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TWI761060B - Chip on film package structure - Google Patents

Chip on film package structure Download PDF

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Publication number
TWI761060B
TWI761060B TW110103980A TW110103980A TWI761060B TW I761060 B TWI761060 B TW I761060B TW 110103980 A TW110103980 A TW 110103980A TW 110103980 A TW110103980 A TW 110103980A TW I761060 B TWI761060 B TW I761060B
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Taiwan
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heat dissipation
chip
layer
adhesive layer
flexible substrate
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TW110103980A
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Chinese (zh)
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TW202232676A (en
Inventor
吳依雯
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南茂科技股份有限公司
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Priority to TW110103980A priority Critical patent/TWI761060B/en
Priority to CN202110411095.6A priority patent/CN114864513A/en
Application granted granted Critical
Publication of TWI761060B publication Critical patent/TWI761060B/en
Publication of TW202232676A publication Critical patent/TW202232676A/en

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    • H10W74/114
    • H10W40/22
    • H10W70/68
    • H10W76/40

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Abstract

A chip on film package structure including a flexible substrate, a chip, an underfill and a heat dissipating tape is provided. The flexible substrate has a first surface and a second surface opposite to each other and a punching range defined. The first surface includes a chip bonding area and a potting area located inside the punching range, and the chip bonding area is located inside the potting area. The chip is disposed in the chip bonding area. The underfill is disposed in the potting area and at least fills the space in between the chip and the flexible substrate. The heat dissipating tape is disposed on at least one of the first surface and the second surface. The heat dissipating tape includes a first adhesive layer, a heat dissipation layer and a protective layer. The protective layer covers the heat dissipation layer. The first adhesive layer is located between the heat dissipation layer and the flexible substrate. An orthographic projection of the first adhesive layer on the flexible substrate covers the potting area and is located within the punching range.

Description

薄膜覆晶封裝結構Chip-on-Film Package Structure

本發明是有關於一種封裝結構,且特別是有關於一種薄膜覆晶封裝結構。The present invention relates to a package structure, and more particularly, to a chip on film package structure.

現行的薄膜覆晶封裝(Chip on Film, COF)為增進散熱效果,會貼附散熱貼片於封裝結構的表面上,而為能增加散熱面積以達到較佳的散熱效果,散熱貼片中的散熱金屬層和其下方的底部黏膠的尺寸通常會盡可能加大(遠大於晶片與點膠區(potting area)範圍)。進一步而言,當晶片判定為不良品而需藉由打拔機構將不良晶片由薄膜覆晶封裝結構上移除時,由於打拔機構的衝切範圍通常只針對晶片尺寸及點膠區範圍進行設計,因此衝切範圍往往會小於散熱貼片的底部黏膠尺寸,如此一來,打拔機構在進行打拔時,其刀具會經過散熱貼片的底部黏膠,導致刀具上殘留黏膠,而影響刀具效能及簡短其使用壽命,且打拔後薄膜覆晶封裝上剩餘的底部黏膠也可能在整卷的薄膜覆晶封裝結構捲繞加壓時產生溢膠進而污染良品的問題。目前為降低前述情況發生,時常需先將散熱貼片移除後再進行打拔動作,導致製程複雜度及時間增加。In the current Chip on Film (COF), in order to improve the heat dissipation effect, a heat dissipation patch is attached to the surface of the package structure, and in order to increase the heat dissipation area to achieve a better heat dissipation effect, the heat dissipation patch The size of the heat-dissipating metal layer and the underlying glue below it is usually as large as possible (much larger than the die and the potting area). Further, when the chip is judged to be a defective product and the defective chip needs to be removed from the chip-on-film packaging structure by the drawing mechanism, the punching range of the drawing mechanism is usually only performed for the size of the chip and the scope of the dispensing area. design, so the punching range is often smaller than the size of the adhesive at the bottom of the heat-dissipating patch. As a result, when the drawing mechanism is pulling, the tool will pass through the adhesive at the bottom of the heat-dissipating patch, resulting in residual adhesive on the tool. This affects the performance of the tool and shortens its service life, and the remaining bottom adhesive on the film-on-chip package after being pulled out may also overflow and contaminate the good product when the whole roll of the film-on-chip package structure is rolled and pressed. At present, in order to reduce the occurrence of the above-mentioned situation, it is often necessary to remove the heat sink first and then perform the pulling action, which increases the complexity and time of the manufacturing process.

本發明提供一種薄膜覆晶封裝結構,其可以在簡化製程的同時降低刀具上殘留黏膠以及後續整卷薄膜覆晶封裝結構捲繞時溢膠汙染的問題發生的機率。The present invention provides a film-on-chip packaging structure, which can simplify the manufacturing process and reduce the probability of glue spillage contamination during subsequent winding of the entire roll of the film-on-chip packaging structure.

本發明的一種薄膜覆晶封裝結構,包括可撓性基板、晶片、底部填充材以及散熱貼片。可撓性基板具有相對的第一表面與第二表面並定義有衝切範圍。第一表面包括位於衝切範圍內的晶片接合區與點膠區,且晶片接合區位於點膠區內。晶片設置於晶片接合區。底部填充材設置於點膠區且至少填充於晶片與可撓性基板之間。散熱貼片至少設置於第一表面與第二表面的其中之一上。散熱貼片包括第一膠層、散熱層與保護層。保護層覆蓋散熱層。第一膠層位於散熱層與可撓性基板之間。第一膠層於可撓性基板上的正投影覆蓋點膠區且位於衝切範圍內。A film-on-chip package structure of the present invention includes a flexible substrate, a chip, an underfill material and a heat dissipation patch. The flexible substrate has opposite first and second surfaces and defines a die cut range. The first surface includes a die bonding area and a glue dispensing area within the punching range, and the wafer bonding area is located in the glue dispensing area. The wafer is disposed in the wafer bonding area. The bottom filling material is arranged in the glue dispensing area and is filled at least between the wafer and the flexible substrate. The heat dissipation patch is disposed on at least one of the first surface and the second surface. The heat dissipation patch includes a first adhesive layer, a heat dissipation layer and a protection layer. The protective layer covers the heat dissipation layer. The first adhesive layer is located between the heat dissipation layer and the flexible substrate. The orthographic projection of the first adhesive layer on the flexible substrate covers the dispensing area and is located within the punching range.

在本發明的一實施例中,上述的第一膠層於所述可撓性基板上的正投影範圍不小於所述點膠區。In an embodiment of the present invention, the orthographic projection range of the first adhesive layer on the flexible substrate is not smaller than the dispensing area.

在本發明的一實施例中,上述的散熱層於可撓性基板上的正投影範圍大於衝切範圍。In an embodiment of the present invention, the orthographic projection range of the heat dissipation layer on the flexible substrate is larger than the punching range.

在本發明的一實施例中,上述的保護層的尺寸大於散熱層的尺寸,且保護層完全覆蓋散熱層。In an embodiment of the present invention, the size of the protective layer is larger than that of the heat dissipation layer, and the protective layer completely covers the heat dissipation layer.

在本發明的一實施例中,上述的散熱貼片更包括第二膠層,第二膠層位於保護層與散熱層之間。In an embodiment of the present invention, the above-mentioned heat dissipation patch further includes a second adhesive layer, and the second adhesive layer is located between the protective layer and the heat dissipation layer.

在本發明的一實施例中,上述的第二膠層於可撓性基板上的正投影位於衝切範圍內。In an embodiment of the present invention, the orthographic projection of the second adhesive layer on the flexible substrate is within the punching range.

在本發明的一實施例中,上述的第二膠層的厚度不大於第一膠層的厚度的1/2。In an embodiment of the present invention, the thickness of the second adhesive layer is not greater than 1/2 of the thickness of the first adhesive layer.

在本發明的一實施例中,上述的散熱貼片設置於第一表面上,第一膠層至少覆蓋晶片的背面與底部填充材。In an embodiment of the present invention, the above-mentioned heat dissipation patch is disposed on the first surface, and the first adhesive layer covers at least the backside of the chip and the underfill material.

在本發明的一實施例中,上述的保護層與散熱層的尺寸相同且完全覆蓋散熱層。In an embodiment of the present invention, the protective layer and the heat dissipation layer have the same size and completely cover the heat dissipation layer.

在本發明的一實施例中,上述的保護層以塗佈方式形成於散熱層上。In an embodiment of the present invention, the above-mentioned protective layer is formed on the heat dissipation layer by coating.

基於上述,藉由將散熱貼片中使散熱層貼合於可撓性基板上的第一膠層設計為於可撓性基板上的正投影覆蓋可撓性基板的點膠區且位於可撓性基板的衝切範圍內,如此一來,散熱貼片的第一膠層可以內縮於衝切範圍內,以使打拔機構在進行打拔時其刀具不會經過第一膠層,避免第一膠層殘留於刀具上以及避免打拔後剩餘的第一膠層在整卷薄膜覆晶封裝結構捲繞加壓時產生溢膠而污染良品的問題,因此本發明的薄膜覆晶封裝結構可以在簡化製程(不須另外進行散熱貼片移除的動作)的同時降低刀具上殘留黏膠以及後續整卷薄膜覆晶封裝結構捲繞時溢膠污染的問題發生的機率。Based on the above, the first adhesive layer in the heat dissipation patch to attach the heat dissipation layer to the flexible substrate is designed to cover the dispensing area of the flexible substrate by an orthographic projection on the flexible substrate and is located in the flexible substrate. In this way, the first adhesive layer of the heat dissipation patch can be shrunk within the punching range, so that the tool of the drawing mechanism will not pass through the first adhesive layer when drawing, avoiding The first adhesive layer remains on the cutter and avoids the problem that the remaining first adhesive layer after being pulled out will overflow and contaminate good products when the whole roll of the film-on-chip packaging structure is rolled and pressed. Therefore, the film-on-chip packaging structure of the present invention It can simplify the manufacturing process (no need to perform the action of removing the heat dissipation patch separately), and at the same time reduce the probability of adhesive overflow on the tool and the occurrence of adhesive overflow contamination during the subsequent winding of the entire film-on-chip packaging structure.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more obvious and easy to understand, the following embodiments are given and described in detail with the accompanying drawings as follows.

參照本實施例之圖式以更全面地闡述本發明。然而,本發明亦可以各種不同的形式體現,而不應限於本文中所述之實施例。圖式中的層或區域的厚度、尺寸或大小會為了清楚起見而放大。The present invention is more fully described with reference to the drawings of this embodiment. However, the present invention may be embodied in various forms and should not be limited to the embodiments described herein. The thickness, size or size of layers or regions in the drawings may be exaggerated for clarity.

應說明的是,下述圖式的薄膜覆晶封裝結構係以捲帶傳輸的方式作業,儘管下述圖式的散熱貼片僅示意地繪示應用於形成薄膜覆晶封裝結構的捲帶上的一個元件區(device area),然而,本發明不限於此,下述圖式的散熱貼片可以同時應用於捲帶上的多個元件區。It should be noted that the chip-on-film packaging structure in the following figures is operated in a tape-and-reel mode, although the heat sink in the figures below is only schematically shown applied to the tape and tape forming the chip-on-film packaging structure. However, the present invention is not limited to this, and the heat dissipation patches of the following figures can be applied to a plurality of device areas on the tape at the same time.

圖1A與圖1B是依照本發明一實施例的薄膜覆晶封裝結構在貼片前後的部分剖面示意圖。圖1C是圖1B的薄膜覆晶封裝結構於捲帶狀態時的俯視示意圖。請同時參考圖1A至圖1C,在本實施例中,薄膜覆晶封裝結構100包括可撓性基板110、晶片120以及底部填充材(underfill)130,其中可撓性基板110具有相對的第一表面110a與第二表面110b並定義有衝切範圍P。進一步而言,第一表面110a包括位於衝切範圍P內的晶片接合區122與點膠區132,晶片接合區122位於點膠區132內,其中晶片120設置於晶片接合區122,而底部填充材130設置於點膠區132且至少填充於晶片120與可撓性基板110之間。更具體而言,在本實施例中,薄膜覆晶封裝結構100還包括多個引腳112以及防銲層114,其中引腳112設置於可撓性基板110上,而防銲層114局部覆蓋引腳112並暴露出晶片接合區122。此外,晶片120透過多個凸塊124電性連接引腳112,換句話說,晶片120係覆晶接合於引腳112上。在此,可撓性基板110的材質例如是聚乙烯對苯二甲酸酯(polyethylene terephthalate, PET)、聚醯亞胺(Polyimide, PI)、聚醚(polyethersulfone, PES)、碳酸脂(polycarbonate, PC)或其他適合的可撓性材料,而晶片120可以是驅動晶片或任何適宜的晶片。1A and FIG. 1B are partial cross-sectional schematic views of a chip-on-film package structure before and after a patch according to an embodiment of the present invention. FIG. 1C is a schematic top view of the chip-on-film packaging structure of FIG. 1B in a tape-and-reel state. Please refer to FIG. 1A to FIG. 1C at the same time, in this embodiment, the chip on film package structure 100 includes a flexible substrate 110 , a chip 120 and an underfill 130 , wherein the flexible substrate 110 has an opposite first The surface 110a and the second surface 110b also define a punching range P. Further, the first surface 110a includes a die bonding area 122 and a glue dispensing area 132 located within the punching range P, the die bonding area 122 is located in the glue dispensing area 132, wherein the wafer 120 is disposed in the die bonding area 122, and the underfill is The material 130 is disposed in the dispensing area 132 and is at least filled between the wafer 120 and the flexible substrate 110 . More specifically, in this embodiment, the chip on film package structure 100 further includes a plurality of pins 112 and a solder mask layer 114 , wherein the pins 112 are disposed on the flexible substrate 110 and the solder mask layer 114 partially covers pin 112 and expose die bonding area 122 . In addition, the chip 120 is electrically connected to the pins 112 through the plurality of bumps 124 , in other words, the chip 120 is flip-chip bonded to the pins 112 . Here, the material of the flexible substrate 110 is, for example, polyethylene terephthalate (PET), polyimide (PI), polyethersulfone (PES), carbonate (polycarbonate, PC) or other suitable flexible material, and wafer 120 may be a drive wafer or any suitable wafer.

再者,薄膜覆晶封裝結構100還包括至少設置於第一表面110a與第二表面110b的其中之一上的散熱貼片140。在本實施例中,散熱貼片140係設置於可撓性基板110的第一表面110a上。散熱貼片140包括第一膠層142、散熱層144與保護層148,其中保護層148覆蓋散熱層144,第一膠層142位於散熱層144與可撓性基板110之間,以將散熱層144貼附於可撓性基板110上。此外,將散熱貼片140對應設置於第一表面110a上時,第一膠層142於可撓性基板110上的正投影覆蓋可撓性基板110的點膠區132且位於衝切範圍P內,如此一來,散熱貼片140的第一膠層142可以自衝切範圍P的邊界內縮一距離d1,以使打拔機構(未繪示)在進行打拔時其刀具10不會經過散熱貼片140的第一膠層142,避免第一膠層142殘留於刀具10上以及避免打拔後剩餘的第一膠層142在整卷的薄膜覆晶封裝結構100捲繞加壓時產生溢膠而污染良品的問題,因此本實施例的薄膜覆晶封裝結構100可以在簡化製程(不須另外進行散熱貼片移除的動作)的同時降低刀具上殘留黏膠以及後續整卷薄膜覆晶封裝結構捲繞時溢膠污染等問題發生的機率。在此,散熱層144的材質可包括金屬箔或石墨類薄膜,其中金屬箔例如是鋁箔或銅箔,但本發明不限於此。保護層148的材質例如是聚醯亞胺(Polyimide, PI),但本發明亦不限於此。Furthermore, the chip on film package structure 100 further includes a heat sink 140 disposed on at least one of the first surface 110a and the second surface 110b. In this embodiment, the heat dissipation patch 140 is disposed on the first surface 110 a of the flexible substrate 110 . The heat dissipation patch 140 includes a first adhesive layer 142 , a heat dissipation layer 144 and a protective layer 148 , wherein the protective layer 148 covers the heat dissipation layer 144 , and the first adhesive layer 142 is located between the heat dissipation layer 144 and the flexible substrate 110 to separate the heat dissipation layer 144 is attached to the flexible substrate 110 . In addition, when the heat dissipation patch 140 is correspondingly disposed on the first surface 110a, the orthographic projection of the first adhesive layer 142 on the flexible substrate 110 covers the dispensing area 132 of the flexible substrate 110 and is located within the punching range P , in this way, the first adhesive layer 142 of the heat dissipation patch 140 can be retracted by a distance d1 from the boundary of the punching range P, so that the tool 10 of the drawing mechanism (not shown) will not pass through when drawing The first adhesive layer 142 of the heat dissipation patch 140 prevents the first adhesive layer 142 from remaining on the cutter 10 and the remaining first adhesive layer 142 after being pulled out when the whole roll of the film-on-chip packaging structure 100 is rolled and pressed Therefore, the chip-on-film packaging structure 100 of this embodiment can simplify the manufacturing process (without the need to remove the heat dissipation patch), and at the same time reduce the residual adhesive on the tool and the subsequent film coating of the whole roll. The probability of the occurrence of problems such as glue overflow pollution when the chip package structure is wound. Here, the material of the heat dissipation layer 144 may include metal foil or graphite film, wherein the metal foil is, for example, aluminum foil or copper foil, but the invention is not limited thereto. The material of the protective layer 148 is, for example, polyimide (PI), but the present invention is not limited thereto.

進一步而言,圖1A為將散熱貼片140設置於第一表面110a之前的階段,圖1B為將散熱貼片140設置於第一表面110a之後的階段。在本實施例中,如圖1A與圖1B所示,可以先將散熱貼片140對位放置於第一表面110a上,使第一膠層142至少覆蓋晶片120的背面120b與底部填充材130。接著,藉由例如滾輪(未繪示)等機構進行滾壓,使散熱貼片140透過第一膠層142黏固於第一表面110a上。應說明的是,儘管在本實施例中散熱貼片140僅設置於第一表面110a上,然而,本發明不限制散熱貼片140所貼附的表面,也不限制貼附的表面數量,只要散熱貼片140至少設置於第一表面110a與第二表面110b的其中之一上皆屬於本發明的保護範圍,因此在其他實施例中,散熱貼片140可以是僅設置於第二表面110b或同時設置於第一表面110a與第二表面110b上。Further, FIG. 1A is a stage before disposing the heat dissipation patch 140 on the first surface 110a, and FIG. 1B is a stage after disposing the heat dissipation patch 140 on the first surface 110a. In this embodiment, as shown in FIG. 1A and FIG. 1B , the heat dissipation patch 140 may be positioned on the first surface 110 a first, so that the first adhesive layer 142 at least covers the back surface 120 b of the chip 120 and the underfill material 130 . Next, the heat dissipation patch 140 is adhered to the first surface 110a through the first adhesive layer 142 by rolling by means such as a roller (not shown). It should be noted that, although the heat dissipation patch 140 is only disposed on the first surface 110a in this embodiment, the present invention does not limit the surface to which the heat dissipation patch 140 is attached, nor does it limit the number of surfaces to which it is attached, as long as The heat dissipation patch 140 disposed on at least one of the first surface 110a and the second surface 110b belongs to the protection scope of the present invention. Therefore, in other embodiments, the heat dissipation patch 140 may be disposed only on the second surface 110b or It is disposed on the first surface 110a and the second surface 110b at the same time.

在一些實施例中,第一膠層142於可撓性基板110上的正投影範圍不小於點膠區132,換句話說,第一膠層142完全覆蓋點膠區132,以達到較佳的黏著效果,但本發明不限於此。如圖1B所示,在本實施例中,第一膠層142於可撓性基板110上的正投影範圍約等於點膠區132的範圍,也就是第一膠層142剛好覆蓋點膠區132。In some embodiments, the orthographic projection range of the first adhesive layer 142 on the flexible substrate 110 is not smaller than the dispensing area 132 , in other words, the first adhesive layer 142 completely covers the dispensing area 132 to achieve a better adhesive effect, but the present invention is not limited to this. As shown in FIG. 1B , in this embodiment, the orthographic projection range of the first adhesive layer 142 on the flexible substrate 110 is approximately equal to the range of the dispensing area 132 , that is, the first adhesive layer 142 just covers the dispensing area 132 .

此外,在本實施例中,散熱層144於可撓性基板110上的正投影範圍可大於衝切範圍P,換句話說,散熱層144的邊緣可超出衝切範圍P,藉由散熱層144較大的散熱面積,可提升散熱效果,但本發明不限於此。In addition, in this embodiment, the orthographic projection range of the heat dissipation layer 144 on the flexible substrate 110 may be larger than the punching range P. In other words, the edge of the heat dissipation layer 144 may exceed the punching range P. The larger heat dissipation area can improve the heat dissipation effect, but the present invention is not limited to this.

再者,在本實施例中,保護層148的尺寸大於散熱層144的尺寸,且保護層148完全覆蓋散熱層144,換句話說,散熱層144於可撓性基板110上的正投影會完全位於保護層148於可撓性基板110上的正投影內,以達到對散熱層144的保護效果,但本發明不限於此。Furthermore, in this embodiment, the size of the protective layer 148 is larger than the size of the heat dissipation layer 144 , and the protective layer 148 completely covers the heat dissipation layer 144 . In other words, the orthographic projection of the heat dissipation layer 144 on the flexible substrate 110 is completely It is located in the orthographic projection of the protective layer 148 on the flexible substrate 110 to achieve a protective effect on the heat dissipation layer 144 , but the invention is not limited thereto.

在本實施例中,散熱貼片140更包括位於保護層148與散熱層144之間的第二膠層146,以將保護層148黏著至散熱層144上。此外,在本實施例中,第二膠層146的厚度不大於第一膠層142的厚度,舉例而言,第二膠層146的厚度不大於第一膠層142的厚度的1/2。由於第二膠層146的厚度相較於第一膠層142薄化許多,在進行散熱貼片140的打拔作業時,第二膠層146對刀具殘膠及溢膠問題上產生的影響相對微小,因此,在本實施例中,第二膠層146的尺寸可大致等於散熱層144的尺寸並位於散熱層144的範圍,以使散熱層144與保護層148之間達到最大貼合面積,以提升兩者間的接合效果。換言之,第二膠層146於可撓性基板110上的正投影會大於衝切範圍P,但本發明不限於此。In this embodiment, the heat dissipation patch 140 further includes a second adhesive layer 146 located between the protection layer 148 and the heat dissipation layer 144 , so as to adhere the protection layer 148 to the heat dissipation layer 144 . In addition, in this embodiment, the thickness of the second adhesive layer 146 is not greater than the thickness of the first adhesive layer 142 , for example, the thickness of the second adhesive layer 146 is not greater than 1/2 of the thickness of the first adhesive layer 142 . Since the thickness of the second adhesive layer 146 is much thinner than that of the first adhesive layer 142 , when the heat dissipation patch 140 is pulled out, the second adhesive layer 146 has a relatively low impact on the problem of tool adhesive residue and adhesive overflow. Therefore, in this embodiment, the size of the second adhesive layer 146 can be approximately equal to the size of the heat dissipation layer 144 and located within the range of the heat dissipation layer 144, so that the maximum bonding area between the heat dissipation layer 144 and the protective layer 148 is achieved. to enhance the bonding effect between the two. In other words, the orthographic projection of the second adhesive layer 146 on the flexible substrate 110 is larger than the punching range P, but the invention is not limited thereto.

在此必須說明的是,以下實施例沿用上述實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明,關於省略部分的說明可參考前述實施例,下述實施例不再重複贅述。It must be noted here that the following embodiments use the element numbers and parts of the above-mentioned embodiments, wherein the same or similar numbers are used to represent the same or similar elements, and the description of the same technical content is omitted, and the description of the omitted part is omitted. Reference may be made to the foregoing embodiments, and detailed descriptions in the following embodiments will not be repeated.

圖1D是依照本發明另一實施例的薄膜覆晶封裝結構的部分剖面示意圖。請參考圖1D,本實施例的薄膜覆晶封裝結構100a類似於上述實施例的薄膜覆晶封裝結構100,而其差別在於:散熱貼片140是設置於第二表面110b上。更詳細而言,散熱貼片140是對應晶片120所在位置而貼設於第二表面110b上,而第一膠層142於可撓性基板110上的正投影同樣覆蓋點膠區132且位於衝切範圍P內。FIG. 1D is a partial cross-sectional schematic diagram of a chip on film package structure according to another embodiment of the present invention. Referring to FIG. 1D , the chip on film package structure 100 a of the present embodiment is similar to the chip on film package structure 100 in the above-mentioned embodiment, and the difference is that the heat sink 140 is disposed on the second surface 110 b. In more detail, the heat dissipation patch 140 is attached to the second surface 110b corresponding to the position of the chip 120 , and the orthographic projection of the first adhesive layer 142 on the flexible substrate 110 also covers the dispensing area 132 and is located in the punching area 132 . within the cut range P.

圖1E是依照本發明又一實施例的薄膜覆晶封裝結構的部分剖面示意圖。請參考圖1E,本實施例的薄膜覆晶封裝結構100b類似於上述實施例的薄膜覆晶封裝結構100,而其差別在於:散熱貼片140同時設置於第一表面110a與第二表面110b上,但本發明不限於此。藉由在可撓性基板110的第一表面110a與第二表面110b對應晶片120所在位置同時設置散熱貼片140,可提升薄膜覆晶封裝結構100b的散熱效率,降低熱效應對薄膜覆晶封裝結構100b的不良影響,進而提高產品的可靠度。FIG. 1E is a partial cross-sectional schematic diagram of a chip on film package structure according to yet another embodiment of the present invention. Referring to FIG. 1E , the chip on film package structure 100 b of this embodiment is similar to the chip on film package structure 100 in the above-mentioned embodiment, and the difference is that the heat dissipation patch 140 is disposed on the first surface 110 a and the second surface 110 b at the same time , but the present invention is not limited to this. By disposing the heat dissipation patch 140 on the first surface 110a and the second surface 110b of the flexible substrate 110 corresponding to the positions of the chip 120 at the same time, the heat dissipation efficiency of the chip on film package structure 100b can be improved, and the thermal effect on the chip on film package structure can be reduced. 100b adverse effects, thereby improving product reliability.

圖2是依照本發明再一實施例的薄膜覆晶封裝結構的部分剖面示意圖。請參考圖2,本實施例的薄膜覆晶封裝結構200類似於上述實施例的薄膜覆晶封裝結構100,而其差別在於:薄膜覆晶封裝結構200的散熱貼片240的第二膠層246於可撓性基板110上的正投影位於衝切範圍P內,如此一來,散熱貼片240的第二膠層246可以自衝切範圍P的邊界內縮一距離d2,以使打拔機構在進行打拔時其刀具10也不會經過散熱貼片240的第二膠層246,避免第二膠層246殘留於刀具上以及避免打拔後剩餘的第二膠層246在整卷的薄膜覆晶封裝結構200捲繞加壓時產生溢膠而污染良品的問題,因此本實施例的薄膜覆晶封裝結構200可以更進一步降低刀具上殘留黏膠以及後續整卷薄膜覆晶封裝結構捲繞時溢膠污染的問題發生的機率,但本發明不限於此。在本實施例中儘管散熱貼片240僅設置於第一表面110a上,然而,本發明不限於此,在其他未繪示的實施例中,散熱貼片240可以是如圖1D所示僅設置於第二表面110b或如圖1E所示同時設置於第一表面110a與第二表面110b上。FIG. 2 is a partial cross-sectional schematic diagram of a chip-on-film package structure according to still another embodiment of the present invention. Referring to FIG. 2 , the chip on film package structure 200 of the present embodiment is similar to the chip on film package structure 100 in the above-mentioned embodiment, and the difference lies in: the second adhesive layer 246 of the heat dissipation patch 240 of the chip on film package structure 200 The orthographic projection on the flexible substrate 110 is located within the punching range P, so that the second adhesive layer 246 of the heat dissipation patch 240 can be retracted by a distance d2 from the boundary of the punching range P, so that the drawing mechanism The cutter 10 will not pass through the second adhesive layer 246 of the heat dissipation patch 240 when pulling out, so as to prevent the second adhesive layer 246 from remaining on the cutter and to prevent the remaining second adhesive layer 246 from remaining on the entire roll of film after being pulled out. When the flip chip package structure 200 is rolled and pressurized, the glue overflows and contaminates the good products. Therefore, the film flip chip package structure 200 of this embodiment can further reduce the residual glue on the tool and the subsequent winding of the film flip chip package structure. The probability of occurrence of the problem of time overflow glue contamination, but the present invention is not limited to this. In this embodiment, although the heat dissipation patch 240 is only disposed on the first surface 110a, the present invention is not limited thereto. In other embodiments not shown, the heat dissipation patch 240 may be only disposed on the first surface 110a as shown in FIG. 1D It is disposed on the second surface 110b or simultaneously on the first surface 110a and the second surface 110b as shown in FIG. 1E .

在本實施例中,第二膠層246的尺寸可與第一膠層142的尺寸大致相同,但本發明不限於此,在未繪示的實施例中,第一膠層142的尺寸與第二膠層246的尺寸可以不相同。In this embodiment, the size of the second adhesive layer 246 may be approximately the same as the size of the first adhesive layer 142, but the invention is not limited thereto. The sizes of the second adhesive layers 246 may be different.

圖3是依照本發明又另一實施例的薄膜覆晶封裝結構的部分剖面示意圖。請參考圖3,本實施例的薄膜覆晶封裝結構300類似於上述實施例的薄膜覆晶封裝結構100,而其差別在於:薄膜覆晶封裝結構300的散熱貼片340的保護層348與散熱層144的尺寸相同且完全覆蓋散熱層144,並且省略了第二膠層。進一步而言,保護層348可以是以塗佈方式形成於散熱層144上,而省略以第二膠層貼合兩者,因此可以完全避免刀具10接觸到第二膠層的情況發生,進而可以更進一步避免刀具10上殘留黏膠以及後續整卷薄膜覆晶封裝結構300捲繞時溢膠污染的問題發生的機率,其中保護層348的材質可以是聚醯亞胺(Polyimide, PI),但本發明不限於此。在本實施例中儘管散熱貼片340僅設置於第一表面110a上,然而,本發明不限於此,在其他未繪示的實施例中,散熱貼片340可以是如圖1D所示僅設置於第二表面110b或如圖1E所示同時設置於第一表面110a與第二表面110b上。3 is a partial cross-sectional schematic view of a chip-on-film package structure according to yet another embodiment of the present invention. Referring to FIG. 3 , the chip on film package structure 300 of the present embodiment is similar to the chip on film package structure 100 in the above-mentioned embodiment, and the difference lies in: the protective layer 348 of the heat dissipation patch 340 of the chip on film package structure 300 and the heat dissipation The layer 144 is the same size and completely covers the heat dissipation layer 144, and the second glue layer is omitted. Further, the protective layer 348 can be formed on the heat dissipation layer 144 by coating, and the second adhesive layer can be omitted to bond the two, so it can be completely avoided that the tool 10 is in contact with the second adhesive layer. To further avoid residual glue on the cutter 10 and the probability of glue overflow contamination when the whole roll of the film-on-chip packaging structure 300 is wound, the material of the protective layer 348 can be polyimide (PI), but The present invention is not limited to this. In this embodiment, although the heat dissipation patch 340 is only disposed on the first surface 110a, the present invention is not limited to this. In other embodiments not shown, the heat dissipation patch 340 may be only disposed on the first surface 110a as shown in FIG. 1D It is disposed on the second surface 110b or simultaneously on the first surface 110a and the second surface 110b as shown in FIG. 1E .

應說明的是,本發明的散熱貼片不限制於上述各實施例中各層別的尺寸關係,只要散熱貼片的第一膠層於可撓性基板上的正投影覆蓋可撓性基板的點膠區且位於可撓性基板的衝切範圍內皆屬於本發明的保護範圍。It should be noted that the heat dissipation patch of the present invention is not limited to the dimensional relationship of each layer in the above-mentioned embodiments, as long as the orthographic projection of the first adhesive layer of the heat dissipation patch on the flexible substrate covers the points of the flexible substrate. Both the glue area and the punching range of the flexible substrate belong to the protection scope of the present invention.

綜上所述,將散熱貼片中貼合散熱層於可撓性基板上的第一膠層設計為於可撓性基板上的正投影覆蓋點膠區且位於衝切範圍內,如此一來,散熱貼片的第一膠層可以內縮於衝切範圍內,以使打拔機構在進行打拔時其刀具不會經過第一膠層,避免第一膠層殘留於刀具上以及避免打拔後剩餘的第一膠層在整卷薄膜覆晶封裝結構捲繞加壓時產生溢膠而污染良品的問題,因此本發明的薄膜覆晶封裝結構可以在簡化製程(不須另外進行散熱貼片移除的動作)的同時降低刀具上殘留黏膠以及後續整卷薄膜覆晶封裝結構捲繞時溢膠污染的問題發生的機率。再者,當散熱貼片中貼合散熱層與保護層的第二膠層設計為於可撓性基板上的正投影位於衝切範圍內,或者省略第二膠層而以例如塗佈方式將保護層形成於散熱層上時,可進一步避免打拔時刀具經過第二膠層而殘留於刀具上或在整卷薄膜覆晶封裝結構捲繞加壓時產生溢膠污染的問題,因此本發明的薄膜覆晶封裝結構可以更進一步降低刀具上殘留黏膠以及後續整卷薄膜覆晶封裝結構捲繞時溢膠污染的問題發生的機率。To sum up, the first adhesive layer in the heat dissipation patch, which is attached to the heat dissipation layer on the flexible substrate, is designed to cover the dispensing area with an orthographic projection on the flexible substrate and is located within the punching range. In this way, , the first adhesive layer of the heat dissipation patch can be shrunk within the punching range, so that the tool of the drawing mechanism will not pass through the first adhesive layer during the drawing, so as to avoid the first adhesive layer remaining on the tool and avoid hitting The problem that the remaining first adhesive layer after pulling out will overflow and contaminate good products when the whole roll of the film-on-chip packaging structure is rolled and pressed. Therefore, the film-on-chip packaging structure of the present invention can simplify the manufacturing process (without the need for additional heat dissipation stickers) The action of removing the chip) at the same time reduces the probability of glue spillage contamination during the subsequent winding of the entire roll of film-on-chip packaging structure with residual glue on the tool. Furthermore, when the second adhesive layer in the heat dissipation patch, which is attached to the heat dissipation layer and the protective layer, is designed so that the orthographic projection on the flexible substrate is within the die-cutting range, or the second adhesive layer is omitted, for example, by coating. When the protective layer is formed on the heat dissipation layer, it can further avoid the problem that the tool passes through the second adhesive layer and remains on the tool during pulling or the problem of glue overflow pollution when the whole roll of film-on-chip packaging structure is wound and pressed. Therefore, the present invention The excellent film-on-chip packaging structure can further reduce the probability of adhesive residue on the tool and the occurrence of glue spillage contamination when the entire roll of the film-on-chip packaging structure is wound.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed as above with examples, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The protection scope of the present invention shall be determined by the scope of the appended patent application.

10:刀具 100、100a、100b、200、300:薄膜覆晶封裝結構 110:可撓性基板 110a:第一表面 110b:第二表面 112:引腳 114:防銲層 120:晶片 120b:背面 122:晶片接合區 124:凸塊 130:底部填充材 132:點膠區 140、240、340:散熱貼片 142:第一膠層 144:散熱層 146、246:第二膠層 148、348:保護層 d1、d2:距離 P:衝切範圍10: Knives 100, 100a, 100b, 200, 300: Thin film flip chip package structure 110: Flexible substrate 110a: First surface 110b: Second surface 112: pin 114: Solder mask 120: Wafer 120b: Back 122: Wafer Bonding Area 124: bump 130: Underfill 132: Dispensing area 140, 240, 340: heat dissipation patch 142: The first adhesive layer 144: heat dissipation layer 146, 246: The second adhesive layer 148, 348: protective layer d1, d2: distance P: Punching range

圖1A、圖1B是依照本發明一實施例的薄膜覆晶封裝結構在貼片前後的部分剖面示意圖。 圖1C是圖1B的薄膜覆晶封裝結構於捲帶狀態時的俯視示意圖。 圖1D是依照本發明另一實施例的薄膜覆晶封裝結構的部分剖面示意圖。 圖1E是依照本發明又一實施例的薄膜覆晶封裝結構的部分剖面示意圖。 圖2是依照本發明再一實施例的薄膜覆晶封裝結構的部分剖面示意圖。 圖3是依照本發明又另一實施例的薄膜覆晶封裝結構的部分剖面示意圖。 應說明的是,圖1C的散熱貼片的第一膠層、散熱層、第二膠層與保護層皆採透視繪法,且省略繪示晶片與引腳。 1A and FIG. 1B are partial cross-sectional schematic views of a chip-on-film package structure before and after a patch according to an embodiment of the present invention. FIG. 1C is a schematic top view of the chip-on-film packaging structure of FIG. 1B in a tape-and-reel state. FIG. 1D is a partial cross-sectional schematic diagram of a chip on film package structure according to another embodiment of the present invention. FIG. 1E is a partial cross-sectional schematic diagram of a chip on film package structure according to yet another embodiment of the present invention. FIG. 2 is a partial cross-sectional schematic diagram of a chip-on-film package structure according to still another embodiment of the present invention. 3 is a partial cross-sectional schematic view of a chip-on-film package structure according to yet another embodiment of the present invention. It should be noted that the first adhesive layer, the heat dissipation layer, the second adhesive layer and the protective layer of the heat dissipation patch in FIG. 1C are all drawn in perspective, and the chips and pins are omitted.

10:刀具 10: Knives

100:薄膜覆晶封裝結構 100: Thin film flip chip package structure

110:可撓性基板 110: Flexible substrate

110a:第一表面 110a: First surface

110b:第二表面 110b: Second surface

112:引腳 112: pin

114:防銲層 114: Solder mask

120:晶片 120: Wafer

120b:背面 120b: Back

122:晶片接合區 122: Wafer Bonding Area

124:凸塊 124: bump

130:底部填充材 130: Underfill

132:點膠區 132: Dispensing area

140:散熱貼片 140: heat dissipation patch

142:第一膠層 142: The first adhesive layer

144:散熱層 144: heat dissipation layer

146:第二膠層 146: The second adhesive layer

148:保護層 148: Protective Layer

P:衝切範圍 P: Punching range

Claims (10)

一種薄膜覆晶封裝結構,包括: 可撓性基板,具有相對的第一表面與第二表面並定義有衝切範圍,其中所述第一表面包括位於所述衝切範圍內的晶片接合區與點膠區,所述晶片接合區位於所述點膠區內; 晶片,設置於所述晶片接合區; 底部填充材,設置於所述點膠區且至少填充於所述晶片與所述可撓性基板之間;以及 散熱貼片,至少設置於所述第一表面與所述第二表面的其中之一上,所述散熱貼片包括第一膠層、散熱層與保護層,所述保護層覆蓋所述散熱層,所述第一膠層位於所述散熱層與所述可撓性基板之間,且所述第一膠層於所述可撓性基板上的正投影覆蓋所述點膠區且位於所述衝切範圍內。 A film-on-chip packaging structure, comprising: A flexible substrate having opposite first and second surfaces and defining a punching range, wherein the first surface includes a die bonding area and a dispensing area located within the punching range, the die bonding area in the dispensing area; a wafer, disposed in the wafer bonding area; an underfill, disposed in the glue dispensing area and at least filled between the wafer and the flexible substrate; and A heat dissipation patch, disposed on at least one of the first surface and the second surface, the heat dissipation patch includes a first adhesive layer, a heat dissipation layer and a protection layer, and the protection layer covers the heat dissipation layer , the first adhesive layer is located between the heat dissipation layer and the flexible substrate, and the orthographic projection of the first adhesive layer on the flexible substrate covers the dispensing area and is located in the within the cutting range. 如請求項1所述的薄膜覆晶封裝結構,其中所述第一膠層於所述可撓性基板上的正投影範圍不小於所述點膠區。The chip-on-film package structure according to claim 1, wherein an orthographic projection range of the first adhesive layer on the flexible substrate is not smaller than the adhesive dispensing area. 如請求項1所述的薄膜覆晶封裝結構,其中所述散熱層於所述可撓性基板上的正投影範圍大於所述衝切範圍。The chip on film package structure according to claim 1, wherein an orthographic projection range of the heat dissipation layer on the flexible substrate is larger than the punching range. 如請求項1所述的薄膜覆晶封裝結構,其中所述保護層的尺寸大於所述散熱層的尺寸,且所述保護層完全覆蓋所述散熱層。The chip on film package structure according to claim 1, wherein the size of the protective layer is larger than that of the heat dissipation layer, and the protective layer completely covers the heat dissipation layer. 如請求項1所述的薄膜覆晶封裝結構,其中所述散熱貼片更包括第二膠層,位於所述保護層與所述散熱層之間。The chip-on-film package structure according to claim 1, wherein the heat dissipation patch further comprises a second adhesive layer located between the protection layer and the heat dissipation layer. 如請求項5所述的薄膜覆晶封裝結構,其中所述第二膠層於所述可撓性基板上的正投影位於所述衝切範圍內。The chip on film package structure according to claim 5, wherein the orthographic projection of the second adhesive layer on the flexible substrate is located within the punching range. 如請求項5所述的薄膜覆晶封裝結構,其中所述第二膠層的厚度不大於所述第一膠層的厚度的1/2。The chip on film packaging structure according to claim 5, wherein the thickness of the second adhesive layer is not greater than 1/2 of the thickness of the first adhesive layer. 如請求項1所述的薄膜覆晶封裝結構,其中所述散熱貼片設置於所述第一表面上,所述第一膠層至少覆蓋所述晶片的背面與所述底部填充材。The chip on film package structure according to claim 1, wherein the heat dissipation patch is disposed on the first surface, and the first adhesive layer covers at least the backside of the chip and the underfill material. 如請求項1所述的薄膜覆晶封裝結構,其中所述保護層與所述散熱層的尺寸相同且完全覆蓋所述散熱層。The chip on film package structure of claim 1, wherein the protective layer has the same size as the heat dissipation layer and completely covers the heat dissipation layer. 如請求項9所述的薄膜覆晶封裝結構,其中所述保護層以塗佈方式形成於所述散熱層上。The chip on film package structure according to claim 9, wherein the protective layer is formed on the heat dissipation layer by coating.
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