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TW201111560A - Fine crystalline and amorphous coexisting gold alloy, plating film, plating solution, and plating method for said film - Google Patents

Fine crystalline and amorphous coexisting gold alloy, plating film, plating solution, and plating method for said film Download PDF

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Publication number
TW201111560A
TW201111560A TW099104998A TW99104998A TW201111560A TW 201111560 A TW201111560 A TW 201111560A TW 099104998 A TW099104998 A TW 099104998A TW 99104998 A TW99104998 A TW 99104998A TW 201111560 A TW201111560 A TW 201111560A
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Taiwan
Prior art keywords
film
gold
plating
gold alloy
amorphous
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TW099104998A
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Chinese (zh)
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TWI476301B (en
Inventor
Tetsuya Osaka
Yutaka Okinaka
Kazutaka Senda
Ryota Iwai
Masaru Kato
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Univ Waseda
Kanto Kagaku
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Publication of TW201111560A publication Critical patent/TW201111560A/en
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/62Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of gold
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/615Microstructure of the layers, e.g. mixed structure
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Electroplating And Plating Baths Therefor (AREA)
  • Electroplating Methods And Accessories (AREA)

Abstract

Disclosed is a microcrystalline-to-amorphous gold alloy-plated film having excellent electrical properties and excellent mechanical properties. Physical properties including both the advantageous properties of a crystalline structure and the advantageous properties of an amorphous structure can be obtained by allowing a microcrystalline phase and an amorphous phase to exist in a mixed state at a specific ratio. The average particle diameter of the microcrystals is 30 nm or smaller, the volume fraction of the microcrystals is 10 to 90%, the knoop hardness is Hk 180 or more, the specific resistivity is 200 [μ]Ocm or less. In the film, hardness and abrasion resistance can be improved while maintaining a good specific resistivity value and chemical stability both inherent to gold at practically insignificant levels. Therefore, the film is useful as a material for connecting an electric or electronic component such as a connector and a relay.

Description

201111560 六、發明說明: 【發明所屬之技術領域】 本發明係關於-種有效用來 子之鑛敷膜、—種電氣特性及機械特件的端 -非定形混雜金合金鍍敷膜、一種 = ·,、之礒細結晶 鍍 定形混雜金合金織狀則=柄微細結晶非 敷液之電氣鑛敷方法。 邊液、—種使用該電性 【先前技術】 在電氣/電子零件的連接器、電氣機械式小型㈣器、 印刷配線崎方面,_是就做為要求高信雛的部位之 電氣接點材料而論,現在_直廣泛地錢—種被稱為硬質 金鍍敷㈣金職膜。硬質金缝膜是—種在金中添加 始、鎳等而成、既不會降低金本來的良好導電性及化學安 定性、且可提昇膜的硬度之物。此種硬質金職膜是-種 具有由金的微細結晶(2〇〜3〇nm)聚集而成的微細構造,可 視為是一種由於此種微細構造而能得到用以獲得接點材 料所要求的耐磨耗性所需之最低限的硬度(努普硬度 (Knoop hardness) : Hk 170 左右)之物質。 另一方面,近年來雖然隨著電子零件之小型化,電氣 接點的尺寸亦隨之微小化了,然而在被形成於此種微小接 點中的鍍敷膜亦小尺寸化、薄膜化,因而也要求將硬度更 進一步地向上提昇以得到高的磨耗性。 又’在不久的將來,接點的尺寸想必是會近似於上述 之硬質金鑛敷膜的微細結晶尺寸;在像這樣的微細接點上g 形成如上述之硬質金鍍敷膜的情況下,由於構成膜的微細 3/22 201111560 t曰曰的絶對數里變少,料想就得不到和形成於現在適用程 度大小的接點上之硬f讀敷膜的情況下同等的耐 性。所以’本發明人等乃發明以不具有微細結晶 定形相所形成的非定形金合金鍍敷膜(例如,專J非 6〜8)。然而’就所謂得到既能將金本來的良好比電獻 學安定性維持在實用上沒有問題的程度並同時^ 之目的而論’可以說是尚有改善的餘地。 更度 〔先前技術文獻〕 〔專利文獻〕 另外,本發明之相關先前技術文獻資訊係如以下所 〔專利文獻1〕特開昭60_33382號公報 〔專利文獻2〕特開昭62_29〇893號公報 〔專利文獻3〕專利第3452724號公報 〔專利文獻4〕專利第3983207號公報 〔專利文獻5〕特開2〇〇4_3〇〇483號公報 〔專利文獻6〕特開2〇〇6_241594號公報 〔專利文獻7〕特開2〇〇7_92157號公報 〔專利文獻8〕特開2〇〇7_1697〇6號公報 〔非專利文獻〕 〔非專利文獻1〕川合慧,「金_鎳合金鍍敷柄 之研究」’金屬表面技術,1968年,第19冊,第 第 487-491 頁 〔非專利文獻2〕清水保雄及另1名,「關於電拚a 合金之微細構造與相的電子顯微鏡之研究」,金屬表〇坟1 術,1976年,第27冊,第i卷,第20·24頁、 面枝 4/22 201111560 〔非專利文獻3〕渡邊徹著,「精密電鍍鍍敷膜構造 之控制技術及其解析法」,技術情報協會,2〇〇2年2月, 第 256-262 頁 〔非專利文獻4〕小見崇及另2名,「Ni-W合金鍍敷 皮膜之高W含轉化財麟性」,金屬表面技術,腫 年,第39冊’第12卷,第809-812頁 〔非專利文獻5〕渡邊徹,「鍍敷法形成非晶質合金的 機構」’表面技術,1989年,第40冊,第3卷,第21_26 頁 【發明内容】 〔發明之概要〕 〔發明所欲解決之課題〕 本發明係鑑於上述情事而成者,目的在於:提供一種 既具有良㈣導電性及化學安定性並同時提高硬度之财 磨耗性優異的微細結晶非定形混雜金合金鐵敷膜、一種 能夠形成該微細結晶·非定形絲金合金錄膜之電性鑛 敷液、及一種使用該電性鍍敷液之電氣鍍敷方法。 〔用以解決課題之手段〕 ,本發明人是在為了達成上記目的而重複地銳意檢討 當中’基於制:就即使是微小接點也不會降低硬度的鑛 敷膜之微細構造而論,雖然結晶性構造相比之下,非定形 相構造方面是既可以將金本來的良好比電阻及化學安定 性維持在貫用上沒有問題的程度並可關時提昇硬度及 财磨耗11 ^而^子的平均自由行程係短於結晶膜的緣故f 以致電氣傳導性低、又且由於内部應力導致在鑛敷膜上容 5/22 201111560 易發生龜裂的想法而進行研究時,發現:藉由使用一種含 有特定濃度軌化金鹽、_及/或㈣、雛者為更進_ 步地^有機酸、無機酸或其鹽等之錯合劑及氨或錢離子 之液=疋性良好的電性鍍敷液來進行電性鍍敷,能得到令 ^驚可的由微細結晶相和非定形相混雜而形成的微細結 日日非定形混雜金合金錢敷膜、以及此種膜既可將金本來 的良好比電阻似化學安定性保持在實訂有用的程度 時提昇硬度’經更進一步地實施研究的結果而完: 也就是說,本發明係提供:⑴一種以由微細結晶相和 ^疋形相混雜形成做為龍之微崎晶 =敷膜、⑵-種含有以金基準計為_01〜04_= ^辰度之氰化金鹽、以鎳基準計為m()i/dm3的濃 二之鎳鹽、及/或骑基準計為_〜G.5 _版 =鹽、較佳為更進一步地含有咖〜的濃; t酸、無機酸或其鹽等之錯合劑、0侧〜5.0 mol/dm3 2度之氨或鋪子做為龍之駐定性請的電性鑛 及⑶―種以使_電性鍍敷液而在被鍍敷物上 錢敷=結晶·較形混雜金合金職膜做為特徵之電氣 〔發明效果〕 微細結晶啡⑽絲金合金職膜係由微 錄〜曰相和狀形相混雜而形成,其結果為·由於它是一 既可將金本來的良好比電崎及化學安定性保持在實 提昇硬度的物質,所以可有效地用來 文為、%電料之電氣/電子零件的接點材料。一般而言,已 6/22 2011U560 =道··在由微細結晶構成結晶膜之情況下,雖然當構成結 晶粒的大小變小時,硬度會增大到某種限度(例如,在^ 1障況下:4 nm左右);然而’當結晶粒更進-步地縮小 時,硬度就恐怕會下降。即使是在金的方面,雖然也是沒 ,能否適用一般理論的實測例子,然而,藉由在金之中^ :人貫現微結晶-非定形混雜結晶膜的本發明,首次確璆·· 微細結晶·非定形混雜金合金鍍敷膜可完全地解決像=樣 =問題點,而且由於電氣傳導體也是高的、不容易發生龜 j的緣故,因而能夠充分地適合用來做為連接器或繼電器 等之電氣/電子零件之微小接點材料。 【實施方式】 以下,更進一步地針對本發明進行詳細的説明。 本發明之微細結晶-非定形混雜金合金鍍敷膜係由微 細結晶相和非定形相混雜所形成。 本發明之微細結晶-非定形混雜金合金鍍敷膜係在金 中含有鎳及/或鈷之物’並且該微細構造係一種由微細結晶 相和非定形相混雜而成的構造;藉由此等特徵而達成:比 純非定形構造之非定形金合金鍍敷膜還要良好的比電阻 値及化學安定性、以及更高的硬度。像這樣的由微細結晶 相和非定形相混雜而成之構造係可以藉由X線繞射(XRD) 圖、牙透式電子顯微鏡(TEM)照片及穿透式高能電子線繞 射(THEED)照片來加以確認。 • 本發明之微細結晶-非定形混雜金合金鍍敷膜,從維 持高硬度的觀點來看,其微細結晶之平均粒徑宜是3〇nmi§]i 以下’尤其’較佳為2〇 nm以下,更佳為15 nm以下。 7/22 201111560 又本發明之微細結晶-非定形混雜金合金錢敷膜, 從,持金本來之特性(良好的比電阻値及化學安定性)或維 持習用的金或金合金鍍敷膜上所沒有的高硬度之觀點來 看,其微細結晶的體積分率宜是10〜90%、特佳為15〜6〇%。 右依照本發明的話,就能夠得到一種具有優異的硬度 和比電阻之微細結晶_非定形混雜金合金鍍敷膜,即能夠 得到一種具有:努普硬度宜是Hk 180以上;尤其,較佳 為Hk 220以上,更佳為Hk 3〇〇以上,特佳為Hk 35〇以 上,又,比電阻宜是200μΩ · cm以下,特佳為150μΩ · cm以下,尤佳為1〇〇μΩ · cm以下之膜。又本發明之微 細結晶-非定形混雜金合金鍍敷膜是一種在3〇(rc以下之 退火處理(保持1小時)日寺不會改變微細結晶相和非定形 相混雜而成的構造(即,引起結晶化而增大微細結晶的平 均粒徑及體積分率)。 本發明之微細結晶-非定形混雜金合金鑛敷膜,因為 它的比電阻値及化學安定性是優異的、並且具有習用的金 或金合金鍍敷膜所未有的高硬度之特徵的緣故,所以可有 =地用來做為電磁開關器、剎車器、惶溫器、繼電器、計 時器、各種開關、印刷配線基板等之電氣/電子零件的端子 等之導通接點。 本發明之微細結晶-非定形混雜金合金鍍敷膜係能夠 以組成式:Au.x_yMxCy(但,Au或M為主成分,可以含 有不可避免的不純物;1^係见及/或c〇; c為碳;丨原子 %$x‘80原子%; 1原子原子%)來表示。 ^本發明之,細結晶-非定形混雜金合金鍍敷膜係能殉 藉由使用含有氰化金鹽、鎳鹽及/祕鹽的電性錄液之電 8/22 201111560 性鍍敷來形成。 在該電性鍍敷液中,雖然是含有氰化金鹽、鎳鹽及/ 或銘鹽,但舉例來說,例如,氰化金鹽的具體例可以是氛 =金卸、氰化金納、氣化金料;錄鹽的具體Μ,舉例來 兒例如匕可以是硫酸鎳、硝酸鎳等,始鹽的具體例,舉 例來說,例如它可从硫酸録、咖條等。職液中之二 化金鹽浪度,以金為基準計,宜是0.0001〜0.4 m〇i/dm3、 較=為〇. 001〜0·2 _編3、更佳為_〜〇』m〇1/dm3 ;鎳 鹽浪度,以鎳為基準計,宜是0.001〜0.5 mol/dm3、較件爲 〇.〇l〜〇.2_/dm3;録鹽濃度,以始為基準計,= 0.001 〜0.5 m_m3、較佳為 G G1〜Q 2 mGl/dm3。錄敷液 金和鎳及/細之時(,⑽岭轉秘計 為0.01〜300、更佳為1〜30之範圍。 X氧I1 生鎮敷液,較佳為更進一步地含有錯合劑。 用來做為該錯合劑者,舉例來說,例如,它可以是具有錯 口作用及pH緩衝作用之有機酸、無機酸或其鹽;用來做 ^有機酸、無舰及其鹽者,舉财說,例如其可以是摔 才豕酉义酒石酉夂、蘋果酸“比0定甲酸、碌酸、胺石黃酸及彼等 之納I If鹽、銨鹽等。鑛敷液中的錯合劑之濃度,較佳 為 0.001 〜2.0 m〇1/dm3 ;尤其,特佳為 〇 〇1 〜】〇 _i/dm3, 尤佳為0.1〜0.3 molAW。鍍敷液中之錯合劑和錄及/或敍的 比率(錯合劑/ (Ni+c〇)〕,以莫耳比計,較佳為 0.01〜100,更佳為丨〜4之範圍。 又’該電⑽敷液較佳為更進—步地含有氨或銨離 子。用來做氨或銨離子之具體例,舉例來說,例如,它可^ 以是氨水、疏酸銨、錯合劑之銨鹽等。鑛敷液中的氨或銨 9/22 201111560 離濃度宜是〇·_〜5.0 mQl/dm3,特佳為讀〜2 〇 m δ亥氨係與所謂之結晶相的平均粒徑、微細結晶(或 疋形)的體積分率之鍍敷膜的結晶狀態、鍍敷浴之安定 性大有關連。 另外,該電性鍍敷液之ρΗ宜是3〜u ;尤其,較佳為 P“〜9 ’尤佳為pH 6左右。pH調整係能夠以使用氨水、 虱氧化鉀等之習用公知的pH調整劑來進行。 +更且,在該電性鍍敷液之中,只要是不會對鍍敷膜之 ^物性微細結晶的體積分率及平均粒徑、XRD曲線圖的 。半値巾田度、#普硬度、t匕電阻)及膜組成產生大的景多響, 可以視需要地含有以提昇光澤性、防止凹陷、賦予導曰電 性提供缓衝性、擴大能使用的電流密度範圍、促進析出 ^度耐熱性、改善潤溼性等做為目的之界面活性 蜊、/谷劑等各種的添加劑(例如,參照特開平7_n476號公 報特開2004-76026號公報、特開2006-37164號公報)。 一电氣鍍敷條件雖然是沒有特別的限定,然而鍍敷溫度 20〜95 C、尤其50〜90°C特別合適。陰極電流密度也 隨著鍵敷液的組成而變化,雖然沒有制的限定,然而在 !電流密度域(例如’ ! mA/cm2以上至小於1〇 —兮及 呵屯流岔度域(例如,超過1〇 mA/cm2至2〇〇 mA/cm2以下) 處之兩者均能夠得到微細結晶_非定形混雜金合金鍍敷 膜。又,在陽極上可以使用白金等之不溶性陽極。又,也 可以使用鎳及/或鈷來做為陽極。另一方面,做為被鑛敷物 者,舉例來說,例如,它可以是在電氣配線等上所使用的 銅、鎳等之金屬材料。此種金屬材料也可以是形成於金屬 基材或非金屬基材上而做為基底層的物質。另外,雖然不 10/22 201111560 論有無擾拌均可,然而較佳為在授拌下進行鍵敷;又,也 可以利用脈衝電流來施加電流。 以下,雖然例示實施例及比較例來具體地説明本發 明’然而本發明卻未受限下述之實施例而已。另外,在實 施例之中’各分析、測定的方法及條件如以下所述。 〔結晶性、結晶粒徑〕 利用理學電機公司製RINT2100_ultima+ : XRD法 CuK 〇ί (40 kV/4〇niA) 或利用日立高科技公司製HF-2200 : TEM及THEED 法’加速電壓200V明視野像 〔體積分率〕 利用日立高科技公司製HF-2200 : TEM法及THEED 法,加速電壓200V明視野像 〔金屬組成〕 利用SII科技公司製SEA5100 : EDXRF法 〔非金屬元素測定〕 利用堀場製作所公司製EMIA-920V、美國LECO公 司製TC-436 〔努普硬度〕 以JISZ2251為基準,測定:荷重5gf荷重保持時間 30秒’對被形成於銅板上的30/zm厚之鍍敷膜進行測定 〔比電阻〕 利用共和理研公司製K-705RS:以JISK7194為基準 測定(四探針法) 土 〔實施例1〕 ^201111560 VI. Description of the Invention: [Technical Field] The present invention relates to an end-non-shaped hybrid gold alloy plating film which is effective for use in a mineral coating film, an electrical property and a mechanical component, ·,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, Side liquid, the use of this electric property [Prior technology] In the electrical / electronic parts connector, electrical and mechanical small (four) device, printed wiring, _ is the electrical contact material for the part of the high letter Now, _ straight wide money - the species is called hard gold plating (four) gold film. The hard gold seam film is a kind of material which is added to gold, such as nickel or the like, and which does not lower the good electrical conductivity and chemical stability of gold, and can increase the hardness of the film. Such a hard gold film is a fine structure having a fine crystal of gold (2〇~3〇nm), which can be regarded as a kind of fine structure which can be obtained to obtain a contact material. The minimum hardness required for wear resistance (Knoop hardness: Hk 170 or so). On the other hand, in recent years, the size of electrical contacts has been miniaturized with the miniaturization of electronic components. However, the plating film formed in such minute contacts has been reduced in size and thinned. Therefore, it is also required to further increase the hardness upward to obtain high wearability. In addition, in the near future, the size of the contact point must be similar to the fine crystal size of the hard gold deposit film described above; in the case of forming a hard gold plating film as described above on the fine contact such as this, Since the absolute number of the fine 3/22 201111560 t曰曰 constituting the film is small, it is expected that the same resistance as in the case of the hard f-reading film formed on the joint of the currently applicable size is not obtained. Therefore, the inventors of the present invention have invented an amorphous gold alloy plating film formed by having no fine crystal phase (for example, J 6 to 8). However, it can be said that there is still room for improvement in terms of the fact that it is possible to maintain the goodness of gold as a function of electrical stability without being problematic. In the prior art, the related art document information of the present invention is as follows: [Patent Document 1] JP-A-60-33382 (Patent Document 2) JP-A-62-29-893 Japanese Patent Laid-Open No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. 2, No. Hei. Japanese Unexamined Patent Publication No. Hei No. Hei. No. Hei. No. Hei. No. 2-7-7697 No. 6 (Non-Patent Document) [Non-Patent Document 1] Chuan Hehui, "Study on Gold-Nickel Alloy Plating Handle "Metal Surface Technology, 1968, Vol. 19, No. 487-491 [Non-Patent Document 2] Shimizu Kazuo and the other, "Study on the Electron Microscope of the Fine Structure and Phase of the A-Alloy Alloy", Metal watch 〇 1 1 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , And its analytical method, technical information Yes, February 2nd, February, pp. 256-262 [Non-Patent Document 4] Xiaojian Chong and 2 others, "The high W of Ni-W alloy plating film contains conversion wealth", metal surface technology , Swollen Year, Vol. 39, Vol. 12, pp. 809-812 [Non-Patent Document 5] Watanabe Toru, "Mechanism of Forming Amorphous Alloy by Plating", Surface Technology, 1989, Vol. 40, No. [Volume 3, page 21_26] [Summary of the Invention] [Problems to be Solved by the Invention] The present invention has been made in view of the above circumstances, and an object of the invention is to provide a good (four) conductivity and chemical stability while a fine crystal amorphous carbon alloy iron coating film excellent in hardness and abrasion resistance, an electrical mineral deposit capable of forming the fine crystal/non-shaped silk gold alloy recording film, and an electric plating solution using the same Electrical plating method. [Means for Solving the Problem] The present inventors have repeatedly and eagerly reviewed the "based system: a fine structure of a mineral coating film that does not reduce the hardness even for a minute contact, in order to achieve the above-mentioned purpose, although In contrast to the crystalline structure, the amorphous phase structure can maintain the good specific resistance and chemical stability of gold to a degree that is not problematic and can improve the hardness and the wear and tear. The average free path is shorter than the reason of the crystal film, so that the electrical conductivity is low, and due to the internal stress, the idea of cracking on the mineral film 5/22 201111560 is found, and it is found that: a liquid containing a specific concentration of orbital gold salt, _ and / or (d), the former is a further _ step of organic acids, inorganic acids or their salts, and ammonia or money ions = good electrical properties The plating solution is used for electrical plating, and a micro-junction non-shaped hybrid gold alloy money film formed by mixing a fine crystal phase and an amorphous phase can be obtained, and the film can be used for gold. Original good ratio Resisting the chemical stability while maintaining the hardness at a practically useful level is completed by further conducting the study: that is, the present invention provides: (1) a method in which a fine crystalline phase and a mixed phase are formed It is a micro-salt crystal of the dragon, a film, and (2) a nickel salt of cerium, which is _01~04_=^^, which is based on gold, and a concentrated nickel salt of m()i/dm3 on a nickel basis. And/or the riding standard is _~G.5 _ plate = salt, preferably further containing the concentration of coffee ~; t acid, inorganic acid or its salt, etc., 0 side ~ 5.0 mol / dm3 The 2 degree ammonia or the shop is used as the electric mineral of the dragon, and (3) the seed is used to make the _ electroplating solution and the material is deposited on the plated material. Electric [Effect of the Invention] The fine crystalline crystalline (10) silk gold alloy film is formed by mixing micro-recording ~ 曰 phase and shape, and the result is that it is a good ratio of gold and electrons and chemical stability. The material is kept in a material that enhances the hardness, so it can be effectively used as a contact material for the electrical/electronic parts of the article. In general, 6/22 2011 U560 = Road · In the case where the crystal film is composed of fine crystals, although the size of the crystal grains becomes small, the hardness increases to a certain limit (for example, in the case of a disorder) Bottom: about 4 nm); however, when the crystal grains are further stepped down, the hardness may be lowered. Even in the case of gold, although it is not, whether the practical example of the general theory can be applied, however, by the invention of the microcrystalline-unshaped hybrid crystal film in the gold, the first time is confirmed. The fine crystal/non-shaped mixed gold alloy plating film can completely solve the problem like the sample, and since the electric conductor is also high and is not prone to the occurrence of the turtle j, it can be sufficiently suitable as a connector. Or tiny contact materials for electrical/electronic parts such as relays. [Embodiment] Hereinafter, the present invention will be described in detail. The fine crystal-unshaped hybrid gold alloy plating film of the present invention is formed by mixing a fine crystal phase and an amorphous phase. The fine crystal-unshaped hybrid gold alloy plating film of the present invention is a material containing nickel and/or cobalt in gold' and the fine structure is a structure in which a fine crystal phase and an amorphous phase are mixed; It is achieved by other characteristics: better specific resistance, chemical stability, and higher hardness than the amorphous non-formed structure of the amorphous gold alloy plating film. Such a structure in which a fine crystal phase and an amorphous phase are mixed may be formed by an X-ray diffraction (XRD) pattern, a tooth-through electron microscope (TEM) photograph, and a transmissive high-energy electron diffraction (THEED). Photo to confirm. • The fine crystal-unshaped hybrid gold alloy plating film of the present invention has an average particle diameter of fine crystals of 3 〇 nmi §]i or less, particularly preferably 2 〇 nm, from the viewpoint of maintaining high hardness. Hereinafter, it is more preferably 15 nm or less. 7/22 201111560 Further, the fine crystal-unshaped hybrid gold alloy money coating film of the present invention, from the original gold bearing property (good specific resistance 化学 and chemical stability) or maintaining a conventional gold or gold alloy plating film From the viewpoint of the high hardness which is not obtained, the volume fraction of the fine crystals is preferably from 10 to 90%, particularly preferably from 15 to 6 % by weight. According to the present invention, it is possible to obtain a fine crystal _ amorphous carbon alloy plating film having excellent hardness and specific resistance, that is, it is possible to obtain a method having a Knoop hardness of preferably Hk 180 or more; in particular, preferably Hk 220 or more, more preferably Hk 3 〇〇 or more, particularly preferably Hk 35 〇 or more, and the specific resistance is preferably 200 μΩ · cm or less, particularly preferably 150 μΩ · cm or less, and particularly preferably 1 μ μΩ · cm or less. The film. Further, the fine crystal-unshaped hybrid gold alloy plating film of the present invention is a structure in which the annealing process (for 1 hour) is not changed, and the fine crystal phase and the amorphous phase are not mixed. , causing crystallization to increase the average particle size and volume fraction of the fine crystals. The fine crystalline-unshaped hybrid gold alloy ore film of the present invention is excellent in specific resistance and chemical stability, and has Due to the high hardness characteristics of the conventional gold or gold alloy plating film, it can be used as an electromagnetic switch, brake, thermostat, relay, timer, various switches, and printed wiring. A conductive contact of a terminal such as a terminal of an electric/electronic component such as a substrate. The fine crystal-unshaped hybrid gold alloy plating film of the present invention can have a composition formula: Au.x_yMxCy (however, Au or M is a main component and may contain Inevitable impurities; 1^ are seen and/or c〇; c is carbon; 丨 atom%$x'80 atom%; 1 atomic atom%). ^Inventive, fine crystalline-amorphous hybrid gold alloy The coating film can be used by using The electric recording liquid of cyanide gold salt, nickel salt and/or secret salt is formed by electroplating 8/22 201111560. In the electroplating solution, although it contains gold cyanide salt, nickel salt and/or Ming salt, but for example, a specific example of a gold cyanide salt may be an atmosphere = gold unloading, a gold cyanide, a gasified gold material; a specific salt of a salt; for example, a crucible may be nickel sulfate or nitric acid Nickel, etc., specific examples of the starting salt, for example, it can be recorded from sulfuric acid, coffee bars, etc. The thickness of the gold salt in the working fluid, based on gold, should be 0.0001~0.4 m〇i/ Dm3, comparison = is 〇. 001~0·2 _3, more preferably _~〇"m〇1/dm3; nickel salt wave, based on nickel, should be 0.001~0.5 mol/dm3, The parts are 〇.〇l~〇.2_/dm3; the salt concentration is calculated from the beginning, = 0.001 ~ 0.5 m_m3, preferably G G1~Q 2 mGl / dm3. Recording liquid gold and nickel and / fine At the time ((10) ridge rotation secret is 0.01~300, more preferably 1~30. X oxygen I1 raw dressing liquid, preferably further containing a wrong agent. Used as the wrong agent, For example, it can be wrong Organic acid, inorganic acid or its salt for mouth action and pH buffering; used for organic acid, no ship and salt thereof, for example, it can be a smashed wine, scorpion, malic acid "The ratio of the concentration of the complexing agent in the ore dressing liquid is preferably 0.001 to 2.0 m〇1/dm3; in particular, it is determined by the concentration of the formic acid, the acid, the amine fluoric acid and the sodium I if salt, the ammonium salt and the like. Particularly preferred is 〇〇1~]〇_i/dm3, especially preferably 0.1~0.3 molAW. The ratio of the wrong agent in the plating solution and the recording/and/or narration (missing agent / (Ni+c〇)) The molar ratio is preferably from 0.01 to 100, more preferably from 丨 to 4. Further, the electric (10) dressing preferably further contains ammonia or ammonium ions. Specific examples of the ammonia or ammonium ion used are, for example, ammonia, ammonium amide, an ammonium salt of a complexing agent, and the like. Ammonia or ammonium in the ore solution 9/22 201111560 The concentration should be 〇·_~5.0 mQl/dm3, especially for the average particle size and fine crystal of the so-called crystal phase of ~2 〇m δ hai The crystal form of the plated film of the volume fraction or the shape of the plating bath is highly correlated with the stability of the plating bath. Further, it is preferable that the pH of the electroplating solution is 3 to u; in particular, it is preferable that P "~9' is preferably about pH 6. The pH adjustment system can use a conventionally known pH such as ammonia water, potassium oxyhydroxide or the like. Further, in the electroless plating solution, the volume fraction, the average particle diameter, and the XRD pattern of the fine crystals of the plating film are not included in the electroplating solution. , #普硬,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, Various kinds of additives such as an interface-active enthalpy, a granule, and the like, which are used for the purpose of the purpose of the present invention, and the like, and the like. Bulletin. Although an electric plating condition is not particularly limited, a plating temperature of 20 to 95 C, particularly 50 to 90 ° C is particularly suitable. The cathode current density also varies depending on the composition of the bonding liquid, although there is no Limitation of the system, however in the current density domain (eg ' Between mA/cm2 and less than 1〇-兮 and 屯 屯 ( ( (for example, more than 1〇mA/cm2 to 2〇〇mA/cm2 or less), both of them can be finely crystallized_Unshaped hybrid gold alloy A plating film may be used. Further, an insoluble anode such as platinum may be used on the anode. Further, nickel and/or cobalt may be used as the anode. On the other hand, as a mineralizer, for example, it It may be a metal material such as copper or nickel used for electric wiring or the like. Such a metal material may be a base layer formed on a metal substrate or a non-metal substrate, and although not 10/ 22 201111560 It is possible to use either or not, but it is preferable to carry out the bonding under the mixing; in addition, it is also possible to apply a current by using a pulse current. Hereinafter, the present invention will be specifically described by way of examples and comparative examples. The invention is not limited to the following examples. In the examples, the methods and conditions for each analysis and measurement are as follows. [Crystallinity, crystal grain size] RINT2100_ultima+: XRD method manufactured by Rigaku Corporation CuK 〇ί (40 kV/4〇niA) or HF-2200 manufactured by Hitachi High-Tech Co., Ltd.: TEM and THEED method 'Acceleration voltage 200V bright field image [volume fraction] Using HF-2200 manufactured by Hitachi High-Technologies Co., Ltd.: TEM method and THEED method, accelerating voltage 200V bright field image [metal composition] using SEA5100 manufactured by SII Technology Co., Ltd.: EDXRF method [measurement of non-metallic elements] EMI-920V manufactured by Horiba, Ltd., TC-436 (Knoop hardness) manufactured by LECO, USA JISZ2251, the measurement: the load of the 5 gf load holding time of 30 seconds was measured for the 30/zm thick plating film formed on the copper plate. [Specific resistance] K-705RS manufactured by Kyowa Ryokan Co., Ltd.: measured based on JIS K7194 ( Four-probe method) soil [Example 1] ^

L 使用含有 KAu (CN)2 0.035 mol/dm3、NiS04 · 6h2〇 11/22 201111560 〇_〇76 mol/dm3、檸檬酸三銨 〇 21 _ 硫酸將pH調整成6的電性鑛敷液,於^产=Κ0Η及 密度lOmA/cm2在純度為99.96°/。之、、以電流 非定形混雜金合金職峨厚丨_)。結晶_ 使用白金被覆鈦電極(網狀);狀錢1^極上係 烈的麟。 邊中的錄浴進行激 藉由XRD、TEM及TH卿分析所得到的微細結晶_ 非定形混雜金合金鍍敷膜。將XRD曲 將舰照纽職D_於第: ^^曲^之二,度㈣具有微細結晶或非定;有的 ,+値幅度1度以上之寬廣峰。又,在tem照片 祭到:結晶特有的結晶紋和奴形财的不規則構造之混 =的樣子。再者,在THEED圖上可觀察到:結晶特有的 ^射斑點和非定形特有的中空環之混雜的樣子4此結 果可知·所得到的鍍敷膜係具有微細結晶-非定形混雜 構造:又’觀察TEM照片的結果,可知:微細結晶的平 均粒棱為10 nm,而微細結晶相的體積分率為观。另一 方面,對所得到的微細結晶_非定形混雜金合金鍍敷膜進 行組成分析、努普硬度及比電阻之献。被檢測出的含有 率:金屬元素部分是金為41.2原子% '鎳為46.0原子%; 非金屬元素部分.碳為13 8原子%。努普硬度為; 比電阻為89// Ω · cm。 〔實施例2〕 、除了添加η-丙醇2〇V〇LQ/。以外,以和實施例i同樣地 進行錄敷,對於所得到的鑛敷膜進行X RD、tem及 ΤΗΕΕΓ)分析。將XRD曲線圖示於第1圖中,將TEM照 12/22 201111560 之圖不於第5〜7圖中。可確認:在XRD曲線 产彳择、又附近具有微細結晶或非定形特有的峰半値幅 ^上之寬廣峰。又,在而照片中可觀察到:結 ^。里^!結晶紋和非定形特有的不規則構造之混雜的樣 點和非ΐ ’在THEED圖上可觀察到:結晶特有的繞射斑 知.上形特有的中空環之混雜的樣子。由此結果,可 =到的it敷膜係具有微細結晶_非定形混雜構造。 UEM照片的結果’可知:微細結晶的平均粒徑 ,、、、nm,而微細結晶相的體積分率為50%。另一方面, 购田結晶-非定形混雜金合金鍍敷膜進行組成 1_ x普硬度及比電阻之測定。被檢測出的含有率:金 蜀几素部分是金為4δ1原子%、鎳為381原子%。非金屬 cm 兀素"卩分.碳為12.8原子°/°。努普硬度為Hk348;比帝陌 為89// Q 电 〔實施例3〕 除了#•檬酸濃度設為0.143 mol/dm3、氨濃度設為j 2 mol/dm、電流密度丨mA/cm2(通電時間5〇秒)和沁 ^A/cW通電時間5秒)毫髮不差地交互進行電解鑛敷以 外’和貫施例i同樣地進行鑛敷,對於所得到的 行XRD、ΊΈΜ及THEED分析。將XRD曲線圖示於第! 圖中,將TEM照片及THEED圖示於苐8〜1〇圖中。可確 認:在XRD曲線之2㈣0度附近具有微細結晶或非定形 特有的峰半値幅度1度以上之寬廣峰。又,在TEM照片7 t可觀察到:結晶特有的結晶紋和非定形特有的不規則 造之混雜的樣子。再者,在THEED圖上可觀察到:結仏 特有的繞射斑點和非定形特有的中空環之混雜的樣子。定。 13/22 201111560 電流鐘敷的情況下’電流密度1 mA/cm2時只得到結晶相, 而10 mA/Cm2時只得到非定形相。由此結果,可知:脈衝 鍍敷所得到的鍍敷膜係具有微細結晶-非定形混雜構造。 又,觀察TEM照片的結果,可知:微細結晶的平均粒徑 為10nm,而微細結晶相的體積分率為6〇%。另一方面^ 對所得到的職膜進行組成分析、努#硬度及比電阻之 定。被檢測出的含有率··金屬元素部分是金為474料 %、鎮為47.0原子%。非金屬元素部分:碳為5·6原子%。 努’曰’硬度為Hk 222,比電阻為57 # Q · cm。 〔實施例4〕 ^ 又5又疋钩、氨濃度設定 】.2m〇l/dm、f流密度設定為5〇誕_2料 ^樣地進行錄,將所得到的非定形金合金鍍敷ς二 火溫度(保溫溫度)4〇〇t、昇溫速度1〇。〇分、' 行退火處理,對所得到的織Si; muheed分析。將XRD曲線 中,將TEM照片及THEED圖示 3二弟^ 認:在XRD曲绩夕^ A U圖中。可今 特有的峰半鋪度1度以上之寬騎。又,开 令可觀察到:結晶特有的結曰曰和在TEM照片 造之混雜的樣子。再者,規則捐 特有的繞射珊和非定形特有財 =、到.結晶 轧雜構造。又,顴宛 铽、礼日日-非定形 的平均粒徑為15 ' 的結果’可知:微細結晶 〔實施例5〕微細結晶相的體積分率為_〇。 14/22 201111560L Use an electrical ore solution containing KAu (CN) 2 0.035 mol/dm3, NiS04 · 6h2〇11/22 201111560 〇_〇76 mol/dm3, triammonium citrate 21 _ sulfuric acid to adjust the pH to 6. ^Production = Κ0Η and density lOmA/cm2 in a purity of 99.96 ° /. The current is non-shaped, mixed with gold alloys, thick 丨 _). Crystallization _ Use titanium to cover the titanium electrode (mesh); The bath in the side was subjected to a fine crystal _ amorphous carbon alloy plating film obtained by XRD, TEM, and TH analysis. The XRD song will be the ship's new job D_ in the first: ^^曲^2, degree (four) has fine crystal or undetermined; some, +値 amplitude of more than 1 degree wide peak. In the tem of the tem, it is the result of the mixture of the irregular structure of the crystallization of the crystal. Furthermore, it can be observed on the THEED diagram that the crystal film is unique and the hollow ring of the amorphous shape is mixed. 4 The results show that the obtained plating film has a fine crystal-deformed hybrid structure: 'As a result of observing the TEM photograph, it is found that the average grain edge of the fine crystal is 10 nm, and the volume fraction of the fine crystal phase is a view. On the other hand, composition analysis, Knoop hardness and specific resistance of the obtained fine crystal_unshaped mixed gold alloy plating film were carried out. The detected content ratio: the metal element portion is 41.2 atom% of gold 'nickel is 46.0 atom%; the non-metal element portion. carbon is 138 atom%. The Knoop hardness is; the specific resistance is 89// Ω · cm. [Example 2] In addition to the addition of η-propanol 2〇V〇LQ/. The recording was carried out in the same manner as in Example i, and X RD, tem, and ΤΗΕΕΓ) were analyzed for the obtained mineral film. The XRD curve is shown in Fig. 1, and the TEM image 12/22 201111560 is not shown in Figs. 5 to 7. It can be confirmed that in the XRD curve, there is a wide peak in the vicinity of the peak and half width of the fine crystal or amorphous. Also, in the photo, it can be observed: knot ^. In the THEED diagram, it is observed that the crystallized pattern and the non-form-shaped irregular structure are mixed with each other. The diffraction pattern unique to the crystal is known. The mixed shape of the hollow ring unique to the upper shape. As a result, the positive film which can be obtained has a fine crystal_unshaped hybrid structure. The result of the UEM photograph showed that the average particle diameter of the fine crystals was nm, and the volume fraction of the fine crystal phase was 50%. On the other hand, the purchase of crystalline crystallization-non-formed hybrid gold alloy plating film was carried out to determine the composition of 1_x hardness and specific resistance. The detected content ratio is: gold is 4δ1 atom%, and nickel is 381 atom%. Non-metallic cm 兀素"卩. Carbon is 12.8 atoms ° / °. Knoop hardness is Hk348; it is 89// Q electricity than Timo (Example 3) except that the concentration of citric acid is set to 0.143 mol/dm3, the concentration of ammonia is set to j 2 mol/dm, and the current density is 丨mA/cm2 ( The energization time is 5 sec.) and the 沁^A/cW energization time is 5 seconds. The electroless mineralization is carried out in the same way as the electrolysis. The mineralization is performed in the same manner as in the example i, and the obtained XRD, ΊΈΜ and THEED analysis are performed. . The XRD curve is shown in the first! In the figure, the TEM photograph and the THEED graph are shown in Fig. 8~1〇. It is confirmed that there is a broad peak with a peak radius of 1 degree or more unique to the fine crystal or amorphous shape in the vicinity of 2 (four) 0 degrees of the XRD curve. Further, in the TEM photograph 7 t, it was observed that the crystal grains characteristic of crystals and the irregularities unique to the amorphous form were mixed. Furthermore, it can be observed on the THEED chart that the characteristic diffraction pattern of the knot is mixed with the hollow ring unique to the amorphous shape. set. 13/22 201111560 In the case of current clock application, only the crystal phase is obtained at a current density of 1 mA/cm2, and only the amorphous phase is obtained at 10 mA/cm2. As a result, it was found that the plating film obtained by pulse plating had a fine crystal-unshaped hybrid structure. Further, as a result of observing the TEM photograph, it was found that the average crystal grain size of the fine crystals was 10 nm, and the volume fraction of the fine crystal phase was 6 % by weight. On the other hand, the composition of the obtained film is analyzed by composition, hardness, and specific resistance. The detected content rate of the metal element is 474% of gold and 47.0% by atom of the town. Non-metallic element portion: carbon is 5.6 atom%. The hardness of the 曰'曰' is Hk 222, and the specific resistance is 57 # Q · cm. [Example 4] ^ 5 and 疋 hook, ammonia concentration setting]. 2m〇l/dm, f flow density was set to 5 _2 _2 material sample, and the obtained amorphous gold alloy was plated. The temperature of the second ignition (insulation temperature) is 4 〇〇 t, and the heating rate is 1 〇. The enthalpy, 'row annealing treatment, the obtained woven Si; muheed analysis. In the XRD curve, the TEM photo and the THEED icon are recognized by the second brother: in the XRD score ^ ^ A U map. This is a unique peak with a width of 1 degree or more. Also, the order was observed to be: the characteristic knots of the crystals and the appearance of the TEM photographs. In addition, the regular donation of the special and the non-formal special wealth =, to the crystallization of the mixed structure. Further, the results of the average particle diameter of the 颧 铽 礼 礼 礼 礼 礼 ’ ’ ’ ’ 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微 微14/22 201111560

使用含有 KAu (CN)2 0.035 mol/dm3、C0SO4 · 7H2O 0.076 mol/dm3、擰檬酸·Η20 0.1 mol/dm3、氨濃度設為 〇 44 mol/dm3並經以KOH及硫酸將pH調整成6的電性鍍敷液, 於溫度7(TC、以電流密度10mA/cm2在純度為99.96%之銅 板上形成微細結晶-非定形混雜金合金鑛敷膜(膜厚l#m)。 另外’在陽極上係使用白金被覆鈦電極(網狀);對於鑛敷 中的鍍敷浴進行激烈的攪拌。 藉由XRD、TTEM及THEED分析所得到的微細結晶一 非定形混雜金合金鍍敷膜。將XRD曲線圖示於第丨圖中, 將TEM照片及THEED圖示於第14〜16圖中。可確認: 在XRD曲線之2 6> =40度附近具有微細結晶或非定形特有 的峰半値幅度1度以上之寬廣峰。又,在TEM照片中可 觀察到.結晶特有的結晶紋和非定形特有的不規則構造之 混雜的樣子。再者,在THEED圖上可觀察到:結晶特有 的繞射斑點和非定形特有的中空環之混雜的樣子。由此結 果,可知:所得到的鍍敷膜係具有微細結晶_非定形混雜 構造。又,觀察TEM照片的結果,可知y数細結晶的平 均粒徑為5 nm,而微細結晶相的體積分率為15%。另一 方面,對所得到的微細結晶-非定形混雜金合金鍍敷膜進 行組成分析、努普硬度之測定。被檢測出的含有率:金屬 元素部分是金為36.4原子%、鈷為40.6原子非金屬元 素部分:碳為23.0原子%。努普硬度為Hk 18〇。 〔比較例1〕Use KAu (CN)2 0.035 mol/dm3, C0SO4 · 7H2O 0.076 mol/dm3, citric acid Η20 0.1 mol/dm3, ammonia concentration 〇44 mol/dm3 and adjust the pH to 6 with KOH and sulfuric acid. The electroplating solution is formed into a fine crystal-deformed mixed gold alloy ore film (film thickness l#m) at a temperature of 7 TC at a current density of 10 mA/cm 2 on a copper plate having a purity of 99.96%. On the anode, a titanium electrode (mesh) was coated with platinum; the plating bath in the ore was vigorously stirred. The fine crystal-amorphous hybrid gold alloy plating film obtained by XRD, TTEM and THEED analysis. The XRD curve is shown in the figure, and the TEM image and THEED chart are shown in Figures 14 to 16. It can be confirmed that there is a fine crystal or amorphous specific peak half-turn amplitude near 2 6 > = 40 degrees of the XRD curve. Wide and broad peaks of 1 degree or more. In addition, in the TEM photograph, it is observed that the crystal grains unique to the crystal and the irregular structure unique to the irregular shape are observed. Further, on the THEED map, it is observed that the crystal is uniquely wound. a mixture of spots and amorphous hollow rings. The result is It is understood that the obtained plating film has a fine crystal-unshaped hybrid structure. Further, when observing the results of the TEM photograph, it is found that the average particle diameter of the y-number fine crystal is 5 nm, and the volume fraction of the fine crystal phase is 15%. On the other hand, composition analysis and Knoop hardness of the obtained fine crystal-unshaped mixed gold alloy plating film were measured. The detected content ratio: metal element portion was 36.4 atom% of gold, and cobalt was 40.6. Atomic non-metallic element portion: carbon is 23.0 atom%. Knoop hardness is Hk 18 〇. [Comparative Example 1]

除了擰檬酸濃度設定為0.143 mol/dm3、氨漢度設定為 0.46 mol/dm3以外,和實施例1同樣地進行鍍敷,並對所4 得到的鍍敷膜進行XRD、TEM及THEED分析。將XRD 15/22 201111560 曲線圖不於第1圖中,將TEM昭 17〜18圖t。可確切·户咖;、'片及扭咖圖示於第 r ]確〜·在XRD曲線之20=4〇卢 非定形特有的峰半値幅度1度以上之寬廣峰乂在^ =中可以確認非定形特有的不規則構造,但不二= 如結晶粒界及結缺之這樣制的構造。再者 圖中可以確認非定職有的Μ環。由此結果可知 到的鑛敷膜是不具有微細結晶的均質非定形構造。又,測 定所得到的鍍敷_組成分析、努t硬度及比電阻。被檢 測出的含有率:金屬元素部分是金為料%、 67.5原子% ;非金屬元素部分··碳為17 3原子。/。。努普硬 cm 度為Hk 435 ;比電阻為251μ Ω 〔比較例2〕 使用含有 KAu (CN)2 0.04 mol/dm3、NiS04 · 6H20 〇·〇085 mo〖/dm3、檸檬酸· h2〇。5 m〇1/dm3、‘〇h 〇2.7 mol/dm3並經以硫酸將pH調整成3·5的電性鍍敷液,於溫 度30°C、以電流密度1〇 mA/cm2在純度為99 %%之銅板 上形成硬質金鍍敷膜(膜厚1/zm)。另外,在陽極上係使用 白金被覆鈦電極(網狀);對於鍍敷中的鍍敷浴進行緩慢的 攪拌。 ’ 藉由XRD、TEM及THEED分析所得到的硬質金鍍 敷膜。將XRD曲線圖不於第1圖中。可確認··在XRD曲 線之2 Θ =38度附近具有來自Au (111)之尖銳峰。又,從 TEM照片及THEED圖亦可確認出結晶。由此結果,可知: 所得到的鑛敷膜係不具有非定形相之多結晶構造。又,從 XRJD曲線圖計算出的結果,可知:結晶的平均粒徑為u nm。另一方面,測定所得到的鍍敷膜之組成分析、努普硬 16/22 201111560 度及比禮。被檢測出的含有率:金屬元素部分是金為 96.5原子/。、鎳為〇.77原子% ;非金屬元素部分:碳為u 原子%。努普硬度為Hkl6〇;比電阻為17;^ .cm。 另外,在第1圖所示的XRD曲線之2θ=50。附近所 見到的尖銳峰係由基板之鋼所引起的。 又’相對於在金鐘敷膜中被認為高硬度的無添加硬金 (AFHG)、鎳硬金(NiHG)、c〇HG的努普硬度仍達不到他 200的程度而言’可知:實施例1之微細結晶-非定形混雜 金合金鍍敷膜的努普硬度係具有相當於彼等的2〜3仵 硬度。 17/22 201111560 < ί吞势-' io.o 寸0.0 ·0 ·0The plating was performed in the same manner as in Example 1 except that the concentration of the citric acid was 0.143 mol/dm 3 and the ammonia degree was set to 0.46 mol/dm 3 , and the obtained coating film was subjected to XRD, TEM, and THEED analysis. The XRD 15/22 201111560 graph is not in Fig. 1, and the TEM is shown in Fig. 17~18. Can be exact · household coffee;, 'slices and twisted coffee icon in the r r = indeed ~ · in the XRD curve of 20 = 4 〇 Lu non-formed peaks and widths of more than 1 degree wide and wide peak 乂 can be confirmed in ^ = An irregular structure unique to amorphous, but not the same as the structure of crystal grain boundaries and knots. In addition, the figure can confirm the ring of non-scheduled positions. From this result, it was found that the mineral coating film was a homogeneous amorphous structure having no fine crystals. Further, the obtained plating_composition analysis, hardness, and specific resistance were measured. The measured content ratio: the metal element portion is gold as a material %, 67.5 atom%; the non-metal element portion · carbon is 17 3 atoms. /. . Knoop hard cm degree is Hk 435; specific resistance is 251 μ Ω [Comparative Example 2] The use of KAu (CN) 2 0.04 mol / dm 3 , NiS04 · 6H20 〇 · 〇 085 mo 〖 / dm3, citric acid · h2 〇. 5 m〇1/dm3, '〇h 〇2.7 mol/dm3 and adjusted to pH 3.5 by electroless plating with sulfuric acid at a temperature of 30 ° C at a current density of 1 〇 mA / cm 2 in purity A hard gold plating film (film thickness 1/zm) was formed on 99%% of the copper plate. Further, a titanium-coated titanium electrode (mesh) was used on the anode; the plating bath in the plating was slowly stirred. Hard gold plating film obtained by XRD, TEM and THEED analysis. The XRD plot is not shown in Figure 1. It is confirmed that there is a sharp peak derived from Au (111) in the vicinity of 2 Θ = 38 degrees of the XRD curve. Further, crystals were confirmed from the TEM photograph and the THEED map. From this result, it was found that the obtained mineral coating film did not have a polycrystalline structure of an amorphous phase. Further, from the results calculated from the XRJD graph, it was found that the average particle diameter of the crystal was u nm. On the other hand, the composition analysis of the obtained plating film was measured, and Nup Hard 16/22 201111560 degrees and ritual. The detected content ratio: the metal element portion is gold of 96.5 atoms/. Nickel is 7777 atom%; non-metal element part: carbon is u atom%. The Knoop hardness is Hkl6〇; the specific resistance is 17; ^.cm. Further, 2θ=50 of the XRD curve shown in Fig. 1 . The sharp peaks seen nearby are caused by the steel of the substrate. In addition, it is 'relative to the degree that the Knoop hardness of the non-added hard gold (AFHG), nickel hard gold (NiHG), and c〇HG which are considered to be high hardness in the Admiralty film is still less than 200. The Knoop hardness of the fine crystal-non-shaped mixed gold alloy plating film of Example 1 has a hardness of 2 to 3 Å equivalent to those of the Knoop. 17/22 201111560 < ί吞势-' io.o inch 0.0 ·0 ·0

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alH IAI3H (2X % i %屮噼 %s %屮唼 。/0屮啤 ialH IAI3H (2X % i %屮噼 %s %屮唼 ./0屮啤酒 i

锆€-11Hs If/fpf 〇K.窗_# ^£s §9 .osoo qII9 .os!N ~(δ) ny>I dss ss^ 0 03 1N nv^4- nil®,- $ 18/22 201111560 【圖式簡單說明】 第1圖係顯示在實關卜2、3、4、5所得到之微細 結晶-非定形混雜金合金鍍敷膜及在比較例丨、2所得到之 金合金鑛敷膜的XRD曲線圖之圖。 第2圖係顯不在實施例1所得到之微細結晶_非定形 混雜金合金鍍敷膜的TEM照片(1〇萬倍)之圖。 v 第3圖係顯$在實施例丨所得到之微細結晶·非定形 混雜金合金鍍敷膜的TEM照片(1〇〇萬倍)之圖。 乂 第4圖係顯示在實施例丨所得到之微細結晶·非定形 混雜金合金鍍敷膜的THEED圖之圖。 ’ 第5圖係顯示在實施例2所得到之微細結晶-非定形 混雜金合金鍍敷膜的TEM照片00萬倍)之圖。 乂 第6圖係顯示在實施例2所得狀微細結晶_非定形 混雜金合金鍍敷膜的TEM照片(1〇〇萬倍)之圖。 夕 第7圖係顯示在實施例2所得到之微細結晶·非定形 混雜金合金鍍敷膜的THEED圖之圖。 y 弟8圖係顯示在實施例3所得到之微細結 混雜金合金鍍敷膜的TEM照片(3〇萬倍)之圖。 第9圖係顯示在實施例3所得到之微細結晶-非疾 混雜金合金鍍敷膜的TEM照片(1〇〇萬倍)之圖。 第1〇圖係顯示在實施例3所得到之微細結晶-非定 混雜金合金鍍敷膜的THEED圖之圖。 第11圖軸示在實劇4所得到之微細結晶-非定 混雜金合金鍍敷膜的TEM照片(20萬倍)之圖。 第12圖係顯示右宭·你存j 4 z, 隹貝把1夕』所仵到之微細結晶-非定 混雜金合金鍍敷膜的TEM照片(70萬倍)之圖。 19/22 201111560 第13圖係顯示在實施例4所得到之微細結晶_非定形 混雜金合金鑛敷膜的THEED圖之圖。 第14圖係顯示在實施例5所得到之微細結晶_非定形 混雜金合金鑛敷膜的TEM照片(40萬倍)之圖。 第15圖係顯示在實施例5所得到之微細結晶_非定形 混雜金合金鍍敷膜的TEM照片(1〇〇萬倍)之圖。 乂Zirconium €-11Hs If/fpf 〇K. Window_# ^£s §9 .osoo qII9 .os!N ~(δ) ny>I dss ss^ 0 03 1N nv^4- nil®,- $ 18/22 201111560 [Simple description of the diagram] The first figure shows the fine crystal-unshaped hybrid gold alloy plating film obtained in the real 2, 3, 4, and 5, and the gold alloy ore obtained in the comparative example 2, 2 A diagram of the XRD plot of the film. Fig. 2 is a view showing a TEM photograph (100,000 times) of the fine crystal_unshaped mixed gold alloy plating film obtained in Example 1. v Fig. 3 is a diagram showing a TEM photograph (100,000 times) of a fine crystal/non-form hybrid gold alloy plating film obtained in Example 。.乂 Fig. 4 is a view showing the THEED chart of the fine crystal/non-shaped hybrid gold alloy plating film obtained in the example. Fig. 5 is a view showing a TEM photograph of 00 million times of the fine crystal-non-shaped hybrid gold alloy plating film obtained in Example 2. Fig. 6 is a view showing a TEM photograph (100,000 times) of the fine crystal_non-shaped mixed gold alloy plating film obtained in Example 2. Further, Fig. 7 is a view showing the THEED chart of the fine crystal/non-shaped hybrid gold alloy plating film obtained in Example 2. A TEM photograph (300,000 times) of the fine-junction mixed gold alloy plating film obtained in Example 3 is shown in Fig. 8 . Fig. 9 is a view showing a TEM photograph (100,000 times) of the fine crystal-non-disease gold alloy plating film obtained in Example 3. Fig. 1 is a view showing the THEED chart of the fine crystal-definite hybrid gold alloy plating film obtained in Example 3. Fig. 11 is a view showing a TEM photograph (200,000 times) of a fine crystal-definite hybrid gold alloy plating film obtained in Shimon. Fig. 12 shows a TEM photograph (700,000 times) of the fine crystal-definite hybrid gold alloy plating film that the 宭 宭 你 存 4 4 4 4 。 。 。 。 。 。 。 。 。 。 。 。. 19/22 201111560 Fig. 13 is a view showing the THEED diagram of the fine crystal_unshaped hybrid gold alloy ore film obtained in Example 4. Fig. 14 is a view showing a TEM photograph (400,000 times) of the fine crystal_unshaped mixed gold alloy ore film obtained in Example 5. Fig. 15 is a view showing a TEM photograph (100,000 times) of the fine crystal_unshaped mixed gold alloy plating film obtained in Example 5.乂

第16圖係顯示在實施例5所得到之微細結晶-非定形 混雜金合金鍍敷膜的THEED圖之圖。 J 第17圖係顯示在比較例1所得到之非定形金合金錄 敷膜的TEM照片(100萬倍)之圖。 又 第18圖係顯示在比較例1所得到之非定形金合金鑛 敷膜的THEED圖之圖。 ,' 【主要元件符號說明】 鉦 20/22Fig. 16 is a view showing the THEED chart of the fine crystal-deformed mixed gold alloy plating film obtained in Example 5. J Fig. 17 is a view showing a TEM photograph (1 million times) of the amorphous gold alloy recording film obtained in Comparative Example 1. Further, Fig. 18 is a view showing the THEED chart of the amorphous gold alloy ore film obtained in Comparative Example 1. , ' [Main component symbol description] 钲 20/22

Claims (1)

201111560 七、申請專利範圍: L 一種鍍_,係金合金,_, 形相混雜所形成者。 巧田、、、口日日相和非定 ^請專利範圍第i項所記叙難& 積分率為10〜90%。 。日日相的體 =請專鄕_丨_記叙則纽 均粒徑為3〇nm以下。 ,、、、〇日日相的平 如申請專利範圍第i項所記载之鑛敷膜, 圍第5項中任-項所記载之鍍敷膜, 八努曰硬度(Kn〇op hardness Hk 18〇以上。 第1項所記载之物— 如申請專利範圍第i項所記载之錢敷膜,其為以 Au則-x-yMxCy (式中,Au 或 M % 工. Co ; C A石卢.1 ®工〇/〆 々土攻刀,M為Ni及/或 原调表“ /、u謝原子% ; 1原伽难 專職圍第1·—魏,麵為電性接 載:Γ形成如申請專利範圍第… 金鹽、_ Met職_紐鍍敷液,且包括氰化 金瓜録I及/或始鹽、錯合劑及 10.如申請專利範圍第9項 正4〇 劑是從檸檬酸、酒石酸性織液,其中錯合 磺酸及彼等之納鹽、卸聰、:比°疋?酸、碌酸、胺 …上;又,帅整;為氨;所選取的… 2. 3. 4. 5. 6. 7. 8. 9. 21/22 201111560 11. 12. 13. 利範圍第Η)項所記載之電性鑛敷液,其中錯合 d為榉棣酸;pH調整劑為氨水。 申,5法:係金合金鍍敷祺之形成方法,為使用如 上^士Γ81第9項所記載之電性鍍敷液,在被鍍敷物 -二;i晶相與非定形減雜而成的金合金鍍敷膜。 項中’係由制如申請糊顯第1至8 噶所5己载之鍍敷膜而成。 22/22201111560 VII. Patent application scope: L A type of plating _, a gold alloy, _, a mixture of shapes. Qiao Tian,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, . The body of the sun and the sun = please specialize _ _ _ statistical New York average particle size of 3 〇 nm or less. ,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, Hk 18〇 or more. The substance described in Item 1 - as described in the patent application scope item i, which is in the form of Au -x-yMxCy (wherein, Au or M % work. Co; CA Shilu. 1 ® work / earth attack, M is Ni and / or original adjustment table " /, u Xie atom%; 1 original gamma full-time full-scale 1 · Wei, the surface for electrical pick-up : Γ formation as in the scope of the patent application... Gold salt, _ Met job _ New plating solution, and including cyanide gold melon I and / or starting salt, wrong agent and 10. If the patent scope of the ninth item Is from citric acid, tartaric acid woven liquid, which is mismatched with sulfonic acid and their sodium salts, unloading,: than 疋 疋 acid, citric acid, amines; and, handsome; ammonia; selected ... 2. 3. 4. 5. 6. 7. 8. 9. 21/22 201111560 11. 12. 13. The electrical ore liquid described in item 利), where the mismatch d is tannic acid The pH adjuster is ammonia water. Shen, 5 method: the formation method of gold alloy plating In order to use the electroplating solution described in item 9 of the above-mentioned Γ Γ 81, a gold alloy plating film is formed by subtracting impurities between the crystal phase and the amorphous phase of the object to be plated. It is made of the coated film of the 5th to the 5th.
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