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TW201144829A - Testing apparatus and machine for preventing electromagnetic interference - Google Patents

Testing apparatus and machine for preventing electromagnetic interference

Info

Publication number
TW201144829A
TW201144829A TW99118079A TW99118079A TW201144829A TW 201144829 A TW201144829 A TW 201144829A TW 99118079 A TW99118079 A TW 99118079A TW 99118079 A TW99118079 A TW 99118079A TW 201144829 A TW201144829 A TW 201144829A
Authority
TW
Taiwan
Prior art keywords
tested
testing
transportation
electronic element
machine
Prior art date
Application number
TW99118079A
Other languages
Chinese (zh)
Other versions
TWI398653B (en
Inventor
Qin-Yi Ouyang
Original Assignee
Chroma Ate Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chroma Ate Inc filed Critical Chroma Ate Inc
Priority to TW99118079A priority Critical patent/TWI398653B/en
Publication of TW201144829A publication Critical patent/TW201144829A/en
Application granted granted Critical
Publication of TWI398653B publication Critical patent/TWI398653B/en

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention relates to a testing apparatus and machine for preventing electromagnetic interference (EMI). The testing machine includes multiple testing areas and multiple transportation devices. An electronic element to be tested is provided through a carrier from a material feeding area. The electronic element to be tested is sent to one of the transportation devices by a robot arm and a transportation track. The transportation device supports the electronic element to be tested. The transportation device is moved to the testing area through another transportation track. The electronic element to be tested is tested in the testing area free of interference. After the testing is finished, the tested electronic element is categorized in outputting area by the robot arm and the transportation tracks.
TW99118079A 2010-06-04 2010-06-04 A test device and test machine for preventing electromagnetic interference TWI398653B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99118079A TWI398653B (en) 2010-06-04 2010-06-04 A test device and test machine for preventing electromagnetic interference

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99118079A TWI398653B (en) 2010-06-04 2010-06-04 A test device and test machine for preventing electromagnetic interference

Publications (2)

Publication Number Publication Date
TW201144829A true TW201144829A (en) 2011-12-16
TWI398653B TWI398653B (en) 2013-06-11

Family

ID=46765732

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99118079A TWI398653B (en) 2010-06-04 2010-06-04 A test device and test machine for preventing electromagnetic interference

Country Status (1)

Country Link
TW (1) TWI398653B (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103376373A (en) * 2012-04-26 2013-10-30 鸿富锦精密工业（深圳）有限公司 Electromagnetic wave interference detecting system
TWI580973B (en) * 2015-11-10 2017-05-01 Chroma Ate Inc A global detection method of fingerprint sensor and its testing equipment
CN111679135A (en) * 2020-06-12 2020-09-18 华天科技（昆山）电子有限公司 OTA test system
TWI741673B (en) * 2020-07-10 2021-10-01 鴻勁精密股份有限公司 Wireless communication electronic component testing device and testing equipment using the same
TWI741433B (en) * 2019-12-05 2021-10-01 鴻勁精密股份有限公司 Radio frequency electronic component test device and test operation equipment for its application
CN114384333A (en) * 2021-12-31 2022-04-22 展讯通信（上海）有限公司 Cloud deck for antenna test, antenna test system and method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110426584A (en) * 2019-08-14 2019-11-08 重庆德新机器人检测中心有限公司 Industrial robot electromagnetic immunity test monitoring method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6709877B2 (en) * 2001-07-23 2004-03-23 Asm Assembly Automation Limited Apparatus and method for testing semiconductor devices
TW200627570A (en) * 2005-01-25 2006-08-01 Jian-Ming Zhao Chip modulized testing device and method thereof
US8821099B2 (en) * 2005-07-11 2014-09-02 Brooks Automation, Inc. Load port module
TWI446867B (en) * 2008-06-27 2014-07-21 Hon Tech Inc Testing and classifying machine of electronic elements with protective devices

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103376373A (en) * 2012-04-26 2013-10-30 鸿富锦精密工业（深圳）有限公司 Electromagnetic wave interference detecting system
TWI467188B (en) * 2012-04-26 2015-01-01 Hon Hai Prec Ind Co Ltd Test system for electromagneteic interference
US9154777B2 (en) 2012-04-26 2015-10-06 Shenzhen Treasure City Technology Co., Ltd. Testing system for anti-electromagnetic interference
TWI580973B (en) * 2015-11-10 2017-05-01 Chroma Ate Inc A global detection method of fingerprint sensor and its testing equipment
TWI741433B (en) * 2019-12-05 2021-10-01 鴻勁精密股份有限公司 Radio frequency electronic component test device and test operation equipment for its application
CN111679135A (en) * 2020-06-12 2020-09-18 华天科技（昆山）电子有限公司 OTA test system
TWI741673B (en) * 2020-07-10 2021-10-01 鴻勁精密股份有限公司 Wireless communication electronic component testing device and testing equipment using the same
CN114384333A (en) * 2021-12-31 2022-04-22 展讯通信（上海）有限公司 Cloud deck for antenna test, antenna test system and method

Also Published As

Publication number Publication date
TWI398653B (en) 2013-06-11

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