TWI892071B - Control circuit and semiconductor memory device - Google Patents
Control circuit and semiconductor memory deviceInfo
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Abstract
Description
本發明關於控制電路以及半導體記憶裝置。 The present invention relates to a control circuit and a semiconductor memory device.
動態隨機存取記憶體(Dynamic Random Access Memory,DRAM)設有延遲鎖相迴路(Delay Locked Loop,DLL)電路作為相位同步電路。DRAM使用DLL電路產生用來輸出資料訊號的內部時脈訊號,並與從外部輸入的輸入時脈訊號同步,例如專利文獻:US 20120194241 A1。 Dynamic random access memory (DRAM) features a delay-locked loop (DLL) circuit as a phase synchronization circuit. DRAM uses the DLL circuit to generate an internal clock signal for outputting data signals, which is synchronized with an external input clock signal. For example, see patent document US 20120194241 A1.
當使用DLL電路進行內部時脈訊號延遲調整時,會執行包含N值的檢測操作程序,N值表示DLL電路的重設操作、DLL電路的延遲操作(讓每1條延遲線活化,同時讓外部時脈與內部時脈同步的操作)、輸入時脈訊號以及內部時脈訊號之間的延遲時脈週期數。此處,DLL電路的延遲操作造成的鎖定時間Tdll,可以用以下的算式來表示。 When using a DLL circuit to adjust the internal clock signal delay, a detection process involving the N value is performed. The N value represents the DLL circuit's reset operation, the DLL circuit's delay operation (activating each delay line and synchronizing the external clock with the internal clock), and the number of clock cycles of delay between the input clock signal and the internal clock signal. The lockup time Tdll caused by the DLL circuit's delay operation can be expressed using the following formula.
Tint+Tdll=N×tCK Tint+Tdll=N×tCK
以上算式中,Tint表示DLL電路當中的既有延遲時間,tCK表示時脈週期。舉例來說,當半導體記憶裝置內的溫度等 造成時脈週期(tCK)比既有延遲時間(Tint)還要長時,如以上算式所示,DLL電路的延遲操作造成的鎖定時間(Tdll)也會拉長。若鎖定時間拉長,上述的程序整體的執行時間就會變長,下一個程序的執行就有延遲之虞。特別是,若延遲一旦拉長,就有可能超過事前設定的程序的執行期間(tDLLK)。另外,為了因應半導體積體電路的高速化,程序中的延遲操作盡可能高速化為佳,但其構成相當複雜,因此希望以更簡易的構成為佳。 In the above formula, Tint represents the inherent delay time within the DLL circuit, and tCK represents the clock cycle. For example, if the clock cycle (tCK) exceeds the inherent delay time (Tint) due to factors such as the temperature within the semiconductor memory device, the lockup time (Tdll) caused by the DLL circuit's delay will also increase, as shown in the above formula. If the lockup time increases, the overall execution time of the aforementioned program will increase, potentially delaying the execution of the next program. In particular, if the delay is extended, it may exceed the pre-set program execution period (tDLLK). Furthermore, to accommodate the increasing speed of semiconductor integrated circuits, it is desirable to make the delay operations in the program as fast as possible. However, this is quite complex, so a simpler structure is desirable.
本發明的控制電路,包含:延遲控制單元,基於輸入時脈訊號與輸出時脈訊號之間的相位差,延遲該輸入時脈訊號,並產生該輸出時脈訊號;其中,該控制電路更包含時脈控制單元;其中,當該相位差在第1既定量以上時,該時脈控制單元將對該輸入時脈訊號的相位延遲第2既定量的時脈訊號,輸入至該延遲電路,作為該輸入時脈訊號。 The control circuit of the present invention includes a delay control unit that delays the input clock signal based on the phase difference between the input clock signal and the output clock signal to generate the output clock signal. The control circuit further includes a clock control unit. When the phase difference exceeds a first predetermined value, the clock control unit delays the phase of the input clock signal by a second predetermined value and inputs the clock signal to the delay circuit as the input clock signal.
根據本發明的控制電路、半導體記憶裝置以及半導體記憶裝置的控制方法,能夠具有簡易的構成,並且能夠抑制延遲操作的延長。 The control circuit, semiconductor memory device, and semiconductor memory device control method of the present invention can have a simple structure and can suppress the extension of delayed operation.
1,1A:DLL電路 1,1A: DLL circuit
10,10A:延遲控制單元 10,10A: Delay control unit
11,11A:輸入緩衝器 11,11A: Input buffer
12,12A:相位檢測單元 12,12A: Phase detection unit
13,13A:DLL控制單元 13,13A:DLL control unit
14,14A:延遲電路 14,14A: Delay circuit
15,15A:複製單元 15,15A: Copy Unit
16,16A:輸出緩衝器 16,16A: Output buffer
17:時脈控制單元 17: Clock control unit
71~74:正反器電路 71~74: Flip-flop circuit
75:AND電路 75: AND circuit
76:正反器電路 76: Flip-flop circuit
77:多工器 77: Multiplexer
111:放大器 111: Amplifier
112:放大器 112: Amplifier
113:反相器 113: Inverter
121:D正反器電路 121:D Flip-flop Circuit
171:時序訊號產生單元 171: Timing signal generation unit
172:選擇訊號產生單元 172: Select the signal generating unit
173:內部時脈選擇單元 173: Internal clock selection unit
CK,CLKC,CLKT:時脈訊號 CK, CLKC, CLKT: Clock signals
clk000:第1時脈訊號 clk000: 1st clock signal
clk180:第2時脈訊號 clk180: Second clock signal
DQS:輸出訊號 DQS: output signal
dll_clk:延遲訊號(輸出時脈訊號) dll_clk: Delay signal (output clock signal)
dll_code:控制訊號 dll_code: Control signal
dll_reset_n:重設訊號 dll_reset_n: Reset signal
fb_clk:回授訊號 fb_clk: feedback signal
in_clk:輸入時脈訊號 in_clk: input clock signal
ref_clk:參考時脈訊號 ref_clk: reference clock signal
sel_clk:時序訊號 sel_clk: timing signal
sel180:選擇訊號 sel180: Select signal
t1~t5,t11~t15,t21~t23,t31~t36,t41~t44:時間 t1~t5,t11~t15,t21~t23,t31~t36,t41~t44: Time
tCK:時脈週期 tCK: clock cycle
tDLLK:執行期間 tDLLK: During execution
Tdll:鎖定時間 Tdll: lock time
Tint:既有延遲時間 Tint: Both delay time
up/down:相位訊號 up/down: phase signal
第1圖為本發明實施例的控制電路的方塊示意圖。 Figure 1 is a block diagram of the control circuit of an embodiment of the present invention.
第2圖(1)為輸入緩衝器的構成的示意圖;第2圖(2)為相位檢測單元 的構成的示意圖。 Figure 2 (1) is a schematic diagram of the input buffer structure; Figure 2 (2) is a schematic diagram of the phase detection unit structure.
第3圖為時脈控制單元的構成的示意圖。 Figure 3 is a schematic diagram of the clock control unit.
第4圖(1)為習知例的控制電路構成例的示意圖;第4圖(2)為習知例的控制電路內的輸入時脈訊號與延遲時間之間的關係時序示意圖。 Figure 4 (1) is a schematic diagram of a control circuit configuration example of a known example; Figure 4 (2) is a timing diagram of the relationship between the input clock signal and the delay time in the control circuit of the known example.
第5圖(1)為相位差在180度以上時,輸入時脈訊號與延遲時間之間的關係時序示意圖;第5圖(2)為相位差未滿180度時,輸入時脈訊號與延遲時間之間的關係時序示意圖。 Figure 5 (1) is a timing diagram showing the relationship between the input clock signal and the delay time when the phase difference is greater than 180 degrees; Figure 5 (2) is a timing diagram showing the relationship between the input clock signal and the delay time when the phase difference is less than 180 degrees.
第6圖(1)、(2)為本程序與習知程序的各狀態示意圖。 Figure 6 (1) and (2) are schematic diagrams of the various states of this program and the learning program.
第7圖為相位差在180度以上時,控制電路內的各單元訊號電壓的推移時序示意圖。 Figure 7 shows the timing diagram of the signal voltage transitions within each unit of the control circuit when the phase difference is greater than 180 degrees.
第8圖為相位差未滿180度時,控制電路內的各單元訊號電壓的推移時序示意圖。 Figure 8 shows the timing diagram of the signal voltage transitions of each unit in the control circuit when the phase difference is less than 180 degrees.
第9圖為輸入緩衝器的其他構成的方塊示意圖。 Figure 9 is a block diagram showing other components of the input buffer.
第1圖示意本發明實施例的DLL電路1(控制電路)。本實施例中,控制電路設置於DRAM等半導體記憶裝置。為簡略說明,並未示意DRAM等半導體記憶裝置當中設置的習知構成(例如,N值檢測單元、潛時控制單元、指令解碼器、記憶單元陣列、輸入輸出用的介面單元等)。 Figure 1 illustrates a DLL circuit 1 (control circuit) according to an embodiment of the present invention. In this embodiment, the control circuit is provided in a semiconductor memory device such as a DRAM. For simplicity, the components of the DRAM or other semiconductor memory device (e.g., N-value detection unit, latent control unit, instruction decoder, memory cell array, input/output interface unit, etc.) are not shown.
DLL電路1包含:輸入緩衝器11、相位檢測單元12、DLL控制單元13、延遲電路14、複製單元15、輸出緩衝器16、時脈 控制單元17。相位檢測單元12、DLL控制單元13、延遲電路14、複製單元15構成延遲控制單元10。當程序開始時,DLL電路1首先進行重設操作,將DLL電路1的延遲電路14重設至初始狀態,然後進行延遲操作,由延遲電路14延遲輸入時脈訊號,並產生期望的輸出時脈訊號。意即,以本實施例的程序控制來說,包含了由此順序進行的重設操作以及延遲操作。 DLL circuit 1 includes an input buffer 11, a phase detection unit 12, a DLL control unit 13, a delay circuit 14, a replica unit 15, an output buffer 16, and a clock control unit 17. The phase detection unit 12, DLL control unit 13, delay circuit 14, and replica unit 15 constitute the delay control unit 10. When the program starts, DLL circuit 1 first performs a reset operation, resetting its delay circuit 14 to its initial state. It then performs a delay operation, delaying the input clock signal and generating the desired output clock signal. In other words, the program control of this embodiment includes the reset and delay operations performed in this order.
輸入緩衝器11、緩衝輸入至輸入緩衝器11的時脈訊號CLKT與時脈訊號CLKC、產生具有與時脈訊號CLKT相同相位的第1時脈訊號clk000以及具有與時脈訊號CLKC相同相位的第2時脈訊號clk180。具體而言,如第2圖(1)所示,輸入緩衝器11包含放大器111。作為外部時脈訊號且互補的兩個時脈訊號CLKT與時脈訊號CLKC輸入至放大器111。輸入的時脈訊號CLKT與時脈訊號CLKC於放大器111放大,產生第1時脈訊號clk000與第2時脈訊號clk180。第2時脈訊號clk180是將第1時脈訊號clk000反轉而產生的時脈訊號。 The input buffer 11 buffers the clock signal CLKT and the clock signal CLKC input to the input buffer 11, and generates a first clock signal clk000 having the same phase as the clock signal CLKT and a second clock signal clk180 having the same phase as the clock signal CLKC. Specifically, as shown in FIG. 2 (1), the input buffer 11 includes an amplifier 111. The two clock signals CLKT and CLKC, which are complementary to each other and serve as external clock signals, are input to the amplifier 111. The input clock signal CLKT and the clock signal CLKC are amplified by the amplifier 111 to generate the first clock signal clk000 and the second clock signal clk180. The second clock signal, clk180, is generated by inverting the first clock signal, clk000.
回到第1圖,產生的第1時脈訊號clk000與第2時脈訊號clk180輸入至時脈控制單元17,且第1時脈訊號clk000亦輸入至相位檢測單元12作為參考時脈訊號ref_clk。 Returning to Figure 1, the generated first clock signal clk000 and second clock signal clk180 are input to the clock control unit 17, and the first clock signal clk000 is also input to the phase detection unit 12 as the reference clock signal ref_clk.
從相位檢測單元12輸出的相位訊號up/down與重設訊號dll_reset_n輸入至時脈控制單元17。重設訊號dll_reset_n於高位準時,示意重設操作已經結束。時脈控制單元17基於相位訊號up/down,將第1時脈訊號clk000與第2時脈訊號clk180任一者 作為輸入時脈訊號in_clk並輸出,該輸入時脈訊號in_clk輸入至延遲電路14。 The phase signal up/down and reset signal dll_reset_n output from phase detection unit 12 are input to clock control unit 17. When reset signal dll_reset_n is high, it indicates the completion of the reset operation. Based on the phase signal up/down, clock control unit 17 outputs either the first clock signal clk000 or the second clock signal clk180 as the input clock signal in_clk. This input clock signal in_clk is then fed into delay circuit 14.
延遲電路14基於DLL控制單元13設定的延遲量產生延遲訊號(輸出時脈訊號)dll_clk,並將延遲訊號dll_clk傳送至輸出緩衝器16與複製單元15,延遲訊號dll_clk是透過延遲從時脈控制單元17輸入的輸入時脈訊號in_clk而得。輸入至輸出緩衝器16的延遲訊號dll_clk於輸出緩衝器16內進行緩衝,作為輸出訊號DQS並輸出。複製單元15將延遲電路14產生的延遲訊號dll_clk作為回授訊號fb_clk並輸出。回授訊號fb_clk輸入至相位檢測單元12。 Delay circuit 14 generates a delayed signal (output clock signal) dll_clk based on the delay amount set by DLL control unit 13 and transmits this signal to output buffer 16 and replica unit 15. This signal is derived by delaying the input clock signal in_clk from clock control unit 17. The delayed signal dll_clk input to output buffer 16 is buffered within output buffer 16 and output as the output signal DQS. Replica unit 15 outputs the delayed signal dll_clk generated by delay circuit 14 as the feedback signal fb_clk. The feedback signal fb_clk is input to the phase detection unit 12.
參考時脈訊號ref_clk與回授訊號fb_clk輸入至相位檢測單元12。相位檢測單元12產生相位訊號up/down,並輸入至DLL控制單元13,相位訊號up/down示意回授訊號fb_clk的相位是領先(延遲未滿180度)或落後(延遲在180度以上)參考時脈訊號ref_clk。 The reference clock signal ref_clk and the feedback signal fb_clk are input to the phase detection unit 12. The phase detection unit 12 generates a phase signal up/down and inputs it to the DLL control unit 13. The phase signal up/down indicates whether the phase of the feedback signal fb_clk leads (delayed by less than 180 degrees) or lags (delayed by more than 180 degrees) the reference clock signal ref_clk.
具體而言,相位檢測單元12如第2圖(2)所示,由D正反器電路121構成。回授訊號fb_clk作為輸入訊號輸入至D正反器電路121,參考時脈訊號ref_clk作為時脈訊號輸入至D正反器電路121,另外,D正反器電路121輸出相位訊號up/down作為輸出訊號。回授訊號fb_clk對參考時脈訊號ref_clk延遲未滿180度時,產生的相位訊號up/down為高位準(up);回授訊號fb_clk對參考時脈訊號ref_clk延遲在180度以上時,產生的相位訊號up/down為低位 準(down)。 Specifically, the phase detection unit 12 is shown in FIG2 (2) and is composed of a D flip-flop circuit 121. The feedback signal fb_clk is input as an input signal to the D flip-flop circuit 121, and the reference clock signal ref_clk is input as a clock signal to the D flip-flop circuit 121. In addition, the D flip-flop circuit 121 outputs a phase signal up/down as an output signal. When the feedback signal fb_clk is delayed by less than 180 degrees relative to the reference clock signal ref_clk, the generated phase signal up/down is high (up); when the feedback signal fb_clk is delayed by more than 180 degrees relative to the reference clock signal ref_clk, the generated phase signal up/down is low (down).
回到第1圖,DLL控制單元13從相位檢測單元12檢測的相位差決定延遲量。具體說明,DLL控制單元13根據來自於相位檢測單元12的相位訊號up/down,產生由複數個位元構成的控制訊號dll_code並輸出,作為延遲操作當中的延遲量。該輸出的控制訊號dll_code輸入至延遲電路14。 Returning to Figure 1, the DLL control unit 13 determines the delay amount based on the phase difference detected by the phase detection unit 12. Specifically, the DLL control unit 13 generates and outputs a control signal dll_code consisting of multiple bits based on the up/down phase signal from the phase detection unit 12 as the delay amount during the delay operation. This output control signal dll_code is input to the delay circuit 14.
延遲電路14為進行延遲操作的可變延遲單元。具體說明,延遲電路14根據控制訊號dll_code活化延遲線,藉以延遲輸入訊號in_clk並產生延遲訊號dll_clk。 The delay circuit 14 is a variable delay unit that performs a delay operation. Specifically, the delay circuit 14 activates the delay line according to the control signal dll_code, thereby delaying the input signal in_clk and generating the delay signal dll_clk.
另外,DLL控制單元13基於相位訊號up/down,當判斷輸入訊號in_clk與延遲訊號dll_clk對應的回授訊號fb_clk收斂至既定的範圍時,判別延遲操作已經結束。藉此,延遲操作結束。 In addition, based on the phase signal up/down, the DLL control unit 13 determines that the delay operation has ended when it determines that the input signal in_clk and the feedback signal fb_clk corresponding to the delay signal dll_clk converge to a predetermined range. Thus, the delay operation ends.
本實施例的DLL電路1中,延遲控制單元10基於輸入時脈訊號in_clk與從延遲訊號dll_clk複製而得的回授訊號fb_clk,來產生延遲輸入時脈訊號in_clk的延遲訊號dll_clk。以下說明時脈控制單元17,時脈控制單元17控制輸入至該延遲控制單元10的輸入時脈訊號in_clk。 In the DLL circuit 1 of this embodiment, the delay control unit 10 generates a delay signal dll_clk that delays the input clock signal in_clk based on the input clock signal in_clk and the feedback signal fb_clk copied from the delay signal dll_clk. The clock control unit 17 is described below. The clock control unit 17 controls the input clock signal in_clk to the delay control unit 10.
相位訊號up/down、重設訊號dll_reset_n、第1時脈訊號clk000以及第2時脈訊號clk180輸入至時脈控制單元17。時脈控制單元17選擇第1時脈訊號clk000以及第2時脈訊號clk180任一者作為輸入時脈訊號in_clk,將輸入時脈訊號in_clk輸入至延遲電路14。延遲操作前,時脈控制單元17選擇第1時脈訊號clk000作 為輸入時脈訊號in_clk。延遲操作開始後,時脈控制單元17根據相位訊號up/down,選擇第1時脈訊號clk000以及第2時脈訊號clk180任一者作為輸入時脈訊號in_clk。 The phase signal up/down, reset signal dll_reset_n, first clock signal clk000, and second clock signal clk180 are input to clock control unit 17. Clock control unit 17 selects either first clock signal clk000 or second clock signal clk180 as input clock signal in_clk and inputs this input clock signal in_clk to delay circuit 14. Before the delay operation, clock control unit 17 selects first clock signal clk000 as input clock signal in_clk. After the delay operation begins, the clock control unit 17 selects either the first clock signal clk000 or the second clock signal clk180 as the input clock signal in_clk based on the phase signal up/down.
使用第3圖說明時脈控制單元17的詳細構成。時脈控制單元17包含:時序訊號產生單元171、選擇訊號產生單元172、內部時脈選擇單元173。 Figure 3 illustrates the detailed structure of the clock control unit 17. The clock control unit 17 includes a timing signal generating unit 171, a selection signal generating unit 172, and an internal clock selection unit 173.
時序訊號產生單元171於延遲操作開始後經過既定期間時,產生示意經過既定期間的時序之時序訊號sel_clk,並輸入至選擇訊號產生單元172。該既定期間是在重設操作後進行時脈的選擇時,於DLL電路1安定之後進行時脈的選擇。 When a predetermined period of time has passed since the start of the delay operation, the timing signal generation unit 171 generates a timing signal sel_clk indicating that the predetermined period of time has passed, and inputs the signal to the selection signal generation unit 172. This predetermined period of time is used when selecting the clock after the reset operation, and the clock selection is performed after the DLL circuit 1 has stabilized.
當時序訊號sel_clk示意經過既定期間的時序時,選擇訊號產生單元172判斷延遲控制單元10的輸入時脈訊號(參考時脈訊號ref_clk)與輸出時脈訊號(回授訊號fb_clk)之間的相位差是否在180度以上,並產生示意判斷結果的選擇訊號sel180,輸入至內部時脈選擇單元173。此處,針對延遲控制單元10的輸入時脈訊號與輸出時脈訊號之間的相位差是否在180度以上的判斷,是使用相位訊號up/down。如上所述,當回授訊號fb_clk(與延遲控制單元10的輸出時脈訊號同相位)對參考時脈訊號ref_clk(與延遲控制單元10的輸入時脈訊號同相位)的延遲未滿180時,相位訊號up/down為高位準(up);而當延遲在180度以上時,相位訊號up/down為低位準(down),因此能夠使用該相位訊號up/down來簡易地進行判斷。換言之,當時序訊號sel_clk示意經過既定期間的時 序時,選擇訊號產生單元172判斷相位訊號up/down是否在180度以上,並產生示意判斷結果的選擇訊號sel180,輸入至內部時脈選擇單元173。內部時脈選擇單元173基於該選擇訊號sel180示意的判斷結果,選擇第1時脈訊號clk000以及第2時脈訊號clk180任一者作為輸入時脈訊號in_clk,並且將輸入時脈訊號in_clk輸出。 When the timing signal sel_clk indicates that the predetermined time has elapsed, the selection signal generation unit 172 determines whether the phase difference between the input clock signal (reference clock signal ref_clk) and the output clock signal (feedback signal fb_clk) of the delay control unit 10 is greater than 180 degrees. The selection signal sel180 indicating the determination result is then input to the internal clock selection unit 173. The phase signal up/down is used to determine whether the phase difference between the input clock signal and the output clock signal of the delay control unit 10 is greater than 180 degrees. As described above, when the delay of the feedback signal fb_clk (in phase with the output clock signal of the delay control unit 10) relative to the reference clock signal ref_clk (in phase with the input clock signal of the delay control unit 10) is less than 180 degrees, the phase signal up/down is high (up). When the delay is greater than 180 degrees, the phase signal up/down is low (down). Therefore, this phase signal up/down can be used to easily make judgments. In other words, when the timing signal sel_clk indicates that a predetermined period of time has elapsed, the selection signal generation unit 172 determines whether the phase signal up/down is greater than 180 degrees and generates a selection signal sel180 indicating the judgment result, which is input to the internal clock selection unit 173. Based on the judgment result indicated by the selection signal sel180, the internal clock selection unit 173 selects either the first clock signal clk000 or the second clock signal clk180 as the input clock signal in_clk, and outputs the input clock signal in_clk.
進一步使用第4圖~第6圖說明時脈控制單元17。 The clock control unit 17 is further described using Figures 4 to 6.
第4圖(1)所示的習知例中,DLL電路1A與本實施例的不同點,在於不包含時脈控制單元17。DLL電路1A當中,從輸入緩衝器11A輸出的時脈訊號CK,輸入至延遲控制單元10A(相位檢測單元12A、DLL控制單元13A以及延遲電路14A),並輸出延遲訊號dll_clk。此般構成的習知例中,如第4圖(2)所示,時脈訊號CK在時間t1從低位準變為高位準;對照之下,回授訊號fb_clk經過既有延遲時間Tint,在時間t2從低位準變為高位準,由於期間t1~t2未滿時脈訊號CK的半週期,因此回授訊號fb_clk相對於時脈訊號CK的週期延遲180度以上。然後,當延遲電路14A對時脈訊號CK進行延遲操作後,在時間t5,時脈訊號CK的升緣與輸出訊號DQS的升緣一致,使得時脈訊號CK與回授訊號fb_clk(即輸出訊號DQS)同步。習知例中,當延遲操作前的回授訊號fb_clk對時脈訊號CK的延遲為時脈週期的半週期之上,也就是相位差在180度以上時,因延遲操作而必須消除的延遲量,也就是鎖定時間Tdll將會變為期間t2~t5,因此延遲操作有可能延長。 In the conventional example shown in FIG4 (1), the DLL circuit 1A differs from the present embodiment in that it does not include the clock control unit 17. In the DLL circuit 1A, the clock signal CK output from the input buffer 11A is input to the delay control unit 10A (phase detection unit 12A, DLL control unit 13A, and delay circuit 14A), which outputs the delay signal dll_clk. In the conventional example of such a configuration, as shown in FIG4 (2), the clock signal CK changes from a low level to a high level at time t1; in contrast, the feedback signal fb_clk changes from a low level to a high level at time t2 after the existing delay time Tint. Since the period t1 to t2 is less than half a cycle of the clock signal CK, the feedback signal fb_clk is delayed by more than 180 degrees relative to the cycle of the clock signal CK. Then, after the delay circuit 14A delays the clock signal CK, at time t5, the rising edge of the clock signal CK coincides with the rising edge of the output signal DQS, making the clock signal CK and the feedback signal fb_clk (i.e., the output signal DQS) synchronized. In the example above, if the delay of the feedback signal fb_clk relative to the clock signal CK before the delay operation exceeds half the clock period, meaning the phase difference exceeds 180 degrees, the delay that must be eliminated by the delay operation, namely the lock time Tdll, will become the period t2-t5. Therefore, the delay operation may be extended.
相較之下,本實施例包含時脈控制單元17,其根據 相位訊號up/down,將第1時脈訊號clk000以及第2時脈訊號clk180任一者作為輸入時脈訊號in_clk輸入至延遲電路14(延遲控制單元10),藉以抑制延遲操作的延長。首先,延遲操作前輸入至延遲控制單元10的輸入時脈訊號in_clk,由於是第1時脈訊號clk000,因此輸入時脈訊號in_clk與第1時脈訊號clk000同相位。當從延遲控制單元10輸出的延遲訊號dll_clk與同相位的回授訊號fb_clk之間的相位差在180度以上時,時脈控制單元17將第2時脈訊號clk180作為輸入時脈訊號in_clk並輸出至延遲電路14。藉此,來自於延遲電路14的輸出時脈訊號與同相位的fb_clk也都延遲180度。結果,延遲控制單元10中,是根據第2時脈訊號clk180的升緣與該延遲180度的回授訊號fb_clk的升緣之間的相位差來進行延遲操作,藉使輸入時脈訊號in_clk與回授訊號fb_clk之間的同步盡早結束,並能夠產生期望的輸出訊號DQS。 In contrast, the present embodiment includes a clock control unit 17 that, based on the phase signal up/down, inputs either the first clock signal clk000 or the second clock signal clk180 as the input clock signal in_clk to the delay circuit 14 (delay control unit 10), thereby suppressing the extension of the delay operation. First, the input clock signal in_clk input to the delay control unit 10 before the delay operation is the first clock signal clk000, so the input clock signal in_clk is in phase with the first clock signal clk000. When the phase difference between the delayed signal dll_clk output from the delay control unit 10 and the feedback signal fb_clk with the same phase is greater than 180 degrees, the clock control unit 17 uses the second clock signal clk180 as the input clock signal in_clk and outputs it to the delay circuit 14. As a result, the output clock signal from the delay circuit 14 is also delayed by 180 degrees, in phase with the same phase as fb_clk. As a result, the delay control unit 10 performs a delay operation based on the phase difference between the rising edge of the second clock signal clk180 and the rising edge of the feedback signal fb_clk, which is delayed by 180 degrees. This allows synchronization between the input clock signal in_clk and the feedback signal fb_clk to be completed as early as possible, thereby generating the desired output signal DQS.
具體說明延遲操作後的回授訊號fb_clk與輸入時脈訊號in_clk之間的相位差在180度以上時的情況。如第5圖(1)所示,輸入時脈訊號in_clk、第1時脈訊號clk000在時間t11從低位準變為高位準;對照之下,回授訊號fb_clk延遲了既有延遲時間Tint,在時間t12從低位準變為高位準。由於示意該相位差的期間t11~t12未滿時脈訊號CK的半週期,因此回授訊號fb_clk相對於輸入時脈訊號in_clk的週期延遲180度以上。此時,時脈控制單元17選擇第2時脈訊號clk180作為輸入時脈訊號in_clk。藉此,延遲控制單元10對第2時脈訊號clk180進行延遲操作,使得在時間t13的第2時脈 訊號clk180的升緣、與在時間t14的延遲180度的回授訊號fb_clk的升緣為同一時間點(第2時脈訊號clk180與回授訊號fb_clk同步)。結果,因延遲操作而必須消解的延遲量,也就是鎖定時間Tdll,將會變成期間t14~t15。 Specifically, the situation where the phase difference between the feedback signal fb_clk and the input clock signal in_clk after the delay operation is greater than 180 degrees is described. As shown in Figure 5 (1), the input clock signal in_clk and the first clock signal clk000 change from low to high at time t11; in contrast, the feedback signal fb_clk is delayed by the existing delay time Tint and changes from low to high at time t12. Since the period t11 to t12 indicating this phase difference is less than half a cycle of the clock signal CK, the feedback signal fb_clk is delayed by more than 180 degrees relative to the cycle of the input clock signal in_clk. At this point, clock control unit 17 selects second clock signal clk180 as input clock signal in_clk. Delay control unit 10 then delays second clock signal clk180 so that the rising edge of second clock signal clk180 at time t13 coincides with the rising edge of feedback signal fb_clk, which is delayed by 180 degrees at time t14 (second clock signal clk180 and feedback signal fb_clk are synchronized). As a result, the delay required to compensate for the delay, or the lock time Tdll, falls between t14 and t15.
若將其進行彙整,如第6圖(1)所示,習知例中,當延遲控制單元10當中的輸入時脈訊號與輸出時脈訊號之間的相位差在180度以上時,由於鎖定時間Tdll拉長,因此程序整體的時間也跟著拉長。相較之下,本實施例中,當延遲控制單元10當中的輸入時脈訊號與輸出時脈訊號之間的相位差在180度以上時,由於構成DLL電路1,能夠將第2輸入時脈訊號clk180當作輸入時脈訊號,因此,能夠使延遲操作盡早結束,並且能夠縮短程序整體的時間。 If we summarize it, as shown in Figure 6 (1), in the conventional example, when the phase difference between the input clock signal and the output clock signal in the delay control unit 10 is greater than 180 degrees, the lock time Tdll is prolonged, and thus the overall program time is also prolonged. In contrast, in this embodiment, when the phase difference between the input clock signal and the output clock signal in the delay control unit 10 is greater than 180 degrees, the DLL circuit 1 is formed, and the second input clock signal clk180 can be used as the input clock signal. Therefore, the delay operation can be terminated as early as possible, and the overall program time can be shortened.
另外,第5圖(2)示意當延遲操作後的回授訊號fb_clk與輸入時脈訊號in_clk之間的相位差未滿180度時的情況。該情況下,由於相位差較小,因此選擇第1時脈訊號clk000。藉此,與習知例相同,延遲電路14對clk000進行延遲操作,使得在時間t21的第1時脈訊號clk000的升緣、與在時間t22的回授訊號fb_clk的升緣一致,結果,既有延遲時間Tint為期間t21~t22,鎖定時間Tdll為期間t22~t23。像這樣進行延遲操作時,如第6圖(2)所示,也能夠在延遲未滿180度時,像習知那樣盡早進行延遲操作,而能夠保持序列整體的時間縮短的狀態。 In addition, FIG5 (2) shows the case where the phase difference between the feedback signal fb_clk after the delay operation and the input clock signal in_clk is less than 180 degrees. In this case, since the phase difference is small, the first clock signal clk000 is selected. Thus, as in the conventional example, the delay circuit 14 performs a delay operation on clk000 so that the rising edge of the first clock signal clk000 at time t21 coincides with the rising edge of the feedback signal fb_clk at time t22. As a result, the delay time Tint is the period t21 to t22, and the lock time Tdll is the period t22 to t23. When performing a delay operation in this way, as shown in Figure 6 (2), it is also possible to perform the delay operation as early as possible when the delay is less than 180 degrees, as we know, and thus keep the overall sequence time shortened.
回到第3圖,說明實現這樣的操作的時脈控制單元17的具體構成。時序訊號產生單元171包含:複數個正反器電路 71~74、AND電路75。圖中例示4個正反器電路71~74,但並不以該數量為限,可以根據電路的安定所需要的既定時間的長度,而進行適當變更。 Returning to Figure 3, the specific structure of the clock control unit 17 that implements this operation is described. The timing signal generation unit 171 includes a plurality of flip-flop circuits 71-74 and an AND circuit 75. While the figure illustrates four flip-flop circuits 71-74, this number is not limited to this number and can be adjusted appropriately based on the desired time required for circuit stabilization.
複數個正反器電路71~74串聯。從外部輸入的重設訊號dll_reset_n作為輸入訊號,輸入至最上游側的正反器電路71。鄰接的上游側的正反器電路71~73的輸出訊號,則分別作為輸入訊號,輸入至其以外的正反器電路72~74。第1時脈訊號clk000反轉後,分別作為時脈訊號輸入至複數個正反器電路71~74。另外,重設訊號dll_reset_n反轉後,分別輸入至正反器電路71~74。最下游側的正反器電路74的輸出訊號反轉後,輸入至AND電路75。另外,正反器電路74的上游側鄰接的正反器電路73的輸出,輸入至AND電路75,同時第1時脈訊號clk000亦輸入至AND電路75。AND電路75對該等輸入訊號進行AND演算,藉以輸出時序訊號sel_clk。 A plurality of flip-flop circuits 71-74 are connected in series. The externally input reset signal dll_reset_n is input to the upstream-most flip-flop circuit 71. The output signals of the adjacent upstream flip-flop circuits 71-73 are input to the subsequent flip-flop circuits 72-74. The first clock signal clk000 is inverted and input as a clock signal to each of the flip-flop circuits 71-74. Furthermore, the reset signal dll_reset_n is inverted and input to each of the flip-flop circuits 71-74. The output signal of the downstream-most flip-flop circuit 74 is inverted and input to an AND circuit 75. In addition, the output of flip-flop circuit 73, which is connected upstream of flip-flop circuit 74, is input to AND circuit 75. At the same time, the first clock signal clk000 is also input to AND circuit 75. AND circuit 75 performs an AND operation on these input signals to output the timing signal sel_clk.
說明時序訊號產生單元171的操作。當輸入的重設訊號dll_reset_n從低位準變為高位準時,該變化將透過複數個正反器電路71~74而保持既定期間,並從正反器電路74輸入至AND電路75。由於正反器電路73的輸出訊號、正反器電路74的輸出訊號、第1時脈訊號clk000輸入至AND電路75,因此當來自於正反器電路74的輸出為高位準時,AND電路75產生並輸出高位準(斷言,Assert)的時序訊號sel_clk。另外,AND電路75產生並輸出低位準的時序訊號sel_clk。藉此,時序訊號sel_clk只有在重設操作後,從延遲操作開始一直到既定的時序之間為高位準。亦即,時序訊號sel_clk 是作為單觸發(One Shot)訊號而產生的。 The operation of timing signal generation unit 171 is described below. When the input reset signal dll_reset_n changes from a low level to a high level, this change is maintained for a predetermined period through a plurality of flip-flop circuits 71-74 and then input from flip-flop circuit 74 to AND circuit 75. Because AND circuit 75 receives the output signal of flip-flop circuit 73, the output signal of flip-flop circuit 74, and the first clock signal clk000, when the output of flip-flop circuit 74 is high, AND circuit 75 generates and outputs a high-level (assert) timing signal sel_clk. Furthermore, AND circuit 75 generates and outputs a low-level timing signal sel_clk. Therefore, the timing signal sel_clk is high only after the reset operation, from the start of the delay operation until the predetermined timing. In other words, the timing signal sel_clk is generated as a one-shot signal.
選擇訊號產生單元172由正反器電路76所構成。相位訊號up/down反轉後作為輸入訊號輸入至正反器電路76,且時序訊號sel_clk作為時脈訊號輸入至正反器電路76。另外,重設訊號dll_reset_n反轉後輸入至正反器電路76。然後,正反器電路76輸出選擇訊號sel180作為輸出訊號。如上所述,由於時序訊號sel_clk是一個單觸發訊號,只有在延遲操作開始後經過既定期間時,從低位準變為高位準,因此,選擇訊號產生單元172就可以只在延遲操作開始後的既定時序,來判斷延遲是否在180度以上。 The select signal generation unit 172 is comprised of a flip-flop circuit 76. The phase signal up/down is inverted and input to the flip-flop circuit 76 as an input signal, and the timing signal sel_clk is input to the flip-flop circuit 76 as a clock signal. Furthermore, the reset signal dll_reset_n is inverted and input to the flip-flop circuit 76. The flip-flop circuit 76 then outputs the select signal sel180 as an output signal. As described above, the timing signal sel_clk is a single-trigger signal that transitions from a low level to a high level only after a predetermined period of time has elapsed since the start of the delay operation. Therefore, the select signal generation unit 172 can determine whether the delay is greater than 180 degrees only at the predetermined timing after the start of the delay operation.
說明選擇訊號產生單元172的操作。選擇訊號產生單元172中,於時序訊號sel_clk從低位準變為高位準輸入的升緣,若重設訊號dll_reset_n為高位準,且相位訊號up/down為高位準(up),則選擇訊號sel180維持低位準。該情況下,由於輸入至延遲控制單元10的輸入訊號的相位差未滿180度,因此輸出低位準的選擇訊號sel180,示意不選擇第2時脈訊號clk180。另一方面,於時序訊號sel_clk從低位準變為高位準輸入的升緣,若重設訊號dll_reset_n為高位準,且相位訊號up/down為低位準(down),則輸出高位準的選擇訊號sel180,示意選擇第2時脈訊號clk180。 The operation of the select signal generating unit 172 is described below. In the select signal generating unit 172, when the timing signal sel_clk transitions from a low level to a high level, if the reset signal dll_reset_n is high and the phase signal up/down is high (up), the select signal sel180 remains low. In this case, since the phase difference between the input signals to the delay control unit 10 is less than 180 degrees, the select signal sel180 is output at a low level, indicating that the second clock signal clk180 is not selected. On the other hand, when the timing signal sel_clk changes from a low-level input to a high-level input, if the reset signal dll_reset_n is high and the phase signal up/down is low (down), a high-level selection signal sel180 is output, indicating that the second clock signal clk180 is selected.
內部時脈選擇單元173由多工器77所構成,根據選擇訊號sel180選擇第1時脈訊號clk000以及第2時脈訊號clk180任一者作為輸入時脈訊號in_clk並輸出。亦即,當選擇訊號sel180為高位準,示意選擇第2選擇訊號clk180時,多工器77輸出第2時脈訊 號clk180;另外,多工器77輸出第1時脈訊號clk000。 Internal clock selection unit 173, comprised of multiplexer 77, selects either the first clock signal clk000 or the second clock signal clk180 as the input clock signal in_clk and outputs it based on select signal sel180. Specifically, when select signal sel180 is high, indicating the second select signal clk180 is selected, multiplexer 77 outputs the second clock signal clk180. Otherwise, multiplexer 77 outputs the first clock signal clk000.
時脈控制單元17可以用簡易的構成,來根據相位訊號up/down,將第1時脈訊號clk000以及第2時脈訊號clk180任一者設定為輸入時脈訊號in_clk,並輸入至延遲電路14。藉此,本實施例的DLL電路1能夠抑制延遲操作的延長。 The clock control unit 17 can use a simple structure to set either the first clock signal clk000 or the second clock signal clk180 as the input clock signal in_clk according to the phase signal up/down, and input it to the delay circuit 14. In this way, the DLL circuit 1 of this embodiment can suppress the extension of the delay operation.
接著,使用第7圖、第8圖示意的流程圖,說明包含時脈控制單元17的本實施例的DLL電路1的操作。 Next, the operation of the DLL circuit 1 of this embodiment including the clock control unit 17 will be described using the flowcharts shown in Figures 7 and 8.
第7圖示意回授訊號fb_clk與輸入時脈訊號in_clk之間的相位差在180度以上時的情況。最初,本程序開始,首先為DLL重設狀態。本狀態下,輸入時脈訊號in_clk為第1時脈訊號clk000,回授訊號fb_clk與輸入時脈訊號in_clk之間的相位差在180度以上。之後,DLL狀態在時間t31結束,重設訊號dll_reset_n從低位準變為高位準。對DLL電路的狀態而言,當DLL重設狀態在時間t31結束的同時,延遲操作開始。 Figure 7 illustrates what happens when the phase difference between the feedback signal fb_clk and the input clock signal in_clk exceeds 180 degrees. Initially, the process begins with the DLL reset state. In this state, the input clock signal in_clk is the first clock signal, clk000, and the phase difference between the feedback signal fb_clk and the input clock signal in_clk exceeds 180 degrees. The DLL state then ends at time t31, and the reset signal dll_reset_n transitions from low to high. Regarding the DLL circuit's state, the delay operation begins when the DLL reset state ends at time t31.
然後在時間t32,時序訊號產生單元171當中,時序訊號sel_clk經過既定期間,從低位準變為高位準。在該時間t32,重設訊號dll_reset_n為高位準,且相位訊號up/down為低位準(down)。於時序訊號sel_clk的升緣,高位準的重設訊號dll_reset_n與低位準的相位訊號up/down輸入至選擇訊號產生單元172,藉此,選擇訊號sel180從低位準變為高位準並輸出。藉此,從時脈控制單元17輸出的輸入時脈訊號in_clk變為第2時脈訊號clk180,從時間t32開始到時間t33為止,輸入訊號in_clk與第2時 脈訊號clk180同樣維持低位準。 Then, at time t32, in timing signal generation unit 171, timing signal sel_clk transitions from low to high after a predetermined period. At this time t32, reset signal dll_reset_n transitions to high, and phase signal up/down transitions to low (down). At the rising edge of timing signal sel_clk, the high reset signal dll_reset_n and the low phase signal up/down are input to select signal generation unit 172, causing select signal sel180 to transition from low to high and be output. As a result, the input clock signal in_clk output from the clock control unit 17 becomes the second clock signal clk180. From time t32 to time t33, the input signal in_clk and the second clock signal clk180 remain at the same low level.
輸入時脈訊號in_clk在時間t33根據第2時脈訊號clk180的升緣,從低位準變為高位準。另外,藉由選擇第2時脈訊號clk180作為輸入時脈訊號in_clk,回授訊號fb_clk亦延遲180度,從時間t32開始到時間t34為止維持低位準,並在時間t34從低位準變為高位準。藉由回授訊號fb_clk從低位準變為高位準,在時間t35,相位訊號up/down從低位準變為高位準。亦即,回授訊號fb_clk與輸入訊號in_clk之間的相位差將變小(未滿180度)。 At time t33, the input clock signal in_clk transitions from low to high in response to the rising edge of the second clock signal clk180. Furthermore, by selecting the second clock signal clk180 as the input clock signal in_clk, the feedback signal fb_clk is also delayed by 180 degrees, remaining low from time t32 to time t34, and transitioning from low to high at time t34. As the feedback signal fb_clk transitions from low to high, the phase signal up/down transitions from low to high at time t35. This means that the phase difference between the feedback signal fb_clk and the input signal in_clk decreases (to less than 180 degrees).
延遲電路14基於該相位訊號up/down,延遲作為第2時脈訊號clk180的輸入時脈訊號in_clk,在時間t36判斷為期望的相位差,並結束延遲操作。 Based on the phase signal up/down, the delay circuit 14 delays the input clock signal in_clk, which is the second clock signal clk180. At time t36, it is determined that the phase difference is the desired phase difference, and the delay operation ends.
接著,使用第8圖示意的流程圖,說明回授訊號fb_clk與輸入時脈訊號in_clk之間的相位差未滿180度時的DLL電路1的操作。 Next, the flow chart shown in Figure 8 will be used to explain the operation of DLL circuit 1 when the phase difference between the feedback signal fb_clk and the input clock signal in_clk is less than 180 degrees.
本程序開始時,DLL電路1的狀態為DLL重設狀態。之後,重設操作在時間t41結束,重設訊號dll_reset_n從低位準變為高位準。當重設操作在時間t41結束的同時,延遲操作於DLL電路1開始。 When this process begins, DLL circuit 1 is in the DLL reset state. The reset operation then completes at time t41, and the reset signal dll_reset_n transitions from low to high. Simultaneously with the completion of the reset operation at time t41, the delay operation begins in DLL circuit 1.
然後在時間t42,時序訊號產生單元171當中,時序訊號sel_clk從低位準變為高位準。在該時間t42,重設訊號dll_reset_n為高位準,且相位訊號up/down為up(高位準)。於時序訊號sel_clk的升緣,高位準的重設訊號dll_reset_n與高位準的相 位訊號up/down輸入至選擇訊號產生單元172,藉此,選擇訊號維持低位準。藉此,選擇第1時脈訊號clk000作為輸入時脈訊號in_clk,從時間t42開始到時間t43為止,輸入訊號in_clk與第1時脈訊號clk000同樣維持高位準。另外,由於輸入訊號in_clk為第1時脈訊號clk000,因此回授訊號fb_clk也不會延遲180度。 Then, at time t42, the timing signal sel_clk in timing signal generation unit 171 transitions from a low level to a high level. At this time, the reset signal dll_reset_n is high, and the phase signal up/down is up (high). At the rising edge of timing signal sel_clk, the high reset signal dll_reset_n and the high phase signal up/down are input to selection signal generation unit 172, thereby maintaining the selection signal at a low level. This selects the first clock signal clk000 as the input clock signal in_clk. From time t42 to time t43, input signal in_clk remains high, just like the first clock signal clk000. In addition, since the input signal in_clk is the first clock signal clk000, the feedback signal fb_clk will not be delayed by 180 degrees.
延遲電路14基於該相位訊號up/down,延遲作為第1時脈訊號clk000的輸入時脈訊號in_clk,在時間t44判斷為期望的相位差,並結束延遲操作。 Based on the phase signal up/down, the delay circuit 14 delays the input clock signal in_clk, which is the first clock signal clk000, and determines that the phase difference is the desired at time t44, thus ending the delay operation.
以下針對本發明的變形例進行說明。如第9圖所示構成輸入緩衝器11,輸入緩衝器11包含放大器112以及反相器113。具有互補關係的時脈訊號CLKT與時脈訊號CLKC作為外部時脈訊號輸入至放大器112。所輸入的彼此互補的時脈訊號CLKT與時脈訊號CLKC於放大器112放大,放大器112只輸出與時脈訊號CLKT同相的第1時脈訊號clk000。另外,該第1時脈訊號clk000輸入至反相器113,將第1時脈訊號clk000反轉,而產生第2時脈訊號clk180。上述實施例中,由於任一訊號都是從放大器111輸出,因此第1時脈訊號clk000與第2時脈訊號clk180彼此之間的cmosgate段數相同;而第9圖所示的實施例中,第1時脈訊號clk000與第2時脈訊號clk180彼此之間的cmosgate段數則相差一段。 The following describes a variation of the present invention. As shown in FIG. 9 , input buffer 11 is configured and includes amplifier 112 and inverter 113. A clock signal CLKT and a clock signal CLKC, which are complementary to each other, are input to amplifier 112 as external clock signals. Amplifier 112 amplifies the complementary clock signals CLKT and CLKC, which then output only a first clock signal clk000 that is in phase with clock signal CLKT. Furthermore, this first clock signal clk000 is input to inverter 113, which inverts the first clock signal clk000 to generate a second clock signal clk180. In the above embodiment, since both signals are output from amplifier 111, the number of CMOS gate stages between the first clock signal clk000 and the second clock signal clk180 is the same. In contrast, in the embodiment shown in FIG9 , the number of CMOS gate stages between the first clock signal clk000 and the second clock signal clk180 differs by one stage.
上述實施例是透過輸入訊號in_clk與延遲訊號dll_clk(回授訊號fb_clk)之間的相位差是否在180度以上從而變更控制的,但也可將該相位差設定為期望值。另外,雖然第2時脈訊 號clk180是對第1時脈訊號clk000延遲180度輸入時脈訊號的相位,但也可將該相位差設定為期望值。另外,半導體記憶裝置也可以是靜態隨機存取記憶體(Static Random Access Memory,SRAM)、快閃記憶體、或是其他的半導體記憶裝置。 The above embodiment controls the phase difference between the input signal in_clk and the delayed signal dll_clk (feedback signal fb_clk) by determining whether the phase difference is greater than 180 degrees. However, this phase difference can also be set to a desired value. Furthermore, although the second clock signal clk180 is a 180-degree delay from the first clock signal clk000, this phase difference can also be set to a desired value. Furthermore, the semiconductor memory device can be a static random access memory (SRAM), flash memory, or other semiconductor memory device.
上述實施例及變形例,是為了容易理解本發明而記載,並非用以限定本發明。因此,上述實施及變形例揭露的各元件,意旨在包含本發明技術領域所屬的所有設計變更或是均等物。 The above embodiments and variations are described to facilitate understanding of the present invention and are not intended to limit the present invention. Therefore, the elements disclosed in the above embodiments and variations are intended to include all design modifications or equivalents within the technical field of the present invention.
1:DLL電路 1: DLL circuit
10:延遲控制單元 10: Delay control unit
11:輸入緩衝器 11: Input buffer
12:相位檢測單元 12: Phase detection unit
13:DLL控制單元 13:DLL control unit
14:延遲電路 14: Delay circuit
15:複製單元 15: Copy Unit
16:輸出緩衝器 16: Output buffer
17:時脈控制單元 17: Clock control unit
CLKC,CLKT:時脈訊號 CLKC, CLKT: Clock signal
clk000:第1時脈訊號 clk000: 1st clock signal
clk180:第2時脈訊號 clk180: Second clock signal
DQS:輸出訊號 DQS: output signal
dll_clk:延遲訊號 dll_clk: Delay signal
dll_code:控制訊號 dll_code: Control signal
fb_clk:回授訊號 fb_clk: feedback signal
in_clk:輸入時脈訊號 in_clk: input clock signal
ref_clk:參考時脈訊號 ref_clk: reference clock signal
up/down:相位訊號 up/down: phase signal
dll_reset_n:重設訊號 dll_reset_n: Reset signal
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120194241A1 (en) * | 2011-01-31 | 2012-08-02 | Hynix Semiconductor Inc. | Synchronization circuit |
| TW201503597A (en) * | 2013-01-29 | 2015-01-16 | Ps4 Luxco Sarl | Dll circuit and semiconductor device |
| TW202001888A (en) * | 2018-06-12 | 2020-01-01 | 華邦電子股份有限公司 | Delay-locked loop circuit and selection method of unit coarse delay thereof |
| US20220006461A1 (en) * | 2020-07-02 | 2022-01-06 | Samsung Electronics Co., Ltd. | Delay circuit of delay-locked loop circuit and delay-locked loop circuit |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120194241A1 (en) * | 2011-01-31 | 2012-08-02 | Hynix Semiconductor Inc. | Synchronization circuit |
| TW201503597A (en) * | 2013-01-29 | 2015-01-16 | Ps4 Luxco Sarl | Dll circuit and semiconductor device |
| TW202001888A (en) * | 2018-06-12 | 2020-01-01 | 華邦電子股份有限公司 | Delay-locked loop circuit and selection method of unit coarse delay thereof |
| US20220006461A1 (en) * | 2020-07-02 | 2022-01-06 | Samsung Electronics Co., Ltd. | Delay circuit of delay-locked loop circuit and delay-locked loop circuit |
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