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TW201735984A - Desiccant, sealing structure and organic electroluminescent device effectively suppressing the occurrence of black spots in organic electroluminescent device for a longer period of time - Google Patents

Desiccant, sealing structure and organic electroluminescent device effectively suppressing the occurrence of black spots in organic electroluminescent device for a longer period of time Download PDF

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TW201735984A
TW201735984A TW105142000A TW105142000A TW201735984A TW 201735984 A TW201735984 A TW 201735984A TW 105142000 A TW105142000 A TW 105142000A TW 105142000 A TW105142000 A TW 105142000A TW 201735984 A TW201735984 A TW 201735984A
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oxide particles
desiccant
particles
organic
layer
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TW105142000A
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TWI671113B (en
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梶山力
保科有佑
稗田茂
高倉佳江
米澤禎久
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双葉電子工業股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D53/00Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
    • B01D53/26Drying gases or vapours
    • B01D53/28Selection of materials for use as drying agents
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/84Passivation; Containers; Encapsulations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/84Passivation; Containers; Encapsulations
    • H10K50/842Containers
    • H10K50/8426Peripheral sealing arrangements, e.g. adhesives, sealants
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/84Passivation; Containers; Encapsulations
    • H10K50/846Passivation; Containers; Encapsulations comprising getter material or desiccants
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D2257/00Components to be removed
    • B01D2257/80Water
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K2102/00Constructional details relating to the organic devices covered by this subclass
    • H10K2102/301Details of OLEDs
    • H10K2102/302Details of OLEDs of OLED structures

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electroluminescent Light Sources (AREA)
  • Drying Of Gases (AREA)

Abstract

The present invention discloses a desiccant, containing adhesive resin and oxide particles dispersed in the adhesive resin. At least a portion of the oxide particles transform into secondary particles. The secondary particles comprise a plurality of primary particles. The average particle size of the oxide particles is lower than 4μm. The specific surface area of the oxide particles is 5 m2/g to 60 m2/g.

Description

乾燥劑、密封結構及有機電致發光元件Desiccant, sealing structure and organic electroluminescent element

本發明涉及一種乾燥劑、密封結構及有機電致發光元件。The present invention relates to a desiccant, a sealing structure and an organic electroluminescent element.

有機EL(Electroluminescence:電致發光)元件一般具有發光部,該發光部包含:含有有機發光材料的薄膜也就是有機層、夾持該有機層的一對電極。有機EL元件是透過向薄膜注入電洞(hole)及電子並使其再結合,而產生激子(exciton)並且利用該激子去活化時放射出的光(螢光或磷光)的自發光元件。The organic EL (Electroluminescence) element generally has a light-emitting portion including a film containing an organic light-emitting material, that is, an organic layer, and a pair of electrodes sandwiching the organic layer. The organic EL element is a self-luminous element that emits light (fluorescent or phosphorescent) by injecting a hole and an electron into a thin film and recombining it to generate an exciton and deactivating the exciton. .

關於有機EL元件,被期待著防止被稱作黑點的有機層的非發光部的產生和成長。作為產生黑點的主要原因,已知水分及氧氣的影響較大,尤其即使存在微量的水分也會對黑點的產生帶來很大的影響。Regarding the organic EL element, it is expected to prevent the generation and growth of the non-light-emitting portion of the organic layer called a black dot. As a main cause of black spots, it is known that water and oxygen have a large influence, and even if a trace amount of water is present, it has a great influence on the generation of black spots.

因此,人們對防止水分及氧氣侵入有機EL元件的方法進行了各種研究。例如,提出有將有機層以及電極密封在乾燥的惰性氣體環境的氣密容器內,並將乾燥劑封入於氣密容器內的中空密封結構。例如,專利文獻1中揭示有一種有機EL元件,其在密封蓋的內表面具備乾燥劑含有層,該乾燥劑含有層包含五氧化二磷的粉末與低溫固化型環氧系黏接劑。Therefore, various studies have been conducted on a method of preventing moisture and oxygen from intruding into an organic EL element. For example, a hollow sealing structure in which an organic layer and an electrode are sealed in an airtight container in a dry inert gas atmosphere and a desiccant is enclosed in an airtight container is proposed. For example, Patent Document 1 discloses an organic EL device having a desiccant-containing layer on the inner surface of a sealing cover, the desiccant-containing layer containing a powder of phosphorus pentoxide and a low-temperature curing epoxy-based adhesive.

另一方面,作為除溼劑,有時利用生石灰(氧化鈣)。例如,在專利文獻2中記載有,生石灰較佳為包含50質量%以上之粒徑為75μm以上的顆粒。On the other hand, as a dehumidifying agent, quicklime (calcium oxide) is sometimes used. For example, Patent Document 2 discloses that quicklime preferably contains 50% by mass or more of particles having a particle diameter of 75 μm or more.

(專利文獻) 專利文獻1:日本特開2001-035659號公報。 專利文獻2:日本特開2005-335987號公報。(Patent Document) Patent Document 1: Japanese Laid-Open Patent Publication No. 2001-035659. Patent Document 2: Japanese Laid-Open Patent Publication No. 2005-335987.

本發明的主要目的在於提供一種乾燥劑,其能夠在更長時間中有效地抑制有機EL元件產生黑點。A main object of the present invention is to provide a desiccant capable of effectively suppressing generation of black spots of an organic EL element for a longer period of time.

在本發明的其中一個方面中提供一種乾燥劑,其包含黏合劑樹脂和分散於黏合劑樹脂中的氧化物顆粒,氧化物顆粒的至少一部分形成包含複數個一次顆粒的二次顆粒,氧化物顆粒的平均粒徑為4μm以下,氧化物顆粒的比表面積為5~60m2 /g。根據上述乾燥劑,能夠在更長時間中有效地抑制有機EL元件產生黑點。In one aspect of the invention, there is provided a desiccant comprising a binder resin and oxide particles dispersed in a binder resin, at least a portion of the oxide particles forming secondary particles comprising a plurality of primary particles, oxide particles The average particle diameter is 4 μm or less, and the specific surface area of the oxide particles is 5 to 60 m 2 /g. According to the above desiccant, black spots can be effectively suppressed from occurring in the organic EL element for a longer period of time.

本發明還可以提供一種組合物,該組合物使用來作為乾燥劑(應用),使用來製備乾燥劑(應用),前述組合物包含黏合劑樹脂和分散於黏合劑樹脂中的氧化物顆粒,氧化物顆粒的至少一部分形成包含複數個一次顆粒的二次顆粒,氧化物顆粒的平均粒徑為4μm以下,氧化物顆粒的比表面積為5~60m2 /g。The present invention can also provide a composition for use as a desiccant (application) for preparing a desiccant (application) comprising a binder resin and oxide particles dispersed in a binder resin, oxidizing At least a portion of the particles form a secondary particle comprising a plurality of primary particles, the oxide particles having an average particle diameter of 4 μm or less, and the oxide particles having a specific surface area of 5 to 60 m 2 /g.

並且,前述氧化物顆粒的比表面積亦可為5~35m2 /g。若氧化物顆粒的比表面積在上述範圍中,則能夠提高乾燥劑的捕水性能。基於相同觀點,黏合劑樹脂亦可包含矽酮樹脂。Further, the oxide particles may have a specific surface area of 5 to 35 m 2 /g. When the specific surface area of the oxide particles is in the above range, the water catching performance of the desiccant can be improved. The binder resin may also contain an anthrone resin based on the same viewpoint.

在本發明的另一方面中提供一種密封結構,其具備:彼此對置配置的一對基板;密封劑,其密封前述一對基板的外周部;乾燥劑層,其在密封劑的內側且被設置於前述一對基板之間,並且包含前述乾燥劑。According to another aspect of the present invention, a sealing structure including: a pair of substrates disposed to face each other; a sealant that seals an outer peripheral portion of the pair of substrates; and a desiccant layer on the inner side of the sealant It is disposed between the pair of substrates and includes the aforementioned desiccant.

在本發明的又一方面中提供一種有機EL元件,其具備:元件基板;密封基板,其相對於元件基板而被對置配置;密封劑,其密封元件基板以及密封基板的外周部;層疊體,其在密封劑的內側且被設置於前述元件基板之上,並且具有有機層以及夾持該有機層的一對電極;乾燥劑層,其在密封劑的內側且被設置於密封基板上,並且包含前述乾燥劑。According to still another aspect of the invention, there is provided an organic EL device comprising: an element substrate; a sealing substrate disposed opposite to the element substrate; a sealant sealing the element substrate and an outer peripheral portion of the sealing substrate; and a laminate Provided on the inner side of the sealant and disposed on the element substrate, and having an organic layer and a pair of electrodes sandwiching the organic layer; a desiccant layer on the inner side of the sealant and disposed on the sealing substrate, And including the aforementioned desiccant.

根據本發明的一個方面所涉及的乾燥劑,能夠在更長時間中有效地抑制有機EL元件產生黑點。因為氧化物顆粒分散於黏合劑樹脂中,所以能夠均勻地分散配置作為捕水成分的氧化物顆粒。According to the desiccant according to an aspect of the invention, it is possible to effectively suppress the generation of black spots of the organic EL element for a longer period of time. Since the oxide particles are dispersed in the binder resin, the oxide particles as the water-trapping component can be uniformly dispersed.

以下,對本發明的實施型態進行詳細說明。但是,本發明不只限於以下實施型態。Hereinafter, embodiments of the present invention will be described in detail. However, the present invention is not limited to the following embodiments.

在本說明書中,“一次顆粒”是指,從表觀上的幾何學形態來判斷時一體地形成為單一顆粒的顆粒。“二次顆粒”包括複數個一次顆粒。通常,會透過聚集複數個一次顆粒而形成二次顆粒。In the present specification, "primary particles" means particles which are integrally formed into a single particle when judged from an apparent geometric form. "Secondary particles" include a plurality of primary particles. Usually, secondary particles are formed by aggregating a plurality of primary particles.

(乾燥劑) 一實施型態的乾燥劑包括:黏合劑樹脂和分散在黏合劑樹脂中的氧化物顆粒。(Drying Agent) An embodiment of the desiccant comprises: a binder resin and oxide particles dispersed in the binder resin.

[氧化物顆粒] 乾燥劑中所含的氧化物顆粒的至少一部分形成包括複數個一次顆粒的二次顆粒。氧化物顆粒形成二次顆粒的情況例如可以透過掃描電子顯微鏡(SEM)等觀察氧化物顆粒而進行確認。在乾燥劑中所含的氧化物顆粒中,可以例如有10~100質量%或者50~100質量%形成二次顆粒。根據本發明人等的見解,氧化物顆粒形成二次顆粒的情形有助於抑制黑點的產生。並且,形成二次顆粒的氧化物顆粒難以成為大體積,其有助於以更小體積的乾燥劑來實現充分的捕水性能。[Oxide Particles] At least a part of the oxide particles contained in the desiccant form secondary particles including a plurality of primary particles. When the oxide particles form secondary particles, for example, it can be confirmed by observing oxide particles by a scanning electron microscope (SEM) or the like. In the oxide particles contained in the desiccant, for example, 10 to 100% by mass or 50 to 100% by mass of the secondary particles may be formed. According to the findings of the present inventors, the case where the oxide particles form secondary particles contributes to suppressing the generation of black spots. Also, it is difficult for the oxide particles forming the secondary particles to become large in volume, which contributes to achieving sufficient water trapping performance with a smaller volume of desiccant.

氧化物顆粒的平均粒徑可以是4μm以下。若氧化物顆粒的平均粒徑為4μm以下,則有助於抑制有機EL元件產生黑點。基於相同觀點,氧化物顆粒的平均粒徑也可以是3.9μm以下或3.8μm以下。氧化物顆粒的平均粒徑的下限並不受特別限制,例如可以是0.5μm以上或1μm以上。例如,可以透過調整氧化物顆粒的煆燒溫度、煆燒時間、粉碎條件等而控制氧化物顆粒的平均粒徑。The average particle diameter of the oxide particles may be 4 μm or less. When the average particle diameter of the oxide particles is 4 μm or less, it is helpful to suppress generation of black spots in the organic EL element. From the same viewpoint, the average particle diameter of the oxide particles may be 3.9 μm or less or 3.8 μm or less. The lower limit of the average particle diameter of the oxide particles is not particularly limited, and may be, for example, 0.5 μm or more or 1 μm or more. For example, the average particle diameter of the oxide particles can be controlled by adjusting the calcination temperature, the calcination time, the pulverization conditions, and the like of the oxide particles.

在本說明書中,氧化物顆粒的平均粒徑是指,用動態光散射粒徑分析儀測量到的體積分佈的中位數。該平均粒徑是包括一次顆粒以及二次顆粒在內的氧化物顆粒整體的平均粒徑,且該平均粒徑是使用將氧化物顆粒分散於規定的分散劑中而調製出的分散液來進行測量。In the present specification, the average particle diameter of the oxide particles means the median of the volume distribution measured by a dynamic light scattering particle size analyzer. The average particle diameter is an average particle diameter of the entire oxide particles including the primary particles and the secondary particles, and the average particle diameter is obtained by dispersing the oxide particles in a predetermined dispersant. measuring.

氧化物顆粒的一次顆粒的平均粒徑並不受特別限制,例如可以是0.5μm以下或0.1μm以下。氧化物顆粒的一次顆粒的平均粒徑也可以是0.01μm以上。氧化物顆粒的一次顆粒的平均粒徑,可以是利用電子顯微鏡等觀察氧化物顆粒時,在觀察視野中存在的一次顆粒的粒徑(最大寬度)的平均值。The average particle diameter of the primary particles of the oxide particles is not particularly limited, and may be, for example, 0.5 μm or less or 0.1 μm or less. The average particle diameter of the primary particles of the oxide particles may be 0.01 μm or more. The average particle diameter of the primary particles of the oxide particles may be an average value of the particle diameter (maximum width) of the primary particles existing in the observation field when the oxide particles are observed by an electron microscope or the like.

氧化物顆粒包含可對氧化物顆粒賦予捕水性能的無機氧化物。以氧化物顆粒的質量為基準,氧化物顆粒通常包含80質量%以上或者90質量%以上的無機氧化物。乾燥劑可以包含一種氧化物顆粒或者成分不同的兩種以上的氧化物顆粒。氧化物顆粒例如包含選自由五氧化二磷(P4 O10 )、氧化鎂(MgO)、氧化鈣(CaO)、氧化鍶(SrO)、氧化鋇(BaO)以及氧化鋁(Al2 O3 )構成的群組中的至少一種無機氧化物。氧化物顆粒也可以包含選自由氧化鎂、氧化鈣、氧化鍶以及氧化鋇構成的群組中的至少一種鹼土族金屬氧化物,也可以包含氧化鈣。The oxide particles comprise an inorganic oxide that imparts water trapping properties to the oxide particles. The oxide particles usually contain 80% by mass or more or 90% by mass or more of the inorganic oxide based on the mass of the oxide particles. The desiccant may contain one oxide particle or two or more oxide particles different in composition. The oxide particles include, for example, selected from the group consisting of phosphorus pentoxide (P 4 O 10 ), magnesium oxide (MgO), calcium oxide (CaO), strontium oxide (SrO), barium oxide (BaO), and aluminum oxide (Al 2 O 3 ). At least one inorganic oxide in the group formed. The oxide particles may also contain at least one alkaline earth metal oxide selected from the group consisting of magnesium oxide, calcium oxide, cerium oxide, and cerium oxide, and may also contain calcium oxide.

氧化物顆粒的比表面積為5~60m2 /g,也可以是5~35 m2 /g。若比表面積為5~60m2 /g,則乾燥劑能夠具有更加優異的捕水性能。基於相同觀點,氧化物顆粒的比表面積可以是10m2 /g以上或者15m2 /g以上,也可以是50m2 /g以下、40m2 /g以下或者35m2 /g以下。The specific surface area of the oxide particles is 5 to 60 m 2 /g, and may be 5 to 35 m 2 /g. If the specific surface area is 5 to 60 m 2 /g, the desiccant can have more excellent water trapping performance. From the same viewpoint, the specific surface area of the oxide particles may be 10 m 2 /g or more or 15 m 2 /g or more, or may be 50 m 2 /g or less, 40 m 2 /g or less, or 35 m 2 /g or less.

在本說明書中,氧化物顆粒的比表面積是指,包括一次顆粒以及二次顆粒在內的氧化物顆粒的總體的比表面積,是透過BET法進行測定的。In the present specification, the specific surface area of the oxide particles means the total specific surface area of the oxide particles including the primary particles and the secondary particles, which are measured by the BET method.

氧化物顆粒在乾燥劑中的含量可以是乾燥劑總質量的10質量%以上、20質量%以上或30質量%以上。氧化物顆粒的含量也可以是80質量%以下、70質量%以下或60質量%以下。The content of the oxide particles in the desiccant may be 10% by mass or more, 20% by mass or more, or 30% by mass or more based on the total mass of the desiccant. The content of the oxide particles may be 80% by mass or less, 70% by mass or less, or 60% by mass or less.

包含氧化鈣的氧化物顆粒例如可以透過如下方法獲得,該方法依序包括如下步驟:對生石灰(CaO)進行氫氧化處理而獲得熟石灰(Ca(OH)2 )、對熟石灰進行煆燒而獲得生石灰以及將生石灰粉碎。對熟石灰進行煆燒的溫度可以是300~600℃。煆燒時間可以是1~20小時。The oxide particles containing calcium oxide can be obtained, for example, by the following steps, which comprise the steps of: oxidizing lime (CaO) to obtain slaked lime (Ca(OH) 2 ), and calcining the hydrated lime to obtain quicklime And crushing the quicklime. The temperature at which the slaked lime is calcined may be 300 to 600 °C. The simmering time can be 1 to 20 hours.

透過粉碎生石灰,能夠將氧化物顆粒的平均粒徑調整為所希望的範圍。例如,可以將生石灰分散在庚烷等溶劑中並用球磨機等進行粉碎。By pulverizing the quicklime, the average particle diameter of the oxide particles can be adjusted to a desired range. For example, the quicklime may be dispersed in a solvent such as heptane and pulverized by a ball mill or the like.

包含氧化鈣的氧化物顆粒的一次顆粒的直徑,具有依存於熟石灰的一次顆粒的傾向。透過對生石灰進行氫氧化處理,能夠將氧化物顆粒的一次顆粒的直徑調整為所希望的範圍。The diameter of the primary particles of the oxide particles containing calcium oxide has a tendency to depend on primary particles of slaked lime. By subjecting the quicklime to a hydrogenation treatment, the diameter of the primary particles of the oxide particles can be adjusted to a desired range.

[黏合劑樹脂] 黏合劑樹脂只要能夠分散氧化物顆粒即可,並不受特別限制。在與氧化物顆粒進行混合時,可以使用能夠形成糊劑的黏合劑樹脂。透過使用乾燥劑的糊劑,能夠容易形成氧化物顆粒均勻分散的乾燥劑層。[Binder Resin] The binder resin is not particularly limited as long as it can disperse oxide particles. When mixing with the oxide particles, a binder resin capable of forming a paste can be used. By using a paste of a desiccant, a desiccant layer in which oxide particles are uniformly dispersed can be easily formed.

黏合劑樹脂例如可以包含選自由聚氯乙烯樹脂、酚醛樹脂、矽酮樹脂、環氧樹脂、聚酯樹脂、氨基甲酸乙酯樹脂、丙烯樹脂以及烯烴樹脂構成的群組中的至少一種樹脂。黏合劑樹脂也可以包含矽酮樹脂。The binder resin may, for example, comprise at least one resin selected from the group consisting of polyvinyl chloride resins, phenol resins, anthrone resins, epoxy resins, polyester resins, urethane resins, propylene resins, and olefin resins. The binder resin may also contain an anthrone resin.

乾燥劑中的氧化物顆粒和黏合劑樹脂的質量比並不受特別限制,可以是1:4~4:1或1:2~2:1。若氧化物顆粒和黏合劑樹脂的質量比在上述範圍內,則有著能夠容易形成後述的乾燥劑層的傾向。The mass ratio of the oxide particles to the binder resin in the desiccant is not particularly limited and may be 1:4 to 4:1 or 1:2 to 2:1. When the mass ratio of the oxide particles and the binder resin is within the above range, the desiccant layer described later tends to be easily formed.

乾燥劑除了氧化物顆粒以及黏合劑樹脂之外還可以包含例如有機金屬化合物、固化性樹脂等成分。The desiccant may contain, for example, an organic metal compound or a curable resin in addition to the oxide particles and the binder resin.

乾燥劑可以透過包括將氧化物顆粒和黏合劑樹脂進行混合的步驟在內的方法來製造出。上述混合動作可以透過離心分離等來進行。離心分離的旋轉速度例如可以為100~3000轉/分鐘。離心分離的時間可以為1~60分鐘。The desiccant can be produced by a method including a step of mixing the oxide particles and the binder resin. The above mixing operation can be carried out by centrifugal separation or the like. The rotational speed of the centrifugal separation may be, for example, 100 to 3000 rpm. The centrifugation time can be from 1 to 60 minutes.

(密封結構) 本實施型態的密封結構具備彼此對置配置的一對基板、密封前述一對基板的外周部的密封劑以及在密封劑的內側且被設置於前述一對基板之間的乾燥劑層。乾燥劑層可以包含上述實施型態所涉及的乾燥劑。乾燥劑層可以填充被密封的空間(前述一對基板之間且在密封劑內側的空間)。(Sealing Structure) The sealing structure of the present embodiment includes a pair of substrates disposed to face each other, a sealant that seals the outer peripheral portions of the pair of substrates, and a drying agent disposed inside the sealant between the pair of substrates Agent layer. The desiccant layer may contain the desiccant according to the above embodiment. The desiccant layer may fill the sealed space (the space between the pair of substrates and inside the sealant).

本實施型態的密封結構,特別適合利用在要對容易受水分影響的設備進行封裝時。作為這種設備,例如可例舉出有機EL元件、有機半導體、有機太陽電池等有機電子設備。The sealing structure of this embodiment is particularly suitable for use when packaging a device that is susceptible to moisture. As such a device, for example, an organic electronic device such as an organic EL device, an organic semiconductor, or an organic solar cell can be exemplified.

(有機EL元件) 第1圖是表示有機EL元件的一種實施型態的示意剖視圖。第1圖所示的有機EL元件1是所謂的中空密封結構的有機EL元件,且由以下部分所構成:元件基板2、相對於元件基板2被對置配置的密封基板3、被設置在元件基板2之上的層疊體(該層疊體具有有機層4以及夾持該有機層4的陽極5和陰極6)、密封元件基板2以及密封基板3的外周部的密封劑8、在密封劑8的內側且被設置於密封基板3上的乾燥劑層7。乾燥劑層7可以包含上述實施型態的乾燥劑。(Organic EL Element) Fig. 1 is a schematic cross-sectional view showing an embodiment of an organic EL element. The organic EL element 1 shown in Fig. 1 is an organic EL element having a so-called hollow sealing structure, and is composed of an element substrate 2, a sealing substrate 3 opposed to the element substrate 2, and a device a laminate on the substrate 2 (the laminate has an organic layer 4 and an anode 5 and a cathode 6 sandwiching the organic layer 4), a sealing agent 8 for sealing the element substrate 2 and an outer peripheral portion of the sealing substrate 3, and a sealant 8 The inner side of the desiccant layer 7 is provided on the sealing substrate 3. The desiccant layer 7 may contain the desiccant of the above embodiment.

在有機EL元件1中,除了乾燥劑層7以外的要件均可以使用先前習知的結構。下面對有機EL元件1的一例進行簡單說明。In the organic EL element 1, a conventional structure other than the desiccant layer 7 can be used. An example of the organic EL element 1 will be briefly described below.

元件基板2由具有絕緣性以及透光性的矩形玻璃基板構成,在該元件基板2之上,由透明導電材料也就是ITO(Indum Tin Oxide:氧化銦錫)形成有陽極5(電極)。該陽極5例如如下形成:針對透過真空蒸鍍法、濺鍍法等PVD(Physical Vapor Deposition:物理氣相沉積)法在元件基板2上形成的ITO膜,進行基於光刻法的蝕刻而形成規定的圖案形狀,從而形成陽極5。作為電極的陽極5的一部分,被引出至元件基板2的端部而與驅動電路(未圖示)連接。The element substrate 2 is made of a rectangular glass substrate having insulating properties and light transmissivity. On the element substrate 2, an anode 5 (electrode) is formed of a transparent conductive material, that is, ITO (Indum Tin Oxide). The anode 5 is formed, for example, by forming an ITO film formed on the element substrate 2 by a PVD (Physical Vapor Deposition) method such as a vacuum vapor deposition method or a sputtering method, and performing etching by photolithography. The pattern is shaped to form the anode 5. A part of the anode 5 as an electrode is led out to the end of the element substrate 2 and connected to a drive circuit (not shown).

在陽極5的上表面,透過真空蒸鍍法、電阻加熱法等PVD法層疊有包含有機發光材料的薄膜也就是有機層4。有機層4可以由單一的層形成,也可以由功能不同的複數個層形成。本實施型態中的有機層4為從陽極5側依序層疊有電洞注入層4a、電洞傳輸層4b、發光層4c以及電子傳輸層4d的四層結構。電洞注入層4a例如由膜厚為數十奈米的酞菁銅(CuPc)形成。電洞傳輸層4b例如由膜厚為數十奈米的二[N-(1-萘基)-N-苯基]聯苯胺(bis[N-(1-naphthyl)-N-phenyl]benzidine,α-NPD)所形成。發光層4c例如由膜厚為數十奈米的三(8-羥基喹啉)鋁(Alq3 )所形成。電子傳輸層4d例如由膜厚為數奈米的氟化鋰(LiF)形成。而且,陽極5、有機層4以及後述的陰極6依序層疊的層疊體構成發光部。On the upper surface of the anode 5, a film including an organic light-emitting material, that is, an organic layer 4, is laminated by a PVD method such as a vacuum deposition method or a resistance heating method. The organic layer 4 may be formed of a single layer or a plurality of layers having different functions. The organic layer 4 in the present embodiment has a four-layer structure in which a hole injection layer 4a, a hole transport layer 4b, a light-emitting layer 4c, and an electron transport layer 4d are sequentially laminated from the anode 5 side. The hole injection layer 4a is formed, for example, of copper phthalocyanine (CuPc) having a film thickness of several tens of nanometers. The hole transport layer 4b is, for example, bis[N-(1-naphthyl)-N-phenyl]benzidine having a film thickness of several tens of nanometers, Formed by α-NPD). The light-emitting layer 4c is formed, for example, of tris(8-hydroxyquinoline)aluminum (Alq 3 ) having a film thickness of several tens of nanometers. The electron transport layer 4d is formed, for example, of lithium fluoride (LiF) having a film thickness of several nanometers. Further, the laminate in which the anode 5, the organic layer 4, and the cathode 6 to be described later are laminated in this order constitutes a light-emitting portion.

在有機層4(電子傳輸層4d)的上表面,透過真空蒸鍍法等PVD法形成有金屬薄膜即陰極6(電極)。作為金屬薄膜的材料,可例舉出Al(鋁)、Li(鋰)、Mg(鎂)、In(銦)等功函數較小的金屬單體或Al-Li(鋁-鋰)、Mg-Ag(鎂-金)等功函數較小的合金等。陰極6的膜厚例如形成為數十奈米~數百奈米(較佳為50nm~200nm)。陰極6的一部分被引出至元件基板2的端部而與驅動電路(未圖示)連接。On the upper surface of the organic layer 4 (electron transport layer 4d), a cathode 6 (electrode) which is a metal thin film is formed by a PVD method such as a vacuum deposition method. The material of the metal thin film may, for example, be a metal monomer having a small work function such as Al (aluminum), Li (lithium), Mg (magnesium) or In (indium) or Al-Li (aluminum-lithium) or Mg- An alloy such as Ag (magnesium-gold) having a small work function. The film thickness of the cathode 6 is, for example, tens of nanometers to several hundreds of nanometers (preferably 50 nm to 200 nm). A part of the cathode 6 is led out to the end of the element substrate 2 and connected to a drive circuit (not shown).

密封基板3被配置成隔著有機層4而與元件基板2對置,並且元件基板2以及密封基板3的外周部由密封劑8所密封。作為密封劑,例如可以使用紫外線固化樹脂。而且,乾燥劑層7在密封劑8的內側且被設置於密封基板3的一部分上或者整個密封基板3上。乾燥劑層7是透過塗布上述實施型態的乾燥劑而形成。乾燥劑層7的膜厚被形成為1~300μm。The sealing substrate 3 is disposed to face the element substrate 2 via the organic layer 4, and the outer peripheral portions of the element substrate 2 and the sealing substrate 3 are sealed by the sealant 8. As the sealant, for example, an ultraviolet curable resin can be used. Further, the desiccant layer 7 is provided inside the sealant 8 and on a part of the sealing substrate 3 or on the entire sealing substrate 3. The desiccant layer 7 is formed by applying the desiccant of the above-described embodiment. The film thickness of the desiccant layer 7 is formed to be 1 to 300 μm.

(有機EL元件的製造方法) 首先,準備在元件基板2上層疊有有機層4等(未圖示出電極)的層疊體。(Manufacturing Method of Organic EL Element) First, a laminate in which an organic layer 4 or the like (an electrode is not illustrated) is laminated on the element substrate 2.

接著,使用塗布機在另行準備的密封基板3上塗布本實施型態的乾燥劑而形成乾燥劑層7。而且,使用塗布機以包圍塗布在密封基板3上的乾燥劑的方式塗布密封劑8。這些操作較佳在以露點為-76℃的氮氣來置換過的手套箱中進行。Next, the desiccant of this embodiment is applied onto the separately prepared sealing substrate 3 using a coater to form a desiccant layer 7. Further, the sealant 8 is applied in such a manner as to surround the desiccant coated on the sealing substrate 3 using a coater. These operations are preferably carried out in a glove box that has been replaced with nitrogen having a dew point of -76 °C.

接著,將層疊有有機層4等的元件基板2和密封基板3貼合在一起。透過對貼合在一起的基板照射UV(紫外線)和加熱至80℃左右而進行密封,從而製造出本實施型態的有機EL元件1。Next, the element substrate 2 on which the organic layer 4 or the like is laminated and the sealing substrate 3 are bonded together. The organic EL element 1 of the present embodiment is produced by irradiating the bonded substrates with UV (ultraviolet rays) and heating to about 80 ° C for sealing.

(實施例) 以下,根據實施例對本發明進行更加具體地說明。但是,本發明並不只限於這些實施例。(Embodiment) Hereinafter, the present invention will be more specifically described based on examples. However, the invention is not limited to the embodiments.

1.氧化物顆粒的合成 [氧化物顆粒1] 將市面上銷售的氧化物顆粒用作氧化物顆粒1。氧化物顆粒1並未形成二次顆粒。氧化物顆粒1的平均粒徑為2.5μm,比表面積為2.5m2 /g。 將氧化物顆粒分散在分散劑(酒精)中而製備測量用的分散液,並將使用該分散液透過動態光散射粒徑分析儀而得到的體積分佈的中位數,作為氧化物顆粒的平均粒徑而加以記錄。並且,將氧化物顆粒在減壓至500Pa以下的環境下以120℃乾燥8小時以上,然後僅取得液態氮溫度中的氮吸附側的等溫吸附線。利用BET法分析等溫吸附線,從而求出氧化物顆粒的比表面積。其他氧化物顆粒的平均粒徑以及比表面積也以相同方法測量。1. Synthesis of Oxide Particles [Oxide Particles 1] Commercially available oxide particles were used as the oxide particles 1. The oxide particles 1 did not form secondary particles. The oxide particles 1 had an average particle diameter of 2.5 μm and a specific surface area of 2.5 m 2 /g. Dispersing an oxide particle in a dispersing agent (alcohol) to prepare a dispersion for measurement, and using the dispersion to pass a dynamic light scattering particle size analyzer to obtain a median volume distribution as an average of oxide particles Record the particle size. Further, the oxide particles were dried at 120 ° C for 8 hours or more under reduced pressure to 500 Pa or less, and then only the isotherm adsorption line on the nitrogen adsorption side in the liquid nitrogen temperature was obtained. The isothermal adsorption line was analyzed by the BET method to determine the specific surface area of the oxide particles. The average particle diameter and specific surface area of other oxide particles were also measured in the same manner.

[氧化物顆粒2] 將比表面積為17.1m2 /g的生石灰粉末(純度:99質量%)分散於溶劑(庚烷)中,並用球磨機進行粉碎。粉碎之後進行蒸餾從而去除溶劑,而得到氧化物顆粒2。用掃描電子顯微鏡(SEM)觀察氧化物顆粒2發現,幾乎所有氧化物顆粒都形成包含複數個一次顆粒的二次顆粒。氧化物顆粒2的平均粒徑為2.5μm,比表面積為5.3m2 /g。[Oxide Particles 2] A quicklime powder (purity: 99% by mass) having a specific surface area of 17.1 m 2 /g was dispersed in a solvent (heptane) and pulverized by a ball mill. After the pulverization, distillation was carried out to remove the solvent, and oxide particles 2 were obtained. Observation of the oxide particles 2 by a scanning electron microscope (SEM) revealed that almost all of the oxide particles formed secondary particles containing a plurality of primary particles. The oxide particles 2 had an average particle diameter of 2.5 μm and a specific surface area of 5.3 m 2 /g.

[氧化物顆粒3] 將比表面積為47m2 /g的熟石灰粉末(純度:73.2質量%)放入煆燒爐中,以450℃的溫度煆燒3小時,從而製備出生石灰粉末。將所得到的生石灰粉末分散於溶劑(庚烷)中,並用球磨機進行粉碎。粉碎之後去除溶劑,而得到氧化物顆粒3。用掃描電子顯微鏡(SEM)觀察氧化物顆粒3發現,幾乎所有氧化物顆粒都形成包含複數個一次顆粒的二次顆粒。氧化物顆粒3的平均粒徑為3.8μm,比表面積為34.6m2 /g。[Oxide Particles 3] A slaked lime powder (purity: 73.2% by mass) having a specific surface area of 47 m 2 /g was placed in a crucible furnace, and calcined at a temperature of 450 ° C for 3 hours to prepare a raw lime powder. The obtained quicklime powder was dispersed in a solvent (heptane) and pulverized by a ball mill. After the pulverization, the solvent is removed to obtain oxide particles 3. Observation of the oxide particles 3 by a scanning electron microscope (SEM) revealed that almost all of the oxide particles formed secondary particles containing a plurality of primary particles. The oxide particles 3 had an average particle diameter of 3.8 μm and a specific surface area of 34.6 m 2 /g.

[氧化物顆粒4] 將比表面積為47m2 /g的熟石灰粉末(純度:73.2質量%)放入煆燒爐中,利用真空泵將壓力設為5×10-3 Pa以下,並以450℃的溫度煆燒3小時,從而製備出氧化物顆粒4。氧化物顆粒4形成包含複數個一次顆粒的二次顆粒。氧化物顆粒4的平均粒徑為4.1μm,比表面積為82.5m2 /g。[Oxide Particles 4] A slaked lime powder (purity: 73.2% by mass) having a specific surface area of 47 m 2 /g was placed in a crucible furnace, and the pressure was set to 5 × 10 -3 Pa or less by a vacuum pump, and 450 ° C was used. The temperature was calcined for 3 hours to prepare oxide particles 4. The oxide particles 4 form secondary particles containing a plurality of primary particles. The oxide particles 4 had an average particle diameter of 4.1 μm and a specific surface area of 82.5 m 2 /g.

[氧化物顆粒5] 將比表面積為35m2 /g的熟石灰粉末(純度:73.3質量%)放入煆燒爐中,利用真空泵將壓力設為5×10-3 Pa以下,並以450℃的溫度煆燒3小時,從而製備出氧化物顆粒5。氧化物顆粒5形成包含複數個一次顆粒的二次顆粒。氧化物顆粒5的平均粒徑為5μm,比表面積為76.1m2 /g。[Oxide Particles 5] A slaked lime powder (purity: 73.3 mass%) having a specific surface area of 35 m 2 /g was placed in a crucible furnace, and the pressure was set to 5 × 10 -3 Pa or less by a vacuum pump, and 450 ° C was used. The temperature was calcined for 3 hours to prepare oxide particles 5. The oxide particles 5 form secondary particles containing a plurality of primary particles. The oxide particles 5 had an average particle diameter of 5 μm and a specific surface area of 76.1 m 2 /g.

[氧化物顆粒6] 將比表面積為35m2 /g的熟石灰粉末(純度:73.3質量%)替換成比表面積為15m2 /g的熟石灰粉末(純度:74.7質量%),除此以外以與氧化物顆粒5相同的方法製備出氧化物顆粒6。氧化物顆粒6形成包含複數個一次顆粒的二次顆粒。氧化物顆粒6的平均粒徑為5μm,比表面積為68.9m2 /g。[Oxide particles 6] A slaked lime powder (purity: 73.3 mass%) having a specific surface area of 35 m 2 /g was replaced with a slaked lime powder having a specific surface area of 15 m 2 /g (purity: 74.7 mass%), and other than oxidation The oxide particles 6 were prepared in the same manner as the particles 5 . The oxide particles 6 form secondary particles comprising a plurality of primary particles. The oxide particles 6 had an average particle diameter of 5 μm and a specific surface area of 68.9 m 2 /g.

[氧化物顆粒7] 將比表面積為35m2 /g的熟石灰粉末(純度:73.3質量%)替換成比表面積為12m2 /g的熟石灰粉末(純度:74.2質量%),除此以外以與氧化物顆粒5相同的製備方法製備出氧化物顆粒7。氧化物顆粒7形成包含複數個一次顆粒的二次顆粒。氧化物顆粒7的平均粒徑為5μm,比表面積為67.2m2 /g。[Oxide Particles 7] A slaked lime powder (purity: 73.3 mass%) having a specific surface area of 35 m 2 /g was replaced with a slaked lime powder having a specific surface area of 12 m 2 /g (purity: 74.2% by mass), and other than oxidation The oxide particles 7 were prepared by the same preparation method of the particles 5 . The oxide particles 7 form secondary particles comprising a plurality of primary particles. The oxide particles 7 had an average particle diameter of 5 μm and a specific surface area of 67.2 m 2 /g.

2.乾燥劑的調製 以1:1的質量比分別將氧化物顆粒1~7和矽酮樹脂進行混合,並以1000轉/分鐘的轉速離心攪拌5分鐘,從而獲得表1所示的實施例1、2以及比較例1~5的乾燥劑。2. The preparation of the desiccant was carried out by mixing the oxide particles 1 to 7 and the fluorenone resin in a mass ratio of 1:1, and centrifugally stirring at 1000 rpm for 5 minutes, thereby obtaining Example 1 shown in Table 1. 2 and the desiccants of Comparative Examples 1 to 5.

3.評價 透過濺鍍法,將具有透明性的導電材料的ITO在元件基板上形成膜厚為140nm的膜。利用光刻法對ITO膜進行蝕刻而形成預定的圖案形狀,從而形成陽極。 利用電阻加熱法。在所形成的陽極的上表面將酞菁銅(CuPc)形成膜厚為70nm的膜,從而形成電洞注入層,並在電洞注入層的上表面將二[N-(1-萘基)-N-苯基]聯苯胺(α-NPD)形成膜厚為30nm的膜,從而形成電洞傳輸層,接著在電洞傳輸層的上表面將三(8-羥基喹啉)鋁(Alq3 )形成膜厚為50nm的膜,從而形成發光層。接著,在發光層的上表面將氟化鋰(LiF)形成膜厚為7nm的膜,從而形成電子傳輸層,並將鋁以150nm的膜厚物理蒸鍍在電子傳輸層的表面以作為陰極。藉此,在元件基板上形成依序層疊有陽極、有機層(電洞注入層/電洞傳輸層/發光層)、電子傳輸層以及陰極的層疊體。 接著,在由露點為-76℃的氮所置換過的手套箱中,利用塗布機將各個實施例或比較例的乾燥劑塗布於密封基板的中央部,從而形成乾燥劑層。並且,利用塗布機將由紫外線固化型樹脂構成的密封劑以包圍所塗布的乾燥劑的方式塗布於密封基板上。 然後,以使層疊體、乾燥劑層以及密封劑位於內側的方式來貼合元件基板和密封基板。在該狀態下,透過照射紫外線和加熱至80℃來密封元件基板及密封基板的外周部,從而得在由密封劑所包圍的氣密空間內設置有乾燥劑的中空密封結構的有機EL元件。 將所獲得的有機EL元件放置於85℃、85%RH的高溫高濕環境中,追蹤發光面積率相對於經過時間的變化。3. It was evaluated that a film having a transparent conductive material was formed on the element substrate by a sputtering method to have a film thickness of 140 nm. The ITO film is etched by photolithography to form a predetermined pattern shape, thereby forming an anode. Use resistance heating. Copper phthalocyanine (CuPc) was formed on the upper surface of the formed anode to form a film having a film thickness of 70 nm, thereby forming a hole injection layer, and bis[N-(1-naphthyl) was formed on the upper surface of the hole injection layer. -N-phenyl]benzidine (α-NPD) forms a film having a film thickness of 30 nm to form a hole transport layer, followed by tris(8-hydroxyquinoline)aluminum (Alq 3 ) on the upper surface of the hole transport layer A film having a film thickness of 50 nm was formed to form a light-emitting layer. Next, lithium fluoride (LiF) was formed on the upper surface of the light-emitting layer to form a film having a film thickness of 7 nm, thereby forming an electron transport layer, and aluminum was physically deposited on the surface of the electron transport layer at a film thickness of 150 nm to serve as a cathode. Thereby, a laminate in which an anode, an organic layer (hole injection layer/hole transport layer/light-emitting layer), an electron transport layer, and a cathode are laminated in this order is formed on the element substrate. Next, in a glove box replaced with nitrogen having a dew point of -76 ° C, the desiccant of each of the examples or the comparative examples was applied to the central portion of the sealing substrate by a coater to form a desiccant layer. Further, a sealant composed of an ultraviolet curable resin is applied onto the sealing substrate so as to surround the applied desiccant by a coater. Then, the element substrate and the sealing substrate are bonded to each other such that the laminate, the desiccant layer, and the sealant are located inside. In this state, the outer peripheral portion of the element substrate and the sealing substrate is sealed by irradiation with ultraviolet rays and heating to 80° C., whereby an organic EL element having a hollow sealing structure in which a desiccant is provided in an airtight space surrounded by the sealant is obtained. The obtained organic EL device was placed in a high-temperature and high-humidity environment of 85 ° C and 85% RH, and the change in the light-emitting area ratio with respect to the elapsed time was followed.

第2圖是表示高溫高濕環境下的有機EL元件的發光面積率和經過時間之間的關係的圖表。包含實施例1、2的乾燥劑的有機EL元件在經過500小時後顯示出80%以上的發光面積率,而且發光面積率在經過1000小時後也維持在75%以上。相對於此,包含比較例1~5的乾燥劑的有機EL元件在經過500小時的時間點中,發光面積率下降到低於80%。由該結果可知,本發明的乾燥劑能夠充分地抑制有機EL元件產生黑點。Fig. 2 is a graph showing the relationship between the light-emitting area ratio and the elapsed time of the organic EL element in a high-temperature and high-humidity environment. The organic EL device including the desiccant of Examples 1 and 2 showed a light-emitting area ratio of 80% or more after 500 hours passed, and the light-emitting area ratio was maintained at 75% or more after 1000 hours passed. On the other hand, in the organic EL device including the desiccant of Comparative Examples 1 to 5, the light-emitting area ratio was lowered to less than 80% at the time point of 500 hours elapsed. From the results, it is understood that the desiccant of the present invention can sufficiently suppress the generation of black spots in the organic EL element.

1‧‧‧有機EL元件
2‧‧‧元件基板
3‧‧‧密封基板
4‧‧‧有機層
4a‧‧‧電洞注入層
4b‧‧‧電洞傳輸層
4c‧‧‧發光層
4d‧‧‧電子傳輸層
5‧‧‧陽極
6‧‧‧陰極
7‧‧‧乾燥劑層
8‧‧‧密封劑
1‧‧‧Organic EL components
2‧‧‧ element substrate
3‧‧‧Seal substrate
4‧‧‧Organic layer
4a‧‧‧ hole injection layer
4b‧‧‧ hole transport layer
4c‧‧‧Lighting layer
4d‧‧‧Electronic transport layer
5‧‧‧Anode
6‧‧‧ cathode
7‧‧‧Drying agent layer
8‧‧‧Sealant

第1圖是表示本發明的一實施型態所涉及的有機EL元件的示意剖視圖。 第2圖是表示高溫高濕環境下的有機EL元件的發光面積率和經過時間之間的關係的圖表。Fig. 1 is a schematic cross-sectional view showing an organic EL device according to an embodiment of the present invention. Fig. 2 is a graph showing the relationship between the light-emitting area ratio and the elapsed time of the organic EL element in a high-temperature and high-humidity environment.

國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無Domestic deposit information (please note according to the order of the depository, date, number)

國外寄存資訊 (請依寄存國家、機構、日期、號碼順序註記) 無Foreign deposit information (please note in the order of country, organization, date, number)

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Claims (5)

一種乾燥劑,其含有黏合劑樹脂與分散於前述黏合劑樹脂中的氧化物顆粒; 其中,前述氧化物顆粒的至少一部分形成二次顆粒,該二次顆粒包含複數個一次顆粒;前述氧化物顆粒的平均粒徑為4μm以下;前述氧化物顆粒的比表面積為5~60m2 /g。A desiccant comprising a binder resin and oxide particles dispersed in the binder resin; wherein at least a portion of the foregoing oxide particles form secondary particles, the secondary particles comprising a plurality of primary particles; the foregoing oxide particles The average particle diameter is 4 μm or less; and the specific surface area of the oxide particles is 5 to 60 m 2 /g. 如請求項1所述的乾燥劑,其中,前述氧化物顆粒的比表面積為5~35 m2 /g。The desiccant according to claim 1, wherein the oxide particles have a specific surface area of 5 to 35 m 2 /g. 如請求項1或2所述的乾燥劑,其中,前述黏合劑樹脂包含矽酮樹脂。The desiccant according to claim 1 or 2, wherein the binder resin comprises an anthrone resin. 一種密封結構,其具備: 彼此對向配置的一對基板;密封劑,其密封前述一對基板的外周部;以及,乾燥劑層,其在前述密封劑的內側且被設置於前述一對基板之間,並且包含請求項1至3中任一項所述的乾燥劑。A sealing structure comprising: a pair of substrates arranged to face each other; a sealant sealing an outer peripheral portion of the pair of substrates; and a desiccant layer disposed inside the sealant and on the pair of substrates The desiccant of any one of claims 1 to 3 is included. 一種有機電致發光元件,其具備: 元件基板;密封基板,其相對於前述元件基板被對向配置;密封劑,其密封前述元件基板和前述密封基板的外周部;層疊體,其在前述密封劑的內側且被設置於前述元件基板上,並且具有有機層和夾持該有機層之一對電極;以及,乾燥劑層,其在前述密封劑的內側且被設置於前述密封基板上,並且包含請求項1至3中任一項所述的乾燥劑。An organic electroluminescence device comprising: an element substrate; a sealing substrate disposed opposite to the element substrate; a sealant sealing the outer peripheral portion of the element substrate and the sealing substrate; and a laminate having the seal An inner side of the agent and disposed on the element substrate, and having an organic layer and a counter electrode sandwiching the organic layer; and a desiccant layer on the inner side of the sealant and disposed on the sealing substrate, and The desiccant of any one of claims 1 to 3 is included.
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