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TW201903393A - Defect inspection system, film manufacturing device, film manufacturing method, printing device, and printing method - Google Patents

Defect inspection system, film manufacturing device, film manufacturing method, printing device, and printing method Download PDF

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Publication number
TW201903393A
TW201903393A TW107106816A TW107106816A TW201903393A TW 201903393 A TW201903393 A TW 201903393A TW 107106816 A TW107106816 A TW 107106816A TW 107106816 A TW107106816 A TW 107106816A TW 201903393 A TW201903393 A TW 201903393A
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film
defect inspection
printing
defect
inspection system
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TW107106816A
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Chinese (zh)
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TWI762592B (en
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橋口大輔
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日商住友化學股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J3/00Typewriters or selective printing or marking mechanisms characterised by the purpose for which they are constructed
    • B41J3/407Typewriters or selective printing or marking mechanisms characterised by the purpose for which they are constructed for marking on special material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41MPRINTING, DUPLICATING, MARKING, OR COPYING PROCESSES; COLOUR PRINTING
    • B41M5/00Duplicating or marking methods; Sheet materials for use therein
    • B41M5/0041Digital printing on surfaces other than ordinary paper
    • B41M5/0064Digital printing on surfaces other than ordinary paper on plastics, horn, rubber, or other organic polymers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Making Paper Articles (AREA)
  • Continuous Casting (AREA)

Abstract

An objective of the present invention is to provide a defect inspection system capable of reducing the influence of fluttering occurring in a film being conveyed and appropriately recording defect information on the film. A defect inspection system includes a conveying line for conveying a long strip-shaped film, a defect inspection device for inspecting defect inspection of the film being conveyed by the conveying line, and a recording device 13 for recording defect information based on the result of the defect inspection on the film F105 being conveyed by the conveying line, wherein the recording device 13 has a printing head 13a for printing defect information by ejecting ink i on a recording area along an edge portion of the film F105, and the printing head 13a is disposed to face a guide roller 153c which is in contact with the film F105.

Description

缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法    Defect inspection system, film manufacturing device, film manufacturing method, printing device, and printing method   

本發明係關於缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法。 The present invention relates to a defect inspection system, a film manufacturing apparatus, a film manufacturing method, a printing device, and a printing method.

例如偏光板等的光學膜,係在進行過異物缺陷、凹凸缺陷等之缺陷檢查後,捲繞在芯材的周圍。與缺陷的位置及種類有關之資訊(以下稱為缺陷資訊),係以在光學膜的端部印上條碼(barcode)、或在缺陷部位印上標記(mark)之方式記錄在光學膜上。捲繞於芯材之光學膜的捲繞量達到一定的量,就與來自上游側的光學膜切分開來,作為光學膜的料捲而出貨。在例如專利文獻1中,揭示一種:在光學膜的搬送線上配備有缺陷檢查裝置、及將缺陷資訊記錄在膜上的記錄裝置之缺陷檢查系統。 For example, an optical film such as a polarizing plate is wound around a core material after being inspected for defects such as foreign matter defects and unevenness defects. Information related to the location and type of the defect (hereinafter referred to as defect information) is recorded on the optical film by printing a barcode on the end of the optical film or by marking on the defect portion. When the winding amount of the optical film wound around the core material reaches a certain amount, it is cut off from the upstream optical film and shipped as a roll of the optical film. For example, Patent Document 1 discloses a defect inspection system equipped with a defect inspection device on a transport line of an optical film and a recording device that records defect information on the film.

[先前技術文獻]     [Prior technical literature]     [專利文獻]     [Patent Literature]    

[專利文獻1]日本特開2011-7779號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2011-7779

然而,上述的缺陷檢查系統在將缺陷資訊記錄在光學膜上之際,會因為光學膜的狀態、搬送條件等而發生搬送中的光學膜啪啪跳動之情形。光學膜發生如此的啪啪跳動的話,就有:要利用從印字頭噴出的墨水印上之缺陷資訊,不會正確地記錄在沿著光學膜的端緣部之記錄區域,而印得不清楚(印字錯誤)之虞。 However, when the defect inspection system described above records defect information on the optical film, the optical film may be slammed during transportation due to the state of the optical film, the transportation conditions, and the like. If such a popping of the optical film occurs, it is necessary to use the defect information printed on the ink ejected from the printing head, and it will not be recorded correctly in the recording area along the edge of the optical film, and the print will not be clear. (Printing error).

本發明係有鑒於如上所述的以往的問題而提出者,其目的在提供可減低搬送中的膜發生的啪啪跳動所造成的影響,可適切地將缺陷資訊記錄於膜上之缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法。 The present invention has been made in view of the conventional problems described above, and an object thereof is to provide a defect inspection system capable of reducing the influence caused by popping of a film during transportation and appropriately recording defect information on the film. Film manufacturing device, film manufacturing method, printing device, and printing method.

作為解決上述課題之手段,根據本發明之態樣提供一種缺陷檢查系統,其係具備有:搬送線,係搬送長帶狀的膜;缺陷檢查裝置,係進行在前述搬送線搬送的膜的缺陷檢查;以及記錄裝置,係將根據前述缺陷檢查的結果而得到的缺陷資訊記錄到在前述搬送線搬送的膜,其中,前述記錄裝置係具有印字頭,前述印字頭係將前述缺陷資訊印到沿著前述膜的端緣部之記錄區域,前述印字頭係與和前述膜接觸之導輥相對向而配置,且從前述膜和前述導輥接觸之側的相反側進行印字。 As a means for solving the above-mentioned problems, according to an aspect of the present invention, there is provided a defect inspection system including: a conveying line for conveying a long-belt-shaped film; and a defect inspection device for performing defects on the film conveyed on the conveying line. Inspection; and a recording device that records defect information obtained based on the results of the defect inspection on a film conveyed on the transfer line, wherein the recording device has a print head, and the print head prints the defect information to The printing head faces the recording area of the edge portion of the film, and the printing head is disposed to face the guide roller in contact with the film, and performs printing from the side opposite to the side where the film and the guide roller are in contact.

在前述態樣之缺陷檢查系統中,前述膜可為以40°至130°之角度範圍繞接在前述導輥的外周面之構成。 In the defect inspection system of the foregoing aspect, the film may be configured to be wound around the outer peripheral surface of the guide roller in an angle range of 40 ° to 130 °.

在前述態樣之缺陷檢查系統中,前述印字頭可為藉由使墨水噴出至前述膜的記錄區域而對前述缺陷資訊進行印字之構成。 In the defect inspection system of the aforementioned aspect, the printing head may be configured to print the defect information by ejecting ink to a recording area of the film.

在前述態樣之缺陷檢查系統中,前述記錄裝置可為具有遮蓋(cover),該遮蓋係防止墨水附著到前述膜的至少比前述記錄區域更靠近內側的區域之構成。 In the defect inspection system of the foregoing aspect, the recording device may have a cover that prevents ink from adhering to an area of the film that is at least closer to the inside than the recording area.

前述態樣之缺陷檢查系統,可為具備有:在前述膜的搬送方向上位於比前述記錄裝置更靠近上游側之位置,用來對前述膜的表面進行除電之靜電去除裝置之構成。 The above-mentioned defect inspection system may be configured to include a static electricity removing device that is located closer to the upstream side than the recording device in the conveyance direction of the film and is used to remove electricity from the surface of the film.

另外,根據本發明的態樣提供一種膜製造裝置,此膜製造裝置具備有前述任一形態的缺陷檢查系統。 Moreover, according to one aspect of this invention, the film manufacturing apparatus provided with the defect inspection system of any one of the above-mentioned forms is provided.

又,根據本發明的態樣提供一種膜製造方法,此膜製造方法包含:使用前述任一形態的缺陷檢查系統來進行缺陷檢查之工序。 Furthermore, according to an aspect of the present invention, there is provided a film manufacturing method including a step of performing a defect inspection using the defect inspection system of any one of the foregoing forms.

又,根據本發明的態樣提供一種印字裝置,此印字裝置係具備有:在搬送長帶狀的膜的期間將資訊印到前述膜之印字頭,前述印字頭係與和前述膜接觸之導輥相對向而配置,且從前述膜和前述導輥接觸之位置的相反側進行印字。 Furthermore, according to an aspect of the present invention, a printing device is provided. The printing device is provided with a printing head that prints information to the film during conveyance of the long-belt-shaped film, and the printing head is in contact with the film. The rollers are arranged to face each other, and printing is performed from the side opposite to the position where the film and the guide roller contact.

又,根據本發明的態樣提供一種印字方 法,此印字方法係包含:在搬送長帶狀的膜的期間使用印字頭將資訊印到前述膜之工序,其中,使前述印字頭與和前述膜接觸之導輥相對向而配置,且從前述膜和前述導輥接觸之位置的相反側進行印字。 In addition, according to an aspect of the present invention, a printing method is provided. The printing method includes a step of printing information onto the film by using a printing head during conveyance of the long strip-shaped film, wherein the printing head and the film The contacting guide rollers are arranged facing each other, and printing is performed from the opposite side of the position where the film and the guide rollers contact.

如以上所述,根據本發明之態樣,就可提供可減低搬送中的膜發生的啪啪跳動所造成的影響,可適切地將缺陷資訊記錄於膜上之缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法。 As described above, according to aspects of the present invention, it is possible to provide a defect inspection system, a film manufacturing apparatus, and a film inspection device that can reduce the influence caused by the popping of the film during transportation, and can appropriately record defect information on the film. Film manufacturing method, printing device and printing method.

10‧‧‧缺陷檢查系統 10‧‧‧ Defect inspection system

11‧‧‧第一缺陷檢查裝置 11‧‧‧The first defect inspection device

12‧‧‧第二缺陷檢查裝置 12‧‧‧Second Defect Inspection Device

13‧‧‧記錄裝置 13‧‧‧Recording device

13a‧‧‧印字頭 13a‧‧‧printing head

14‧‧‧第一測長器 14‧‧‧The first length measuring device

15‧‧‧第二測長器 15‧‧‧Second length measuring device

16‧‧‧控制裝置 16‧‧‧Control device

21a、22a、23a、24a、25a‧‧‧照明部 21a, 22a, 23a, 24a, 25a

21b、22b、23b、24b、25b‧‧‧光檢測部 21b, 22b, 23b, 24b, 25b

30‧‧‧遮蓋 30‧‧‧ cover

30a‧‧‧第一側板部 30a‧‧‧First side plate

30b‧‧‧第二側板部 30b‧‧‧Second side plate section

30c‧‧‧第三側板部 30c‧‧‧The third side plate

30d‧‧‧第四側板部 30d‧‧‧Fourth side plate

31‧‧‧遮蓋 31‧‧‧ cover

32‧‧‧遮蓋 32‧‧‧ cover

32a‧‧‧窗部 32a‧‧‧Window

40‧‧‧靜電去除裝置 40‧‧‧ static elimination device

100‧‧‧膜製造裝置 100‧‧‧ film manufacturing equipment

101‧‧‧第一搬送線 101‧‧‧The first transfer line

102‧‧‧第二搬送線 102‧‧‧Second Transfer Line

103‧‧‧第三搬送線 103‧‧‧ Third Transfer Line

104‧‧‧第四搬送線 104‧‧‧Fourth Transfer Line

105‧‧‧第五搬送線 105‧‧‧Fifth transfer line

106‧‧‧捲取部 106‧‧‧ Take-up Department

111a、111b‧‧‧第一夾輥 111a, 111b‧‧‧The first nip roller

112‧‧‧第一蓄積器 112‧‧‧The first accumulator

112a、112b‧‧‧第一張力調節輥 112a, 112b‧‧‧ First tension adjusting roller

113‧‧‧第一導輥 113‧‧‧first guide roller

121a、121b‧‧‧第二夾輥 121a, 121b‧‧‧Second nip roller

122‧‧‧第二蓄積器 122‧‧‧Second Accumulator

122a、122b‧‧‧第二張力調節輥 122a, 122b‧‧‧Second tension adjusting roller

123a、123b‧‧‧第二導輥 123a, 123b‧‧‧Second guide roller

131a、131b‧‧‧第三夾輥 131a, 131b‧‧‧ Third pinch roller

141a、141b‧‧‧第四夾輥 141a, 141b‧‧‧ Fourth pinch roller

142‧‧‧第三蓄積器 142‧‧‧Third Accumulator

142a、142b‧‧‧第三張力調節輥 142a, 142b‧‧‧Third tension adjustment roller

143a、143b‧‧‧第四導輥 143a, 143b‧‧‧ Fourth guide roller

151a、151b‧‧‧第五夾輥 151a, 151b‧‧‧ fifth pinch roller

152‧‧‧第四蓄積器 152‧‧‧Fourth Accumulator

152a、152b‧‧‧第四張力調節輥 152a, 152b‧‧‧ Fourth tension adjustment roller

153a‧‧‧第五導輥 153a‧‧‧Fifth guide roller

153b‧‧‧第六導輥 153b‧‧‧ Sixth guide roller

153c‧‧‧第七導輥 153c‧‧‧Seventh guide roller

P‧‧‧液晶顯示面板(光學顯示裝置) P‧‧‧LCD panel (optical display device)

F1X‧‧‧光學膜 F1X‧‧‧Optical Film

F10X‧‧‧光學膜 F10X‧‧‧Optical Film

F101‧‧‧第一膜 F101‧‧‧first film

F102‧‧‧第二膜 F102‧‧‧Second film

F103‧‧‧第三膜 F103‧‧‧Third film

F104‧‧‧單面貼合膜 F104‧‧‧Single-sided laminating film

F105‧‧‧兩面貼合膜 F105‧‧‧Laminated film on both sides

第1圖係顯示液晶顯示面板的一例之平面圖。 FIG. 1 is a plan view showing an example of a liquid crystal display panel.

第2圖係第1圖中顯示的液晶顯示面板的斷面圖。 FIG. 2 is a cross-sectional view of the liquid crystal display panel shown in FIG. 1. FIG.

第3圖係顯示光學膜的一例之斷面圖。 Fig. 3 is a sectional view showing an example of an optical film.

第4圖係顯示膜製造裝置及缺陷檢查系統的構成之側面圖。 FIG. 4 is a side view showing the configuration of a film manufacturing apparatus and a defect inspection system.

第5圖係顯示記錄裝置的一例之側面圖。 Fig. 5 is a side view showing an example of a recording device.

第6圖係顯示遮蓋的一例,第6圖(a)係遮蓋之從膜的上方側所見的平面圖,第6圖(b)係遮蓋之從膜的上游側所見的側面圖,第6圖(c)係遮蓋之從膜的外側所見的側面圖。 Fig. 6 shows an example of masking. Fig. 6 (a) is a plan view of the mask viewed from the upper side of the film, and Fig. 6 (b) is a side view of the mask viewed from the upstream side of the film. Fig. 6 ( c) A side view of the cover as seen from the outside of the film.

第7圖係顯示遮蓋的變形例之平面圖。 Fig. 7 is a plan view showing a modification of the mask.

第8圖係顯示遮蓋的變形例,第8圖(a)係遮蓋的斜視圖,第8圖(b)係遮蓋的側面圖。 Fig. 8 shows a modification of the mask, Fig. 8 (a) is a perspective view of the mask, and Fig. 8 (b) is a side view of the mask.

第9圖係顯示遮蓋的另一實施形態,第9圖(a)係遮蓋 的平面圖,第9圖(b)係遮蓋的側面圖。 Fig. 9 shows another embodiment of the covering, Fig. 9 (a) is a plan view of the covering, and Fig. 9 (b) is a side view of the covering.

以下,參照圖式來詳細說明本發明的實施形態。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

在本實施形態中,將就光學顯示裝置的生產系統,說明構成其一部分之膜製造裝置、以及使用此膜製造裝置之膜製造方法。 In this embodiment, a film production apparatus constituting a part of the production system of an optical display device and a film production method using the film production apparatus will be described.

膜製造裝置係製造用來貼合在例如液晶顯示面板(panel)、有機EL顯示面板等之面板狀的光學顯示元件(光學顯示面板)上之例如偏光膜或相位差膜、增亮膜等的膜狀的光學部件(光學膜)之裝置。膜製造裝置係構成生產包含如此的光學顯示元件及光學部件之光學顯示裝置(device)的生產系統的一部分。 The film manufacturing apparatus manufactures, for example, a polarizing film, a retardation film, a brightness enhancement film, and the like, which are bonded to a panel-shaped optical display element (optical display panel) such as a liquid crystal display panel or an organic EL display panel. Device for film-like optical components (optical films). The film production apparatus constitutes a part of a production system for producing an optical display device including such an optical display element and an optical component.

本實施形態中,係以透過型的液晶顯示裝置作為光學顯示裝置的例子進行說明。透過型的液晶顯示裝置係大致具有液晶顯示面板、以及背光(backlight)。此液晶顯示裝置可藉由使從背光射出的照明光從液晶顯示面板的背面側射入,使經液晶顯示面板予以調變過的光從液晶顯示面板的表面側射出而顯示影像。 In this embodiment, a transmissive liquid crystal display device is used as an example of the optical display device. A transmissive liquid crystal display device generally includes a liquid crystal display panel and a backlight. In this liquid crystal display device, the illumination light emitted from the backlight is made incident from the back side of the liquid crystal display panel, and the light modulated by the liquid crystal display panel is emitted from the surface side of the liquid crystal display panel to display an image.

(光學顯示裝置)     (Optical display device)    

首先,針對光學顯示裝置,說明第1及2圖所示的液晶顯示面板P的構成。第1圖係顯示液晶顯示面板P的構成之平面圖。第2圖係沿著第1圖中顯示的剖面線A-A剖 開之液晶顯示面板P的斷面圖。第2圖中省略了表示斷面之陰影線的圖示。 First, the configuration of the liquid crystal display panel P shown in FIGS. 1 and 2 will be described for the optical display device. FIG. 1 is a plan view showing the configuration of the liquid crystal display panel P. Fig. 2 is a sectional view of the liquid crystal display panel P taken along the section line A-A shown in Fig. 1. In FIG. 2, the hatching of the cross section is omitted.

液晶顯示面板P係如第1及2圖所示,大致具備有第一基板P1、與第一基板P1相對向配置之第二基板P2、以及配置於第一基板P1與第二基板P2之間之液晶層P3。 As shown in FIGS. 1 and 2, the liquid crystal display panel P is roughly provided with a first substrate P1, a second substrate P2 disposed opposite to the first substrate P1, and a liquid crystal display panel P disposed between the first substrate P1 and the second substrate P2. The liquid crystal layer P3.

第一基板P1係由從平面圖看呈長方形的透明基板所構成。第二基板P2係由比第一基板P1小之長方形的透明基板所構成。第一基板P1與第二基板P2之間的周圍係以密封材(未圖示)密封住,液晶層P3係配置於由密封材所圍住之從平面圖看呈長方形的區域的內側。液晶顯示面板P當中,從平面圖看限制在液晶層P3的外周的內側之區域為顯示區域P4,包圍在此顯示區域P4的周圍之外側的區域為框緣部G。 The first substrate P1 is composed of a transparent substrate that is rectangular in a plan view. The second substrate P2 is composed of a rectangular transparent substrate smaller than the first substrate P1. The periphery between the first substrate P1 and the second substrate P2 is sealed with a sealing material (not shown), and the liquid crystal layer P3 is disposed inside a region surrounded by the sealing material and rectangular in a plan view. In the liquid crystal display panel P, a region restricted to the inner side of the outer periphery of the liquid crystal layer P3 in a plan view is a display region P4, and a region surrounded on the outer side of the periphery of the display region P4 is a frame edge portion G.

在液晶顯示面板P的背面(背光側),貼合有作為偏光膜之第一膜F11。在液晶顯示面板P的表面(顯示面側),則貼合有作為偏光膜之第二膜F12、以及重疊而貼合於第二膜F12上之作為增亮膜之第三膜F13。以下,將第一膜、第二膜及第三膜F11、F12、F13統稱為光學膜F1X。 A first film F11 as a polarizing film is bonded to the back surface (backlight side) of the liquid crystal display panel P. On the surface (display surface side) of the liquid crystal display panel P, a second film F12 as a polarizing film and a third film F13 as a brightness enhancement film which is laminated and bonded to the second film F12 are bonded. Hereinafter, the first film, the second film, and the third film F11, F12, and F13 are collectively referred to as an optical film F1X.

(光學膜)     (Optical film)    

接著,說明第3圖所示之構成光學膜F1X之光學片FX的一例。第3圖係顯示光學片FX的構成之斷面圖。第3圖中省略了表示斷面之陰影線的圖示。 Next, an example of the optical sheet FX constituting the optical film F1X shown in FIG. 3 will be described. Fig. 3 is a sectional view showing the configuration of the optical sheet FX. In FIG. 3, the hatching of the cross section is omitted.

光學膜F1X係從第3圖所示的長帶狀的光學片(料捲)FX切出一段預定長度的片段(chip)而得到。具體而言,該光學片FX係具有基材片F4、設於基材片F4的一側的面(第3圖中的上側面)之黏著層F5、透過黏著層F5而設於基材片F4的一側的面之分隔片(separator sheet)F6、以及設於基材片F4的另一側的面(第3圖中的下側面)之表面保護片F7。 The optical film F1X is obtained by cutting a length of a chip of a predetermined length from the long strip-shaped optical sheet (roll) FX shown in FIG. 3. Specifically, the optical sheet FX includes a base material sheet F4, an adhesive layer F5 provided on one surface (upper side in FIG. 3) of the base material sheet F4, and is provided on the base material sheet through the adhesive layer F5. A separator sheet F6 on one side of F4, and a surface protection sheet F7 provided on the other side (lower side in FIG. 3) of the base material sheet F4.

基材片F4在例如偏光膜之情況,係具有將偏光鏡(polarizer)F4a夾在一對保護膜F4b、F4c之間的構造。黏著層F5係用來使光學片(光學膜F1X)黏貼在液晶顯示面板P上之層。分隔片F6係保護黏著層F5之膜片,在要將光學片(光學膜F1X)黏貼至液晶顯示面板P之前從黏著層F5剝離。以下,將已經撕掉分隔片F6之光學膜F1X的部分稱為貼合片F8。表面保護片F7係用來保護基材片F4的表面之膜片,表面保護片F7在已將光學片(光學膜F1X)黏貼至液晶顯示面板P之後從光學片(光學膜F1X)的表面剝離。 In the case of the polarizing film, for example, the base material sheet F4 has a structure in which a polarizer F4a is sandwiched between a pair of protective films F4b and F4c. The adhesive layer F5 is a layer for attaching an optical sheet (optical film F1X) to the liquid crystal display panel P. The separator F6 is a film that protects the adhesive layer F5, and is separated from the adhesive layer F5 before the optical sheet (optical film F1X) is adhered to the liquid crystal display panel P. Hereinafter, a portion where the optical film F1X of the separator F6 has been removed is referred to as a bonding sheet F8. The surface protection sheet F7 is a film for protecting the surface of the substrate sheet F4. The surface protection sheet F7 is peeled from the surface of the optical sheet (optical film F1X) after the optical sheet (optical film F1X) has been pasted to the liquid crystal display panel P. .

在基材片F4方面,可為將一對保護膜F4b、F4c之中的任一方予以省略之構成。例如,可省略黏著層F5側的保護膜F4b而將黏著層F5直接設於偏光鏡F4a。另外,可對於表面保護片F7側的保護膜F4c,施加例如用來保護液晶顯示面板P的最外面之硬鍍膜(hard coating)處理、用來得到防眩效果之防眩光(antiglare)處理等之表面處理。又,基材片F4並不限於上述的積層構造的薄片,亦 可為單層構造的薄片。此外,也可將表面保護片F7予以省略。 The base material sheet F4 may have a configuration in which any one of the pair of protective films F4b and F4c is omitted. For example, the protective film F4b on the side of the adhesive layer F5 may be omitted, and the adhesive layer F5 may be directly provided on the polarizer F4a. In addition, the protective film F4c on the side of the surface protective sheet F7 may be subjected to, for example, a hard coating treatment to protect the outermost portion of the liquid crystal display panel P, an antiglare treatment to obtain an antiglare effect, and the like. Surface treatment. In addition, the base material sheet F4 is not limited to the above-mentioned laminated structure sheet, and may be a single-layer structure sheet. The surface protection sheet F7 may be omitted.

(膜製造裝置及膜製造方法)     (Film manufacturing apparatus and method)    

接著,說明第4圖所示之膜製造裝置100。第4圖係顯示膜製造裝置100的構成之側面圖。 Next, a film manufacturing apparatus 100 shown in FIG. 4 will be described. FIG. 4 is a side view showing the configuration of the film manufacturing apparatus 100.

膜製造裝置100係如第4圖所示,為例如在作為偏光膜之長帶狀的第一膜F101的一面貼合作為表面保護膜之長帶狀的第二膜F102之後,在第一膜F101的另一面貼合作為表面保護膜之長帶狀的第三膜F103,以此方式製造在第一膜F101的兩面貼合有第二膜F102及第三膜F103之光學膜F10X之裝置。 As shown in FIG. 4, the film manufacturing apparatus 100 is, for example, a long strip-shaped second film F101 that is a polarizing film and is adhered to a long strip-shaped second film F102 that is a surface protective film. The other side of F101 is bonded to a third long-belt-shaped third film F103 of a surface protection film. In this way, a device in which an optical film F10X in which a second film F102 and a third film F103 are bonded on both sides of the first film F101 is manufactured.

具體而言,該膜製造裝置100係大致具備有第一搬送線101、第二搬送線102、第三搬送線103、第四搬送線104、第五搬送線105、以及捲取部106。 Specifically, the film manufacturing apparatus 100 generally includes a first transfer line 101, a second transfer line 102, a third transfer line 103, a fourth transfer line 104, a fifth transfer line 105, and a winding unit 106.

其中,第一搬送線101係形成搬送第一膜F101之搬送路徑,第二搬送線102係形成搬送從第一料捲R1拉出的第二膜F102之搬送路徑,第三搬送線103係形成搬送在第一膜F101的一面貼合第二膜F102之後的單面貼合膜F104之搬送路徑,第四搬送線104係形成搬送從第二料捲R2拉出的第三膜F103之搬送路徑,第五搬送線105係形成搬送在單面貼合膜F104的第一膜F101側的面(第一膜F101的另一面)貼合第三膜F103之後的兩面貼合膜F105(光學膜F10X)之搬送路徑。製造出的光學膜F10X 係在捲取部106捲繞在芯材上而成為第三料捲R3。 Among them, the first conveying line 101 forms a conveying path for conveying the first film F101, the second conveying line 102 forms a conveying path for conveying the second film F102 pulled out from the first roll R1, and the third conveying line 103 forms The single-sided laminating film F104 is conveyed on one side of the first film F101 after the second film F102 is attached. The fourth conveying line 104 forms a conveying path for the third film F103 pulled out from the second roll R2. The fifth conveying line 105 forms a two-sided bonding film F105 (optical film F10X) after the third film F103 is bonded to the first film F101 side of the single-sided bonding film F104 (the other side of the first film F101). ). The manufactured optical film F10X is wound around a core material at a winding unit 106 to form a third roll R3.

第一搬送線101係將對於例如PVA(聚乙烯醇:Polyvinyl Alcohol)等之作為偏光鏡的基材之膜施加染色處理及交聯處理、拉伸處理等之後,在其兩面貼合TAC(三醋酸纖維素:Triacetylcellulose)等之保護膜而得到之長帶狀的第一膜F101往第三搬送線103搬送。 The first transfer line 101 is a method in which, for example, PVA (polyvinyl alcohol: Polyvinyl Alcohol) is used as a base material of a polarizer to apply a dyeing treatment, a crosslinking treatment, a stretching treatment, and the like, and then TAC (three The long film-like first film F101 obtained from a protective film such as cellulose acetate: Triacetylcellulose) is transferred to the third transfer line 103.

具體而言,係在此第一搬送線101上,從第三搬送線103的上游處的一方側開始朝向第三搬送線103的方向,在水平方向依序排列配置一對第一夾輥(nip roller)111a、111b、包含複數個第一張力調節輥(dancer roller)112a、112b之第一蓄積器(accumulator)112、以及第一導輥113。 Specifically, a pair of first nip rollers (in a horizontal direction) are arranged in this order on the first conveying line 101, starting from one side upstream of the third conveying line 103 toward the third conveying line 103. nip rollers 111a, 111b, a first accumulator 112 including a plurality of first dancer rollers 112a, 112b, and a first guide roller 113.

一對第一夾輥111a、111b係將第一膜F101夾在中間且同時往相反方向轉,藉此而將第一膜F101往第4圖中顯示的箭號的方向(右方)拉。 The pair of first pinch rolls 111a and 111b sandwich the first film F101 in the middle and rotate in the opposite direction at the same time, thereby pulling the first film F101 in the direction of the arrow (right) shown in FIG. 4.

第一蓄積器112係用來吸收第一膜F101的進給量變動所產生的差,以及減低施加於第一膜F101之張力的變動。具體而言,第一蓄積器112係具有在第一夾輥111a、111b與第一導輥113之間將位於上部側之複數個張力調節輥112a及位於下部側之複數個張力調節輥112b交互排列配置之構成。 The first accumulator 112 is used to absorb a difference caused by a change in the feed amount of the first film F101 and reduce a change in the tension applied to the first film F101. Specifically, the first accumulator 112 includes a plurality of tension adjustment rollers 112a on the upper side and a plurality of tension adjustment rollers 112b on the lower side between the first nip rollers 111a, 111b and the first guide roller 113. Arrangement configuration.

第一蓄積器112係以使第一膜F101交互地繞過上部側的張力調節輥112a及繞過下部側的張力調節輥112b之狀態,一邊進行第一膜F101的搬送,一邊使上部側的張力調節輥112a及下部側的張力調節輥112b相對 地在上下方向做升降動作。如此,就可暫時蓄積第一膜F101而不用使第一搬送線101停止。例如,第一蓄積器112使上部側的張力調節輥112a與下部側的張力調節輥112b之間的距離增大,就可增加第一膜F101之蓄積,反之,使上部側的張力調節輥112a與下部側的張力調節輥112b之間的距離縮減,就可減少第一膜F101之蓄積。第一蓄積器112係例如在更換料捲R1至R3的芯材之後的片帶的銜接等之作業時稼動。 The first accumulator 112 is a state in which the first film F101 alternately bypasses the tension adjustment roller 112a on the upper side and the tension adjustment roller 112b on the lower side, and the first film F101 is conveyed while the upper film The tension adjustment roller 112a and the tension adjustment roller 112b on the lower side relatively move up and down in the vertical direction. In this way, the first film F101 can be temporarily accumulated without stopping the first transfer line 101. For example, if the first accumulator 112 increases the distance between the upper tension adjusting roller 112a and the lower tension adjusting roller 112b, the accumulation of the first film F101 can be increased, and conversely, the upper tension adjusting roller 112a is increased. By reducing the distance from the lower tension adjusting roller 112b, the accumulation of the first film F101 can be reduced. The first accumulator 112 is moved, for example, during operations such as the connection of the sheets after the core materials of the rolls R1 to R3 are replaced.

第一導輥113係轉動而將第一夾輥111a、111b所拉動並搬送過來的第一膜F101導引朝向第三搬送線103的上游側。第一導輥113並不限於只配置一個之構成,亦可為配置複數個之構成。 The first guide roller 113 is rotated to guide the first film F101 pulled and conveyed by the first nip rollers 111 a and 111 b toward the upstream side of the third conveyance line 103. The first guide roller 113 is not limited to a configuration in which only one is disposed, and may be a configuration in which a plurality of first guide rollers are disposed.

第二搬送線102係將例如PET(聚對苯二甲酸乙二酯:Polyethylene Terephthalate)等之作為表面保護膜之長帶狀的第二膜F102從第一料捲R1拉出,並將之往第三搬送線103搬送。 The second conveying line 102 is a long strip-shaped second film F102 such as PET (Polyethylene Terephthalate) as a surface protection film is pulled out from the first roll R1, The third transfer line 103 transfers.

具體而言,係在此第二搬送線102上,從第三搬送線103的上游處的另一方側開始朝向第三搬送線103的方向,在水平方向依序排列配置一對第二夾輥121a、121b、包含複數個第二張力調節輥122a、122b之第二蓄積器122、以及複數個第二導輥123a、123b。 Specifically, on the second conveying line 102, a pair of second nip rollers are arranged in a horizontal direction from the other side upstream of the third conveying line 103 toward the third conveying line 103. 121a, 121b, a second accumulator 122 including a plurality of second tension adjusting rollers 122a, 122b, and a plurality of second guide rollers 123a, 123b.

一對第二夾輥121a、121b係將第二膜F102夾在中間且同時往相反方向轉,藉此而將第二膜F102往第4圖中顯示的箭號的方向(左方)拉。 The pair of second nip rollers 121a and 121b sandwich the second film F102 in the middle and rotate in opposite directions at the same time, thereby pulling the second film F102 in the direction of the arrow (left) shown in FIG.

第二蓄積器122係用來吸收第二膜F102的進給量變動所產生的差,以及減低施加於第二膜F102之張力的變動。具體而言,第二蓄積器122係具有在第二夾輥121a、121b與第二導輥123a之間將位於上部側之複數個張力調節輥122a及位於下部側之複數個張力調節輥122b交互排列配置之構成。 The second accumulator 122 is used to absorb a difference caused by a change in the feed amount of the second film F102 and reduce a change in the tension applied to the second film F102. Specifically, the second accumulator 122 includes a plurality of tension adjusting rollers 122a on the upper side and a plurality of tension adjusting rollers 122b on the lower side between the second nip rollers 121a, 121b and the second guide roller 123a. Arrangement configuration.

第二蓄積器122係以使第二膜F102交互地繞過上部側的張力調節輥122a及繞過下部側的張力調節輥122b之狀態,一邊進行第二膜F102的搬送,一邊使上部側的張力調節輥122a及下部側的張力調節輥122b相對地在上下方向做升降動作。如此,就可蓄積第二膜F102而不用使第二搬送線102停止。例如,第二蓄積器122使上部側的張力調節輥122a與下部側的張力調節輥122b之間的距離增大,就可增加第二膜F102之蓄積,反之,使上部側的張力調節輥122a與下部側的張力調節輥122b之間的距離縮減,就可減少第二膜F102之蓄積。第二蓄積器122係例如在更換料捲R1至R3的芯材之後的片帶的銜接等之作業時稼動。 The second accumulator 122 is a state in which the second film F102 alternately bypasses the tension adjustment roller 122a on the upper side and the tension adjustment roller 122b on the lower side, and the second film F102 is conveyed while the upper film The tension adjustment roller 122a and the tension adjustment roller 122b on the lower side relatively move up and down in the vertical direction. In this way, the second film F102 can be accumulated without stopping the second transfer line 102. For example, if the second accumulator 122 increases the distance between the upper tension adjusting roller 122a and the lower tension adjusting roller 122b, the accumulation of the second film F102 can be increased, and conversely, the upper tension adjusting roller 122a is increased. By reducing the distance from the lower tension adjusting roller 122b, the accumulation of the second film F102 can be reduced. The second accumulator 122 is moved, for example, during operations such as the connection of the sheets after the core materials of the rolls R1 to R3 are replaced.

複數個第二導輥123a、123b係分別轉動而將第二夾輥121a、121b所拉動並搬送過來的第二膜F102導引向第三搬送線103的上游側。第二導輥123a、123b並不限於配置複數個之構成,亦可為只配置一個之構成。 The plurality of second guide rollers 123 a and 123 b are respectively rotated to guide the second film F102 pulled and transported by the second nip rollers 121 a and 121 b to the upstream side of the third transport line 103. The second guide rollers 123a and 123b are not limited to a configuration in which a plurality of second guide rollers 123a and 123b are disposed, and may be a configuration in which only one is disposed.

第三搬送線103係將在第一膜F101的一面貼合第二膜F102而成的長帶狀的單面貼合膜F104往第五 搬送線105搬送。 The third transfer line 103 transfers a long-strip single-sided bonding film F104 formed by bonding the second film F102 to one side of the first film F101 to the fifth transfer line 105.

具體而言,係在此第三搬送線103上配置一對第三夾輥131a、131b。一對第三夾輥131a、131b係位於第一搬送線101的下游側與第二搬送線102的下游側的合流點,將第一膜F101及第二膜F102夾在中間且同時往相反方向旋轉,藉此而將第一膜F101及第二膜F102兩者相貼合而成的單面貼合膜F104往第4圖中顯示的箭號的方向(下方)拉。 Specifically, a pair of third pinch rollers 131 a and 131 b are arranged on the third transfer line 103. A pair of third pinch rollers 131a and 131b are located at a confluence point of the downstream side of the first conveying line 101 and the downstream side of the second conveying line 102, sandwiching the first film F101 and the second film F102 in the middle and facing in opposite directions at the same time By rotating, the single-sided bonding film F104 formed by bonding the first film F101 and the second film F102 together is pulled in the direction of the arrow (below) shown in FIG. 4.

第四搬送線104係將例如PET(Polyethylene Terephthalate)等之作為表面保護膜之長帶狀的第三膜F103從第二料捲R2拉出,並將之往第五搬送線105搬送。 The fourth transfer line 104 is a long strip-shaped third film F103, such as PET (Polyethylene Terephthalate), which is a surface protective film, is pulled out from the second roll R2, and is transferred to the fifth transfer line 105.

具體而言,係在此第四搬送線104上,從第三搬送線103的下游處的一方側開始朝向第三搬送線103的方向,在水平方向依序排列配置一對第四夾輥141a、141b、包含複數個第三張力調節輥142a、142b之第三蓄積器142、以及複數個第四導輥143a、143b。 Specifically, on the fourth conveying line 104, a pair of fourth pinch rollers 141a are sequentially arranged in the horizontal direction from one side downstream of the third conveying line 103 toward the third conveying line 103. 141b, a third accumulator 142 including a plurality of third tension adjusting rollers 142a, 142b, and a plurality of fourth guide rollers 143a, 143b.

一對第四夾輥141a、141b係一邊將第三膜F103夾在中間且一邊相互往相反方向轉,藉此而將第三膜F103往第4圖中顯示的箭號的方向(右方)拉。 A pair of fourth nip rollers 141a and 141b rotate the third film F103 in the direction of the arrow shown in Fig. 4 (right side) while sandwiching the third film F103 in the middle and rotating in opposite directions. Pull.

第三蓄積器142係用來吸收第三膜F103的進給量變動所產生的差,以及減低施加於第三膜F103之張力的變動。具體而言,第三蓄積器142係具有在第四夾輥141a、141b與第四導輥143a之間將位於上部側之複數個張力調節輥142a及位於下部側之複數個張力調節輥 142b交互排列配置之構成。 The third accumulator 142 is used to absorb the difference caused by the change in the feed amount of the third film F103 and reduce the change in the tension applied to the third film F103. Specifically, the third accumulator 142 has a plurality of tension adjustment rollers 142a on the upper side and a plurality of tension adjustment rollers 142b on the lower side between the fourth nip rollers 141a, 141b and the fourth guide roller 143a. Arrangement configuration.

第三蓄積器142係以使第三膜F103交互地繞過上部側的張力調節輥142a及繞過下部側的張力調節輥142b之狀態,一邊進行第三膜F103的搬送,一邊使上部側的張力調節輥142a及下部側的張力調節輥142b相對地在上下方向做升降動作。如此,就可暫時蓄積第三膜F103而不用使第四搬送線104停止。例如,第三蓄積器142使上部側的張力調節輥142a與下部側的張力調節輥142b之間的距離增大,就可增加第三膜F103之蓄積,反之,使上部側的張力調節輥142a與下部側的張力調節輥142b之間的距離縮減,就可減少第三膜F103之蓄積。第三蓄積器142係例如在更換料捲R1至R3的芯材之後的片帶的銜接等之作業時稼動。 The third accumulator 142 causes the third film F103 to alternately bypass the upper tension adjusting roller 142a and the lower tension adjusting roller 142b, and while carrying the third film F103, the upper film The tension adjustment roller 142a and the lower tension adjustment roller 142b relatively move up and down in the vertical direction. In this way, the third film F103 can be temporarily accumulated without stopping the fourth transfer line 104. For example, when the third accumulator 142 increases the distance between the upper tension adjusting roller 142a and the lower tension adjusting roller 142b, the accumulation of the third film F103 can be increased, and conversely, the upper tension adjusting roller 142a is increased. By reducing the distance from the lower tension adjusting roller 142b, the accumulation of the third film F103 can be reduced. The third accumulator 142 is moved, for example, during operations such as the connection of the sheets after the core materials of the rolls R1 to R3 are replaced.

複數個第四導輥143a、143b係分別轉動而將第四夾輥141a、141b所拉動並搬送過來的第三膜F103導引向第三搬送線103的下游側(第五搬送線105的上游側)。第四導輥143a、143b並不限於配置複數個之構成,亦可為只配置一個之構成。 The plurality of fourth guide rollers 143a and 143b are respectively rotated to guide the third film F103 pulled and carried by the fourth nip rollers 141a and 141b to the downstream side of the third conveying line 103 (upstream of the fifth conveying line 105). side). The fourth guide rollers 143a and 143b are not limited to a configuration in which a plurality of fourth guide rollers 143a and 143b are arranged, and may be a configuration in which only one is arranged.

第五搬送線105係將在單面貼合膜F104的第一膜F101側的面(第一膜F101的另一面)貼合第三膜F103而成的長帶狀的兩面貼合膜F105(光學膜F10X)往第三料捲R3搬送。 The fifth conveying line 105 is a long strip-shaped double-sided lamination film F105 (the other surface of the first film F101) (the other side of the first film F101) is bonded to the surface of the first film F101 side of the single-sided lamination film F104 ( The optical film F10X) is conveyed to the third roll R3.

具體而言,係在此第五搬送線105上,從第三搬送線103的下游處的另一方側開始朝向第三料捲 R3的方向,在水平方向依序排列配置一對第五夾輥151a、151b、第五導輥153a、一對第六夾輥151c、151d、包含複數個第四張力調節輥152a、152b之第四蓄積器152、以及第六導輥153b。 Specifically, on the fifth conveying line 105, a pair of fifth pinch rollers are arranged in a horizontal direction from the other side downstream of the third conveying line 103 toward the third roll R3. 151a, 151b, a fifth guide roller 153a, a pair of sixth nip rollers 151c, 151d, a fourth accumulator 152 including a plurality of fourth tension adjustment rollers 152a, 152b, and a sixth guide roller 153b.

一對第五夾輥151a、151b係位於第三搬送線103的下游側與第五搬送線105的上游側的合流點,將單面貼合膜F104及第三膜F103夾在中間且同時往相反方向轉,藉此而將單面貼合膜F104與第三膜F103兩者相貼合而成的兩面貼合膜F105往第4圖中顯示的箭號的方向(下方)拉。 A pair of fifth pinch rollers 151a and 151b are located at the confluence point of the downstream side of the third conveying line 103 and the upstream side of the fifth conveying line 105, sandwiching the single-sided laminating film F104 and the third film F103 at the same time. Turn in the opposite direction, thereby pulling the two-sided bonding film F105 formed by bonding the single-sided bonding film F104 and the third film F103 to the direction (downward) of the arrow shown in FIG. 4.

第五導輥153a係轉動而將第五夾輥151a、151b所拉動並搬送過來的兩面貼合膜F105導引向第四蓄積器152。第五導輥153a並不限於只配置一個之構成,亦可為配置複數個之構成。 The fifth guide roller 153a is rotated to guide the double-sided bonding film F105 pulled and transported by the fifth nip rollers 151a and 151b to the fourth accumulator 152. The fifth guide roller 153a is not limited to a configuration in which only one is disposed, and may be a configuration in which a plurality of fifth guide rollers 153a are disposed.

一對第六夾輥151c、151d係一邊將兩面貼合膜F105夾在中間且一邊相互往相反方向轉,藉此而將兩面貼合膜F105往第4圖中顯示的箭號的方向(右方)拉。 A pair of sixth pinch rollers 151c and 151d sandwich the two-sided bonding film F105 in the middle and turn them in opposite directions, thereby turning the two-sided bonding film F105 in the direction of the arrow shown in FIG. 4 (right Party) pull.

第四蓄積器152係以使兩面貼合膜F105交互地繞過上部側的張力調節輥152a及繞過下部側的張力調節輥152b之狀態,一邊進行兩面貼合膜F105的搬送,一邊使上部側的張力調節輥152a及下部側的張力調節輥152b相對地在上下方向做升降動作。如此,就可蓄積兩面貼合膜F105而不用使第五搬送線105停止。例如,第四蓄積器152使上部側的張力調節輥152a與下部側的張力調 節輥152b之間的距離增大,就可增加兩面貼合膜F105之蓄積,反之,使上部側的張力調節輥152a與下部側的張力調節輥152b之間的距離縮減,就可減少兩面貼合膜F105之蓄積。第四蓄積器152係例如在更換料捲R1至R3的芯材之後的片帶的銜接等之作業時稼動。 The fourth accumulator 152 is a state where the double-sided bonding film F105 alternately bypasses the upper tension adjusting roller 152a and the lower tension adjusting roller 152b, and conveys the double-sided bonding film F105 while moving the upper portion The tension adjusting roller 152a on the side and the tension adjusting roller 152b on the lower side relatively move up and down in the vertical direction. In this manner, the double-sided bonding film F105 can be accumulated without stopping the fifth conveyance line 105. For example, if the fourth accumulator 152 increases the distance between the tension adjusting roller 152a on the upper side and the tension adjusting roller 152b on the lower side, the accumulation of the double-sided bonding film F105 can be increased, and conversely, the tension adjusting roller on the upper side can be increased. By reducing the distance between 152a and the tension adjusting roller 152b on the lower side, the accumulation of the double-sided bonding film F105 can be reduced. The fourth accumulator 152 is moved, for example, during operations such as the connection of the sheets after the core materials of the rolls R1 to R3 are replaced.

第六導輥153b係轉動而將兩面貼合膜F105導引向第三料捲R3。第六導輥153b並不限於只配置一個之構成,亦可為配置複數個之構成。 The sixth guide roller 153b is rotated to guide the double-sided bonding film F105 to the third roll R3. The sixth guide roller 153b is not limited to a configuration in which only one is arranged, and may be a configuration in which a plurality of sixth guide rollers 153b are arranged.

兩面貼合膜F105係在捲取部106捲繞在芯材上之後,作為光學膜F10X的第三料捲R3而送到下一工序進行處。 The double-sided bonding film F105 is wound around the core material by the winding unit 106 and then sent to the next step as the third roll R3 of the optical film F10X.

(缺陷檢查系統)     (Defect inspection system)    

接著,針對上述膜製造裝置100所具備的缺陷檢查系統10進行說明。 Next, a defect inspection system 10 included in the film manufacturing apparatus 100 will be described.

缺陷檢查系統10係如第4圖所示,大致具備有搬送線L、第一缺陷檢查裝置11及第二缺陷檢查裝置12、記錄裝置13、第一測長器14及第二測長器15、以及控制裝置16。 As shown in FIG. 4, the defect inspection system 10 roughly includes a transfer line L, a first defect inspection device 11 and a second defect inspection device 12, a recording device 13, a first length measuring device 14, and a second length measuring device 15. And control device 16.

搬送線L係形成搬送作為檢查對象的膜之搬送路徑,本實施形態中,搬送線L係由上述第一搬送線101、第三搬送線103及第五搬送線105所構成。 The transfer line L forms a transfer path for transferring the film to be inspected. In this embodiment, the transfer line L is composed of the first transfer line 101, the third transfer line 103, and the fifth transfer line 105.

第一缺陷檢查裝置11係進行在貼合第二膜F102及第三膜F103之前的第一膜101的缺陷檢查的裝 置。具體而言,此第一缺陷檢查裝置11係檢測出製造第一膜F101之際、搬送第一膜F101之際產生的異物缺陷、凹凸缺陷、亮點缺陷等之各種缺陷。第一缺陷檢查裝置11係藉由對於在第一搬送線101上搬送的第一膜F101進行例如反射檢查、透射檢查、斜向透射檢查、正交偏光(crossed Nichol)透射檢查等之檢查處理,來檢測出第一膜F101的缺陷。 The first defect inspection device 11 is a device that inspects the defects of the first film 101 before the second film F102 and the third film F103 are bonded together. Specifically, the first defect inspection device 11 detects various defects such as foreign object defects, uneven defects, bright spot defects, and the like that occur when the first film F101 is manufactured and when the first film F101 is transported. The first defect inspection device 11 performs inspection processing such as reflection inspection, transmission inspection, oblique transmission inspection, crossed Nichol transmission inspection, and the like on the first film F101 transported on the first transport line 101. To detect a defect of the first film F101.

第一缺陷檢查裝置11係在第一搬送線101上比第一夾輥111a、111b更靠近上游側之處具有:照射光線至第一膜F101之複數個照明部21a、22a、23a、以及檢測透射過第一膜F101之光(透射光)或在第一膜F101反射之光(反射光)之複數個光檢測部21b、22b、23b。 The first defect inspection device 11 is located on the first conveying line 101 closer to the upstream side than the first nip rollers 111a and 111b, and includes a plurality of illumination sections 21a, 22a, and 23a that irradiate light to the first film F101, and detection. A plurality of light detecting sections 21b, 22b, 23b of light (transmitted light) transmitted through the first film F101 or light (reflected light) reflected by the first film F101.

本實施形態中,用來檢測透射光之構成,係在第一膜F101的搬送方向排列配置相互隔著第一膜F101而相對向之複數個照明部21a、22a、23a及複數個光檢測部21b、22b、23b。另外,第一缺陷檢查裝置11並不限於如此之檢測透射光之構成,亦可為檢測反射光之構成、或檢測透射光及反射光之構成。 In this embodiment, the structure for detecting transmitted light is a plurality of illumination units 21a, 22a, and 23a and a plurality of light detection units which are arranged opposite to each other across the first film F101 in the conveying direction of the first film F101. 21b, 22b, 23b. In addition, the first defect inspection device 11 is not limited to such a configuration for detecting transmitted light, and may be a configuration for detecting reflected light or a configuration for detecting transmitted light and reflected light.

照明部21a、22a、23a係照射經按照缺陷檢查的種類而調整過光強度及波長、偏光狀態等之照明光至第一膜F101。光檢測部21b、22b、23b係使用CCD等之攝像元件來攝取第一膜F101之照射到照明光的位置的影像。光檢測部21b、22b、23b所攝得的影像(缺陷檢查結果)係輸出至控制裝置16。 The illuminating sections 21a, 22a, and 23a irradiate the first film F101 with illumination light whose light intensity, wavelength, and polarization state have been adjusted according to the type of defect inspection. The light detecting sections 21b, 22b, and 23b use an imaging element such as a CCD to capture an image of the position of the first film F101 that is irradiated with the illumination light. The images (defect inspection results) captured by the light detection sections 21 b, 22 b, and 23 b are output to the control device 16.

第二缺陷檢查裝置12係進行貼合了第二膜F102及第三膜F103之後的第一膜101、亦即兩面貼合膜F105的缺陷檢查的裝置。具體而言,此第二缺陷檢查裝置12係檢測在第一膜F101貼合第二膜F102及第三膜F103之際、搬送單面貼合膜F104及兩面貼合膜F105之際產生的異物缺陷、凹凸缺陷、亮點缺陷等之各種缺陷。第二缺陷檢查裝置12係藉由對於在第五搬送線105上搬送的兩面貼合膜F105進行例如反射檢查、透射檢查、斜向透射檢查、正交偏光透射檢查等之檢查處理,來檢測出兩面貼合膜F105的缺陷。 The second defect inspection device 12 is a device for performing a defect inspection of the first film 101 after bonding the second film F102 and the third film F103, that is, the two-sided bonding film F105. Specifically, the second defect inspection device 12 detects foreign matter generated when the first film F101 is bonded to the second film F102 and the third film F103, and when the single-sided bonded film F104 and the double-sided bonded film F105 are transported. Various defects such as defects, bump defects, and bright spot defects. The second defect inspection device 12 detects the inspection process such as reflection inspection, transmission inspection, oblique transmission inspection, orthogonal polarization transmission inspection, and the like on the double-sided bonding film F105 conveyed on the fifth conveying line 105. Defects of film F105 on both sides.

第二缺陷檢查裝置12係在第五搬送線105上比第五夾輥151a、151b更靠近下游側之處具有:照射光線至兩面貼合膜F105之複數個照明部24a、25a、以及檢測透射過兩面貼合膜F105之光(透射光)或在兩面貼合膜F105反射之光(反射光)之複數個光檢測部24b、25b。 The second defect inspection device 12 is located on the fifth conveying line 105 closer to the downstream side than the fifth nip rollers 151a and 151b. The second defect inspection device 12 has a plurality of illumination sections 24a and 25a for irradiating light to the double-sided bonding film F105 and detecting transmission A plurality of light detecting portions 24b and 25b pass through the light (transmitted light) passing through the two-sided bonding film F105 or the light (reflected light) reflected by the two-sided bonding film F105.

本實施形態中,用來檢測透射光之構成,係在兩面貼合膜F105的搬送方向排列配置相互隔著兩面貼合膜F105而相對向之複數個照明部24a、25a及複數個光檢測部24b、25b。另外,第二缺陷檢查裝置12並不限於如此之檢測透射光之構成,亦可為檢測反射光之構成、或檢測透射光及反射光之構成。 In this embodiment, the structure for detecting transmitted light is arranged in the conveying direction of the double-sided bonding film F105 in a plurality of illuminating sections 24a, 25a and a plurality of light detecting sections facing each other across the double-sided bonding film F105. 24b, 25b. In addition, the second defect inspection device 12 is not limited to such a configuration for detecting transmitted light, and may be a configuration for detecting reflected light or a configuration for detecting transmitted light and reflected light.

照明部24a、25a係照射經按照缺陷檢查的種類而調整過光強度及波長、偏光狀態等之照明光至兩面貼合膜F105。光檢測部24b、25b係使用CCD等之攝像元 件來攝取兩面貼合膜F105之照射到照明光的位置的影像。光檢測部24b、25b所攝得的影像(缺陷檢查結果)係輸出至控制裝置16。 The illuminating sections 24a and 25a irradiate the illuminating light whose light intensity, wavelength, and polarization state are adjusted according to the type of defect inspection to the double-sided bonding film F105. The light detecting sections 24b and 25b use an imaging element such as a CCD to capture an image of a position where the double-sided bonding film F105 is irradiated with the illumination light. The images (defect inspection results) captured by the light detection units 24 b and 25 b are output to the control device 16.

(印字裝置及印字方法)     (Printing device and printing method)    

記錄裝置13係將根據第一缺陷檢查裝置11及第二缺陷檢查裝置12的缺陷檢查的結果而得到之缺陷資訊記錄到兩面貼合膜F105之裝置(印字裝置)。具體而言,缺陷資訊係包含與缺陷的位置及種類等有關之資訊,係以例如條碼、二維條碼、QR code(註冊商標)等之識別碼的形態記錄(印上)。識別碼中含有例如表示第一缺陷檢查裝置11及第二缺陷檢查裝置12所檢測出的缺陷係存在於與印上識別碼的位置在膜的寬度方向相距多少距離的位置之資訊(與缺陷的位置有關之資訊)。識別碼中亦可含有與檢測出的缺陷的種類有關的資訊。本實施形態中,印上的缺陷資訊係7mm×7mm之二維條碼。 The recording device 13 is a device (printing device) that records defect information obtained based on the results of defect inspection by the first defect inspection device 11 and the second defect inspection device 12 on the double-sided bonding film F105. Specifically, the defect information includes information about the position and type of the defect, and is recorded (printed) in the form of an identification code such as a barcode, a two-dimensional barcode, a QR code (registered trademark), and the like. The identification code contains, for example, information indicating how far the defect detected by the first defect inspection device 11 and the second defect inspection device 12 is located at a distance from the position where the identification code is printed in the width direction of the film. Location-related information). The identification code may also contain information related to the type of defect detected. In this embodiment, the defect information printed is a two-dimensional bar code of 7 mm × 7 mm.

記錄裝置13係在第五搬送線105上設於比第二缺陷檢查裝置12更靠近下游側之處。記錄裝置13係具有採用例如噴墨方式之印字頭13a。另外,在與印字頭13a相對向之位置,配置有與兩面貼合膜F105相接觸之第七導輥153c。該印字頭13a係從兩面貼合膜F105之與第七導輥153c相接觸位置的相反側,在沿著兩面貼合膜105的寬度方向的端緣部之位置(記錄區域)噴出墨水,而進行上述缺陷資訊之印出。 The recording device 13 is provided on the fifth transfer line 105 closer to the downstream side than the second defect inspection device 12. The recording device 13 includes a print head 13a using, for example, an inkjet method. In addition, a seventh guide roller 153c is disposed at a position facing the print head 13a so as to be in contact with the double-sided bonding film F105. The printing head 13a ejects ink from the opposite side of the double-sided bonding film F105 to the seventh guide roller 153c at a position (recording area) along the widthwise edge of the double-sided bonding film 105, and Print out the above defect information.

記錄裝置13亦可藉由在兩面貼合膜F105的缺陷部位印上將缺陷包含在裡面之大小的點狀、線狀或框狀的標記(marking),而直接在缺陷部位進行記錄。此時,除了標記之外亦可藉由印上表示缺陷的種類之記號或圖案,來記錄與缺陷的種類有關之資訊。 The recording device 13 can also directly record on the defect site by printing dot, line, or frame-shaped markings on the defect site of the double-sided bonding film F105 to include the defect therein. At this time, in addition to the mark, information related to the type of the defect may be recorded by printing a mark or pattern indicating the type of the defect.

第一測長器14及第二測長器15係量測第一膜F101的搬送量之裝置。具體而言,本實施形態中,係在第一搬送線101上,在位於第一蓄積器112的上游側之第一夾輥111a配置構成第一測長器14之旋轉編碼器(rotary encoder),以及在位於第一蓄積器112的下游側之第三夾輥131a配置構成第二測長器15之旋轉編碼器。 The first length measuring device 14 and the second length measuring device 15 are devices for measuring the conveyance amount of the first film F101. Specifically, in the present embodiment, a rotary encoder constituting the first length measuring device 14 is arranged on the first conveying line 101 and the first pinch roller 111 a located upstream of the first accumulator 112. And a third encoder 131a located downstream of the first accumulator 112 is provided with a rotary encoder constituting the second length measuring device 15.

第一測長器14及第二測長器15係利用旋轉編碼器根據與第一膜F101接觸而轉動之第一夾輥111a及第三夾輥131a的轉動變位量而測出第一膜F101的搬送量。第一測長器14及第二測長器15的測定結果係輸出至控制裝置16。 The first length measuring device 14 and the second length measuring device 15 use a rotary encoder to measure the first film according to the rotational displacement of the first nip roller 111a and the third nip roller 131a that are rotated by contact with the first film F101. F101 transportation amount. The measurement results of the first length measuring device 14 and the second length measuring device 15 are output to the control device 16.

本實施形態中,在第一缺陷檢查裝置11與記錄裝置13之間只存在有一個蓄積器,所以分別在該蓄積器的上游側及下游側各配置一個測長器。另一方面,在第一缺陷檢查裝置11與記錄裝置13之間存在有複數個蓄積器之情況,只要在最上游側的蓄積器的上游側及最下游側的蓄積器的下游側各配置一個測長器即可。 In the present embodiment, since there is only one accumulator between the first defect inspection device 11 and the recording device 13, a length measuring device is disposed on each of the upstream side and the downstream side of the accumulator. On the other hand, in the case where there are a plurality of accumulators between the first defect inspection device 11 and the recording device 13, as long as one is disposed on each of the upstream side of the most upstream accumulator and the downstream side of the most downstream accumulator A length measuring device is sufficient.

控制裝置16係統括控制膜製造裝置100的各部之裝置。具體而言,此控制裝置16係具備有作為電子 控制裝置之電腦系統。電腦系統大致具備有CPU等之演算處理部、以及記憶體及硬碟等之資訊記憶部。 The control device 16 system includes a device that controls each part of the film manufacturing apparatus 100. Specifically, the control device 16 is provided with a computer system as an electronic control device. The computer system generally includes a calculation processing unit such as a CPU, and an information storage unit such as a memory and a hard disk.

控制裝置16的資訊記憶部中,記錄有控制電腦系統之作業系統(OS)、使演算處理部進行膜製造裝置100的各部所需的各種處理之程式等。控制裝置16亦可包含進行膜製造裝置100的各部的控制所需的各種處理之ASIC等的邏輯電路。另外,控制裝置16包含用來進行電腦系統與外部裝置的輸出入之介面(interface)。可在此介面連接上例如鍵盤及滑鼠等之輸入裝置、液晶顯示器等之顯示裝置、通訊裝置等。 The information storage section of the control device 16 stores an operating system (OS) for controlling a computer system, a program for causing the calculation processing section to perform various processes required by each section of the film manufacturing apparatus 100, and the like. The control device 16 may include a logic circuit such as an ASIC that performs various processes necessary for controlling the respective sections of the film manufacturing apparatus 100. In addition, the control device 16 includes an interface for inputting and outputting a computer system and an external device. Input devices such as keyboards and mice, display devices such as liquid crystal displays, and communication devices can be connected to this interface.

控制裝置16係分析光檢測部21b、22b、23b及光檢測部24b、25b所攝得的影像,判別缺陷之有無(位置)及種類等。控制裝置16在判定第一膜F101或兩面貼合膜F105有缺陷之情況,控制記錄裝置13使之在兩面貼合膜F105上記錄缺陷資訊。 The control device 16 analyzes the images captured by the light detection units 21b, 22b, 23b and 24b, 25b, and determines the presence (position) and type of defects. When the control device 16 determines that the first film F101 or the double-sided bonding film F105 is defective, the control device 16 controls the recording device 13 to record the defect information on the double-sided bonding film F105.

缺陷檢查系統10係以不會讓兩面貼合膜F105的缺陷檢查位置、與缺陷資訊的資訊記錄位置之間發生偏差之方式,在缺陷檢查後的預定的時序(timing)進行缺陷資訊的記錄。例如,本實施形態中,係算出從第一缺陷檢查裝置11或第二缺陷檢查裝置12進行缺陷檢查的時點之後在搬送線L上搬送的膜的搬送量,且在算出的搬送量與偏移距離(offset distance)一致時,使記錄裝置13進行記錄。 The defect inspection system 10 records defect information at a predetermined timing after the defect inspection in such a manner that a deviation between the defect inspection position of the double-sided bonding film F105 and the information recording position of the defect information does not occur. For example, in the present embodiment, the transport amount of the film transported on the transport line L after the time when the defect inspection is performed by the first defect inspection apparatus 11 or the second defect inspection apparatus 12 is calculated, and the calculated transport amount and offset are calculated. When the offset distances match, the recording device 13 is caused to perform recording.

此處,偏移距離係指第一缺陷檢查裝置11 及第二缺陷檢查裝置12與記錄裝置13之間的膜的搬送距離。嚴格來說,偏移距離係定義為第一缺陷檢查裝置11及第二缺陷檢查裝置12進行缺陷檢查的位置(缺陷檢查位置)與記錄裝置13進行缺陷資訊的記錄的位置(資訊記錄位置)之間的膜的搬送距離。偏移距離在第一蓄積器112稼動時會變動。 Here, the offset distance refers to a film transport distance between the first defect inspection device 11 and the second defect inspection device 12 and the recording device 13. Strictly speaking, the offset distance is defined as the position where the first defect inspection device 11 and the second defect inspection device 12 perform defect inspection (defect inspection position) and the position where the recording device 13 records defect information (information recording position). Transport distance between the films. The offset distance changes when the first accumulator 112 is moved.

第一蓄積器112未稼動時的偏移距離(以下稱為第一偏移距離)係預先記憶於控制裝置16的資訊記憶部。具體而言,第一缺陷檢查裝置11及第二缺陷檢查裝置12中有複數個光檢測部21b、22b、23b及光檢測部24b、25b,每個光檢測部21b、22b、23b、24b、25b都進行缺陷檢查。因此,控制裝置16的資訊記憶部中針對每個光檢測部21b、22b、23b、24b、25b分別記憶有第一偏移距離。 The offset distance (hereinafter referred to as the first offset distance) when the first accumulator 112 is not moved is stored in the information storage section of the control device 16 in advance. Specifically, the first defect inspection device 11 and the second defect inspection device 12 include a plurality of light detection sections 21b, 22b, 23b and 24b, 25b. Each of the light detection sections 21b, 22b, 23b, 24b, 25b are all inspected for defects. Therefore, the information storage section of the control device 16 stores the first offset distances for each of the light detection sections 21b, 22b, 23b, 24b, and 25b, respectively.

在偏移距離由於第一蓄積器112的稼動而變動之情況,係根據第一蓄積器112的上游側及下游側的第一膜F101的搬送量的差來算出偏移距離的修正值。亦即,控制裝置16係從第一測長器14及第二測長器15的測定結果來算出第一蓄積器112中的第一膜F101的蓄積量,根據此第一膜F101的蓄積量來算出偏移距離的修正值。 When the offset distance varies due to the movement of the first accumulator 112, the correction value of the offset distance is calculated based on the difference between the conveyance amounts of the first film F101 on the upstream side and the downstream side of the first accumulator 112. That is, the control device 16 calculates the accumulation amount of the first film F101 in the first accumulator 112 from the measurement results of the first length measuring device 14 and the second length measuring device 15, and based on the accumulation amount of the first film F101 To calculate the correction value of the offset distance.

缺陷檢查系統10在第一蓄積器112稼動時,根據偏移距離的修正值來修正記錄裝置13進行缺陷資訊的記錄之時點。例如,本實施形態係根據第一測長器14及第二測長器15的測定結果,來算出偏移距離的修正值。 控制裝置16根據此修正值及第一偏移距離,來算出第一蓄積器112稼動時的偏移距離(以下稱為第二偏移距離)。 When the first accumulator 112 is in motion, the defect inspection system 10 corrects the time when the recording device 13 records defect information based on the correction value of the offset distance. For example, the present embodiment calculates the correction value of the offset distance based on the measurement results of the first length measuring device 14 and the second length measuring device 15. The control device 16 calculates an offset distance (hereinafter referred to as a second offset distance) when the first accumulator 112 is moved based on the correction value and the first offset distance.

本實施形態中,根據第一測長器14及第二測長器15的測定結果算出從第一缺陷檢查裝置11及第二缺陷檢查裝置12進行缺陷檢查的時點之後在搬送線L上搬送的膜的搬送量,且在算出的搬送量與第二偏移距離一致時,使記錄裝置13進行記錄。 In this embodiment, based on the measurement results of the first length measuring device 14 and the second length measuring device 15, the time when the defect inspection is performed from the first defect inspection device 11 and the second defect inspection device 12 on the transport line L is calculated. When the transport amount of the film and the calculated transport amount coincide with the second offset distance, the recording device 13 is caused to record.

又,本實施形態中,在第一蓄積器112稼動時,可除了缺陷資訊之外,還在兩面貼合膜F105記錄表示第一蓄積器112為稼動的之資訊(以下稱為蓄積器稼動資訊)。在也記錄蓄積器稼動資訊之情況,操作員(operator)仔細檢查印有蓄積器稼動資訊的部分的缺陷部位,就可檢測出記錄位置之偏差等。如此,誤將良品部分判定為缺陷部位的可能性會變少,產率會提高。 In addition, in this embodiment, when the first accumulator 112 is moved, in addition to the defect information, information on the double-sided laminated film F105 may be recorded to indicate that the first accumulator 112 is moved (hereinafter referred to as the accumulator movement information). ). When the accumulator motion information is also recorded, the operator can carefully check the defect position of the part on which the accumulator motion information is printed, so that deviations in the recording position can be detected. In this way, the possibility of erroneously determining a good part as a defective part is reduced, and the yield is improved.

然而,就本實施形態之缺陷檢查系統10而言,由於兩面貼合膜F105的狀態、搬送條件等,會有搬送中的兩面貼合膜F105發生啪啪跳動之情形。尤其,在兩面貼合膜F105的寬度方向的兩端部容易因為膜的吸濕或乾燥條件等而捲曲(curl),此捲曲可想成是在搬送中發生啪啪跳動的原因之一。 However, in the defect inspection system 10 according to this embodiment, due to the state of the double-sided bonding film F105, the transportation conditions, and the like, the double-sided bonding film F105 may be snapped during transportation. In particular, both ends in the width direction of the film F105 on both sides are easily curled due to moisture absorption or drying conditions of the film, and this curl is thought to be one of the causes of popping during transportation.

針對此點,本實施形態之缺陷檢查系統10係如第5圖所示,將印字頭13a配置成與和上述的兩面貼合膜F105接觸之第七導輥153c相對向。 In view of this, as shown in FIG. 5, the defect inspection system 10 of the present embodiment is configured such that the print head 13 a faces the seventh guide roller 153 c that is in contact with the above-mentioned double-sided bonding film F105.

藉此,即使是在搬送中兩面貼合膜F105的 寬度方向的兩端部發生啪啪跳動之情況,也可在與第七導輥153c相接觸之位置抑制兩面貼合膜F105的啪啪跳動。因此,本實施形態之缺陷檢查系統10可適切地將想要利用從印字頭13a噴出的墨水i印上之缺陷資訊記錄(印)在兩面貼合膜F105的記錄區域。 This makes it possible to suppress the popping of the double-sided bonding film F105 at the position in contact with the seventh guide roller 153c even in the case where both ends of the double-sided bonding film F105 in the width direction are transported. . Therefore, the defect inspection system 10 of this embodiment can appropriately record (print) the defect information to be printed on the recording area of the double-sided bonding film F105 by using the ink i ejected from the print head 13a.

兩面貼合膜F105最好以40°至130°之角度範圍(以下稱為圍繞角度θ)繞接在第七導輥153c的外周面。本實施形態中所謂的圍繞角度,係指以導輥的中心角表示膜在圓周方向與導輥的外周面接觸的角度範圍。 The double-sided bonding film F105 is preferably wound around the outer peripheral surface of the seventh guide roller 153c in an angle range of 40 ° to 130 ° (hereinafter referred to as a surrounding angle θ). The so-called “surrounding angle” in this embodiment refers to the angular range where the film contacts the outer peripheral surface of the guide roller in the circumferential direction with the central angle of the guide roller.

當圍繞角度θ小於40°,兩面貼合膜F105就容易在第七導輥153c的外周面上滑動。因此,為了防止由於兩面貼合膜F105的滑動而產生的擦痕等,最好使圍繞角度θ在40°以上。另一方面,當圍繞角度θ超過130°,就容易在例如作為表面保護膜之第二及第三膜F102、F103與第一膜F101之間咬入氣泡。因而,為了防止如此之氣泡的咬入,最好使圍繞角度θ在130°以下。 When the surrounding angle θ is less than 40 °, the double-sided bonding film F105 easily slides on the outer peripheral surface of the seventh guide roller 153c. Therefore, in order to prevent scratches and the like caused by the sliding of the double-sided bonding film F105, it is preferable to set the surrounding angle θ to 40 ° or more. On the other hand, when the surrounding angle θ exceeds 130 °, it is easy to bite air bubbles between, for example, the second and third films F102 and F103, which are surface protection films, and the first film F101. Therefore, in order to prevent such bubbles from being bitten, it is preferable to set the surrounding angle θ to 130 ° or less.

另外,施加於兩面貼合膜F105之張力低的情況,最好使圍繞角度θ超過90°,在95°以上更好。如此,可抑制發生於兩面貼合膜F105之啪啪跳動。另一方面,施加於兩面貼合膜F105之張力高的情況,最好使圍繞角度θ小於90°,在85°以下更好。如此,可防止兩面貼合膜F105過度緊貼於第七導輥153c的外周面。 When the tension applied to the double-sided bonding film F105 is low, the surrounding angle θ is preferably more than 90 °, and more preferably 95 ° or more. In this way, the popping of the double-sided bonding film F105 can be suppressed. On the other hand, when the tension applied to the double-sided bonding film F105 is high, the surrounding angle θ is preferably less than 90 °, and more preferably 85 ° or less. In this way, it is possible to prevent the double-sided bonding film F105 from coming into close contact with the outer peripheral surface of the seventh guide roller 153c.

關於兩面貼合膜F105的搬送速度,通常係在9至35m/min之程度。關於施加於兩面貼合膜F105之 張力,在乾燥爐內係在400至1500N之程度,在乾燥爐外係在200至500N之程度。施加於兩面貼合膜F105之張力越小越容易發生啪啪跳動。兩面貼合膜F105的寬度係在500至1500mm之程度。兩面貼合膜F105的寬度越大越容易發生啪啪跳動。兩面貼合膜F105的厚度係在13至300μm之程度。兩面貼合膜F105的厚度越薄越容易發生啪啪跳動。 The conveyance speed of the double-sided bonding film F105 is usually about 9 to 35 m / min. The tension applied to the double-sided bonding film F105 is about 400 to 1500 N in the drying furnace, and about 200 to 500 N in the outside of the drying furnace. The smaller the tension applied to the double-sided bonding film F105, the more likely it is that popping will occur. The width of the double-sided bonding film F105 is about 500 to 1500 mm. The larger the width of the double-sided bonding film F105, the more likely it is that popping will occur. The thickness of the double-sided bonding film F105 is about 13 to 300 μm. The thinner the thickness of the double-sided bonding film F105 is, the more likely it is that popping occurs.

另外,第七導輥153c的外徑最好在100至150mm之範圍內。第七導輥153c的外徑變大,相對於圍繞角度θ之與第七導輥153c的外周面接觸的兩面貼合膜F105的面積就會變大。因此,可抑制發生於兩面貼合膜F105之啪啪跳動,可使記錄區域更穩定化。但是,第七導輥153c的外徑變大,就容易發生上述的擦痕或氣泡的咬入,所以最好在上述的範圍內。 The outer diameter of the seventh guide roller 153c is preferably in the range of 100 to 150 mm. The outer diameter of the seventh guide roller 153c becomes larger, and the area of the two-sided bonding film F105 that is in contact with the outer peripheral surface of the seventh guide roller 153c around the angle θ becomes larger. Therefore, it is possible to suppress the popping of the double-sided laminated film F105 and stabilize the recording area. However, the larger the outer diameter of the seventh guide roller 153c is, the more easily the above-mentioned scratches or bite of air bubbles occur, so it is preferably within the above-mentioned range.

又,第七導輥153c的真圓度越高,越可抑制與該第七導輥153c接觸之兩面貼合膜F105的振動,使記錄區域更穩定化。具體而言,第七導輥153c的真圓度最好在1.0mm以下,在0.5mm以下更好。 In addition, the higher the roundness of the seventh guide roller 153c, the more the vibration of the two-sided bonding film F105 in contact with the seventh guide roller 153c can be suppressed, and the recording area can be more stabilized. Specifically, the roundness of the seventh guide roller 153c is preferably 1.0 mm or less, and more preferably 0.5 mm or less.

又,第七導輥153c的外周面的表面粗度(最大粗度Ry)最好在100s以下,在25s以下更好。如此,可抑制上述的擦痕或氣泡之咬入的發生。 The surface roughness (maximum roughness Ry) of the outer peripheral surface of the seventh guide roller 153c is preferably 100s or less, and more preferably 25s or less. In this way, it is possible to suppress the occurrence of the above-mentioned scratches or biting of air bubbles.

又,本實施形態之缺陷檢查系統10可為了在第七導輥153c的上游側及下游側也抑制發生於兩面貼合膜105之啪啪跳動,而追加與兩面貼合膜F105接觸之 導輥。在此情況,追加的導輥與第七導輥153c之間的距離最好在1000mm以內。亦可使兩面貼合膜F105相對於追加的導輥具有圍繞角度。最好相對於追加於上游側之導輥具有圍繞角度,相對於追加於上游側及下游側之導輥都具有圍繞角度更好。 In addition, the defect inspection system 10 of this embodiment can add a guide roller in contact with the double-sided laminated film F105 in order to suppress the popping of the double-sided laminated film 105 on the upstream and downstream sides of the seventh guide roller 153c. . In this case, the distance between the additional guide roller and the seventh guide roller 153c is preferably within 1000 mm. The double-sided bonding film F105 may have a surrounding angle with respect to the additional guide roller. It is preferable to have a surrounding angle with respect to the guide roller added to the upstream side, and it is better to have a surrounding angle with respect to the guide roller added to the upstream side and the downstream side.

如以上所述,本實施形態之缺陷檢查系統10可減低由於發生於搬送中的兩面貼合膜F105的啪啪跳動所造成的影響,適切地在兩面貼合膜F105記錄(印上)缺陷資訊。因此,本實施形態之膜製造裝置100可防止由於印字錯誤所導致之缺陷資訊的讀取錯誤之發生,而可用很好的產率從兩面貼合膜F105切出光學膜F10X,可製造高品質的光學膜F10X。 As described above, the defect inspection system 10 of this embodiment can reduce the influence caused by the popping of the double-sided laminated film F105 during transportation, and appropriately record (print) defect information on the double-sided laminated film F105. . Therefore, the film manufacturing apparatus 100 of this embodiment can prevent the occurrence of reading error information due to printing errors, and can cut out the optical film F10X from the double-sided laminated film F105 with a good yield, and can manufacture high quality Optical film F10X.

本實施形態中之記錄裝置13係如第6圖(a)至(c)所示,設有遮蓋(cover)30以防止墨水i附著於兩面貼合膜F105的至少記錄區域S以外的內側之區域。第6圖(a)係從兩面貼合膜F105的上方側看遮蓋30所見之平面圖,第6圖(b)係從兩面貼合膜F105的搬送方向的上游側看遮蓋30所見之側面圖,第6圖(c)係從兩面貼合膜F105的外側看遮蓋30所見之側面圖。 As shown in FIGS. 6 (a) to (c), the recording device 13 in this embodiment is provided with a cover 30 to prevent the ink i from adhering to at least the inner side of the double-sided bonding film F105 other than the recording area S. region. Fig. 6 (a) is a plan view of the cover 30 as viewed from the upper side of the double-sided bonding film F105, and Fig. 6 (b) is a side view of the cover 30 as viewed from the upstream side of the transport direction of the double-sided bonding film F105. Fig. 6 (c) is a side view of the cover 30 as viewed from the outside of the double-sided bonding film F105.

具體而言,該遮蓋30係具有:遮住兩面貼合膜F105與印字頭13a相對向的空間K之中的面向兩面貼合膜F105的內側之側之第一側板部30a、遮住面向兩面貼合膜F105的搬送方向的上游側之側之第二側板部30b、以及遮住面向兩面貼合膜F105的搬送方向的下游側之側 之第三側板部30c。 Specifically, the cover 30 includes a first side plate portion 30a which covers a side of the space K facing the double-sided bonding film F105 and the print head 13a facing the inside of the double-sided bonding film F105, and covers both sides. The second side plate portion 30b on the upstream side in the conveying direction of the bonding film F105 and the third side plate portion 30c on the side facing the downstream side in the conveying direction of the double-sided bonding film F105.

遮蓋30係利用螺絲鎖緊等之手段而相對於印字頭13a安裝成可裝拆。遮蓋30係使空間K之中之面向兩面貼合膜F105的外側之側開放,所以相對於印字頭13a之裝拆會變容易。 The cover 30 is detachably attached to the print head 13a by means such as screw locking. The cover 30 opens the side of the space K that faces the outer side of the double-sided bonding film F105, so that it can be easily attached to and detached from the print head 13a.

遮蓋30之與兩面貼合膜F105相對向的面、與兩面貼合膜F105的表面之間的間隔T最好在1mm以下。使此間隔T在1mm以下的方式,可在從印字頭13a噴出的墨水i飛散到周圍時防止該墨水i的飛散物飛散到遮蓋30的外側。 The interval T between the surface of the cover 30 facing the double-sided bonding film F105 and the surface of the double-sided bonding film F105 is preferably 1 mm or less. By setting the interval T to be 1 mm or less, when the ink i ejected from the print head 13a is scattered to the surroundings, the scattered matter of the ink i is prevented from being scattered to the outside of the cover 30.

墨水i的飛散物有:從印字頭13a噴出的墨水i之中例如離開資訊記錄位置而飛散到周圍之墨水i、附著到兩面貼合膜F105後飛散到周圍之墨水i等。 The scattered matter of the ink i includes, for example, the ink i ejected from the printing head 13a and scattered from the information recording position to the surrounding ink i, and attached to the double-sided bonding film F105 and scattered to the surrounding ink i.

記錄區域S係位於在將兩面貼合膜F105貼合到上述液晶顯示面板P時與該液晶顯示面板P的顯示區域P4重疊之區域的外側。而且,記錄區域S係在貼合到上述液晶顯示面板P之前要切掉之區域。 The recording region S is located outside the region overlapping the display region P4 of the liquid crystal display panel P when the double-sided bonding film F105 is bonded to the liquid crystal display panel P. The recording area S is an area to be cut off before being attached to the liquid crystal display panel P.

構成遮蓋30之三個側板部30a、30b、30c之中,第一側板部30a係防止墨水i的飛散物附著到兩面貼合膜F105之與顯示區域P4重疊之區域,第二側板部30b係防止墨水i的飛散物附著到兩面貼合膜F105的搬送方向的上游側,第三側板部30c係防止墨水i的飛散物附著到兩面貼合膜F105的搬送方向的下游側。 Among the three side plate portions 30a, 30b, and 30c constituting the cover 30, the first side plate portion 30a prevents the scattering of the ink i from adhering to the area of the double-sided bonding film F105 overlapping the display area P4, and the second side plate portion 30b is The scattering of the ink i is prevented from adhering to the upstream side in the conveying direction of the double-sided bonding film F105, and the third side plate portion 30c prevents the scattering of the ink i from being adhering to the downstream side in the conveying direction of the double-sided bonding film F105.

墨水i的飛散物會附著於遮蓋30的內面。 因此,可定期地將遮蓋30從印字頭13a拆下,進行洗淨後,再安裝到印字頭13a而重複使用。 The scattered matter of the ink i adheres to the inner surface of the cover 30. Therefore, the cover 30 can be periodically removed from the print head 13a, washed, and then mounted on the print head 13a and reused.

又,膜製造裝置100最好形成為具備有對兩面貼合膜F105的表面進行除電之靜電去除裝置40之構成。靜電去除裝置40係稱為電離器(ionizer)者,配置於兩面貼合膜F105的搬送方向上之比記錄裝置13(印字頭13a)靠近上游側之處。此靜電去除裝置40係在兩面貼合膜F105的寬度方向全域噴吹離子化氣體,來去除兩面貼合膜F105的表面所產生的靜電。 The film manufacturing apparatus 100 is preferably configured to include a static electricity removing device 40 that removes electricity from the surface of the double-sided laminated film F105. The static electricity removing device 40 is called an ionizer, and is disposed closer to the upstream side than the recording device 13 (printing head 13a) in the conveying direction of the double-sided bonding film F105. This static electricity removing device 40 blows ionized gas across the entire width direction of the double-sided bonding film F105 to remove static electricity generated on the surface of the double-sided bonding film F105.

藉此,膜製造裝置100防止墨水i的飛散物受到靜電的吸引而吸附到兩面貼合膜F105的表面。因此,膜製造裝置100可藉由組合上述的遮蓋30及靜電去除裝置40來更加抑制墨水i的飛散物附著到兩面貼合膜F105的表面。 Thereby, the film manufacturing apparatus 100 prevents the scattered matter of the ink i from being attracted to the surface of the double-sided bonding film F105 by electrostatic attraction. Therefore, the film manufacturing apparatus 100 can further suppress the scattering of the ink i from adhering to the surface of the double-sided bonding film F105 by combining the cover 30 and the static elimination device 40 described above.

如以上所述,本實施形態之缺陷檢查系統10可防止由於將缺陷資訊記錄到兩面貼合膜F105之際之墨水i的飛散所造成之兩面貼合膜F105的污染。 As described above, the defect inspection system 10 of this embodiment can prevent contamination of the double-sided bonding film F105 due to scattering of the ink i when the defect information is recorded on the double-sided bonding film F105.

本發明並非一定要限定於上述實施形態,還可在未脫離本發明的主旨之範圍內加上各種變更。 The present invention is not necessarily limited to the above-mentioned embodiments, and various changes can be added without departing from the gist of the present invention.

具體而言,在上述遮蓋30方面,亦可為配置上述三個側板部30a、30b、30c之中的至少第一側板部30a之構成。藉此,可防止墨水i的飛散物附著到兩面貼合膜F105之與顯示區域P4重疊之區域。 Specifically, the cover 30 may have a configuration in which at least the first side plate portion 30a is arranged among the three side plate portions 30a, 30b, and 30c. Thereby, it is possible to prevent the scattered matter of the ink i from adhering to the area overlapping the display area P4 of the double-sided bonding film F105.

又,關於上述遮蓋30,亦可如第7圖所示, 採用除了上述三個側板部30a、30b、30c之外,還配置有遮住面向兩面貼合膜F105的外側之側之第四側板部30d之構成。 As for the cover 30, as shown in FIG. 7, in addition to the three side plate portions 30a, 30b, and 30c, a fourth side plate covering the side facing the outside of the two-sided bonding film F105 may be used. The structure of the part 30d.

又,關於上述記錄裝置13,亦可如第8圖(a)、(b)所示,將安裝於印字頭13a之遮蓋31的下端部形成為合於導輥41的外形之形狀。藉此,而可使與兩面貼合膜F105之間的間隔T在1mm以下。 As for the recording device 13 described above, the lower end portion of the cover 31 attached to the print head 13a may be formed into a shape conforming to the outer shape of the guide roller 41 as shown in FIGS. 8 (a) and (b). Thereby, the space | interval T with the double-sided bonding film F105 can be made into 1 mm or less.

又,作為本發明的另一實施形態,亦可採用如例如第9圖(a)、(b)所示之遮蓋32。此遮蓋32係由平行平板狀的板材所構成,以接近兩面貼合膜F105的狀態與兩面貼合膜F105相對向而配置。而且,在遮蓋32之面臨記錄區域S的位置設有窗部(開口部)32a。在此構成之情況下,遮蓋32遮住記錄區域S以外的區域,而可防止在兩面貼合膜F105記錄缺陷資訊之際之墨水i的飛散所造成之兩面貼合膜F105的污染。此外,遮蓋32也可設有上述的側板部30a、30b、30c、30d。亦即,此遮蓋32可構成覆蓋上述遮蓋30的底面之底板部。 Further, as another embodiment of the present invention, a cover 32 as shown in, for example, FIGS. 9 (a) and (b) may be used. This cover 32 is made of a parallel flat plate-like plate material, and is arranged to face the double-sided bonding film F105 in a state close to the double-sided bonding film F105. A window (opening) 32a is provided at a position of the cover 32 facing the recording area S. With this configuration, the cover 32 covers areas other than the recording area S, and contamination of the double-sided bonding film F105 caused by scattering of the ink i while the double-sided bonding film F105 records defect information can be prevented. The cover 32 may be provided with the above-mentioned side plate portions 30a, 30b, 30c, and 30d. That is, the cover 32 may constitute a bottom plate portion covering the bottom surface of the cover 30.

又,上述記錄裝置13雖係形成為配置於第二缺陷檢查裝置12的下游側之構成,但亦可配置在第一缺陷檢查裝置11的下游側。在此情況下,可在進行過利用第一缺陷檢查裝置11之缺陷檢查之後,進行利用記錄裝置13之缺陷資訊的記錄。 Although the recording device 13 is configured to be disposed downstream of the second defect inspection device 12, the recording device 13 may be disposed downstream of the first defect inspection device 11. In this case, after the defect inspection using the first defect inspection device 11 is performed, the defect information using the recording device 13 may be recorded.

又,關於上述記錄裝置13,並不限定於在上述的缺陷檢查後記錄缺陷資訊。還有例如,在長距離的 搬送線上,配置複數個記錄裝置,在每一定距離進行距離資訊的記錄,根據此記錄的距離資訊進行距離的修正。關於如此的進行距離資訊的記錄之記錄裝置,係例如配置於第一缺陷檢查裝置11的上游側等。 The recording device 13 is not limited to recording defect information after the defect inspection. For another example, a plurality of recording devices are arranged on a long-distance transport line, and distance information is recorded at a certain distance, and the distance is corrected based on the recorded distance information. The recording device for recording such distance information is, for example, disposed on the upstream side of the first defect inspection device 11.

又,關於適合採用本發明之膜,並非一定要限定於上述的偏光膜或相位差膜、增亮膜等之光學膜,亦可將本發明擴大應用於要以記錄裝置13在其上進行記錄之膜。 Moreover, the film suitable for the present invention is not necessarily limited to the above-mentioned optical film such as a polarizing film, a retardation film, a brightness enhancement film, and the like, and the present invention can be extended to be recorded on the recording device 13 Of the film.

又,本發明除了上述的噴墨方式之外,亦可擴大應用於雷射方式等之非接觸式的印字裝置及印字方法。尤其,噴墨方式容易產生墨水的氣霧,所以若光學膜發生啪啪跳動,就容易受之影響而發生印字錯誤。關於缺陷資訊也一樣,以噴墨方式列印上述的二維條碼之類的複雜資訊之情況,較容易受到光學膜的啪啪跳動的影響。 In addition to the above-mentioned inkjet method, the present invention can be applied to a non-contact type printing device and a printing method such as a laser method. In particular, the inkjet method is prone to generate aerosol of ink. Therefore, if the optical film is popped, it is easily affected and printing errors occur. The same is true for defect information. When printing complex information such as the two-dimensional barcode described above by inkjet, it is more likely to be affected by the popping of the optical film.

Claims (9)

一種缺陷檢查系統,具備有:搬送線,係搬送長帶狀的膜;缺陷檢查裝置,係進行在前述搬送線搬送的膜的缺陷檢查;以及記錄裝置,係將根據前述缺陷檢查的結果而得到的缺陷資訊記錄到在前述搬送線搬送的膜,其中,前述記錄裝置係具有印字頭,前述印字頭係將前述缺陷資訊印到沿著前述膜的端緣部之記錄區域,前述印字頭係與和前述膜接觸之導輥相對向而配置,且從前述膜和前述導輥接觸之側的相反側進行印字。     A defect inspection system includes: a conveying line for conveying a long-belt-shaped film; a defect inspection device for inspecting a defect of a film conveyed on the aforementioned conveying line; and a recording device for obtaining based on a result of the aforementioned defect inspection The defect information is recorded on the film conveyed on the conveying line, wherein the recording device has a printing head, and the printing head prints the defect information on a recording area along the edge of the film, and the printing head is connected with The guide rollers in contact with the film are arranged to face each other, and printing is performed from the side opposite to the side where the film and the guide rollers are in contact.     如申請專利範圍第1項所述之缺陷檢查系統,其中,前述膜係以40°至130°之角度範圍繞接在前述導輥的外周面。     The defect inspection system according to item 1 of the scope of patent application, wherein the film is wound around the outer peripheral surface of the guide roller in an angle range of 40 ° to 130 °.     如申請專利範圍第1或2項所述之缺陷檢查系統,其中,前述印字頭係藉由使墨水噴出至前述膜的記錄區域而對前述缺陷資訊進行印字。     The defect inspection system according to item 1 or 2 of the scope of application for a patent, wherein the printing head prints the defect information by ejecting ink to a recording area of the film.     如申請專利範圍第3項所述之缺陷檢查系統,其中,前述記錄裝置係具有遮蓋,該遮蓋係防止前述墨水附著到前述膜的至少比前述記錄區域更靠近內側的區域。     The defect inspection system according to claim 3, wherein the recording device has a cover that prevents the ink from adhering to an area of the film that is at least closer to the inside than the recording area.     如申請專利範圍第3或4項所述之缺陷檢查系統,更具備有: 靜電去除裝置,係在前述膜的搬送方向上位於比前述記錄裝置更靠近上游側之位置,用來對前述膜的表面進行除電。     The defect inspection system according to item 3 or 4 of the scope of patent application, further includes: a static electricity removing device, which is located closer to the upstream side than the recording device in the conveying direction of the film, and is used to inspect the film. Discharge the surface.     一種膜製造裝置,具備有:申請專利範圍第1至5項中任一項所述之缺陷檢查系統。     A film manufacturing apparatus includes the defect inspection system according to any one of claims 1 to 5 of a patent application scope.     一種膜製造方法,包含:使用申請專利範圍第1至5項中任一項所述之缺陷檢查系統進行缺陷檢查之工序。     A film manufacturing method includes a process of performing defect inspection using the defect inspection system according to any one of claims 1 to 5.     一種印字裝置,具備有:印字頭,係在搬送長帶狀的膜的期間將資訊印到前述膜,前述印字頭係與和前述膜接觸之導輥相對向而配置,且從前述膜和前述導輥接觸之側的相反側進行印字。     A printing device includes a printing head that prints information to the film during conveyance of a long-belt-shaped film, the printing head is disposed to face a guide roller that is in contact with the film, and is arranged from the film and the film. Printing is performed on the opposite side of the guide roller contact side.     一種印字方法,包含:在搬送長帶狀的膜的期間使用印字頭將資訊印到前述膜之工序,其中,使前述印字頭與和前述膜接觸之導輥相對向而配置,且從前述膜和前述導輥接觸之位置的相反側進行印字。     A printing method includes a step of printing information onto the film using a printing head during conveyance of the long-belt-shaped film, wherein the printing head is arranged to face a guide roller in contact with the film, and the film is disposed from the film. Printing is performed on the side opposite to the position in contact with the guide roller.    
TW107106816A 2017-03-03 2018-03-01 Defect inspection system, film manufacturing apparatus, film manufacturing method, printing apparatus and printing method TWI762592B (en)

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Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3208255B2 (en) * 1994-08-29 2001-09-10 アルプス電気株式会社 Printer
JP3890430B2 (en) * 1999-08-24 2007-03-07 富士フイルム株式会社 Surface inspection method and apparatus
JP2004045071A (en) * 2002-07-09 2004-02-12 Sumitomo Chem Co Ltd Continuous sheet marking device
JP4077258B2 (en) * 2002-07-12 2008-04-16 株式会社リコー Method and apparatus for inspecting inner surface of cylindrical body for electrophotography
JP2005088556A (en) * 2003-09-22 2005-04-07 National Printing Bureau Sheet conveying device
JP2005114499A (en) 2003-10-07 2005-04-28 Toppan Printing Co Ltd Die coat bead inspection device and inspection method thereof
JP2006047078A (en) * 2004-08-04 2006-02-16 Central Glass Co Ltd Method for inspecting printing defect and/or printing contamination of transparent plate body
JP2006194721A (en) * 2005-01-13 2006-07-27 Nagase & Co Ltd Defective marking apparatus
JP2006266981A (en) 2005-03-25 2006-10-05 Nagase & Co Ltd Apparatus for marking defect
US20060164647A1 (en) 2005-01-13 2006-07-27 Nagase & Co., Ltd. Apparatus for marking a defect
JP5248052B2 (en) * 2006-10-11 2013-07-31 日東電工株式会社 Defect inspection device for sheet-like product having optical film, inspection data processing device, cutting device and manufacturing system thereof
JP2009069142A (en) * 2007-08-23 2009-04-02 Nitto Denko Corp Defect inspection method and apparatus for laminated film
JP2009243911A (en) * 2008-03-28 2009-10-22 Toray Ind Inc Defect inspection system
JP2009244064A (en) * 2008-03-31 2009-10-22 Sumitomo Chemical Co Ltd Inspection method of polarization film
JP5276875B2 (en) * 2008-03-31 2013-08-28 富士フイルム株式会社 Film defect inspection method and apparatus
JP5619348B2 (en) * 2008-11-21 2014-11-05 住友化学株式会社 Mold sheet inspection system
JP5588223B2 (en) 2009-05-26 2014-09-10 旭化成イーマテリアルズ株式会社 Defect marking apparatus and defect marking method for wire grid polarizing film
JP2011218712A (en) * 2010-04-13 2011-11-04 Seiko Epson Corp Ink jet printer
JP5925609B2 (en) 2012-06-12 2016-05-25 日東電工株式会社 Sheet product inspection system and sheet product inspection method
JP2014048206A (en) * 2012-08-31 2014-03-17 Sharp Corp Defect classification device, defect classification method, control program and storage medium
JP6182806B2 (en) * 2013-06-04 2017-08-23 住友化学株式会社 Defect inspection system and film manufacturing apparatus
JP6177017B2 (en) * 2013-06-12 2017-08-09 住友化学株式会社 Defect inspection system
JP6410413B2 (en) * 2013-08-02 2018-10-24 住友化学株式会社 Defect inspection system and film manufacturing apparatus
JP6156820B2 (en) * 2013-08-22 2017-07-05 住友化学株式会社 Defect inspection apparatus, optical member manufacturing system, and optical display device production system
JP6204416B2 (en) * 2015-07-17 2017-09-27 住友化学株式会社 Film inspection apparatus, film inspection method, and film manufacturing method

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TWI762592B (en) 2022-05-01
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JP7117864B2 (en) 2022-08-15
KR20180101206A (en) 2018-09-12

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