TWI762592B - Defect inspection system, film manufacturing apparatus, film manufacturing method, printing apparatus and printing method - Google Patents
Defect inspection system, film manufacturing apparatus, film manufacturing method, printing apparatus and printing method Download PDFInfo
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- TWI762592B TWI762592B TW107106816A TW107106816A TWI762592B TW I762592 B TWI762592 B TW I762592B TW 107106816 A TW107106816 A TW 107106816A TW 107106816 A TW107106816 A TW 107106816A TW I762592 B TWI762592 B TW I762592B
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- 238000007689 inspection Methods 0.000 title claims abstract description 110
- 238000007639 printing Methods 0.000 title claims abstract description 55
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J3/00—Typewriters or selective printing or marking mechanisms characterised by the purpose for which they are constructed
- B41J3/407—Typewriters or selective printing or marking mechanisms characterised by the purpose for which they are constructed for marking on special material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41M—PRINTING, DUPLICATING, MARKING, OR COPYING PROCESSES; COLOUR PRINTING
- B41M5/00—Duplicating or marking methods; Sheet materials for use therein
- B41M5/0041—Digital printing on surfaces other than ordinary paper
- B41M5/0064—Digital printing on surfaces other than ordinary paper on plastics, horn, rubber, or other organic polymers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
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- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Making Paper Articles (AREA)
- Continuous Casting (AREA)
Abstract
Description
本發明係關於缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法。 The present invention relates to a defect inspection system, a film manufacturing apparatus, a film manufacturing method, a printing apparatus, and a printing method.
例如偏光板等的光學膜,係在進行過異物缺陷、凹凸缺陷等之缺陷檢查後,捲繞在芯材的周圍。與缺陷的位置及種類有關之資訊(以下稱為缺陷資訊),係以在光學膜的端部印上條碼(barcode)、或在缺陷部位印上標記(mark)之方式記錄在光學膜上。捲繞於芯材之光學膜的捲繞量達到一定的量,就與來自上游側的光學膜切分開來,作為光學膜的料捲而出貨。在例如專利文獻1中,揭示一種:在光學膜的搬送線上配備有缺陷檢查裝置、及將缺陷資訊記錄在膜上的記錄裝置之缺陷檢查系統。 For example, an optical film such as a polarizing plate is wound around a core material after being inspected for defects such as foreign matter defects and concave-convex defects. Information related to the position and type of defects (hereinafter referred to as defect information) is recorded on the optical film by printing a barcode on the end of the optical film or printing a mark on the defect site. When the winding amount of the optical film wound around the core material reaches a certain amount, it is cut from the optical film from the upstream side and shipped as a roll of the optical film. For example,
[專利文獻1]日本特開2011-7779號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2011-7779
然而,上述的缺陷檢查系統在將缺陷資訊記錄在光學膜上之際,會因為光學膜的狀態、搬送條件等而發生搬送中的光學膜啪啪跳動之情形。光學膜發生如此的啪啪跳動的話,就有:要利用從印字頭噴出的墨水印上之缺陷資訊,不會正確地記錄在沿著光學膜的端緣部之記錄區域,而印得不清楚(印字錯誤)之虞。 However, in the above-mentioned defect inspection system, when the defect information is recorded on the optical film, the optical film during conveyance may jump depending on the state of the optical film, conveyance conditions, and the like. If the optical film jumps like this, the defect information printed by the ink ejected from the printing head will not be correctly recorded in the recording area along the edge of the optical film, and the printing will not be clear. (typographical error).
本發明係有鑒於如上所述的以往的問題而提出者,其目的在提供可減低搬送中的膜發生的啪啪跳動所造成的影響,可適切地將缺陷資訊記錄於膜上之缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法。 The present invention has been made in view of the above-mentioned conventional problems, and an object of the present invention is to provide a defect inspection system capable of appropriately recording defect information on the film while reducing the influence of the slaps that occur in the film being conveyed. , Film manufacturing apparatus, film manufacturing method, printing apparatus and printing method.
作為解決上述課題之手段,根據本發明之態樣提供一種缺陷檢查系統,其係具備有:搬送線,係搬送長帶狀的膜;缺陷檢查裝置,係進行在前述搬送線搬送的膜的缺陷檢查;以及記錄裝置,係將根據前述缺陷檢查的結果而得到的缺陷資訊記錄到在前述搬送線搬送的膜,其中,前述記錄裝置係具有印字頭,前述印字頭係將前述缺陷資訊印到沿著前述膜的端緣部之記錄區域,前述印字頭係與和前述膜接觸之導輥相對向而配置,且從前述膜和前述導輥接觸之側的相反側進行印字。 As means for solving the above-mentioned problems, according to an aspect of the present invention, there is provided a defect inspection system including: a conveying line for conveying a long-belt-shaped film; and a defect inspection device for inspecting defects of the film conveyed on the conveying line inspection; and a recording device for recording the defect information obtained based on the result of the defect inspection on the film conveyed on the conveying line, wherein the recording device has a printing head, and the printing head prints the defect information along the edge In the recording area of the edge portion of the film, the print head is arranged to face the guide roller in contact with the film, and prints are performed from the side opposite to the side where the film is in contact with the guide roller.
在前述態樣之缺陷檢查系統中,前述膜可為以40°至130°之角度範圍繞接在前述導輥的外周面之構成。 In the defect inspection system of the aforementioned aspect, the film may be wound around the outer peripheral surface of the guide roller at an angle ranging from 40° to 130°.
在前述態樣之缺陷檢查系統中,前述印字頭可為藉由使墨水噴出至前述膜的記錄區域而對前述缺陷資訊進行印字之構成。 In the defect inspection system of the above aspect, the printing head may be configured to print the defect information by ejecting ink to the recording area of the film.
在前述態樣之缺陷檢查系統中,前述記錄裝置可為具有遮蓋(cover),該遮蓋係防止墨水附著到前述膜的至少比前述記錄區域更靠近內側的區域之構成。 In the defect inspection system of the aforementioned aspect, the recording device may have a cover configured to prevent ink from adhering to at least an area of the film that is closer to the inner side than the recording area.
前述態樣之缺陷檢查系統,可為具備有:在前述膜的搬送方向上位於比前述記錄裝置更靠近上游側之位置,用來對前述膜的表面進行除電之靜電去除裝置之構成。 The defect inspection system of the above-described aspect may include a static electricity removing device for removing static electricity from the surface of the film at a position upstream of the recording device in the film conveying direction.
另外,根據本發明的態樣提供一種膜製造裝置,此膜製造裝置具備有前述任一形態的缺陷檢查系統。 Furthermore, according to an aspect of the present invention, there is provided a film manufacturing apparatus including the defect inspection system of any one of the aforementioned aspects.
又,根據本發明的態樣提供一種膜製造方法,此膜製造方法包含:使用前述任一形態的缺陷檢查系統來進行缺陷檢查之工序。 Moreover, according to the aspect of this invention, there is provided the film manufacturing method which includes the process of performing a defect inspection using the defect inspection system of any one of the above-mentioned aspects.
又,根據本發明的態樣提供一種印字裝置,此印字裝置係具備有:在搬送長帶狀的膜的期間將資訊印到前述膜之印字頭,前述印字頭係與和前述膜接觸之導輥相對向而配置,且從前述膜和前述導輥接觸之位置的相反側進行印字。 Further, according to an aspect of the present invention, there is provided a printing apparatus including a printing head for printing information on the film while conveying a long strip-shaped film, and the printing head is in contact with a guide that is in contact with the film. The rolls are arranged to face each other, and printing is performed from the opposite side of the position where the film and the guide roll are in contact with each other.
又,根據本發明的態樣提供一種印字方 法,此印字方法係包含:在搬送長帶狀的膜的期間使用印字頭將資訊印到前述膜之工序,其中,使前述印字頭與和前述膜接觸之導輥相對向而配置,且從前述膜和前述導輥接觸之位置的相反側進行印字。 Further, according to an aspect of the present invention, there is provided a printing method comprising the step of printing information on the film using a printing head while conveying a long strip-shaped film, wherein the printing head and the film are made to The guide rollers in contact are arranged to face each other, and printing is performed from the opposite side of the position where the film and the guide roller are in contact.
如以上所述,根據本發明之態樣,就可提供可減低搬送中的膜發生的啪啪跳動所造成的影響,可適切地將缺陷資訊記錄於膜上之缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法。 As described above, according to the aspect of the present invention, it is possible to provide a defect inspection system, a film manufacturing apparatus, a film manufacturing apparatus, a defect inspection system, a film production apparatus, a film production apparatus, a defect inspection system, a film production apparatus, a film production apparatus, a defect inspection system, a film production apparatus, a film production apparatus, a defect inspection system, a film production apparatus, and a Film manufacturing method, printing device and printing method.
10‧‧‧缺陷檢查系統 10‧‧‧Defect Inspection System
11‧‧‧第一缺陷檢查裝置 11‧‧‧First Defect Inspection Device
12‧‧‧第二缺陷檢查裝置 12‧‧‧Second defect inspection device
13‧‧‧記錄裝置 13‧‧‧Recording device
13a‧‧‧印字頭 13a‧‧‧Print head
14‧‧‧第一測長器 14‧‧‧First Length Gauge
15‧‧‧第二測長器 15‧‧‧Second length measuring device
16‧‧‧控制裝置 16‧‧‧Control device
21a、22a、23a、24a、25a‧‧‧照明部 21a, 22a, 23a, 24a, 25a‧‧‧Lighting
21b、22b、23b、24b、25b‧‧‧光檢測部 21b, 22b, 23b, 24b, 25b‧‧‧Light detection part
30‧‧‧遮蓋 30‧‧‧Cover
30a‧‧‧第一側板部 30a‧‧‧First side plate
30b‧‧‧第二側板部 30b‧‧‧Second side plate
30c‧‧‧第三側板部 30c‧‧‧The third side plate
30d‧‧‧第四側板部 30d‧‧‧The fourth side plate
31‧‧‧遮蓋 31‧‧‧Covering
32‧‧‧遮蓋 32‧‧‧covering
32a‧‧‧窗部 32a‧‧‧Window
40‧‧‧靜電去除裝置 40‧‧‧Static removal device
100‧‧‧膜製造裝置 100‧‧‧Membrane manufacturing equipment
101‧‧‧第一搬送線 101‧‧‧First transfer line
102‧‧‧第二搬送線 102‧‧‧Second transfer line
103‧‧‧第三搬送線 103‧‧‧The third transfer line
104‧‧‧第四搬送線 104‧‧‧The fourth conveying line
105‧‧‧第五搬送線 105‧‧‧Fifth transfer line
106‧‧‧捲取部 106‧‧‧Coiler
111a、111b‧‧‧第一夾輥 111a, 111b‧‧‧First nip roll
112‧‧‧第一蓄積器 112‧‧‧First accumulator
112a、112b‧‧‧第一張力調節輥 112a, 112b‧‧‧First Tensioner Roller
113‧‧‧第一導輥 113‧‧‧First guide roller
121a、121b‧‧‧第二夾輥 121a, 121b‧‧‧Second nip roll
122‧‧‧第二蓄積器 122‧‧‧Second accumulator
122a、122b‧‧‧第二張力調節輥 122a, 122b‧‧‧Second tensioning roller
123a、123b‧‧‧第二導輥 123a, 123b‧‧‧Second guide roller
131a、131b‧‧‧第三夾輥 131a, 131b‧‧‧The third nip roll
141a、141b‧‧‧第四夾輥 141a, 141b‧‧‧The fourth nip roll
142‧‧‧第三蓄積器 142‧‧‧Third accumulator
142a、142b‧‧‧第三張力調節輥 142a, 142b‧‧‧The third dancer roller
143a、143b‧‧‧第四導輥 143a, 143b‧‧‧The fourth guide roller
151a、151b‧‧‧第五夾輥 151a, 151b‧‧‧Fifth nip roll
152‧‧‧第四蓄積器 152‧‧‧Fourth accumulator
152a、152b‧‧‧第四張力調節輥 152a, 152b‧‧‧The fourth dancer roller
153a‧‧‧第五導輥 153a‧‧‧Fifth guide roller
153b‧‧‧第六導輥 153b‧‧‧Sixth guide roller
153c‧‧‧第七導輥 153c‧‧‧Seventh guide roller
P‧‧‧液晶顯示面板(光學顯示裝置) P‧‧‧LCD panel (optical display device)
F1X‧‧‧光學膜 F1X‧‧‧Optical Film
F10X‧‧‧光學膜 F10X‧‧‧Optical Film
F101‧‧‧第一膜 F101‧‧‧First Film
F102‧‧‧第二膜 F102‧‧‧Second film
F103‧‧‧第三膜 F103‧‧‧Third film
F104‧‧‧單面貼合膜 F104‧‧‧Single-sided lamination film
F105‧‧‧兩面貼合膜 F105‧‧‧Double-sided lamination film
第1圖係顯示液晶顯示面板的一例之平面圖。 FIG. 1 is a plan view showing an example of a liquid crystal display panel.
第2圖係第1圖中顯示的液晶顯示面板的斷面圖。 FIG. 2 is a cross-sectional view of the liquid crystal display panel shown in FIG. 1 .
第3圖係顯示光學膜的一例之斷面圖。 Fig. 3 is a cross-sectional view showing an example of an optical film.
第4圖係顯示膜製造裝置及缺陷檢查系統的構成之側面圖。 FIG. 4 is a side view showing the configuration of a film manufacturing apparatus and a defect inspection system.
第5圖係顯示記錄裝置的一例之側面圖。 Fig. 5 is a side view showing an example of a recording device.
第6圖係顯示遮蓋的一例,第6圖(a)係遮蓋之從膜的上方側所見的平面圖,第6圖(b)係遮蓋之從膜的上游側所見的側面圖,第6圖(c)係遮蓋之從膜的外側所見的側面圖。 Fig. 6 shows an example of the mask, Fig. 6(a) is a plan view of the mask as seen from the upper side of the film, Fig. 6(b) is a side view of the mask as seen from the upstream side of the film, and Fig. 6 ( c) is a side view of the mask as seen from the outside of the membrane.
第7圖係顯示遮蓋的變形例之平面圖。 Fig. 7 is a plan view showing a modification of the mask.
第8圖係顯示遮蓋的變形例,第8圖(a)係遮蓋的斜視圖,第8圖(b)係遮蓋的側面圖。 Fig. 8 shows a modification of the cover, Fig. 8(a) is a perspective view of the cover, and Fig. 8(b) is a side view of the cover.
第9圖係顯示遮蓋的另一實施形態,第9圖(a)係遮蓋 的平面圖,第9圖(b)係遮蓋的側面圖。 Fig. 9 shows another embodiment of the cover, Fig. 9(a) is a plan view of the cover, and Fig. 9(b) is a side view of the cover.
以下,參照圖式來詳細說明本發明的實施形態。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
在本實施形態中,將就光學顯示裝置的生產系統,說明構成其一部分之膜製造裝置、以及使用此膜製造裝置之膜製造方法。 In the present embodiment, a film manufacturing apparatus constituting a part of a production system of an optical display device, and a film manufacturing method using the film manufacturing apparatus will be described.
膜製造裝置係製造用來貼合在例如液晶顯示面板(panel)、有機EL顯示面板等之面板狀的光學顯示元件(光學顯示面板)上之例如偏光膜或相位差膜、增亮膜等的膜狀的光學部件(光學膜)之裝置。膜製造裝置係構成生產包含如此的光學顯示元件及光學部件之光學顯示裝置(device)的生產系統的一部分。 The film manufacturing apparatus manufactures, for example, a polarizing film, a retardation film, a brightness enhancement film, etc., for lamination on a panel-shaped optical display element (optical display panel) such as a liquid crystal display panel (panel) and an organic EL display panel (optical display panel). A device for film-like optical components (optical films). The film manufacturing apparatus constitutes a part of a production system for producing an optical display device including such an optical display element and optical components.
本實施形態中,係以透過型的液晶顯示裝置作為光學顯示裝置的例子進行說明。透過型的液晶顯示裝置係大致具有液晶顯示面板、以及背光(backlight)。此液晶顯示裝置可藉由使從背光射出的照明光從液晶顯示面板的背面側射入,使經液晶顯示面板予以調變過的光從液晶顯示面板的表面側射出而顯示影像。 In this embodiment, a transmissive liquid crystal display device will be described as an example of an optical display device. A transmissive liquid crystal display device generally includes a liquid crystal display panel and a backlight. In this liquid crystal display device, the illumination light emitted from the backlight is incident from the back side of the liquid crystal display panel, and the light modulated by the liquid crystal display panel is emitted from the front side of the liquid crystal display panel to display an image.
首先,針對光學顯示裝置,說明第1及2圖所示的液晶顯示面板P的構成。第1圖係顯示液晶顯示面板P的構成之平面圖。第2圖係沿著第1圖中顯示的剖面線A-A剖 開之液晶顯示面板P的斷面圖。第2圖中省略了表示斷面之陰影線的圖示。 First, the configuration of the liquid crystal display panel P shown in FIGS. 1 and 2 will be described with respect to an optical display device. FIG. 1 is a plan view showing the configuration of the liquid crystal display panel P. As shown in FIG. Fig. 2 is a cross-sectional view of the liquid crystal display panel P taken along the section line A-A shown in Fig. 1 . In Fig. 2, the hatched line showing the cross section is omitted.
液晶顯示面板P係如第1及2圖所示,大致具備有第一基板P1、與第一基板P1相對向配置之第二基板P2、以及配置於第一基板P1與第二基板P2之間之液晶層P3。 As shown in FIGS. 1 and 2, the liquid crystal display panel P generally includes a first substrate P1, a second substrate P2 arranged opposite to the first substrate P1, and a second substrate P2 arranged between the first substrate P1 and the second substrate P2 the liquid crystal layer P3.
第一基板P1係由從平面圖看呈長方形的透明基板所構成。第二基板P2係由比第一基板P1小之長方形的透明基板所構成。第一基板P1與第二基板P2之間的周圍係以密封材(未圖示)密封住,液晶層P3係配置於由密封材所圍住之從平面圖看呈長方形的區域的內側。液晶顯示面板P當中,從平面圖看限制在液晶層P3的外周的內側之區域為顯示區域P4,包圍在此顯示區域P4的周圍之外側的區域為框緣部G。 The first substrate P1 is formed of a transparent substrate having a rectangular shape in plan view. The second substrate P2 is formed of a rectangular transparent substrate smaller than the first substrate P1. The periphery between the 1st board|substrate P1 and the 2nd board|substrate P2 is sealed with the sealing material (not shown), and the liquid crystal layer P3 is arrange|positioned inside the area|region which is rectangular in plan view surrounded by the sealing material. In the liquid crystal display panel P, the area limited to the inner side of the outer periphery of the liquid crystal layer P3 in plan view is the display area P4, and the area surrounding the outer periphery of the display area P4 is the frame edge portion G.
在液晶顯示面板P的背面(背光側),貼合有作為偏光膜之第一膜F11。在液晶顯示面板P的表面(顯示面側),則貼合有作為偏光膜之第二膜F12、以及重疊而貼合於第二膜F12上之作為增亮膜之第三膜F13。以下,將第一膜、第二膜及第三膜F11、F12、F13統稱為光學膜F1X。 On the back surface (backlight side) of the liquid crystal display panel P, the first film F11 as a polarizing film is bonded. On the surface (display surface side) of the liquid crystal display panel P, the second film F12 as a polarizing film and the third film F13 as a brightness enhancement film are laminated and bonded on the second film F12. Hereinafter, the first film, the second film, and the third film F11, F12, and F13 are collectively referred to as the optical film F1X.
接著,說明第3圖所示之構成光學膜F1X之光學片FX的一例。第3圖係顯示光學片FX的構成之斷面圖。第3圖中省略了表示斷面之陰影線的圖示。 Next, an example of the optical sheet FX which comprises the optical film F1X shown in FIG. 3 is demonstrated. Fig. 3 is a cross-sectional view showing the structure of the optical sheet FX. In Fig. 3, the hatched line showing the cross section is omitted.
光學膜F1X係從第3圖所示的長帶狀的光學片(料捲)FX切出一段預定長度的片段(chip)而得到。具體而言,該光學片FX係具有基材片F4、設於基材片F4的一側的面(第3圖中的上側面)之黏著層F5、透過黏著層F5而設於基材片F4的一側的面之分隔片(separator sheet)F6、以及設於基材片F4的另一側的面(第3圖中的下側面)之表面保護片F7。 The optical film F1X is obtained by cutting out a piece (chip) of a predetermined length from the long-belt-shaped optical sheet (roll) FX shown in FIG. 3 . Specifically, this optical sheet FX has a base material sheet F4, an adhesive layer F5 provided on one side of the base sheet F4 (upper side in FIG. 3 ), and provided on the base sheet through the adhesive layer F5 A separator sheet (separator sheet) F6 on one surface of F4, and a surface protection sheet F7 provided on the other surface (lower surface in FIG. 3 ) of the base sheet F4.
基材片F4在例如偏光膜之情況,係具有將偏光鏡(polarizer)F4a夾在一對保護膜F4b、F4c之間的構造。黏著層F5係用來使光學片(光學膜F1X)黏貼在液晶顯示面板P上之層。分隔片F6係保護黏著層F5之膜片,在要將光學片(光學膜F1X)黏貼至液晶顯示面板P之前從黏著層F5剝離。以下,將已經撕掉分隔片F6之光學膜F1X的部分稱為貼合片F8。表面保護片F7係用來保護基材片F4的表面之膜片,表面保護片F7在已將光學片(光學膜F1X)黏貼至液晶顯示面板P之後從光學片(光學膜F1X)的表面剝離。 In the case of a polarizing film, for example, the base sheet F4 has a structure in which a polarizer F4a is sandwiched between a pair of protective films F4b and F4c. The adhesive layer F5 is a layer for adhering the optical sheet (optical film F1X) on the liquid crystal display panel P. As shown in FIG. The separator F6 is a film which protects the adhesive layer F5, and is peeled off from the adhesive layer F5 before sticking the optical sheet (optical film F1X) to the liquid crystal display panel P. As shown in FIG. Hereinafter, the part where the optical film F1X of the separator F6 has been torn off is referred to as a bonding sheet F8. The surface protection sheet F7 is a film for protecting the surface of the base material sheet F4, and the surface protection sheet F7 is peeled from the surface of the optical sheet (optical film F1X) after the optical sheet (optical film F1X) has been pasted to the liquid crystal display panel P .
在基材片F4方面,可為將一對保護膜F4b、F4c之中的任一方予以省略之構成。例如,可省略黏著層F5側的保護膜F4b而將黏著層F5直接設於偏光鏡F4a。另外,可對於表面保護片F7側的保護膜F4c,施加例如用來保護液晶顯示面板P的最外面之硬鍍膜(hard coating)處理、用來得到防眩效果之防眩光(antiglare)處理等之表面處理。又,基材片F4並不限於上述的積層構造的薄片,亦 可為單層構造的薄片。此外,也可將表面保護片F7予以省略。 In the aspect of the base material sheet F4, it is possible to omit either one of the pair of protective films F4b and F4c. For example, the protective film F4b on the side of the adhesive layer F5 may be omitted, and the adhesive layer F5 may be directly provided on the polarizer F4a. In addition, the protective film F4c on the surface protective sheet F7 side may be subjected to, for example, a hard coating treatment for protecting the outermost surface of the liquid crystal display panel P, an antiglare treatment for obtaining an antiglare effect, or the like. Surface treatment. In addition, the base material sheet F4 is not limited to the above-mentioned laminated structure sheet, and may be a single-layer structure sheet. In addition, the surface protection sheet F7 can also be abbreviate|omitted.
接著,說明第4圖所示之膜製造裝置100。第4圖係顯示膜製造裝置100的構成之側面圖。 Next, the
膜製造裝置100係如第4圖所示,為例如在作為偏光膜之長帶狀的第一膜F101的一面貼合作為表面保護膜之長帶狀的第二膜F102之後,在第一膜F101的另一面貼合作為表面保護膜之長帶狀的第三膜F103,以此方式製造在第一膜F101的兩面貼合有第二膜F102及第三膜F103之光學膜F10X之裝置。 The
具體而言,該膜製造裝置100係大致具備有第一搬送線101、第二搬送線102、第三搬送線103、第四搬送線104、第五搬送線105、以及捲取部106。 Specifically, this
其中,第一搬送線101係形成搬送第一膜F101之搬送路徑,第二搬送線102係形成搬送從第一料捲R1拉出的第二膜F102之搬送路徑,第三搬送線103係形成搬送在第一膜F101的一面貼合第二膜F102之後的單面貼合膜F104之搬送路徑,第四搬送線104係形成搬送從第二料捲R2拉出的第三膜F103之搬送路徑,第五搬送線105係形成搬送在單面貼合膜F104的第一膜F101側的面(第一膜F101的另一面)貼合第三膜F103之後的兩面貼合膜F105(光學膜F10X)之搬送路徑。製造出的光學膜F10X 係在捲取部106捲繞在芯材上而成為第三料捲R3。 Among them, the
第一搬送線101係將對於例如PVA(聚乙烯醇:Polyvinyl Alcohol)等之作為偏光鏡的基材之膜施加染色處理及交聯處理、拉伸處理等之後,在其兩面貼合TAC(三醋酸纖維素:Triacetylcellulose)等之保護膜而得到之長帶狀的第一膜F101往第三搬送線103搬送。 The first conveying
具體而言,係在此第一搬送線101上,從第三搬送線103的上游處的一方側開始朝向第三搬送線103的方向,在水平方向依序排列配置一對第一夾輥(nip roller)111a、111b、包含複數個第一張力調節輥(dancer roller)112a、112b之第一蓄積器(accumulator)112、以及第一導輥113。 Specifically, on the
一對第一夾輥111a、111b係將第一膜F101夾在中間且同時往相反方向轉,藉此而將第一膜F101往第4圖中顯示的箭號的方向(右方)拉。 A pair of 1st nip
第一蓄積器112係用來吸收第一膜F101的進給量變動所產生的差,以及減低施加於第一膜F101之張力的變動。具體而言,第一蓄積器112係具有在第一夾輥111a、111b與第一導輥113之間將位於上部側之複數個張力調節輥112a及位於下部側之複數個張力調節輥112b交互排列配置之構成。 The
第一蓄積器112係以使第一膜F101交互地繞過上部側的張力調節輥112a及繞過下部側的張力調節輥112b之狀態,一邊進行第一膜F101的搬送,一邊使上部側的張力調節輥112a及下部側的張力調節輥112b相對 地在上下方向做升降動作。如此,就可暫時蓄積第一膜F101而不用使第一搬送線101停止。例如,第一蓄積器112使上部側的張力調節輥112a與下部側的張力調節輥112b之間的距離增大,就可增加第一膜F101之蓄積,反之,使上部側的張力調節輥112a與下部側的張力調節輥112b之間的距離縮減,就可減少第一膜F101之蓄積。第一蓄積器112係例如在更換料捲R1至R3的芯材之後的片帶的銜接等之作業時稼動。 The
第一導輥113係轉動而將第一夾輥111a、111b所拉動並搬送過來的第一膜F101導引朝向第三搬送線103的上游側。第一導輥113並不限於只配置一個之構成,亦可為配置複數個之構成。 The first guide roller 113 rotates to guide the first film F101 pulled by the first nip
第二搬送線102係將例如PET(聚對苯二甲酸乙二酯:Polyethylene Terephthalate)等之作為表面保護膜之長帶狀的第二膜F102從第一料捲R1拉出,並將之往第三搬送線103搬送。 The
具體而言,係在此第二搬送線102上,從第三搬送線103的上游處的另一方側開始朝向第三搬送線103的方向,在水平方向依序排列配置一對第二夾輥121a、121b、包含複數個第二張力調節輥122a、122b之第二蓄積器122、以及複數個第二導輥123a、123b。 Specifically, on this
一對第二夾輥121a、121b係將第二膜F102夾在中間且同時往相反方向轉,藉此而將第二膜F102往第4圖中顯示的箭號的方向(左方)拉。 The pair of second nip rolls 121a and 121b sandwich the second film F102 while rotating in opposite directions, thereby pulling the second film F102 in the direction of the arrow (leftward) shown in FIG. 4 .
第二蓄積器122係用來吸收第二膜F102的進給量變動所產生的差,以及減低施加於第二膜F102之張力的變動。具體而言,第二蓄積器122係具有在第二夾輥121a、121b與第二導輥123a之間將位於上部側之複數個張力調節輥122a及位於下部側之複數個張力調節輥122b交互排列配置之構成。 The
第二蓄積器122係以使第二膜F102交互地繞過上部側的張力調節輥122a及繞過下部側的張力調節輥122b之狀態,一邊進行第二膜F102的搬送,一邊使上部側的張力調節輥122a及下部側的張力調節輥122b相對地在上下方向做升降動作。如此,就可蓄積第二膜F102而不用使第二搬送線102停止。例如,第二蓄積器122使上部側的張力調節輥122a與下部側的張力調節輥122b之間的距離增大,就可增加第二膜F102之蓄積,反之,使上部側的張力調節輥122a與下部側的張力調節輥122b之間的距離縮減,就可減少第二膜F102之蓄積。第二蓄積器122係例如在更換料捲R1至R3的芯材之後的片帶的銜接等之作業時稼動。 The
複數個第二導輥123a、123b係分別轉動而將第二夾輥121a、121b所拉動並搬送過來的第二膜F102導引向第三搬送線103的上游側。第二導輥123a、123b並不限於配置複數個之構成,亦可為只配置一個之構成。 The plurality of
第三搬送線103係將在第一膜F101的一面貼合第二膜F102而成的長帶狀的單面貼合膜F104往第五 搬送線105搬送。 The
具體而言,係在此第三搬送線103上配置一對第三夾輥131a、131b。一對第三夾輥131a、131b係位於第一搬送線101的下游側與第二搬送線102的下游側的合流點,將第一膜F101及第二膜F102夾在中間且同時往相反方向旋轉,藉此而將第一膜F101及第二膜F102兩者相貼合而成的單面貼合膜F104往第4圖中顯示的箭號的方向(下方)拉。 Specifically, a pair of third nip
第四搬送線104係將例如PET(Polyethylene Terephthalate)等之作為表面保護膜之長帶狀的第三膜F103從第二料捲R2拉出,並將之往第五搬送線105搬送。 The
具體而言,係在此第四搬送線104上,從第三搬送線103的下游處的一方側開始朝向第三搬送線103的方向,在水平方向依序排列配置一對第四夾輥141a、141b、包含複數個第三張力調節輥142a、142b之第三蓄積器142、以及複數個第四導輥143a、143b。 Specifically, on the
一對第四夾輥141a、141b係一邊將第三膜F103夾在中間且一邊相互往相反方向轉,藉此而將第三膜F103往第4圖中顯示的箭號的方向(右方)拉。 The pair of fourth nip rolls 141a and 141b rotate in opposite directions to each other while sandwiching the third film F103, thereby moving the third film F103 in the direction of the arrow (right) shown in FIG. 4. pull.
第三蓄積器142係用來吸收第三膜F103的進給量變動所產生的差,以及減低施加於第三膜F103之張力的變動。具體而言,第三蓄積器142係具有在第四夾輥141a、141b與第四導輥143a之間將位於上部側之複數個張力調節輥142a及位於下部側之複數個張力調節輥 142b交互排列配置之構成。 The
第三蓄積器142係以使第三膜F103交互地繞過上部側的張力調節輥142a及繞過下部側的張力調節輥142b之狀態,一邊進行第三膜F103的搬送,一邊使上部側的張力調節輥142a及下部側的張力調節輥142b相對地在上下方向做升降動作。如此,就可暫時蓄積第三膜F103而不用使第四搬送線104停止。例如,第三蓄積器142使上部側的張力調節輥142a與下部側的張力調節輥142b之間的距離增大,就可增加第三膜F103之蓄積,反之,使上部側的張力調節輥142a與下部側的張力調節輥142b之間的距離縮減,就可減少第三膜F103之蓄積。第三蓄積器142係例如在更換料捲R1至R3的芯材之後的片帶的銜接等之作業時稼動。 The
複數個第四導輥143a、143b係分別轉動而將第四夾輥141a、141b所拉動並搬送過來的第三膜F103導引向第三搬送線103的下游側(第五搬送線105的上游側)。第四導輥143a、143b並不限於配置複數個之構成,亦可為只配置一個之構成。 The plurality of
第五搬送線105係將在單面貼合膜F104的第一膜F101側的面(第一膜F101的另一面)貼合第三膜F103而成的長帶狀的兩面貼合膜F105(光學膜F10X)往第三料捲R3搬送。 The
具體而言,係在此第五搬送線105上,從第三搬送線103的下游處的另一方側開始朝向第三料捲 R3的方向,在水平方向依序排列配置一對第五夾輥151a、151b、第五導輥153a、一對第六夾輥151c、151d、包含複數個第四張力調節輥152a、152b之第四蓄積器152、以及第六導輥153b。 Specifically, on this
一對第五夾輥151a、151b係位於第三搬送線103的下游側與第五搬送線105的上游側的合流點,將單面貼合膜F104及第三膜F103夾在中間且同時往相反方向轉,藉此而將單面貼合膜F104與第三膜F103兩者相貼合而成的兩面貼合膜F105往第4圖中顯示的箭號的方向(下方)拉。 A pair of fifth nip rolls 151a and 151b are located at the junction of the downstream side of the
第五導輥153a係轉動而將第五夾輥151a、151b所拉動並搬送過來的兩面貼合膜F105導引向第四蓄積器152。第五導輥153a並不限於只配置一個之構成,亦可為配置複數個之構成。 The
一對第六夾輥151c、151d係一邊將兩面貼合膜F105夾在中間且一邊相互往相反方向轉,藉此而將兩面貼合膜F105往第4圖中顯示的箭號的方向(右方)拉。 The pair of sixth nip rolls 151c and 151d rotate in opposite directions to each other while sandwiching the double-sided bonding film F105, thereby moving the double-sided bonding film F105 in the direction of the arrow (right) shown in FIG. 4 . square) pull.
第四蓄積器152係以使兩面貼合膜F105交互地繞過上部側的張力調節輥152a及繞過下部側的張力調節輥152b之狀態,一邊進行兩面貼合膜F105的搬送,一邊使上部側的張力調節輥152a及下部側的張力調節輥152b相對地在上下方向做升降動作。如此,就可蓄積兩面貼合膜F105而不用使第五搬送線105停止。例如,第四蓄積器152使上部側的張力調節輥152a與下部側的張力調 節輥152b之間的距離增大,就可增加兩面貼合膜F105之蓄積,反之,使上部側的張力調節輥152a與下部側的張力調節輥152b之間的距離縮減,就可減少兩面貼合膜F105之蓄積。第四蓄積器152係例如在更換料捲R1至R3的芯材之後的片帶的銜接等之作業時稼動。 The
第六導輥153b係轉動而將兩面貼合膜F105導引向第三料捲R3。第六導輥153b並不限於只配置一個之構成,亦可為配置複數個之構成。 The
兩面貼合膜F105係在捲取部106捲繞在芯材上之後,作為光學膜F10X的第三料捲R3而送到下一工序進行處。 After the double-sided bonding film F105 is wound around the core material by the winding
接著,針對上述膜製造裝置100所具備的缺陷檢查系統10進行說明。 Next, the
缺陷檢查系統10係如第4圖所示,大致具備有搬送線L、第一缺陷檢查裝置11及第二缺陷檢查裝置12、記錄裝置13、第一測長器14及第二測長器15、以及控制裝置16。 As shown in FIG. 4 , the
搬送線L係形成搬送作為檢查對象的膜之搬送路徑,本實施形態中,搬送線L係由上述第一搬送線101、第三搬送線103及第五搬送線105所構成。 The conveyance line L forms a conveyance path for conveying the film to be inspected, and in this embodiment, the conveyance line L is constituted by the above-mentioned
第一缺陷檢查裝置11係進行在貼合第二膜F102及第三膜F103之前的第一膜101的缺陷檢查的裝 置。具體而言,此第一缺陷檢查裝置11係檢測出製造第一膜F101之際、搬送第一膜F101之際產生的異物缺陷、凹凸缺陷、亮點缺陷等之各種缺陷。第一缺陷檢查裝置11係藉由對於在第一搬送線101上搬送的第一膜F101進行例如反射檢查、透射檢查、斜向透射檢查、正交偏光(crossed Nichol)透射檢查等之檢查處理,來檢測出第一膜F101的缺陷。 The first defect inspection apparatus 11 is an apparatus for inspecting the defects of the
第一缺陷檢查裝置11係在第一搬送線101上比第一夾輥111a、111b更靠近上游側之處具有:照射光線至第一膜F101之複數個照明部21a、22a、23a、以及檢測透射過第一膜F101之光(透射光)或在第一膜F101反射之光(反射光)之複數個光檢測部21b、22b、23b。 The first defect inspection device 11 includes a plurality of
本實施形態中,用來檢測透射光之構成,係在第一膜F101的搬送方向排列配置相互隔著第一膜F101而相對向之複數個照明部21a、22a、23a及複數個光檢測部21b、22b、23b。另外,第一缺陷檢查裝置11並不限於如此之檢測透射光之構成,亦可為檢測反射光之構成、或檢測透射光及反射光之構成。 In the present embodiment, the structure for detecting transmitted light is that a plurality of
照明部21a、22a、23a係照射經按照缺陷檢查的種類而調整過光強度及波長、偏光狀態等之照明光至第一膜F101。光檢測部21b、22b、23b係使用CCD等之攝像元件來攝取第一膜F101之照射到照明光的位置的影像。光檢測部21b、22b、23b所攝得的影像(缺陷檢查結果)係輸出至控制裝置16。 The
第二缺陷檢查裝置12係進行貼合了第二膜F102及第三膜F103之後的第一膜101、亦即兩面貼合膜F105的缺陷檢查的裝置。具體而言,此第二缺陷檢查裝置12係檢測在第一膜F101貼合第二膜F102及第三膜F103之際、搬送單面貼合膜F104及兩面貼合膜F105之際產生的異物缺陷、凹凸缺陷、亮點缺陷等之各種缺陷。第二缺陷檢查裝置12係藉由對於在第五搬送線105上搬送的兩面貼合膜F105進行例如反射檢查、透射檢查、斜向透射檢查、正交偏光透射檢查等之檢查處理,來檢測出兩面貼合膜F105的缺陷。 The 2nd
第二缺陷檢查裝置12係在第五搬送線105上比第五夾輥151a、151b更靠近下游側之處具有:照射光線至兩面貼合膜F105之複數個照明部24a、25a、以及檢測透射過兩面貼合膜F105之光(透射光)或在兩面貼合膜F105反射之光(反射光)之複數個光檢測部24b、25b。 The second
本實施形態中,用來檢測透射光之構成,係在兩面貼合膜F105的搬送方向排列配置相互隔著兩面貼合膜F105而相對向之複數個照明部24a、25a及複數個光檢測部24b、25b。另外,第二缺陷檢查裝置12並不限於如此之檢測透射光之構成,亦可為檢測反射光之構成、或檢測透射光及反射光之構成。 In the present embodiment, the structure for detecting the transmitted light is arranged in the conveyance direction of the double-sided bonding film F105, and a plurality of illuminating
照明部24a、25a係照射經按照缺陷檢查的種類而調整過光強度及波長、偏光狀態等之照明光至兩面貼合膜F105。光檢測部24b、25b係使用CCD等之攝像元 件來攝取兩面貼合膜F105之照射到照明光的位置的影像。光檢測部24b、25b所攝得的影像(缺陷檢查結果)係輸出至控制裝置16。 The
記錄裝置13係將根據第一缺陷檢查裝置11及第二缺陷檢查裝置12的缺陷檢查的結果而得到之缺陷資訊記錄到兩面貼合膜F105之裝置(印字裝置)。具體而言,缺陷資訊係包含與缺陷的位置及種類等有關之資訊,係以例如條碼、二維條碼、QR code(註冊商標)等之識別碼的形態記錄(印上)。識別碼中含有例如表示第一缺陷檢查裝置11及第二缺陷檢查裝置12所檢測出的缺陷係存在於與印上識別碼的位置在膜的寬度方向相距多少距離的位置之資訊(與缺陷的位置有關之資訊)。識別碼中亦可含有與檢測出的缺陷的種類有關的資訊。本實施形態中,印上的缺陷資訊係7mm×7mm之二維條碼。 The
記錄裝置13係在第五搬送線105上設於比第二缺陷檢查裝置12更靠近下游側之處。記錄裝置13係具有採用例如噴墨方式之印字頭13a。另外,在與印字頭13a相對向之位置,配置有與兩面貼合膜F105相接觸之第七導輥153c。該印字頭13a係從兩面貼合膜F105之與第七導輥153c相接觸位置的相反側,在沿著兩面貼合膜105的寬度方向的端緣部之位置(記錄區域)噴出墨水,而進行上述缺陷資訊之印出。 The
記錄裝置13亦可藉由在兩面貼合膜F105的缺陷部位印上將缺陷包含在裡面之大小的點狀、線狀或框狀的標記(marking),而直接在缺陷部位進行記錄。此時,除了標記之外亦可藉由印上表示缺陷的種類之記號或圖案,來記錄與缺陷的種類有關之資訊。 The
第一測長器14及第二測長器15係量測第一膜F101的搬送量之裝置。具體而言,本實施形態中,係在第一搬送線101上,在位於第一蓄積器112的上游側之第一夾輥111a配置構成第一測長器14之旋轉編碼器(rotary encoder),以及在位於第一蓄積器112的下游側之第三夾輥131a配置構成第二測長器15之旋轉編碼器。 The first
第一測長器14及第二測長器15係利用旋轉編碼器根據與第一膜F101接觸而轉動之第一夾輥111a及第三夾輥131a的轉動變位量而測出第一膜F101的搬送量。第一測長器14及第二測長器15的測定結果係輸出至控制裝置16。 The first
本實施形態中,在第一缺陷檢查裝置11與記錄裝置13之間只存在有一個蓄積器,所以分別在該蓄積器的上游側及下游側各配置一個測長器。另一方面,在第一缺陷檢查裝置11與記錄裝置13之間存在有複數個蓄積器之情況,只要在最上游側的蓄積器的上游側及最下游側的蓄積器的下游側各配置一個測長器即可。 In the present embodiment, there is only one accumulator between the first defect inspection device 11 and the
控制裝置16係統括控制膜製造裝置100的各部之裝置。具體而言,此控制裝置16係具備有作為電子 控制裝置之電腦系統。電腦系統大致具備有CPU等之演算處理部、以及記憶體及硬碟等之資訊記憶部。 The
控制裝置16的資訊記憶部中,記錄有控制電腦系統之作業系統(OS)、使演算處理部進行膜製造裝置100的各部所需的各種處理之程式等。控制裝置16亦可包含進行膜製造裝置100的各部的控制所需的各種處理之ASIC等的邏輯電路。另外,控制裝置16包含用來進行電腦系統與外部裝置的輸出入之介面(interface)。可在此介面連接上例如鍵盤及滑鼠等之輸入裝置、液晶顯示器等之顯示裝置、通訊裝置等。 In the information storage part of the
控制裝置16係分析光檢測部21b、22b、23b及光檢測部24b、25b所攝得的影像,判別缺陷之有無(位置)及種類等。控制裝置16在判定第一膜F101或兩面貼合膜F105有缺陷之情況,控制記錄裝置13使之在兩面貼合膜F105上記錄缺陷資訊。 The
缺陷檢查系統10係以不會讓兩面貼合膜F105的缺陷檢查位置、與缺陷資訊的資訊記錄位置之間發生偏差之方式,在缺陷檢查後的預定的時序(timing)進行缺陷資訊的記錄。例如,本實施形態中,係算出從第一缺陷檢查裝置11或第二缺陷檢查裝置12進行缺陷檢查的時點之後在搬送線L上搬送的膜的搬送量,且在算出的搬送量與偏移距離(offset distance)一致時,使記錄裝置13進行記錄。 The
此處,偏移距離係指第一缺陷檢查裝置11 及第二缺陷檢查裝置12與記錄裝置13之間的膜的搬送距離。嚴格來說,偏移距離係定義為第一缺陷檢查裝置11及第二缺陷檢查裝置12進行缺陷檢查的位置(缺陷檢查位置)與記錄裝置13進行缺陷資訊的記錄的位置(資訊記錄位置)之間的膜的搬送距離。偏移距離在第一蓄積器112稼動時會變動。 Here, the offset distance means the conveyance distance of the film between the first defect inspection apparatus 11 , the second
第一蓄積器112未稼動時的偏移距離(以下稱為第一偏移距離)係預先記憶於控制裝置16的資訊記憶部。具體而言,第一缺陷檢查裝置11及第二缺陷檢查裝置12中有複數個光檢測部21b、22b、23b及光檢測部24b、25b,每個光檢測部21b、22b、23b、24b、25b都進行缺陷檢查。因此,控制裝置16的資訊記憶部中針對每個光檢測部21b、22b、23b、24b、25b分別記憶有第一偏移距離。 The offset distance (hereinafter referred to as the first offset distance) when the
在偏移距離由於第一蓄積器112的稼動而變動之情況,係根據第一蓄積器112的上游側及下游側的第一膜F101的搬送量的差來算出偏移距離的修正值。亦即,控制裝置16係從第一測長器14及第二測長器15的測定結果來算出第一蓄積器112中的第一膜F101的蓄積量,根據此第一膜F101的蓄積量來算出偏移距離的修正值。 When the offset distance fluctuates due to the operation of the
缺陷檢查系統10在第一蓄積器112稼動時,根據偏移距離的修正值來修正記錄裝置13進行缺陷資訊的記錄之時點。例如,本實施形態係根據第一測長器14及第二測長器15的測定結果,來算出偏移距離的修正值。 控制裝置16根據此修正值及第一偏移距離,來算出第一蓄積器112稼動時的偏移距離(以下稱為第二偏移距離)。 The
本實施形態中,根據第一測長器14及第二測長器15的測定結果算出從第一缺陷檢查裝置11及第二缺陷檢查裝置12進行缺陷檢查的時點之後在搬送線L上搬送的膜的搬送量,且在算出的搬送量與第二偏移距離一致時,使記錄裝置13進行記錄。 In this embodiment, based on the measurement results of the first
又,本實施形態中,在第一蓄積器112稼動時,可除了缺陷資訊之外,還在兩面貼合膜F105記錄表示第一蓄積器112為稼動的之資訊(以下稱為蓄積器稼動資訊)。在也記錄蓄積器稼動資訊之情況,操作員(operator)仔細檢查印有蓄積器稼動資訊的部分的缺陷部位,就可檢測出記錄位置之偏差等。如此,誤將良品部分判定為缺陷部位的可能性會變少,產率會提高。 Furthermore, in this embodiment, when the
然而,就本實施形態之缺陷檢查系統10而言,由於兩面貼合膜F105的狀態、搬送條件等,會有搬送中的兩面貼合膜F105發生啪啪跳動之情形。尤其,在兩面貼合膜F105的寬度方向的兩端部容易因為膜的吸濕或乾燥條件等而捲曲(curl),此捲曲可想成是在搬送中發生啪啪跳動的原因之一。 However, in the
針對此點,本實施形態之缺陷檢查系統10係如第5圖所示,將印字頭13a配置成與和上述的兩面貼合膜F105接觸之第七導輥153c相對向。 In view of this, as shown in FIG. 5, the
藉此,即使是在搬送中兩面貼合膜F105的 寬度方向的兩端部發生啪啪跳動之情況,也可在與第七導輥153c相接觸之位置抑制兩面貼合膜F105的啪啪跳動。因此,本實施形態之缺陷檢查系統10可適切地將想要利用從印字頭13a噴出的墨水i印上之缺陷資訊記錄(印)在兩面貼合膜F105的記錄區域。 Thereby, even in the case where the double-sided bonding film F105 has the both ends in the width direction during conveyance, the double-sided bonding film F105 can be restrained from jumping at the position where the double-sided bonding film F105 is in contact with the
兩面貼合膜F105最好以40°至130°之角度範圍(以下稱為圍繞角度θ)繞接在第七導輥153c的外周面。本實施形態中所謂的圍繞角度,係指以導輥的中心角表示膜在圓周方向與導輥的外周面接觸的角度範圍。 The double-sided bonding film F105 is preferably wound around the outer peripheral surface of the
當圍繞角度θ小於40°,兩面貼合膜F105就容易在第七導輥153c的外周面上滑動。因此,為了防止由於兩面貼合膜F105的滑動而產生的擦痕等,最好使圍繞角度θ在40°以上。另一方面,當圍繞角度θ超過130°,就容易在例如作為表面保護膜之第二及第三膜F102、F103與第一膜F101之間咬入氣泡。因而,為了防止如此之氣泡的咬入,最好使圍繞角度θ在130°以下。 When the surrounding angle θ is less than 40°, the double-sided bonding film F105 easily slides on the outer peripheral surface of the
另外,施加於兩面貼合膜F105之張力低的情況,最好使圍繞角度θ超過90°,在95°以上更好。如此,可抑制發生於兩面貼合膜F105之啪啪跳動。另一方面,施加於兩面貼合膜F105之張力高的情況,最好使圍繞角度θ小於90°,在85°以下更好。如此,可防止兩面貼合膜F105過度緊貼於第七導輥153c的外周面。 Moreover, when the tension|tensile_strength applied to the double-sided bonding film F105 is low, it is preferable to make surrounding angle (theta) more than 90 degrees, More preferably, it is 95 degrees or more. In this way, it is possible to suppress the popping that occurs in the double-sided bonding film F105. On the other hand, when the tension applied to the double-sided bonding film F105 is high, the surrounding angle θ is preferably less than 90°, more preferably 85° or less. In this way, the double-sided bonding film F105 can be prevented from adhering to the outer peripheral surface of the
關於兩面貼合膜F105的搬送速度,通常係在9至35m/min之程度。關於施加於兩面貼合膜F105之 張力,在乾燥爐內係在400至1500N之程度,在乾燥爐外係在200至500N之程度。施加於兩面貼合膜F105之張力越小越容易發生啪啪跳動。兩面貼合膜F105的寬度係在500至1500mm之程度。兩面貼合膜F105的寬度越大越容易發生啪啪跳動。兩面貼合膜F105的厚度係在13至300μm之程度。兩面貼合膜F105的厚度越薄越容易發生啪啪跳動。 The conveyance speed of the double-sided bonding film F105 is usually about 9 to 35 m/min. The tension applied to the double-sided adhesive film F105 is about 400 to 1500N inside the drying oven, and about 200 to 500N outside the drying oven. The smaller the tension applied to the double-sided lamination film F105, the easier it is to pop. The width of the double-sided lamination film F105 is in the range of 500 to 1500 mm. The larger the width of the double-sided lamination film F105 is, the more likely it is to pop. The thickness of the double-sided bonding film F105 is in the range of 13 to 300 μm. The thinner the thickness of the double-sided lamination film F105, the easier it is to pop.
另外,第七導輥153c的外徑最好在100至150mm之範圍內。第七導輥153c的外徑變大,相對於圍繞角度θ之與第七導輥153c的外周面接觸的兩面貼合膜F105的面積就會變大。因此,可抑制發生於兩面貼合膜F105之啪啪跳動,可使記錄區域更穩定化。但是,第七導輥153c的外徑變大,就容易發生上述的擦痕或氣泡的咬入,所以最好在上述的範圍內。 In addition, the outer diameter of the
又,第七導輥153c的真圓度越高,越可抑制與該第七導輥153c接觸之兩面貼合膜F105的振動,使記錄區域更穩定化。具體而言,第七導輥153c的真圓度最好在1.0mm以下,在0.5mm以下更好。 Moreover, as the roundness of the
又,第七導輥153c的外周面的表面粗度(最大粗度Ry)最好在100s以下,在25s以下更好。如此,可抑制上述的擦痕或氣泡之咬入的發生。 In addition, the surface roughness (maximum roughness Ry) of the outer peripheral surface of the
又,本實施形態之缺陷檢查系統10可為了在第七導輥153c的上游側及下游側也抑制發生於兩面貼合膜105之啪啪跳動,而追加與兩面貼合膜F105接觸之 導輥。在此情況,追加的導輥與第七導輥153c之間的距離最好在1000mm以內。亦可使兩面貼合膜F105相對於追加的導輥具有圍繞角度。最好相對於追加於上游側之導輥具有圍繞角度,相對於追加於上游側及下游側之導輥都具有圍繞角度更好。 In addition, in the
如以上所述,本實施形態之缺陷檢查系統10可減低由於發生於搬送中的兩面貼合膜F105的啪啪跳動所造成的影響,適切地在兩面貼合膜F105記錄(印上)缺陷資訊。因此,本實施形態之膜製造裝置100可防止由於印字錯誤所導致之缺陷資訊的讀取錯誤之發生,而可用很好的產率從兩面貼合膜F105切出光學膜F10X,可製造高品質的光學膜F10X。 As described above, the
本實施形態中之記錄裝置13係如第6圖(a)至(c)所示,設有遮蓋(cover)30以防止墨水i附著於兩面貼合膜F105的至少記錄區域S以外的內側之區域。第6圖(a)係從兩面貼合膜F105的上方側看遮蓋30所見之平面圖,第6圖(b)係從兩面貼合膜F105的搬送方向的上游側看遮蓋30所見之側面圖,第6圖(c)係從兩面貼合膜F105的外側看遮蓋30所見之側面圖。 As shown in FIGS. 6(a) to (c), the
具體而言,該遮蓋30係具有:遮住兩面貼合膜F105與印字頭13a相對向的空間K之中的面向兩面貼合膜F105的內側之側之第一側板部30a、遮住面向兩面貼合膜F105的搬送方向的上游側之側之第二側板部30b、以及遮住面向兩面貼合膜F105的搬送方向的下游側之側 之第三側板部30c。 Specifically, the
遮蓋30係利用螺絲鎖緊等之手段而相對於印字頭13a安裝成可裝拆。遮蓋30係使空間K之中之面向兩面貼合膜F105的外側之側開放,所以相對於印字頭13a之裝拆會變容易。 The
遮蓋30之與兩面貼合膜F105相對向的面、與兩面貼合膜F105的表面之間的間隔T最好在1mm以下。使此間隔T在1mm以下的方式,可在從印字頭13a噴出的墨水i飛散到周圍時防止該墨水i的飛散物飛散到遮蓋30的外側。 It is preferable that the space|interval T between the surface which opposes the double-sided bonding film F105 of the
墨水i的飛散物有:從印字頭13a噴出的墨水i之中例如離開資訊記錄位置而飛散到周圍之墨水i、附著到兩面貼合膜F105後飛散到周圍之墨水i等。 Among the ink i ejected from the
記錄區域S係位於在將兩面貼合膜F105貼合到上述液晶顯示面板P時與該液晶顯示面板P的顯示區域P4重疊之區域的外側。而且,記錄區域S係在貼合到上述液晶顯示面板P之前要切掉之區域。 The recording area S is located outside the area which overlaps with the display area P4 of the liquid crystal display panel P when the double-sided bonding film F105 is bonded to the liquid crystal display panel P described above. In addition, the recording area S is an area to be cut out before being attached to the liquid crystal display panel P described above.
構成遮蓋30之三個側板部30a、30b、30c之中,第一側板部30a係防止墨水i的飛散物附著到兩面貼合膜F105之與顯示區域P4重疊之區域,第二側板部30b係防止墨水i的飛散物附著到兩面貼合膜F105的搬送方向的上游側,第三側板部30c係防止墨水i的飛散物附著到兩面貼合膜F105的搬送方向的下游側。 Among the three
墨水i的飛散物會附著於遮蓋30的內面。 因此,可定期地將遮蓋30從印字頭13a拆下,進行洗淨後,再安裝到印字頭13a而重複使用。 The scattered matter of the ink i adheres to the inner surface of the
又,膜製造裝置100最好形成為具備有對兩面貼合膜F105的表面進行除電之靜電去除裝置40之構成。靜電去除裝置40係稱為電離器(ionizer)者,配置於兩面貼合膜F105的搬送方向上之比記錄裝置13(印字頭13a)靠近上游側之處。此靜電去除裝置40係在兩面貼合膜F105的寬度方向全域噴吹離子化氣體,來去除兩面貼合膜F105的表面所產生的靜電。 Moreover, it is preferable that the
藉此,膜製造裝置100防止墨水i的飛散物受到靜電的吸引而吸附到兩面貼合膜F105的表面。因此,膜製造裝置100可藉由組合上述的遮蓋30及靜電去除裝置40來更加抑制墨水i的飛散物附著到兩面貼合膜F105的表面。 Thereby, the
如以上所述,本實施形態之缺陷檢查系統10可防止由於將缺陷資訊記錄到兩面貼合膜F105之際之墨水i的飛散所造成之兩面貼合膜F105的污染。 As described above, the
本發明並非一定要限定於上述實施形態,還可在未脫離本發明的主旨之範圍內加上各種變更。 The present invention is not necessarily limited to the above-described embodiment, and various modifications can be added without departing from the gist of the present invention.
具體而言,在上述遮蓋30方面,亦可為配置上述三個側板部30a、30b、30c之中的至少第一側板部30a之構成。藉此,可防止墨水i的飛散物附著到兩面貼合膜F105之與顯示區域P4重疊之區域。 Specifically, in the above-mentioned
又,關於上述遮蓋30,亦可如第7圖所示, 採用除了上述三個側板部30a、30b、30c之外,還配置有遮住面向兩面貼合膜F105的外側之側之第四側板部30d之構成。 Moreover, as shown in FIG. 7, about the said
又,關於上述記錄裝置13,亦可如第8圖(a)、(b)所示,將安裝於印字頭13a之遮蓋31的下端部形成為合於導輥41的外形之形狀。藉此,而可使與兩面貼合膜F105之間的間隔T在1mm以下。 In addition, regarding the
又,作為本發明的另一實施形態,亦可採用如例如第9圖(a)、(b)所示之遮蓋32。此遮蓋32係由平行平板狀的板材所構成,以接近兩面貼合膜F105的狀態與兩面貼合膜F105相對向而配置。而且,在遮蓋32之面臨記錄區域S的位置設有窗部(開口部)32a。在此構成之情況下,遮蓋32遮住記錄區域S以外的區域,而可防止在兩面貼合膜F105記錄缺陷資訊之際之墨水i的飛散所造成之兩面貼合膜F105的污染。此外,遮蓋32也可設有上述的側板部30a、30b、30c、30d。亦即,此遮蓋32可構成覆蓋上述遮蓋30的底面之底板部。 Moreover, as another embodiment of this invention, the
又,上述記錄裝置13雖係形成為配置於第二缺陷檢查裝置12的下游側之構成,但亦可配置在第一缺陷檢查裝置11的下游側。在此情況下,可在進行過利用第一缺陷檢查裝置11之缺陷檢查之後,進行利用記錄裝置13之缺陷資訊的記錄。 In addition, although the said
又,關於上述記錄裝置13,並不限定於在上述的缺陷檢查後記錄缺陷資訊。還有例如,在長距離的 搬送線上,配置複數個記錄裝置,在每一定距離進行距離資訊的記錄,根據此記錄的距離資訊進行距離的修正。關於如此的進行距離資訊的記錄之記錄裝置,係例如配置於第一缺陷檢查裝置11的上游側等。 In addition, the
又,關於適合採用本發明之膜,並非一定要限定於上述的偏光膜或相位差膜、增亮膜等之光學膜,亦可將本發明擴大應用於要以記錄裝置13在其上進行記錄之膜。 In addition, the film suitable for use in the present invention is not necessarily limited to the above-mentioned optical films such as the polarizing film, retardation film, brightness enhancement film, etc., and the present invention can also be extended to the
又,本發明除了上述的噴墨方式之外,亦可擴大應用於雷射方式等之非接觸式的印字裝置及印字方法。尤其,噴墨方式容易產生墨水的氣霧,所以若光學膜發生啪啪跳動,就容易受之影響而發生印字錯誤。關於缺陷資訊也一樣,以噴墨方式列印上述的二維條碼之類的複雜資訊之情況,較容易受到光學膜的啪啪跳動的影響。 In addition to the above-described ink jet method, the present invention can also be widely applied to a non-contact printing apparatus and a printing method such as a laser method. In particular, the ink jet method tends to generate ink mist, so if the optical film bounces, it is easy to be affected by it and cause printing errors. The same is true for defect information. In the case of printing complex information such as the above-mentioned two-dimensional barcode by inkjet, it is more likely to be affected by the popping of the optical film.
10‧‧‧缺陷檢查系統 10‧‧‧Defect Inspection System
13‧‧‧記錄裝置 13‧‧‧Recording device
13a‧‧‧印字頭 13a‧‧‧Print head
153c‧‧‧第七導輥 153c‧‧‧Seventh guide roller
F105‧‧‧兩面貼合膜 F105‧‧‧Double-sided lamination film
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Also Published As
| Publication number | Publication date |
|---|---|
| JP2018146579A (en) | 2018-09-20 |
| CN108535272A (en) | 2018-09-14 |
| JP7117864B2 (en) | 2022-08-15 |
| KR102438892B1 (en) | 2022-08-31 |
| TW201903393A (en) | 2019-01-16 |
| KR20180101206A (en) | 2018-09-12 |
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