TWI741673B - Wireless communication electronic component testing device and testing equipment using the same - Google Patents
Wireless communication electronic component testing device and testing equipment using the same Download PDFInfo
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Abstract
Description
本發明提供一種可壓接電子元件,並供通過傳輸無線訊號之接合機構。The invention provides a bonding mechanism that can crimp electronic components and transmit wireless signals.
請參閱圖1,一內建有複數個天線之射頻電子元件10廣泛應用於行動通訊區域無線網路系統及無線通訊區域網路系統等領域;目前射頻電子元件10於一面設置複數個接點11,並於另一面設有天線12,射頻電子元件10於出廠前,除了執行無線訊號測試作業,亦需執行電性測試作業,以確保品質。Please refer to Figure 1. A radio frequency
射頻電子元件用之測試裝置於機台配置電性連接之電路板21及測試座22,測試座22具有複數個探針221以供測試射頻電子元件10,測試裝置另於測試座22之上方配置天線測試器23,以對射頻電子元件10發射或接收無線訊號;當射頻電子元件10置放於測試座22時,射頻電子元件10以接點11接觸測試座22之探針221而執行電性測試作業,並以天線12朝向位於預設待測指向之天線測試器23發出無線訊號,天線測試器23接收無線訊號而進行無線訊號測試作業。The test device for radio frequency electronic components is equipped with a
上述射頻電子元件10僅以自重的壓力,令其接點11接觸測試座22之探針221,由於探針221內有彈簧,此一自重壓力並無法使接點11與探針221確實相互接觸,以致影響射頻電子元件10之電性測試品質;由於射頻電子元件10之天線12相對於天線測試器23,因此,如何在不影響天線測試器23與射頻電子元件10傳輸無線訊號之要件下,而可壓接射頻電子元件10執行測試作業,即為業者研發之標的。The above-mentioned radio frequency
本發明之目的一,提供一種射頻電子元件測試裝置,包含電性 測試器、天線測試器及接合機構,其接合機構設有承載器及防擾壓件,承載器裝配且驅動防擾壓件位移,防擾壓件以防屏蔽材質製作,並具有低介電係數而可供無線訊號通過,藉以承載器承載防擾壓件位於天線測試器與射頻電子元件之間,不僅利用防擾壓件對射頻電子元件施以壓接力,使射頻電子元件確實接觸電性測試器而執行測試作業,並供天線測試器與射頻電子元件間傳輸之無線訊號通過防擾壓件而進行無線訊號測試作業,進而提升測試品質。 The first objective of the present invention is to provide a radio frequency electronic component testing device, including electrical Tester, antenna tester and jointing mechanism. The jointing mechanism is equipped with a carrier and anti-disturbance parts. The carrier is assembled and drives the displacement of the anti-disturbance parts. The anti-disturbance parts are made of shielding materials and have a low dielectric coefficient. The anti-disturbance component is located between the antenna tester and the radio frequency electronic component, and the anti-disturbance component is not only used to apply a crimping force to the radio frequency electronic component, so that the radio frequency electronic component does contact the electrical test. The test operation is performed by the device, and the wireless signal transmitted between the antenna tester and the radio frequency electronic component is subjected to the wireless signal test operation through the anti-interference pressure component, thereby improving the test quality.
本發明之目的二,提供一種射頻電子元件測試裝置,其接合機構之承載器供裝配防擾壓件及天線測試器,防擾壓件位於天線測試器之下方,承載器驅動防擾壓件及天線測試器同步位移,進而提升測試生產效能。The second objective of the present invention is to provide a radio frequency electronic component test device, the carrier of the joint mechanism is for assembling the anti-disturbance component and the antenna tester, the anti-disturbance component is located under the antenna tester, and the carrier drives the anti-disturbance component and The antenna tester moves synchronously to improve the test production efficiency.
本發明之目的三,提供一種射頻電子元件測試裝置,其接合機構於防擾壓件或其周側設置至少一拾取件,藉以拾取件將射頻電子元件移置電性測試器,並搭配防擾壓件壓接射頻電子元件,進而提高測試產能。The third objective of the present invention is to provide a radio frequency electronic component testing device, the bonding mechanism of which is provided with at least one pick-up member on the anti-disturbance pressure member or its surrounding side, whereby the pick-up member displaces the radio frequency electronic component to the electrical tester, and is matched with the anti-interference The pressure parts are crimped with radio frequency electronic components, thereby increasing test productivity.
本發明之目的四,提供一種射頻電子元件測試裝置,更包含第一平台,第一平台配置有調整器,以供調整擺置位置或角度,第一平台供裝配電性測試器及接合機構,不僅使接合機構可隨電性測試器同步調整位置或角度,並使射頻電子元件執行不同待測指向之無線訊號測試作業,以縮減天線測試器之配置數量,達到節省天線測試器成本及提高使用效能之實用效益。The fourth object of the present invention is to provide a radio frequency electronic component testing device, further comprising a first platform, the first platform is equipped with an adjuster for adjusting the placement position or angle, and the first platform is for assembling the electrical tester and the joining mechanism, It not only enables the joint mechanism to adjust the position or angle synchronously with the electrical tester, but also enables the radio frequency electronic components to perform wireless signal test operations with different directions to be tested, so as to reduce the number of antenna testers, save the cost of the antenna tester and increase the use Practical benefits of effectiveness.
本發明之目的五,係提供一種測試設備,包含機台、供料裝置 、收料裝置、本發明測試裝置、輸送裝置及中央控制裝置;供料裝置配置於機台上,並設有至少一容納待測射頻電子元件之供料承置器;收料裝置配置於機台上,並設有至少一容納已測射頻電子元件之收料承置器;本發明測試裝置配置於機台上,包含電性測試器、天線測試器及接合機構,以測試及壓接射頻電子元件;輸送裝置配置於機台上,並設有至少一輸送器,以輸送射頻電子元件 ;中央控制裝置以供控制及整合各裝置作動,而執行自動化作業,達到提升作業效能之實用效益。 The fifth objective of the present invention is to provide a test equipment including a machine and a feeding device , The receiving device, the test device of the present invention, the conveying device and the central control device; the feeding device is arranged on the machine platform, and is provided with at least one feeding holder for accommodating the radio frequency electronic component to be tested; the receiving device is arranged on the machine The platform is equipped with at least one receiving holder for accommodating the tested radio frequency electronic components; the testing device of the present invention is arranged on the machine platform and includes an electrical tester, an antenna tester and a joint mechanism to test and crimp the radio frequency Electronic components; the conveying device is arranged on the machine table and is equipped with at least one conveyor to convey radio frequency electronic components ; The central control device is used to control and integrate the actions of various devices, and perform automated operations to achieve the practical benefits of improving operational efficiency.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the accompanying drawings. The details are as follows:
請參閱圖2,本發明測試裝置30之第一實施例,包含電性測試器31、天線測試器32及接合機構33。Please refer to FIG. 2, the first embodiment of the
電性測試器31設有電性連接之電路板311及至少一測試座312,測試座312供電性連接至少一位於測試工位之射頻電子元件,以對射頻電子元件執行電性測試作業。更進一步,測試座312具有複數支探針313,探針313之一端電性連接電路板311,另一端供電性連接射頻電子元件。再者,測試工位為預設射頻電子元件執行測試作業之位置,測試工位可位於電性測試器31、載具
或輸送器等,依不同測試作業需求而定,不受限於本實施例;於本實施例,測試工位即位於測試座312。
The
電性測試器31更包含於測試座312設有至少一限位部件,限位部件可為限位板、限位柱或抽氣孔;於本實施例,限位部件為抽氣孔314,抽氣孔314連接一抽氣設備(圖未示出),以便吸附限位射頻電子元件。The
電性測試器31裝配於第一平台34,更進一步,第一平台34可為面板、端部、架體或座體,亦或以連接電性測試器31之相關元件的一部位作為第一平台34,第一平台34之型態只要可供裝配電性測試器31均可,易言之,第一平台34可為機台之台板、調整器之承裝部件、測試室之面板或載具之承裝部件等,載具可為轉動具、線性驅動源(如作動臂、滑軌組或螺桿螺座組等)或包含箱罩及可驅動箱罩位移之驅動源;第一平台34可為固定式或活動式,例如第一平台34為機台之台板或測試室之面板時,可使電性測試器31固定於預設位置
。活動式之第一平台34可作至少一方向位移或作角度轉動,亦或作至少一方向位移及角度轉動;例如第一平台34為調整器之承裝部件時,可帶動電性測試器31作角度轉動而調整擺置角度或作至少一方向位移而變換擺置位置;例如第一平台34為載具之承裝部件時,可帶動電性測試器31作線性位移或旋轉位移;於本實施例,第一平台34為固定式配置且為機台之台板,以供裝配電性測試器31。
The
天線測試器32設有至少一訊號作業件321,以供射頻電子元件執行無線訊號測試作業;例如天線測試器32對射頻電子元件執行接收或發射無線訊號之作業,例如天線測試器32對射頻電子元件作接收及發射無線訊號之作業
。天線測試器32可連接一獨立之處理器(圖未示出),以將接收射頻電子元件的無線訊號傳輸至處理器,或者將處理器之測試用的無線訊號發射至射頻電子元件,處理器亦可為中央控制裝置(圖未示出)之處理器。再者,天線測試器32之訊號作業件321的作業軸線L角度可相同或偏近於射頻電子元件之待測指向(如0°或45°或30°指向)。
The
測試裝置30可依測試作業所需而變換天線測試器32之配置數量及配置位置,例如測試單一指向之無線訊號時,可配置單一天線測試器32,例如測試不同指向之無線訊號時,可於複數個位置配置複數個天線測試器32;於本實施例,天線測試器32裝配於第二平台35,天線測試器32之訊號作業件321的作業軸線L位於0°指向,以供接收射頻電子元件所發出之無線訊號,並將無線訊號傳輸至中央控制裝置之處理器而作一分析,以判別射頻電子元件之待測指向所發出波束的無線訊號強度是否符合標準。The
又第二平台35可為面板、端部、架體或座體,或者以連接天線測試器32之相關元件的一部位作為第二平台35,第二平台35之型式只要可供裝配天線測試器32均可,例如第二平台35包含複數個不同位置之面板,可供裝配複數個不同位置之天線測試器32,易言之,第二平台35可為機台之台板、調整器之承裝部件、測試室之面板、箱罩之面板、承載器之承裝部件、載具之承裝部件或承座之架板等,載具可為轉動具、線性驅動源(如作動臂、滑軌組或螺桿螺座組等)或包含箱罩及可驅動箱罩位移之驅動源。第二平台35可為固定式或活動式,例如第二平台35為機台之台板、測試室之面板或承座之架板時,可使天線測試器32固定於預設位置;活動式之第二平台35可作至少一方向位移或作角度轉動,亦或作至少一方向位移及角度轉動;例如第二平台35為調整器之承裝部件,以供帶動天線測試器32調整擺置角度或位置;例如第二平台35為載具之承裝部件,以供帶動天線測試器32作線性位移或旋轉位移。The
於本實施例中,第二平台35為固定式配置之架板,以供裝配天線測試器32,天線測試器32之訊號作業件321的作業軸線L角度相同於射頻電子元件之0°待測指向,以接收射頻電子元件之待測指向所發出波束的無線訊號。In this embodiment, the
接合機構33包含承載器331及防擾壓件332,承載器331供裝配防擾壓件332,防擾壓件332以防屏蔽材質製作,並具有低介電係數,承載器331承載防擾壓件332位於天線測試器32與射頻電子元件之間,利用防擾壓件332與射頻電子元件其中一者朝向另一者作壓接位移而執行電性測試作業,更進一步
,由於不同型式之射頻電子元件具有不同體積,其天線可配置於射頻電子元件
之壓接位置或非壓接位置的一方,壓接位置為預設可供防擾壓件332壓接之位置;例如體積大之射頻電子元件,其天線配置於射頻電子元件之非壓接位置的下方,易言之,非壓接位置不受防擾壓件332壓接,防擾壓件332亦不會壓接於天線之上方,使得天線測試器32與射頻電子元件間傳輸之無線訊號毋需通過防擾壓件332即可執行無線訊號測試作業;例如體積小之射頻電子元件,其天線配置於射頻電子元件之壓接位置的下方,即防擾壓件332會壓接於天線之上方
,使得天線測試器32與射頻電子元件間傳輸之無線訊號可通過防擾壓件332而執行無線訊號測試作業。再者,承載器331承載防擾壓件332與射頻電子元件作相對位移,亦無不可,仍可利用防擾壓件332壓接射頻電子元件而執行電性測試作業。
The
承載器331為固定式或活動式設計,承載器331可為固定架、移動臂、壓接座或轉軸,例如承載器331為固定架,並配置於天線測試器32與電性測試器31之間;例如承載器331為移動臂、壓接座或轉軸,而作至少一方向位移,位移可為線性位移或旋轉位移,亦或作線性位移及旋轉位移。承載器331可以防屏蔽材質或非防屏蔽材質(如金屬材)製作,其強度只要可承載防擾壓件332;於本實施例,承載器331為移動臂,並作X-Z方向位移,承載器331開設有容置部3311,容置部3311貫通承載器331之頂面及底面。The
防擾壓件332裝配於承載器331,並以防屏蔽材質製作,且具有低介電係數;更進一步,防擾壓件332可裝配於承載器331之一側,或穿置於承載器331,而由承載器331承載位於天線測試器32與射頻電子元件之間;防擾壓件332應用之防屏蔽材質可為閉孔聚乙烯泡綿或氣凝膠,當防屏蔽材質之內部為真空,其介電係數為1,當防屏蔽材質之內部為空氣,其介電係數接近於1;防擾壓件332具有適當強度及彈性,於受壓後,可回復原狀;於本實施例,防擾壓件332為閉孔聚乙烯泡綿,並具有適當之強度及彈性,防擾壓件332裝配於承載器331之容置部3311,並以一面作為壓接面3321,壓接面3321突出於容置部3311,以供壓接射頻電子元件,另一面為裝配面3322,以供相對於天線測試器32,壓接面3321與裝配面3322間形成傳輸通道T;防擾壓件332之介電係數可為1.06~1.03,更佳者,介電係數為1.03~1,防擾壓件332之介電係數低,尤其對毫米波無線訊號干擾小,而可降低無線訊號於傳輸上之損耗。The
又防擾壓件332之周側、頂面或底面可依作業需求,而加裝一非防屏蔽材質製作之框架(圖未示出),框架迴避傳輸通道T,以確保無線訊號傳輸無干擾。In addition, a frame made of non-shielding material (not shown in the figure) can be added to the peripheral side, top or bottom surface of the
然,當接合機構33具有壓接及移載之使用需求時,可於防擾壓件332或其周側設置至少一拾取件,拾取件裝配於承載器331,以供取放射頻電子元件;換言之,當接合機構33具有壓接之使用需求時,毋需於承載器331配置拾取件;於本實施例,承載器331係於防擾壓件332之周側配置拾取件333,以供取放移載射頻電子元件。However, when the
請參閱圖3,接合機構33以拾取件333吸附一待測之射頻電子元件40,射頻電子元件40之一面具有複數個接點41,另一面具有天線42,天線42位於射頻電子元件40之壓接位置的下方;接合機構33之承載器331作X-Z方向位移將待測之射頻電子元件40移載置放於電性測試器31之測試座312(即測試工位),射頻電子元件40之接點41即初步電性接觸測試座312之探針313,測試座312以抽氣孔314吸附射頻電子元件40限位。Referring to FIG. 3, the
然,為使射頻電子元件40之接點41確實接觸測試座312之探針313,接合機構33之承載器331帶動防擾壓件332作Z方向位移,令防擾壓件332之壓接面3321以預設壓接力壓接射頻電子元件40之壓接位置,使射頻電子元件40之接點41確實接觸測試座312之探針313,探針313經由電路板311而對射頻電子元件40執行電性測試作業;再者,射頻電子元件40之天線42的待測指向為0°,天線測試器32之訊號作業件321的作業軸線L角度相同射頻電子元件40之待測指向且為0°,接合機構33之防擾壓件332雖位於射頻電子元件40之天線42及天線測試器32間,由於防擾壓件332以防屏蔽材質製作,其介電係數為1.03~1,防擾壓件332可供通過無線訊號,因此,在防擾壓件332之裝配面3322相對於天線測試器32之狀態下,而可使防擾壓件332之傳輸通道T相對於天線測試器32,於測試工位之射頻電子元件40的天線42朝0°待測指向發出波束而傳輸無線訊號時
,在防擾壓件332具有低介電係數及低損耗的要件下,無線訊號通過防擾壓件332之傳輸通道T而傳輸至天線測試器32,天線測試器32之訊號作業件321接收射頻電子元件40之無線訊號,進而執行無線訊號測試作業,天線測試器32並將接收之無線訊號傳輸至中央控制裝置(圖未示出)之處理器,以供處理器作一分析,而判別射頻電子元件40之待測指向所發出的無線訊號強度是否符合標準;若是,則判斷射頻電子元件40為良品,反之,則判斷射頻電子元件40為不良品
;因此,測試裝置30之接合機構33不僅可壓接射頻電子元件40而確保電性測試作業品質,並供順暢執行無線訊號測試作業,進而提高生產效能。
However, in order to make the
請參閱圖4、5,本發明測試裝置30之第二實施例,其與第一實施例之差異在於天線測試器32裝配於接合機構33之承載器331,承載器331之內部開設有訊號通道3312,訊號通道3312之一端供裝配天線測試器32,另一端則裝配防擾壓件332,防擾壓件332之裝配面3322相對於天線測試器32,而壓接面3321供相對於射頻電子元件40,防擾壓件332之傳輸通道T可供通過無線訊號;於本實施例,於射頻電子元件40移入電性測試器31後,接合機構33之承載器331帶動天線測試器32及防擾壓件332同步作Z方向位移,令防擾壓件332之壓接面3321以預設壓接力壓接射頻電子元件40,使射頻電子元件40之接點41確實接觸電性測試器31之探針313而執行電性測試作業,並供射頻電子元件40的天線
42發出之無線訊號通過防擾壓件332之傳輸通道T而傳輸至天線測試器32,使天線測試器32接收射頻電子元件40之無線訊號,進而執行無線訊號測試作業。
4 and 5, the second embodiment of the
請參閱圖6、7,本發明測試裝置30於第一平台34或第二平台配置至少一調整器,以供調整電性測試器31或天線測試器32之擺置位置或角度;於第三實施例,測試裝置30於第一平台34配置調整器36,第一平台34裝配電性測試器31,以供調整電性測試器31之擺置位置或角度,使射頻電子元件40之天線42執行不同預設指向之無線訊號測試作業,以縮減天線測試器32之配置數量而節省成本;再者,調整器36可為機械手臂或轉軸,或包含複數個調整桿件,以調整電性測試器31及其上之射頻電子元件40擺置呈測試作業所需之角度(如0°
、30°或45°指向),例如複數個調整桿件可作不同高度搭配作動,以驅動調整第一平台34。
6 and 7, the
再者,調整器36帶動第一平台34及電性測試器31同步調整擺置角度時,接合機構33可獨立作動,並視電性測試器31之擺置角度,而以承載器331調整防擾壓件332之擺置角度;然,接合機構33亦可配置於第一平台34,由調整器36帶動第一平台34、電性測試器31及接合機構33同步調整擺置角度;於本實施例,接合機構33之承載器331配置於第一平台34,並作複數個方向位移
,於取放料時,承載器331帶動防擾壓件332作線性位移或迴轉位移而迴避輸送器(圖未示出),以利輸送器於電性測試器31取放射頻電子元件40;於測試時,調整器36帶動第一平台34、電性測試器31及射頻電子元件40同步調整擺置角度
,然在防擾壓件332之防干擾範圍大於射頻電子元件40之待測指向範圍的要件下,射頻電子元件40之天線42朝向30°待測指向發射無線訊號,並利用承載器331帶動防擾壓件332以預設壓接力壓接射頻電子元件40而執行電性測試作業,以及供射頻電子元件40的天線42發出之無線訊號通過防擾壓件332而傳輸至天線測試器32,使天線測試器32之訊號作業件321接收射頻電子元件40之無線訊號,進而執行無線訊號測試作業。
Furthermore, when the
請參閱圖8,本發明測試裝置30之第四實施例,測試裝置30更包含測試室,電性測試器31、天線測試器32及接合機構33於測試時位於測試室;測試室可為一獨立且具門板之箱室,或者於機台上固設具門板之箱罩,而於箱罩與機台間形成測試室,亦或於機台之上方配置一可作Z方向位移之外罩,以於外罩罩置於機台時,而於外罩與機台間形成測試室;於本實施例,測試裝置30於機台50上固設具門板372之箱罩371,而於箱罩371與機台50間形成測試室373,測試室373設有至少一可輸入預設溫度流體之輸送管374,以使測試室373形成一模擬日後射頻電子元件應用場所溫度之測試環境;電性測試器31及接合機構33配置於測試室373內之機台50上,接合機構33之承載器331作複數個方向位移(如X-Z方向),以利迴避輸送器52及可壓接射頻電子元件40,天線測試器32則配置於測試室373之頂板375;當一輸送器52將待測之射頻電子元件40移入測試室373時,承載器331作X-Z方向位移,以迴避輸送器52,而供輸送器52將射頻電子元件40移入電性測試器31之測試工位,接合機構33以承載器331帶動防擾壓件332壓接射頻電子元件40而執行電性測試作業,以及供射頻電子元件40的天線42發出之無線訊號通過防擾壓件332而傳輸至天線測試器32,使天線測試器32接收射頻電子元件40之無線訊號,進而執行無線訊號測試作業;因此,測試裝置30可使射頻電子元件40於測試室373內執行無線訊號測試作業及電性測試作業。Please refer to FIG. 8, a fourth embodiment of the
請參閱圖9,本發明測試裝置30之第五實施例,測試裝置30更包含測試室,電性測試器31、天線測試器32及接合機構33於測試時位於測試室,電性測試器31配置於測試室內之機台50上,接合機構33配置於電性測試器31之上方,承載器331可作複數個方向位移(如X-Z方向),並於內部設有訊號通道3312,訊號通道3312之一端供裝配天線測試器32,另一端則裝配防擾壓件332
,防擾壓件332之裝配面3322相對於天線測試器32,而壓接面3321供相對於射頻電子元件40之天線42,防擾壓件332可供通過無線訊號;另測試室373於電性測試器31之一方設置載台,以載送射頻電子元件;於本實施例,電性測試器31之側方設置二作Y方向位移之載台381、382,以供載送待測射頻電子元件40及已測射頻電子元件40;當一載台381承載待測之射頻電子元件40至電性測試器31之側方時,接合機構33之承載器331帶動拾取件333作X-Z方向位移,令拾取件333於一載台381取出待測之射頻電子元件40,並移入電性測試器31,承載器331帶動防擾壓件332及天線測試器32作Z方向位移,並以防擾壓件332壓接射頻電子元件40而執行電性測試作業,以及供射頻電子元件40的天線42發出之無線訊號通過防擾壓件332而傳輸至天線測試器32,使天線測試器32接收射頻電子元件40之無線訊號,而執行無線訊號測試作業,於測試完畢,接合機構33之拾取件333將電性測試器31之已測射頻電子元件40移載至另一載台382而出料。
Please refer to FIG. 9, the fifth embodiment of the
請參閱第2、10圖,本發明測試裝置30應用於測試設備之示意圖
,包含機台50、供料裝置60、收料裝置70、本發明測試裝置30、輸送裝置80及中央控制裝置(圖未示出);供料裝置60係配置於機台50上,並設有至少一容納待測射頻電子元件之供料承置器61;收料裝置70係配置於機台50上,並設有至少一容納已測射頻電子元件之收料承置器71;本發明之測試裝置30配置於機台50上,包含電性測試器31、天線測試器32及接合機構33,以供壓接射頻電子元件,並對射頻電子元件執行電性測試作業及無線訊號測試作業,於本實施例中,於機台50之第一側及第二側分別配置測試裝置30;輸送裝置80配置於機台50上,並設有至少一輸送器,用以輸送射頻電子元件,於本實施例中,輸送裝置80設有作X-Y-Z方向位移之第一輸送器81,第一輸送器81於供料裝置60取出待測之射頻電子元件,並移載至二為載台之第二輸送器82,輸送裝置80之第三輸送器83於第二輸送器82與測試裝置30之電性測試器31取放交換待測射頻電子元件及已測之射頻電子元件,第一輸送器81再於第二輸送器82取出已測之射頻電子元件,並依測試結果,將已測之射頻電子元件移載至收料裝置70而分類收置;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。
Please refer to Figures 2 and 10, a schematic diagram of the
[習知]
10:射頻電子元件
11:接點
12:天線
21:電路板
22:測試座
221:探針
23:天線測試器
[本發明]
30:測試裝置
31:電性測試器
311:電路板
312:測試座
313:探針
314:抽氣孔
32:天線測試器
321:訊號作業件
L:作業軸線
33:接合機構
331:承載器
3311:容置部
3312:訊號通道
332:防擾壓件
3321:壓接面
3322:裝配面
T:傳輸通道
333:拾取件
34:第一平台
35:第二平台
36:調整器
371:箱罩
372:門板
373:測試室
374:輸送管
375:頂板
381、382:載台
40:射頻電子元件
41:接點
42:天線
50:機台
52:輸送器
60:供料裝置
61:供料承置器
70:收料裝置
71:收料承置器
80:輸送裝置
81:第一輸送器
82:第二輸送器
83:第三輸送器
[Learning]
10: RF electronic components
11: Contact
12: Antenna
21: circuit board
22: Test Block
221: Probe
23: Antenna Tester
[this invention]
30: Test device
31: Electrical tester
311: Circuit Board
312: Test Block
313: Probe
314: Vent
32: Antenna Tester
321: Signal work piece
L: work axis
33: Joint mechanism
331: Carrier
3311: containing part
3312: signal channel
332: Anti-disturbance pressure parts
3321: crimping surface
3322: Assembly surface
T: Transmission channel
333: Pickup
34: The first platform
35: The second platform
36: adjuster
371: box cover
372: Door Panel
373: Test Room
374: Conveying Pipe
375:
圖1:習知測試裝置之使用示意圖。 圖2:本發明測試裝置第一實施例之示意圖。 圖3:本發明測試裝置第一實施例之使用示意圖。 圖4:本發明測試裝置第二實施例之示意圖。 圖5:本發明測試裝置第二實施例之使用示意圖。 圖6:本發明測試裝置第三實施例之示意圖。 圖7:本發明測試裝置第三實施例之使用示意圖。 圖8:本發明測試裝置第四實施例之使用示意圖。 圖9:本發明測試裝置第五實施例之使用示意圖。 圖10:本發明測試裝置應用於測試設備之示意圖。 Figure 1: Schematic diagram of the use of the conventional testing device. Figure 2: A schematic diagram of the first embodiment of the testing device of the present invention. Figure 3: A schematic diagram of the use of the first embodiment of the testing device of the present invention. Figure 4: A schematic diagram of the second embodiment of the testing device of the present invention. Figure 5: A schematic diagram of the use of the second embodiment of the testing device of the present invention. Fig. 6: A schematic diagram of the third embodiment of the testing device of the present invention. Fig. 7: A schematic diagram of the use of the third embodiment of the test device of the present invention. Fig. 8: A schematic diagram of the use of the fourth embodiment of the testing device of the present invention. Fig. 9: A schematic diagram of the use of the fifth embodiment of the test device of the present invention. Figure 10: A schematic diagram of the testing device of the present invention applied to testing equipment.
30:測試裝置 30: Test device
31:電性測試器 31: Electrical tester
313:探針 313: Probe
32:天線測試器 32: Antenna Tester
33:接合機構 33: Joint mechanism
331:承載器 331: Carrier
3312:訊號通道 3312: signal channel
332:防擾壓件 332: Anti-disturbance pressure parts
3321:壓接面 3321: crimping surface
T:傳輸通道 T: Transmission channel
40:射頻電子元件 40: RF electronic components
41:接點 41: Contact
42:天線 42: Antenna
Claims (12)
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109123475A TWI741673B (en) | 2020-07-10 | 2020-07-10 | Wireless communication electronic component testing device and testing equipment using the same |
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| Publication Number | Publication Date |
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| TW202202856A TW202202856A (en) | 2022-01-16 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201144829A (en) * | 2010-06-04 | 2011-12-16 | Chroma Ate Inc | Testing apparatus and machine for preventing electromagnetic interference |
| TW201643447A (en) * | 2015-06-05 | 2016-12-16 | Hon Tech Inc | Electronic component testing device with anti-noise mechanism and test classification equipment applying same |
| TWM595759U (en) * | 2019-06-07 | 2020-05-21 | 台灣福雷電子股份有限公司 | Antenna testing module |
| TWM595761U (en) * | 2020-02-24 | 2020-05-21 | 中華精測科技股份有限公司 | Energy attenuation test device for packaged integrated circuit |
-
2020
- 2020-07-10 TW TW109123475A patent/TWI741673B/en active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201144829A (en) * | 2010-06-04 | 2011-12-16 | Chroma Ate Inc | Testing apparatus and machine for preventing electromagnetic interference |
| TW201643447A (en) * | 2015-06-05 | 2016-12-16 | Hon Tech Inc | Electronic component testing device with anti-noise mechanism and test classification equipment applying same |
| TWM595759U (en) * | 2019-06-07 | 2020-05-21 | 台灣福雷電子股份有限公司 | Antenna testing module |
| TWM595761U (en) * | 2020-02-24 | 2020-05-21 | 中華精測科技股份有限公司 | Energy attenuation test device for packaged integrated circuit |
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