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TWI695175B - Wafer detection pushing device - Google Patents

Wafer detection pushing device Download PDF

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Publication number
TWI695175B
TWI695175B TW108109132A TW108109132A TWI695175B TW I695175 B TWI695175 B TW I695175B TW 108109132 A TW108109132 A TW 108109132A TW 108109132 A TW108109132 A TW 108109132A TW I695175 B TWI695175 B TW I695175B
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Taiwan
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seat
hole
rod
air pressure
group
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TW108109132A
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Chinese (zh)
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TW202036006A (en
Inventor
陳智岳
葉信宏
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鼎弘國際科技有限公司
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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

一種晶片檢測頂抵裝置,係裝於一檢測台,包含有一氣缸座,具有一氣缸孔,連接一前進氣壓源及一後退氣壓源;一氣壓桿,具有一活塞部受該前進氣壓源與後退氣壓源活動於該氣缸座的氣缸孔,一桿身接於該活塞部;一前座組,接於該氣壓桿的桿身前端;一左右移座,可左右調整地裝設於該前座組;一定位桿組,裝設於該左右移座,供頂抵定位晶片用。A wafer detection jacking device is mounted on a detection platform, and includes a cylinder seat with a cylinder hole, connected with a forward air pressure source and a backward air pressure source; a pneumatic rod has a piston part which receives the forward air pressure source and retreats The air pressure source moves in the cylinder hole of the cylinder seat, a shaft is connected to the piston part; a front seat group is connected to the front end of the shaft of the air pressure rod; a left and right shifting seat can be installed on the front seat group to adjust left and right; A positioning rod set is installed on the left and right moving seats, and is used for abutting and positioning the wafer.

Description

晶片檢測頂抵裝置Wafer detection pushing device

本發明係與晶片檢測相關,特別是一種晶片檢測頂抵裝置。The invention relates to wafer inspection, in particular to a wafer inspection pushing device.

已知晶片檢測頂抵裝置,其都是針對預定尺寸範圍的晶片而設計,因此其頂抵定位一不同大小的晶片時,頂抵定位的位置並非都能在其中間位置,因此容易造成晶片走位或受力損壞等情形;因此,習知晶片檢測頂抵裝置的缺失仍有待改善。Known wafer detection abutment devices are designed for wafers with a predetermined size range. Therefore, when abutment positioning a wafer of a different size, the position of the abutment positioning is not all in the middle position, so it is easy to cause the wafer to move Position or damage due to force; therefore, the lack of conventional wafer detection abutment devices still needs to be improved.

有鑒於現有技術的上述缺陷,本發明主要目的即在提供一種晶片檢測頂抵裝置,其可方便調整多個方向位置使達到更適當的定位頂抵晶片。In view of the above-mentioned shortcomings of the prior art, the main object of the present invention is to provide a wafer inspection abutment device, which can conveniently adjust the positions in multiple directions so as to achieve more proper positioning of the abutment wafer.

緣以達成上述目的,本發明提供一種晶片檢測頂抵裝置,係裝於一檢測台,包含有一氣缸座,具有一氣缸孔,連接一前進氣壓源及一後退氣壓源;一氣壓桿,具有一活塞部受該前進氣壓源與後退氣壓源活動於該氣缸座的氣缸孔,一桿身接於該活塞部;一前座組,接於該氣壓桿的桿身前端;一左右移座,可左右調整地裝設於該前座組;一定位桿組,裝設於該左右移座,供頂抵定位晶片用。In order to achieve the above object, the present invention provides a wafer inspection abutment device, which is mounted on an inspection table and includes a cylinder block with a cylinder bore, which is connected to a forward air pressure source and a backward air pressure source; The piston part is moved by the forward air pressure source and the backward air pressure source in the cylinder hole of the cylinder seat, a shaft is connected to the piston part; a front seat group is connected to the front end of the shaft of the air pressure rod; It is adjusted and installed on the front seat group; a positioning rod group is installed on the left and right shifting seats, and is used for abutting and positioning the wafer.

藉由該氣缸座可前後調整位移固定,該左右移座可左右調整位移固定,使該定位桿組達到更適當的定位頂抵晶片,因此達成本發明之目的。The displacement can be adjusted by the cylinder seat forward and backward, and the displacement can be adjusted left and right by the left and right displacement seats, so that the positioning rod group can achieve a more appropriate positioning against the wafer, thus achieving the purpose of the invention.

較佳地,該前座組具有一第一座及一第二座,該左右移座固定在該第二座。Preferably, the front seat group has a first seat and a second seat, and the left-right shift seat is fixed on the second seat.

較佳地,該氣壓桿的前端具有一螺紋部,該第二座設有一通孔供該氣壓桿穿設,並以一螺帽螺設該氣壓桿的螺紋部,使該第一座與第二座間固定,該第二座藉由其通孔調整與該第一座的相對高度。Preferably, the front end of the pneumatic rod has a threaded portion, the second seat is provided with a through hole for the pneumatic rod to penetrate, and a threaded portion of the pneumatic rod is screwed with a nut, so that the first seat and the The two seats are fixed, and the second seat adjusts the relative height with the first seat through its through hole.

較佳地,該前座組具有一螺孔,該左右移座具有一長形孔供一螺栓穿設而鎖固於該螺孔。Preferably, the front seat group has a screw hole, and the left and right shift seats have an elongated hole for a bolt to pass through and be locked in the screw hole.

較佳地,其更包含有一輔助平衡桿,接於該前座組並滑設於該氣缸座的一導孔。Preferably, it further includes an auxiliary balance bar connected to the front seat group and slidingly arranged in a guide hole of the cylinder seat.

較佳地,該前座組具有一桿孔供該氣壓桿插接,一開槽開通至該桿孔,並以一夾緊螺栓使該前座組夾緊該氣壓桿。Preferably, the front seat group has a rod hole for inserting the pneumatic rod, a slot is opened to the rod hole, and the pneumatic rod is clamped by the front seat group with a clamping bolt.

下面結合附圖和實施例對本發明作進一步說明:The present invention will be further described below with reference to the drawings and embodiments:

如第1圖至第5圖所示,本發明一較佳實施例所提供的一種晶片檢測頂抵裝置,係裝於一檢測台(1),包含有:As shown in FIG. 1 to FIG. 5, a wafer inspection abutment device provided in a preferred embodiment of the present invention is mounted on an inspection table (1) and includes:

一氣缸座(10),具有一氣缸孔(11),連接一前進氣壓源(13)及一後退氣壓源(14),一導孔(17)平行於該氣缸孔(11)設置。A cylinder block (10) has a cylinder bore (11) connected to a forward air pressure source (13) and a backward air pressure source (14), and a guide hole (17) is arranged parallel to the cylinder bore (11).

其中,該氣缸座(10)係以一固定單元(19)可調整位移地固定於該檢測台(1)。Wherein, the cylinder block (10) is fixedly fixed to the detection platform (1) by a fixing unit (19).

一氣壓桿(20),具有一活塞部(21)受該前進氣壓源(13)與後退氣壓源(14)活動於該氣缸座(10)的氣缸孔(11),一桿身(22)接於該活塞部(21),以及一螺紋部(23)位於該桿身(22)前端。A pneumatic rod (20) has a piston part (21) which is moved by the forward air pressure source (13) and the backward air pressure source (14) in the cylinder bore (11) of the cylinder block (10), and a shaft (22) Connected to the piston part (21), and a threaded part (23) is located at the front end of the shaft (22).

一前座組(3),接於該氣壓桿(20)的桿身(22)前端;其中,該前座組(3)具有一第一座(30)及一第二座(40),該左右移座(50)固定在該第二座(40)。A front seat group (3) connected to the front end of the shaft (22) of the pneumatic rod (20); wherein the front seat group (3) has a first seat (30) and a second seat (40), the left and right The shift seat (50) is fixed on the second seat (40).

該前座組(3)的第一座(30)具有一桿孔(31)供該氣壓桿(20)插接,一開槽(32)開通至該桿孔(31),一沈頭孔(33)及一螺孔(34)及分別位在該開槽(32)兩側,並以一夾緊螺栓(39)穿設該沈頭孔(33)螺固於該螺孔(34)使該前座組(3)夾緊該氣壓桿(20)。The first seat (30) of the front seat group (3) has a rod hole (31) for inserting the pneumatic rod (20), a slot (32) opens into the rod hole (31), and a countersunk hole ( 33) and a screw hole (34) and respectively located on both sides of the slot (32), and a countersunk head hole (33) is screwed into the screw hole (34) with a clamping bolt (39) so that The front seat group (3) clamps the pneumatic rod (20).

該前座組(3)的第二座(40)設有一通孔(41)供該氣壓桿(20)穿設,一螺孔(42)由上而下形成;其中,該第一座(30)與第二座(40)間之,係以一螺帽(49)螺設該氣壓桿(20)的螺紋部(23)使迫緊之。本例中,該通孔(41)係呈開放槽孔。The second seat (40) of the front seat group (3) is provided with a through hole (41) for the pneumatic rod (20) to pass through, and a screw hole (42) is formed from top to bottom; wherein, the first seat (30) ) And the second seat (40), a threaded portion (23) of the pneumatic rod (20) is screwed with a nut (49) to force it. In this example, the through hole (41) is an open slot.

一左右移座(50),可左右調整地裝設於該前座組(3);即,該左右移座(50)具有一長形孔(51)以一螺栓(59)鎖固於該第二座(40)之螺孔(42)。A left and right shifting seat (50) can be installed in the front seat group (3) to adjust left and right; that is, the left and right shifting seat (50) has an elongated hole (51) locked to the first seat with a bolt (59) Screw holes (42) for two seats (40).

本發明一較佳實施例中,該左右移座(50)係同時跨置靠接該第一座(30)與第二座(40)。In a preferred embodiment of the present invention, the left-right shifting seat (50) simultaneously spans the first seat (30) and the second seat (40).

一定位桿組(60),裝設於該左右移座(50),供頂抵定位晶片用。A positioning rod set (60) is installed on the left and right moving seat (50) for abutting and positioning the wafer.

一輔助平衡桿(70),接於該前座組(3)並滑設於該氣缸座(10)的導孔(17)。本例中,該輔助平衡桿(70)係接於該第一座(30)。An auxiliary balance bar (70) is connected to the front seat group (3) and slidably arranged in the guide hole (17) of the cylinder seat (10). In this example, the auxiliary balance bar (70) is connected to the first seat (30).

藉由上述實施結構,該氣缸座(10)可前後調整位移固定,該左右移座(50)可左右調整位移固定,使該定位桿組(60)達到更適當的定位頂抵晶片,因此達成本發明之目的。With the above-mentioned implementation structure, the cylinder block (10) can be adjusted forward and backward for displacement and fixed, and the left and right shift seat (50) can be adjusted for left and right displacement and fixed, so that the positioning rod group (60) can be positioned more properly against the chip, thus achieving The purpose of the invention.

而如第7圖所示,藉由旋鬆該螺帽(49)該第二座(40)可以其通孔(41)調整位移於該氣壓桿(20)的桿身(22),即可調整該第二座(40)至上升狀態,再鎖緊該螺帽(49)即可固定在另一高度,即該第二座(40)藉由其通孔(41)調整與該第一座(30)的相對高度,使該定位桿組(60)達到更適當的定位頂抵晶片,因此又達成本發明之目的。As shown in FIG. 7, by loosening the nut (49) and the second seat (40), the through hole (41) can be used to adjust the displacement to the shaft (22) of the pneumatic rod (20), Adjust the second seat (40) to the rising state, and then lock the nut (49) to fix it at another height, that is, the second seat (40) is adjusted to the first through its through hole (41) The relative height of the seat (30) enables the positioning rod group (60) to achieve more proper positioning against the wafer, thus achieving the purpose of the invention.

另外,該輔助平衡桿(70)可使該第一座(30)位移時更為平衡,最終使得該定位桿組(60)定位更為平穩。In addition, the auxiliary balance bar (70) can make the first seat (30) more balanced when displaced, and finally makes the positioning rod group (60) more stable in positioning.

除了以上實施之外,本發明還可實施如下:In addition to the above implementations, the present invention can also be implemented as follows:

例如,該第一座(30)與第二座(40)不限定如前述分開成兩個,兩者也可改為一體的。For example, the first seat (30) and the second seat (40) are not limited to be divided into two as described above, and the two may also be integrated.

或者,該第二座(40)的通孔(41)不限定如前述呈開放槽孔,其也可為一圓孔其不開通到底邊或側邊,以提供另一種使用型態需求。Alternatively, the through hole (41) of the second seat (40) is not limited to be an open slot as described above, but it may also be a round hole that does not open to the bottom or side to provide another type of use requirement.

綜上,本發明晶片檢測頂抵裝置確實方便調整多個方向位置使達到更適當的定位頂抵晶片,因此達成本發明所述目的。In summary, the wafer testing and abutment device of the present invention is indeed convenient for adjusting the positions in multiple directions to achieve more proper positioning and abutment on the wafer, thus achieving the object of the invention.

(1):檢測台 (1): Testing platform

(10):氣缸座 (10): Cylinder block

(11):氣缸孔 (11): Cylinder hole

(13):前進氣壓源 (13): Forward air pressure source

(14):後退氣壓源 (14): Back pressure source

(17):導孔 (17): Guide hole

(19):固定單元 (19): fixed unit

(20):氣壓桿 (20): Air pressure rod

(21):活塞部 (21): Piston part

(22):桿身 (22): shaft

(23):螺紋部 (23): Threaded part

(3):前座組 (3): Front seat group

(30):第一座 (30): The first

(31):桿孔 (31): Rod hole

(32):開槽 (32): Slotted

(33):沈頭孔 (33): countersunk head hole

(34):螺孔 (34): screw hole

(39):夾緊螺栓 (39): Clamping bolt

(40):第二座 (40): Block 2

(42):螺孔 (42): screw hole

(50):左右移座 (50): Move left and right

(51):長形孔 (51): Long hole

(59):螺栓 (59): Bolt

(60):定位桿組 (60): Positioning rod set

(70):輔助平衡桿 (70): auxiliary balance bar

第1圖係本發明一較佳實施例的立體組合圖。 第2圖係本發明一較佳實施例的組合上視圖。 第3圖係本發明一較佳實施例的局部剖視圖。 第4圖係本發明一較佳實施例的組合上視圖,顯示一作動狀態。 第5圖係第4圖的側視組合圖。 第6圖係本發明一較佳實施例左右移座的調整狀態圖。 第7圖概同於第4圖,顯示第二座的調整上升狀態。 Figure 1 is a three-dimensional assembled view of a preferred embodiment of the present invention. Figure 2 is a combined top view of a preferred embodiment of the present invention. Figure 3 is a partial cross-sectional view of a preferred embodiment of the present invention. Figure 4 is a combined top view of a preferred embodiment of the present invention, showing an actuated state. Figure 5 is a side view of Figure 4 combined. FIG. 6 is an adjustment state diagram of the left and right moving seats according to a preferred embodiment of the present invention. Figure 7 is the same as Figure 4 and shows the adjusted rise of the second seat.

(1):檢測台 (1): Testing platform

(10):氣缸座 (10): Cylinder block

(13):前進氣壓源 (13): Forward air pressure source

(14):後退氣壓源 (14): Back pressure source

(19):固定單元 (19): fixed unit

(20):氣壓桿 (20): Air pressure rod

(23):螺紋部 (23): Threaded part

(3):前座組 (3): Front seat group

(30):第一座 (30): The first

(40):第二座 (40): Block 2

(41):通孔 (41): Through hole

(49):螺帽 (49): Nut

(50):左右移座 (50): Move left and right

(60):定位桿組 (60): Positioning rod set

Claims (9)

一種晶片檢測頂抵裝置,係裝於一檢測台(1),包含有:一氣缸座(10),具有一氣缸孔(11),連接一前進氣壓源(13)及一後退氣壓源(14);一氣壓桿(20),具有一活塞部(21)受該前進氣壓源(13)與後退氣壓源(14)活動於該氣缸座(10)的氣缸孔(11),一桿身(22)接於該活塞部(21);一前座組(3),接於該氣壓桿(20)的桿身(22)前端;一左右移座(50),可左右調整地裝設於該前座組(3);一定位桿組(60),裝設於該左右移座(50),供頂抵定位晶片用;其中該前座組(3)具有一螺孔(42),該左右移座(50)具有一長形孔(51)供一螺栓(59)穿設而鎖固於該螺孔(42)。 A wafer testing and abutting device is mounted on a testing platform (1), including: a cylinder block (10), having a cylinder hole (11), connected to a forward air pressure source (13) and a backward air pressure source (14) ); a pneumatic rod (20) with a piston part (21) moved by the forward air pressure source (13) and the backward air pressure source (14) in the cylinder bore (11) of the cylinder block (10), a shaft ( 22) It is connected to the piston part (21); a front seat group (3) is connected to the front end of the shaft (22) of the pneumatic rod (20); a left and right moving seat (50) can be installed on the left and right adjustment Front seat group (3); a positioning rod group (60), installed on the left and right shift seat (50), for positioning against the wafer; wherein the front seat group (3) has a screw hole (42), the left and right shift The seat (50) has an elongated hole (51) for a bolt (59) to pass through and be locked in the screw hole (42). 一種晶片檢測頂抵裝置,係裝於一檢測台(1),包含有:一氣缸座(10),具有一氣缸孔(11),連接一前進氣壓源(13)及一後退氣壓源(14);一氣壓桿(20),具有一活塞部(21)受該前進氣壓源(13)與後退氣壓源(14)活動於該氣缸座(10)的氣缸孔(11),一桿身(22)接於該活塞部(21);一前座組(3),接於該氣壓桿(20)的桿身(22)前端;一左右移座(50),可左右調整地裝設於該前座組(3);一定位桿組(60),裝設於該左右移座(50),供頂抵定位晶片用;其中該前座組(3)具有一第一座(30)及一第二座(40),該左右移座(50)固定在該第二座(40);其中該氣壓桿(20)的前端具有一螺紋部(23),該第二座(40)設有一通孔(41)供該氣壓桿(20)穿設,並以一螺帽(49)螺設該氣壓桿(20)的螺紋部(23),使該第一座 (30)與第二座(40)間固定,該第二座(40)藉由其通孔(41)調整與該第一座(30)的相對高度。 A wafer testing and abutting device is mounted on a testing platform (1), including: a cylinder block (10), having a cylinder hole (11), connected to a forward air pressure source (13) and a backward air pressure source (14) ); a pneumatic rod (20) with a piston part (21) moved by the forward air pressure source (13) and the backward air pressure source (14) in the cylinder bore (11) of the cylinder block (10), a shaft ( 22) It is connected to the piston part (21); a front seat group (3) is connected to the front end of the shaft (22) of the pneumatic rod (20); a left and right moving seat (50) can be installed on the left and right adjustment Front seat group (3); a positioning rod group (60), which is installed on the left and right shift seat (50) for abutting and positioning the wafer; wherein the front seat group (3) has a first seat (30) and a first Two seats (40), the left and right shift seats (50) are fixed on the second seat (40); wherein the front end of the pneumatic rod (20) has a threaded portion (23), the second seat (40) is provided with a passage The hole (41) is used for piercing the pneumatic rod (20), and the screw part (23) of the pneumatic rod (20) is screwed with a nut (49) to make the first seat (30) is fixed between the second seat (40), and the second seat (40) adjusts the relative height with the first seat (30) through the through hole (41). 如請求項2所述的晶片檢測頂抵裝置,其中該前座組(3)具有一螺孔(42),該左右移座(50)具有一長形孔(51)供一螺栓(59)穿設而鎖固於該螺孔(42)。 The wafer detection abutment device according to claim 2, wherein the front seat group (3) has a screw hole (42), and the left and right shift seat (50) has an elongated hole (51) for a bolt (59) to pass through The screw hole (42) is locked. 如請求項2或3所述的晶片檢測頂抵裝置,其更包含有一輔助平衡桿(70),接於該前座組(3)並滑設於該氣缸座(10)的一導孔(17)。 The wafer detection abutment device according to claim 2 or 3, further comprising an auxiliary balance bar (70) connected to the front seat group (3) and slidingly arranged in a guide hole (17) of the cylinder seat (10) ). 如請求項1所述的晶片檢測頂抵裝置,其更包含有一輔助平衡桿(70),接於該前座組(3)並滑設於該氣缸座(10)的一導孔(17)。 The wafer inspection abutment device according to claim 1, further comprising an auxiliary balance bar (70) connected to the front seat group (3) and slidably arranged in a guide hole (17) of the cylinder seat (10). 如請求項1或5所述的晶片檢測頂抵裝置,其中該前座組(3)具有一桿孔(31)供該氣壓桿(20)插接,一開槽(32)開通至該桿孔(31),並以一夾緊螺栓(39)夾緊該開槽(32)使該前座組(3)與該氣壓桿(20)固定。 The wafer inspection abutment device according to claim 1 or 5, wherein the front seat group (3) has a rod hole (31) for inserting the pneumatic rod (20), and a slot (32) is opened to the rod hole (31), and clamp the slot (32) with a clamping bolt (39) to fix the front seat group (3) and the pneumatic rod (20). 如請求項4所述的晶片檢測頂抵裝置,其中該前座組(3)具有一桿孔(31)供該氣壓桿(20)插接,一開槽(32)開通至該桿孔(31),並以一夾緊螺栓(39)夾緊該開槽(32)使該前座組(3)與該氣壓桿(20)固定。 The wafer detection abutment device according to claim 4, wherein the front seat group (3) has a rod hole (31) for inserting the pneumatic rod (20), and a slot (32) is opened to the rod hole (31) ), and clamp the slot (32) with a clamping bolt (39) to fix the front seat group (3) and the pneumatic rod (20). 如請求項2或3所述的晶片檢測頂抵裝置,其中該前座組(3)具有一桿孔(31)供該氣壓桿(20)插接,一開槽(32)開通至該桿孔(31),並以一夾緊螺栓(39)夾緊該開槽(32)使該前座組(3)與該氣壓桿(20)固定。 The wafer detection abutment device according to claim 2 or 3, wherein the front seat group (3) has a rod hole (31) for inserting the pneumatic rod (20), and a slot (32) is opened to the rod hole (31), and clamp the slot (32) with a clamping bolt (39) to fix the front seat group (3) and the pneumatic rod (20). 一種晶片檢測頂抵裝置,係裝於一檢測台(1),包含有:一氣缸座(10),具有一氣缸孔(11),連接一前進氣壓源(13)及一後退氣壓源(14);一氣壓桿(20),具有一活塞部(21)受該前進氣壓源(13)與後退氣壓源(14)活動於該氣缸座(10)的氣缸孔(11),一桿身(22)接於該活塞部(21);一前座組(3),接於該氣壓桿(20)的桿身(22)前端;一左右移座(50),可左右調整地裝設於該前座組(3); 一定位桿組(60),裝設於該左右移座(50),供頂抵定位晶片用;其中該前座組(3)具有一桿孔(31)供該氣壓桿(20)插接,一開槽(32)開通至該桿孔(31),並以一夾緊螺栓(39)夾緊該開槽(32)使該前座組(3)與該氣壓桿(20)固定。A wafer testing and abutting device is mounted on a testing platform (1), including: a cylinder block (10), having a cylinder hole (11), connected to a forward air pressure source (13) and a backward air pressure source (14) ); a pneumatic rod (20) with a piston part (21) moved by the forward air pressure source (13) and the backward air pressure source (14) in the cylinder bore (11) of the cylinder block (10), a shaft ( 22) It is connected to the piston part (21); a front seat group (3) is connected to the front end of the shaft (22) of the pneumatic rod (20); a left and right moving seat (50) can be installed on the left and right adjustment Front seat group (3); A positioning rod group (60) is installed on the left and right shifting seat (50) for abutting and positioning the wafer; wherein the front seat group (3) has a rod hole (31) for inserting the pneumatic rod (20), A slot (32) is opened to the rod hole (31), and the slot (32) is clamped by a clamping bolt (39) to fix the front seat group (3) and the pneumatic rod (20).
TW108109132A 2019-03-18 2019-03-18 Wafer detection pushing device TWI695175B (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN205423384U (en) * 2015-11-27 2016-08-03 富泰华工业(深圳)有限公司 Cylinder combination
TWI639546B (en) * 2018-05-04 2018-11-01 鴻勁精密股份有限公司 Electronic component crimping mechanism and test classification device
TWI653453B (en) * 2018-05-28 2019-03-11 致茂電子股份有限公司 Electronic component testing device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN205423384U (en) * 2015-11-27 2016-08-03 富泰华工业(深圳)有限公司 Cylinder combination
TWI639546B (en) * 2018-05-04 2018-11-01 鴻勁精密股份有限公司 Electronic component crimping mechanism and test classification device
TWI653453B (en) * 2018-05-28 2019-03-11 致茂電子股份有限公司 Electronic component testing device

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