TW201946857A - Crimping mechanism for electronic component and applied for test classification equipment in which the crimper can minutely adjust to control the downward pressure of the pressing member so that the crimping member will accurately press down the electronic component - Google Patents

Abstract

A crimping mechanism is provided with a crimper which can be driven to move by a moving arm. The crimper is provided with a driving unit and a jig unit. The driving unit has a first bearing seat connected to the moving arm and having at least one pressing member. The jig unit has a second bearing seat for assembling or disassembling with the first bearing seat of the driving unit. The second bearing seat is configured to have an elastically displaceable crimping member inside the second bearing seat at the position corresponding to the pressing member. When the moving arm drives the crimping member to a predetermined position, the driving unit of the crimping member can fine-tune and control the downward pressure of the pressing member, and then the downward pressing member drives the pressing member of the jig unit to move so that the pressing member will accurately press down the electronic component to perform the test operation. Therefore, the practical benefits of ensuring test quality and improving the yield of electronic components can be achieved.

Description

   Electronic component crimping mechanism and test classification equipment for its application   

The invention provides a driving unit of the crimper which can finely control the amount of pressing force applied to the crimping member, and drives the crimping member of the fixture unit with the crimping member to make the crimping member accurately press the electronic component. An electronic component crimping mechanism that performs test operations to ensure test quality and improve the yield of electronic components.

At present, there are many types of electronic components, such as logic ICs, RF radio frequency ICs, etc. However, no matter what type of electronic components, testing operations must be performed on test equipment to eliminate defective products and ensure product quality, but different The type of IC can withstand different test down pressures due to factors such as the surface material or the number of solder balls. Taking logic ICs as an example, the surface can withstand a large test down pressure. In contrast, the RF radio frequency IC can't withstand the surface. For larger test downforce, the test downforce must be accurately controlled to avoid pressure loss.

Please refer to FIGS. 1 and 2. The electronic component testing equipment is equipped with a testing device 12 and a crimping mechanism 13 on the machine 11. The testing device 12 is provided with an electrically connected circuit board 121 and a test base 122. The base 122 receives and tests electronic components (such as RF radio frequency IC). The crimping mechanism 13 is provided on the frame 131 with a motor 132. The output shaft of the motor 132 drives a lead screw 134 to rotate by a pulley set 133. The lead screw The screw sleeve connection on 134 drives an L-shaped frame 135 to be displaced in the first direction (such as the Z direction). The bottom surface of the L-shaped frame 135 is equipped with a crimper 136, which is connected to the corresponding test seat 122. A pressing member 1361 below the suction nozzle is fixedly positioned to pick up and press down the electronic component 14; when performing the test operation, the crimping mechanism 13 transfers the electronic component 14 above the testing device 12, and The lead screw 134 is driven to rotate by the motor 132 via the belt wheel set 133, and the L-shaped frame 135 and the crimper 136 are moved in the Z direction, so that the lower pressing piece 1361 moves the electronic component 14 into the test base 122, so that the electronic component The solder ball of 14 does contact the probe in the test seat 122, and the motor 132 passes through the pulley set 133 and The lead screw 134 continuously drives the L-shaped frame 135 and the crimping device 136 for Z-direction displacement, so that the crimping member 136 below the crimping device 136 presses down the electronic component 14 so that the solder ball of the electronic component 14 and the probe of the test base 122 Make sure that they are in contact, and then perform the test operation of the electronic component 14. However, due to the many types of electronic components and the surface of some electronic components cannot withstand heavy pressure, the crimping mechanism 13 is a motor 132 via a pulley 133 and a lead screw. 134 drives the crimping device 136 to press down the electronic component 14 for Z-direction displacement, but the rotation accuracy of the motor 132 cannot be fine-tuned. If the type of the electronic component to be tested is a logic IC, the surface of the motor 132 can still accept the pressure of the motor 132. The large downforce provided by the connector 136, but if the type of electronic component to be tested is an RF radio frequency IC, its surface cannot withstand heavy pressure. When the motor 132 drives the crimper 136 to be crimped with a large downward pressure In the case of the RF radio frequency IC, the surface pressure loss and breakage of the RF radio frequency IC are prone to affect not only the test quality but also the RF radio frequency IC damage and increase the cost. Furthermore, because of the crimping device with the pressing member 1361, 136 is fixed on L-shaped frame 135 At the bottom, if you want to pick and place electronic components of different sizes, you need to disassemble the whole set of crimpers 136, and you can replace the crimpers with different size lower parts according to the needs of the pick and place operation, but at the bottom of the L-shaped frame 135 Disassembling and replacing the entire set of crimpers 136 must take tedious proofreading of the assembly accuracy of the crimpers 136, thereby reducing production efficiency.

An object of the present invention is to provide a crimping mechanism for electronic components, which is provided with a crimping device which can be driven by a moving arm. The crimping device is provided with a driving unit and a jig unit, and a first socket of the driving unit. It is connected to the moving arm and has at least one pressing member. The second bearing of the jig unit can be assembled or separated from the first bearing of the driving unit. The inside of the second bearing is connected to the corresponding pressing member. An elastically displaceable crimping member is provided at the position. When the moving arm drives the crimper to a preset position, the driving unit of the crimper can finely adjust the amount of pressing force of the crimping member, and lower the crimping member with the crimping member. The crimping part of the jig unit is driven by pressure, so that the crimping part can accurately press down the electronic component to perform the test operation, thereby achieving the practical benefits of ensuring the test quality and improving the yield of the electronic component.

The second object of the present invention is to provide a crimping mechanism for electronic components, in which the driving unit of the crimping device is fixedly mounted on the moving arm, and the jig unit is connected or separated by the joint with the driving unit. For electronic components of different sizes, only the second holder of the jig unit and the first holder of the drive unit need to be separated by using a jig, and the jig unit with crimping pieces of different sizes can be quickly replaced without tedious proofreading and pressing. Connector to effectively reduce the replacement operation time and achieve practical benefits of improving production efficiency.

A third object of the present invention is to provide a test classification device using an electronic component crimping mechanism, which includes a machine, a feeding device, a receiving device, a testing device, a conveying device, and a central control device. The machine is provided with at least one feeding holder for containing the electronic components to be tested. The receiving device is arranged on the machine and is provided with at least one receiving holder for containing the tested electronic components. The testing device is arranged on the machine platform and is provided with at least one pair of testers for performing test operations on the electronic components. The conveying device is arranged on the machine platform and is provided with at least one transfer device for transferring electronic components, and There is at least one crimping mechanism of the present invention, which presses down the electronic components. The central control device is used to control and integrate the actions of various devices to perform automated operations to achieve practical benefits of improving operation efficiency.

     [Learning]     

11‧‧‧machine

12‧‧‧test device

121‧‧‧Circuit Board

122‧‧‧Test Block

13‧‧‧ Crimping mechanism

131‧‧‧ Rack

132‧‧‧ Motor

133‧‧‧ pulley set

134‧‧‧lead screw

135‧‧‧L frame

136‧‧‧Crimper

1361‧‧‧Pressing pieces

14‧‧‧Electronic components

     〔this invention〕     

20, 20A‧‧‧ Crimping mechanism

21, 21A‧‧‧ Mobile Arm

22, 22A‧‧‧ Crimping device

221‧‧‧First seat

2211‧‧‧Air chamber

2212‧‧‧ Intake

2213‧‧‧The first docking part

222‧‧‧ to press

223, 223A‧‧‧Second Seat

2231‧‧‧The first mating part

2232‧‧‧Crossing Department

2233‧‧‧The first limit part

2234‧‧‧Second docking part

224, 224A‧‧‧Joint

225, 225A‧‧‧Crimp

2251‧‧‧ lug

2252‧‧‧The third limit department

2253, 2253A‧‧‧ Crimping section

2254, 2254A‧‧‧ Nozzle

226, 226A‧‧‧Third Seat

2261‧‧‧Crossover

2262‧‧‧perforation

2263‧‧‧through groove

2264‧‧‧Second limit component

227‧‧‧Elastic piece

2281‧‧‧First suction section

2282‧‧‧Second suction section

2283‧‧‧third suction section

229‧‧‧Anti-noise

31‧‧‧RF RF IC

32‧‧‧machine

321‧‧‧positioning pin

33‧‧‧Test device

331‧‧‧Circuit board

332‧‧‧Test Block

40‧‧‧machine

50‧‧‧feeding device

51‧‧‧feeder

60‧‧‧Receiving device

61‧‧‧Receiving container

70‧‧‧test device

71‧‧‧Circuit Board

72‧‧‧Test Block

80‧‧‧ Conveying device

81‧‧‧first feeder

82‧‧‧First loading stage

83‧‧‧Second loading stage

84‧‧‧First discharge stage

85‧‧‧Second discharge stage

86‧‧‧second feeder

Figure 1: Schematic diagram of the configuration of the conventional test device and crimping mechanism.

Figure 2: Schematic diagram of the use of the conventional test device and crimping mechanism.

Fig. 3: Schematic diagram of the crimping mechanism of the present invention.

Fig. 4: Schematic diagram of assembly of the crimping mechanism of the present invention (1).

Figure 5: Assembly schematic diagram of the crimping mechanism of the present invention (2).

Figure 6: Schematic diagram of the use of the crimping mechanism of the present invention (1).

Figure 7: Schematic diagram of the use of the crimping mechanism of the present invention (2).

Figure 8: Schematic diagram of the use of the crimping mechanism of the present invention (3).

Figure 9: Schematic diagram of the use of the crimping mechanism of the present invention (4).

Figure 10: Schematic diagram of using the crimping mechanism to replace the fixture unit (1).

Figure 11: Schematic diagram of using the crimping mechanism to replace the fixture unit (2).

FIG. 12 is a schematic diagram of the application of the crimping mechanism of the present invention to a test classification device.

In order for your reviewing committee to further understand the present invention, a preferred embodiment will be given in conjunction with the drawings, detailed as follows: Please refer to FIGS. 3, 4, and 5. The electronic component crimping mechanism 20 of the present invention includes movement The arm 21 and the crimping device 22, wherein the moving arm 21 is driven by at least one driving source (not shown) for displacement in at least a first direction (such as the Z direction). Because the driving source is not a technical feature of the present application Therefore, I will not repeat them here. The driving source drives the moving arm 21 to perform a larger Z-direction displacement, so that the moving arm 21 drives the crimper 22 to move to a preset position. The crimper 22 is provided with a driving unit. And a fixture unit, the driving unit is provided with at least a first socket 221 assembled on the movable arm 21, and the first socket 221 can be directly connected to the movable arm 21 or an object under the movable arm 21, In the embodiment, the first socket 221 is an object fixedly mounted under the movable arm 21, and the driving unit is provided with at least one pressing member 222 on the first bearing 221. Further, the pressing member 222 It can be a diaphragm or an airbag. In this embodiment, the bottom surface of the first socket 221 is concave. An accommodating space is provided. The pressing member 222 is a diaphragm, and is assembled on the bottom of the first bearing seat 221 and closes the accommodating space, so that the accommodating space forms an air chamber 2211, and the air chamber 2211 communicates with at least An air passage 2212 is connected to the air supply device. When gas is input into the air chamber 2212 from the air passage 2212, the pressure member 222 can be convexed downward to form a pressure, and the drive unit can control the air. The pressure value of the chamber 2211 is used to precisely fine tune the pressure amount under the pressure member 222. The fixture unit is provided with at least a second socket 223, and the second socket 223 of the fixture unit can be assembled or separated from the drive. The first socket 221 of the unit, further, the second socket 223 is connected to or separated from the first socket 221 of the driving unit or the moving arm 21 or an object below the moving arm 21 by at least one joint 224 (such as a floating (Head), in this embodiment, when the second socket 223 is connected to the object below the moving arm 21 by the coupling tool 224, it can be assembled below the first socket 221, otherwise, the second socket 223 is When the jig 224 separates the object under the moving arm 21, it can be disengaged from the first seat 2 21; In addition, the crimper 22 is provided with a first alignment structure between the first socket 221 and the second socket 223, so that the first socket 221 and the second socket 223 can be quickly assembled and aligned. The first alignment structure is provided with a first mating member 2213 and a first mating member 2231 that cooperate with each other between the first socket 221 and the second socket 223. The first mating member 2213 and the first mating member 2231 can be a groove and a bump, or a socket and a pin, respectively. In this embodiment, the first alignment structure is provided on the bottom surface of the first socket 221 with a first docking member that can be a bump. 2213, and a first mating member 2231 that can be a recess is provided on the top surface of the second socket 223 corresponding to the first mating member 2213; and the crimper 22 is inside the second socket 223 At least one elastically displaceable crimping member 225 is provided at a position corresponding to the pressing member 222. In this embodiment, at least one third socket 226 is provided inside the second socket 223, and the third socket 226 and the second socket 223 may be integrally formed or are separate components. In this embodiment, the third socket 226 and the second socket 223 are independent elements. A plurality of cross-sections 2261 are protruded from the top peripheral side of the third socket 226 to lock the cross-sections 2232 on the top surface of the second socket 223 in cross-connection. The third socket 226 is opposite to A hole 2262 should be provided at the position of the pressing member 222 to pass through the pressing member 225, and at least one elastic member 227 is provided between the pressing member 225 and the third socket 226. In this embodiment, The third socket 226 is provided with a through slot 2263 on the peripheral side for assembling an elastic member 227 that can be a spring. The first end of the elastic member 227 is against the third socket 226 and the second end is against. A first limiting member 2233 is provided at the position of the lug 2251 of the crimping member 225 so that the crimping member 225 can be elastically displaced in the Z direction, and the second bearing 223 is corresponding to the lug 2251 of the crimping member 225. In order to prevent the crimping member 225 from detaching upward, a second limiting member 2264 that can be a groove is provided on the top of the through hole 2262 of the third socket 226, and the top of the crimping member 225 corresponds to the second limiting member 2264. A third limiting portion 2252, which can be a flange, is provided at the position to prevent the crimping member 225 from falling downward by using the second limiting member 2264 and the third limiting portion 2252. The connecting piece 225 may be a pressing piece with a simple pressing function, or a pressing piece with a pressing and removing function. In this embodiment, the pressing piece 225 is provided with at least one suction nozzle 2254. A crimping portion 2253, which presses down the electronic component, and the suction nozzle 2254 is connected to a suction device via a suction line. In this embodiment, the suction line is connected to the crimping piece 225. A first suction section 2281 is provided inside, and two ends of the first suction section 2281 are respectively connected to the suction nozzle 2254 and the second suction section 2282, and the second suction section 2282 is further connected to a third suction section. 2283, the third suction section 2283 communicates with the suction device, so that the crimping member 225 has the function of pressing down and taking in and placing electronic components, and at least one second docking is provided around the second socket 223 The second alignment structure of the component 2234 is used to accurately join the object to be assembled (such as a machine table or a cover or a test base, etc.). In this embodiment, the second docking component 2234 may be a fitting hole to be connected to the machine. The positioning pin (not shown) on the table, and the crimper 22 is attached to the second socket 223 of the jig unit, and at least one anti-noise piece 229 is provided to prevent external noise. Noise interference test job or prevent leakage of the test signal, in this embodiment, the bottom line of the second socket 223 may be provided with noise preventing member 229 of the conductive cotton.

Please refer to FIGS. 6 and 7, because the suction nozzle 2254 of the crimping member 225 of the crimper 22 has absorbed the RF IC 31 to be measured, the moving arm 21 of the crimping mechanism 20 drives the crimper 22 to the second direction. (Such as the Y direction) is moved above the test device 33 of the machine 32, which is provided with a circuit board 331 and a test base 332 which are electrically connected, and the test base 332 is for receiving and testing the RF radio frequency IC 31; The moving arm 21 drives the crimper 22 to move downward in the Z direction to a preset position, so that the second docking part 2234 of the second socket 223 of the fixture unit is positioned on the machine 32 and aligned. The positioning pin 321 is positioned, and the anti-noise piece 229 at the bottom of the second socket 223 is attached to the machine 32 to prevent external noise from interfering with the test operation or preventing the test signal from leaking. At this time, the crimping The nozzle 2254 of the piece 225 moves the RF radio frequency IC 31 to be tested into the test base 332 of the test device 33.

Please refer to Figs. 8 and 9. However, in order to make sure that the contact point of the RF RF IC31 to be tested actually contacts the probe of the test base 332, the crimping part 2253 of the crimping member 225 must be continuously applied to the RF RF IC31 to be tested. Pressure, since the surface of the RF radio-frequency IC31 cannot withstand a large downward pressure, the pressure of the crimping member 225 on the RF radio-frequency IC31 must be accurately controlled. When the RF radio-frequency IC31 to be tested is moved into the test base 332, the crimper The driving unit of 22 inputs the gas to the air chamber 2211 through the air inlet 2212 of the first bearing seat 221, so that the pressing member 222 protrudes downward to form a pressure amount, and presses the pressing member 222 downward to press the The crimping member 225 is displaced in the Z direction, and the crimper 22 can finely adjust the pressure value of the air chamber 2211 and the amount of pressure under the crimping member 222, so as to accurately control the amount of pressure under the crimping member 225. The piece 225 is precisely displaced in the Z direction in the perforation 2262 of the third bearing seat 226, and the elastic piece 227 is compressed by the lug 2251, so that the crimping part 2253 of the crimping piece 225 is pressed down by the precise pressing force to the measured object. The RF RF IC31 not only ensures that the contact point of the RF RF IC31 to be tested contacts the probe of the test base 332, and RF radio is prevented IC31 pressure loss, and thus perform RF RF IC31 of the test job.

Please refer to Figures 5, 10, and 11. When the crimping mechanism 20 wants to pick up and push down small electronic components, only the fixture unit of the crimper 22 needs to be replaced. When replacing, it only needs to open the joint. 224, so that the second holder 223 of the original jig unit is separated from the first holder 221 of the drive unit. Because the drive unit is fixed below the moving arm 21, it is not necessary to replace the entire set of crimpers 22, which not only saves Cost, and can be quickly replaced with a new jig unit. The difference between the new jig unit and the original jig unit is that a crimping piece 225A with a smaller crimping portion 2253A is provided inside the third holder 226A, and A suction nozzle 2254A is provided on the crimping part 2253A. The second holder 223A of the new jig unit is provided with a jig 224A, which can be assembled with the objects connected below the moving arm 21, so that the crimper 22 can be quickly replaced with a new jig. Unit, and make the crimping piece 225A correspond to the crimping piece 222 of the driving unit, so that the crimping piece 225A can be driven by the crimping piece 222 to move in the Z direction of the precise stroke, and pick and place and press down the smaller electronic component .

Please refer to FIGS. 3, 4, 5 and 12, which are schematic diagrams of the application of the crimping mechanism 20 of the present invention to an electronic component test and classification device. The test and classification device is provided with a feeding device 50 and a receiving device 60 on the machine 40. Test device 70, conveying device 80 and central control device (not shown) provided with the crimping mechanism 20 of the present invention; the feeding device 50 is assembled on the machine table 40, and is provided with at least one supply tray for the feeding tray. The receiving device 51 is used for accommodating at least one electronic component to be tested. The receiving device 60 is assembled on the machine 40 and is provided with at least one receiving device 61 as a receiving tray for receiving at least A tested electronic component; the testing device 70 is mounted on the machine 40 and is provided with at least one pair of testers for performing test operations on the electronic components. In this embodiment, the tester is provided with an electrical connection. The circuit board 71 and the test base 72 are used to perform test operations on electronic components. The conveying device 80 is assembled on the machine 40 and is provided with at least one transfer device for transferring electronic components, and at least one of the present invention. The crimping mechanism 20, in this embodiment, the conveying device 80 is provided with a first movement The feeder 81 is used to take out the electronic components to be tested in the feeding holder 51 of the feeding device 50, and transfer the electronic components to the first and second loading platforms 82, 83, and the first and second loading platforms 82, 83 The electronic component to be tested is carried to the side of the testing device 70. The crimping mechanism 20 and 20A of the present invention respectively use the moving arms 21 and 21A to drive the crimping devices 22 and 22A to move in the YZ direction to make the second pressure The connectors 22 and 22A take out the electronic components to be tested from the first and second loading platforms 82 and 83, and transfer them to the test base 72 of the testing device 70 to perform the test operation, and the tested electronic components of the test base 72 Transfer to the first and second discharge stages 84 and 85. The first and second discharge stages 84 and 85 carry the measured electronic components. The conveying device 80 is provided with a second transfer device 86 on the first 2. Take out the tested electronic components from the two loading platforms 84 and 85, and transport the measured electronic components to the receiving device 61 of the receiving device 60 to classify them according to the test results; the central control The device is used to control and integrate the actions of various devices to perform automated operations to achieve practical benefits of improving operation efficiency.

Claims (10)

    An electronic component crimping mechanism includes: a moving arm: displaced in at least one first direction; a crimper: provided with a driving unit and a jig unit, the driving unit is provided with at least one assembled under the moving arm A first bearing, the first bearing is provided with at least one pressing member, the jig unit is provided with at least one second bearing, and the interior of the second bearing is provided with at least one position corresponding to the pressing member. For crimping a crimping part of an electronic component, the second socket is connected to or separated from the first socket.         According to the electronic component crimping mechanism according to item 1 of the scope of patent application, wherein the crimping part of the crimping device is a diaphragm or an airbag.         The electronic component crimping mechanism according to item 1 of the scope of patent application, wherein the second socket of the jig unit is connected to or separated from the first socket of the driving unit or the moving arm or the Move the object under the arm.         According to the electronic component crimping mechanism according to item 1 of the scope of patent application, wherein the crimping device is provided with a first alignment structure between the first socket and the second socket.         The electronic component crimping mechanism according to item 1 of the scope of patent application, wherein the second seat of the jig unit is provided with at least a third seat, and the third seat is corresponding to a corresponding pressing member. The crimping piece is penetrated at the position.         According to the electronic component crimping mechanism according to item 5 of the scope of patent application, wherein the jig unit is provided with at least one elastic member between the crimping member and the third socket.         According to the electronic component crimping mechanism according to item 1 of the scope of patent application, wherein the crimping part of the jig unit is provided with at least one crimping part with a suction nozzle.         According to the electronic component crimping mechanism according to item 1 of the scope of patent application, wherein the jig unit is provided with a second alignment structure with at least one second docking component on the second socket.         According to the electronic component crimping mechanism described in item 1 of the scope of the patent application, wherein the jig unit is provided with at least one anti-noise component on the second socket.         A test classification device using an electronic component crimping mechanism includes: a machine table; a feeding device: arranged on the machine table and provided with at least one feeding holder for containing at least one electronic component to be tested ; Receiving device: It is arranged on the machine and is provided with at least one receiving device for accommodating at least one measured electronic component. Test device: It is arranged on the machine and is provided with at least A tester to perform test operations on electronic components; a conveying device: arranged on the machine and provided with at least one transfer device for transferring electronic components, and at least one according to item 1 of the scope of patent application Electronic component crimping mechanism; Central control device: It is used to control and integrate the actions of various devices to perform automatic operations.