200813459 九、發明說明： 【發明所屬之技術領域】 本發明财關於―制試纟統 ;係關於-種按鍵測試系統及方法。丨更斤而吕之’ 【先前技術】 、按鍵置都具有可供使用者操作的按鍵， 進響了使用者對電子裝置的功能操控，因 此對域進行測試係為產品出薇前的 =式技術多藉由單晶片機控制，亦即，將單晶目，的 讀ms機與按鍵板（swi灿―）電性連接， 含有複數按鍵之電路板，而此種測試方法 ⑴測试人員需要熟悉單晶片機的硬體電路 早晶片機的輪入輸出接聊及連接'、叔 與按鍵板電性迷接，而不同型號的：此:::二機 二:r量與位置亦不同，若更換另-型號的單= 則早曰曰片機與按鍵板即需要 義 機測試按鍵的技術，其硬體接電種藉由單晶片 改硬體連接電路亦則浪費==路不具有通用性，而更 ⑵賴人員需要—定程度的單晶片機程式編寫義 礎，。由於不同型號的單晶片機，其軟體設計亦不同、^ 5式耘式燒錄於單@ μ機㈣,^ " 取亦不可更改〇 原碼即不可讀 即需要重新編寫及重新^于。=^晶片機’則測試程式 垔新燒錄。故此種藉由單晶片機测試按 19646 5 200813459 =技其軟體測試程式亦不具有通用性，而重新 測試程式同樣會浪費測試時間。 ’、、’… (3)受單晶片機的功能限制，測試程式僅能 鍵好壞而缺乏對測試結果 二 ==⑽，、測試總量及良品率ί 數量限二錄二又，叉早晶片機的輸入輸出接腳的 ^ 一次僅能測試一個或少量的按 此種藉由單晶片機測試按鍵的技術既不利於測試人3 二鍵板測式貧料的追蹤管理’又不適用於按鍵板的大量測 為此’如何提供—種能實現❹m祕與節省測試時 間之功效’復能提供按鍵板測試資料之追縱管理，並適用 於按鍵板之大量測試的按鍵測試系統及方法，以解決前述 習知按鍵測試技術之種種缺點，遂成為目前亟待解決 題。 ^ φ【發明内容】 雲於上述習知技術之缺點，本發明之主要目的在於提 供一種具有通用性之按鍵測試系統及方法。 本發明之另一目的在於提供一種按鍵測試系統及方 法，以節省測試時間。 本發明之再一目的在於提供一種按鍵測試系統及方 法’其能對按鍵板之測試結果進行處理，俾後續按鍵板測 試資料之追縱管理。 本發明之又一目的在於提供—種按鍵測試系統及方 19646 6 200813459 法’藉以實現按鍵板之大量測試。 - 為達上述之目的，本發明提供一種按鍵測試系統，其 包括：測試裝置，係用以電性連接具有至少一按鍵之按鍵 *板（SWltchB〇ard)，用以偵測該按鍵板之按鍵狀態；資料 ^處理裝置，係用以依據該測試裝置所偵測之按鍵板之按鍵 狀恶，記錄對應於該按鍵板之測試結果及按鍵板測試之統 计結果，並用以顯示該測試裝置所偵測之按鍵板之按鍵狀 ；態、測試結果及統計結果；以及傳輸介面，係電性連接該 、⑩測試裝置及資料處理裝置，用以將該測試裝置所偵測之按 鍵板之按鍵狀態傳輸至該資料處理裝置，該傳輸介面係為 周邊元件介面（Peripheral C⑽ponent Interface; PCI) 及萬用串列匯流排（Universal Serial Bus; USB)之其中 一者。 於本發明之一種型態中，該資料處理裝置進一步包 括：設定模組，係用以設定對應於按鍵狀態之顯示方式， _並用以建立該按鍵板及按鍵之位置分佈與該測試裝置所 偵測之按鍵板及按鍵之實體位置的對應關係；讀取模組， 係用以讀取該傳輸介面所傳輸之該測試裝置所偵測之按 鍵板之按鍵狀態；記錄模組，係用以依據該讀取模組所讀 取之按鍵板之按鍵狀態記錄對應於該按鍵板之測試結果 及知:鍵板測試之統計結果；顯示模組，係用以提供按鍵測 试視窗’該按鍵測試視窗係用以顯示該按鍵板及按鍵之位 置分佈、該記錄模組所記錄之對應於該按鍵板之測試結果 及按鍵板測試之統計結果，並用以依據該設定模組所設定 7 19646 200813459 之顯示方式及所建立之對應關係顯示該讀取模組所讀取 -,按鍵板之按鍵狀態；以及儲存模組，係用以儲存該記錄 核組所記錄之對應於該按鍵板之測試結果及按鍵板測試 • 之統計結果。 於本發明之一種型態中，該設定對應於按鍵狀態之顯 不方式，係指設定不同的按鍵狀態對應於不同的顯示 ‘彩。 *、 • 透k鈉述本發明之按鍵測試糸統，本發明復提供一種 、按鍵測試方法，係包括下述步驟：設定對應於按鍵狀態之 顯示方式，並建立按鍵板及按鍵之位置分佈與該測試裝置 所偵測之按鍵板及按鍵之實體位置的對應關係；電性連接 該按鍵板與該測試裝置；顯示該按鍵板及按鍵之位置分 佈；讀取該傳輸介面所傳輸之該測試裝置所偵測之按鍵板 之按鍵狀態；依據所設定之顯示方式及所建立之對應關係 顯示所讀取之該按鍵板之按鍵狀態；依據所讀取之該按鍵 _板之按鍵狀態記錄對應於該按鍵板之測試結果及按鍵板 •測試之統計結果；顯示所記錄之對應於該按鍵板之測試結 _ 果及知7鍵板測试之統計結果；以及儲存該所記錄之對應於 該按鍵板之測試結果及按鍵板測試之統計結果，其中，該 傳輸介面係為周邊元件介面（peripherai Component Interface; PCI)及萬用串列匯流排 〇jniversal Serial Bus; USB)之其中一者。 於本發明之一種型態中，該設定對應於按鍵狀態之顯 示方式’係指設定不同的按鍵狀態對應於不同的顯示色 8 19646 200813459 彩。 ' '因此’本發明之按鍵測試系統及方法係藉由傳輸介面 將测4裝置所㈣之各按鍵板之按鍵狀態傳輸至該資料 .處理裝置並予以顯示及處理’測試人員能直接讀取按鍵之 ，測試結果及統計結果，且由於資料處理裝置之硬體及軟體 貧源強大，即無需再使用單晶片機對按鍵測試進行控制， 故能解決習知技術因使料W機㈣而導致硬體連接 ，電路、軟體測試程式不具㈣用性，以及㈣測試時間之 缺點。再者，本發明之按鍵測試系統利用了資料處理裝置 將測試時間、測試通過的按鍵位置、測試按鍵板的總量及 良品率予以儲存，藉此能使測試人員直接了解不良按鍵之 具體位^以及測試良品率，俾於測試人員對按鍵板測試進 订追知官理。另外，利用該資料處理裝置之強大硬體資源 可一次同時測試多個按鍵板並予以記錄，故本發明亦能適 用於按鍵板之大量測試。、 馨【實施方式】 一以下係藉由具體實例說明本發明之實施方式，熟悉此 技蟄之人士可由本說明書所揭示之内容輕易地瞭解本發 月m點與功效。纟發明亦可藉由其他不同的具體實 例加以施行或應用，本說明書中的各項細節亦可基於不同 觀點與應用，在不㈣本發明之精神下進行各種修飾與變 更。 上、/第1圖為一方塊示意圖，係用以顯示本發明之按鍵測 试系統之基本架構，如圖所示，該按鍵測試系統i係包括 19646 9 200813459 測試裝置li ’傳輸介面12，以及資料處理裝置13。 該測試裝置u，係電性連接具有至少一按鍵之按鍵 板（SwitchBoardMO’用以偵測各按鍵板1〇之按鍵狀態。 該測試裝置11能依據實際f要電性連接單—或複數個按 鍵板，於本實施例中，該測試裝置n係電性連接4個按 鍵板10，且每個按鍵板具有8個按鍵，該測試裝置u可200813459 IX. Description of the invention: [Technical field to which the invention pertains] The invention relates to a system for testing and testing;先前更斤和吕之' [Previous technology], the button has a user-operable button, which rang the user's function control of the electronic device, so the test of the domain is the product before the product The technology is controlled by a single-chip machine, that is, a single-chip, read-m machine and a keyboard (swican-) are electrically connected, and a circuit board containing a plurality of keys, and the test method (1) testers need Familiar with the hardware circuit of the single-chip machine, the wheel-in output and the connection of the early wafer machine, and the connection between the uncle and the button board, and different models: this::: two machine two: r quantity and position are also different, If you replace the other model's single = then the early die-cutting machine and the keypad need the technology of the prosthetic test button, and the hardware connection is also wasted by changing the single-chip to the hard-connected circuit. Sex, and more (2) the need for personnel - a certain degree of single-chip programming. Due to the different types of single-chip machines, the software design is different, and the type 5 is burned in a single @μ machine (4), ^ " can not be changed 〇 The original code is not readable, it needs to be rewritten and re-applied. =^The chip machine' is the test program. Therefore, the test by the single-chip machine according to 19646 5 200813459 = the software test program is not universal, and the re-testing program will also waste test time. ',, '... (3) Limited by the function of the single-chip machine, the test program can only be good or bad, and the test result is 2 ==(10), the total amount of the test and the yield rate ί, the quantity limit is two, and the fork is early. The input/output pin of the transputer can only test one or a small amount of the test button by the single-chip machine. This is not conducive to the tracking management of the tester 3. A large number of test of the button board is how to provide - the ability to achieve 秘m secret and save test time. 'Recovery provides key track test data management, and is suitable for button test system and method for a large number of test of keypad In order to solve the shortcomings of the aforementioned conventional button testing technology, it has become an urgent problem to be solved. ^ φ [Summary of the Invention] Cloud is a disadvantage of the above-mentioned prior art, and the main object of the present invention is to provide a universal button test system and method. Another object of the present invention is to provide a button test system and method to save test time. It is still another object of the present invention to provide a button test system and method that can process the test results of the keypad and track the subsequent test data of the keypad. Still another object of the present invention is to provide a button test system and a method for implementing a large number of test of a keypad. In order to achieve the above, the present invention provides a button test system, which includes: a test device for electrically connecting a button* board having at least one button to detect a button of the button board. The data processing device is configured to record the test result corresponding to the key panel and the statistical result of the keypad test according to the button-like evil of the keypad detected by the testing device, and display the test device The button shape of the detected button board; state, test result and statistical result; and the transmission interface is electrically connected to the 10 test device and the data processing device for the button state of the button board detected by the test device The transmission interface is transmitted to one of a peripheral component interface (Peripheral C (10) Pentent Interface; PCI) and a Universal Serial Bus (USB). In one aspect of the present invention, the data processing device further includes: a setting module configured to set a display mode corresponding to the state of the button, and configured to establish a position distribution of the keypad and the button and the test device is detected Corresponding relationship between the physical position of the button board and the button; the reading module is configured to read the button state of the button board detected by the test device transmitted by the transmission interface; the recording module is used for The button state record of the keypad read by the reading module corresponds to the test result of the keypad and the statistical result of the keyboard test; the display module is used to provide a button test window 'the button test window It is used to display the position distribution of the button board and the button, the test result recorded by the recording module corresponding to the button board, and the statistical result of the button board test, and is used to display the display according to the setting module 7 19646 200813459 The mode and the established relationship show that the read module reads - the button state of the button board; and the storage module is used to store the record core group record It corresponds to a test of the key board and key board test results • the statistical results. In one form of the invention, the setting corresponds to the display mode of the button state, which means that setting different button states corresponds to different display ‘color. *, • Through the button test system of the present invention, the present invention provides a button test method, which includes the steps of: setting a display mode corresponding to a button state, and establishing a position distribution of a button pad and a button; Corresponding relationship between the physical position of the button board and the button detected by the testing device; electrically connecting the button board and the testing device; displaying the position distribution of the button board and the button; reading the testing device transmitted by the transmission interface The state of the button of the detected button board; displaying the state of the button of the read button according to the set display mode and the established correspondence relationship; according to the read button status of the button_board corresponding to the button The test result of the keypad and the statistical result of the test panel; the test; the recorded statistical result corresponding to the test panel of the keypad and the statistical result of the 7-key board test; and the storage of the recorded corresponding to the keypad The test results and the statistical results of the keypad test, wherein the transmission interface is a peripheral component interface (PCI) and 10,000 Serial bus 〇jniversal Serial Bus; USB) of one person. In one form of the invention, the setting corresponds to the display mode of the button state' means that setting different button states corresponds to different display colors 8 19646 200813459. 'Therefore, the button test system and method of the present invention transmits the button state of each button board of the device (4) to the data through the transmission interface. The processing device displays and processes the tester. The tester can directly read the button. The test results and statistical results, and because the hardware and software of the data processing device are powerful, that is, there is no need to use the single-chip machine to control the button test, so that the conventional technology can be solved due to the material W (four) Body connection, circuit, software test program does not have (four) usability, and (d) shortcomings of test time. Furthermore, the button test system of the present invention utilizes a data processing device to store the test time, the position of the button passed through the test, the total amount of the test button board, and the yield rate, thereby enabling the tester to directly understand the specific position of the defective button. As well as testing the yield rate, the tester will judge the keyboard test. In addition, the powerful hardware resources of the data processing device can simultaneously test and record a plurality of keypads at a time, so that the present invention can also be applied to a large number of tests of keypads. [Embodiment] Hereinafter, embodiments of the present invention will be described by way of specific examples, and those skilled in the art can easily understand the point and function of the present month by the contents disclosed in the present specification. The invention may be carried out or applied by various other specific embodiments, and the various details in the specification may be variously modified and changed without departing from the spirit and scope of the invention. The upper/first diagram is a block diagram showing the basic structure of the key test system of the present invention. As shown in the figure, the button test system i includes 19646 9 200813459 test device li 'transport interface 12, and Data processing device 13. The test device u is electrically connected to a button board having at least one button (SwitchBoardMO' is used to detect the button state of each button board. The test device 11 can electrically connect a single button or a plurality of buttons according to the actual f In the embodiment, the test device n is electrically connected to the four keypads 10, and each of the keypads has eight buttons, and the testing device u can
分別偵測32個按鍵之按鍵狀態，亦即該些按鍵被按下後 疋否能正常發出其所代表的訊號。 該傳輸介面12’係電性連接該測試裝置u及資料處 理裝置13,用以將該測試裝置u所偵測之各按鍵板ι〇 之按鍵狀態傳輸至該資料處理裝置13。其中 面12係為周邊元件介面(Peripheralc卿賺nt傳輸"The status of the buttons of the 32 buttons is detected separately, that is, after the buttons are pressed, the signals represented by them can be normally sent out. The transmission interface 12' is electrically connected to the test device u and the data processing device 13 for transmitting the button state of each of the keypads detected by the test device u to the data processing device 13. The 12-face is the peripheral component interface (Peripheralc 赚 nt transmission "
Interface; PCI)，於本發明之其他實施例中，該傳輸介 面12亦可為萬用串列匯流Β^; USB)。於本實施例中，該傳輸介面12係為一具有路「】 與〇」之開關量（Switch)輸入之pCI介面的開關量卡， 用以將該測試裝置11所偵測之各按鍵板之按鍵狀態轉換 為開關量，例如，1表示按鍵被按下，〇表示按鍵未按下。 該資料處理裝置13,係用以顯示該測試裝置丨丨所债 測之各按鍵板之按鍵狀態，且用以依據該測試裝置11所 偵測之各按鍵板1〇之按鍵狀態記錄對應於各按鍵板之測 試結果及按鍵板測試之統計結果並予以顯示。於本實施例 中"亥資料處理裝置13係為一電腦。如第1圖所示，該 貝料處理裝置13包括設定模組130、讀取模組131、記錄 19646 10 200813459 模組132、顯示模組133、以及儲存模組134。 該a又疋才果組13 〇，择用以 係用以δ又疋對應於按鍵狀 方式，並用以建立該按锺柘1fl Β“ ‘肩不 :…1… 鍵之位置分佈與該測 ,:衣按鍵板10及按鍵之實體位置的對應關 係。/、中，該设定對應於按鍵狀態之顯示方式，係指設— 不同的按鍵狀態對應於不同的顯示色彩，例如，黑 按鍵被按下，白色表示按鍵未被按下。 又丁 該讀取模組131 ’係用以讀取該傳輸介面12所傳輸 之該測試裝置11所偵測之各按鍵板10之按鍵狀態。於本 實施例中，測試人員分別按下32個按鍵，該測試裝置U 偵測32個按鍵之按鍵狀態，若按鍵有問題（例如斷路， 按鍵接觸不良等），即使按鍵被按下，測試裝置u所偵 測之按鍵狀態亦為未按下。 、 該記錄模組132，係用以依據該讀取模組131所讀取 之按鍵板10之按鍵狀態記錄對應於該按鍵板1〇之測試結 _果及按鍵板10測試之統計結果。於本實施例中，各按鍵 板10之測試結果係指，若所讀取之1個按鍵板1 〇上8 個按鍵狀態均為1 (被按下），則記錄該按鍵板1〇為測 试通過（Pass);若所讀取之1値按鍵板1〇上至少有丨個 按鍵狀·％為〇 (未按下），則記錄該按鍵板1 〇為測試失 敗（Fail)。此外，記錄按鍵板測試之統計結果係包括記錄 所測試之按鍵板的總量（Total)、通過量以及失敗量。 該顯示模組133，係用以提供按鍵測試視窗，該按鍵 測試視窗係用以顯示該按鍵板1 〇及按鍵之位置分佈、該 11 19646 200813459 記錄模組132所記錄之對應於該按鍵板1G之測試結果及 按鍵板10測武之統計結果，i用以依據該設定模組⑽ -所12又疋之頦不方式及所建立之對應關係顯示該讀取模組 • 131所讀取之按鍵板1G。如帛2A圖所示，其係顯示一按 ^鍵測試視窗，該按鍵測試視窗顯示對應於該測試裝置u •所偵測之各按鍵板1〇及按鍵之實體位置之按鍵板（1#板 〜4#板）及按鍵的位置分佈（白色方格）。請繼續參閲第 2B圖，其係依據該設定模組13〇所設定之顯示方式及所 '建立之對應關係顯示該讀取模組131所讀取之各按鍵板 10之按鍵狀態，圖中黑色方格表示偵測到按鍵按下，白 色方格表示未偵測到按鍵按下。若測試人員按下按鍵測試 視®中之檢測結果”按鍵，該按鍵測試視窗即顯示本次測 忒中该e錄模組132所記錄之對應於各按鍵板丨〇之測試 結果及按鍵板10測試之統計結果，並將按鍵狀態之顯示 恢復至初始狀態（白色方格）以繼續進行測試，如第2C 圖所示，其中板、2#板及3#板測試失敗（Fail)，4# 、板測試通過（pass);請配合參閲第2B圖（前次累計的按 ' 鍵板測試之統計結果），本次測試後累計的測試按鍵板的 總里（Total )為 24 個（pcs)，通過量（Pass)為 18 個（pcs)， 失敗量（Fail)為6個（pcs)。 該儲存模組134，係用以儲存該記錄模組132所記錄 之對應於該按鍵板10之測試結果及按鍵板1〇測試之統計 結果。如第2D及2E圖所示，其係為本發明之按鍵測試系 統所儲存之測試結果及統計結果之一實施例示意圖，該儲 12 19646 200813459 存模組134將測試時間及測試通過的按鍵位置儲存於一 檔案中，如第2D圖所示；同時，該儲存模組134依據所 記錄之測試按鍵板10的總量及通過量計算按鍵板測試的 良品率並儲存於一檔案中，如第2E圖所示。 請參閱第3圖，其係為本發明之按鍵測試方法透過前 述本發明之按鍵測試系統流程示意圖。如圖所示，本發明 之按鍵測試方法3包括以下步驟： 设定對應於按鍵狀態之顯示方式，並建立按鍵板及按 鍵之位置分佈與該測試裝置所偵測之按鍵板及按鍵之實 體位置的對應關係；電性連接該按鍵板與該測試裝置；顯 不該按鍵板及按鍵之位置分佈；讀取該傳輸介面所傳輸之 該測試裝置所偵測之按鍵板之按鍵狀態；依據所設定之顯 示方式及所建立之對應關係顯示所讀取之該按鍵板之按 鍵狀悲，依據所§買取之該按鍵板之按鍵狀態記錄對應於該 按鍵板之測試結果及按鍵板測試之統計結果；顯示所記^ 壽之對應於該按鍵板之測試結果及按鍵板測試之統計結、 果；以及儲存該所記錄之對應於該按鍵板之測試結果及按 鍵板測試之統計結果，其中，該傳輸介面係為周邊元件介 面（Peripheral Component lnterface; PCI)及萬用串列 匯流排（Universal Serial Bus; USB)之其中一者 於步驟S30中，設定對應於按鍵狀態之顯示方式，並 建立按鍵板及按鍵之位置分佈與該測試裝置所偵測之按 鍵板及按鍵之實體位置的對應關係。接著進至步驟S3i。 於步驟S31中，電性連接該按鍵板與該測試裝置。接 19646 13 200813459 著進至步驟S32。 即測試人員是否 若否’則返回該 於步驟S32中’判斷是否開始測試， 啓動按鍵測試’若是’則進至步驟S33 ; 步驟S32。 於步驟S33中’提供-按鍵測試視窗，以顯示該按鍵 板及按鍵之位置分佈，朗Μ賴人員㈣之測試按 鍵，如第2Α圖所示。接著進至步驟S34。 於步驟S34中，讀取該傳輸介面所傳輸之該測試裝置 所偵測之按鍵板之按鍵狀態。接著進至步驟§35。 於步驟S35中，依據所設定之顯示方式及所建立之對 應關係顯示所讀取之各按鍵板之按鍵狀態。於本實施例 ^測試人員依次按下各按鍵板之按鍵，若按鍵正常，測 试裝置能夠债測到該按鍵被按下，則該按鍵測試視窗中相 應按鍵位置之白色方格即轉換為黑色方格；若按鍵有問 題’測試裝置偵測到該按鍵未被按下，則該按鍵測試視窗 _中相應按鍵位置之白色方格保持不變，其可例如第找圖 所示。接著進至步驟S36。 於步驟S36中，依據所讀取之各按鍵板之按鍵狀態記 、彔？應於各按鍵板之測試結果及按鍵板測試之統計結 果。接著進至步驟S37。 於步驟S37中，判斷是否顯示檢測結果，即測試人員 疋否知:下5亥按鍵測試視窗中之“檢測結果”按鍵，若是，則 進至步驟S38 ;若否，則返回至步驟S37。 於步驟S38中，顯示所記錄之對應於各按鍵板之測試 19646 14 200813459 結果及按鍵板測試之統計結果。對應於第2B圖，本步驟 •之顯示所記錄之對應於各按鍵板之測試結果及按鍵板測 试之統計結果係如第2C圖所示，其顯示各按鍵板是否通 :過，測試按鍵板的總量，通過量以及失敗量。接著進至步 * 驟 S 3 9 〇 於步驟S39中，儲存該所記錄之對應於該按鍵板之測 試結果及按鍵板測試之統計結果。於本實施例中，將測試 、 時間及測試通過的按鍵位置儲存於一檔案中，如第2d圖 '眷所不；以及依據所記錄之測試按鍵板的總量及通過量計算 按鍵板測試的良品率並儲存於一檔案中，如第2E圖所示。 綜前所述，本發明之按鍵測試系統及方法係藉由傳輸 介面將測試裝置所偵測之各按鍵板之按鍵狀態傳輸至該 資料處理裝置並予以顯示及處理，測試人員能直接讀取按 鍵之測試結果及統計結果，且由於資料處理裝置之硬體及 軟體資源強大，即無需再使用單晶片機對按鍵測試進行控 • _制，故能解決習知技術因使用單晶片機控制而導致硬體連 :接電路、軟體測試程式不具有通用性，以及浪費測試時間 '之缺點。再者，本發明之按鍵測試系統利用了資料處理裝 置將測4b守間、測試通過的按鍵位置、測試按鍵板的總量 及良品率予以儲存，藉此能使測試人員直接了解不良按鍵 之具體位置以及測試良品率，俾於測試人員對按鍵板測試 進行追縱：理。另外，利用該資料處理裝置之強大硬體資 源可-次同時測試多個按鍵板並予以記錄，故本發明亦能 適用於按鍵板之大量測試。 19646 15 200813459 上述實施例僅例示性說明本發明之 -非用於限制本發明。任何熟習此項技蓺原理及其功效，而 背本發明之精神及範疇下，對上述實施^人士均可在不違 ::羞鬥因此’本發明之權利保護範圍’應如後二錦二 . 範圍所列。 τ明專利 【圖式簡單說明】 • 第1圖係為本發明之按鍵測試系統之基本架構 塊示意圖； 〃、 、方 第2A至2C圖係為本發明之按鍵測試系統所顯示之 鍵測試視窗之其中一實施例的示意圖； 安 弟2 D至2 E圖係為本發明之按鍵測試系統所储存之、 試結果及統計結果之其中一實施例的示意圖；以及 、 第3圖係為本發明之按鍵測試方法之流程示意圖。 【主要元件符號說明】 1 按鍵測試系統 10 按鍵板 11 測試裝置 12 傳輸介面 13 資料處理裝置 130 設定模組 131 讀取模組 132 記錄模組 133 顯示模組 134 儲存模組 3 按鍵測試方法 S30〜S38 步驟 19646 16In other embodiments of the present invention, the transmission interface 12 may also be a universal serial port; USB). In this embodiment, the transmission interface 12 is a switch card having a pCI interface inputted by a switch of the path "" and "〇" for detecting the keypads detected by the test device 11. The button state is converted to a switch amount. For example, 1 indicates that the button is pressed, and 〇 indicates that the button is not pressed. The data processing device 13 is configured to display a button state of each of the keypads tested by the testing device, and is configured to correspond to each button state of each of the keypads detected by the testing device 11 The test results of the keypad and the statistical results of the keypad test are displayed. In the present embodiment, the "Hai data processing device 13 is a computer. As shown in FIG. 1, the bedding processing device 13 includes a setting module 130, a reading module 131, a recording 19646 10 200813459 module 132, a display module 133, and a storage module 134. The a 疋 疋 果 组 13 〇 〇 〇 〇 择 择 δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ δ : Correspondence between the button board 10 and the physical position of the button. In the middle, the setting corresponds to the display mode of the button state, which means that different button states correspond to different display colors, for example, the black button is pressed. The white button indicates that the button is not pressed. The reading module 131 is configured to read the state of the button of each of the keypads 10 detected by the testing device 11 transmitted by the transmission interface 12. In the example, the tester presses 32 buttons respectively, and the test device U detects the state of the button of the 32 buttons. If the button has a problem (such as an open circuit, a bad button contact, etc.), even if the button is pressed, the test device u detects The measured button state is also not pressed. The recording module 132 is configured to record a test result corresponding to the keypad 1 according to the state of the button of the keypad 10 read by the reading module 131. And the statistical results of the test of the button board 10. In the embodiment, the test result of each of the keypads 10 means that if the state of the eight buttons on the one button board 1 is 1 (pressed), the button board 1 is recorded as a test pass. (Pass); if there is at least one button shape on the button board 1··% is 〇 (not pressed), the button board 1 is recorded as a test failure (Fail). In addition, the record button The statistical result of the board test includes recording the total amount (Total), the throughput, and the amount of failure of the pressed keypad. The display module 133 is configured to provide a button test window for displaying the button. The position distribution of the board 1 and the button, the statistical result corresponding to the test result of the button board 1G and the measurement result of the button board 10 recorded by the recording module 132, i is used according to the setting module (10) - 12 The corresponding mode and the established relationship display the touch panel 1G read by the reading module • 131. As shown in FIG. 2A, the system displays a button test window, and the button test window displays Corresponding to the test device u • each key plate detected 1〇 The key position of the button (1# board ~ 4# board) and the position distribution of the button (white square). Please continue to refer to Figure 2B, which is based on the display mode set by the setting module 13 The established relationship indicates the state of the buttons of each of the keypads 10 read by the reading module 131. The black square in the figure indicates that the button is pressed, and the white square indicates that the button is not detected. If the tester presses the button to test the test result in the button, the button test window displays the test result corresponding to each button board recorded in the e-recording module 132 in the test and the button board 10 Test the statistical results, and restore the display of the button status to the initial state (white square) to continue the test, as shown in Figure 2C, where the board, 2# board and 3# board test failed (Fail), 4# , board test pass (pass); please refer to Figure 2B (previously accumulated by the 'keyboard test statistics results'), the total number of test button boards accumulated after this test (Total) is 24 (pcs ), the throughput is 18 (pcs), the amount of failure (Fai) l) is 6 (pcs). The storage module 134 is configured to store the statistical results recorded by the recording module 132 corresponding to the test result of the keypad 10 and the test of the keypad 1 . As shown in Figures 2D and 2E, which is a schematic diagram of an embodiment of the test results and statistical results stored in the button test system of the present invention, the storage module 134 will test the time and the position of the button passed the test. Stored in a file, as shown in FIG. 2D; at the same time, the storage module 134 calculates the yield of the keypad test according to the total amount and throughput of the recorded test button 10 and stores it in a file, such as Figure 2E shows. Please refer to FIG. 3, which is a schematic diagram of the key test method of the present invention through the key test system of the present invention. As shown in the figure, the button test method 3 of the present invention comprises the following steps: setting a display mode corresponding to the state of the button, and establishing a position distribution of the button board and the button and a physical position of the button board and the button detected by the testing device Corresponding relationship; electrically connecting the button board and the testing device; displaying the position distribution of the button board and the button; reading the button state of the button board detected by the testing device transmitted by the transmission interface; The display mode and the established correspondence relationship display the key shape of the read button board, and the test result corresponding to the button board and the statistical result of the key board test are recorded according to the button state of the button board; Displaying the statistical result of the test result corresponding to the keypad and the test of the keypad; and storing the recorded statistical result corresponding to the test result of the keypad and the test of the keypad, wherein the transmission The interface is a Peripheral Component lnterface (PCI) and a Universal Serial Bus (USB). Those in step S30, the status is set corresponding to the key display, and keypad keys and create the relationship between the detected positions corresponding to the distribution of the test apparatus according to the physical location of the key sheet and the key. Then it proceeds to step S3i. In step S31, the keypad and the testing device are electrically connected. Then, 19646 13 200813459 proceeds to step S32. That is, if the tester does not return, the process returns to the step S32 to determine whether to start the test, and if the button test is started, the process proceeds to step S33; step S32. In step S33, the 'key-key test window is displayed to display the position distribution of the button board and the button, and the test button of the person (4) is as shown in the second figure. Then it proceeds to step S34. In step S34, the button state of the keypad detected by the test device transmitted by the transmission interface is read. Then proceed to step §35. In step S35, the state of the keys of each of the read keypads is displayed according to the set display mode and the established correspondence relationship. In this embodiment, the tester sequentially presses the button of each button board. If the button is normal and the test device can detect that the button is pressed, the white square of the corresponding button position in the button test window is converted into black. If there is a problem with the button, the test device detects that the button has not been pressed, and the white square of the corresponding button position in the button test window remains unchanged, which can be found, for example, in the first figure. Then it proceeds to step S36. In step S36, according to the state of the button of each of the read keypads, 彔? The test results of each keypad and the statistical results of the keypad test. Then it proceeds to step S37. In step S37, it is judged whether or not the detection result is displayed, that is, whether the tester knows: the "detection result" button in the lower 5 key test window, and if so, proceeds to step S38; if not, returns to step S37. In step S38, the recorded statistical results of the test 19646 14 200813459 and the keypad test corresponding to each of the keypads are displayed. Corresponding to FIG. 2B, the statistical results corresponding to the test results of the respective keypads and the test of the keypads recorded in the display of this step are as shown in FIG. 2C, which indicates whether each keypad is open: over, test button The total amount of plates, throughput and the amount of failure. Then, the process proceeds to step S3 9 〇 In step S39, the recorded statistical result corresponding to the test result of the keypad and the keypad test is stored. In this embodiment, the test, time, and test button positions are stored in a file, as shown in FIG. 2d, and the button board test is calculated according to the total amount of the test button board and the throughput. The yield is stored in a file as shown in Figure 2E. As described above, the button test system and method of the present invention transmits the button state of each button board detected by the test device to the data processing device through the transmission interface and displays and processes the test button, and the tester can directly read the button. The test results and statistical results, and because of the strong hardware and software resources of the data processing device, it is no longer necessary to use the single-chip machine to control the button test, so it can solve the conventional technology caused by the use of single-chip machine control. Hardware connection: the shortcomings of the circuit, the software test program is not versatile, and the test time is wasted. Furthermore, the key test system of the present invention utilizes a data processing device to store the 4b keeper, the position of the test button, the total amount of the test button board, and the yield rate, thereby enabling the tester to directly understand the specificity of the bad button. Location and test yield rate, the tester is tracking the keyboard test: rational. In addition, the powerful hardware resources of the data processing device can simultaneously test and record a plurality of keypads, so the present invention can also be applied to a large number of tests of keypads. 19646 15 200813459 The above examples are merely illustrative of the invention - not intended to limit the invention. Anyone familiar with the principle and function of this technology, and under the spirit and scope of the present invention, can not violate the above implementation:: Shame, therefore, the scope of protection of the present invention should be as follows. . Listed in the scope. τ明专利 [Simple diagram of the diagram] • Figure 1 is a schematic diagram of the basic architecture of the button test system of the present invention; 〃, 、, 2A to 2C are the key test windows displayed by the button test system of the present invention. A schematic diagram of one of the embodiments; An Di 2 D to 2 E is a schematic diagram of one of the embodiments of the test results and statistical results stored in the key test system of the present invention; and FIG. 3 is the present invention Schematic diagram of the key test method. [Key component symbol description] 1 Key test system 10 Keypad 11 Test device 12 Transmission interface 13 Data processing device 130 Setting module 131 Reading module 132 Recording module 133 Display module 134 Storage module 3 Key test method S30~ S38 Step 19646 16