TWI775815B - 缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法 - Google Patents

缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法 Download PDF

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Publication number: TWI775815B
Authority: TW; Taiwan
Prior art keywords: film; printing; double; defect inspection; meandering
Prior art date: 2017-03-03

Application number

TW107106813A

Other languages

English (en)

Chinese (zh)

Other versions

TW201837454A (zh

Inventor

洪昇均

李銀珪

加集功士

Original Assignee

日商住友化學股份有限公司

南韓商東友精細化工有限公司

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2017-03-03

Filing date

2018-03-01

Publication date

2022-09-01

2018-03-01 Application filed by 日商住友化學股份有限公司, 南韓商東友精細化工有限公司 filed Critical 日商住友化學股份有限公司

2018-10-16 Publication of TW201837454A publication Critical patent/TW201837454A/zh

2022-09-01 Application granted granted Critical

2022-09-01 Publication of TWI775815B publication Critical patent/TWI775815B/zh

Links

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Images

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J11/00—Devices or arrangements of selective printing mechanisms, e.g. ink-jet printers or thermal printers, for supporting or handling copy material in sheet or web form
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J3/00—Typewriters or selective printing or marking mechanisms characterised by the purpose for which they are constructed
- B41J3/407—Typewriters or selective printing or marking mechanisms characterised by the purpose for which they are constructed for marking on special material
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/888—Marking defects

Landscapes

Physics & Mathematics (AREA)
Analytical Chemistry (AREA)
General Health & Medical Sciences (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Pathology (AREA)
Biochemistry (AREA)
Immunology (AREA)
General Physics & Mathematics (AREA)
Textile Engineering (AREA)
Engineering & Computer Science (AREA)
Mathematical Physics (AREA)
Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Making Paper Articles (AREA)

TW107106813A 2017-03-03 2018-03-01 缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法 TWI775815B (zh)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
JP2017-040932		2017-03-03
JP2017040932		2017-03-03

Publications (2)

Publication Number	Publication Date
TW201837454A TW201837454A (zh)	2018-10-16
TWI775815B true TWI775815B (zh)	2022-09-01

Family

ID=63486402

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
TW107106813A TWI775815B (zh)	2017-03-03	2018-03-01	缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法

Country Status (4)

Country	Link
JP (1)	JP7086642B2 (ja)
KR (1)	KR102469408B1 (ja)
CN (1)	CN108535273B (ja)
TW (1)	TWI775815B (ja)

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* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CN110954401B (zh) *	2018-09-27	2022-08-05	Ykk株式会社	拉头固定部件检查装置
JP2020173188A (ja) *	2019-04-11	2020-10-22	住友化学株式会社	検査装置、検査方法、及び、フィルムの製造方法
KR20230058613A (ko) *	2020-08-31	2023-05-03	닛토덴코 가부시키가이샤	광학 적층체의 검사 방법
JP7587966B2 (ja) *	2020-11-19	2024-11-21	住友化学株式会社	積層光学フィルムの製造方法、印字装置及び積層光学フィルムの製造装置
JP2022090281A (ja) *	2020-12-07	2022-06-17	日東電工株式会社	光学フィルムの縁部検出方法
JP2022090247A (ja) *	2020-12-07	2022-06-17	日東電工株式会社	光学フィルムの縁部検出方法

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JPS63180323A (ja) *	1987-01-22	1988-07-25	Daiwa Can Co Ltd	製缶用金属コイル薄板の欠陥部の表示方法
TW200801442A (en) *	2006-06-22	2008-01-01	Welon Tech Inc	Sensor with functions of line-following and side-following having two-row light emitting source design used for deviation rectification
JP2014240816A (ja) *	2013-06-12	2014-12-25	住友化学株式会社	欠陥検査システム

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DE19906701C1 (de) *	1999-02-18	2000-12-14	Parsytec Comp Gmbh	Verfahren und Vorrichtung zum Detektieren, Kennzeichnen und Wiederauffinden von Fehlern eines Materialbandes
JP3741013B2 (ja) *	2001-09-17	2006-02-01	ウシオ電機株式会社	蛇行修正機構を備えた帯状ワークの露光装置
JP2003344302A (ja) *	2002-05-31	2003-12-03	Sumitomo Chem Co Ltd	偏光フィルムの検査法および検査装置
US20060164647A1 (en) *	2005-01-13	2006-07-27	Nagase & Co., Ltd.	Apparatus for marking a defect
JP2009243911A (ja) *	2008-03-28	2009-10-22	Toray Ind Inc	欠陥検査システム
JP4572955B2 (ja) *	2008-05-28	2010-11-04	富士ゼロックス株式会社	ベルト蛇行補正装置及びこれを用いた画像形成装置
JP5383099B2 (ja) *	2008-06-20	2014-01-08	キヤノン株式会社	記録ヘッドの製造方法および記録ヘッド
JP2011178144A (ja) *	2010-03-04	2011-09-15	Seiko Epson Corp	媒体処理装置のギャップ制御方法および媒体処理装置
JP5474869B2 (ja) *	2010-09-03	2014-04-16	日東電工株式会社	偏光膜を有する積層体ストリップロールの製造方法
JP5817466B2 (ja) *	2011-11-24	2015-11-18	セイコーエプソン株式会社	画像記録装置、画像記録方法
JP6410413B2 (ja) *	2013-08-02	2018-10-24	住友化学株式会社	欠陥検査システム及びフィルム製造装置
JP6438718B2 (ja) *	2014-09-11	2018-12-19	株式会社Ｓｃｒｅｅｎホールディングス	印刷装置および印刷方法
CN204228993U (zh) *	2014-11-21	2015-03-25	日东电工株式会社	偏光膜的制造装置
JP6269560B2 (ja) *	2015-04-10	2018-01-31	コニカミノルタ株式会社	画像形成装置および画像形成システム

2018
- 2018-02-27 KR KR1020180023839A patent/KR102469408B1/ko active Active
- 2018-02-28 CN CN201810169803.8A patent/CN108535273B/zh active Active
- 2018-03-01 TW TW107106813A patent/TWI775815B/zh active
- 2018-03-01 JP JP2018036991A patent/JP7086642B2/ja active Active

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Publication number	Priority date	Publication date	Assignee	Title
JPS63180323A (ja) *	1987-01-22	1988-07-25	Daiwa Can Co Ltd	製缶用金属コイル薄板の欠陥部の表示方法
TW200801442A (en) *	2006-06-22	2008-01-01	Welon Tech Inc	Sensor with functions of line-following and side-following having two-row light emitting source design used for deviation rectification
JP2014240816A (ja) *	2013-06-12	2014-12-25	住友化学株式会社	欠陥検査システム

Also Published As

Publication number	Publication date
KR20180101211A (ko)	2018-09-12
TW201837454A (zh)	2018-10-16
CN108535273A (zh)	2018-09-14
JP7086642B2 (ja)	2022-06-20
JP2018146581A (ja)	2018-09-20
KR102469408B1 (ko)	2022-11-22
CN108535273B (zh)	2022-03-25

Publication	Publication Date	Title
TWI775815B (zh)	2022-09-01	缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法
JP6177017B2 (ja)	2017-08-09	欠陥検査システム
TW201508266A (zh)	2015-03-01	缺陷檢查裝置、光學部件之製造系統及光學顯示裝置之生產系統
JP6182806B2 (ja)	2017-08-23	欠陥検査システム及びフィルムの製造装置
KR102475056B1 (ko)	2022-12-06	결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트
KR102476511B1 (ko)	2022-12-09	마킹 장치, 결함 검사 시스템 및 필름 제조 방법
KR102241700B1 (ko)	2021-04-19	결함 검사 시스템 및 필름 제조 장치
KR102478804B1 (ko)	2022-12-16	마킹 장치, 결함 검사 시스템 및 필름 제조 방법
WO2014192334A1 (ja)	2014-12-04	欠陥検査装置及び光学表示デバイスの生産システム
TWI762592B (zh)	2022-05-01	缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法
JP7195042B2 (ja)	2022-12-23	欠陥情報読取方法、欠陥情報読取システム及びフィルム製造装置
KR20180101209A (ko)	2018-09-12	마킹 장치, 결함 검사 시스템 및 필름 제조 방법
JP6179886B2 (ja)	2017-08-16	欠陥検査装置、光学表示デバイスの生産システム及び光学シートの製造システム

Legal Events

Date	Code	Title	Description
2022-09-01	GD4A	Issue of patent certificate for granted invention patent