TWI860063B - Thermal conductive device and handler using the same - Google Patents
Thermal conductive device and handler using the same Download PDFInfo
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Abstract
Description
本發明係關於半導體測試之技術,尤指一種熱傳導裝置及使用該熱傳導裝置之分選機。 The present invention relates to semiconductor testing technology, particularly to a heat transfer device and a sorting machine using the heat transfer device.
一般半導體封裝件、積體電路(IC)或晶片等半導體元件於製造後,須經過許多項測試,以確保作為產品之半導體元件於使用時可正常運作。於前述之各項測試中,通常會使用分類機進行測試,其中,半導體元件之測試過程中將會產生高熱,因此,分類機需要對半導體元件進行溫度控制。 After manufacturing, semiconductor components such as semiconductor packages, integrated circuits (ICs) or chips must undergo many tests to ensure that the semiconductor components as products can operate normally when used. Among the aforementioned tests, a sorting machine is usually used for testing. During the testing process of semiconductor components, high heat will be generated. Therefore, the sorting machine needs to control the temperature of the semiconductor components.
具體而言,分類機可包括用於承載待測半導體元件之承載單元、設於該承載單元上方之驅動單元以及設於該驅動單元下方之熱傳導單元,其中,該熱傳導單元可包含本體、嵌埋於該本體中之加熱棒以及位於該本體下且用於接觸半導體元件之熱交換件,該熱傳導單元受該驅動單元帶動而相對半導體元件移動,亦即,於進行測試時,該驅動單元移動該熱傳導單元,使該熱交換件之底面接觸待測半導體元件,以透過其本體提供散熱,另於半導體元件之運作溫度未達測試需求時,可利用加熱棒加熱進行升溫,據此,藉由該熱傳導單元提供符 合測試需求之溫度,以檢測半導體元件於運作時之效能表現,達到確認產品良劣之目的。 Specifically, the classifier may include a carrier unit for carrying the semiconductor element to be tested, a driving unit disposed above the carrier unit, and a heat transfer unit disposed below the driving unit, wherein the heat transfer unit may include a body, a heating rod embedded in the body, and a heat exchanger disposed under the body and used to contact the semiconductor element. The heat transfer unit is driven by the driving unit to move relative to the semiconductor element, that is, During the test, the drive unit moves the heat transfer unit so that the bottom surface of the heat exchanger contacts the semiconductor element to be tested, thereby providing heat dissipation through its body. When the operating temperature of the semiconductor element does not meet the test requirements, the heating rod can be used to heat it up. Thus, the heat transfer unit provides a temperature that meets the test requirements to detect the performance of the semiconductor element during operation, thereby achieving the purpose of confirming the quality of the product.
惟,習知之分類機之熱傳導單元利用本體進行降溫且透過本體中之加熱棒進行加熱,是以,於加熱過程中無法提供溫度調節之功能,可能因加熱過度而造成半導體元件損壞,雖可利用本體之降溫功能控制加熱之溫度,但可能因而抑制加熱效果,使得加熱棒須提升加熱功率,致生耗電問題,且亦將減少加熱棒之使用壽命;另外,由於熱傳導單元必須設置用以接觸半導體元件之熱交換件,是以,於透過本體提供降溫時,將無可避免地經過熱交換件進行溫度傳遞,致使提供降溫及加熱功能之本體與半導體元件之間存在相當大的間隔距離,此將影響降溫及加熱之效果。 However, the heat transfer unit of the known sorting machine uses the body for cooling and the heating rod in the body for heating. Therefore, it cannot provide the function of temperature regulation during the heating process, and may cause damage to the semiconductor components due to overheating. Although the cooling function of the body can be used to control the heating temperature, the heating effect may be suppressed, so that the heating rod needs to increase the heating power, resulting in power consumption problems and reducing the service life of the heating rod. In addition, since the heat transfer unit must be provided with a heat exchanger for contacting the semiconductor component, when providing cooling through the body, the temperature will inevitably be transferred through the heat exchanger, resulting in a considerable distance between the body that provides cooling and heating functions and the semiconductor component, which will affect the cooling and heating effects.
鑑於上述問題,如何提供一種適於提供熱傳導之結構裝置,特別是,能同時考量升溫和降溫需求,以達良好的溫度控制效果,此將成為目前本技術領域人員急欲追求之目標。 In view of the above problems, how to provide a structural device suitable for providing heat conduction, especially, how to simultaneously consider the heating and cooling requirements to achieve a good temperature control effect, will become the goal that people in this technical field are eager to pursue.
為解決上述現有技術之問題,本發明揭露一種熱傳導裝置,係接觸一工作件並提供溫度調節,該熱傳導裝置包括:裝置主體;第一流道,設於該裝置主體內;以及第二流道,設於該裝置主體內且與該第一流道互不連通,該第二流道位於該第一流道下方並接近該工作件,以適於導引一流體以對該工作件進行溫度調節。 In order to solve the above-mentioned problems of the prior art, the present invention discloses a heat transfer device that contacts a workpiece and provides temperature regulation. The heat transfer device includes: a device body; a first flow channel disposed in the device body; and a second flow channel disposed in the device body and not connected to the first flow channel. The second flow channel is located below the first flow channel and close to the workpiece, so as to guide a fluid to regulate the temperature of the workpiece.
於一實施例中,該第一流道適於導引另一流體以提供該裝置主體之溫度調節。 In one embodiment, the first flow channel is adapted to direct another fluid to provide temperature regulation of the device body.
於一實施例中,該流體及該另一流體之溫度小於該工作件之工作溫度。 In one embodiment, the temperature of the fluid and the other fluid is lower than the working temperature of the workpiece.
於一具體實施例中,該裝置主體復包括傳導本體以及位於該傳導本體下且用以接觸該工作件之熱交換本體,其中,該第一流道形成於該傳導本體內,且包含第一入水口及第一出水口以供該另一流體進出,於另一具體實施例中,該第二流道形成於該熱交換本體內或是部分形成於該傳導本體中且部分形成於該熱交換本體中,且該第二流道包含第二入水口及第二出水口以供該流體進出。 In a specific embodiment, the device body further includes a conducting body and a heat exchange body located under the conducting body and used to contact the workpiece, wherein the first flow channel is formed in the conducting body and includes a first water inlet and a first water outlet for the other fluid to enter and exit. In another specific embodiment, the second flow channel is formed in the heat exchange body or is partially formed in the conducting body and partially formed in the heat exchange body, and the second flow channel includes a second water inlet and a second water outlet for the fluid to enter and exit.
於一實施例中,該第一入水口、該第一出水口、該第二入水口以及該第二出水口實質位於同一水平面上。 In one embodiment, the first water inlet, the first water outlet, the second water inlet and the second water outlet are substantially located on the same horizontal plane.
於另一實施例中,該第二流道中形成有複數微流道。 In another embodiment, a plurality of microchannels are formed in the second flow channel.
於另一實施例中,該第二流道中設置至少一具有複數鰭片之散熱件,以於各該鰭片之間形成各該微流道。 In another embodiment, at least one heat sink having a plurality of fins is disposed in the second flow channel to form each of the micro-flow channels between each of the fins.
於另一實施例中,本發明之熱傳導裝置復包括設於該熱交換本體中之複數加熱件。 In another embodiment, the heat transfer device of the present invention further includes a plurality of heating elements disposed in the heat exchange body.
於又一實施例中,該第一流道之通道寬度大於各該微流道之通道寬度,於一具體實施例中,相鄰之各該鰭片間之間隔小於0.5毫米。 In another embodiment, the channel width of the first flow channel is greater than the channel width of each of the micro-flow channels. In a specific embodiment, the spacing between adjacent fins is less than 0.5 mm.
本發明復揭露一種分選機,係包括:測試載台,用於承載一工作件;移動裝置,係位於該測試載台上方;以及如前述實施例中任一者所述之熱傳導裝置,係設於該移動裝置下方,且受該移動裝置驅動而相對該測試載台移動。 The present invention further discloses a sorting machine, comprising: a test carrier for carrying a workpiece; a moving device located above the test carrier; and a heat transfer device as described in any of the aforementioned embodiments, which is located below the moving device and is driven by the moving device to move relative to the test carrier.
於一實施例中,該分選機連接一冷卻裝置,且由該冷卻裝置連接該第一流道及該第二流道。 In one embodiment, the sorting machine is connected to a cooling device, and the cooling device is connected to the first flow channel and the second flow channel.
於另一實施例中,該分選機連接一控制裝置,該控制裝置用於監測該熱傳導裝置之溫度變化,以依據預設之測試溫度控制該冷卻裝置而對該熱傳導裝置進行溫度調節。 In another embodiment, the sorting machine is connected to a control device, which is used to monitor the temperature change of the heat transfer device to control the cooling device according to the preset test temperature to adjust the temperature of the heat transfer device.
於又一實施例中,該移動裝置藉由氣壓缸、油壓缸或螺桿執行運作以移動該熱傳導裝置。 In another embodiment, the moving device is operated by a pneumatic cylinder, a hydraulic cylinder or a screw to move the heat transfer device.
由上可知,本發明之熱傳導裝置透過分層設置之第一流道以及第二流道,令用於降溫之第二流道接近工作件,以於工作件進行測試時,可提供良好的降溫或散熱效果,而於工作件之運作溫度未達需求而使用加熱件進行加熱時,透過第一流道進行溫度調節,以調控加熱效果,據此,可避免該熱傳導裝置之溫度過高或瞬間變化過大,而造成工作件之損壞;另外,本發明具有前述熱傳導裝置之分選機,透過監測該熱傳導裝置之溫度變化,據以控制供給該第一流道及該第二流道之流體的流量、流速或溫度,以達到調控溫度之目的。 As can be seen from the above, the heat transfer device of the present invention uses the first flow channel and the second flow channel arranged in layers to make the second flow channel for cooling close to the workpiece, so as to provide a good cooling or heat dissipation effect when the workpiece is tested. When the operating temperature of the workpiece does not meet the requirements and the heating element is used for heating, the temperature is adjusted through the first flow channel to adjust the heating effect. Thus, the temperature of the heat transfer device is prevented from being too high or the instantaneous change is too large, which may cause damage to the workpiece. In addition, the sorting machine of the present invention having the above-mentioned heat transfer device controls the flow rate, flow velocity or temperature of the fluid supplied to the first flow channel and the second flow channel by monitoring the temperature change of the heat transfer device, so as to achieve the purpose of temperature control.
1:熱傳導裝置 1: Heat transfer device
1a:裝置主體 1a: Device body
11:第一流道 11: First flow channel
111:第一入水口 111: First water inlet
112:第一出水口 112: First water outlet
113:散熱鰭片 113: Heat sink fins
12:第二流道 12: Second flow channel
121:第二入水口 121: Second water inlet
122:第二出水口 122: Second water outlet
123:微流道 123: Microfluidics
13:傳導本體 13: Conducting entity
131:第一空間 131: First Space
132:第一上表面 132: First upper surface
133:第一下表面 133: First lower surface
134:第三空間 134: The Third Space
14:熱交換本體 14: Heat exchange body
141:第二空間 141: Second Space
142:第二上表面 142: Second upper surface
143:第二下表面 143: Second lower surface
144:間隔片 144: Spacer
15:加熱件 15: Heating element
16:散熱件 16: Heat sink
161:鰭片 161: Fins
17:蓋板 17: Cover plate
8:IC分選機設備 8: IC sorting equipment
81:分選機 81: Sorting machine
811:測試載台 811: Test platform
812:移動裝置 812: Mobile device
8121:連接部 8121:Connection part
813:熱傳導裝置 813: Heat transfer device
814:測試基座 814: Test base
82:冷卻裝置 82: Cooling device
83:控制裝置 83: Control device
84:處理裝置 84: Processing device
9:工作件 9: Workpiece
F1:第一流體 F1: First fluid
F2:第二流體 F2: Second fluid
圖1係本發明之熱傳導裝置之立體結構圖。 Figure 1 is a three-dimensional structural diagram of the heat transfer device of the present invention.
圖2係本發明之熱傳導裝置之第一流道的剖面視圖。 Figure 2 is a cross-sectional view of the first flow channel of the heat transfer device of the present invention.
圖3係本發明之熱傳導裝置之第二流道的剖面視圖。 Figure 3 is a cross-sectional view of the second flow channel of the heat transfer device of the present invention.
圖4係本發明之熱傳導裝置之測試架構的示意圖。 Figure 4 is a schematic diagram of the test structure of the heat transfer device of the present invention.
圖5係本發明之熱傳導裝置之分解圖。 Figure 5 is an exploded view of the heat transfer device of the present invention.
圖6係本發明之熱傳導裝置之傳導本體之仰角視圖。 Figure 6 is an elevation view of the conductive body of the heat conduction device of the present invention.
圖7係本發明之熱傳導裝置中呈現S形之第二流道之結構示意圖。 Figure 7 is a schematic diagram of the structure of the S-shaped second flow channel in the heat transfer device of the present invention.
圖8係應用本發明之熱傳導裝置之IC分選機設備之架構圖。 Figure 8 is a structural diagram of an IC sorting machine using the heat transfer device of the present invention.
圖9係具有本發明之熱傳導裝置之分選機的結構示意圖。 Figure 9 is a schematic diagram of the structure of a sorting machine having the heat transfer device of the present invention.
圖10A-10B係本發明之熱傳導裝置之第一流道其他實施例之結構示意圖。 Figures 10A-10B are schematic diagrams of the structure of other embodiments of the first flow channel of the heat transfer device of the present invention.
以下藉由特定的具體實施形態說明本發明之技術內容,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之優點與功效。然本發明亦可藉由其他不同的具體實施形態加以施行或應用。 The following describes the technical content of the present invention through a specific concrete implementation form. People familiar with this technology can easily understand the advantages and effects of the present invention from the content disclosed in this manual. However, the present invention can also be implemented or applied through other different specific implementation forms.
圖1為本發明之熱傳導裝置之立體結構圖,圖2為本發明之熱傳導裝置之第一流道的剖面視圖,圖3為本發明之熱傳導裝置之第一流道的剖面視圖,以及圖4為本發明之熱傳導裝置之測試架構的示意圖。如圖所示,本發明之熱傳導裝置1包括裝置主體1a以及設於該裝置主體1a內之第一流道11以及第二流道12,本發明之熱傳導裝置1於使用時,如圖4所示,以其底部接觸例如半導體元件之工作件9後,透過第一流道11以及第二流道12導引流體對該工作件9進行溫度之控制,其中,本發明之熱傳導裝置1可應用於液態冷卻系統,以下以此為例進行說明。有關本發明之熱傳導裝置1之詳細說明,如下所陳。
FIG. 1 is a three-dimensional structural diagram of the heat transfer device of the present invention, FIG. 2 is a cross-sectional view of the first flow channel of the heat transfer device of the present invention, FIG. 3 is a cross-sectional view of the first flow channel of the heat transfer device of the present invention, and FIG. 4 is a schematic diagram of the test structure of the heat transfer device of the present invention. As shown in the figure, the
該第一流道11可供第一流體F1流通經過(如圖2所示),利用該第一流體F1之溫度對該熱傳導裝置1進行溫度調節,其中,所述之溫度調節可藉由調配該第一流體F1之流量、流速(即單位時間內流入該熱傳導裝置之流量)或溫度進行控制,使得該熱傳導裝置1之整體溫度符合所欲進行測試之測試溫度,亦即,第一流道11可於工作件9進行測試時,將該熱傳導裝置1之溫度調節至測試溫度,
或於工作件9進行高功率運作之測試時,將該熱傳導裝置1中之熱量導出,以達降溫之效果,據此,本發明可透過第一流道11進行該熱傳導裝置1之溫度控制。
The
該第二流道12可導引第二流體F2流通經過(如圖3所示),以對該工作件9進行冷卻或降溫,且透過控制第二流體F2流經該第二流道12之流量、流速或液體溫度,提供對應之冷卻或降溫效果,例如增加流量、流速或降低液體溫度可提升降低溫度之效果;進一步地,本發明之第二流道12與第一流道11互不連通,且該第二流道12位於該第一流道11下方並接近該工作件9,該第二流道12於工作件9因測試致生高熱時,能透過該熱傳導裝置1提供該工作件9進行冷卻或降溫。於一實施例中,所述的互不連通係指第一流道11內之第一流體F1與第二流道12內之第二流體F2不會互相混合。
The
於一實施例中,該第一流體F1及該第二流體F2之溫度皆小於該工作件9之工作溫度,以於該工作件9運作時,可藉由該第一流體F1及該第二流體F2之溫度對該工作件進行溫度調節。
In one embodiment, the temperature of the first fluid F1 and the second fluid F2 are both lower than the working temperature of the
據此,如圖4所示,本發明之熱傳導裝置1於實際應用時,透過相互獨立且上、下分層設置之方式,使該第一流道11及該第二流道12互不連通,該第二流道12之位置接近該工作件9,當第二流體進入第二流道12時,能提供良好且快速的降溫或散熱之效果,且於該工作件9之工作溫度未達測試標準而進行加熱升溫時,透過讓第一流體進入該第一流道11,藉以提供溫度調整之功能,以避免升溫過快或溫度過高致該工作件9損壞,以及於第二流道12提供降溫時,藉由第一流道11及第二流道12之設計增加單位時間內流動於該熱傳導裝置1內之流量,以增加降低溫度之效果,另外,本發明之熱傳導裝置1藉由使第二流道12接近工作件9之設計,可有效對工作件9進行冷卻,因此,即便工作件9在2000瓦(W)
甚至2000W以上之功率下運作時,仍可將工作件9之溫度控制在100℃以下之運作溫度。
Accordingly, as shown in FIG. 4 , the
進一步地,熱傳導裝置1之裝置主體1a包含傳導本體13以及位於該傳導本體13下之熱交換本體14,該熱傳導裝置1係透過熱交換本體14接觸工作件9(如圖4所示)。具體而言,該第一流道11係形成於該傳導本體13內,而該第二流道12可形成於該熱交換本體14內,例如內嵌於該熱交換本體14,又或是部分形成於該傳導本體13中且部分形成於該熱交換本體14中,也就是,該第二流道12除了一部分內嵌於該熱交換本體14外,另一部分延伸至該傳導本體13。再者,該第一流道11包含第一入水口111及第一出水口112,以及該第二流道12包含第二入水口121及第二出水口122,於一具體實施例中,該第一入水口111、該第一出水口112、該第二入水口121以及該第二出水口122可位於同一水平面上,但不以此為限,亦即,可依需求而更改第一入水口111、第一出水口112、第二入水口121以及第二出水口122之位置。據此,該第一流道11及該第二流道12分別透過第一入水口111、第一出水口112、第二入水口121以及第二出水口122與外部連通,亦即,第一入水口111、第一出水口112、第二入水口121及第二出水口122分別連接外部之第一入水管、第一出水管、第二入水管及第二出水管(圖未繪示),藉以導引第一流體和第二流體進出。
Furthermore, the device body 1a of the
於一實施例中,如圖3所示,本發明可於該第二流道12中形成有複數微流道123,其中,各該微流道123之通道寬度小於該第一流道11之通道寬度,具體而言,該第二流道12可透過設置具有複數鰭片161之至少一散熱件16,以於各該鰭片161之間形成各該微流道123。於一具體實施例中,相鄰之兩鰭片之間相互間隔小於0.5毫米(mm),易言之,各該微流道123的流道寬度小於0.5mm,據此本
發明可藉由設置散熱件16以及形成多個微流道之方式以增加散熱面積,進而達到提升降溫效果之目的。
In one embodiment, as shown in FIG. 3 , the present invention can form a plurality of microchannels 123 in the
圖5為本發明之熱傳導裝置之分解圖。如圖所示,傳導本體13其內部可形成呈S形之第一空間131以構成該第一流道,於一具體實施例中,該傳導本體13可具有相對之第一上表面132以及第一下表面133,且於該第一上表面132處凹設有呈S形之第一空間131,並以一蓋板17密封該第一空間131而形成該第一流道。於另一實施例中,該第一空間131中可設置具有複數鰭片之散熱結構(圖未繪示),藉以提升溫度調節之效果。
FIG5 is an exploded view of the heat transfer device of the present invention. As shown in the figure, the
又如圖5所示,熱交換本體14具有相對之第二上表面142以及第二下表面143,且於該第二上表面142形成向內部凹入之第二空間141,於一具體實施例中,於該熱交換本體14以該第二上表面142結合至該傳導本體13時,使該第一下表面133結合至該第二上表面142以密封該第二空間141,據之形成第二流道,亦即,於本實施例中,使得該第二流道僅形成於該熱交換本體14中。
As shown in FIG. 5 , the
本發明之熱傳導裝置1可設置複數加熱件15,以於測試過程中且工作件運作未達欲測試溫度之情況時,藉由加熱件15加熱工作件以達到欲測試之溫度。該加熱件15可為加熱棒,具體地,可設於該散熱件16底部,又或是設於該熱交換本體14之底部,藉以接近工作件,如圖5所示,可於該散熱件16之底部開設複數裝設孔,以供各該加熱件15嵌設於各該裝設孔中。本發明之熱傳導裝置1藉由各該加熱件15而對該熱交換本體14進行加熱,使該工作件9達到測試之溫度。另外,該熱交換本體14可依需求而設於該第二流道之下方或側邊,同樣能提供降溫、加熱之效果。
The
圖6為本發明之傳導本體之仰角視圖,請一併參考圖5。於一實施例中,該傳導本體13之第一下表面133可對應該第二空間141而形成向內部凹入之第三空間134,以於該傳導本體13與該熱交換本體14結合時,使該第二空間141與該第三空間134連通而形成該第二流道,亦即,於本實施例中,該第二流道部分位於該傳導本體13中以及部分位於該熱交換本體14中,以形成較大之第二流道,故可增加第二流體之流量,而達到提升降溫效果之目的。
FIG6 is an elevation view of the conductive body of the present invention, please refer to FIG5 together. In one embodiment, the first
圖7為本發明之熱傳導裝置中呈現S形之第二流道之結構示意圖。如圖所示,該第二流道可為呈S形蜿蜒之流道,具體而言,該熱交換本體14之第二空間141中設置有複數間隔片144,藉以於該第二空間141中間隔出呈現S形之第二流道,且於該第二流道中設置複數散熱件16,使得第二流體能均勻地流經各該散熱件16。
FIG7 is a schematic diagram of the structure of the S-shaped second flow channel in the heat transfer device of the present invention. As shown in the figure, the second flow channel can be a flow channel that meanders in an S shape. Specifically, a plurality of spacers 144 are arranged in the
圖8為應用本發明之熱傳導裝置之IC分選機設備之架構圖,圖9為具有本發明之熱傳導裝置之分選機的結構示意圖。如圖所示,IC分選機設備8包括分選機81、冷卻裝置82、控制裝置83以及處理裝置84,其中,分選機81具有熱傳導裝置813且分別連接冷卻裝置82和控制裝置83,而處理裝置84連接控制裝置83。
FIG8 is a structural diagram of an IC sorting machine using the heat transfer device of the present invention, and FIG9 is a structural schematic diagram of a sorting machine having the heat transfer device of the present invention. As shown in the figure, the
冷卻裝置82分別連接熱傳導裝置813之第一流道以及第二流道,以分別提供第一流體及第二流體,其中,第一流體及第二流體可為水,但不以此為限;另外,該第一流體及該第二流體流經該第一流道及該第二流道時,可具有相同或不同之流速、流量或溫度,藉以提供所需之測試溫度,於一具體實施例中,該冷卻裝置82可為選用低溫流體之冰水主機;另外,控制裝置83用於監測熱傳導裝置813之溫度變化,且依據預先設定之測試溫度控制該冷卻裝置82提供所需流
體(例如第一流體及第二流體),以對該熱傳導裝置813進行降溫或溫度調節;另外,連接控制裝置83之處理裝置84,可為電腦或行動裝置之電子裝置,能要求控制裝置83執行運作(溫度控制操作),且能接收控制裝置83監控之數據或對控制裝置83進行設定。
The
如圖9所示,分選機81係包含測試載台811、位於該測試載台811上方之移動裝置812以及位於該移動裝置812下方之熱傳導裝置813,其中,測試載台811用以承載工作件9,以提供該工作件9測試環境,於一實施例中,該工作件9係設置於一測試基座(Socket)814,且該測試基座814中具有複數探針,以傳送用於測試該工作件9之測試訊號;再者,該移動裝置812用以移動位於其下方(底部)之熱傳導裝置813,於一具體實施例中,該移動裝置812藉由氣壓缸、油壓缸或螺桿執行運作以移動該熱傳導裝置813;另外,該移動裝置812之底部復可具有連接部8121,該連接部8121之側邊設有至少一扣件,具體而言,例如於該連接部8121之二相對側分別設置該扣件,另於該熱傳導裝置813對應各該扣件設有卡勾,透過各該扣件扣持對應之卡勾,以固定該熱傳導裝置813;此外,該連接部8121復可具有複數導件,且該熱傳導裝置813對應各該導引件具有導孔,據此,於該熱傳導裝置813結合至該連接部8121時,可透過各該導件對應各該導孔,將該熱傳導裝置813引導至該連接部8121之結合位置,進而透過各該扣件固定該熱傳導裝置813,以進行結合。
As shown in FIG. 9 , the sorting
據上可知,該熱傳導裝置813位於該移動裝置812及該測試載台811之間,藉由該移動裝置812驅動該熱傳導裝置813相對該工作件9移動,即於測試時,使該熱傳導裝置813受該移動裝置812之驅動而接觸該工作件9,搭配該熱傳導裝置813之溫控效果,以調節該工作件9於進行測試過程時之溫度。
As can be seen from the above, the
於實際測試中,當工作件9以高功率運作時,可透過控制裝置83控制冷卻裝置82提供第二流體給第二流道,該第二流體可為低溫之冰水或其他可提供降溫之流體,以供工作件9進行降溫或冷卻,另外,冷卻裝置82復可於前述測試時,停止或減少第一流體之供給,或可同時提供用於冷卻之第一流體給第一流道,藉由雙流道進行降溫,可同時提供較大之流速及流量,以全速進行降溫,達到有效降溫或散熱之目的;當工作件9之運轉效能降低致未達測試溫度時,使加熱件15(如圖5所示)對熱傳導裝置813進行加熱,此時,該控制裝置83監測該熱傳導裝置813之升溫情況,據以控制該冷卻裝置82提供第一流體給第一流道,具體而言,該控制裝置83依據該熱傳導裝置813之溫度以及預先設定之所需溫度,使冷卻裝置82藉由控制例如流體閥之方式,改變流經該第一流道的第一流體之流速或單位流量,亦可直接改變第一流體之溫度,以對該熱傳導裝置813進行溫度調控,避免加熱件15之加熱溫度過高或瞬間加熱溫度變化過快而致工作件9損壞,於一實施例中,在對工作件9進行加熱時,可同時停止或減少供給第二流體,即令第二流道不進行降溫,以避免第二流道影響加熱件之加熱效果,亦可使加熱件無須持續加熱,可避免減少加熱件15之使用壽命之目的。
In actual testing, when the
綜上,無論是進行降溫或溫度調控,皆關乎於熱傳導裝置對熱阻之效應,於熱傳導裝置中,其熱傳導總熱阻包括熱對流熱阻及熱傳導熱阻,具體地,為降低各種熱阻之效應,可考量下列公式,第一個公式為“熱對流熱阻=1/(熱對流係數×熱傳面積)”,其中,熱對流係數與流速相關,於此情況下,期盼流速越大、熱傳面積越大,水溫越小,則有望降低熱阻,另外,第二個公式為“熱傳導熱阻=傳導路徑長度/(材料熱傳係數×熱傳接觸面積)”,於此情況下,期盼熱傳係數越大,接觸面積越大,傳導路徑越小,則利於降低熱阻,易言之, 本發明藉由上述之熱傳導裝置中第一流道及第二流道之設計,可提升流體之流速,提供低溫之流體,增加熱傳導面積及熱傳接觸面積,且縮短傳導路徑,據以達到降低熱阻之功效。 In summary, whether it is cooling or temperature control, it is related to the effect of the heat transfer device on the thermal resistance. In the heat transfer device, the total thermal resistance of the heat transfer includes the thermal convection resistance and the thermal conduction resistance. Specifically, in order to reduce the effect of various thermal resistances, the following formulas can be considered. The first formula is "thermal convection resistance = 1/(thermal convection coefficient × heat transfer area)", where the thermal convection coefficient is related to the flow rate. In this case, it is expected that the greater the flow rate, the larger the heat transfer area, and the lower the water temperature, the lower the thermal resistance is expected to be. In addition, the second formula is "thermal conduction resistance = conduction path length / (material heat transfer coefficient × heat transfer contact area)". In this case, it is expected that the larger the heat transfer coefficient, the larger the contact area, and the smaller the conduction path, the more conducive to reducing thermal resistance. In other words, the present invention can increase the flow rate of the fluid, provide low-temperature fluid, increase the heat transfer area and heat transfer contact area, and shorten the conduction path through the design of the first flow channel and the second flow channel in the above-mentioned heat transfer device, thereby achieving the effect of reducing thermal resistance.
另外,為進一步降低本發明之熱傳導裝置之熱阻,如圖10A-10B所示,為本發明前述第一流道其他實施例之結構示意圖,其中,如圖10A所示,本發明之第一流道11可採用大面積之流道,且設置散熱鰭片113,據以增加熱傳面積;另外,如圖10B所示,本發明可設置複數第一流道11,圖所示為二個第一流道11,且各第一流道11皆有對應之入水口及出水口,並設有散熱鰭片113,藉此增加流體之流速,因而可增加單位時間內流經本發明之熱傳導裝置之流量。
In addition, in order to further reduce the thermal resistance of the heat transfer device of the present invention, as shown in Figures 10A-10B, it is a schematic diagram of the structure of other embodiments of the first flow channel of the present invention. As shown in Figure 10A, the
此外,本發明之第二流道可設計成具有複數子流道,其中,各該子流道相互獨立且具有各自的入水口及出水口,藉此增加流體之流速及流量;再者,本發明復可依需求而增設獨立於第一流道和第二流道之第三流道或更多其他流道,亦即可不限制流道數量下,透過多個獨立流道來達到降溫和溫控效果,據此,將有助於提升本發明之熱傳導裝置之溫控效果,達到應付具有更高的運作溫度之工作件的目的。 In addition, the second flow channel of the present invention can be designed to have multiple sub-flow channels, wherein each sub-flow channel is independent of each other and has its own water inlet and outlet, thereby increasing the flow rate and flow rate of the fluid; furthermore, the present invention can add a third flow channel or more other flow channels independent of the first flow channel and the second flow channel according to demand, that is, the cooling and temperature control effects can be achieved through multiple independent flow channels without limiting the number of flow channels. Accordingly, it will help to improve the temperature control effect of the heat transfer device of the present invention and achieve the purpose of coping with workpieces with higher operating temperatures.
此外,本發明之熱傳導裝置中第一流道提供之溫度調控亦可採用其他方式,例如,第一流道之區域可不提供流體,而僅使用內嵌於熱交換本體內而能縮短熱傳導路徑的第二流道,基於第二流道靠近工作件,同樣能達到較佳降溫效果,同時熱傳導裝置中第一流道之區域採用氣冷散熱,同樣具溫度調控能力,易言之,本發明之第一流道可依需求而有不同設計選擇。 In addition, the temperature control provided by the first flow channel in the heat transfer device of the present invention can also be achieved in other ways. For example, the area of the first flow channel may not provide fluid, but only use the second flow channel embedded in the heat exchange body to shorten the heat transfer path. Since the second flow channel is close to the workpiece, a better cooling effect can also be achieved. At the same time, the area of the first flow channel in the heat transfer device adopts air cooling to dissipate heat, which also has the ability to regulate temperature. In other words, the first flow channel of the present invention can have different design options according to needs.
本發明之熱傳導裝置具有以下優點。第一,本發明之熱傳導裝置為具有第一流道及第二流道之分層設計,藉由令提供降溫功能之第二流道接近 工作件,甚至透過將第二流道之一部分或全部形成於熱交換本體中,以大幅減小第二流道與工作件之間的距離,據以提供良好的降溫效果;第二,本發明藉由第一流道之設置,提供熱傳導裝置之溫度調控,亦即,於對工作件進行降溫冷卻時,能提供額外之降溫效果,或於對工作件進行加熱時,可在不影響加熱件加熱效果下,避免熱傳導裝置之溫度過高或瞬間加熱造成溫度變化過鉅,進而有工作件損毀之情況發生;第三,本發明藉由雙流道之設置,透過調配各流道內流體狀態(如流體之流速、流量或溫度),能達到良好地提供適於需求之測試環境的目的。 The heat transfer device of the present invention has the following advantages. First, the heat transfer device of the present invention has a layered design with a first flow channel and a second flow channel. By making the second flow channel providing a cooling function close to the workpiece, or even by forming a part or all of the second flow channel in the heat exchange body, the distance between the second flow channel and the workpiece is greatly reduced, thereby providing a good cooling effect. Second, the present invention provides temperature control of the heat transfer device through the setting of the first flow channel, that is, when the workpiece is subjected to When cooling, it can provide additional cooling effect, or when heating the workpiece, it can avoid the temperature of the heat transfer device being too high or the temperature change being too large due to instantaneous heating without affecting the heating effect of the heating element, thereby causing damage to the workpiece; thirdly, the present invention can achieve the purpose of providing a test environment suitable for the needs by setting up dual flow channels and adjusting the fluid state in each flow channel (such as the flow rate, flow rate or temperature of the fluid).
上述實施例僅為例示性說明,而非用於限制本發明。任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修飾與改變。因此,本發明之權利保護範圍係由本發明所附之申請專利範圍所定義,只要不影響本發明之效果及實施目的,應涵蓋於此公開技術內容中。 The above embodiments are only illustrative and not intended to limit the present invention. Anyone familiar with this technology may modify and change the above embodiments without violating the spirit and scope of the present invention. Therefore, the scope of protection of the present invention is defined by the scope of the patent application attached to the present invention. As long as it does not affect the effect and implementation purpose of the present invention, it should be covered by this public technical content.
1:熱傳導裝置 1: Heat transfer device
1a:裝置主體 1a: Device body
11:第一流道 11: First flow channel
111:第一入水口 111: First water inlet
112:第一出水口 112: First water outlet
12:第二流道 12: Second flow channel
121:第二入水口 121: Second water inlet
122:第二出水口 122: Second water outlet
13:傳導本體 13: Conducting entity
14:熱交換本體 14: Heat exchange body
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201219802A (en) * | 2010-11-05 | 2012-05-16 | Hon Tech Inc | providing heat conduction mechanism for full-scale cold/heat exchange to greatly enhance cooling performance during testing and ensure testing quality |
| TW201346293A (en) * | 2012-05-11 | 2013-11-16 | Hon Tech Inc | Electric component press bonding device, testing equipment applying the same and press bonding control method |
| US20190229038A1 (en) * | 2015-09-30 | 2019-07-25 | Microfabrica Inc. | Micro Heat Transfer Arrays, Micro Cold Plates, and Thermal Management Systems for Cooling Semiconductor Devices, and Methods for Using and Making Such Arrays, Plates, and Systems |
| TW202226931A (en) * | 2020-12-18 | 2022-07-01 | 鴻勁精密股份有限公司 | Temperature controlling unit and operating apparatus using the same |
| US20220291727A1 (en) * | 2016-02-15 | 2022-09-15 | Cooler Master Co., Ltd. | Cooling apparatus |
| TW202322314A (en) * | 2021-11-18 | 2023-06-01 | 雙鴻科技股份有限公司 | Liquid cooling device |
-
2023
- 2023-08-28 TW TW112132364A patent/TWI860063B/en active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201219802A (en) * | 2010-11-05 | 2012-05-16 | Hon Tech Inc | providing heat conduction mechanism for full-scale cold/heat exchange to greatly enhance cooling performance during testing and ensure testing quality |
| TW201346293A (en) * | 2012-05-11 | 2013-11-16 | Hon Tech Inc | Electric component press bonding device, testing equipment applying the same and press bonding control method |
| US20190229038A1 (en) * | 2015-09-30 | 2019-07-25 | Microfabrica Inc. | Micro Heat Transfer Arrays, Micro Cold Plates, and Thermal Management Systems for Cooling Semiconductor Devices, and Methods for Using and Making Such Arrays, Plates, and Systems |
| US20220291727A1 (en) * | 2016-02-15 | 2022-09-15 | Cooler Master Co., Ltd. | Cooling apparatus |
| TW202226931A (en) * | 2020-12-18 | 2022-07-01 | 鴻勁精密股份有限公司 | Temperature controlling unit and operating apparatus using the same |
| TW202322314A (en) * | 2021-11-18 | 2023-06-01 | 雙鴻科技股份有限公司 | Liquid cooling device |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202509501A (en) | 2025-03-01 |
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