TWI771750B - Wire bonding apparatus and wire bonding method - Google Patents
Wire bonding apparatus and wire bonding method Download PDFInfo
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- TWI771750B TWI771750B TW109131438A TW109131438A TWI771750B TW I771750 B TWI771750 B TW I771750B TW 109131438 A TW109131438 A TW 109131438A TW 109131438 A TW109131438 A TW 109131438A TW I771750 B TWI771750 B TW I771750B
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B06B—METHODS OR APPARATUS FOR GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS OF INFRASONIC, SONIC, OR ULTRASONIC FREQUENCY, e.g. FOR PERFORMING MECHANICAL WORK IN GENERAL
- B06B1/00—Methods or apparatus for generating mechanical vibrations of infrasonic, sonic, or ultrasonic frequency
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Abstract
Description
本發明之實施形態係關於一種導線接合裝置及導線接合方法。Embodiments of the present invention relate to a wire bonding apparatus and a wire bonding method.
已知一種使導線接合於工件之被接合部之導線接合裝置(專利文獻1)。於如此之導線接合裝置中,追求抑制發生被接合部與導線之間之接合不良。 [先前技術文獻] [專利文獻]A wire bonding apparatus for bonding a wire to a joined portion of a workpiece is known (Patent Document 1). In such a wire bonding apparatus, it is sought to suppress the occurrence of poor bonding between the part to be bonded and the wire. [Prior Art Literature] [Patent Literature]
[專利文獻1] 日本特開平10-98064號公報[Patent Document 1] Japanese Patent Application Laid-Open No. 10-98064
[發明所欲解決之課題][The problem to be solved by the invention]
本發明所欲解決之課題在於提供一種可抑制發生被接合部與導線之間之接合不良之導線接合裝置及導線接合方法。 [解決課題之技術手段]The problem to be solved by the present invention is to provide a wire bonding apparatus and a wire bonding method which can suppress the occurrence of poor bonding between the part to be bonded and the wire. [Technical means to solve the problem]
實施形態之導線接合裝置係在導線壓抵於被接合部之狀態下使超音波振動產生,而使前述導線接合於前述被接合部者,且具備:接合工具,其使導線與被接合部接觸並施加荷重;超音波銲頭,其產生超音波振動;荷重感測器,其連續地檢測自前述接合工具施加於前述被接合部之荷重;及控制部,其控制前述接合工具及前述超音波銲頭之動作。前述控制部解析自前述導線與前述被接合部接觸起至產生前述超音波振動之期間自前述荷重感測器輸出之前述荷重之資料,且基於解析結果,控制前述接合工具及前述超音波銲頭之動作。The wire bonding apparatus according to the embodiment generates ultrasonic vibration in a state where the wire is pressed against the part to be joined to bond the wire to the part to be joined, and includes a bonding tool for bringing the wire into contact with the part to be joined and apply a load; an ultrasonic welding head, which generates ultrasonic vibration; a load sensor, which continuously detects the load applied to the above-mentioned joined part from the above-mentioned joining tool; and a control part, which controls the above-mentioned joining tool and the above-mentioned ultrasonic wave Action of the welding head. The control unit analyzes the data of the load output from the load cell during the period from the time when the wire contacts the part to be bonded to the generation of the ultrasonic vibration, and controls the bonding tool and the ultrasonic welding head based on the analysis result action.
以下,對於本發明之各實施形態一面參照圖式一面進行說明。 圖式係示意性或概念性顯示者,各部分之厚度與寬度之關係、部分間之大小之比例等並非一定與現實之實物相同。即便為表示相同之部分之情形下,亦有根據圖式而彼此之尺寸或比率不同地表示之情形。 於本發明申請案說明書與各圖中,對於已出現之圖式賦予與前述之要件相同之要件以相同之符號,並適當省略詳細之說明。Hereinafter, each embodiment of the present invention will be described with reference to the drawings. The drawings are schematic or conceptual representations, and the relationship between the thickness and width of each part, and the ratio of sizes between parts are not necessarily the same as the actual objects. Even in the case of showing the same part, the size or ratio of each other may be shown differently according to the drawings. In the description of the application of the present invention and each of the drawings, the same elements as those described above are given the same symbols to the existing drawings, and detailed descriptions are appropriately omitted.
圖1係示意性地顯示實施形態之導線接合裝置之概略圖。
圖2係示意性地顯示實施形態之導線接合裝置之一部分之概略圖。
如圖1及圖2所示般,實施形態之導線接合裝置100具備:接合頭10、XY載台20、接合載台30、荷重感測器40、及控制部50。FIG. 1 is a schematic diagram schematically showing a wire bonding apparatus according to an embodiment.
FIG. 2 is a schematic view schematically showing a part of the wire bonding apparatus of the embodiment.
As shown in FIGS. 1 and 2 , the
接合頭10具有:接合工具11、超音波銲頭12、接合臂13、及驅動部14。The bonding
接合工具11放出作為接合材之導線3。接合工具11例如為接合毛細管。導線3例如為鋁線、金線、銀線、或銅線等。接合工具11使導線3與載置於接合載台30之工件1之被接合部2接觸,並對被接合部2施加荷重。The
超音波銲頭12產生超音波振動。超音波銲頭12具有產生超音波振動之超音波振子。超音波銲頭12支持接合工具11。自超音波銲頭12產生之超音波振動經由接合工具11傳遞至導線3。藉由在導線3與被接合部2接觸之狀態下,超音波振動傳遞至導線3,而將導線3接合於被接合部2。超音波銲頭12與控制部50電性連接。The
接合臂13支持超音波銲頭12。即,接合臂13經由超音波銲頭12支持接合工具11。接合臂13以軸部13a為中心可轉動地設置。The
驅動部14以軸部13a為中心使接合臂13於Z方向上驅動。驅動部14例如為線性馬達。藉由接合臂13於Z方向上移動,而由接合臂13支持之接合工具11及超音波銲頭12於Z方向上移動。藉由接合工具11於Z方向上移動,可使導線3與被接合部2接觸並自接合工具11施加荷重。驅動部14與控制部50電性連接。The
再者,於本申請案說明書中,以連結接合工具11與工件1之方向為Z方向。以與Z方向正交之方向為X方向。以與Z方向及X方向正交之方向為Y方向。In addition, in the specification of this application, the direction which connects the
接合頭10搭載於XY載台20。XY載台20可於X方向及Y方向上移動。藉由XY載台20於X方向及Y方向上移動,而接合頭10於X方向及Y方向上移動。即,XY載台20作為對設置於接合頭10之接合工具11等於X方向及Y方向上進行定位之定位機構發揮功能。XY載台20與控制部50電性連接。The bonding
接合載台30支持導線接合之對象即工件1。接合載台30例如藉由吸附工件1而予以支持。工件1例如為IC晶片等半導體晶片或基板。於被接合部2,例如設置有凸塊2a。The
荷重感測器40連續性地檢測自接合工具11施加於工件1之被接合部2之荷重。荷重感測器40例如具有應變儀。荷重感測器40亦可為檢測施加於接合工具11之工件1側之前端之荷重者。於本例中,荷重感測器40安裝於接合臂13。荷重感測器40與控制部50電性連接。荷重感測器40將檢測到之荷重之資料輸出至控制部50。The
控制部50控制超音波銲頭12、驅動部14、及XY載台20之動作。控制部50可藉由控制超音波銲頭12,而控制自超音波銲頭12產生之超音波振動之輸出。The
控制部50可藉由控制驅動部14之動作,而控制接合工具11之動作。更具體而言,控制部50可藉由控制驅動部14而使接合臂13於Z方向上驅動,而控制接合工具11之Z方向上之位置。藉此,控制部50可控制自接合工具11施加於被接合部2之荷重之大小。The
控制部50可藉由控制XY載台20之動作,而控制接合工具11之動作。更具體而言,控制部50可藉由控制XY載台20而使接合頭10於X方向及Y方向上驅動,而控制接合工具11於X方向及Y方向上之位置。The
又,控制部50解析自荷重感測器40輸出之荷重之資料,並基於解析結果,控制接合工具11及超音波銲頭12之動作。對於控制部50之荷重之資料之解析及基於其之控制將於後述。Moreover, the
如圖2所示般,導線接合裝置100藉由在將自接合工具11放出之導線3壓抵於載置在接合載台30之工件1之被接合部2之狀態下,自超音波銲頭12產生超音波振動,而使導線3接合於被接合部2。As shown in FIG. 2 , the
圖3係顯示在進行導線接合時自荷重感測器輸出之荷重信號波形之一例之圖表。
圖4係顯示在進行導線接合時自荷重感測器輸出之荷重信號波形之又一例之圖表。
於圖3及圖4中,以實線表示導線3對於被接合部2之接合狀態為良好之情形之荷重信號波形,以虛線表示導線3對於被接合部2之接合狀態為不良之情形之荷重信號波形。荷重信號波形表示荷重(荷重信號)之大小相對於時間之變化。FIG. 3 is a graph showing an example of a load signal waveform output from a load cell during wire bonding.
FIG. 4 is a graph showing yet another example of the load signal waveform output from the load cell during wire bonding.
In FIG. 3 and FIG. 4, the solid line represents the load signal waveform when the bonding state of the
當使接合工具11朝向被接合部2於Z方向上移動(下降)時,於時點t1,保持於接合工具11之導線3與被接合部2接觸。當導線3與被接合部2接觸時,由荷重感測器40檢測到之荷重開始增加。當使接合工具11進一步下降時,於荷重感測器40中檢測到之荷重不斷增加,並到達時點t2。時點t2係開始接合動作之時點,該接合動作以一面自超音波銲頭12產生超音波振動,一面將特定之荷重施加於被接合部2之方式利用接合工具11使導線3接合於被接合部2。時點t2例如係荷重之值成為特定值以上之時點。時點t2例如亦可係接合工具11之Z方向上之位置成為特定位置以下之時點。時點t2例如還可係接合工具11之Z方向上之移動速度成為特定值以下之時點。當接合動作開始時,於荷重感測器40中檢測到之荷重如圖3所示般不斷減少,於時點t3與時點t4之間變為平穩。又,根據接合條件,亦有於荷重感測器40中檢測到之荷重如圖4所示般不斷增加,於時點t3與時點t4之間變為平穩之情形。當到達時點t4時,使接合工具11以離開被接合部2之方式於Z方向上移動(上升),並將導線3切斷(導線切斷)。當進行導線切斷時,於荷重感測器40中檢測到之荷重為零。When the
如圖3及圖4所示般,於時點t1至時點t2之間,導線3對於被接合部2之接合狀態為良好之情形之荷重信號波形(實線),與導線3對於被接合部2之接合狀態為不良之情形之荷重信號波形(虛線)不同。於導線3對於被接合部2之接合狀態為良好情形下,荷重例如如圖3及圖4所示般,於時點t1至時點t2之間,一面反曲一面增加。另一方面,於導線3對於被接合部2之接合狀態為不良之情形下,荷重例如如圖3及圖4所示般,於時點t1至時點t2之間,不反曲地增加。As shown in FIGS. 3 and 4 , between the time point t1 and the time point t2, the load signal waveform (solid line) in the case where the bonding state of the
如此之時點t1至時點t2之間之荷重信號波形之不同,例如考量為根據被接合部2之狀態之不同而產生。特別是,當於被接合部2形成有凸塊2a之情形下,時點t1至時點t2之間之荷重信號波形之不同,例如考量為根據凸塊2a之高度或形狀等而產生。The difference in the waveform of the load signal between the time point t1 and the time point t2 is considered, for example, due to the difference in the state of the joined
於實施形態中,控制部50根據在導線3與被接合部2接觸後直至產生超音波振動為止之期間(時點t1至時點t2之期間)由荷重感測器40檢測到之荷重而算出判定值,並基於判定值,控制接合工具11及超音波銲頭12之動作。對於判定值之算出方法將於後述。In the embodiment, the
更具體而言,控制部50在判定值為預設之基準範圍內之情形下,進行接合動作。又,控制部50例如在判定值為基準範圍外之情形下,不進行接合動作,並停止接合工具11及超音波銲頭12之動作。控制部50例如在判定值為基準範圍外之情形下,亦可在進行了接合動作之後,停止接合工具11及超音波銲頭12之動作。More specifically, the
又,控制部50例如亦可在判定值為基準範圍內之情形下,以第1條件進行接合動作,在判定值為基準範圍外之情形下,以與第1條件不同之第2條件進行接合動作。該情形下,第1條件與第2條件間,在自超音波銲頭12產生之超音波振動之輸出、進行接合動作之時間、及自接合工具11施加於被接合部2之荷重之至少任一者上有所不同。即,控制部50例如可在判定值為基準範圍外之情形下,於進行接合動作時,使自超音波銲頭12產生之超音波振動之輸出、進行接合動作之時間、及自接合工具11施加於被接合部2之荷重之至少任一者,自判定值為基準範圍內之情形有所變化。In addition, the
再者,於控制部50中,進行算出判定值之部分,可與進行各部之動作控制之部分分開設置。即,控制部50可具有進行各部之動作控制的控制區域、及進行算出判定值的解析區域。In addition, in the
又,控制部50例如可基於判定值而推定導線3對於被接合部2之接合狀態之好壞。該情形下,控制部50可將接合狀態之好壞之推定結果顯示於與控制部50電性連接之顯示部等。Moreover, the
以下,對於判定值之算出方法之例進行說明。
圖5(a)及圖5(b)係顯示判定值之算出方法之一例之說明圖。
圖5(a)表示導線3對於被接合部2之接合狀態為良好之荷重信號波形。另一方面,圖5(b)表示導線3對於被接合部2之接合狀態為不良之荷重信號波形。Hereinafter, an example of the calculation method of the judgment value will be described.
FIGS. 5( a ) and 5 ( b ) are explanatory diagrams showing an example of the calculation method of the determination value.
FIG. 5( a ) shows a load signal waveform in which the bonding state of the
如圖5(a)及圖5(b)所示般,判定值例如係於自導線3與被接合部2接觸起至產生超音波振動之期間,由荷重感測器40檢測之荷重信號波形之任意時間區間內之荷重之時間積分值。As shown in FIGS. 5( a ) and 5 ( b ), the determination value is, for example, the waveform of the load signal detected by the
於圖5(a)及圖5(b)之例中,任意之時間區間係時點ta至時點tb之期間。時點ta及時點tb係時點t1至時點t2之期間之任意時點。時點ta可與時點t1相同。於圖5(a)及圖5(b)中,時點ta至時點tb之期間內的荷重之時間積分值作為以斜線表示之區域之面積而示出。In the examples of FIG. 5( a ) and FIG. 5( b ), the arbitrary time interval is the period from the time point ta to the time point tb. The time point ta and the time point tb are any time points during the period from the time point t1 to the time point t2. The time point ta may be the same as the time point t1. In FIGS. 5( a ) and 5( b ), the time-integrated value of the load in the period from the time point ta to the time point tb is shown as the area of the region indicated by the diagonal lines.
如圖5(a)及圖5(b)所示般,例如,導線3對於被接合部2之接合狀態為良好之時間積分值S1,大於導線3對於被接合部2之接合狀態為不良之時間積分值S2。於該情形下,基準範圍之下限設定為大於時間積分值S2、且小於時間積分值S1之值。又,基準範圍之上限設定為大於時間積分值S1之值。As shown in FIGS. 5( a ) and 5 ( b ), for example, the time integral value S1 at which the bonding state of the
圖6(a)及圖6(b)係顯示圖5(a)及圖5(b)所示之判定值之算出方法之變化例之說明圖。於圖6(a)及圖6(b)中,表示導線3對於被接合部2之接合狀態為良好之荷重信號波形。FIGS. 6( a ) and 6( b ) are explanatory diagrams showing a variation of the calculation method of the determination value shown in FIGS. 5( a ) and 5 ( b ). In FIGS. 6( a ) and 6 ( b ), the load signal waveforms in which the bonding state of the
如圖6(a)所示般,判定值可為自導線3與被接合部2接觸起至產生超音波振動之期間由荷重感測器40檢測之荷重信號波形之任意時間區間內的荷重之時間積分值之一部分。As shown in FIG. 6( a ), the determination value can be the sum of the load in any time interval of the load signal waveform detected by the
於圖6(a)之例中,判定值例如以S-Fmin×(tb-ta)表示。S係圖5(a)及圖5(b)中所示之時點ta至時點tb之期間的荷重之時間積分值S1或S2。Fmin係時點ta之荷重之大小。圖6(a)中,S-Fmin×(tb-ta)作為以斜線表示之區域之面積而示出。In the example of FIG. 6( a ), the determination value is represented by, for example, S-Fmin×(tb-ta). S is the time-integrated value S1 or S2 of the load during the period from the time point ta to the time point tb shown in FIG. 5( a ) and FIG. 5( b ). Fmin is the size of the load at the time point ta. In FIG.6(a), S-Fmin*(tb-ta) is shown as the area of the area|region shown with a diagonal line.
如圖6(b)所示般,判定值亦可為於導線3與被接合部2接觸後直至產生超音波振動為止之期間由荷重感測器40檢測到之荷重信號波形之任意之時間區間內之時間積分值之比例(面積比)。As shown in FIG. 6( b ), the determination value can also be an arbitrary time interval of the load signal waveform detected by the
於圖6(b)之例中,判定值例如以Sm/Sn表示。Sm例如係圖6(a)中所示之S-Fmin×(tb-ta)。Sm例如亦可為圖5(a)及圖5(b)中所示之時點ta至時點tb之期間之荷重之時間積分值S1或S2。於圖6(b)中,Sm作為以斜線表示之區域之面積而示出。Sn作為自具有以荷重信號波形上之時點ta之點P與時點tb之點Q為對角之長方形SQ去除Sm之區域之面積而示出。In the example of FIG.6(b), the determination value is represented by Sm/Sn, for example. Sm is, for example, S-Fmin×(tb-ta) shown in FIG. 6( a ). Sm may be, for example, the time-integrated value S1 or S2 of the load during the period from the time point ta to the time point tb shown in FIG. 5( a ) and FIG. 5( b ). In FIG.6(b), Sm is shown as the area of the area|region shown with an oblique line. Sn is shown as the area of a region in which Sm is removed from a rectangle SQ having a point P at a time point ta and a point Q at a time point tb on the load signal waveform as diagonal corners.
圖7(a)及圖7(b)顯示判定值之算出方法之又一例之說明圖。
圖7(a)表示導線3對於被接合部2之接合狀態為良好之情形之荷重信號波形。另一方面,圖7(b)表示導線3對於被接合部2之接合狀態為不良之情形之荷重信號波形。7(a) and 7(b) are explanatory diagrams showing still another example of the calculation method of the determination value.
FIG. 7( a ) shows the load signal waveform when the bonding state of the
如圖7(a)及圖7(b)所示般,判定值例如亦可為將於導線3與被接合部2接觸後直至產生超音波振動為止之期間由荷重感測器40檢測到之荷重信號波形上之任意之兩點予以連結之直線、與兩點間之荷重信號波形之間之最大距離。As shown in FIGS. 7( a ) and 7 ( b ), the determination value may be, for example, a value detected by the
於圖7(a)及圖7(b)之例中,任意之兩點為點p1及點p2。點p1及點p2係時點t1至時點t2之期間之荷重信號波形上之任意之點。連結任意之兩點之直線為直線A。於圖7(a)及圖7(b)中,判定值以直線A、與在點p1與點p2之間最遠離直線A之荷重信號波形上之點X之間之距離D而表示。再者,在點X相對於直線A位於上方之情形下,距離D為正值,在點X相對於直線A位於下方之情形下,距離D為負值。即,圖7(a)之距離D1為正值,圖7(b)之距離D2為負值。In the example of FIG.7(a) and FIG.7(b), any two points are point p1 and point p2. The point p1 and the point p2 are arbitrary points on the waveform of the load signal during the period from the time point t1 to the time point t2. A straight line connecting any two points is straight line A. In FIGS. 7( a ) and 7 ( b ), the determination value is represented by the distance D between the straight line A and the point X on the load signal waveform that is farthest from the straight line A between the point p1 and the point p2 . Furthermore, when the point X is located above the line A, the distance D is a positive value, and when the point X is located below the line A, the distance D is a negative value. That is, the distance D1 in Fig. 7(a) is a positive value, and the distance D2 in Fig. 7(b) is a negative value.
如圖7(a)及圖7(b)所示般,例如,導線3對於被接合部2之接合狀態為良好之情形之距離D1,大於導線3對於被接合部2之接合狀態為不良之情形之距離D2。於該情形下,基準範圍之下限設定為大於距離D2且小於距離D1之值。又,基準範圍之上限設定為大於距離D1之值。As shown in FIG. 7( a ) and FIG. 7( b ), for example, the distance D1 in the case where the bonding state of the
圖8(a)及圖8(b)係顯示判定值之算出方法之另一例之說明圖。
圖8(a)表示導線3對於被接合部2之接合狀態為良好之情形之荷重信號波形。另一方面,圖8(b)表示導線3對於被接合部2之接合狀態為不良之情形之荷重信號波形。FIGS. 8( a ) and 8( b ) are explanatory diagrams showing another example of the calculation method of the determination value.
FIG. 8( a ) shows a load signal waveform when the bonding state of the
如圖8(a)及圖8(b)所示般,判定值例如可為於導線3與被接合部2接觸後直至產生超音波振動為止之期間由荷重感測器40檢測到之荷重信號波形之任意之時點之荷重之大小。As shown in FIG. 8( a ) and FIG. 8( b ), the determination value may be, for example, a load signal detected by the
於圖8(a)及圖8(b)之例中,任意之時點tc係時點t1至時點t2之期間之任意之時點。In the example of FIG.8(a) and FIG.8(b), the arbitrary time point tc is an arbitrary time point in the period from the time point t1 to the time point t2.
如圖8(a)及圖8(b)所示般,例如,導線3對於被接合部2之接合狀態為良好之情形之時點tc下之荷重之大小L1,大於導線3對於被接合部2之接合狀態為不良之情形之時點tc下之荷重之大小L2。於該情形下,基準範圍之下限設定為大於荷重之大小L2、且小於荷重之大小L1之值。又,基準範圍之上限設定為大於荷重之大小L1之值。As shown in FIG. 8( a ) and FIG. 8( b ), for example, the magnitude L1 of the load at the time point tc when the bonding state of the
圖9(a)及圖9(b)係顯示判定值之算出方法之再一例之說明圖。
圖9(a)表示導線3對於被接合部2之接合狀態為良好之情形之荷重信號波形。另一方面,圖9(b)表示導線3對於被接合部2之接合狀態為不良之情形之荷重信號波形。FIGS. 9( a ) and 9 ( b ) are explanatory diagrams showing still another example of the calculation method of the determination value.
FIG. 9( a ) shows the load signal waveform when the bonding state of the
如圖9(a)及圖9(b)所示般,判定值例如可為於導線3與被接合部2接觸後直至產生超音波振動為止之期間由荷重感測器40檢測到之荷重信號波形之任意之時點之荷重之時間微分值。As shown in FIG. 9( a ) and FIG. 9( b ), the determination value may be, for example, a load signal detected by the
於圖9(a)及圖9(b)之例中,任意之時點td係時點t1至時點t2之期間之任意之時點。於圖9(a)及圖9(b)中,時點td之荷重之時間微分值,作為以兩點鏈線表示之對於時點td之荷重信號波形之切線B之斜率而示出。In the example of FIG.9(a) and FIG.9(b), the arbitrary time point td is an arbitrary time point in the period from the time point t1 to the time point t2. In FIGS. 9( a ) and 9( b ), the time differential value of the load at the time point td is shown as the slope of the tangent B to the load signal waveform at the time point td represented by a two-dot chain line.
如圖9(a)及圖9(b)所示般,例如,導線3對於被接合部2之接合狀態為良好之情形之時間微分值(切線B1之斜率),大於導線3對於被接合部2之接合狀態為不良之情形之時間微分值(切線B2之斜率)。於該情形下,基準範圍之下限設定為大於時間微分值(切線B2之斜率)、且小於時間微分值(切線B1之斜率)之值。又,基準範圍之上限設定為大於時間微分值(切線B1之斜率)之值。As shown in FIGS. 9( a ) and 9 ( b ), for example, the time differential value (the slope of the tangent B1 ) when the bonding state of the
以下,對於實施形態之導線接合方法進行說明。 實施形態之導線接合方法具有:探查工序、解析工序、及動作工序。於實施形態之導線接合方法中,例如重複進行探查工序、解析工序、及動作工序。Hereinafter, the wire bonding method of the embodiment will be described. The wire bonding method of the embodiment includes a probe step, an analysis step, and an operation step. In the wire bonding method of the embodiment, for example, a probe step, an analysis step, and an operation step are repeatedly performed.
於探查工序中,一面使導線3與被接合部2接觸並施加荷重,一面連續性地檢測施加於被接合部2之荷重。於解析工序中,根據在探查工序中檢測到之荷重算出判定值。於動作工序中,當在解析工序中算出之判定值為預設之基準範圍內之情形下,在對被接合部2施加荷重之狀態下,進行產生超音波振動而使導線3接合於被接合部2之接合動作,當在解析工序中算出之判定值為基準範圍外之情形下,進行與判定值為基準範圍內之情形不同之動作。此處,所謂「與判定值為基準範圍內之情形不同之動作」,例如包含:不進行接合動作、在進行了接合動作之後停止裝置、及以與判定值為基準範圍內之情形不同之條件進行接合動作等。以下,對於各種情形之流程進行說明。In the probing step, the load applied to the joined
圖10係顯示實施形態之導線接合方法之一例之流程圖。
如圖10所示般,控制部50使接合工具11朝向工件1之被接合部2下降(步驟S101)。控制部50使接合工具11下降直至由接合工具11保持之導線3與被接合部2接觸為止(步驟S102)。FIG. 10 is a flowchart showing an example of the wire bonding method of the embodiment.
As shown in FIG. 10, the
當導線3與被接合部2接觸時,控制部50根據由荷重感測器40檢測到之荷重算出判定值(步驟S103)。當算出判定值時,控制部50判定判定值是否為預設之基準範圍內(步驟S104)。When the
若判定值為基準範圍內(步驟S104:是),控制部50以自接合工具11對被接合部2施加預設之荷重之方式一面控制接合工具11之Z方向上之位置,一面自超音波銲頭12產生超音波振動,而進行使導線3接合於被接合部2之接合動作(步驟S105)。If the determined value is within the reference range (step S104: YES), the
當經過特定時間,控制部50使接合工具11上升,將導線3切斷(導線切斷)(步驟S106)。若所有的導線接合結束(步驟S107:是),控制部50使接合工具11移動至原點,而結束接合。若所有的導線接合尚未結束(步驟S107:否),控制部50使接合工具11移動至下一個被接合部2,返回步驟S101,而開始下一導線接合。When the predetermined time elapses, the
若判定值為基準範圍外(步驟S104:否),控制部50不進行接合動作,而使接合工具11及超音波銲頭12之動作停止(步驟S108)。又,此時,控制部50例如可藉由使異常發生燈點亮等,而報知發生了異常。在進行步驟S108之後,控制部50可在進行了某些處理之後,使動作再次開始(移向步驟S107)。If the determination value is outside the reference range (step S104: NO), the
再者,於該流程中,步驟S101及S102為探查工序,步驟S103及S104為解析工序,步驟S105~S108為動作工序。In addition, in this flow, steps S101 and S102 are exploration steps, steps S103 and S104 are analysis steps, and steps S105 to S108 are operation steps.
圖11係顯示實施形態之導線接合方法之又一例之流程圖。 由於圖11所示之流程圖之步驟S201~S207與圖10所示之流程圖之步驟S101~S107實質上相同,故省略說明。FIG. 11 is a flowchart showing still another example of the wire bonding method of the embodiment. Since steps S201-S207 of the flowchart shown in FIG. 11 are substantially the same as steps S101-S107 of the flowchart shown in FIG. 10, the description is omitted.
於圖11所示之流程圖中,若判定值為基準範圍外(步驟S204:否),控制部50與步驟S205同樣地進行接合動作(步驟S208),與步驟S206同樣地進行導線切斷(步驟S209)。在進行導線切斷之後,控制部50使接合工具11及超音波銲頭12之動作停止(步驟S210)。又,此時,控制部50例如可藉由使異常發生燈點亮等,而報知發生了異常。在進行步驟S210之後,控制部50可在進行了某些處理之後,使動作再次開始(往向步驟S207)。In the flowchart shown in FIG. 11 , if the determination value is outside the reference range (step S204 : NO), the
再者,於該流程中,步驟S201及S202為探查工序,步驟S203及S204為解析工序,步驟S205~S210為動作工序。In addition, in this flow, steps S201 and S202 are exploration steps, steps S203 and S204 are analysis steps, and steps S205 to S210 are operation steps.
圖12係顯示實施形態之導線接合方法之另一例之流程圖。
由於圖12所示之流程圖之步驟S301~S307與圖10所示之流程圖之步驟S101~S107實質上相同,故省略說明。於步驟S305中,控制部50以第1條件進行接合動作。FIG. 12 is a flowchart showing another example of the wire bonding method of the embodiment.
Since steps S301 to S307 of the flowchart shown in FIG. 12 are substantially the same as steps S101 to S107 of the flowchart shown in FIG. 10, the description is omitted. In step S305, the
於圖12所示之流程圖中,若判定值為基準範圍外(步驟S304:否),控制部50以與步驟S305之接合動作中之第1條件不同之第2條件進行接合動作(步驟S308)。進行接合動作之後,控制部50與步驟S306同樣地進行導線切斷(步驟S309)。進行導線切斷之後,控制部50進行所有的導線接合是否結束之判斷(步驟S307)。In the flowchart shown in FIG. 12 , if the determined value is outside the reference range (step S304 : NO), the
於實施形態中,在進行了導線切斷(步驟S309)之後,控制部50可在不進行步驟S307下,停止接合工具11及超音波銲頭12之動作。又,此時,控制部50例如可藉由使異常發生燈點亮等,而報知發生了異常。In the embodiment, after the wire cutting (step S309 ) is performed, the
再者,於該流程中,步驟S301及S302為探查工序,步驟S303及S304為解析工序,步驟S305~S309為動作工序。In addition, in this flow, steps S301 and S302 are exploration steps, steps S303 and S304 are analysis steps, and steps S305 to S309 are operation steps.
以下,對於實施形態之導線接合裝置及實施形態之導線接合方法之作用效果進行說明。 於半導體裝置之製造工序中,較多使用在作為半導體晶片之電極之墊與作為導線架或基板之電極之導線之間利用金屬細線之導線進行連接之導線接合裝置。使用如此之導線接合裝置之導線接合,通常藉由使接合工具相對於墊或導線等被接合部於Z方向上移動,將在接合工具之前端被保持之導線朝被接合部按壓並壓抵,且藉由超音波銲頭對導線施加超音波振動而進行。Hereinafter, the effects of the wire bonding apparatus of the embodiment and the wire bonding method of the embodiment will be described. In the manufacturing process of a semiconductor device, a wire bonding apparatus that uses wires of thin metal wires to connect between pads serving as electrodes of a semiconductor chip and wires serving as electrodes of a lead frame or a substrate is often used. In wire bonding using such a wire bonding apparatus, generally, by moving the bonding tool in the Z direction relative to the part to be bonded, such as a pad or a wire, the wire held at the front end of the bonding tool is pressed and pressed against the part to be bonded, And it is carried out by applying ultrasonic vibration to the wire by the ultrasonic welding head.
於使用如此之方法進行導線接合之情形下,有時因被接合部之狀態等而在被接合部與導線之間未獲得充分之接合強度,而發生導線自被接合部剝離等之接合不良。特別是,在對形成於被接合部之凸塊使導線予以接合之情形下,有時因凸塊之高度或形狀等要因,而在凸塊與導線之間未獲得充分之接合強度,而發生導線自凸塊剝離等之接合不良。考量為此種情況係在凸塊之高度或形狀等非為正常之情形下,導線與凸塊之接合面積減小、或者因接合時之凸塊之變形而未對接合部分施加充分之荷重之故。When wire bonding is performed using such a method, a sufficient bonding strength may not be obtained between the bonded portion and the wire due to the state of the bonded portion and the like, and bonding failures such as peeling of the wire from the bonded portion may occur. In particular, in the case of bonding wires to bumps formed in parts to be bonded, there may be cases where sufficient bonding strength is not obtained between the bumps and the wires due to factors such as the height or shape of the bumps. Poor bonding such as wire peeling from bumps. It is considered that this situation is due to the fact that the height or shape of the bump is abnormal, the bonding area between the wire and the bump is reduced, or due to the deformation of the bump during bonding, a sufficient load is not applied to the bonding portion. Therefore.
因此,提議藉由通電或電容檢測等檢測被接合部與導線之間之接合不良之方法、或檢測接合時之荷重或接合工具之Z方向上之位置而判定導線與被接合部之間之接合狀態之好壞之方法。然而,於該等之先前之接合不良之檢測方法中,由於在使導線接合於被接合部之接合動作之中途、或者在接合動作之完成後檢測接合不良之發生,故雖然可在接合後發現發生了接合不良之產品,但無法抑制接合不良之產生本身。因此,存在產品之成品率降低之問題。Therefore, it is proposed to determine the bonding between the wire and the bonding part by detecting the poor bonding between the bonding part and the wire, such as energization or capacitance detection, or by detecting the load during bonding or the position of the bonding tool in the Z direction. A way of being good or bad. However, in these conventional methods for detecting poor bonding, since the occurrence of poor bonding is detected in the middle of the bonding operation for bonding the wire to the portion to be bonded, or after the bonding operation is completed, it is possible to find out after bonding. Products with defective joints have occurred, but the occurrence of joint failures itself cannot be suppressed. Therefore, there is a problem that the yield of the product decreases.
因此,於實施形態中,設置連續性地檢測自接合工具11施加於被接合部2之荷重之荷重感測器40,藉由控制部,根據於導線3與被接合部2接觸後直至產生超音波振動為止之期間由荷重感測器40檢測到之荷重而算出判定值,並基於判定值而控制接合工具11及超音波銲頭12之動作。Therefore, in the embodiment, a
藉此,例如,可在進行接合動作之前,推定導線3對於被接合部2之接合狀態之好壞。即,可在實際進行接合動作之前,推定在進行接合動作時是否產生有接合不良。因此,藉由在推定為導線3對於被接合部2之接合狀態為差之情形下,進行與推定為接合狀態為好之情形不同之動作(例如,不進行接合動作、在進行了接合動作之後停止裝置、或以不同之條件進行接合動作等),而可防患產生接合不良於未然。Thereby, for example, it is possible to estimate the quality of the bonding state of the
更具體而言,控制部50例如在判定值為基準範圍內之情形下,進行接合動作,在判定值為基準範圍外之情形下,不進行接合動作,而停止接合工具11及超音波銲頭12之動作。藉此,可確實地抑制產生接合不良,從而可提高產品之成品率。More specifically, the
或者,控制部50例如在判定值為基準範圍內之情形下,進行接合動作,在判定值為基準範圍外之情形下,在進行了接合動作之後,停止接合工具11及超音波銲頭12之動作。藉此,可抑制產生接合不良,且進一步提高產品之成品率。例如,作為接合不良之產生之預兆,而於接合良品中發生判定值之變化之情形下,藉由如此之控制,而可防患產生接合不良於未然。Alternatively, the
或者,控制部50例如在判定值為基準範圍內之情形下,以第1條件進行接合動作,在判定值為基準範圍外之情形下,以與第1條件不同之第2條件進行接合動作。藉此,可抑制產生接合不良,且進一步提高產品之成品率。Alternatively, for example, the
如以上所說明般,根據實施形態,提供一種可抑制發生被接合部與導線之間之接合不良之導線接合裝置及導線接合方法。As described above, according to the embodiment, there are provided a wire bonding apparatus and a wire bonding method which can suppress the occurrence of poor bonding between the part to be bonded and the wire.
以上例示了本發明之若干個實施形態,但該等實施形態係作為例子而提出者,並非意欲限定發明之範圍。該等新穎之實施方式可利用其他各種方式予以實施,在不脫離發明之要旨範圍內,可進行各種省略、置換、變更等。該等實施形態或其變化例,係包含於發明之範圍及要旨內,且包含於申請專利範圍所記載之發明及其均等之範圍內。又,前述之各實施形態可相互組合而實施。Several embodiments of the present invention have been illustrated above, but these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in other various forms, and various omissions, substitutions, and changes can be made without departing from the gist of the invention. These embodiments or variations thereof are included in the scope and gist of the invention, and are included in the inventions described in the claims and their equivalents. In addition, each of the above-mentioned embodiments can be implemented in combination with each other.
1:工件
2:被接合部
2a:凸塊
3:導線
10:接合頭
11:接合工具
12:超音波銲頭
13:接合臂
13a:軸部
14:驅動部
20:XY載台
30:接合載台
40:荷重感測器
50:控制部
100:導線接合裝置
A:直線
B,B1,B2:切線
D,D1,D2:距離
L1,L2:荷重之大小
S1,S2:時間積分值
Sm,Sn:面積
SQ:長方形
S101~S108,S201~S210,S301~S309:步驟
t1~t4,ta,tb,tc,td:時點
P,p1,p2,Q,X:點
X,Y,Z:方向1: Workpiece
2: The joined
圖1係示意性地顯示實施形態之導線接合裝置之概略圖。 圖2係示意性地顯示實施形態之導線接合裝置之一部分之概略圖。 圖3係顯示在進行導線接合時自荷重感測器輸出之荷重信號波形之一例之圖表。 圖4係顯示在進行導線接合時自荷重感測器輸出之荷重信號波形之又一例之圖表。 圖5(a)及圖5(b)係顯示判定值之算出方法之一例之說明圖。 圖6(a)及圖6(b)係顯示圖5(a)及圖5(b)所示之判定值之算出方法之變化例之說明圖。 圖7(a)及圖7(b)係顯示判定值之算出方法之又一例之說明圖。 圖8(a)及圖8(b)係顯示判定值之算出方法之另一例之說明圖。 圖9(a)及圖9(b)係顯示判定值之算出方法之再一例之說明圖。 圖10係顯示實施形態之導線接合方法之一例之流程圖。 圖11係顯示實施形態之導線接合方法之又一例之流程圖。 圖12係顯示實施形態之導線接合方法之另一例之流程圖。FIG. 1 is a schematic diagram schematically showing a wire bonding apparatus according to an embodiment. FIG. 2 is a schematic view schematically showing a part of the wire bonding apparatus of the embodiment. FIG. 3 is a graph showing an example of a load signal waveform output from a load cell during wire bonding. FIG. 4 is a graph showing yet another example of the load signal waveform output from the load cell during wire bonding. FIGS. 5( a ) and 5 ( b ) are explanatory diagrams showing an example of the calculation method of the determination value. FIGS. 6( a ) and 6( b ) are explanatory diagrams showing a variation of the calculation method of the determination value shown in FIGS. 5( a ) and 5 ( b ). FIGS. 7( a ) and 7 ( b ) are explanatory diagrams showing still another example of the calculation method of the determination value. FIGS. 8( a ) and 8( b ) are explanatory diagrams showing another example of the calculation method of the determination value. FIGS. 9( a ) and 9 ( b ) are explanatory diagrams showing still another example of the calculation method of the determination value. FIG. 10 is a flowchart showing an example of the wire bonding method of the embodiment. FIG. 11 is a flowchart showing still another example of the wire bonding method of the embodiment. FIG. 12 is a flowchart showing another example of the wire bonding method of the embodiment.
1:工件 1: Workpiece
2:被接合部 2: The joined part
10:接合頭 10: Splice head
11:接合工具 11: Joining tools
12:超音波銲頭 12: Ultrasonic welding head
13:接合臂 13: Engagement Arm
13a:軸部 13a: Shaft
14:驅動部 14: Drive Department
20:XY載台 20:XY stage
30:接合載台 30: Engage the stage
40:荷重感測器 40: Load sensor
50:控制部 50: Control Department
100:導線接合裝置 100: Wire Bonding Device
X,Y,Z:方向 X,Y,Z: direction
Claims (13)
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| JP2020007451A JP7488656B2 (en) | 2019-09-19 | 2020-01-21 | Wire bonding apparatus and wire bonding method |
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|---|---|---|---|---|
| WO2010007702A1 (en) * | 2008-07-16 | 2010-01-21 | 株式会社新川 | Method for judging pass/fail of bonding, apparatus for judging pass/fail of bonding, and bonding apparatus |
| WO2018038113A1 (en) * | 2016-08-23 | 2018-03-01 | 株式会社新川 | Wire bonding method and wire bonding device |
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| JPH0758141A (en) * | 1993-08-19 | 1995-03-03 | Toshiba Corp | Bonding apparatus and bonding load control method |
| JPH08330366A (en) * | 1995-06-01 | 1996-12-13 | Mitsubishi Electric Corp | Wire bonding apparatus and method |
| JP3531378B2 (en) | 1996-09-24 | 2004-05-31 | ソニー株式会社 | Wire bonding equipment |
| JP2888335B2 (en) * | 1997-05-26 | 1999-05-10 | 日本電気株式会社 | Wire bonding apparatus and wire bonding method |
| JP3528643B2 (en) | 1998-12-04 | 2004-05-17 | 三菱電機株式会社 | Wire bonding equipment |
| CN100522449C (en) * | 2005-01-28 | 2009-08-05 | 日产自动车株式会社 | Ultrasonic bonding equipment and resulting bonding structure |
| JP4425319B1 (en) | 2008-09-10 | 2010-03-03 | 株式会社新川 | Bonding method, bonding apparatus, and manufacturing method |
| JP2015153907A (en) | 2014-02-14 | 2015-08-24 | 株式会社新川 | Semiconductor device manufacturing method and wire bonding apparatus |
| WO2018110417A1 (en) * | 2016-12-14 | 2018-06-21 | 株式会社新川 | Wire bonding device and wire bonding method |
| DE112018000674T5 (en) * | 2017-02-03 | 2019-12-19 | Mitsubishi Electric Corporation | Ultrasonic bonding device, ultrasonic bond examination method and manufacturing method for the ultrasound bonded area |
| JP6824056B2 (en) * | 2017-02-03 | 2021-02-03 | 日本アビオニクス株式会社 | Ultrasonic bonding device |
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| WO2010007702A1 (en) * | 2008-07-16 | 2010-01-21 | 株式会社新川 | Method for judging pass/fail of bonding, apparatus for judging pass/fail of bonding, and bonding apparatus |
| US20110146408A1 (en) * | 2008-07-16 | 2011-06-23 | Shinkawa Ltd. | Method and apparatus for pass/fail determination of bonding and bonding apparatus |
| WO2018038113A1 (en) * | 2016-08-23 | 2018-03-01 | 株式会社新川 | Wire bonding method and wire bonding device |
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| KR102536694B1 (en) | 2023-05-26 |
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