Serial Bus (USB) interface, an Inter-Integrated Circuit Bus (I2C Bus) interface, or other bus interface. In a possible embodiment, the transmission interfaces 171 and 191 can be different kinds of transmission interfaces.
在本實施例中,負載裝置110係透過傳輸介面172、192以及電流測量裝置130,與處理裝置150進行信號傳送,其中所傳送的信號與測量信號無關。在其它實施例中,負載裝置110可僅透過單一傳輸介面(不透過電流測量裝置130),直接地與處理裝置150進行資料傳輸。In the present embodiment, the load device 110 transmits signals to the processing device 150 through the transmission interfaces 172, 192 and the current measuring device 130, wherein the transmitted signals are independent of the measurement signals. In other embodiments, the load device 110 can directly transmit data to the processing device 150 through a single transmission interface (not through the current measurement device 130).
本發明並不限定傳輸介面172與192的種類。在一可能實施例中,傳輸介面172與192均為一週邊裝置元件互連(Peripheral Component Interconnect;PCI)介面,但並非用以限制本發明。在其它可能實施例中,傳輸介面172與192可為相同或不同的介面。The invention does not limit the types of transmission interfaces 172 and 192. In a possible embodiment, the transmission interfaces 172 and 192 are both Peripheral Component Interconnect (PCI) interfaces, but are not intended to limit the present invention. In other possible embodiments, the transmission interfaces 172 and 192 can be the same or different interfaces.
如圖所示,電流測量裝置130與負載裝置110各自獨立於不同的電路板。在一可能實施例中,電流測量裝置130可整合於負載裝置110之中,亦即電流測量裝置130與負載裝置110設置在同一電路板。在其它實施例中,負載裝置110、電流測量裝置130與處理裝置150設置在同一電路板。As shown, current measuring device 130 and load device 110 are each independent of a different circuit board. In a possible embodiment, the current measuring device 130 can be integrated into the load device 110, that is, the current measuring device 130 and the load device 110 are disposed on the same circuit board. In other embodiments, the load device 110, the current measurement device 130, and the processing device 150 are disposed on the same circuit board.
本發明並不限定負載裝置110的種類。在一可能實施例中,負載裝置110係為一顯示卡(Video Graphics Array;VGA),或是其它週邊裝置。以顯示卡為例,顯示卡一般具有許多元件,每一元件均可作為負載單元111。在本實施例中,負載單元111可為顯示卡的繪圖處理器(Graphic Processing Unit;GPU)或/及記憶體。由於顯示卡為本領域人士所深知,故不再贅述顯示卡的動作原理。The invention does not limit the type of load device 110. In a possible embodiment, the load device 110 is a Video Graphics Array (VGA) or other peripheral device. Taking a display card as an example, a display card generally has many components, each of which can function as the load unit 111. In this embodiment, the load unit 111 can be a graphics processing unit (GPU) or/and a memory of the display card. Since the display card is well known to those skilled in the art, the operation principle of the display card will not be described again.
處理裝置150根據電流測量裝置130的測量結果,執行一特定動作,如顯示流經負載單元111的電流量,或是調整負載裝置110或負載單元111的操作頻率等等。本發明並不限制處理裝置150的種類。在一可能實施例中,處理裝置150係為一主機板(motherboard;MB)。在其實施例中,處理裝置150係為一外部儀器。The processing device 150 performs a specific action based on the measurement result of the current measuring device 130, such as displaying the amount of current flowing through the load unit 111, or adjusting the operating frequency of the load device 110 or the load unit 111, and the like. The invention does not limit the type of processing device 150. In one possible embodiment, the processing device 150 is a motherboard (MB). In its embodiment, processing device 150 is an external instrument.
假設,負載裝置110為一顯示卡,處理裝置150係為一主機板時,顯示卡與主機板便可透過傳輸介面(如PCI介面)172、192以及電流測量裝置130,相互傳送信號。因此,主機板便可處理顯示卡的輸出信號,或是提供信號予顯示卡。It is assumed that when the load device 110 is a display card and the processing device 150 is a motherboard, the display card and the motherboard can transmit signals to each other through a transmission interface (such as a PCI interface) 172, 192 and a current measuring device 130. Therefore, the motherboard can process the output signal of the display card or provide a signal to the display card.
此時,若需測量顯示卡內的某一負載單元的電流量,則電流測量裝置130透過傳輸介面171,將測量信號傳送至負載單元,並根據負載單元的回傳結果,求得測量結果。電流測量裝置130再透過傳輸介面191,將測量結果傳送至主機板。主機板便可根據電流測量結果,執行一特定動作,如調整負載單元的操作頻率,或是將測量結果呈現於螢幕。At this time, if it is necessary to measure the current amount of a certain load cell in the display card, the current measuring device 130 transmits the measurement signal to the load unit through the transmission interface 171, and obtains the measurement result according to the return result of the load unit. The current measuring device 130 transmits the measurement result to the motherboard through the transmission interface 191. The motherboard can perform a specific action based on the current measurement, such as adjusting the operating frequency of the load cell or presenting the measurement on the screen.
在本實施例中,處理裝置150係透過不同的傳輸介面(如USB及PCI),分別接收測量信號以及與電流測量無關的信號,但並非用以限制本發明。在其它實施例中,處理裝置150可透過單一傳輸介面,同時接收測量信號以及與電流測量無關的信號。In this embodiment, the processing device 150 receives measurement signals and signals independent of current measurement through different transmission interfaces (such as USB and PCI), but is not intended to limit the present invention. In other embodiments, the processing device 150 can transmit a measurement signal and a signal unrelated to the current measurement through a single transmission interface.
另外,如第1圖所示,負載裝置110接收輸入電壓VIN1 ,電流測量裝置130接收輸入電壓VIN2 ,並與負載單元111耦接於一節點(未顯示)。輸入電壓VIN1 與輸入電壓VIN2 可來自相同或不同的電壓源。另外,輸入電壓VIN1 與輸入電壓VIN2 可具有相同或不同的位準。在測量模式下,負載單元111停止接收輸入電壓VIN1 。不在測量模式時,負載單元111根據輸入電壓VIN1 而運作。In addition, as shown in FIG. 1, the load device 110 receives the input voltage V IN1 , and the current measuring device 130 receives the input voltage V IN2 and is coupled to the load unit 111 at a node (not shown). The input voltage V IN1 and the input voltage V IN2 may be from the same or different voltage sources. Additionally, the input voltage V IN1 and the input voltage V IN2 may have the same or different levels. In the measurement mode, the load unit 111 stops receiving the input voltage V IN1 . When not in the measurement mode, the load unit 111 operates in accordance with the input voltage V IN1 .
第2圖為本發明之電流測量裝置130之一可能實施例。如圖所示,電流測量裝置130接收輸入電壓VIN2 ,並與負載單元111耦接於節點ND。在本實施例中,電流測量裝置130具有,阻抗單元210、偵測單元230以及處理單元250。Figure 2 is a possible embodiment of a current measuring device 130 of the present invention. As shown, the current measuring device 130 receives the input voltage V IN2 and is coupled to the load unit 111 to the node ND. In the embodiment, the current measuring device 130 has an impedance unit 210, a detecting unit 230, and a processing unit 250.
阻抗單元210的一端接收輸入電壓VIN2 ,其另一端與負載單元110耦接於節點ND。在本實施例中,阻抗單元210係為電阻器。偵測單元230根據輸入電壓VIN2 與節點ND的電壓,產生偵測信號SDEC 。處理單元250根據偵測信號SDEC ,得知流經負載單元111的電流量。在本實施例中,偵測信號SDEC 係為一電壓位準。One end of the impedance unit 210 receives the input voltage V IN2 , and the other end of the impedance unit 210 is coupled to the load unit 110 to the node ND. In the present embodiment, the impedance unit 210 is a resistor. The detecting unit 230 generates the detection signal S DEC according to the input voltage V IN2 and the voltage of the node ND. The processing unit 250 knows the amount of current flowing through the load unit 111 based on the detection signal S DEC . In this embodiment, the detection signal S DEC is a voltage level.
為了得知流經負載單元111的電流量,處理單元250具有電壓至電流轉換功能。在處理單元250將偵測信號SDEC 由電壓位準轉換成電流位準後,藉由轉換後的結果,便可得知流經負載單元111的電流量。In order to know the amount of current flowing through the load unit 111, the processing unit 250 has a voltage to current conversion function. After the processing unit 250 converts the detection signal S DEC from the voltage level to the current level, the amount of current flowing through the load unit 111 can be known by the converted result.
第3A圖為偵測單元230之一可能實施例。如圖所示,偵測單元230具有差動放大器(differential amplifier)310。差動放大器310根據輸入電壓VIN2 與節點ND的電壓VND 之間的壓差,產生一壓差信號。在本實施例中,差動放大器310所產生的壓差信號即為偵測信號SDEC 。FIG. 3A is a possible embodiment of the detecting unit 230. As shown, the detection unit 230 has a differential amplifier 310. The differential amplifier 310 generates a differential pressure signal based on a voltage difference between the input voltage V IN2 and the voltage V ND of the node ND. In the present embodiment, the differential pressure signal generated by the differential amplifier 310 is the detection signal S DEC .
由於差動放大器310所產生的壓差信號係為一類比信號,因此,在另一可能實施例中,第2圖所示的處理單元250需具有類比至數位的轉換功能。當差動放大器310所產生的壓差信號(類比信號)被傳送至處理單元250時,處理單元250會將所接收到的壓差信號由類比格式轉換成數位格式的電流位準。在本實施例中,處理單元250所產生的電流位準即為流經負載單元111的電流量。Since the differential pressure signal generated by the differential amplifier 310 is an analog signal, in another possible embodiment, the processing unit 250 shown in FIG. 2 needs to have an analog to digital conversion function. When the differential pressure signal (analog signal) generated by the differential amplifier 310 is transmitted to the processing unit 250, the processing unit 250 converts the received differential pressure signal from an analog format to a current level of the digital format. In the present embodiment, the current level generated by the processing unit 250 is the amount of current flowing through the load unit 111.
第3B圖為偵測單元230之另一可能實施例。第3B圖相似第3A圖,不同之處在於,第3B圖之偵測單元230具有一類比數位轉換器(ADC)330。類比數位轉換器330轉換差動放大器310所產生的壓差信號,並將轉換後的結果傳送至第2圖所示的處理單元250。FIG. 3B is another possible embodiment of the detecting unit 230. FIG. 3B is similar to FIG. 3A except that the detecting unit 230 of FIG. 3B has an analog-to-digital converter (ADC) 330. The analog-to-digital converter 330 converts the differential pressure signal generated by the differential amplifier 310, and transmits the converted result to the processing unit 250 shown in FIG.
在本實施例中,類比數位轉換器330所轉換後的壓差信號即為偵測信號SDEC 。由於第2圖所示的處理單元250具有電壓轉電流的功能,因此當處理單元250接收到類比數位轉換器330的輸出信號時,便可產生一相對應的電流位準,其中此電流位準即為流經負載裝置110的電流量。In this embodiment, the differential pressure signal converted by the analog-to-digital converter 330 is the detection signal S DEC . Since the processing unit 250 shown in FIG. 2 has the function of voltage-converting current, when the processing unit 250 receives the output signal of the analog-to-digital converter 330, a corresponding current level can be generated, wherein the current level is generated. That is, the amount of current flowing through the load device 110.
另外,在第2圖中,電流測量裝置130更具有一開關270,用以選擇性地傳送節點ND的電壓VND 予偵測單元230。在測量模式下,導通開關270,故可將節點ND的電壓VND 傳送至偵測單元230。不在測量模式時,不導通開關270。因此,節點ND的電壓VND 並不會被傳送至偵測單元230。在一可能實施例中,不在測量模式時,負載單元111可能係接收輸入電壓VIN1 ,並根據輸入電壓VIN1 而運作。In addition, in FIG. 2, the current measuring device 130 further has a switch 270 for selectively transmitting the voltage V ND of the node ND to the detecting unit 230. In the measurement mode, the switch 270 is turned on, so that the voltage V ND of the node ND can be transmitted to the detecting unit 230. When not in the measurement mode, the switch 270 is not turned on. Therefore, the voltage V ND of the node ND is not transmitted to the detecting unit 230. In one possible embodiment, it is not in the measurement mode, the load unit 111 may be provided for receiving an input voltage V IN1, and the operation of the input voltage V IN1.
第4圖為處理裝置150之一可能實施例。如圖所示,處理裝置150包括,控制單元410、溫度測量單元430、儲存單元450以及顯示電路470,但並非用以限制本發明。在其它實施例中,處理裝置150的部份或全部元件可整合於電流測量裝置130或負載裝置110之中。另外,根據處理裝置150所需執行的特定動作的種類,可將其它元件整合於處理裝置150之中。FIG. 4 is a possible embodiment of a processing device 150. As shown, the processing device 150 includes a control unit 410, a temperature measuring unit 430, a storage unit 450, and a display circuit 470, but is not intended to limit the present invention. In other embodiments, some or all of the components of processing device 150 may be integrated into current measuring device 130 or load device 110. Additionally, other components may be integrated into the processing device 150 depending on the type of particular action that the processing device 150 needs to perform.
控制單元410根據傳輸介面191的信號(即電流測量裝置130的測量結果),執行一特定動作。在本實施例中,控制單元410所執行的特定動作係,驅動顯示電路470,使得一顯示面板可顯示流經負載單元111的電流量。在其它實施例中,若不需顯示負載單元111的電流量,則可省略顯示電路470。The control unit 410 performs a specific action based on the signal of the transmission interface 191 (ie, the measurement result of the current measuring device 130). In the present embodiment, the specific action performed by the control unit 410 drives the display circuit 470 such that a display panel can display the amount of current flowing through the load unit 111. In other embodiments, the display circuit 470 may be omitted if the amount of current of the load unit 111 is not required to be displayed.
在另一可能實施例中,控制單元410可透過一電路內部整合電路滙流排(Inter-Integrated Circuit Bus;I2C Bus)或是USB匯流排,接收電流測量裝置130的測量結果。也就是說,傳輸介面191係為電路內部整合電路滙流排(I2C Bus)或是USB匯流排。In another possible embodiment, the control unit 410 can receive the measurement result of the current measuring device 130 through an Inter-Integrated Circuit Bus (I2C Bus) or a USB bus. That is to say, the transmission interface 191 is an integrated circuit bus (I2C Bus) or a USB bus.
當傳輸介面191係為電路內部整合電路滙流排時,電流測量裝置130需具有一電路內部整合電路(I2C),用以將偵測信號SDEC 轉換成一時脈信號以及一資料信號,然後將轉換後的結果,透過傳輸介面191傳送至控制單元410。When the transmission interface 191 is a circuit integrated circuit bus, the current measuring device 130 needs to have an internal circuit (I2C) for converting the detection signal S DEC into a clock signal and a data signal, and then converting The subsequent result is transmitted to the control unit 410 through the transmission interface 191.
在另一可能實施例中,控制單元410所執行的特定動作係根據電流測量裝置130的測量結果,調整負載裝置110或負載單元111的操作頻率。舉例而言,若流經負載單元111的電流量小於一預設值時,則控制單元410逐漸地增加負載單元111的操作頻率。相反地,若流經負載單元111的電流量大於該預設值時,則控制單元410逐漸地減少負載單元111的操作頻率。In another possible embodiment, the specific action performed by the control unit 410 adjusts the operating frequency of the load device 110 or the load unit 111 according to the measurement result of the current measuring device 130. For example, if the amount of current flowing through the load unit 111 is less than a predetermined value, the control unit 410 gradually increases the operating frequency of the load unit 111. Conversely, if the amount of current flowing through the load unit 111 is greater than the preset value, the control unit 410 gradually reduces the operating frequency of the load unit 111.
在其它可能實施例中,負載單元111可能具有一第一負載以及一第二負載。第一負載並聯第二負載,其中第一負載具有一第一操作頻率,第二負載具有一第二操作頻率。在此例中,控制單元410所執行的特定動作可為,調整第一及第二操作頻率之至少一者。In other possible embodiments, the load unit 111 may have a first load and a second load. The first load is in parallel with the second load, wherein the first load has a first operating frequency and the second load has a second operating frequency. In this example, the specific action performed by the control unit 410 may be to adjust at least one of the first and second operating frequencies.
首先,電流測量裝置130測量負載單元111,用以得到一第一測量結果。接著,在調整第一及第二操作頻率之至少一者後,電流測量裝置130再次測量負載單元111,用以得到一第二測量結果。控制單元410根據第一及第二測量結果,便可分別求得流經第一負載的第一電流量以及流經該第二負載的第二電流量。First, the current measuring device 130 measures the load unit 111 for obtaining a first measurement result. Then, after adjusting at least one of the first and second operating frequencies, the current measuring device 130 measures the load unit 111 again to obtain a second measurement result. The control unit 410 can respectively determine the first current amount flowing through the first load and the second current amount flowing through the second load according to the first and second measurement results.
舉例而言,第一測量結果CUR_total如下式所示:For example, the first measurement result CUR_total is as follows:
CUR_total=IL1 +IL2 …………………………(1)CUR_total=I L1 +I L2 ..............................(1)
其中,IL1 為流經第一負載的第一電流量,IL2 為流經第一負載的第二電流量。Wherein, I L1 is a first current amount flowing through the first load, and I L2 is a second current amount flowing through the first load.
假設,第一負載的第一操作頻率被減少20%,則第二測量結果CUR_total’如下式所示:Assuming that the first operating frequency of the first load is reduced by 20%, the second measurement result CUR_total' is as follows:
CUR_total’=0.8IL1 +IL2 …………………………(2)CUR_total'=0.8I L1 +I L2 ..............................(2)
由於第一及第二測量結果已知,故根據式(1)及(2),便可分別求得流經第一負載的第一電流量IL1 以及流經第二負載的第二電流量IL2 。Since the first and second measurement results are known, according to equations (1) and (2), the first current amount I L1 flowing through the first load and the second current amount flowing through the second load can be respectively determined. I L2 .
在本實施例中,僅調降第一負載的第一操作頻率。在其它實施例中,可調降/調升第一及/或第二負載的第一及/或第二操作頻率。本發明並不限制調整的幅度。在一可能實施例中,第一操作頻率被調整的幅度可等於或不等於第一操作頻率被調整的幅度。舉例而言,第一操作頻率可能被調降20%,而第二操作頻率可能被調升10%或被調降10%、20%或30%。In this embodiment, only the first operating frequency of the first load is throttled down. In other embodiments, the first and/or second operating frequencies of the first and/or second load may be adjusted down/regulated. The invention does not limit the magnitude of the adjustment. In a possible embodiment, the first operating frequency is adjusted to have an amplitude equal to or not equal to the amplitude at which the first operating frequency is adjusted. For example, the first operating frequency may be reduced by 20%, while the second operating frequency may be increased by 10% or reduced by 10%, 20%, or 30%.
另外,可利用監視狗(watch dog)監控負載單元111的運作情況。若負載單元111因調整後的操作頻率而無法正常運作時(如當機),則重新啟動電腦系統100。在重新啟動後,控制單元410可再次調整負載單元111的操作頻率,或是改測試負載裝置110的其它功能。在本實施例中,監視狗的相關軟體係儲存在儲存單元450中,但並非用以限制本發明。In addition, the operation of the load unit 111 can be monitored using a watch dog. If the load unit 111 cannot operate normally due to the adjusted operating frequency (such as a crash), the computer system 100 is restarted. After restarting, the control unit 410 may adjust the operating frequency of the load unit 111 again, or change other functions of the load device 110. In the present embodiment, the related soft system of the watchdog is stored in the storage unit 450, but is not intended to limit the present invention.
在其它可能實施例中,儲存單元450可儲存其它測試負載裝置110的測試軟體。控制單元410載入儲存單元450所儲存的資料,測試負載裝置110或是負載單元111的性能。在一可能實施例中,測試後的結果可呈現於一顯示面板之中。另外,儲存單元450亦可儲存電流測量裝置130的測量結果。In other possible embodiments, the storage unit 450 can store test software of other test load devices 110. The control unit 410 loads the data stored in the storage unit 450 and tests the performance of the load device 110 or the load unit 111. In a possible embodiment, the results of the test can be presented in a display panel. In addition, the storage unit 450 can also store the measurement result of the current measuring device 130.
在本實施例中,處理裝置150更包括溫度測量單元430。在一可能實施例中,溫度測量單元430係為一熱電二極體(thermo diode),用以測量負載裝置110、負載單元111、或是電腦系統100的環境溫度。測量後溫度結果可顯示於一顯示面板之中。因此,使用者便可得知,流經負載單元111的電流量與溫度之間的關聯。本發明並不限制溫度測量單元430的設置位置。在其它可能實施例中,溫度測量單元430可整合於負載裝置110或電流測量裝置130之中。In the embodiment, the processing device 150 further includes a temperature measuring unit 430. In a possible embodiment, the temperature measuring unit 430 is a thermo diode for measuring the ambient temperature of the load device 110, the load unit 111, or the computer system 100. The measured temperature results can be displayed in a display panel. Therefore, the user can know the correlation between the amount of current flowing through the load unit 111 and the temperature. The present invention does not limit the set position of the temperature measuring unit 430. In other possible embodiments, the temperature measuring unit 430 can be integrated into the load device 110 or the current measuring device 130.
在另一可能實施例中,處理裝置150內的儲存單元450、溫度測量單元430以及顯示電路470並非必要。根據控制單元410所執行的特定動作,選擇性地設計處理裝置150內的元件。In another possible embodiment, the storage unit 450, the temperature measuring unit 430, and the display circuit 470 within the processing device 150 are not necessary. The components within processing device 150 are selectively designed in accordance with the particular actions performed by control unit 410.
另外,儲存單元450、溫度測量單元430以及顯示電路470並非一定要設計在處理裝置150之內。在其它實施例中,可選擇性地將儲存單元450、溫度測量單元430或/及顯示電路470設計在負載裝置110或是電流測量裝置130之中。In addition, the storage unit 450, the temperature measuring unit 430, and the display circuit 470 are not necessarily designed to be within the processing device 150. In other embodiments, the storage unit 450, the temperature measuring unit 430, or/and the display circuit 470 can be selectively designed in the load device 110 or the current measuring device 130.
第5A圖為本發明之電流測量裝置之另一可能實施例。在本實施例中,電流測量裝置530可測量負載單元111及112的電流量,其中負載單元112可為另一負載裝置的元件或是負載裝置110的另一元件。Figure 5A is another possible embodiment of the current measuring device of the present invention. In the present embodiment, the current measuring device 530 can measure the amount of current of the load units 111 and 112, wherein the load unit 112 can be an element of another load device or another component of the load device 110.
在本實施例中,阻抗單元531a及531b分別由電阻R1及R2所構成。在一可能實施例中,電阻R1的阻抗係大於、小於或等於電阻R2的阻抗。由於第5A圖的動作原理與第2圖相同,故不再述贅。In the present embodiment, the impedance units 531a and 531b are composed of resistors R1 and R2, respectively. In a possible embodiment, the impedance of the resistor R1 is greater than, less than or equal to the impedance of the resistor R2. Since the principle of operation of Fig. 5A is the same as that of Fig. 2, it will not be described.
在測量模式下,開關537a及537b分別將節點ND1及ND2的電壓傳送至偵測單元533a及533b。在非測量模式下,開關537a及537b停止傳送節點ND1及ND2的電壓。此時,負載單元111及112可能接收輸入電壓VIN1 。在另一可能實施例中,負載單元111及112接收不同的輸入電壓。In the measurement mode, switches 537a and 537b transmit the voltages of nodes ND1 and ND2 to detection units 533a and 533b, respectively. In the non-measurement mode, switches 537a and 537b stop transmitting voltages of nodes ND1 and ND2. At this time, the load units 111 and 112 may receive the input voltage V IN1 . In another possible embodiment, load units 111 and 112 receive different input voltages.
第5B圖為本發明之電流測量裝置之另一可能實施例。第5B圖相似第5A圖,不同之處在於,第5B圖具有切換單元539。切換單元539根據處理單元535所產生的控制信號SC1 及SC2 ,選擇性地將偵測信號SDEC1 及SDEC2 傳送至處理單元535。在一可能實施例中,處理單元535可利用USB或是I2C匯流排,輸出處理後的結果。Figure 5B is another possible embodiment of the current measuring device of the present invention. Fig. 5B is similar to Fig. 5A except that Fig. 5B has a switching unit 539. The switching unit 539 selectively transmits the detection signals S DEC1 and S DEC2 to the processing unit 535 according to the control signals S C1 and S C2 generated by the processing unit 535. In a possible embodiment, the processing unit 535 can output the processed result by using a USB or an I2C bus.
在一可能實施例中,處理單元535係為一微控制器(micro-controller),具有許多轉換功能。舉例而言,處理單元535不但可將類比信號轉換成數位信號的功能,更具有將電壓位準轉換成一相對應的電流位準的功能。In one possible embodiment, processing unit 535 is a micro-controller with many conversion functions. For example, the processing unit 535 not only can convert the analog signal into a function of a digital signal, but also has the function of converting the voltage level into a corresponding current level.
在另一可能實施例中,處理單元535可為繪圖處理器(GPU)。假設,負載單元111為繪圖處理器時,則繪圖處理器可根據偵測信號SDEC1 ,求得流經本身的電流量。另外,處理單元535可利用通用型之輸入輸出(General Purpose I/O)端,輸出控制信號SC1 及SC2 。在本實施例中,輸出控制信號SC1 的通用型之輸入輸出端稱為第一通用型之輸入輸出端。輸出控制信號SC2 的通用型之輸入輸出端稱為第二通用型之輸入輸出端。In another possible embodiment, processing unit 535 can be a graphics processing unit (GPU). Assuming that the load unit 111 is a graphics processor, the graphics processor can determine the amount of current flowing through itself according to the detection signal S DEC1 . In addition, the processing unit 535 can output control signals S C1 and S C2 using a general-purpose input/output (General Purpose I/O) terminal. In the present embodiment, the general-purpose input and output terminal that outputs the control signal S C1 is referred to as the input and output terminal of the first general-purpose type. The general-purpose input and output terminal of the output control signal S C2 is referred to as the input and output terminal of the second general-purpose type.
藉由本發明之電流測量裝置,可在不改變負載單元與其它元件原本的連接關係的情況下,測量出流經負載單元的電流量。因此,可大幅降低除錯時間。另外,藉由儲存裝置記錄流經負載單元的電流量,並透過顯示面板顯示流經負載單元的電流量,便可使測試人員更加了解負載單元的性能。With the current measuring device of the present invention, the amount of current flowing through the load cell can be measured without changing the original connection relationship between the load cell and other components. Therefore, the debugging time can be greatly reduced. In addition, the amount of current flowing through the load unit is recorded by the storage device, and the amount of current flowing through the load unit is displayed through the display panel, so that the tester can better understand the performance of the load unit.
當處理裝置150的控制單元410載入儲存單元450所儲存的資料時,便可利用所載入的資料,長時間監控流經負載單元的電流變化。因而提供工程作分析,並評估負載單元是否異常。若本發明應用於工廠端,則在出貨前,先將異常的負載單元攔下,以提高出貨的良率。When the control unit 410 of the processing device 150 loads the data stored in the storage unit 450, the loaded data can be used to monitor the current change through the load unit for a long time. Engineering is therefore provided for analysis and an assessment of whether the load cell is abnormal. If the invention is applied to the factory side, then Before shipment, the abnormal load unit is stopped to improve the shipment yield.
另外,可藉由儲存單元450所儲存的應用程式,自動地調整負載單元的操作頻率。因此,負載單元便可操作在最佳頻率。若在調整操作頻率後,發生當機的情形,則可自動地重新啟動電腦系統。因此,工程人員不需隨時監控電腦系統的狀態,進而提高工作效率。In addition, the operating frequency of the load unit can be automatically adjusted by the application stored in the storage unit 450. Therefore, the load unit can operate at the optimum frequency. If the situation of the crash occurs after adjusting the operating frequency, the computer system can be automatically restarted. Therefore, engineers do not need to monitor the state of the computer system at any time, thereby improving work efficiency.
雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.
100‧‧‧電腦系統100‧‧‧ computer system
110‧‧‧負載裝置110‧‧‧Loading device
111、112‧‧‧負載單元111, 112‧‧‧ load cell
150‧‧‧處理裝置150‧‧‧Processing device
130‧‧‧電流測量裝置130‧‧‧ Current measuring device
410‧‧‧控制單元410‧‧‧Control unit
430‧‧‧溫度測量單元430‧‧‧Temperature measuring unit
450‧‧‧儲存單元450‧‧‧ storage unit
470‧‧‧顯示電路470‧‧‧ display circuit
310‧‧‧差動放大器310‧‧‧Differential Amplifier
171、172、191、192‧‧‧傳輸介面171, 172, 191, 192‧‧ transmission interface
210、531a、531b‧‧‧阻抗單元210, 531a, 531b‧‧‧ impedance unit
230、533a、533b‧‧‧偵測單元230, 533a, 533b‧‧‧ detection unit
250、535‧‧‧處理單元250, 535‧ ‧ processing unit
270、537a、537b‧‧‧開關270, 537a, 537b‧‧ ‧ switch
330‧‧‧類比數位轉換器330‧‧‧ Analog Digital Converter
第1圖係為本發明之電腦系統之示意圖。Figure 1 is a schematic illustration of a computer system of the present invention.
第2圖為本發明之電流測量裝置之一可能實施例。Figure 2 is a possible embodiment of the current measuring device of the present invention.
第3A圖為偵測單元之一可能實施例。Figure 3A is a possible embodiment of one of the detection units.
第3B圖為偵測單元之另一可能實施例。Figure 3B is another possible embodiment of the detection unit.
第4圖為本發明之處理裝置之一可能實施例。Figure 4 is a possible embodiment of a processing apparatus of the present invention.
第5A及5B圖為本發明之電流測量裝置之其它可能實施例。5A and 5B are other possible embodiments of the current measuring device of the present invention.
100...電腦系統100. . . computer system
110...負載裝置110. . . Load device
111...負載單元111. . . Load unit
130...電流測量裝置130. . . Current measuring device
150...處理裝置150. . . Processing device
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| TW201423409A (en) | 2012-12-06 | 2014-06-16 | Hon Hai Prec Ind Co Ltd | Management device for managing multiple control cards and management system and control card using the management device |
| EP3513207A4 (en) | 2016-09-16 | 2020-05-20 | Xcerra Corporation | Testing system and method |
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| TW200837372A (en) * | 2007-03-12 | 2008-09-16 | Hon Hai Prec Ind Co Ltd | Motherboard test circuit |
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| CN101470155B (en) * | 2007-12-27 | 2011-05-04 | 宏达国际电子股份有限公司 | current measuring device |
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| US5386188A (en) * | 1993-01-15 | 1995-01-31 | Keithley Instruments, Inc. | In-circuit current measurement |
| US5804979A (en) * | 1997-05-13 | 1998-09-08 | Fluke Corporation | Circuit for measuring in-circuit resistance and current |
| TWI251675B (en) * | 2004-11-02 | 2006-03-21 | Giga Byte Tech Co Ltd | Methodology and apparatus for detecting current |
| TWI290217B (en) * | 2005-01-24 | 2007-11-21 | Yan-De Guan | Power and temperature measuring method and device with high-end display card |
| TW200837372A (en) * | 2007-03-12 | 2008-09-16 | Hon Hai Prec Ind Co Ltd | Motherboard test circuit |
| US20090058435A1 (en) * | 2007-08-27 | 2009-03-05 | Fujitsu Limited | High-sensitive resistance measuring device and monitoring method of solder bump |
| US20090121729A1 (en) * | 2007-11-12 | 2009-05-14 | Sandor Farkas | System and Method for Current Measurement |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201043970A (en) | 2010-12-16 |
| CN102004686A (en) | 2011-04-06 |
| CN102004686B (en) | 2013-03-27 |
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