TW201824443A - Chip positioning device comprising an absolute precision marking member, a chip attachment body, an image capturing member, an attaching member, and a positioning adjustment member - Google Patents
Chip positioning device comprising an absolute precision marking member, a chip attachment body, an image capturing member, an attaching member, and a positioning adjustment member Download PDFInfo
- Publication number
- TW201824443A TW201824443A TW105143492A TW105143492A TW201824443A TW 201824443 A TW201824443 A TW 201824443A TW 105143492 A TW105143492 A TW 105143492A TW 105143492 A TW105143492 A TW 105143492A TW 201824443 A TW201824443 A TW 201824443A
- Authority
- TW
- Taiwan
- Prior art keywords
- attaching
- die
- grain
- positioning
- positioning device
- Prior art date
Links
- 239000013078 crystal Substances 0.000 claims description 30
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000002313 adhesive film Substances 0.000 description 1
- 238000012858 packaging process Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
本發明相關於一種晶粒定位裝置,特別是相關於一種具有絕對精度記號的晶粒定位裝置。The present invention relates to a grain positioning device, and more particularly, to a grain positioning device having an absolute accuracy mark.
在半導體晶圓級封裝的製程中,必須將晶圓切割成複數晶粒,再從中挑出良品,重新貼附到膠膜或基板上以進行後續的加工。貼附的過程係利用機械手臂及可移動的載台等精密設備以準確地控制晶粒的貼附位置。In the semiconductor wafer-level packaging process, the wafer must be cut into multiple dies, then good products can be picked out, and reattached to the adhesive film or substrate for subsequent processing. The attachment process uses precise equipment such as a robotic arm and a movable stage to accurately control the attachment position of the die.
然而, 傳統的晶粒定位方式係以已貼附的晶粒作為參考點,因此相鄰兩顆晶粒之間具有相對精度,但整體的晶粒貼附位置可能沒有絕對精度。若初期晶粒的貼附位置有些微誤差(例如偏離X軸、偏離Y軸或角度不正),這些誤差可能在貼附完若干晶粒後累積到可觀的程度,嚴重影響後續加工製程,並導致成本上升及良率低落。However, the traditional grain positioning method uses the attached grains as a reference point, so there is relative accuracy between two adjacent grains, but the overall grain attachment position may not have absolute accuracy. If there are some slight errors in the attachment position of the initial grain (such as deviation from the X-axis, Y-axis, or incorrect angle), these errors may accumulate to a considerable degree after attaching several grains, which seriously affects the subsequent processing and leads to Rising costs and low yields.
因此,為解決上述問題,本發明的目的即在提供一種具有絕對精度記號的晶粒定位裝置。Therefore, in order to solve the above problems, an object of the present invention is to provide a crystal grain positioning device having an absolute accuracy mark.
本發明為解決習知技術之問題所採用之技術手段係提供一種晶粒定位裝置,包含:一絕對精度記號構件,該絕對精度記號構件的表面具有一預定圖形輪廓的一絕對精度記號;一晶粒貼附體,設置於該絕對精度記號構件的表面,該晶粒貼附體具有一晶粒貼附面及一相反於該晶粒貼附面的一背面,其中該背面朝向該絕對精度記號構件,且該晶粒貼附體係為可被電磁波穿透;一影像擷取構件,於該晶粒貼附面擷取包含有該絕對精度記號的一晶粒定位用影像;一貼附構件;以及一定位調整構件,訊號連接該貼附構件及該影像擷取構件,該定位調整構件依據該晶粒定位用影像精密調整以使該貼附構件對應匹配該晶粒貼附面的一晶粒貼附位置。The technical means adopted by the present invention to solve the problems of the conventional technology is to provide a crystal grain positioning device, which includes: an absolute accuracy mark member whose surface has an absolute accuracy mark with a predetermined graphic profile; a crystal A grain attachment body is disposed on the surface of the absolute accuracy mark member. The grain attachment body has a grain attachment surface and a back surface opposite to the grain attachment surface, wherein the back surface faces the absolute accuracy mark. A component, and the die attaching system can be penetrated by electromagnetic waves; an image capturing component, which captures an image for die positioning including the absolute accuracy mark on the die attaching surface; an attaching component; And a positioning adjusting member, the signal is connected to the attaching member and the image capturing member, and the positioning adjusting member is precisely adjusted according to the grain positioning image so that the attaching member correspondingly matches a die on the die attaching surface. Attach position.
在本發明的一實施例中係提供一種晶粒定位裝置,該絕對精度記號係排列為直角座標系的複數個座標點。According to an embodiment of the present invention, a grain positioning device is provided. The absolute accuracy mark system is arranged as a plurality of coordinate points in a rectangular coordinate system.
在本發明的一實施例中係提供一種晶粒定位裝置,該絕對精度記號係呈垂直網狀。According to an embodiment of the present invention, a grain positioning device is provided, and the absolute accuracy mark is in a vertical mesh shape.
在本發明的一實施例中係提供一種晶粒定位裝置,該定位調整構件包括一控制構件及一晶粒承載調整構件,該控制構件訊號連接該晶粒承載調整構件及該貼附構件,該晶粒承載調整構件設置於該絕對精度記號構件的一相反於該表面的背面且經設置而帶動該晶粒貼附體及該絕對精度記號構件移動,該控制構件控制該貼附構件自一晶粒供應區揀取一晶粒並依據該預設晶粒貼附位置而貼附該晶粒於該晶粒貼附面。According to an embodiment of the present invention, a grain positioning device is provided. The positioning adjustment member includes a control member and a die bearing adjustment member, and the control member signals are connected to the die bearing adjustment member and the attaching member. The grain bearing adjustment member is disposed on a back of the absolute precision marking member opposite to the surface and is arranged to drive the die attachment body and the absolute precision marking member to move. The control member controls the attachment member to move from a crystal. A die supply area picks a die and attaches the die to the die attaching surface according to the preset die attach position.
在本發明的一實施例中係提供一種晶粒定位裝置,該控制構件控制該貼附構件移動到一預備置晶位置,該控制構件依據該晶粒定位用影像中的至少一個絕對精度記號的位置,透過精密調整該晶粒承載調整構件與該貼附構件的相對關係而使該貼附構件對應匹配該晶粒貼附面的該晶預設粒貼附位置。According to an embodiment of the present invention, a grain positioning device is provided. The control member controls the attaching member to move to a preliminary crystal placement position. The control member is based on at least one absolute accuracy mark in the grain positioning image. Position, by precisely adjusting the relative relationship between the die bearing adjustment member and the attaching member, the attaching member correspondingly matches the attaching position of the crystal grain on the die attaching surface.
在本發明的一實施例中係提供一種晶粒定位裝置,該控制構件經設置而透過一第二影像擷取構件擷取該貼附構件揀取該晶粒的影像以分析一位置誤差值,並依據該位置誤差值及該晶粒定位用影像精密調整以使該貼附構件對應匹配該晶粒貼附面的該預設晶粒貼附位置。According to an embodiment of the present invention, a grain positioning device is provided. The control component is configured to capture an image of the grain picked by the attached component through a second image capturing component to analyze a position error value. And according to the position error value and the grain positioning image, fine adjustment is performed so that the attaching member correspondingly matches the preset die attaching position of the die attaching surface.
在本發明的一實施例中係提供一種晶粒定位裝置,該控制構件控制該貼附構件移動到一預備置晶位置,該控制構件依據該晶粒定位用影像中的至少一個絕對精度記號及該晶粒位置誤差值,透過精密調整該晶粒承載調整構件與該貼附構件的相對關係而使該貼附構件對應匹配該晶粒貼附面的該預設晶粒貼附位置。According to an embodiment of the present invention, a grain positioning device is provided. The control member controls the attaching member to move to a preliminary crystal placement position. The control member is based on at least one absolute accuracy mark in the image for grain positioning and The grain position error value allows the attached member to match the preset die attaching position of the die attaching surface by precisely adjusting the relative relationship between the die carrying adjustment member and the attaching member.
在本發明的一實施例中係提供一種晶粒定位裝置,更包括一發光構件,經設置而朝向該晶粒貼附面發射一輔助定位光線。According to an embodiment of the present invention, a grain positioning device is further provided, which further includes a light emitting member, and is arranged to emit an auxiliary positioning light toward the die attaching surface.
在本發明的一實施例中係提供一種晶粒定位裝置,該發光構件係為可見光發光構件、紅外光發光構件、紫外光發光構件或X光發光構件。According to an embodiment of the present invention, a crystal grain positioning device is provided. The light emitting member is a visible light emitting member, an infrared light emitting member, an ultraviolet light emitting member, or an X-ray light emitting member.
經由本發明所採用之技術手段,可依據晶粒定位用影像中的絕對精度記號的位置,使各個晶粒的實際擺放位置匹配預設的晶粒貼附位置而具有絕對精度,並使各個晶粒之間也有相對精度,,因而提升晶粒貼附的精確度。According to the technical means adopted by the present invention, according to the position of the absolute accuracy mark in the grain positioning image, the actual placement position of each die can be matched with the preset die attach position to have absolute accuracy, and each There is also relative accuracy between the grains, thus improving the accuracy of the die attach.
本發明所採用的具體實施例,將藉由以下之實施例及附呈圖式作進一步之說明。The specific embodiments used in the present invention will be further explained by the following embodiments and accompanying drawings.
以下根據第1圖至第4圖,而說明本發明的實施方式。該說明並非為限制本發明的實施方式,而為本發明之實施例的一種。Hereinafter, embodiments of the present invention will be described with reference to FIGS. 1 to 4. This description is not intended to limit the embodiment of the present invention, but is an example of the embodiment of the present invention.
如第1圖及第2圖所示, 本發明一實施例的一晶粒定位裝置100包含一晶粒貼附體1、一絕對精度記號構件2、一第一影像擷取構件C1、一貼附構件6及一定位調整構件。As shown in FIG. 1 and FIG. 2, a die positioning device 100 according to an embodiment of the present invention includes a die attaching body 1, an absolute accuracy marking member 2, a first image capturing member C1, and a sticker. Attachment member 6 and a positioning adjustment member.
絕對精度記號構件2的表面21具有一預定圖形輪廓的一絕對精度記號23。如第2圖所示,絕對精度記號23為排列成直角座標系的複數個十字形座標點。然而本發明不限於此,在其他實施例中,例如如第3圖所示,絕對精度記號23a為排列成直角座標系的複數個圓點座標點。如第4圖所示,絕對精度記號23b係呈垂直網狀。The surface 21 of the absolute accuracy mark member 2 has an absolute accuracy mark 23 having a predetermined graphic contour. As shown in FIG. 2, the absolute accuracy symbol 23 is a plurality of cross-shaped coordinate points arranged in a rectangular coordinate system. However, the present invention is not limited to this. In other embodiments, for example, as shown in FIG. 3, the absolute accuracy symbol 23a is a plurality of dot coordinate points arranged in a rectangular coordinate system. As shown in FIG. 4, the absolute accuracy mark 23 b has a vertical mesh shape.
晶粒貼附體1設置於絕對精度記號構件2的表面21。晶粒貼附體1具有一晶粒貼附面11及一相反於晶粒貼附面11的一背面12,其中背面12朝向絕對精度記號構件2,且晶粒貼附體1係為可被電磁波穿透。舉例來說,晶粒貼附體1例如是透明或半透明的藍膜、UV膜或硬質的透光板,也可以是能被紅外光、紫外光或X光穿透的載體(例如塑膠),且本發明不限於此。The die attach body 1 is provided on the surface 21 of the absolute accuracy mark member 2. The die attaching body 1 has a die attaching surface 11 and a back surface 12 opposite to the die attaching surface 11, wherein the back surface 12 faces the absolute accuracy marking member 2, and the die attaching body 1 is capable of being Electromagnetic waves penetrate. For example, the die attach body 1 is, for example, a transparent or translucent blue film, a UV film, or a rigid transparent plate, or a carrier (such as plastic) that can be penetrated by infrared, ultraviolet, or X-rays. And the present invention is not limited to this.
第一影像擷取構件C1於晶粒貼附面11擷取包含有絕對精度記號23的一晶粒定位用影像。The first image capturing component C1 captures an image for crystal grain positioning including the absolute accuracy mark 23 on the crystal grain attaching surface 11.
定位調整構件訊號連接貼附構件6及第一影像擷取構件C1。定位調整構件依據該晶粒定位用影像精密調整以使該貼附構件對應匹配晶粒貼附面11的一預設晶粒貼附位置。The positioning adjustment member signal is connected to the attachment member 6 and the first image capturing member C1. The positioning adjustment member is precisely adjusted according to the crystal positioning image so that the attaching member corresponds to a preset crystal attaching position of the crystal attaching surface 11.
詳細來說,在本實施例中,定位調整構件包括一控制構件31及一晶粒承載調整構件32,控制構件31訊號連接晶粒承載調整構件32及貼附構件6。晶粒承載調整構件32設置於絕對精度記號構件2的一相反於表面21的背面22,經設置而一起帶動晶粒貼附體1及絕對精度記號構件2移動(例如在第1圖中平行圖面地上下移動,或垂直圖面地前後移動),也可以旋轉移動以調整角度。控制構件31控制貼附構件6自一晶粒供應區揀取一晶粒D,並控制貼附構件6及/或晶粒承載調整構件32相對移動到一預備置晶位置。由於機械震動、溫度變化、或其他產生誤差的因素等的影響,導致該預備置晶位置往往與理想的預設晶粒貼附位置有落差,因此控制構件31依據該晶粒定位用影像中的至少一個絕對精度記號23的位置,透過精密調整晶粒承載調整構件32與貼附構件6的相對關係而使貼附構件6對應匹配晶粒貼附面11的該預設晶粒貼附位置。如此,可使各個晶粒D的實際擺放位置匹配該預設晶粒貼附位置而具有絕對精度,各個晶粒D之間也有相對精度,因而可使複數個晶粒D在晶粒貼附面11上排列整齊。In detail, in this embodiment, the positioning adjustment member includes a control member 31 and a die load adjustment member 32, and the control member 31 is connected to the die load adjustment member 32 and the attachment member 6 by signals. The die bearing adjustment member 32 is provided on the back 22 of the absolute precision mark member 2 opposite to the surface 21, and is arranged to move the die attach body 1 and the absolute precision mark member 2 together (for example, a parallel view in FIG. 1). Move up and down, or move back and forth vertically, or rotate to adjust the angle. The control member 31 controls the attaching member 6 to pick a die D from a die supply area, and controls the relative movement of the attaching member 6 and / or the die load adjusting member 32 to a preliminary die placement position. Due to the effects of mechanical vibration, temperature changes, or other factors that cause errors, the prepared crystal placement position is often different from the ideal preset die attachment position. Therefore, the control member 31 uses the The position of the at least one absolute accuracy mark 23 is adapted to match the predetermined die attaching position of the die attaching surface 11 by precisely adjusting the relative relationship between the die bearing adjustment member 32 and the attaching member 6. In this way, the actual placement position of each die D can be matched with the preset die attachment position with absolute accuracy, and there is relative accuracy between each die D, so that a plurality of die D can be attached to the die. The surface 11 is neatly arranged.
進一步地,在本實施例中,貼附構件6可包括一吸取式的機械手臂。在另一個實施例中,控制構件31可依據該晶粒定位用影像中的至少一個絕對精度記號23的位置,透過精密調整貼附構件6以使貼附構件6對應匹配該預設晶粒貼附位置。Further, in this embodiment, the attachment member 6 may include a suction-type robot arm. In another embodiment, the control member 31 can precisely adjust the attaching member 6 according to the position of at least one absolute accuracy mark 23 in the grain positioning image to make the attaching member 6 correspondingly match the preset die attach. Attached location.
進一步地,由於機械震動、溫度變化、或其他產生誤差的因素等的影響,導致該預備置晶位置往往與理想的預設晶粒貼附位置有落差。控制構件31經設置而透過一第二影像擷取構件C2擷取貼附構件6揀取該晶粒D的影像以分析一位置誤差值,控制構件31控制貼附構件6移動到一預備置晶位置,控制構件31依據該位置誤差值及該晶粒定位用影像中的至少一個絕對精度記號23,透過精密調整晶粒承載調整構件32與貼附構件6的相對關係而使貼附構件6對應匹配晶粒貼附面11的該預設晶粒貼附位置。Further, due to the effects of mechanical vibration, temperature change, or other factors that cause errors, the prepared crystal placement position often differs from the ideal preset die attachment position. The control member 31 is set to capture the image of the die D through a second image capture member C2 to pick up the image of the die D to analyze a position error value. The control member 31 controls the attachment member 6 to move to a pre-set crystal. Position, the control member 31 corresponds to the attachment member 6 by precisely adjusting the relative relationship between the die load adjustment member 32 and the attachment member 6 according to the position error value and at least one absolute accuracy symbol 23 in the grain positioning image The predetermined die attaching position of the die attaching surface 11 is matched.
進一步地,晶粒定位裝置100更包括一發光構件4,經設置而朝向晶粒貼附面11發射一輔助定位光線L,以供C1擷取影像,輔助控制構件31控制定位調整構件調整該預設晶粒貼附位置。發光構件4係為可見光發光構件、紅外光發光構件、紫外光發光構件或X光發光構件。Further, the die positioning device 100 further includes a light-emitting member 4 configured to emit an auxiliary positioning light L toward the die attaching surface 11 for C1 to capture an image, and the auxiliary control member 31 controls the positioning adjustment member to adjust the preliminarily. Set the die attach position. The light emitting member 4 is a visible light emitting member, an infrared light emitting member, an ultraviolet light emitting member, or an X-ray light emitting member.
綜上所述,本發明的晶粒定位裝置相對於先前技術,可使晶粒與晶粒之間、晶粒與晶粒貼附體整體具有絕對精度,因而提升晶粒貼附的精確度。In summary, compared with the prior art, the crystal grain positioning device of the present invention can make the crystal grains and crystal grains, and the crystal grain and the crystal grain attachment body have absolute accuracy, thereby improving the accuracy of crystal grain attachment.
以上之敘述以及說明僅為本發明之較佳實施例之說明,對於此項技術具有通常知識者當可依據以下所界定申請專利範圍以及上述之說明而作其他之修改,惟此些修改仍屬於本發明之發明精神而在本發明之權利範圍中。The above descriptions and descriptions are merely illustrations of the preferred embodiments of the present invention. Those with ordinary knowledge of this technology should make other modifications based on the scope of the patent application as defined below and the above description, but these modifications still belong to The spirit of the invention is within the scope of the invention.
100‧‧‧晶粒定位裝置 100‧‧‧ Grain positioning device
1‧‧‧晶粒貼附體 1‧‧‧ Grain Attachment
11‧‧‧晶粒貼附面 11‧‧‧ die attach surface
12‧‧‧背面 12‧‧‧ back
2‧‧‧絕對精度記號構件 2‧‧‧ Absolute accuracy mark component
21‧‧‧表面 21‧‧‧ surface
22‧‧‧背面 22‧‧‧ back
23‧‧‧絕對精度記號 23‧‧‧ absolute accuracy mark
23a‧‧‧絕對精度記號 23a‧‧‧ absolute accuracy mark
23b‧‧‧絕對精度記號 23b‧‧‧ absolute accuracy mark
31‧‧‧控制構件 31‧‧‧Control component
32‧‧‧晶粒承載調整構件 32‧‧‧ Grain load adjustment member
4‧‧‧發光構件 4‧‧‧Light-emitting components
6‧‧‧貼附構件 6‧‧‧ Attachment
C1‧‧‧第一影像擷取構件 C1‧‧‧First image capture component
C2‧‧‧第二影像擷取構件 C2‧‧‧Second image capture component
D‧‧‧晶粒 D‧‧‧ Grain
L‧‧‧輔助定位光線 L‧‧‧ auxiliary positioning light
第1圖為顯示根據本發明一實施例的晶粒定位裝置之示意圖。 第2圖為顯示根據本發明的實施例的絕對精度記號構件之示意圖。 第3圖為顯示根據本發明另一實施例的絕對精度記號構件之示意圖。 第4圖為顯示根據本發明另一實施例的絕對精度記號構件之示意圖。FIG. 1 is a schematic diagram showing a die positioning device according to an embodiment of the present invention. FIG. 2 is a schematic diagram showing an absolute accuracy mark member according to an embodiment of the present invention. FIG. 3 is a schematic diagram showing an absolute accuracy marking member according to another embodiment of the present invention. FIG. 4 is a schematic diagram showing an absolute accuracy mark member according to another embodiment of the present invention.
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW105143492A TWI602260B (en) | 2016-12-28 | 2016-12-28 | Chip positioning device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW105143492A TWI602260B (en) | 2016-12-28 | 2016-12-28 | Chip positioning device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI602260B TWI602260B (en) | 2017-10-11 |
| TW201824443A true TW201824443A (en) | 2018-07-01 |
Family
ID=61010963
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW105143492A TWI602260B (en) | 2016-12-28 | 2016-12-28 | Chip positioning device |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI602260B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110880468A (en) * | 2019-11-26 | 2020-03-13 | 深圳市矽电半导体设备有限公司 | Method for aligning core particles to sorting membrane and core particle sorting method |
| CN111086906A (en) * | 2019-11-26 | 2020-05-01 | 矽电半导体设备(深圳)股份有限公司 | Position correction method for placing core particles on sorting film and core particle sorting method |
| TWI755129B (en) * | 2020-10-30 | 2022-02-11 | 梭特科技股份有限公司 | A chip pick-and-place transfer device and method for chip positioning thereof |
| CN114496831A (en) * | 2020-10-27 | 2022-05-13 | 均华精密工业股份有限公司 | Positioning system and positioning device of die bonder and die placing method of die bonder |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110933927B (en) * | 2018-09-20 | 2021-05-14 | 梭特科技股份有限公司 | Die attaching position positioning device capable of improving mask contrast |
| CN111446151A (en) * | 2020-03-27 | 2020-07-24 | 绍兴同芯成集成电路有限公司 | Method for transferring crystal grains to blue film in batches after crystal grains are cut |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5277266B2 (en) * | 2011-02-18 | 2013-08-28 | 株式会社日立ハイテクインスツルメンツ | Die bonder and semiconductor manufacturing method |
| TWI498993B (en) * | 2011-11-09 | 2015-09-01 | I Hsing Tsai | Automatic positioning method of the first die |
-
2016
- 2016-12-28 TW TW105143492A patent/TWI602260B/en active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110880468A (en) * | 2019-11-26 | 2020-03-13 | 深圳市矽电半导体设备有限公司 | Method for aligning core particles to sorting membrane and core particle sorting method |
| CN111086906A (en) * | 2019-11-26 | 2020-05-01 | 矽电半导体设备(深圳)股份有限公司 | Position correction method for placing core particles on sorting film and core particle sorting method |
| CN114496831A (en) * | 2020-10-27 | 2022-05-13 | 均华精密工业股份有限公司 | Positioning system and positioning device of die bonder and die placing method of die bonder |
| CN114496831B (en) * | 2020-10-27 | 2025-07-04 | 均华精密工业股份有限公司 | Positioning system and positioning device of die bonding machine and method for placing die of die bonding machine |
| TWI755129B (en) * | 2020-10-30 | 2022-02-11 | 梭特科技股份有限公司 | A chip pick-and-place transfer device and method for chip positioning thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI602260B (en) | 2017-10-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI602260B (en) | Chip positioning device | |
| US11062964B2 (en) | Method for manufacturing semiconductor device, and mounting apparatus | |
| CN102646572B (en) | Die bonder and semiconductor manufacturing method | |
| TWI712351B (en) | Apparatus and method for semiconductor device bonding and mechanism for aligning a plurality of semiconductor devices | |
| JP6212507B2 (en) | Cutting apparatus and cutting method | |
| TWI649820B (en) | Semiconductor manufacturing device and method for manufacturing semiconductor device | |
| JP6787612B2 (en) | Devices and methods for positioning the first object with respect to the second object | |
| JP2016015438A (en) | Alignment method | |
| JP5344145B2 (en) | Method for aligning electronic component and substrate in bonding apparatus | |
| CN112771652B (en) | Bare die attach system and method for integrated accuracy verification and calibration using the system | |
| CN113380661A (en) | Chip mounting device and method for manufacturing semiconductor device | |
| KR102186384B1 (en) | Die bonding apparatus and manufacturing method of semiconductor device | |
| CN111834254A (en) | Processing device and processing method of workpiece | |
| JP2015190826A (en) | Substrate inspection device | |
| KR20190042419A (en) | Semiconductor manufacturing device and manufacturing method of semiconductor device | |
| CN108807230B (en) | Method for accurately calibrating working position of suction head of sorting machine | |
| JP2015195261A (en) | Die bonder and semiconductor manufacturing method | |
| JP6259616B2 (en) | Die bonder and semiconductor manufacturing method | |
| TWI755129B (en) | A chip pick-and-place transfer device and method for chip positioning thereof | |
| CN112867386B (en) | Automatic chip mounting device, suction nozzle thereof and automatic chip mounting method | |
| CN108986167B (en) | Correction method of crystal setting equipment and crystal setting equipment using same | |
| US20250149498A1 (en) | Position alignment device, position alignment method, bonding device, bonding method, and method for manufacturing semiconductor device | |
| TW202601858A (en) | Die bonding method using two-dimensional optical ruler to adjust position of die bonding device | |
| CN115376982A (en) | Positioning device, die bonder and positioning correction method | |
| TW201903929A (en) | Method for correcting chip apparatus and chip apparatus using the method |